Electrostatic field simulation surveying instrument and surveying method

Abstract

The invention relates to an electrostatic field simulation surveying instrument and a surveying method, the electrostatic field simulation surveying instrument comprises a rack, and a detection platform and a detection mechanism which are installed on the rack, the detection mechanism comprises a horizontal moving assembly and a probe, and the probe is installed on the horizontal moving assembly and moves in the horizontal direction through the horizontal moving mechanism; the device further comprises a lifting mechanism, the lifting mechanism comprises two first stepping motors and a plurality of limiting rods, and the two first stepping motors are both in transmission connection with lead screw transmission assemblies. According to the technical scheme, the probe moves on the horizontal plane through the horizontal moving assembly, the moving probe detects different parts of an object to be detected on the detection platform to obtain voltage values of the different parts, the lifting mechanism is used for adjusting the distance between the object to be detected and the probe, and meanwhile when the object to be detected is a liquid dielectric medium, the voltage values of the different parts are obtained. The depth of the probe in the liquid dielectric can be adjusted, and spatial detection can be carried out on the interior of the liquid dielectric.

Description

Technical Field

[0001] The invention relates to the technical field of experimental equipment, and in particular to an electrostatic field simulation surveying and mapping instrument and a surveying and mapping method. Background Art

[0002] The "Simulation and Description of Electrostatic Field" experiment is a must-do experiment for students majoring in science, engineering, agriculture, and medicine in the university physics experiment course. It allows students to experience the distribution of electric fields under various steady current conditions, deepen their understanding of electric field lines, and cultivate students' intuitive and vivid physical thinking. At present, the traditional "Simulation and Mapping of Electrostatic Field" experiment uses a steady current field to simulate the electrostatic field, and uses a metal probe to manually measure the potential on the conductive microcrystalline plate point by point.

[0003] However, this type of experimental instrument has the following four obvious disadvantages:

[0004] First, due to the limitations of traditional experimental equipment, the experimental content is single, and the experiment is limited to measuring the electric field area of ​​the conductive microcrystal;

[0005] The second is that the steps are cumbersome, and students need to constantly move the probe arm to find equipotential points, which is time-consuming;

[0006] The third problem is that the measurement error is large. The uncertainty of manual operation makes the probe easily bend and deflect up and down. The long-term operation of the sharp probe leads to uneven resistance of the conductive microcrystals and distortion of the electric field distribution, which makes the potential distribution obtained by the experiment significantly different from the theoretical one.

[0007] Finally, the traditional experiment is limited to the measurement of the electric potential in the plane, which makes it difficult for students to intuitively obtain the spatial electric potential distribution. Therefore, it is particularly important to use new technologies and new methods to improve this experiment and enhance the teaching effect. Summary of the invention

[0008] In view of this, the purpose of the present invention is to provide an electrostatic field simulation surveying and mapping instrument and a surveying and mapping method to solve the problems of single experimental content, inconvenient measurement operation and mapping in the prior art.

[0009] The present invention is achieved through the following technical solutions:

[0010] An electrostatic field simulation surveying instrument comprises a frame and a detection platform and a detection mechanism mounted on the frame, wherein the detection mechanism comprises a horizontal moving component and a probe, wherein the probe is mounted on the horizontal moving component and moves in a horizontal direction through the horizontal moving mechanism;

[0011] It also includes a lifting mechanism, which includes two first stepper motors and multiple limit rods. The two first stepper motors are both connected to a screw transmission assembly. The two screw transmission assemblies are symmetrically arranged on both sides of the detection platform. The output shaft of the first stepper motor is used to drive the screw in the screw transmission assembly to rotate. The screw nut in the screw transmission assembly is installed on the detection platform. The multiple limit rods are arranged parallel to the screw, and one end is connected to the bottom of the frame, and the other end is connected to the top of the frame.

[0012] It is further defined that the horizontal moving assembly includes a Y-axis slide rail and an X-axis slide rail, two Y-axis slide rails are provided, the two Y-axis slide rails are symmetrically and parallelly arranged on both sides of the top of the frame, the X-axis slide rail is arranged between the two Y-axis slide rails, the two ends of the X-axis slide rail are respectively connected with the two Y-axis slide rails in a sliding manner, the X-axis slide rail is provided with a slider, and the probe is installed on the slider.

[0013] It is further defined that the horizontal moving assembly also includes two second stepper motors, which are respectively installed on both sides of the frame, and a driving wheel is provided on the output shaft of the second stepper motor. A transmission belt is wound around the driving wheel, and both ends of the transmission belt are respectively connected to the two sides of the slider.

[0014] It is further defined that the probe is an insulating probe or a spring probe.

[0015] It is further defined that it also includes a rendering system, the rendering system comprising:

[0016] A voltage output module, the voltage output module is electrically connected to the electrodes of the detected object;

[0017] A voltage value acquisition module, the voltage value acquisition module includes an operational amplifier and a digital-to-analog converter, the operational amplifier is connected to the probe and is used to acquire an analog signal, the digital-to-analog converter is electrically connected to the operational amplifier and is used to receive the acquired analog signal and convert it into a digital signal to obtain a voltage value;

[0018] A coordinate acquisition module, the coordinate acquisition module is used to acquire pulse signals of the second stepper motor and the first stepper motor to obtain coordinate information of the probe;

[0019] A pattern drawing module is used to draw a pattern according to the voltage value acquired by the voltage value acquisition module and the coordinate information acquired by the coordinate acquisition module.

[0020] A surveying and mapping method of an electrostatic field simulation surveying and mapping instrument comprises the following steps:

[0021] S1: Make the detection platform in a horizontal state by adjustment;

[0022] S2: Place the inspected object on the inspection platform;

[0023] S3: Select a suitable type of probe and adjust the initial position of the probe;

[0024] S4: operate the probe to scan and detect the object to be detected;

[0025] S5: Draw a pattern.

[0026] It is further defined that the inspected object is a liquid dielectric or a solid dielectric.

[0027] The beneficial effects of the present invention are:

[0028] The electrostatic field simulation surveying instrument and surveying method move the probe on a horizontal plane through a horizontal moving component. The moving probe detects different parts of the inspected object placed on a detection platform to obtain voltage values ​​of different parts. The lifting mechanism is used to adjust the distance between the inspected object and the probe. At the same time, when the inspected object is a liquid dielectric, the depth of the probe in the liquid dielectric can be adjusted, and the interior of the liquid dielectric can be spatially detected.

[0029] Other advantages, objectives and features of the present invention will be described in the following description to some extent, and to some extent, will be obvious to those skilled in the art based on the following examination and study, or can be taught from the practice of the present invention. The objectives and other advantages of the present invention can be realized and obtained through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Figure 1 It is a structural schematic diagram of the present invention;

[0031] Figure 2 It is a schematic diagram of the installation structure of the lifting mechanism;

[0032] Figure 3 It is a schematic diagram of the transmission structure of the first stepper motor, the transmission belt and the slider located on the left;

[0033] Figure 4 The first stepper motor and the transmission belt and the sliding block are shown in the figure below.

[0034] Figure 5 It is a schematic diagram of potential collection in the present invention;

[0035] Figure 6 The diagram of the change of coaxial potential for experimental verification;

[0036] In the figure: 1. frame; 2. probe; 3. first stepper motor; 4. limit rod; 5. screw transmission assembly; 6. detection platform; 7. Y-axis slide rail; 8. X-axis slide rail; 9. slider; 10. second stepper motor; 11. driving wheel; 12. transmission belt; 13. first pulley; 14. second pulley. DETAILED DESCRIPTION

[0037] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0038] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0039] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0040] In the above description of the present invention, it should be noted that the terms "one side", "the other side", etc. indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship in which the product of the invention is usually placed when in use, which is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

[0041] In addition, the term "same" does not mean that the parts must be absolutely the same, but slight differences are allowed. The term "vertical" only means that the positional relationship between the parts is more vertical than "parallel", and does not mean that the structure must be completely vertical, but can be slightly tilted.

[0042] See also Figure 1-5The present invention provides a technical solution: an electrostatic field simulation surveying instrument, comprising a frame 1 and a detection platform 6 and a detection mechanism installed on the frame 1, wherein the detection mechanism comprises a horizontal moving assembly and a probe 2, wherein the probe 2 is installed on the horizontal moving assembly and moves in the horizontal direction through the horizontal moving mechanism; further comprising a lifting mechanism, wherein the lifting mechanism comprises two first stepper motors 3 and a plurality of limit rods 4, wherein the two first stepper motors 3 are both transmission-connected with a screw transmission assembly 5, wherein the two screw transmission assemblies 5 are symmetrically arranged on both sides of the detection platform 6, wherein the output shaft of the first stepper motor 3 is used to drive the screw in the screw transmission assembly 5 to rotate, wherein the screw nut in the screw transmission assembly 5 is installed on the detection platform 6, wherein the plurality of limit rods 4 are arranged in parallel with the screw, and one end of the limit rods 4 is connected to the bottom of the frame 1, and the other end is connected to the top of the frame 1.

[0043] In this embodiment, the probe 2 is moved in the horizontal direction, i.e., in the X-axis and Y-axis directions, by a horizontal moving mechanism, and the detection platform 6 is moved in the vertical direction, i.e., in the Z-axis direction, by a lifting mechanism, wherein the detection platform 6 is used to place the detected object, and the detected object can adjust its relative position with the probe 2 under the action of the lifting mechanism. When the detected object is solid, specifically, a conductive microcrystalline plate or a rubber plate, etc., two electrodes for voltage input are provided on the detected object. During detection, the lifting mechanism is adjusted to make the probe 2 in contact with the detected object, and then the probe 2 is moved on the detected object by the horizontal moving mechanism, so that the probe 2 can detect the surface of the detected object. The voltage value of each part is measured; when the object to be inspected is liquid, such as water, a container can be pre-set to hold the object to be inspected, and two electrodes will also be set on the container. The same as the above principle, the lifting mechanism can be adjusted to make the probe 2 extend into the depth of the inspected object. After the detection is completed on the plane at the first depth position, it is adjusted to the plane at the second depth position. By analogy, the object to be inspected can be inspected in three-dimensional space; in the process of adjusting the Z-axis direction, its power is driven by two screw transmission mechanisms and the first stepper motor 3, and cooperates with the limit rod 4, and is symmetrically arranged on both sides of the detection platform 6, so that the detection platform 6 is in a relatively stable state during the adjustment process.

[0044] In this embodiment, the horizontal moving assembly includes a Y-axis slide rail 7 and an X-axis slide rail 8. Two Y-axis slide rails 7 are provided. The two Y-axis slide rails 7 are symmetrically and parallelly arranged on both sides of the top of the frame 1. The X-axis slide rail 8 is arranged between the two Y-axis slide rails 7. The two ends of the X-axis slide rail 8 are respectively connected with the two Y-axis slide rails 7 in a sliding manner. A slider 9 is provided on the X-axis slide rail 8, and the probe 2 is installed on the slider 9.

[0045] The horizontal moving component limits the moving trajectory of the probe 2 in the horizontal direction. From a top view, the probe 2 is installed on the X-axis slide rail 8 through the slider 9, and it can move along the X-axis slide rail 8, and the two ends of the X-axis slide rail 8 are installed on two Y-axis slide rails 7. The X-axis can slide on the two Y-axis slide rails 7. When the slider 9 moves along the X-axis slide rail 8, the detected object can be detected along the X-axis direction. When the X-axis slide rail 8 moves along the Y-axis slide rail 7, the detected object can be detected along the Y-axis direction, so that the probe 2 can be moved on the horizontal plane.

[0046] In this embodiment, the horizontal moving component also includes two second stepper motors 10, which are respectively installed on both sides of the frame 1. A driving wheel 11 is arranged on the output shaft of the second stepper motor 10, and a transmission belt 12 is wound around the driving wheel 11. The two ends of the transmission belt 12 are respectively connected to the two sides of the probe 2.

[0047] Two second stepper motors 10 are installed as driving power sources on both sides of the frame 1, that is, on both sides of the probe 2. The two second stepper motors 10 are respectively provided with a transmission belt 12, and can be dragged by the driving wheel 11 to move the transmission belt 12. The two ends of the transmission belt 12 are respectively connected to the two sides of the X-axis direction of the slider 9, wherein the transmission belt 12 can be used as a bypass track limit by a plurality of pulleys. If the two second stepper motors 10 are respectively installed at the same end of the Y-axis slide rail 7, then the other end of the Y-axis slide rail 7 will be provided with The first pulley 13 is set, and the second pulley 14 is set at both ends of the X-axis slide rail 8. The distribution structure of the transmission belt 12 is observed from a top view as follows: the transmission belt 12 driven by the second stepper motor 10 on the left side starts from the driving wheel 11 at both ends, one end extends along the left Y-axis slide rail 7 and bypasses the first pulley 13 on the left, then extends to the right Y-axis slide rail 7 and bypasses the first pulley 13 on the right, and then turns to the second pulley 14 at the right end of the X-axis slide rail 8 and is connected to the right side of the slider 9, and the other end also extends along the left Y-axis The slide rail 7 extends and passes through the second pulley 14 on the left side when passing through the X-axis slide rail 8 and is connected to the left side of the slider 9. When the second stepper motor 10 rotates clockwise, the slider 9 will be dragged to move to the left along the X-axis slide rail 8, otherwise, the slider 9 will be dragged to move to the right along the X-axis slide rail 8; two symmetrically arranged second stepper motors 10 and transmission belts 12, when the two second stepper motors 10 rotate in the same direction in the clockwise or counterclockwise direction, the slider 9 will move along the X-axis slide rail 8, when the left second stepper motor 10 rotates clockwise and the right second stepper motor 10 rotates counterclockwise, the X-axis slide rail 8 will be dragged to move downward, otherwise, the X-axis slide rail 8 will be dragged to move upward, so as to drive the slider 9 to move on the horizontal plane. During the movement, both sides of the slider 9 are subjected to force at the same time, the movement force is balanced, and the stability of its movement is improved; wherein, the driving wheel 11 can be a gear, and the transmission belt 12 can be a toothed transmission belt matched therewith, so as to reduce the transmission friction and make the moving position more accurate.

[0048] In this embodiment, the probe 2 is an insulating probe 2 or a spring probe 2 .

[0049] The insulating probe 2 is entirely wrapped in insulating material, with only the tip exposed, and is suitable for measuring liquid conductive media. The spring probe 2 has a telescopic property, and its tip can shrink to adapt to extrusion when under pressure. When measuring solid conductive media, it can reduce the extrusion friction between the probe 2 and the object being tested, thereby protecting the tip of the probe 2 and the object being tested.

[0050] In this embodiment, a drawing system is also included, and the drawing system includes:

[0051] A voltage output module, the voltage output module is electrically connected to the electrodes of the detected object;

[0052] A voltage value acquisition module, the voltage value acquisition module includes an operational amplifier and a digital-to-analog converter, the operational amplifier is connected to the probe 2 and is used to acquire an analog signal, the digital-to-analog converter is electrically connected to the operational amplifier and is used to receive the acquired analog signal and convert it into a digital signal to obtain a voltage value;

[0053] A coordinate acquisition module, which is used to acquire the pulse signals of the second stepper motor 10 and the first stepper motor 3 to obtain the coordinate information of the probe 2;

[0054] A pattern drawing module is used to draw a pattern according to the voltage value acquired by the voltage value acquisition module and the coordinate information acquired by the coordinate acquisition module.

[0055] Among them, the voltage output module has an output voltage range of 0.6-36V, and a power supply can be integrated and installed in the frame 1. It is connected to the positive electrode of the electrode set on the detected object. The operational amplifier adopts the LM356 operational amplifier, and its follower probe 2 is used as a detection follower to increase the input impedance of voltage acquisition, and then input into the processing system through the ADS1115 high-precision digital-to-analog conversion module. The processing system adopts the Ardu ino single-chip microcomputer. The processing system will also be used to send pulse signals to the first stepper motor 3 and the second stepper motor 10 to control the operation, so as to obtain the coordinate information of the slider 9 according to the pulse signal, and set LabVIEW to store the voltage value and coordinate information, and then set python to draw the pattern according to the voltage value and coordinate information;

[0056] The specific control operation can be controlled by the ATF color screen module, and the ATF color screen module is controlled by the Ardu ino microcontroller through the UART serial port communication protocol.

[0057] A surveying and mapping method of an electrostatic field simulation surveying and mapping instrument comprises the following steps:

[0058] S1: Make the detection platform 6 in a horizontal state by adjusting;

[0059] S2: placing the inspected object on the inspection platform 6;

[0060] S3: Select a suitable type of probe 2 and adjust the initial position of the probe 2;

[0061] S4: operate the probe 2 to scan and detect the object to be detected;

[0062] S5: Draw a pattern.

[0063] In this embodiment, the inspected object is a liquid dielectric or a solid dielectric.

[0064] The object to be tested is water, and the specific operation steps are as follows:

[0065] Prepare a container for containing water, the top of the container is open for the probe 2 to be inserted and move horizontally, the bottom of the container is provided with an electrode for connecting with the voltage output module, and a certain height of water is injected into the container so that the electrode and the water are in contact and conductive state;

[0066] Then adjust the detection platform 6 to make it in a horizontal state, and a level meter can be used as an auxiliary detection tool during the adjustment process;

[0067] The container is then placed on the detection platform 6, and the electrodes and the probe 2 are connected by plugging wires;

[0068] Power on each electrical component, adjust the probe 2, and set the initial position of the probe 2;

[0069] Then, different planes in the water are scanned by the probe 2 to obtain voltage values ​​of the different planes, and a pattern is drawn according to the voltage values ​​and the coordinate information of the voltage value collection points of the probe 2 by the pattern drawing module.

[0070] Verification experiment

[0071] Draw and fit manually Graph and compare the slope with theoretical techniques.

[0072] like Figure 6 As shown in the experimental principle, The slope of the curve

[0073] Enter the experimental parameters

[0074] Relative error E = 0.48%

[0075] It can be seen that the surveying and mapping results obtained by using the surveying and mapping instrument and method are greatly improved in accuracy compared to the results obtained by manual measurement and mapping in the prior art.

[0076] In summary, this technical solution can achieve multiple functions, including:

[0077] 1. Applicable to a variety of dielectrics, including but not limited to conductive microcrystals, conductive rubber sheets, water, etc.;

[0078] 2. Realize accurate measurement of electric potential in spatial regions;

[0079] 3. The potential measurement of each point is accurate, the overall potential distribution can be drawn, and the potential image can be displayed in real time;

[0080] 4. Both manual measurement and automatic measurement functions can be set through the program to meet different teaching needs.

[0081] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solution of the present invention can be modified or replaced by equivalents without departing from the purpose and scope of the technical solution of the present invention, which should be included in the scope of the claims of the present invention.

Claims

1. An electrostatic field simulation surveying and mapping instrument, comprising a frame and a detection platform and a detection mechanism mounted on the frame, characterized in that: The detection mechanism includes a horizontal moving assembly and a probe, wherein the probe is mounted on the horizontal moving assembly and moves in a horizontal direction through the horizontal moving mechanism; It also includes a lifting mechanism, which includes two first stepper motors and multiple limit rods. The two first stepper motors are both connected to a screw transmission assembly. The two screw transmission assemblies are symmetrically arranged on both sides of the detection platform. The output shaft of the first stepper motor is used to drive the screw in the screw transmission assembly to rotate. The screw nut in the screw transmission assembly is installed on the detection platform. The multiple limit rods are arranged parallel to the screw, and one end is connected to the bottom of the frame, and the other end is connected to the top of the frame.

2. The electrostatic field simulation surveying and mapping instrument according to claim 1, characterized in that: The horizontal moving assembly includes a Y-axis slide rail and an X-axis slide rail. Two Y-axis slide rails are provided. The two Y-axis slide rails are symmetrically and parallelly arranged on both sides of the top of the frame. The X-axis slide rail is arranged between the two Y-axis slide rails. The two ends of the X-axis slide rail are respectively connected with the two Y-axis slide rails in a sliding manner. A slider is provided on the X-axis slide rail, and the probe is installed on the slider.

3. The electrostatic field simulation surveying and mapping instrument according to claim 2, characterized in that: The horizontal moving assembly also includes two second stepper motors, which are respectively installed on both sides of the frame. A driving wheel is arranged on the output shaft of the second stepper motor, and a transmission belt is wound around the driving wheel. Both ends of the transmission belt are respectively connected to the two sides of the slider.

4. The electrostatic field simulation surveying and mapping instrument according to claim 3, characterized in that: The probe is an insulating probe or a spring probe.

5. The electrostatic field simulation surveying and mapping instrument according to claim 4, characterized in that: Also included is a drawing system, the drawing system comprising: A voltage output module, the voltage output module is electrically connected to the electrodes of the detected object; A voltage value acquisition module, the voltage value acquisition module includes an operational amplifier and a digital-to-analog converter, the operational amplifier is connected to the probe and is used to acquire an analog signal, the digital-to-analog converter is electrically connected to the operational amplifier and is used to receive the acquired analog signal and convert it into a digital signal to obtain a voltage value; A coordinate acquisition module, the coordinate acquisition module is used to acquire pulse signals of the second stepper motor and the first stepper motor to obtain coordinate information of the probe; A pattern drawing module is used to draw a pattern according to the voltage value acquired by the voltage value acquisition module and the coordinate information acquired by the coordinate acquisition module.

6. The surveying and mapping method of the electrostatic field simulation surveying and mapping instrument as claimed in claim 5, characterized in that: The steps include: S1: Make the detection platform level by adjustment; S2: Place the inspected object on the inspection platform; S3: Select a suitable type of probe and adjust the initial position of the probe; S4: operate the probe to scan and detect the object to be detected; S5: Draw a pattern.

7. The surveying and mapping method of the electrostatic field simulation surveying and mapping instrument according to claim 6, characterized in that: The inspected object is a liquid dielectric or a solid dielectric.

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