High-efficiency test method for low-orbit satellite terminal based on radio frequency fingerprints

Abstract

The invention discloses a low-orbit satellite terminal high-efficiency test method based on radio frequency fingerprints. A control and synchronization system, a feed system, a sparse measurement array, a multi-channel data transceiving system and a data processing system are included. The low-orbit satellite terminal phased array test comprises a transmitting phased array test and a receiving phased array test; in the transmitting phased array test, after the feed system generates a test signal, the to-be-tested terminal phased array transmits the test signal, and after the sparse measurement array collects the signal, the multi-channel data receiving and transmitting system collects radio frequency fingerprint data; in a receiving phased array test, a test signal generated by the multi-channel data transceiving system is transmitted by the sparse measurement array, and radio frequency fingerprint data is acquired by the feed system after the signal is received by the terminal phased array to be tested. By capturing and analyzing the unique radio frequency signal characteristics of the low earth orbit satellite terminal, the performance evaluation can be quickly and accurately carried out, and the automation degree and the accuracy of the test are improved, so that the overall test efficiency is remarkably improved.

Description

Technical Field

[0001] The present invention is a high-efficiency test method for low-orbit satellite terminal phased array based on radio frequency fingerprint, and relates to a test method theory for low-orbit satellite terminal phased array, and in particular to a theory and method for realizing high-efficiency test of low-orbit satellite terminal phased array. Background Art

[0002] With the rapid development of science and technology, low-orbit satellite communications have become a focus area of ​​the global science and technology industry. With its advantages such as lower communication latency, higher signal strength and lower launch cost, low-orbit satellites are gradually changing the way we communicate.

[0003] However, there is a problem of inefficiency in the phased array testing of low-orbit satellite terminals. First, the test process usually requires the use of a robotic arm for mechanical scanning to ensure accurate measurement of all directions and angles of the phased array, which is a cumbersome and time-consuming process. Secondly, the large number of low-orbit satellite terminals means that each terminal needs to be tested individually, resulting in a significant increase in testing time. Finally, the operating frequency range of low-orbit satellite terminals is wide, covering multiple frequency bands. During the test process, tests need to be performed at multiple frequency points to ensure their performance and reliability, which further increases the complexity and time consumption of the test. Therefore, traditional testing methods often fail to meet the needs of efficient testing.

[0004] At present, there are two main testing methods for phased array antennas:

[0005] Method one is the far-field test method, which is a method for evaluating antenna performance by measuring the radiation characteristics of the antenna in the far-field region, that is, directly measuring the far-field data of the antenna to be tested. The principle is to illuminate the antenna with a plane wave of known characteristic parameters to obtain the antenna's reception characteristic parameters, and then use the antenna's reciprocity principle to obtain the antenna's propagation characteristic parameters. This method can truly reflect the radiation characteristics of the antenna in free space; however, the antenna test field needs to meet the minimum test distance requirements, and should also try to avoid the influence of surrounding terrain and objects to simulate free space more realistically. In addition, in order to avoid reflections and interference, the test usually needs to be carried out in an open field or anechoic chamber, which may increase the test cost.

[0006] The second method is the near-field test method, which is a method for evaluating antenna performance by measuring the electromagnetic field distribution of the antenna in the near-field area. The near-field test measures the electromagnetic field distribution in the near-field area of ​​the antenna and uses mathematical methods such as Fourier transform to derive far-field performance parameters. The near-field test can overcome the distance limitations and environmental interference in the far-field test and provide more accurate measurement results. However, the near-field test equipment is complex and expensive, and the test process is also cumbersome.

[0007] Both of the above-mentioned testing methods for phased array antennas require the use of a robotic arm, and ultimately require the generation of a directional diagram to observe the results, so the entire testing process is inefficient.

[0008] In summary, the current domestic and international methods for studying phased array testing of low-orbit satellite terminals have the problem of low efficiency, which makes it difficult to use the above methods in practical applications. In view of the above problems, the present invention proposes a high-efficiency testing method for low-orbit satellite terminals based on radio frequency fingerprints, which solves the problem of low efficiency of the phased array testing method for low-orbit satellite terminals. Summary of the invention

[0009] The purpose of the present invention is to overcome the shortcomings of the prior art and provide a high-efficiency testing method for low-orbit satellite terminals based on radio frequency fingerprints, which can quickly and accurately perform performance evaluation by capturing and analyzing the unique radio frequency signal characteristics of low-orbit satellite terminals.

[0010] The object of the present invention is achieved through the following technical solutions: a high-efficiency test method for a low-orbit satellite terminal based on radio frequency fingerprint, including a control and synchronization system, a feeding system, a sparse measurement array, a multi-channel data transceiver system and a data processing system; a phased array test of a low-orbit satellite terminal includes two tests: a transmitting phased array test and a receiving phased array test;

[0011] For the test of the low-orbit satellite terminal transmitting phased array, a fingerprint test set is first randomly generated, which specifies the frequency, amplitude, phase, and number of test signal groups of the test signal;

[0012] The control and synchronization system configures a unified clock source for the feeding system, sparse measurement array, and multi-channel data transceiver system, and sets a synchronization trigger signal;

[0013] The feed system generates the test signal according to the parameters set by the fingerprint test set, and then transmits it through the phased array;

[0014] During the test, all receiving channels of the sparse measurement array are started by a synchronous trigger signal, and the multi-channel data transceiver system collects the test signal data received by all receiving channels; and all the collected test signal data are transmitted to the data processing system for analysis and processing, and the data processing system sends a termination signal to the control and synchronization system to control the feeding system and the phased array to stop transmitting signals, and the sparse measurement array and the multi-channel data transceiver system stop data collection;

[0015] During the test, the standard phased array is first used to traverse the entire fingerprint test set to obtain the standard RF fingerprint set, and then the phased array of the terminal to be tested is used to measure to obtain the RF fingerprint set to be tested. Finally, the collected standard RF fingerprint set is compared with the RF fingerprint set to be tested to evaluate the accuracy of the measurement results.

[0016] For the test of receiving phased array of LEO satellite terminal, a fingerprint test set is first randomly generated;

[0017] Configure a unified clock source for the feeding system, sparse measurement array and multi-channel data transceiver system through the control and synchronization system, and set a synchronization trigger signal;

[0018] The multi-channel data transceiver system generates a test signal according to the parameters set by the fingerprint test set;

[0019] The control and synchronization system generates a main trigger signal, and uses the main trigger signal to activate the channels of the sparse measurement array one by one to transmit the test signal; the synchronization trigger signal triggers the feeding system to collect the test signal data received by the phased array; and the collected test signal data is transmitted to the data processing system for analysis and processing. At the same time, the data processing system sends a termination signal to the control and synchronization system to control the sparse measurement array and the multi-channel data transceiver system to stop transmitting signals, and the phased array and the feeding system to stop data collection;

[0020] During the test, the standard phased array is first used to traverse the entire fingerprint test set to obtain the standard RF fingerprint set, and then the phased array of the terminal to be tested is used to measure to obtain the RF fingerprint set to be tested. Finally, the collected standard RF fingerprint set is compared with the RF fingerprint set to be tested to evaluate the accuracy of the measurement results.

[0021] The beneficial effects of the present invention are as follows: in view of the low efficiency of the current phased array testing methods for low-orbit satellite terminals, the present invention proposes a high-efficiency testing method for low-orbit satellite terminals based on radio frequency fingerprinting. By capturing and analyzing the unique radio frequency signal characteristics of low-orbit satellite terminals, performance evaluation can be performed quickly and accurately, the testing time is reduced, and the degree of automation and accuracy of the test are improved, thereby significantly improving the overall testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 It is a schematic diagram of a low-orbit satellite terminal phased array test system involved in the present invention;

[0023] Figure 2 This is a flow chart of the phased array test of the low-orbit satellite terminal launch involved in the present invention;

[0024] Figure 3 The present invention is a flow chart of the phased array receiving test of the low-orbit satellite terminal. DETAILED DESCRIPTION

[0025] The present invention relates to the testing of the transmitting phased array and the receiving phased array of a low-orbit satellite terminal. During the test, the test distance between the sparse measurement array and the phased array of the terminal to be tested meets the specific requirements of the test and the characteristics of the phased array to be tested. The high-efficiency testing method for low-orbit satellite terminals based on radio frequency fingerprints provided by the present invention is key in that a sparse measurement array is used to replace the design of a traditional mechanical arm, and the method of the present invention is used to complete the testing of the transmitting phased array and the receiving phased array of the low-orbit satellite terminal phased array. The present invention realizes the testing of the phased array of low-orbit satellite terminals based on radio frequency fingerprints, does not require the use of a mechanical arm, reduces the number of sampling points, and improves the efficiency of the entire testing process. The technical scheme of the present invention is further illustrated below in conjunction with the accompanying drawings.

[0026] The high-efficiency test method for low-orbit satellite terminals based on radio frequency fingerprints uses a test system structure such as Figure 1 As shown, it includes a control and synchronization system, a feeding system, a sparse measurement array, a multi-channel data transceiver system and a data processing system; in this embodiment, the number of array elements N of the sparse measurement array is the same as the number of array elements of the phased array of the terminal to be tested, and the number of array elements of the standard phased array is the same as the number of array elements of the phased array of the terminal to be tested. The low-orbit satellite terminal phased array test includes two tests: the transmitting phased array test and the receiving phased array test;

[0027] For the test of the low-orbit satellite terminal transmitting phased array, a fingerprint test set is first randomly generated, which specifies the frequency, amplitude, phase, and number of test signal groups of the test signal;

[0028] The control and synchronization system configures a unified clock source for the feeding system, sparse measurement array, and multi-channel data transceiver system, and sets a synchronization trigger signal;

[0029] The feed system generates the test signal according to the parameters set by the fingerprint test set, and then transmits it through the phased array;

[0030] During the test, all receiving channels of the sparse measurement array are started by a synchronous trigger signal, and the multi-channel data transceiver system collects the test signal data received by all receiving channels; and all the collected test signal data are transmitted to the data processing system for analysis and processing, and the data processing system sends a termination signal to the control and synchronization system to control the feeding system and the phased array to stop transmitting signals, and the sparse measurement array and the multi-channel data transceiver system stop data collection;

[0031] During the test, the standard phased array is first used to traverse the entire fingerprint test set to obtain the standard RF fingerprint set, and then the phased array of the terminal to be tested is used to measure to obtain the RF fingerprint set to be tested. Finally, the collected standard RF fingerprint set is compared with the RF fingerprint set to be tested to evaluate the accuracy of the measurement results.

[0032] For the test of receiving phased array of LEO satellite terminal, a fingerprint test set is first randomly generated;

[0033] Configure a unified clock source for the feeding system, sparse measurement array and multi-channel data transceiver system through the control and synchronization system, and set a synchronization trigger signal;

[0034] The multi-channel data transceiver system generates a test signal according to the parameters set by the fingerprint test set;

[0035] The control and synchronization system generates a main trigger signal, and uses the main trigger signal to activate the channels of the sparse measurement array one by one to transmit the test signal; the synchronization trigger signal triggers the feeding system to collect the test signal received by the phased array; and the collected test signal data is transmitted to the data processing system for analysis and processing. At the same time, the data processing system sends a termination signal to the control and synchronization system to control the sparse measurement array and the multi-channel data transceiver system to stop transmitting signals, and the phased array and the feeding system to stop data collection;

[0036] During the test, the standard phased array is first used to traverse the entire fingerprint test set to obtain the standard RF fingerprint set, and then the phased array of the terminal to be tested is used to measure to obtain the RF fingerprint set to be tested. Finally, the collected standard RF fingerprint set is compared with the RF fingerprint set to be tested to evaluate the accuracy of the measurement results.

[0037] like Figure 2 As shown, the specific steps of the method for testing the low-orbit satellite terminal transmitting phased array are as follows:

[0038] S1. Randomly generate a fingerprint test set f represents the frequency of the test signal, A represents the amplitude of the test signal, Indicates the phase of the test signal; in this embodiment, f=[14.5,16.2,28.5,32.0,12.5] T (GHz), the corresponding amplitude A = [0.8, 1.2, 0.9, 1.0, 0.7] T (V), Phase The number of data sets M=5.

[0039] S2, using a standard phased array to transmit a test signal;

[0040] S3, configuring a unified clock source for the feeding system, the sparse measurement array and the multi-channel data transceiver system through the control and synchronization system so that they share the same clock signal, and setting a synchronization trigger signal PSHIFT;

[0041] S4, the feeding system is based on the fingerprint test set Setting test signal parameters and generating test signals, and transmitting through the phased array;

[0042] S5, synchronous trigger signal triggers, sparse measurement array of all receiving channels CH1, CH2, ..., CH N Start in sequence, and at the same time, each channel of the multi-channel data transceiver system collects the corresponding amplitude A m1 , A m2 , …, A mN and Phase The signal data of each channel collected is transmitted to the data processing system;

[0043] S6. The data processing system calculates the amplitude ratio ΔA between two adjacent channels. m =[ΔA m1 , ΔA m2 ,…,ΔA m(N-1) ] and phase difference All are stored in the corresponding position of the standard RF fingerprint set At the same time, the data processing system sends a termination signal PSTOP to the control and synchronization system, causing the standard phased array to stop transmitting signals, and the sparse measurement array and multi-channel data transceiver system to stop data acquisition;

[0044] S7, repeat steps S3 to S6 until all test signal groups are tested and the standard RF fingerprint set is obtained. where frequency f=[f1,f2,…,f M ] T , amplitude ratio ΔA=[ΔA1,ΔA2,…,ΔA M ] T , phase difference

[0045] S8, replacing the standard phased array with the terminal phased array to be tested for measurement;

[0046] S9, repeat steps S3 to S7 to obtain the RF fingerprint set to be tested, compare the RF fingerprint data to be tested under each frequency group in the RF fingerprint set to the standard RF fingerprint set Compare the RF fingerprint data at the corresponding frequency in Calculate the amplitude error, ΔA cmn Indicates the nth amplitude ratio in the mth group of the RF fingerprint set to be tested, ΔA mn represents the nth amplitude ratio in the mth group of the standard RF fingerprint set; according to the formula

[0047] Calculate the phase error, Indicates the nth phase difference value in the mth group of the radio frequency fingerprint set to be tested, Indicates the nth phase difference value in the mth group in the standard RF fingerprint set; comprehensively judge whether the RF fingerprint data to be tested at this frequency is qualified according to the amplitude error and phase error. If the amplitude error and phase error are both less than or equal to 0.05%, it means that the RF fingerprint data to be tested at this frequency is qualified, and the overall evaluation P is recorded as "qualified"; otherwise, the overall evaluation P is recorded as "unqualified"; and the amplitude error, phase error and overall evaluation are added to the RF fingerprint set to be tested to obtain the final RF fingerprint set to be tested where frequency f=[f1,f2,…,f M ] T , amplitude ratio ΔA c =[ΔA c1 , ΔA c2 , ..., ΔA cM ] T , phase difference Amplitude error θ A =[θ A1 ,θ A2 ,…,θ AM ] T , phase error Overall evaluation P = [P1, P2, ..., P M ] T ; When the fingerprint test set After all the test signals generated by all the groups of parameters in are tested, the qualified rate of the RF fingerprint data to be tested is calculated. If the qualified rate is greater than or equal to 80%, the fingerprint test set is qualified; otherwise, the fingerprint test set is regenerated for a new round of measurement.

[0048] like Figure 3 As shown in the figure, the specific steps of the low-orbit satellite terminal receiving phased array test are as follows:

[0049] T1. Randomly generate a fingerprint test set f represents the frequency of the test signal, A represents the amplitude of the test signal, Indicates the phase of the test signal. In this embodiment, the frequency f=[14.5,16.2,28.5,32.0,12.5] T (GHz), amplitude A = [0.8, 1.2, 0.9, 1.0, 0.7] T (V) and phase The test set contains a total of 5 sets of data;

[0050] T2, using a standard phased array to receive the test signal;

[0051] T3. Configure a unified clock source for the feeding system, sparse measurement array and multi-channel data transceiver system through the control and synchronization system so that they share the same clock signal, and set a synchronization trigger signal PSHIFT;

[0052] T4, multi-channel data transceiver system according to the fingerprint test set Setting parameters of a test signal to generate a test signal;

[0053] T5, the control and synchronization system generates the main trigger signal MSHIFT, which is used to synchronously control the entire test process;

[0054] T6, use the main trigger signal MSHIFT to activate the first channel CH1 of the sparse measurement array, and the multi-channel data transceiver system transmits the test signal to the standard phased array through the sparse measurement array;

[0055] T7, the synchronous trigger signal PSHIFT triggers the feed system to receive the signal, and collects the signal amplitude data A of the first channel CH1 m1 and phase data transfer to a data processing system for storage;

[0056] T8, using the main trigger signal MSHIFT to end the signal transmission of the first channel CH1, and activate the next channel CH2 of the sparse measurement array to transmit the signal;

[0057] T9, repeat steps T6 to T8 until channels CH1, CH2, ..., CH N All signal transmissions are completed; at this time, the data processing system stores a total of N groups of signal data, namely, amplitude data A m1 , A m2 , …, A mN and phase data The data processing system calculates the amplitude ratio ΔA between two adjacent channels m =[ΔA m1 , ΔA m2 ,…,ΔA m(N-1) ] and phase difference Store these N-1 sets of RF fingerprint data into the corresponding positions of the standard RF fingerprint set

[0058] T10, repeat steps T3 to T9 until the fingerprint test set is traversed Get the standard RF fingerprint set At the same time, a termination signal PSTOP is sent to the control and synchronization system, so that the sparse measurement array and the multi-channel data transceiver system stop transmitting the test signal, and the standard phased array and the feeding system stop data acquisition;

[0059] T11. Replace the standard phased array with the terminal phased array to be tested;

[0060] T12, repeat steps T3 to T9 until the fingerprint test set is traversed Get the RF fingerprint set to be tested; compare the RF fingerprint data to be tested under each frequency group in the RF fingerprint set to the standard RF fingerprint set Compare the RF fingerprint data at the corresponding frequency in Calculate the amplitude error; according to the formula Calculate the phase error; comprehensively judge whether the RF fingerprint data to be tested at this frequency is qualified based on the amplitude error and phase error, and record it as the overall evaluation P; if the amplitude error and phase error are both less than or equal to 0.05%, it means that the RF fingerprint data to be tested at this frequency is qualified, and the overall evaluation P is recorded as "qualified"; otherwise, the overall evaluation P is recorded as "unqualified". And add the amplitude error, phase error and overall evaluation to the RF fingerprint set to obtain the final RF fingerprint set to be tested where frequency f=[f1,f2,…,f M ] T , amplitude ratio ΔA c =[ΔA c1 , ΔA c2 ,…,ΔA cM ] T , phase difference Amplitude error θ A =[θ A1 ,θ A2 ,…,θ AM ] T , phase error Overall evaluation P = [P1, P2, ..., P M ] T ; When the fingerprint test set After all the parameters in the test set are tested, the qualified rate of the RF fingerprint data to be tested is calculated. If the qualified rate is greater than or equal to 80%, the fingerprint test set is qualified; otherwise, the fingerprint test set is regenerated for a new round of measurement.

[0061] Those skilled in the art will appreciate that the embodiments described herein are intended to help readers understand the principles of the present invention, and should be understood that the protection scope of the present invention is not limited to such specific statements and embodiments. Those skilled in the art can make various other specific variations and combinations that do not deviate from the essence of the present invention based on the technical revelations disclosed by the present invention, and these variations and combinations are still within the protection scope of the present invention.

Claims

1. A high-efficiency test method for low-orbit satellite terminals based on radio frequency fingerprints, characterized in that: It includes control and synchronization system, feeding system, sparse measurement array, multi-channel data transceiver system and data processing system; low-orbit satellite terminal phased array test includes two tests: transmitting phased array test and receiving phased array test; For the test of the phased array transmitted by the low-orbit satellite terminal, a fingerprint test set is first randomly generated, which specifies the frequency, amplitude, phase, and number of test signal groups of the test signal; The control and synchronization system configures a unified clock source for the feeding system, sparse measurement array, and multi-channel data transceiver system, and sets a synchronization trigger signal; The feed system generates the test signal according to the parameters set by the fingerprint test set, and then transmits it through the phased array; During the test, all receiving channels of the sparse measurement array are started by a synchronous trigger signal, and at the same time, the multi-channel data transceiver system collects the test signal data received by all receiving channels; All the collected test signal data are transmitted to the data processing system for analysis and processing. At the same time, the data processing system sends a termination signal to the control and synchronization system to control the feeding system and the phased array to stop transmitting signals, and the sparse measurement array and the multi-channel data transceiver system to stop data collection; During the test, the standard phased array is first used to traverse the entire fingerprint test set to obtain the standard RF fingerprint set, and then the phased array of the terminal to be tested is used to measure to obtain the RF fingerprint set to be tested. Finally, the collected standard RF fingerprint set is compared with the RF fingerprint set to be tested to evaluate the accuracy of the measurement results. For the test of receiving phased array of LEO satellite terminal, a fingerprint test set is first randomly generated; Configure a unified clock source for the feeding system, sparse measurement array and multi-channel data transceiver system through the control and synchronization system, and set a synchronization trigger signal; The multi-channel data transceiver system generates a test signal according to the parameters set by the fingerprint test set; The control and synchronization system generates a main trigger signal, and uses the main trigger signal to activate the channels of the sparse measurement array one by one to transmit the test signal; The synchronous trigger signal triggers the feed system to collect the test signal data received by the phased array; The collected test signal data is transmitted to the data processing system for analysis and processing. At the same time, the data processing system sends a termination signal to the control and synchronization system to control the sparse measurement array and the multi-channel data transceiver system to stop transmitting signals, and the phased array and the feeding system to stop data collection; During the test, the standard phased array is first used to traverse the entire fingerprint test set to obtain the standard RF fingerprint set, and then the phased array of the terminal to be tested is used to measure to obtain the RF fingerprint set to be tested. Finally, the collected standard RF fingerprint set is compared with the RF fingerprint set to be tested to evaluate the accuracy of the measurement results.

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