Smart card test method, system, equipment and medium

Abstract

The invention discloses a smart card test method and device and a medium. The method comprises the following steps: acquiring test information of a smart card; analyzing the test scheme to obtain an associated test project; selecting a first performance function handle in the test project according to the test information; analyzing the test case to obtain a second performance function handle; and selecting a performance function corresponding to the second performance function handle according to the first performance function handle, generating a test code after the main function executes the performance function, and testing the intelligent card by the test code. The multiple performance functions in the test case can be called through the first performance function handle of the test project, so that the multiple performance functions are integrated in one test case, the address of the test case only needs to be called once, the main function of the test case also only needs to be called once, the analysis time of the test case is greatly saved, and the analysis efficiency of the test case is improved. The intelligent card testing method can be widely applied to the technical field of data processing.

Description

Technical Field

[0001] The present invention relates to the field of data processing technology, and in particular to a smart card testing method, system, equipment and medium. Background Art

[0002] With the development of the smart card industry, there are more and more types of smart cards, such as bank cards, social security cards, mobile phone SIM cards, etc. These smart cards may have different applications installed, or the same application installed but different card issuance data written into them.

[0003] In the prior art, the smart card is tested by using multiple test cases, and the test cases of the same type are classified into test plans, test projects and test cases. When the software is loaded to parse the test cases, each test case needs to be indexed to the corresponding file path according to the file name of the test case in the test project, and then the main function in each test case is repeatedly executed to call the functional function.

[0004] Due to the large number of test case files, repeated execution of the main function calling the functional function results in slow test case parsing and low smart card testing efficiency. Summary of the invention

[0005] In view of this, an object of the embodiments of the present invention is to provide a smart card testing method, system, device and medium, which can increase the parsing speed of test cases and improve the testing efficiency of smart cards.

[0006] In a first aspect, an embodiment of the present invention provides a smart card testing method, which is applied to a smart card testing system, wherein the smart card testing system includes a test terminal and a smart card, wherein the test terminal is provided with a test component, wherein the test component includes a test scheme, a test project and a test case, wherein the test project includes a test case path, a test case name and a first number of first function function handles, wherein the test case includes a main function, a first number of second function function handles and a first number of function functions, wherein the second function function handle corresponds to the first function function handle, and wherein the smart card testing method includes:

[0007] Acquiring test information of the smart card through the test terminal, wherein the test information represents a test type of the smart card;

[0008] The test terminal selects the test scheme according to the test information;

[0009] The test terminal parses the test scheme to obtain the associated test project;

[0010] The test terminal selects a first function handle in the test project according to the test information;

[0011] The test terminal parses the test case according to the test case path and the test case name to obtain the card reader configuration parameters, one main function, a first number of the second function function handles and a first number of the function functions;

[0012] The test terminal selects the function corresponding to the second function handle according to the first function function handle, and the main function generates a test code after executing the function function, and sends the test code to the card reader corresponding to the card reader configuration parameters to test the smart card on the card reader, and generates a test result after the smart card test is completed.

[0013] In some optional embodiments, the test scheme includes a second number of project paths and a second number of project names, and the test terminal parses the test scheme to obtain the associated test project, including:

[0014] The test terminal selects a matching project according to a preset project list corresponding to the test scheme and the test information, wherein the preset project list includes a second number of project paths and a second number of project names and corresponding test contents;

[0015] The test terminal obtains the matching project path and the matching project name of the matching project from the preset project list;

[0016] The test terminal searches for the test project according to the matching project path and the matching project name.

[0017] In some optional embodiments, the test component includes a second number of the test projects, and after the test terminal parses the test solution to obtain the associated test projects, the test includes:

[0018] The test terminal selects a matching project from a second number of the test projects according to the test information;

[0019] The test terminal acquires and matches test cases according to the matching project, and the matching test cases correspond to the matching project;

[0020] The test terminal generates a matching test plan according to the matching project and the matching test case, and the matching test plan corresponds to the matching project alone;

[0021] The test terminal tests the smart card after executing the matching test solution.

[0022] In some optional embodiments, the test terminal performs a test on the smart card after executing the matching test scheme, including:

[0023] The test terminal sends the matching test solution to test execution software, and the test execution software is set in the test terminal;

[0024] The test execution software executes the matching test solution, obtains and executes the matching project to generate the test code;

[0025] The test execution software sends the test code to the smart card located in the card reader, so that the smart card generates a test result after executing a test operation.

[0026] In some optional embodiments, the test terminal selects the function corresponding to the second function handle according to the first function handle, including:

[0027] The test terminal selects a third number of the second function handles according to a third number of the first function handles, where the third number is less than or equal to the first number;

[0028] The test terminal selects a third number of the function functions according to a third number of the second function function handles.

[0029] In some optional embodiments, after the test terminal selects a third number of the function functions according to a third number of the second function function handles, the method further comprises:

[0030] Sending a third number of the second function handles to the main function;

[0031] The main function calls a third number of the function functions according to a third number of the second function function handles, and generates the test code after executing the third number of the function functions.

[0032] In some optional embodiments, the smart card testing system further includes a server, and the smart card testing method further includes:

[0033] Storing the test plan, the test project and the test case by the server;

[0034] The interface of the test terminal displays a test scheme control, and in response to the operation of clicking the test scheme control and the test project control in sequence on the interface, generates an address of the test scheme and an address of the test project;

[0035] The test terminal sends the address of the test plan and the address of the test project to the server, so that the server obtains the test plan and the test project, and generates a matching test plan for the test project and the test case corresponding to the test project;

[0036] The matching test scheme is received and executed by test execution software, and the test execution software is arranged in the test terminal or other terminals.

[0037] In a second aspect, an embodiment of the present invention provides a smart card testing system, which applies the above-mentioned smart card testing method, including:

[0038] The first module is used to obtain test information of the smart card, where the test information represents the test type of the smart card;

[0039] A second module is used to select the test scheme according to the test information;

[0040] A third module is used to parse the test scheme to obtain the associated test project;

[0041] A fourth module is used to select a first functional handle in the test project according to the test information;

[0042] A fifth module is used to parse the test case according to the test case path and the test case name to obtain the card reader configuration parameters, one main function, a first number of the second function function handles and a first number of the function functions;

[0043] The sixth module is used to select the function function corresponding to the second function function handle according to the first function function handle, generate a test code after the main function executes the function function, and send the test code to the card reader corresponding to the card reader configuration parameters to test the smart card on the card reader, and generate a test result after the smart card test is completed.

[0044] In a third aspect, an embodiment of the present invention provides a computer device, comprising a processor, a memory, and a computer program stored in the memory and executable by the processor, wherein the steps of the above method are implemented when the computer program is executed by the processor.

[0045] In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium, in which a program executable by a processor is stored. When the program executable by the processor is executed by the processor, it is used to perform the method as described above.

[0046] Implementation of the embodiments of the present invention includes the following beneficial effects: The embodiments of the present invention provide a smart card testing method, including: obtaining test information of the smart card through the test terminal, the test information characterizing the test type of the smart card; the test terminal selecting the test scheme according to the test information; the test terminal parsing the test scheme to obtain the associated test project; the test terminal selecting the first function handle in the test project according to the test information; the test terminal parsing the test case according to the test case path and the test case name to obtain the reader configuration parameters, a main function, a first number of the second function function handles and a first number of the function functions; the test terminal selecting the function function corresponding to the second function function handle according to the first function function handle, the main function generating a test code after executing the function function, sending the test code to the card reader corresponding to the card reader configuration parameter, so that the smart card on the card reader is tested, and generating a test result after the smart card test is completed. Through the first function handle of the test project, multiple function functions in the test case can be called, thereby integrating multiple function functions into one test case. The address of the test case only needs to be called once, and the main function of the test case only needs to be called once, which greatly saves the parsing time of the test case and improves the efficiency of smart card testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] Figure 1 is a structural schematic diagram of a smart card testing system provided by an embodiment of the present invention;

[0048] Figure 2 is a flow chart of a smart card testing method provided by an embodiment of the present invention;

[0049] Figure 3 is a structural block diagram of another smart card testing system provided by an embodiment of the present invention;

[0050] Figure 4 It is a schematic block diagram of the structure of a computer device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0051] Embodiments of the present invention are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0052] In the description of the present invention, it should be understood that descriptions involving orientation, such as up, down, front, back, left, right, etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0053] In the description of the present invention, "several" means one or more, "more" means more than two, "greater than", "less than", "exceed" etc. are understood as not including the number itself, and "above", "below", "within" etc. are understood as including the number itself. If there is a description of "first" or "second", it is only used for the purpose of distinguishing the technical features, and cannot be understood as indicating or implying the relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.

[0054] In the description of the present invention, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in the present invention based on the specific content of the technical solution.

[0055] An embodiment of the present invention provides a smart card testing method, device and medium, wherein the smart card testing method includes: obtaining test information of a smart card through the test terminal, wherein the test information represents a test type of the smart card; the test terminal selects the test scheme according to the test information; the test terminal parses the test scheme to obtain the associated test project; the test terminal selects a first function handle in the test project according to the test information; the test terminal parses the test case according to the test case path and the test case name to obtain a card reader configuration parameter, a main function, a first number of the second function function handles and a first number of the function functions; the test terminal selects the function corresponding to the second function function handle according to the first function function handle, the main function generates a test code after executing the function function, and sends the test code to the card reader corresponding to the card reader configuration parameter, so that the smart card on the card reader is tested, and a test result is generated after the smart card test is completed. Through the first function handle of the test project, multiple function functions in the test case can be called, thereby integrating multiple function functions into one test case. The address of the test case only needs to be called once, and the main function of the test case only needs to be called once, which greatly saves the parsing time of the test case and improves the efficiency of smart card testing.

[0056] First, the implementation environment of the present invention is exemplified. This example does not limit the specific device structure, but is a specific implementation environment in which the technical solution of the present invention can be executed. Figure 1 , Figure 1 The present invention is an implementation environment diagram of an embodiment of the present invention. The smart card test system of this embodiment includes a test terminal and a smart card. The test terminal is provided with a test component, and the test component includes a test scheme, a test project and a test case. The test project includes a test case path, a test case name and a first number of first function function handles. The test case includes a main function, a first number of second function function handles and a first number of function functions. The second function function handle corresponds to the first function function handle; that is, the first test scheme can reference the second number of test projects, and a test project can reference the second number of function functions of multiple test cases. The test scheme is executed by the test execution software of the test terminal, thereby generating a corresponding test code, and the test code is sent to the smart card on the card reader. The smart card program in the smart card executes the corresponding test operation and generates a corresponding test result after the test is completed.

[0057] The following is based on the Figure 1 The implementation environment shown is used to further illustrate the control method of the embodiment of the present invention.

[0058] Reference Figure 2 , Figure 2 A flowchart of a smart card testing method provided by an embodiment of the present invention, the smart card testing method includes but is not limited to the following steps:

[0059] S201, obtaining test information of a smart card through the test terminal, where the test information represents a test type of the smart card;

[0060] S202, the test terminal selects the test scheme according to the test information;

[0061] S203, the test terminal parses the test solution to obtain the associated test project;

[0062] S204, the test terminal selects a first function handle in the test project according to the test information;

[0063] S205, the test terminal parses the test case according to the test case path and the test case name to obtain a card reader configuration parameter, one main function, a first number of the second function function handles and a first number of the function functions;

[0064] S206, the test terminal selects the function corresponding to the second function handle according to the first function function handle, the main function generates a test code after executing the function, and sends the test code to the card reader corresponding to the card reader configuration parameters to test the smart card on the card reader, and generates a test result after the smart card test is completed.

[0065] It should be noted that the present application changes the content of the test project into the form of test case name + test case file address + function function handle, and then places the function functions in the original multiple test cases into a test case file, and retains a main function. Through this method, the original first number (the first number is set according to demand, such as 100, not specifically limited) of test cases are integrated into a test case file. When parsing, it is only necessary to index the test case file path once (originally due to the existence of the first number of test cases, the first number of indexes is required), and the first number of function functions can be parsed for execution, and each parsing does not need to be called again by the main function (that is, the first number of function functions can be executed through a main function), the parsing speed is increased by the first number of times, and the occupation of computer hardware device resources by the process is reduced, and there will be no stuck phenomenon.

[0066] The files in the test script program for testing the smart card in the test terminal are associated in three levels, namely:

[0067] The first level is the test plan file: it can be associated with multiple test project files, and the content is the test project relative path + test project relative address;

[0068] The second level is the test project file: it can be associated with multiple test case files, and the content is the test case relative path name + test case name + function handle;

[0069] The third level is the test case file: the content is the card reader configuration parameters + a main function + multiple function handles + multiple function functions;

[0070] In terms of function structure, the handle of the function is called as a parameter in the upper layer test project, that is, the second function handle is called through the first function handle, and the first function handle and the second function handle are equal, that is, the function handle in the test project can call the function handle equal to it in the test case, or the function handle in the test project can call the function handle associated with it in the test case. The specific calling method is not limited here. The first function function handle exists as an extended parameter of the test case path + name, and can be infinitely extended, that is, the more extensions there are, the more function functions can be called, and even appear in the form of a list. When traversing the extension or list, each test case can be parsed synchronously, and the parsing speed is fast, thereby improving the test efficiency.

[0071] In some optional embodiments, the test scheme includes a second number of project paths and a second number of project names, Figure 2 Step 203 shown includes but is not limited to: the test terminal selects a matching project based on a preset project list corresponding to the test plan and the test information, the preset project list including a second number of the project paths and a second number of the project names and corresponding test contents; the test terminal obtains the matching project path and the matching project name of the matching project from the preset project list; the test terminal searches for the test project based on the matching project path and the matching project name.

[0072] Specifically, different types of tests on smart cards require the selection of different test plans. The test project corresponding to the test plan and the specific test content of the test project are stored through a preset project list. When the test information of the smart card is obtained, the corresponding test plan is selected by parsing the test type corresponding to the test information, and the corresponding test project is selected according to the corresponding test content; that is, a matching test project with the same specific test content as the smart card is selected from the preset project list stored in the test plan, and the pre-stored matching project path and matching project name are obtained from the preset project list, so as to search for the corresponding test project according to the matching project path and matching project name.

[0073] In some optional embodiments, the test component includes a second number of the test projects. Figure 2After step 203 shown, it includes but is not limited to: the test terminal selects a matching project from the second number of test projects according to the test information; the test terminal obtains and matches test cases according to the matching project, and the matching test cases correspond to the matching project; the test terminal generates a matching test plan according to the matching project and the matching test cases, and the matching test plan corresponds to the matching project alone; the test terminal tests the smart card after executing the matching test plan.

[0074] Specifically, when conducting a smart card test, the test type and test content of the smart card are first obtained to obtain the corresponding test information, and the test execution software of the test terminal selects the corresponding test plan according to the test information, and obtains the test project associated with the test plan from the test plan; because the test plan includes multiple test projects, and the test project required for the smart card test may be only one or several of them, this causes a waste of test projects, and the test projects can only be used in the original test plan, with poor portability; when other smart card tests also call the same test plan as the smart card being tested, the test projects used by other smart cards need to be completed with the smart card being tested before corresponding maintenance can be carried out, and the test execution software executes the test projects in sequence, resulting in tests being carried out in series, the test time is equal to the sum of the time of each test project, the test efficiency is slow, and the independence is poor.

[0075] Therefore, the required matching test project is selected through the specific test information of the smart card, and a new test plan is generated according to the test cases associated with the matching test project, which is the matching test plan; the matching test plan can be transplanted to other test terminals for testing, or it can be executed separately, so that the corresponding test plan can be generated according to different smart cards or different test types and test contents to test the smart card. The test project of the original test plan is re-divided to establish a new test plan, so that each test project can be divided and a new test plan can be generated, so that multiple smart cards can be tested in parallel independently, with high test efficiency, independent test time, and no need to wait for other test projects to be completed before performing inspection and maintenance on a single test project.

[0076] In some optional embodiments, the test terminal tests the smart card after executing the matching test scheme, including: the test terminal sends the matching test scheme to the test execution software, and the test execution software is set in the test terminal; the test execution software executes the matching test scheme, obtains and executes the matching project to generate the test code; the test execution software sends the test code to the smart card located in the card reader, so that the smart card generates a test result after executing the test operation.

[0077] Specifically, the test execution software of the test terminal executes the test operation on the smart card, sends the matching test plan to the test execution software, and the test execution software executes the matching test plan, thereby obtaining the matching test project according to the specific test information, selecting the test case and the corresponding function of the test project according to the specific test content, and generating the corresponding test code after execution; the test code is sent to the address of the configuration parameters in the test case, that is, the configuration parameters of the card reader, so that the test code is sent to the card reader, and the smart card on the card reader receives the test code, so that the program in the smart card executes the corresponding test operation, and the smart card generates the corresponding test results after the test is completed. The test results can be sent to the display interface of the test terminal for display, and also sent to the server for cloud storage for subsequent remote calls; the subsequent test plan of the smart card can also be selected according to the corresponding test results, which is not limited here.

[0078] In some optional embodiments, Figure 2 The test terminal in step 206 shown selects the function function corresponding to the second function function handle based on the first function function handle, including but not limited to: the test terminal selects a third number of the second function function handles based on the third number of the first function function handles, and the third number is less than or equal to the first number; the test terminal selects a third number of the function functions based on the third number of the second function function handles.

[0079] Specifically, the first function handle in the test project corresponds to the second function handle in the test case, and the test execution software can call the second function handle through the first function handle, thereby calling the corresponding function. A test case includes multiple function functions, and multiple function functions can be executed through the main function; a test project can also be associated with multiple test cases, each test case includes multiple function functions, and the specific number of test cases is not limited here. Each time, a third number of first function function handles can be called, thereby selecting a third number of second function function handles, and then calling a third number of function functions. The third number is less than or equal to the first number, that is, the test project can be called at most, including all test cases and all function functions included in the test cases, and the test efficiency is high.

[0080] In some optional embodiments, after the test terminal selects a third number of the function functions according to a third number of the second function function handles, it includes: sending a third number of the second function function handles to the main function; the main function calls a third number of the function functions according to the third number of the second function function handles, and generates the test code after executing the third number of the function functions.

[0081] Specifically, a third number of the second function handles are executed through the main function, thereby calling the function associated with the second function handle, and generating corresponding test code after execution.

[0082] In some optional embodiments, the smart card testing system also includes a server, and the smart card testing method also includes: storing the test plan, the test project and the test case by the server; the interface of the test terminal displays the test plan control, and generates the address of the test plan and the address of the test project in response to the operation of clicking the test plan control and the test project control in sequence on the interface; the test terminal sends the address of the test plan and the address of the test project to the server, so that the server obtains the test plan and the test project, and generates a matching test plan for the test project and the test case corresponding to the test project; receiving and executing the matching test plan by test execution software, and the test execution software is set in the test terminal or other terminals.

[0083] Specifically, the test terminal is provided with a display interface, and a corresponding test page is displayed on the display interface. The test plan is uploaded to the server in advance, and the test terminal parses the test plan, test project and test case in turn and sends them to the test page on the display interface. At this time, the user selects the test plan and the corresponding test project to be executed according to the specific test, or the test plan, test project and test case required now. The test terminal forms the middleware with the data selected by the user and the test engine. The test engine is the address corresponding to the test plan selected by the user on the server, or the address corresponding to the test plan, test project and / or test case selected by the user. The specific details are not limited here. The middleware then obtains and parses the required test plan on the server, and then splits the test plan and packages it into a new test plan. The new test plan only includes the test project required by the user and the test case corresponding to the test project. The server sends the new test plan to the test terminal for execution; or sends it to the test execution software on the computer / other test terminals added to the local area network. By calling the interface of the test execution software, the test execution software registers the service to the computer / other test terminals, so that the test engine can search and call the interface according to the IP+port of the computer / other test terminal. The test execution software will receive the new test plan of the service, and then parse the test plan, test project and test case in turn, and then execute the corresponding test; the splitting and transplantation of the test project is realized, the test speed is fast, and the application range is wide.

[0084] Implementation of the embodiments of the present invention includes the following beneficial effects: The embodiments of the present invention provide a smart card testing method, including: obtaining test information of the smart card through the test terminal, the test information characterizing the test type of the smart card; the test terminal selecting the test scheme according to the test information; the test terminal parsing the test scheme to obtain the associated test project; the test terminal selecting the first function handle in the test project according to the test information; the test terminal parsing the test case according to the test case path and the test case name to obtain the reader configuration parameters, a main function, a first number of the second function function handles and a first number of the function functions; the test terminal selecting the function function corresponding to the second function function handle according to the first function function handle, the main function generating a test code after executing the function function, sending the test code to the card reader corresponding to the card reader configuration parameter, so that the smart card on the card reader is tested, and generating a test result after the smart card test is completed. Through the first function handle of the test project, multiple function functions in the test case can be called, thereby integrating multiple function functions into one test case. The address of the test case only needs to be called once, and the main function of the test case only needs to be called once, which greatly saves the parsing time of the test case and improves the efficiency of smart card testing.

[0085] like Figure 3 As shown, in a second aspect, an embodiment of the present invention further provides a smart card testing system, applying the above-mentioned smart card testing method, including:

[0086] The first module is used to obtain test information of the smart card, where the test information represents the test type of the smart card;

[0087] A second module is used to select the test scheme according to the test information;

[0088] A third module is used to parse the test scheme to obtain the associated test project;

[0089] A fourth module is used to select a first functional handle in the test project according to the test information;

[0090] A fifth module is used to parse the test case according to the test case path and the test case name to obtain the card reader configuration parameters, one main function, a first number of the second function function handles and a first number of the function functions;

[0091] The sixth module is used to select the function function corresponding to the second function function handle according to the first function function handle, generate a test code after the main function executes the function function, and send the test code to the card reader corresponding to the card reader configuration parameters to test the smart card on the card reader, and generate a test result after the smart card test is completed.

[0092] It can be seen that the contents of the above method embodiments are all applicable to the present system embodiments, the functions specifically implemented by the present system embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0093] like Figure 4 As shown, in the third aspect, an embodiment of the present invention further provides a computer device, which can be a terminal. The computer device includes a processor, a memory, and a network interface connected via a system bus, wherein the memory may include a non-volatile storage medium and an internal memory. The non-volatile storage medium can store an operating system and a computer program. The computer program includes program instructions, which, when executed, enable the processor to execute any one of the methods for visual management of industrial equipment. The processor is used to provide computing and control capabilities to support the operation of the entire computer device. The internal memory provides an environment for the operation of the computer program in the non-volatile storage medium, which, when executed by the processor, enables the processor to execute any one of the methods for visual management of industrial equipment. The network interface is used for network communications, such as sending assigned tasks, etc. Those skilled in the art will understand that Figure 4 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present disclosure, and does not constitute a limitation on the computer device to which the solution of the present disclosure is applied. The specific computer device may include Figure 4More or less components shown in, or some components are combined, or there are different component arrangements. It should be understood that the processor can be a central processing unit (CPU), and the processor can also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field programmable gate arrays (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components, etc. Among them, the general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc. In one embodiment, the processor is used to run a computer program stored in a memory to implement the following steps: obtaining test information of a smart card through the test terminal, the test information representing a test type of the smart card; the test terminal selecting the test scheme according to the test information; the test terminal parsing the test scheme to obtain the associated test project; the test terminal selecting a first function handle in the test project according to the test information; the test terminal parsing the test case according to the test case path and the test case name to obtain a card reader configuration parameter, a main function, a first number of the second function function handles and a first number of the function functions; the test terminal selecting the function function corresponding to the second function function handle according to the first function function handle, the main function generating a test code after executing the function function, and sending the test code to the card reader corresponding to the card reader configuration parameter, so that the smart card on the card reader is tested, and a test result is generated after the smart card test is completed.

[0094] It can be seen that the contents of the above method embodiments are all applicable to the present device embodiments, the functions specifically implemented by the present device embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0095] In addition, the embodiment of the present application also discloses a computer program product or a computer program, and the computer program product or the computer program is stored in a computer-readable storage medium. The processor of the computer device can read the computer program from the computer-readable storage medium, and the processor executes the computer program, so that the computer device performs the above method. Similarly, the contents in the above method embodiment are all applicable to the storage medium embodiment, and the functions specifically implemented by the storage medium embodiment are the same as those in the above method embodiment, and the beneficial effects achieved are also the same as those achieved by the above method embodiment.

[0096] It is understood that all or some steps and systems in the disclosed method above can be implemented as software, firmware, hardware and appropriate combinations thereof. Some physical components or all physical components can be implemented as software executed by a processor, such as a central processing unit, a digital information processor or a microprocessor, or implemented as hardware, or implemented as an integrated circuit, such as an application-specific integrated circuit. Such software can be distributed on a computer-readable medium, and the computer-readable medium can include a computer storage medium (or a non-transitory medium) and a communication medium (or a temporary medium). As known to those of ordinary skill in the art, the term computer storage medium includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storing information (such as computer-readable instructions, data structures, program modules or other data). Computer storage media include, but are not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital versatile disk (DVD) or other optical disk storage, magnetic cassette, magnetic tape, disk storage or other magnetic storage device, or any other medium that can be used to store desired information and can be accessed by a computer. Furthermore, it is well known to those skilled in the art that communication media generally contain computer readable instructions, data structures, program modules, or other data in modulated data information such as carrier waves or other transport mechanisms, and may include any information delivery media.

[0097] The embodiments of the present invention are described in detail above with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge scope of ordinary technicians in the technical field without departing from the purpose of the present invention.

Claims

1. A smart card testing method, characterized in that: Applied to a smart card test system, the smart card test system includes a test terminal and a smart card, the test terminal is provided with a test component, the test component includes a test scheme, a test project and a test case, the test project includes a test case path, a test case name and a first number of first function function handles, the test case includes a main function, a first number of second function function handles and a first number of function functions, the second function function handle corresponds to the first function function handle, and the smart card test method includes: Acquiring test information of the smart card through the test terminal, wherein the test information represents a test type of the smart card; The test terminal selects the test scheme according to the test information; The test terminal parses the test scheme to obtain the associated test project; The test terminal selects a first function handle in the test project according to the test information; The test terminal parses the test case according to the test case path and the test case name to obtain the card reader configuration parameters, one main function, a first number of the second function function handles and a first number of the function functions; The test terminal selects the function corresponding to the second function handle according to the first function function handle, and the main function generates a test code after executing the function function, and sends the test code to the card reader corresponding to the card reader configuration parameters to test the smart card on the card reader, and generates a test result after the smart card test is completed.

2. The method according to claim 1, characterized in that The test scheme includes a second number of project paths and a second number of project names, and the test terminal parses the test scheme to obtain the associated test project, including: The test terminal selects a matching project according to a preset project list corresponding to the test scheme and the test information, wherein the preset project list includes a second number of project paths and a second number of project names and corresponding test contents; The test terminal obtains the matching project path and the matching project name of the matching project from the preset project list; The test terminal searches for the test project according to the matching project path and the matching project name.

3. The method according to claim 1, characterized in that: The test component includes a second number of the test projects, and after the test terminal parses the test solution to obtain the associated test projects, the test includes: The test terminal selects a matching project from a second number of the test projects according to the test information; The test terminal acquires and matches test cases according to the matching project, and the matching test cases correspond to the matching project; The test terminal generates a matching test plan according to the matching project and the matching test case, and the matching test plan corresponds to the matching project alone; The test terminal tests the smart card after executing the matching test solution.

4. The method according to claim 3, characterized in that The test terminal performs a test on the smart card after executing the matching test scheme, including: The test terminal sends the matching test solution to test execution software, and the test execution software is set in the test terminal; The test execution software executes the matching test solution, obtains and executes the matching project to generate the test code; The test execution software sends the test code to the smart card located in the card reader, so that the smart card generates a test result after executing a test operation.

5. The method according to claim 1, characterized in that The test terminal selects the function corresponding to the second function handle according to the first function handle, including: The test terminal selects a third number of the second function handles according to a third number of the first function handles, where the third number is less than or equal to the first number; The test terminal selects a third number of the function functions according to a third number of the second function function handles.

6. The method according to claim 5, characterized in that After the test terminal selects a third number of the function functions according to the third number of the second function function handles, the method includes: Sending a third number of the second function handles to the main function; The main function calls a third number of the function functions according to a third number of the second function function handles, and generates the test code after executing the third number of the function functions.

7. The method according to claim 1, characterized in that The smart card testing system further includes a server, and the smart card testing method further includes: Storing the test plan, the test project and the test case by the server; The interface of the test terminal displays a test scheme control, and in response to the operation of clicking the test scheme control and the test project control in sequence on the interface, generates an address of the test scheme and an address of the test project; The test terminal sends the address of the test plan and the address of the test project to the server, so that the server obtains the test plan and the test project, and generates a matching test plan for the test project and the test case corresponding to the test project; The matching test scheme is received and executed by test execution software, and the test execution software is arranged in the test terminal or other terminals.

8. A smart card testing system, characterized in that: The smart card testing method according to claim 1 comprises: The first module is used to obtain test information of the smart card, where the test information represents the test type of the smart card; A second module is used to select the test scheme according to the test information; A third module is used to parse the test scheme to obtain the associated test project; A fourth module is used to select a first functional handle in the test project according to the test information; A fifth module is used to parse the test case according to the test case path and the test case name to obtain the card reader configuration parameters, one main function, a first number of the second function function handles and a first number of the function functions; The sixth module is used to select the function function corresponding to the second function function handle according to the first function function handle, generate a test code after the main function executes the function function, and send the test code to the card reader corresponding to the card reader configuration parameters to test the smart card on the card reader, and generate a test result after the smart card test is completed.

9. A computer device, wherein: The computer device comprises a processor, a memory, and a computer program stored in the memory and executable by the processor, wherein when the computer program is executed by the processor, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium storing a program executable by a processor, characterized in that: The processor-executable program is used to perform the method according to any one of claims 1 to 7 when executed by the processor.

Images