Test platform and test method for PC power supply fault

Abstract

The invention relates to the technical field of power supply fault testing, and particularly discloses a PC power supply fault testing platform and a testing method. The test platform is provided with a static load state data set acquisition module, a dynamic load fluctuation data set acquisition module, a first test evaluation value analysis module, a fault injection test frequency acquisition module, a fault injection test data set acquisition module and a fault adaptability level judgment module. The problems that a traditional test platform is single in fault test capability, insufficient in dynamic response capability, incapable of adjusting a PC power supply fault test method based on existing conditions and low in integration level are solved, a more comprehensive view angle is provided for the overall performance of the power supply, the reliability and adaptability of the power supply are judged, improvement guidance is provided, and the power supply fault test platform is suitable for popularization and application. And decision support can be provided for use of the power supply, including selection of a proper power supply application environment and formulation of a maintenance strategy.

Description

Technical Field

[0001] The invention relates to the technical field of power failure testing, in particular to a testing platform and a testing method for a PC power failure. Background Art

[0002] PC power supply is one of the most important components in personal computer system. It is a device that converts alternating current (AC) into low-voltage direct current (DC). It is responsible for providing stable and safe power to various components of the computer. Power failure may cause instability of the entire system and may even damage expensive hardware devices such as CPU, GPU, etc. PC power supply is easily affected by voltage fluctuations, dust accumulation, aging and other factors in daily operation. These factors may cause power supply performance degradation or failure. Using a dedicated test platform, you can quickly and accurately identify power supply problems and judge the power supply adaptability, thereby improving maintenance efficiency.

[0003] For example, the invention patent with announcement number CN109164377B discloses a high-speed AD / DA hybrid chip fault test device and method, which is used to diagnose high-speed ADC and DAC devices on a circuit board. For ADC diagnosis, a given voltage value is input into a PC host computer, which generates an analog voltage through an AD / DA integrated module and loads it to the ADC under test, generates test instructions and test vectors, and then acts on the AD test module through the IEEE1149.1 controller. The AD test module quickly serially shifts the collected voltage quantization value to the IEEE1149.1 The IEEE1149.1 controller then sends the data to the PC host computer and compares it with the expected response to determine the ADC fault condition. For DAC diagnosis, the given voltage value is input into the PC host computer, which converts the voltage value into a test vector and generates a test instruction. After being decoded by the IEEE1149.1 controller, the test vector is moved into the DA test module through TDI and then loaded into the DAC under test. The analog voltage output by the DAC under test collected by the AD / DA integrated module is received and compared with the expected response to determine the DAC fault condition.

[0004] Nowadays, there are still some deficiencies in the research on a PC power supply failure test platform. Specifically, the traditional test platform has a single fault testing capability and insufficient dynamic response capability. It is unable to adjust the PC power supply failure test method based on the existing situation and has low integration. It is unable to comprehensively evaluate the health status of the power supply, which affects subsequent maintenance and repair decisions. It is unable to respond to dynamic changes in the actual use environment and may miss problems that may arise in actual operation. It may also cause the test results to be inaccurate and fail to discover new failure modes or changes in time, thereby affecting the effectiveness of fault diagnosis. The low integration complicates the overall test process, increases test time and labor costs, and fails to achieve efficient data interaction. Summary of the invention

[0005] In view of the deficiencies in the prior art, the present invention provides a test platform and a test method for PC power failure, which can effectively solve the problems involved in the above-mentioned background technology.

[0006] To achieve the above objectives, the present invention is implemented through the following technical solutions: In a first aspect, the present invention provides a PC power supply fault test platform, including a static load state data set acquisition module, a dynamic load fluctuation data set acquisition module, a first test evaluation value analysis module, a fault injection test times acquisition module, a fault injection test data set acquisition module and a fault adaptability level judgment module, wherein: the static load state data set acquisition module is used to test the PC power supply to be tested with a static load under standard working conditions to obtain the static load state data set of the PC power supply to be tested; the dynamic load fluctuation data set acquisition module is used to test the PC power supply to be tested with a dynamic load under standard working conditions to obtain the PC power supply to be tested. The power supply dynamic load fluctuation data set; the first test evaluation value analysis module is used to combine the static load state data set of the PC power supply to be tested and the dynamic load fluctuation data set of the PC power supply to be tested, and comprehensively analyze to obtain the first test evaluation value of the PC power supply to be tested; the fault injection test number acquisition module is used to obtain the number of fault injection tests based on the first test evaluation value of the PC power supply to be tested; the fault injection test data set acquisition module is used to perform a fault injection test on the PC power supply to be tested based on the number of fault injection tests, and obtain the fault injection test data set of the PC power supply to be tested; the fault adaptability level judgment module is used to judge the fault adaptability level of the PC power supply to be tested based on the fault injection test data set of the PC power supply to be tested.

[0007] As a further solution, it is necessary to test the PC power supply static load status data set, including the static load power factor, the static load voltage stable time ratio, and the static load average noise decibel value.

[0008] As a further solution, it is necessary to test the PC power supply dynamic load fluctuation data set, including the average response time required for load changes and the average noise decibel value of load changes.

[0009] As a further solution, a first test evaluation value of the PC power supply to be tested is obtained through comprehensive analysis. The specific analysis process is as follows: based on a static load state data set of the PC power supply to be tested and a dynamic load fluctuation data set of the PC power supply to be tested, a first test evaluation value of the PC power supply to be tested is obtained through comprehensive analysis. The first test evaluation value of the PC power supply to be tested is used as an analysis basis for obtaining the number of fault injection tests. The first test evaluation value of the PC power supply needs to be tested. The specific analysis process is as follows: In the formula, To test the first test evaluation value of the PC power supply, is the static load power factor, is the proportion of static load voltage stability time, is the average noise decibel value under static load, is the average response time required for load changes, is the average noise decibel value of load change, is the compensation factor of the set static load power factor, is the compensation factor for the set static load voltage stability duration, is the compensation factor for the set average noise decibel value of the static load, The compensation factor for the average response time required for a set load change, It is the compensation factor for the average noise decibel value of the set load change.

[0010] As a further solution, based on the first test evaluation value of the PC power supply to be tested, the number of fault injection tests is obtained, and the specific analysis process is: compare the first test evaluation value of the PC power supply to be tested with the first test evaluation value of the PC power supply to be tested stored in the database; if the first test evaluation value of the PC power supply to be tested is higher than or equal to the first test reference evaluation value of the PC power supply to be tested, the test result of the PC power supply to be tested corresponding to the first test evaluation value of the PC power supply to be tested under standard working conditions is qualified, and the number of fault injection tests of the PC power supply to be tested is the reference number of fault injection tests stored in the database; if the first test evaluation value of the PC power supply to be tested is lower than the first test reference evaluation value of the PC power supply to be tested, the test result of the PC power supply to be tested corresponding to the first test evaluation value of the PC power supply to be tested under standard working conditions is unqualified, then the first test evaluation value of the PC power supply to be tested is compared with the number of fault injection tests corresponding to each first test evaluation value of the PC power supply to be tested stored in the database to obtain the number of fault injection tests corresponding to the first test evaluation value of the PC power supply to be tested, and the number of fault injection tests corresponding to the first test evaluation value of the PC power supply to be tested represents the number of fault injection tests of the PC power supply to be tested corresponding to the first test evaluation value of the PC power supply to be tested.

[0011] As a further solution, a PC power supply fault injection test data set to be tested specifically includes a PC power supply short circuit injection test data set to be tested, a PC power supply overload injection test data set to be tested, and a PC power supply over-temperature injection test data set to be tested; the PC power supply short circuit injection test data set to be tested specifically includes the short circuit injection test response time, the short circuit injection test current peak, and the short circuit injection test noise decibel value; the PC power supply overload injection test data set to be tested specifically includes the overload injection test response time, the absolute value of the difference between the actual power and the reference power of the overload injection test, and the number of instantaneous voltage fluctuations in the overload injection test; the PC power supply over-temperature injection test data set to be tested specifically includes the over-temperature injection test response time, the over-temperature injection test temperature change rate, and the over-temperature injection test fan response time.

[0012] As a further solution, based on the fault injection test data set of the PC power supply to be tested, the fault adaptability level of the PC power supply to be tested is judged. The specific analysis process is: based on the short-circuit injection test data set of the PC power supply to be tested, a short-circuit injection test evaluation value is obtained through comprehensive analysis, and the short-circuit injection test evaluation value is used as the analysis basis for judging the fault adaptability level of the PC power supply to be tested; based on the overload injection test data set of the PC power supply to be tested, an overload injection test evaluation value is obtained through comprehensive analysis, and the overload injection test evaluation value is used as the analysis basis for judging the fault adaptability level of the PC power supply to be tested; based on the over-temperature injection test data set of the PC power supply to be tested, an over-temperature injection test evaluation value is obtained through comprehensive analysis, and the over-temperature injection test evaluation value is used as the analysis basis for judging the fault adaptability level of the PC power supply to be tested; the short-circuit injection test evaluation value, the overload injection test evaluation value and the over-temperature injection test evaluation value are comprehensively analyzed to obtain the first The second test evaluation value, the second test evaluation value of the PC power supply to be tested is used as an analysis basis for judging the fault adaptability level of the PC power supply to be tested; the second test evaluation value of the PC power supply to be tested is compared with the second test reference evaluation value of the PC power supply to be tested stored in the database; if the second test evaluation value of the PC power supply to be tested is higher than the second test reference evaluation value of the PC power supply to be tested, then the fault adaptability level of the PC power supply to be tested corresponding to the second test evaluation value of the PC power supply to be tested is level three; if the second test evaluation value of the PC power supply to be tested is equal to the second test reference evaluation value of the PC power supply to be tested, then the fault adaptability level of the PC power supply to be tested corresponding to the second test evaluation value of the PC power supply to be tested is level two; if the second test evaluation value of the PC power supply to be tested is lower than the second test reference evaluation value of the PC power supply to be tested, then the fault adaptability level of the PC power supply to be tested corresponding to the second test evaluation value of the PC power supply to be tested is level one.

[0013] As a further solution, it is necessary to test the second test evaluation value of the PC power supply. The specific analysis process is as follows: ; In the formula, To test the second test evaluation value of the PC power supply, Evaluated value for short circuit injection test, Inject test evaluation values ​​for overloads, For over temperature injection test evaluation value, is a natural constant.

[0014] As a further solution, the short circuit injection test evaluation value, the specific analysis process is as follows: ; In the formula, Evaluated value for short circuit injection test, The short circuit injection test response time. Inject test current peak value for short circuit, The decibel value of the short circuit injection test noise, The compensation factor for the set short-circuit injection test response time, The compensation factor for the peak value of the short-circuit injection test current is set. The compensation factor for the set short-circuit injection test noise decibel value, is a natural constant.

[0015] A second aspect of the present invention provides a method for testing a PC power supply failure, comprising the following steps: under standard working conditions, testing a PC power supply to be tested with a static load to obtain a static load state data set of the PC power supply to be tested; under standard working conditions, testing the PC power supply to be tested with a dynamic load to obtain a dynamic load fluctuation data set of the PC power supply to be tested; combining the static load state data set of the PC power supply to be tested and the dynamic load fluctuation data set of the PC power supply to be tested, and comprehensively analyzing to obtain a first test evaluation value of the PC power supply to be tested; based on the first test evaluation value of the PC power supply to be tested, obtaining the number of fault injection tests; based on the number of fault injection tests, performing a fault injection test on the PC power supply to be tested to obtain a fault injection test data set of the PC power supply to be tested; and judging the fault adaptability level of the PC power supply to be tested based on the fault injection test data set of the PC power supply to be tested.

[0016] Compared with the prior art, the embodiments of the present invention have at least the following advantages or beneficial effects: (1) The present invention provides a test platform and a test method for PC power supply failure. By performing a static load test under standard working conditions, basic performance data of the power supply in a stable state can be obtained, and the situation under load changes in actual applications can be simulated, so as to evaluate the dynamic response capability of the power supply. Combining static and dynamic load data provides a more comprehensive perspective for the overall performance of the power supply, helps to judge the reliability and adaptability of the power supply, and provides improvement guidance. Through actual fault injection testing, behavioral data related to power supply failure conditions can be obtained. Based on the fault test results, the adaptability of the power supply can be comprehensively evaluated, which helps to provide decision support for the use of the power supply, including selecting a suitable power supply application environment and formulating maintenance strategies.

[0017] (2) The present invention obtains the number of fault injection tests based on the first test evaluation value of the PC power supply to be tested. Reasonable determination of the number of fault injection tests can avoid excessive testing, save test resources (time, equipment, power consumption, etc.), and improve overall test efficiency. Through targeted fault testing based on the evaluation value, more reliable data can be obtained, avoiding errors caused by insufficient test quantity. By reasonably arranging the number of tests, the performance of the PC power supply under different load conditions can be comprehensively analyzed to clarify its advantages and disadvantages.

[0018] (3) The present invention determines the fault adaptability level of the PC power supply to be tested based on the fault injection test data set of the PC power supply to be tested, and can quantitatively evaluate the fault resistance of the power supply and obtain a clear fault adaptability level, thereby providing an objective basis for the PC power supply performance. By determining the fault adaptability level, the faults that may occur in a specific environment can be identified in advance, helping to formulate corresponding risk management strategies. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] The present invention is further described using the accompanying drawings, but the embodiments in the accompanying drawings do not constitute any limitation to the present invention. A person skilled in the art can obtain other drawings based on the following drawings without creative work.

[0020] Figure 1 It is a schematic diagram of the connection of the test platform module of the present invention.

[0021] Figure 2 The figure is a schematic flow chart of the steps of the testing method of the present invention. DETAILED DESCRIPTION

[0022] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0023] Reference Figure 1 As shown, the first aspect of the present invention provides a PC power supply failure test platform, including a static load status data set acquisition module, a dynamic load fluctuation data set acquisition module, a first test evaluation value analysis module, a fault injection test number acquisition module, a fault injection test data set acquisition module and a fault adaptability level judgment module.

[0024] The static load state data set acquisition module is used to test the PC power supply to be tested with a static load under standard working conditions to obtain the static load state data set of the PC power supply to be tested.

[0025] Specifically, it is necessary to test the static load state data set of the PC power supply, including the static load power factor, the static load voltage stability time ratio, and the static load average noise decibel value. The power factor is the ratio of actual power (active power) to apparent power, which measures the working efficiency of the power supply under load conditions. A power factor close to 1 indicates that the power supply can effectively utilize electricity, which is obtained based on the power analyzer. The voltage stability time ratio refers to the proportion of time during a test period that the power supply output voltage remains within the specified range, which reflects the power supply's resistance to voltage fluctuations under static load conditions, which is obtained based on an oscilloscope. The noise decibel value refers to the standard measurement of the noise level emitted by the power supply during operation, which is obtained based on a decibel meter.

[0026] In a specific embodiment, the power factor mainly reflects how effectively the power supply uses electrical energy. A higher power factor indicates that the power supply can better convert electrical energy into actual useful work without losing too much power due to reactive power. If the power factor of the power supply is high, it means that it can more effectively control the current when the load changes, thereby reducing the possibility of voltage fluctuations. Under steady-state operating conditions, a higher power factor helps to maintain the output voltage of the power supply stable. When the power supply outputs a stable voltage, it usually means that its internal circuit is working properly, and the feedback control system can effectively adjust the output to avoid voltage fluctuations. When the voltage remains stable, the heat dissipation inside the power supply, the vibration between components and the current fluctuation are relatively small, which may lead to a lower noise level. A longer voltage stability time is usually associated with a lower noise decibel value.

[0027] The dynamic load fluctuation data set acquisition module is used to test the PC power supply to be tested with a dynamic load under standard working conditions to obtain the dynamic load fluctuation data set of the PC power supply to be tested.

[0028] Specifically, it is necessary to test the PC power supply dynamic load fluctuation data set, including the average response time required for load changes and the average noise decibel value of load changes. The average response time required for load changes refers to the average time required for the system (such as power supply, UPS, inverter, etc.) to perceive the change and make corresponding adjustments when the load changes, which is obtained based on an oscilloscope. The average noise decibel value of load changes refers to the average decibel value of the noise generated by the device during its operation when the load changes, which is obtained based on a decibel meter.

[0029] It should be explained that some of the above-mentioned devices may have a delayed reaction when the load changes, that is, the response time is longer. In this case, when the system finally makes an adjustment, it may be accompanied by greater force or speed, resulting in greater noise. If the device responds slowly, its internal components may operate under a higher load in a short period of time, causing the noise to remain at a high level for a long time. The longer the response time required for the load change, the higher the average noise may be.

[0030] The first test evaluation value analysis module is used to combine the static load state data set of the PC power supply to be tested and the dynamic load fluctuation data set of the PC power supply to be tested, and comprehensively analyze to obtain the first test evaluation value of the PC power supply to be tested.

[0031] Specifically, a first test evaluation value of the PC power supply to be tested is obtained through comprehensive analysis. The specific analysis process is as follows: based on a static load state data set of the PC power supply to be tested and a dynamic load fluctuation data set of the PC power supply to be tested, a first test evaluation value of the PC power supply to be tested is obtained through comprehensive analysis. The first test evaluation value of the PC power supply to be tested is used as an analysis basis for obtaining the number of fault injection tests. The first test evaluation value of the PC power supply needs to be tested. The specific analysis process is as follows: In the formula, To test the first test evaluation value of the PC power supply, is the static load power factor, is the proportion of static load voltage stability time, is the average noise decibel value under static load, is the average response time required for load changes, is the average noise decibel value of load change, is the compensation factor of the set static load power factor, is the compensation factor for the set static load voltage stability duration, is the compensation factor for the set average noise decibel value of the static load, The compensation factor for the average response time required for a set load change, It is the compensation factor for the average noise decibel value of the set load change.

[0032] It should be explained that the first test evaluation value of the PC power supply to be tested is calculated through static load power factor, static load voltage stability time ratio, static load average noise decibel value, average response time required for load change, and load change average noise decibel value. The static load power factor, static load voltage stability time ratio, static load average noise decibel value, average response time required for load change, and load change average noise decibel value are normalized. Multi-dimensional evaluation indicators can fully reflect the performance of the power supply under different load conditions, so that the evaluation process is not limited to the influence of a single factor, ensuring a comprehensive understanding of the reliability of the power supply. Combining multiple evaluation standards can improve the accuracy of judgment. Relying on a single indicator alone often cannot fully reflect the performance of the power supply, and comprehensive data from all aspects can more realistically present the overall quality of the power supply. The evaluation of various indicators of power supply performance can identify potential problems earlier and make risk predictions in advance. The compensation factors for the set static load power factor, static load voltage stability time ratio, static load average noise decibel value, average response time required for load change, and load change average noise decibel value are obtained from the database. , , , , The compensation factors corresponding to the static load power factor, the static load voltage stability time ratio, the static load average noise decibel value, the average response time required for load changes, and the average noise decibel value of load changes preset in the database represent the numerical values ​​of the influence of the static load power factor, the static load voltage stability time ratio, the static load average noise decibel value, the average response time required for load changes, and the average noise decibel value of load changes on the first test evaluation value of the PC power supply to be tested. When used, the compensation factors corresponding to the static load power factor, the static load voltage stability time ratio, the static load average noise decibel value, the average response time required for load changes, and the average noise decibel value of load changes can be directly obtained from the database. The corresponding relationship can be a preset mapping relationship. For example, the static load power factor, the static load voltage stability time ratio, the static load average noise decibel value, the average response time required for load changes, and the average noise decibel value of load changes A mapping set is formed by the timing length ratio, the static load average noise decibel value, the average response time required for load changes, the average noise decibel value of load changes, and the compensation factors of the static load power factor, the static load voltage stability time ratio, the static load average noise decibel value, the average response time required for load changes, and the average noise decibel value of load changes preset in the database. The real-time static load power factor, the static load voltage stability time ratio, the static load average noise decibel value, the average response time required for load changes, and the average noise decibel value of load changes are input into the mapping set to obtain the static load power factor, the static load voltage stability time ratio, the static load average noise decibel value, the average response time required for load changes, and the compensation factors corresponding to the average noise decibel value of load changes. The mapping relationship can be one-to-one or many-to-one.

[0033] The fault injection test number acquisition module is used to obtain the fault injection test number based on the first test evaluation value of the PC power supply to be tested.

[0034] Specifically, based on the first test evaluation value of the PC power supply to be tested, the number of fault injection tests is obtained, and the specific analysis process is: compare the first test evaluation value of the PC power supply to be tested with the first test evaluation value of the PC power supply to be tested stored in the database; if the first test evaluation value of the PC power supply to be tested is higher than or equal to the first test reference evaluation value of the PC power supply to be tested, the test result of the PC power supply to be tested corresponding to the first test evaluation value of the PC power supply to be tested under standard working conditions is qualified, and the number of fault injection tests of the PC power supply to be tested is the reference number of fault injection tests stored in the database; if the first test evaluation value of the PC power supply to be tested is lower than the first test reference evaluation value of the PC power supply to be tested, the test result of the PC power supply to be tested corresponding to the first test evaluation value of the PC power supply to be tested under standard working conditions is unqualified, and the first test evaluation value of the PC power supply to be tested is compared with the first test evaluation value of each PC power supply to be tested stored in the database. A fault injection test number corresponding to a test evaluation value is compared, and based on a historically established mapping set of first test evaluation values ​​of a PC power supply to be tested and the fault injection test number, the first test evaluation value of the PC power supply to be tested is compared with an established mapping set of first test evaluation values ​​of the PC power supply to be tested and the fault injection test number, to obtain the number of fault injection tests corresponding to the first test evaluation value of the PC power supply to be tested, and the number of fault injection tests corresponding to the first test evaluation value of the PC power supply to be tested represents the number of fault injection tests of the PC power supply to be tested corresponding to the first test evaluation value of the PC power supply to be tested, that is, when a fault injection test is performed on the PC power supply, a test evaluation value will be obtained after each test, and this evaluation value is called the "first test evaluation value", and the "number of fault injection tests corresponding to the first test evaluation value of the PC power supply to be tested" refers to the number of fault injection tests performed to generate this specific test evaluation value.

[0035] In a specific embodiment, the first test evaluation value of the PC power supply to be tested is compared with the historical data, so that the performance of the PC power supply can be evaluated more accurately. If the current evaluation value is significantly lower than the evaluation value of the qualified product in the historical data, it can be determined that the product may have potential problems, thereby strengthening the fault injection test on it. A set of standardized test processes can also be established to ensure that all PC power supplies to be tested are subject to consistent evaluation standards. Standardization helps to reduce the impact of human factors and make test results more repeatable and reliable. After an unqualified evaluation, a more in-depth fault injection test can help identify and locate potential defects. Increasing the number of fault injection tests can more comprehensively evaluate the performance of the product under various extreme conditions, thereby identifying deficiencies in the design or manufacturing process. The comparison based on historical data and evaluation values ​​makes the decision-making process more data-driven, which can provide reliable data support for management and help it make more informed decisions in production and quality control.

[0036] It should be explained that the number of fault injection tests is obtained based on the first test evaluation value of the PC power supply to be tested. Reasonable determination of the number of fault injection tests can avoid excessive testing, save testing resources (time, equipment, power consumption, etc.), and improve overall testing efficiency. Through targeted fault testing based on the evaluation value, more reliable data can be obtained, avoiding errors caused by insufficient test quantity. By reasonably arranging the number of tests, the performance of the PC power supply under different load conditions can be comprehensively analyzed to clarify its advantages and disadvantages.

[0037] The fault injection test data set acquisition module is used to perform a fault injection test on the PC power supply to be tested based on the number of fault injection tests, and acquire a fault injection test data set of the PC power supply to be tested.

[0038] Specifically, the PC power supply fault injection test data set needs to be tested, including the PC power supply short-circuit injection test data set, the PC power supply overload injection test data set, and the PC power supply overtemperature injection test data set; the PC power supply short-circuit injection test data set needs to be tested specifically includes the short-circuit injection test response time, the short-circuit injection test current peak, and the short-circuit injection test noise decibel value. The short-circuit injection test response time refers to the length of time after the short-circuit event occurs, that is, the time when the device can work stably under the short-circuit condition and the time when the set protection operation starts to take effect. It is used to evaluate the response speed and stability of the device to the short-circuit condition, and is obtained based on the logic analyzer. It is used to capture the transient changes of the current signal and help analyze the response time. The short-circuit injection test current peak refers to the current peak measured when the device is short-circuited, which reflects the maximum current that the device can withstand during the short-circuit, and is used to evaluate the safety and stability of the device under extreme conditions. It is obtained based on the oscilloscope. The short-circuit injection test noise decibel value refers to the sound pressure level generated by the device in the short-circuit state, which is obtained based on the decibel meter; the PC power supply needs to be tested The source overload injection test data set specifically includes the overload injection test response time, the absolute value of the difference between the actual power and the reference power of the overload injection test, and the number of instantaneous voltage fluctuations in the overload injection test. The response time refers to the time required for the device to take corresponding measures (such as cutting off the power supply or reducing the power) after detecting an overload condition (such as exceeding the rated load), which reflects the rapid response of the device's protection mechanism. The response time can be measured by an oscilloscope or a fast data acquisition system, and a high-frequency sampling rate is usually required to capture instantaneous changes. The absolute value of the difference between the actual power and the reference power of the overload injection test refers to the absolute value of the difference between the actual power measured by the device and the set reference power under the overload condition. It is used to evaluate whether the power output of the device under the overload state exceeds the expected range, reflecting the load capacity and stability of the device. A power meter is used to measure the actual power, and the reference power is provided by the design parameters or standards. The number of instantaneous voltage fluctuations in the overload injection test refers to the number of instantaneous voltage fluctuations during the test, indicating the instability of the voltage over time. The number of voltage fluctuations can be captured by an oscilloscope or a voltage monitor;The PC power supply over-temperature injection test data set to be tested specifically includes the over-temperature injection test response time, over-temperature injection test temperature change rate, and over-temperature injection test fan response time. The response time refers to the time required for the device to start cooling measures (such as fans, cooling devices, or other protection mechanisms) when it detects that the temperature reaches the preset over-temperature threshold. Effective response time can help the device take timely measures under over-temperature conditions to prevent further damage. Use temperature sensors such as thermocouples and thermistors to record temperature changes, and monitor the response time after the temperature reaches the threshold through the control system. The temperature change rate refers to the temperature change over time inside or on the surface of the device during the over-temperature injection test. The rate of temperature change can be used to evaluate the device's tolerance to over-temperature conditions and its heat dissipation performance. The greater the temperature change rate, the more likely it is that the device's heat dissipation capacity is insufficient. Use temperature sensors (such as thermocouples and thermistors) to monitor the temperature in real time to record the temperature values ​​at different time points, thereby calculating the rate of temperature change. The fan response time refers to the time required for the fan to reach full speed from receiving the start signal, which affects the reaction speed of the cooling system and, in turn, the cooling effect of the device under over-temperature conditions. Use the output of the temperature sensor as the start signal, and the fan's start optimization can be detected through current monitoring or speed sensors, and the time required for the fan to reach maximum speed can be recorded. ;

[0039] In a specific embodiment, there is usually a positive correlation between the response time and the current peak. After a short circuit occurs, the device needs a certain amount of time to respond. Due to the suddenness of the short-circuit current, the current peak may increase rapidly. If the device response time is short, the current peak may change more dramatically. If the device takes a long time to respond to the short circuit event, it may cause more serious damage in a short period of time. In this process, more noise may be generated, resulting in an increase in the noise decibel value. The increase in current peak usually causes greater instantaneous stress on the internal components of the device (such as relays, transformers, etc.), which may cause greater noise. When these components are subjected to overload or short-circuit current, their mechanical structure may vibrate, thereby generating sound.

[0040] It needs to be explained that the shorter the above-mentioned response time is, the faster the device can detect the overload and take measures (such as current limiting, power cutting, etc.). If the response time is long, the actual power may exceed the reference power during this period, resulting in an increase in the absolute value of the difference. Within the response time, if the device fails to cut off or adjust the power supply in time, it may cause multiple voltage fluctuations. The voltage may experience unstable changes when it fails under overload conditions, increasing the number of instantaneous voltage fluctuations. The larger the difference between the actual power and the reference power, it usually means that the load conditions are more extreme, which may cause unstable power output, and then cause more voltage fluctuations. A larger power difference will lead to an increase in the number of instantaneous voltage fluctuations.

[0041] It needs to be explained that the shorter the response time of the above-mentioned device, the faster measures can be taken (such as starting the cooling fan) when the temperature reaches the over-temperature threshold, thereby effectively reducing the temperature change rate. If the response time is longer, the device may experience a greater temperature rise, resulting in an increase in the temperature change rate. The fan response time directly affects the temperature change rate of the device. If the fan starts quickly and can improve the heat dissipation capacity in a short time, then the temperature change rate can be reduced. If the fan response time is long, the improvement in heat dissipation capacity will be delayed, which may lead to a greater temperature change rate.

[0042] The fault adaptability level judgment module is used to judge the fault adaptability level of the PC power supply to be tested based on the PC power supply fault injection test data set to be tested.

[0043] Specifically, based on the PC power supply fault injection test data set to be tested, the fault adaptability level of the PC power supply to be tested is judged, and the specific analysis process is: based on the short-circuit injection test data set of the PC power supply to be tested, a short-circuit injection test evaluation value is obtained through comprehensive analysis, and the short-circuit injection test evaluation value is used as an analysis basis for judging the fault adaptability level of the PC power supply to be tested; based on the overload injection test data set of the PC power supply to be tested, an overload injection test evaluation value is obtained through comprehensive analysis, and the overload injection test evaluation value is used as an analysis basis for judging the fault adaptability level of the PC power supply to be tested; based on the over-temperature injection test data set of the PC power supply to be tested, an over-temperature injection test evaluation value is obtained through comprehensive analysis, and the over-temperature injection test evaluation value is used as an analysis basis for judging the fault adaptability level of the PC power supply to be tested; the short-circuit injection test evaluation value, the overload injection test evaluation value and the over-temperature injection test evaluation value are comprehensively analyzed to obtain the second test value of the PC power supply to be tested The evaluation value of the second test evaluation value of the PC power supply to be tested is used as the analysis basis for judging the fault adaptability level of the PC power supply to be tested; the second test evaluation value of the PC power supply to be tested is compared with the second test reference evaluation value of the PC power supply to be tested stored in the database; if the second test evaluation value of the PC power supply to be tested is higher than the second test reference evaluation value of the PC power supply to be tested, then the fault adaptability level of the PC power supply to be tested corresponding to the second test evaluation value of the PC power supply to be tested is level three; if the second test evaluation value of the PC power supply to be tested is equal to the second test reference evaluation value of the PC power supply to be tested, then the fault adaptability level of the PC power supply to be tested corresponding to the second test evaluation value of the PC power supply to be tested is level two; if the second test evaluation value of the PC power supply to be tested is lower than the second test reference evaluation value of the PC power supply to be tested, then the fault adaptability level of the PC power supply to be tested corresponding to the second test evaluation value of the PC power supply to be tested is level one.

[0044] In a specific embodiment, the injection test data of various fault types such as short circuit, overload and overtemperature are comprehensively analyzed to form a comprehensive evaluation mechanism. The systematic evaluation can comprehensively reflect the performance of the PC power supply under different fault conditions, avoid the incompleteness of single fault testing, and conduct a multi-dimensional evaluation of fault adaptability, which can effectively improve the reliability of the test results. Only power supplies that perform well under all test types can be considered to have high adaptability, avoiding erroneous judgments that may be made due to accidental performance under a single fault condition. Comparison of various evaluation values ​​with reference standards can identify deficiencies in existing power supply designs, accurately identify the fault adaptability level of the power supply, effectively perform risk management, reduce equipment damage or system instability caused by power supply failures, and ensure the safety and stability of the entire computer system. The higher the PC power supply fault adaptability level, the better the PC power supply fault adaptability.

[0045] It should be explained that the above-mentioned judgment of the fault adaptability level of the PC power supply to be tested based on the fault injection test data set of the PC power supply to be tested can quantitatively evaluate the fault resistance of the power supply and derive a clear fault adaptability level, thereby providing an objective basis for the performance of the PC power supply. By determining the fault adaptability level, possible faults that may occur in a specific environment can be identified in advance, helping to formulate corresponding risk management strategies.

[0046] Furthermore, it is necessary to test the second test evaluation value of the PC power supply. The specific analysis process is as follows: ; In the formula, To test the second test evaluation value of the PC power supply, Evaluated value for short circuit injection test, Inject test evaluation values ​​for overloads, For over temperature injection test evaluation value, is a natural constant.

[0047] It needs to be explained that the second test evaluation value of the PC power supply to be tested is calculated through the short-circuit injection test evaluation value, the overload injection test evaluation value and the over-temperature injection test evaluation value. It can evaluate whether the protection mechanism of the power supply is effective under short-circuit conditions, ensure that the power supply can cut off the power supply when encountering a short circuit, avoid fire and equipment damage, evaluate the performance of the power supply under overload conditions, reduce equipment damage caused by power overload, evaluate the performance of the power supply under high temperature conditions, ensure that the power supply can still work normally in a high temperature environment, reduce the probability of failure due to overheating, enhance product reliability, and combine different test methods to comprehensively evaluate the performance of the power supply under extreme conditions, analyze its overall performance from multiple dimensions, and form a more reliable test report.

[0048] Specifically, the short-circuit injection test evaluation value, the specific analysis process is: ; In the formula, Evaluated value for short circuit injection test, The short circuit injection test response time. Inject test current peak value for short circuit, The decibel value of the short circuit injection test noise, The compensation factor for the set short-circuit injection test response time, The compensation factor for the peak value of the short-circuit injection test current is set. The compensation factor for the set short-circuit injection test noise decibel value, is a natural constant.

[0049] It should be explained that the above short-circuit injection test evaluation value is calculated through the short-circuit injection test response time, short-circuit injection test current peak value, and short-circuit injection test noise decibel value. The short-circuit injection test response time, short-circuit injection test current peak value, and short-circuit injection test noise decibel value are normalized. The response time of the short-circuit injection test can evaluate whether the protection measures of the power supply are fast enough in the case of a short circuit. If the response time is too long, it may cause equipment damage or cause safety hazards. The peak current evaluation can show how much current the power supply can withstand in a short-circuit state to ensure that it can protect the circuit and downstream equipment in transient short-circuit events. The noise level generated during the test can reflect the stability of the power supply when it is working. Analysis of these test data is helpful to improve the power supply design to enhance the reliability of the system under short-circuit conditions. The compensation factors for the set short-circuit injection test response time, short-circuit injection test current peak value, and short-circuit injection test noise decibel value are obtained from the database. , , The compensation factors corresponding to the short-circuit injection test response time, short-circuit injection test current peak, and short-circuit injection test noise decibel value preset in the database represent the numerical values ​​of the influence of the short-circuit injection test response time, short-circuit injection test current peak, and short-circuit injection test noise decibel value on the short-circuit injection test evaluation value. When used, the compensation factors corresponding to the short-circuit injection test response time, short-circuit injection test current peak, and short-circuit injection test noise decibel value can be directly obtained from the database, and the corresponding relationship can be a pre-set mapping relationship. For example, the short-circuit injection test response time, short-circuit injection test current peak, and short-circuit injection test noise decibel value are used to form a mapping set with the compensation factors of the short-circuit injection test response time, short-circuit injection test current peak, and short-circuit injection test noise decibel value preset in the database. The real-time short-circuit injection test response time, short-circuit injection test current peak, and short-circuit injection test noise decibel value are input into the mapping set to obtain the compensation factors corresponding to the short-circuit injection test response time, short-circuit injection test current peak, and short-circuit injection test noise decibel value. The mapping relationship can be one-to-one or many-to-one.

[0050] It should be explained that the above overload injection test evaluation value, the specific analysis process is as follows: ; In the formula, Inject test evaluation values ​​for overloads, The response time for the overload injection test, It is the absolute value of the difference between the actual power and the reference power of the overload injection test. Inject the test voltage fluctuation times for overload. Compensation factor for the set overload injection test response time, The compensation factor for the absolute value of the difference between the actual power and the reference power of the set overload injection test, Compensation factor for the number of voltage fluctuations during the set overload injection test.

[0051] It should be explained that the above-mentioned overload injection test evaluation value is calculated through the overload injection test response time, the absolute value of the difference between the actual power and the reference power of the overload injection test, and the number of instantaneous voltage fluctuations of the overload injection test. The overload injection test response time, the absolute value of the difference between the actual power and the reference power of the overload injection test, and the number of instantaneous voltage fluctuations of the overload injection test are normalized. The response time under overload conditions can evaluate whether the power supply can quickly cut off or reduce the output to avoid equipment damage or other safety problems. By calculating the difference between the actual power and the reference power, the power supply's ability to withstand overload conditions can be intuitively evaluated, helping designers to ensure that the power supply operates within the rated range, thereby reducing Risk, can verify whether the overload protection mechanism of the power supply is operating effectively, ensure that the power supply can be cut off in time in the overload state, avoid thermal damage or fire risk of circuits and equipment, analyze the number of instantaneous voltage fluctuations, and evaluate the output stability of the power supply. Frequent voltage fluctuations may cause instability of downstream equipment, especially in voltage-sensitive applications. The ability to control power fluctuations is crucial. System monitoring and data analysis can timely discover trends that may lead to failures, help take preventive measures, and reduce maintenance costs. The set overload injection test response time, the absolute value of the difference between the actual power and the reference power of the overload injection test, and the compensation factor of the number of instantaneous voltage fluctuations in the overload injection test are obtained from the database. , , The compensation factor corresponding to the overload injection test response time, the absolute value of the difference between the actual power of the overload injection test and the reference power, and the number of instantaneous voltage fluctuations of the overload injection test preset in the database represents the numerical value of the influence of the overload injection test response time, the absolute value of the difference between the actual power of the overload injection test and the reference power, and the number of instantaneous voltage fluctuations of the overload injection test on the overload injection test evaluation value. When used, the compensation factor corresponding to the overload injection test response time, the absolute value of the difference between the actual power of the overload injection test and the reference power, and the number of instantaneous voltage fluctuations of the overload injection test can be directly obtained from the database. The corresponding relationship can be a preset mapping relationship, for example, the overload injection test response time, the overload A mapping set is formed by the absolute value of the difference between the actual power of the injection test and the reference power, the number of instantaneous voltage fluctuations in the overload injection test, and the overload injection test response time preset in the database, the absolute value of the difference between the actual power of the overload injection test and the reference power, and the compensation factor of the number of instantaneous voltage fluctuations in the overload injection test. The real-time overload injection test response time, the absolute value of the difference between the actual power of the overload injection test and the reference power, and the number of instantaneous voltage fluctuations in the overload injection test are input into the mapping set to obtain the overload injection test response time, the absolute value of the difference between the actual power of the overload injection test and the reference power, and the compensation factor corresponding to the number of instantaneous voltage fluctuations in the overload injection test. The mapping relationship can be one-to-one or many-to-one.

[0052] It should be explained that the above over-temperature injection test evaluation value, the specific analysis process is as follows: ; In the formula, For over temperature injection test evaluation value, It is the response time of over temperature injection test. Temperature change rate for over temperature injection test, Inject test fan response time for over temperature, The compensation factor for the set over-temperature injection test response time, The compensation factor for the set over-temperature injection test temperature change rate, A compensation factor for the fan response time injected into the set overtemperature test.

[0053] It should be explained that the above-mentioned over-temperature injection test evaluation value is calculated through the over-temperature injection test response time, over-temperature injection test temperature change rate, and over-temperature injection test fan response time. The over-temperature injection test response time, over-temperature injection test temperature change rate, and over-temperature injection test fan response time are normalized to evaluate the response capability of the equipment under over-temperature conditions, and ensure that timely measures can be taken (such as cutting off the power supply or enabling the protection mechanism) to prevent safety hazards such as equipment damage or fire. By monitoring the temperature change rate, the rationality of the system's heat dissipation design can be evaluated, and the system can be adjusted or optimized in time to avoid over-temperature, thereby ensuring that the equipment works stably within a safe temperature range. The fan's startup and adjustment capabilities when the temperature rises can be detected to ensure that it can quickly and effectively reduce the equipment temperature. Timely fan response can reduce the risk of overheating and extend the life of the equipment. Comprehensive over-temperature evaluation can ensure that the equipment is operating under various loads. and reliability under environmental conditions, reducing the failure rate, thereby enhancing user trust, monitoring and analyzing temperature changes, being able to warn of possible failures in advance, helping to take preventive measures, and reducing maintenance costs and downtime, the set over-temperature injection test response time, over-temperature injection test temperature change rate, and over-temperature injection test fan response time compensation factors are obtained from the database, and a mapping set of historically measured over-temperature injection test response time, over-temperature injection test temperature change rate, over-temperature injection test fan response time and over-temperature injection test response time, over-temperature injection test temperature change rate, and over-temperature injection test fan response time compensation factors is established based on historical data to obtain the over-temperature injection test response time, over-temperature injection test temperature change rate, and over-temperature injection test fan response time compensation factors corresponding to the current over-temperature injection test response time, over-temperature injection test temperature change rate, and over-temperature injection test fan response time.

[0054] Reference Figure 2As shown, the second aspect of the present invention provides a method for testing PC power supply failure, comprising the following steps: under standard working conditions, testing the PC power supply to be tested with a static load to obtain a static load state data set of the PC power supply to be tested; under standard working conditions, testing the PC power supply to be tested with a dynamic load to obtain a dynamic load fluctuation data set of the PC power supply to be tested; combining the static load state data set of the PC power supply to be tested and the dynamic load fluctuation data set of the PC power supply to be tested, comprehensively analyzing to obtain a first test evaluation value of the PC power supply to be tested; based on the first test evaluation value of the PC power supply to be tested, obtaining the number of fault injection tests; based on the number of fault injection tests, performing a fault injection test on the PC power supply to be tested to obtain a fault injection test data set of the PC power supply to be tested; based on the fault injection test data set of the PC power supply to be tested, judging the fault adaptability level of the PC power supply to be tested.

[0055] It should be explained that, by providing a test platform and test method for PC power supply failure, static load testing is performed under standard working conditions, so that basic performance data of the power supply in a stable state can be obtained, and the situation under load changes in actual applications can be simulated, so as to evaluate the dynamic response capability of the power supply. Combining static and dynamic load data provides a more comprehensive perspective for the overall performance of the power supply, helps to judge the reliability and adaptability of the power supply, and provides improvement guidance. Through actual fault injection testing, behavioral data on power supply failure can be obtained, and the adaptability of the power supply can be comprehensively evaluated based on the fault test results, which helps to provide decision support for the use of the power supply, including selecting a suitable power supply application environment and formulating maintenance strategies.

[0056] The above contents are merely examples and explanations of the structure of the present invention. The technicians in this technical field may make various modifications or additions to the specific embodiments described or replace them in a similar manner. As long as they do not deviate from the structure of the invention or exceed the scope defined by the claims, they should all fall within the protection scope of the present invention.

Claims

1. A PC power failure test platform, characterized in that: It includes a static load state data set acquisition module, a dynamic load fluctuation data set acquisition module, a first test evaluation value analysis module, a fault injection test number acquisition module, a fault injection test data set acquisition module and a fault adaptability level judgment module, wherein: The static load state data set acquisition module is used to test the PC power supply to be tested with a static load under standard working conditions to acquire the static load state data set of the PC power supply to be tested; The dynamic load fluctuation data set acquisition module is used to test the PC power supply to be tested with a dynamic load under standard working conditions to acquire the dynamic load fluctuation data set of the PC power supply to be tested; The first test evaluation value analysis module is used to combine the static load state data set of the PC power supply to be tested and the dynamic load fluctuation data set of the PC power supply to be tested, and comprehensively analyze to obtain the first test evaluation value of the PC power supply to be tested; The fault injection test number acquisition module is used to obtain the fault injection test number based on the first test evaluation value of the PC power supply to be tested; The fault injection test data set acquisition module is used to perform a fault injection test on the PC power supply to be tested based on the number of fault injection tests, and acquire a fault injection test data set for the PC power supply to be tested; The fault adaptability level judgment module is used to judge the fault adaptability level of the PC power supply to be tested based on the PC power supply fault injection test data set to be tested.

2. A PC power failure test platform according to claim 1, characterized in that: The PC power supply static load state data set to be tested specifically includes static load power factor, static load voltage stable time ratio, and static load average noise decibel value.

3. A PC power failure test platform according to claim 1, characterized in that: The PC power supply dynamic load fluctuation data set to be tested specifically includes the average response time required for load changes and the average noise decibel value of load changes.

4. A PC power failure test platform according to claim 1, characterized in that: The comprehensive analysis obtains the first test evaluation value of the PC power supply to be tested, and the specific analysis process is as follows: Based on the static load state data set of the PC power supply to be tested and the dynamic load fluctuation data set of the PC power supply to be tested, a first test evaluation value of the PC power supply to be tested is obtained through comprehensive analysis, and the first test evaluation value of the PC power supply to be tested is used as an analysis basis for obtaining the number of fault injection tests; The first test evaluation value of the PC power supply needs to be tested. The specific analysis process is as follows: In the formula, To test the first test evaluation value of the PC power supply, is the static load power factor, is the proportion of static load voltage stability time, is the average noise decibel value under static load, is the average response time required for load changes, is the average noise decibel value of load change, is the compensation factor of the set static load power factor, is the compensation factor for the set static load voltage stability duration, is the compensation factor for the set average noise decibel value of the static load, The compensation factor for the average response time required for a set load change, It is the compensation factor for the average noise decibel value of the set load change.

5. A PC power failure test platform according to claim 1, characterized in that: The fault injection test times are obtained based on the first test evaluation value of the PC power supply to be tested, and the specific analysis process compares the first test evaluation value of the PC power supply to be tested with the first test evaluation value of the PC power supply to be tested stored in the database; If the first test evaluation value of the PC power supply to be tested is higher than or equal to the first test reference evaluation value of the PC power supply to be tested, the test result of the PC power supply to be tested corresponding to the first test evaluation value of the PC power supply to be tested under the standard working conditions is qualified, and the number of fault injection tests of the PC power supply to be tested is the reference number of fault injection tests stored in the database; If the first test evaluation value of the PC power supply to be tested is lower than the first test reference evaluation value of the PC power supply to be tested, the test result of the PC power supply to be tested corresponding to the first test evaluation value of the PC power supply to be tested under standard working conditions is unqualified, then the first test evaluation value of the PC power supply to be tested is compared with the number of fault injection tests corresponding to the first test evaluation values ​​of each PC power supply to be tested stored in the database to obtain the number of fault injection tests corresponding to the first test evaluation value of the PC power supply to be tested, and the number of fault injection tests corresponding to the first test evaluation value of the PC power supply to be tested represents the number of fault injection tests of the PC power supply to be tested corresponding to the first test evaluation value of the PC power supply to be tested.

6. A PC power failure test platform according to claim 1, characterized in that: The PC power supply fault injection test data set to be tested specifically includes a PC power supply short circuit injection test data set to be tested, a PC power supply overload injection test data set to be tested, and a PC power supply over-temperature injection test data set to be tested; The PC power supply short-circuit injection test data set to be tested specifically includes short-circuit injection test response time, short-circuit injection test current peak value, and short-circuit injection test noise decibel value; The PC power overload injection test data set to be tested specifically includes the overload injection test response time, the absolute value of the difference between the actual power and the reference power of the overload injection test, and the number of instantaneous voltage fluctuations in the overload injection test; The PC power supply over-temperature injection test data set to be tested specifically includes an over-temperature injection test response time, an over-temperature injection test temperature change rate, and an over-temperature injection test fan response time.

7. A PC power failure test platform according to claim 1, characterized in that: The power supply failure adaptability level of the PC to be tested is determined based on the test data set of the PC power supply failure injection test. The specific analysis process is as follows: Based on the short-circuit injection test data set of the PC power supply to be tested, a short-circuit injection test evaluation value is obtained through comprehensive analysis. The short-circuit injection test evaluation value is used as the analysis basis for judging the fault adaptability level of the PC power supply to be tested. Based on the overload injection test data set of the PC power supply to be tested, the overload injection test evaluation value is obtained through comprehensive analysis. The overload injection test evaluation value is used as the analysis basis for judging the fault adaptability level of the PC power supply to be tested. Based on the over-temperature injection test data set of the PC power supply to be tested, the over-temperature injection test evaluation value is obtained through comprehensive analysis. The over-temperature injection test evaluation value is used as the analysis basis for judging the fault adaptability level of the PC power supply to be tested. The short-circuit injection test evaluation value, the overload injection test evaluation value and the over-temperature injection test evaluation value are comprehensively analyzed to obtain the second test evaluation value of the PC power supply to be tested, and the second test evaluation value of the PC power supply to be tested is used as an analysis basis for determining the fault adaptability level of the PC power supply to be tested; Compare the second test evaluation value of the PC power supply to be tested with the second test reference evaluation value of the PC power supply to be tested stored in the database; If the second test evaluation value of the PC power supply to be tested is higher than the second test reference evaluation value of the PC power supply to be tested, the PC power supply to be tested fault adaptability level corresponding to the second test evaluation value of the PC power supply to be tested is level three; If the second test evaluation value of the PC power supply to be tested is equal to the second test reference evaluation value of the PC power supply to be tested, the fault adaptability level of the PC power supply to be tested corresponding to the second test evaluation value of the PC power supply to be tested is level 2; If the second test evaluation value of the PC power supply to be tested is lower than the second test reference evaluation value of the PC power supply to be tested, the fault adaptability level of the PC power supply to be tested corresponding to the second test evaluation value of the PC power supply to be tested is level one.

8. A PC power failure test platform according to claim 7, characterized in that: The second test evaluation value of the PC power supply to be tested, the specific analysis process is: ； In the formula, To test the second test evaluation value of the PC power supply, Evaluated value for short circuit injection test, Inject test evaluation values ​​for overloads, For over temperature injection test evaluation value, is a natural constant.

9. A PC power failure test platform according to claim 7, characterized in that: The short-circuit injection test evaluation value, the specific analysis process is: ； In the formula, Evaluated value for short circuit injection test, The short circuit injection test response time. Inject test current peak value for short circuit, The decibel value of the short circuit injection test noise, The compensation factor for the set short-circuit injection test response time, The compensation factor for the peak value of the short-circuit injection test current is set. The compensation factor for the set short-circuit injection test noise decibel value, is a natural constant.

10. A method for testing a PC power failure, using a PC power failure testing platform as claimed in any one of claims 1 to 9, characterized in that: The following steps are involved: Under standard working conditions, the PC power supply to be tested is tested with a static load to obtain a static load state data set of the PC power supply to be tested; Under standard working conditions, the PC power supply to be tested is tested with a dynamic load to obtain a dynamic load fluctuation data set of the PC power supply to be tested; Combining the static load state data set of the PC power supply to be tested and the dynamic load fluctuation data set of the PC power supply to be tested, a comprehensive analysis is performed to obtain the first test evaluation value of the PC power supply to be tested; Based on the first test evaluation value of the PC power supply to be tested, the number of fault injection tests is obtained; Based on the number of fault injection tests, a fault injection test is performed on the PC power supply to be tested, and a fault injection test data set of the PC power supply to be tested is obtained; Based on the test data set of the PC power supply fault injection, the power supply fault adaptability level of the PC to be tested is determined.

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