Battery pack defect detection method, device and battery pack defect detection equipment

By performing overall digital imaging scan and accurate scanning of the power battery pack, the problem of long detection time and loss in the prior art is solved, and efficient and accurate detection of lossless battery pack defects is achieved.

CN119224020BActive Publication Date: 2025-04-04CONTEMPORARY AMPEREX TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202411767115.3
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-12-04
Publication Date
2025-04-04
Estimated Expiration
2044-12-04

AI Technical Summary

Technical Problem

In the prior art, the detection of power battery packs mainly relies on lossy disassembly methods, resulting in a long detection time and the battery packs are easily scrapped, which cannot meet the needs of efficient non-destructive testing.

Method used

By performing an overall digital imaging scan of the battery pack to be tested, determine whether there are defects to be detected, and determine the precise scanning parameters based on the defect plane detection information, accurately scan the defects to be detected, and realize non-destructive testing.

Benefits of technology

Improve the accuracy and efficiency of battery pack defect detection, avoiding the risk of damage caused by battery pack due to detection.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present application relates to a battery pack defect detection method, device and battery pack defect detection equipment. The method comprises: obtaining battery pack information of a battery pack to be tested, and determining basic scanning parameters for image scanning based on the battery pack information; performing overall digital imaging scanning on the battery pack to be tested according to the basic scanning parameters to obtain digital image information of the battery pack to be tested; when it is determined based on the digital image information that the battery pack to be tested has a defect to be detected, obtaining defect plane detection information of the defect to be detected; the defect to be detected is a defect that meets the precise detection conditions; based on the defect plane detection information, determining precise scanning parameters for precise detection of the defect to be detected; performing precise scanning of the defect to be detected according to the precise scanning parameters to obtain defect detection results of the defect to be detected. The use of this method can improve the efficiency and accuracy of non-destructive detection of battery pack defects.
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Description

Technical Field

[0001] The present application relates to the technical field of battery pack detection, and in particular to a battery pack defect detection method, device, electronic device, storage medium, computer program product and battery pack defect detection device. Background Art

[0002] In electric drive equipment, such as new energy vehicles, the power battery system can be considered the "heart" of the electric drive equipment, which directly affects the safe application and development of the electric drive equipment to a large extent. With the rapid growth of lithium battery production capacity, a large number of power battery products have flooded into the market. During use, it is found that the quality of power battery products is uneven and the product consistency is poor, which is easy to cause battery safety accidents. This makes the safety of power battery packs one of the key issues that currently plague the development of the industry.

[0003] At present, the power battery pack is generally tested by a destructive disassembly test confirmation method. This method takes a long time to test, and the destructive testing method can easily cause the battery pack to be scrapped. Therefore, there is an urgent need for an efficient and accurate non-destructive testing method for battery packs to detect defects in power battery packs. Summary of the invention

[0004] Based on this, it is necessary to provide a battery pack defect detection method, device, electronic device, computer-readable storage medium and computer program product that can improve the efficiency and accuracy of non-destructive detection of battery pack defects in response to the above-mentioned technical problems.

[0005] In a first aspect, the present application provides a battery pack defect detection method, the method comprising:

[0006] Obtaining battery pack information of the battery pack to be tested, and determining basic scanning parameters for image scanning based on the battery pack information;

[0007] Performing an overall digital imaging scan on the battery pack to be tested according to the basic scanning parameters to obtain digital image information of the battery pack to be tested;

[0008] When it is determined that the battery pack to be tested has a defect to be detected according to the digital image information, defect plane detection information of the defect to be detected is obtained; the defect to be detected is a defect that meets the precise detection conditions;

[0009] Based on the defect plane detection information, determining precise scanning parameters for performing precise detection on the defect to be detected;

[0010] The defect to be detected is accurately scanned according to the accurate scanning parameters to obtain a defect detection result of the defect to be detected.

[0011] In the above embodiment, basic scanning parameters matching the battery pack to be tested are determined according to the battery pack information of the battery pack to be tested, and then an overall digital imaging scan is performed according to the basic scanning parameters to determine whether there are defects to be detected, and then a more matching and accurate scan is performed on the defects to be detected. This can improve the accuracy of battery pack defect detection while improving the detection efficiency of battery pack defect detection. Moreover, the entire battery pack defect detection process is performed by scanning, without damaging the battery pack, thereby reducing the risk of damage to the battery pack due to defect detection.

[0012] In some embodiments, the method further comprises:

[0013] Performing image analysis on the digital image information to obtain plane defect information of the battery pack to be tested mapped on the detection plane;

[0014] When it is determined that the battery pack to be tested has at least one plane display defect according to the plane defect information, evaluating the importance of the plane display defect;

[0015] The plane display defects whose importance evaluation results are important are determined as defects to be detected that meet the precise detection conditions.

[0016] In the above embodiment, when it is determined that the battery pack to be tested has at least one flat display defect, the flat display defects are evaluated for importance, and defects to be detected that have a significant impact on the safe use of the battery pack to be tested are screened out from the flat display defects. Subsequently, targeted and precise scanning and detection can be performed on the defects to be detected, which can reduce the cost of precise detection and improve the efficiency of defect detection while improving the safety of battery pack use.

[0017] In some embodiments, the plane defect information includes defect feature information of the plane display defect; and the importance assessment of the plane display defect includes:

[0018] Determining the defect severity of each of the planar display defects based on the defect feature information of each of the planar display defects;

[0019] For each of the planar display defects, when the severity of the defect reaches a preset severity threshold, the importance assessment result of the planar display defect is determined to be important.

[0020] In the above embodiment, the defect severity of each plane display defect is determined by the defect feature information of each plane display defect, and then the importance of each plane display defect is evaluated based on the comparison result between the preset degree threshold and each defect severity. This can effectively improve the accuracy and evaluation efficiency of the importance evaluation results, thereby improving the accuracy and detection efficiency of battery pack defect detection.

[0021] In some embodiments, the plane defect information also includes the defect properties of the plane display defect; and the method further includes:

[0022] When the severity of the defect does not reach the preset severity threshold, matching the defect property of the plane display defect with a preset key defect property;

[0023] In the case where the defect property successfully matches the preset key defect property, it is determined that the importance assessment result of the plane display defect is important.

[0024] In the above embodiment, by performing further property matching operations on the flat display defects whose defect severity does not reach the preset threshold, the key defects that may affect the safe operation of the battery pack can be screened out from the flat display defects for secondary precise detection, thereby effectively improving the accuracy and comprehensiveness of battery pack defect detection.

[0025] In some embodiments, the defect plane detection information includes defect position information of the defect to be detected; the precise scanning parameters include a scanning detection area for precise scanning;

[0026] The step of determining precise scanning parameters for accurately detecting the defect to be detected based on the defect plane detection information includes:

[0027] According to the defect position information of each of the defects to be detected, each of the defects to be detected that meets the defect area merging condition is merged to obtain a defect group to be detected;

[0028] For each of the defect groups to be detected, determining a defect group detection area of ​​the defect group to be detected based on defect position information of defects to be detected in each group contained in the defect group to be detected;

[0029] The defect group detection area is determined as a scanning detection area for accurately scanning the defects to be detected in each of the groups.

[0030] In the above embodiment, by merging the defects to be detected that meet the defect area merging conditions into a defect group to be detected, and determining the defect group detection area of ​​the defect group to be detected as the scanning detection area for accurately scanning the defects to be detected in each group, the operating time of the scanning component during precise scanning can be effectively reduced, the service life of the scanning component can be increased, and the detection cost of battery pack defect detection can be reduced.

[0031] In some embodiments, the method further comprises:

[0032] Determine the defect size of each defect to be detected along a scanning moving direction according to the defect position information of each defect to be detected; the scanning moving direction is the moving direction of the battery pack to be detected when scanning;

[0033] For each defect to be detected, when the defect size of the defect to be detected is smaller than the reference scanning size, determining a combinable size range of the defect to be detected according to the reference scanning size;

[0034] In the case that other defects to be detected are included in the mergeable size range, the defect to be detected and other defects to be detected included in the mergeable size range are determined as the defects to be detected that meet the defect area merging condition.

[0035] In the above embodiment, by determining the defect size of the defect to be detected in the scanning movement direction, and dividing the defect to be detected into a merging size range based on the reference scanning size and the defect size of the defect to be detected, the accuracy of merging the defects to be detected can be effectively improved, thereby effectively improving the detection efficiency of battery pack defect detection.

[0036] In some embodiments, the method further comprises:

[0037] Determine the defects to be detected that do not meet the defect area merging condition as independent defects to be detected;

[0038] For each of the independent defects to be detected, determining a defect detection area of ​​the independent defect to be detected according to defect position information of the independent defect to be detected;

[0039] The defect detection area is determined as a scanning detection area for accurately scanning the independent defect to be detected.

[0040] In the above embodiment, for independent defects to be detected that cannot be merged with other defects to be detected, the controller can directly determine the defect area of ​​the independent defect to be detected as the defect detection area of ​​the independent defect to be detected, which can effectively improve the scanning accuracy during subsequent precise scanning, thereby improving the accuracy of battery pack defect detection.

[0041] In some embodiments, the defect plane detection information includes defect position information of the defect to be detected; the precise scanning parameter includes a scanning method for performing precise scanning;

[0042] The step of determining precise scanning parameters for accurately detecting the defect to be detected based on the defect plane detection information includes:

[0043] Based on the defect position information of each defect to be detected, clustering the defects to be detected to obtain each defect cluster to be detected;

[0044] For each of the defect clusters to be detected, determining a defect cluster size of the defect cluster to be detected according to defect position information of defects in each cluster in the defect cluster to be detected;

[0045] Based on the defect cluster size of the defect cluster to be detected, a scanning mode for accurately scanning the defect cluster to be detected is determined.

[0046] In the above embodiment, by performing clustering processing on each defect to be detected and matching a suitable scanning mode for each defect cluster to be detected according to the defect cluster size of each defect cluster to be detected, the adaptability of the scanning mode to the actual defect distribution during precise scanning can be effectively improved, thereby reducing the number of scans and the scanning time, so as to achieve the effect of reducing the detection cost and increasing the service life of the scanning component.

[0047] In some of the embodiments, the scanning method includes battery pack fixed-point scanning and battery pack mobile scanning;

[0048] The determining, based on the defect cluster size of the defect cluster to be detected, a scanning method for accurately scanning the defect cluster to be detected includes:

[0049] When the defect cluster size of the defect cluster to be detected is less than or equal to the moving reference scanning size, determining that the scanning mode for performing precise scanning on the defect cluster to be detected is battery pack moving scanning;

[0050] When the defect cluster size of the defect cluster to be detected is larger than the moving reference scanning size, it is determined that the scanning mode for performing precise scanning on the defect cluster to be detected is battery pack fixed-point scanning.

[0051] In the above embodiment, by comparing the defect cluster size with the moving reference scanning size, an accurate scanning method that is more in line with the defect cluster size can be matched for each defect cluster size to be detected, thereby effectively reducing the accurate scanning cost and improving the detection efficiency of battery pack defect detection.

[0052] In a second aspect, the present application further provides a battery pack defect detection device, the device comprising:

[0053] A digital imaging scanning module, used for performing overall digital imaging scanning on the battery pack to be tested to obtain digital image information of the battery pack to be tested;

[0054] A detection information acquisition module, used for acquiring defect plane detection information of the defect to be detected when it is determined that the battery pack to be detected has a defect to be detected according to the digital image information; the defect to be detected is a defect that meets the precise detection conditions;

[0055] A scanning parameter determination module, used to determine precise scanning parameters for precise detection of the defect to be detected based on the defect plane detection information;

[0056] The precise scanning module is used to precisely scan the defect to be detected according to the precise scanning parameters to obtain a defect detection result of the defect to be detected.

[0057] In a third aspect, the present application further provides an electronic device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the above method when executing the computer program.

[0058] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program implements the steps of the above method when executed by a processor.

[0059] In a fifth aspect, the present application also provides a computer program product, including a computer program, which implements the steps of the above method when executed by a processor.

[0060] In a sixth aspect, the present application further provides a battery pack defect detection device, the device comprising a carrying and transporting component, a scanning component, and a controller respectively communicatively connected to the carrying and transporting component and the scanning component;

[0061] The carrying and transporting assembly is used to carry the battery pack to be tested and drive the battery pack to be tested to move along the scanning movement direction;

[0062] The scanning component is used to perform overall digital imaging scanning on the battery pack to be tested, and to perform accurate scanning on defects to be detected on the battery pack to be tested;

[0063] The controller is used to execute the steps of the above method.

[0064] In some embodiments, the carrying and transporting assembly includes an active supporting component and an auxiliary supporting component; the scanning assembly includes a linear ray accelerator and a linear array detector;

[0065] A scanning gap is provided between the active supporting component and the auxiliary supporting component, and the ray linear accelerator and the linear array detector are relatively arranged through the scanning gap; the gap width of the scanning gap is determined according to the detection width of the linear array detector.

[0066] The above-mentioned battery pack defect detection method, device, electronic device, storage medium and computer program product first determine the basic scanning parameters matching the battery pack to be tested according to the battery pack information of the battery pack to be tested, and then perform an overall digital imaging scan on the battery pack to be tested according to the basic scanning parameters to obtain the digital image information of the battery pack to be tested, and determine whether there is a defect to be detected that meets the precise detection conditions in the battery pack to be tested according to the digital image information. When it is determined that there is a defect to be detected, it can be determined based on the defect plane detection information of the defect to be detected. Precise scanning parameters for precise detection of the defect to be detected can be determined. Since the precise scanning parameters are determined according to the defect plane detection information of the defect to be detected, they can be matched with the defect to be detected in the battery pack. Then, the defect to be detected is accurately scanned according to the precise scanning parameters to obtain the defect detection result of the defect to be detected. By first performing an overall digital imaging scan to determine whether there is a defect to be detected, and then performing a more matching precise scan on the defect to be detected, the accuracy of battery pack defect detection can be improved while improving the detection efficiency of battery pack defect detection. The entire battery pack defect detection process is performed by scanning, and there is no need to damage the battery pack, thereby reducing the risk of damage to the battery pack due to defect detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0067] Figure 1 is a structural block diagram of a battery pack defect detection device in some embodiments;

[0068] Figure 2 It is a schematic diagram of the structure of the load-bearing and transporting components in some embodiments;

[0069] Figure 3 A schematic diagram of the structure of a scanning component in some embodiments;

[0070] Figure 4 is a schematic flow chart of a battery pack defect detection method in some embodiments;

[0071] Figure 5 A schematic diagram of a process of performing overall digital imaging scanning on a battery pack to be tested to obtain digital image information of the battery pack to be tested in some embodiments;

[0072] Figure 6 is a schematic flow chart of a battery pack defect detection method in some other embodiments;

[0073] Figure 7 A schematic diagram of a process for determining precise scanning parameters for precise detection of defects to be detected based on defect plane detection information in some embodiments;

[0074] Figure 8 is a schematic flow chart of a battery pack defect detection method in some other embodiments;

[0075] Fig. 9 is a schematic flow chart of a battery pack defect detection method in some other embodiments;

[0076] Fig.10 A schematic diagram of a flow chart of determining precise scanning parameters for precise detection of defects to be detected based on defect plane detection information in other embodiments;

[0077] Fig.11 is a schematic flow chart of a battery pack defect detection method in some other embodiments;

[0078] Fig.12 is a structural block diagram of a battery pack defect detection device in some embodiments;

[0079] Fig.13 1 is a diagram of the internal structure of an electronic device in some embodiments.

[0080] Explanation of the accompanying drawings: 100-battery pack defect detection equipment; 101-carrying and transporting component; 102-scanning component; 103-controller; 201-active supporting component; 202-auxiliary supporting component; 203-support plate; 2011-screw; 2012-active supporting guide rail; 2013-first roller; 2021-auxiliary supporting guide rail; 2022-second roller; 301-scanning cyclotron frame; 302-ray linear accelerator; 303-linear array detector; 304-modulator; 305-cooler; 306-center channel. DETAILED DESCRIPTION

[0081] The following embodiments of the technical solution of the present application are described in detail in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application, and are therefore only used as examples, and cannot be used to limit the scope of protection of the present application.

[0082] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0083] Reference to "embodiments" herein means that the specific features, structures, or characteristics described in conjunction with the embodiments may be included in at least some embodiments of the present application. The appearance of the phrase in various places in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0084] In the description of the embodiments of the present application, the term "multiple" refers to more than two (including two). Similarly, "multiple groups" refers to more than two groups (including two groups), and "multiple pieces" refers to more than two pieces (including two pieces).

[0085] In the description of the embodiments of the present application, the technical terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, which are only for the convenience of describing the embodiments of the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the embodiments of the present application.

[0086] In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to the specific circumstances.

[0087] The power battery pack is the core component of the electric drive unit, which directly affects the safe application and development of electric drive equipment to a large extent. During the manufacturing process, the battery pack may have defects due to problems such as lax process control or insufficient assembly component matching accuracy. For example, there may be defects such as too large or too small gaps between battery cells, poor welding of connecting pieces, wrinkled pole pieces, cracked pole pieces, etc., which affect the quality of the battery pack product and pose a safety hazard to the use of the battery pack. Therefore, defect detection of battery packs to eliminate defective products is a necessary measure to improve the safety of battery pack use.

[0088] Currently, battery packs are usually tested by destructive disassembly testing. This destructive testing method has the problems of long testing time and high battery pack scrap rate, and cannot meet the current demand for efficient and non-destructive testing of battery packs.

[0089] In order to reduce the risk of battery pack damage due to defect detection and improve the efficiency and accuracy of battery pack defect detection, an overall digital imaging scan can be performed on the battery pack to be tested to obtain digital image information of the battery pack to be tested, and whether there are defects to be detected that meet the precise detection conditions in the battery pack to be tested can be determined based on the digital image information. When it is determined that there are defects to be detected, precise scanning parameters for precise detection of the defects to be detected can be determined based on the defect plane detection information of the defects to be detected. Since the precise scanning parameters are determined based on the defect plane detection information of the defects to be detected, they can be matched with the defects to be detected in the battery pack. Subsequently, the defects to be detected are precisely scanned according to the precise scanning parameters to obtain defect detection results of the defects to be detected. By first performing an overall digital imaging scan to determine whether there are defects to be detected, and then performing a more matched precise scan of the defects to be detected, the accuracy of battery pack defect detection can be improved while improving the detection efficiency of battery pack defect detection. The entire battery pack defect detection process is performed by scanning, and there is no need to damage the battery pack, thereby reducing the risk of damage to the battery pack due to defect detection.

[0090] The battery pack defect detection method provided in the embodiment of the present application can be applied to Figure 1 In the battery pack defect detection device 100 shown in the figure, the battery pack defect detection device 100 includes a carrying and transporting component 101, a scanning component 102, and a controller 103 which is communicatively connected with the carrying and transporting component 101 and the scanning component 102 respectively.

[0091] The carrying and transporting assembly 101 is used to carry the battery pack to be tested and drive the battery pack to be tested to move along the scanning movement direction. The scanning assembly 102 is used to perform overall digital imaging scanning of the battery pack to be tested and to perform precise scanning of defects to be detected on the battery pack to be tested.

[0092] The carrying and transporting component 101 is a driving component for carrying the battery pack to be tested and driving the battery pack to be tested to move along the scanning movement direction, and the scanning movement direction is the direction of the scanning area corresponding to the scanning component 102. The carrying and transporting component 101 can respond to the control of the controller 103, carry and drive the battery pack to be tested to move along the scanning movement direction, so that the battery pack to be tested can be moved into or out of the scanning area of ​​the scanning component 102, so that the scanning component 102 can perform overall digital imaging scanning or precise scanning on the battery pack to be tested.

[0093] The scanning component 102 is a scanning device for penetrating scanning of the battery pack to be tested. The scanning component 102 can perform overall digital imaging scanning on the battery pack to be tested that is transported to the scanning area to obtain digital image information of the battery pack to be tested, and can also perform precise scanning of defects to be detected in the battery pack to be tested to obtain defect scanning information of the defects to be detected. It can be understood that in order to achieve overall digital imaging scanning and precise scanning of the battery pack to be tested, the scanning component 102 needs to have both two-dimensional scanning capabilities and three-dimensional scanning capabilities.

[0094] The controller 103 may be any control component with logic execution capability, such as an MCU, a micro control unit, etc.

[0095] In some optional embodiments, when it is necessary to perform defect detection on the battery pack to be tested, the controller 103 can control the carrying and transporting component 101 to drive the battery pack to be tested to move along the scanning movement direction. When the battery pack to be tested moves to the scanning area of ​​the scanning component 102, the controller 103 can control the scanning component 102 to perform an overall digital imaging scan on the battery pack to be tested, and obtain digital image information of the battery pack to be tested based on the scanning operation of the scanning component 102. When the controller 103 determines that the battery pack to be tested has a defect to be detected that meets the precise detection condition based on the digital image information, the controller 103 can obtain defect plane detection information of the defect to be detected, and determine precise scanning parameters for precise detection of the defect to be detected based on the defect plane detection information. Subsequently, the controller 103 can control the carrying and transporting component 101 and the scanning component 102 to cooperate according to the precise scanning parameters to perform precise scanning on the defect to be detected in the battery pack to be tested, thereby obtaining a defect detection result of the defect to be detected.

[0096] In the above embodiment, the battery pack defect detection equipment can drive the battery pack to be tested to move by means of the carrying and transporting component. When the battery pack to be tested moves to the scanning area of ​​the scanning component, the scanning component is controlled by the controller to perform an overall digital imaging scan of the battery pack to be tested according to the scanning requirements, or to perform an accurate scan of the defects to be detected on the battery pack to be tested. This enables non-destructive detection of internal defects of battery packs of different types and sizes without disassembly, thereby reducing the risk of damage to the battery pack due to defect detection.

[0097] In some embodiments, the load-bearing and transporting assembly may include a load-bearing component and a supporting component. The load-bearing component is arranged above the supporting component. The supporting component is used to support the load-bearing component within the full stroke range of the load-bearing component and drive the load-bearing component to move, thereby indirectly driving the battery pack to be tested placed on the load-bearing component to move. The load-bearing component is used to carry the battery pack to be tested.

[0098] When the battery pack to be tested needs to be moved to the scanning area of ​​the scanning component for scanning and detection, the bearing component can carry the battery pack to be tested, and the controller can control the movement of the supporting component to drive the bearing component carrying the battery pack to be tested to move to the scanning component. It can be understood that the bearing component can be a support plate, such as a carbon fiber material plate. The supporting component can be composed of movable structures such as rollers and wheels.

[0099] In some embodiments, the carrying and transporting assembly includes an active supporting component and an auxiliary supporting component, and the scanning assembly includes a linear ray accelerator and a linear array detector. A scanning gap is provided between the active supporting component and the auxiliary supporting component, and the linear ray accelerator and the linear array detector are arranged relative to each other through the scanning gap.

[0100] Among them, the active support components and the auxiliary support components are both support components used to support the battery pack to be tested. The difference is that in addition to the supporting and transporting capabilities, the active support components are also the driving force source of the entire load-bearing and transporting components, that is, the active support components can be used to provide mobile guidance and reciprocating power for the battery pack to be tested.

[0101] It can be understood that in some of the embodiments, when a carrying component is used to carry the battery pack to be tested, the carrying component can move above the active supporting component and the auxiliary supporting component, and the active supporting component and the auxiliary supporting component can provide support for the carrying component over a full range of travel.

[0102] In some embodiments, the auxiliary support component includes an auxiliary support rail and at least one roller disposed on the auxiliary support rail. The auxiliary support rail is used to provide support for the battery pack to be tested, and the roller is used to drive the battery pack to be tested to move by its own rotation. Similarly, the active support component includes an active support rail, at least one roller disposed on the active support rail, and a screw. The active support rail is used to provide support for the battery pack to be tested, the roller is used to drive the battery pack to be tested to move by its own rotation, and the screw is a driving component used to convert rotational motion into linear motion to drive the battery pack to be tested to move.

[0103] Among them, the linear accelerator is a ray emitting device used to generate high-energy X-rays. The linear accelerator can accelerate charged particles to high energy through an accelerating tube by utilizing the electric field or magnetic field force, thereby generating high-energy X-rays.

[0104] The linear array detector is a radiation receiving device used to receive the detection radiation emitted by the linear accelerator and penetrating the battery pack to be tested. The linear array detector consists of a series of independent detection units arranged in a straight line, and each unit is responsible for detecting the signal strength at a specific position.

[0105] Among them, a scanning gap is set between the active supporting component and the auxiliary supporting component. Since the scanning gap is a preset gap used to reduce the influence of the supporting component on the scanning imaging of the battery pack to be tested, and the detection width of the linear detector determines the width of the scanning area during scanning, the gap width of the scanning gap can be determined according to the detection width of the linear detector.

[0106] In some optional embodiments, in order to reduce the interference effect of the supporting component on the scanning and imaging of the battery pack to be tested, a scanning gap is arranged between the active supporting component and the auxiliary supporting component. The gap width of the scanning gap can be determined according to the detection width of the linear detector. The ray linear accelerator and the linear array detector are relatively arranged through the scanning gap. When scanning the battery pack to be tested, the controller can control the active supporting component to drive the battery pack to be tested to move along the scanning movement direction. During the movement, the to-be-detected area of ​​the battery pack to be tested will pass through the scanning area corresponding to the scanning gap. At this time, the ray linear accelerator will emit high-energy X-rays to penetrate the battery pack to be tested. Due to the existence of the scanning gap, the X-rays received by the detector do not pass through the supporting component. Therefore, the interference effect of the supporting component on the scanning and imaging of the battery pack to be tested can be effectively reduced.

[0107] In some of the embodiments, the battery pack inspection equipment further includes a scanning cyclotron drive assembly, which is used to apply a rotational driving force to the X-ray linear accelerator and the linear array detector, driving the X-ray linear accelerator and the linear detector to rotate circumferentially along the rotation axis to collect a detection image of the area to be inspected, wherein the scanning gap between the active support component and the auxiliary support component is on the rotation axis.

[0108] In some of the embodiments, the scanning cycloid drive assembly includes a scanning cycloid frame, which is provided with a central channel. The channel diameter can be set according to the maximum size of the battery pack to be tested, so that the central channel can accommodate battery packs of all sizes to be tested for scanning and detection.

[0109] During actual scanning and testing, the battery to be tested can pass through the central hole of the scanning gyroscopic frame driven by the active support component and the auxiliary support component, and the scanning gap between the active support component and the auxiliary support component is within the central hole of the scanning gyroscopic frame.

[0110] The scanning cyclotron frame is mainly used to carry the linear accelerator and the linear array detector, and drive the linear accelerator and the linear array detector to rotate around the battery pack to be tested during the scanning process. It can be understood that a rotation drive component, such as a rotation drive motor, is provided on the scanning cyclotron frame, which can control the linear accelerator and the linear array detector to rotate evenly around the battery pack to be tested at a constant speed, so as to collect comprehensive projection data.

[0111] In some of the embodiments, at least one slip ring assembly is provided on the scanning cyclotron frame, wherein the slip ring assembly is an electrical component responsible for connecting the rotating body and transmitting energy and signals. It can transmit electricity, electrical signals or data between the rotating part and the stationary part of the equipment, so that the rotating part can maintain continuous transmission of electrical signals or energy while rotating.

[0112] In some embodiments, a battery pack defect detection device is provided, which includes a load-carrying and transporting component and a scanning component, and a controller that is communicatively connected to the load-carrying and transporting component and the scanning component, respectively.

[0113] Among them, Figure 2 As shown, the load-bearing and transporting assembly includes an active supporting component 201 , an auxiliary supporting component 202 and a supporting plate 203 .

[0114] The active support component 201 includes a screw 2011, an active support guide rail 2012 and a first roller 2013. The active support component 201 is used to provide guidance and reciprocating power for the movement of the battery pack to be tested. When the support plate 203 is placed on the active support component 201, the first roller 2013 under the support plate 203 will support the support plate 203 and drive the support plate 203 to move.

[0115] The support plate 203 is used to carry the battery pack to be tested, and its main material may be carbon fiber material. Before performing defect detection on the battery pack to be tested, the inspector may place the battery pack to be tested on the support plate 203 manually or mechanically.

[0116] In some of the embodiments, the battery pack to be tested can be placed on the support plate 203 by a overhead crane device. In order to achieve accurate positioning of the overhead crane device and subsequent scanning and detection, the surface of the support plate 203 is provided with placement position identification information, such as a center line, a starting position line, a contour line of a battery pack of general size, etc., to assist in rapid positioning and detection of the battery pack.

[0117] In actual operation, the inspector can operate the crane equipment manually or through a controller to accurately place the hoist above the battery pack to be tested, wait for the contact point between the crane and the battery pack to be tested to be stable, and then start the crane equipment to slowly lift the battery pack to reduce the impact of shaking or impact caused by sudden acceleration or deceleration on the placement accuracy, thereby controlling the crane equipment to smoothly move the battery pack to be tested to above the detection position of the support plate 203, and slowly lower the battery pack to be tested until it is safely placed on the detection position.

[0118] The auxiliary support component 202 includes an auxiliary support rail 2021 and a second roller 2022. A 100mm scanning gap is left between the active support rail 2012 of the active support component 201 and the auxiliary support rail 2021 of the auxiliary support component 202, which facilitates imaging detection of the battery pack to be tested and reduces interference of the support body on the imaging.

[0119] like Figure 3 As shown, the scanning assembly includes a scanning cyclotron frame 301, on which a linear ray accelerator 302, a linear array detector 303 arranged opposite to the linear ray accelerator 302, a rotation drive motor (not shown in the figure), a slip ring assembly (not shown in the figure), a modulator 304, a cooler 305, and a central channel 306 arranged in the middle of the scanning cyclotron frame 301 are carried.

[0120] The modulator 304 is mainly used for manually debugging the scanning rays, and the cooler 305 can cool down the ray linear accelerator 302 and the linear array detector 303 during the scanning process to reduce the probability of damage to the ray linear accelerator 302 and the linear array detector 303 due to long-term scanning.

[0121] The scanning gyroscopic frame 301 is mainly responsible for rotating around the battery pack to be tested during the scanning process. This rotation process depends on the drive of the rotary drive motor. Through the precise motor drive, the scanning gyroscopic frame can rotate at a constant speed. At the same time, during the scanning process, it drives the carried linear ray accelerator 302 and the linear array detector 303 to rotate evenly around the battery pack to be tested, thereby collecting comprehensive projection data information of the defects to be detected on the battery pack to be tested. The comprehensive projection data information can be stably and uninterruptedly transmitted to the controller for processing through the slip ring assembly.

[0122] The linear accelerator 302 uses a 9MeV X-band linear accelerator to generate X-rays. The linear accelerator has the advantages of small size, high energy, light weight, and high dose rate. The linear array detector 303 is composed of a series of independent detection units arranged in a straight line, and each unit is responsible for detecting the signal strength at a specific position.

[0123] The central hole 306 in the middle of the scanning gyroscopic frame 301 is a hole for the battery pack to pass through, and the hole diameter can be set to 1600 mm. By setting a large-diameter central hole, the battery pack defect detection device can support battery packs of various sizes to pass through. It should be noted that a 100 mm scanning gap is left between the active support rail 2012 and the auxiliary support rail 2021 in the central hole 306, and the ray linear accelerator 302 and the linear array detector 303 are arranged relative to each other through the scanning gap.

[0124] During the actual detection process, when the battery pack to be tested has been accurately placed on the support plate 203, the controller can control the active support component 201 to start, and the active support component 201 drives the support plate 203 to move toward the central channel 306 in the middle of the scanning convolution frame through the first roller 2013. When moving to the scanning gap, the controller can drive the scanning convolution frame 301 to rotate, thereby driving the linear accelerator 302 and the linear array detector 303 to rotate. During the rotation process, the linear accelerator 302 and the linear array detector 303 are controlled to start, scan the battery pack to be tested, and obtain corresponding projection data.

[0125] In some embodiments, Figure 4 As shown, a battery pack defect detection method is provided, and the method is applied to Figure 1 The controller 103 shown is used as an example for description, and includes the following steps:

[0126] S402, performing an overall digital imaging scan on the battery pack to be tested to obtain digital image information of the battery pack to be tested.

[0127] Among them, overall digital imaging scanning is also called digital X-ray (Digital Radiography, DR) scanning. It uses the principle that different densities, thicknesses, and materials have different degrees of absorption of X-rays. It uses X-rays to pass through the object to be measured, and captures the ray signals after the X-rays penetrate the object to be measured. It converts them into digital images to realize X-ray imaging technology to image the object. By using overall digital imaging scanning technology, the two-dimensional projection image information of the object to be measured can be obtained efficiently and intuitively.

[0128] The digital image information of the battery pack to be tested can be used to characterize the two-dimensional projection image information of the battery pack to be tested mapped on the detection plane when performing an overall digital imaging scan. The detection plane is a plane perpendicular to the battery pack to be tested and the scanning ray. It can be understood that when the scanning component performs an overall digital imaging scan of the battery pack to be tested, the scanning component will be in a stationary state, and the scanning ray penetrates the battery pack to be tested from a fixed direction. The battery pack to be tested can be two-dimensionally projected and mapped on the detection plane perpendicular to the scanning ray to obtain the digital image information of the battery pack to be tested. For example, the planar direction of the detection plane can be parallel to the scanning movement direction of the battery pack to be tested. When the battery pack to be tested moves to the scanning area, the scanning component can emit scanning rays from the top of the battery pack to be tested and penetrate the battery pack to be tested, thereby obtaining the digital image information of the battery pack to be tested mapped on the detection plane.

[0129] In some optional embodiments, the controller may control the scanning component to perform an overall digital imaging scan on the battery pack to be tested in the scanning area to obtain digital image information of the battery pack to be tested.

[0130] In some of the embodiments, the area of ​​the scanning region is smaller than the detection area of ​​the battery pack to be tested. In order to achieve an overall digital imaging scan of the entire battery pack to be tested, when performing the imaging scan, the controller can control the carrying transmission component to drive the battery pack to be tested through the scanning area at a uniform speed at a preset speed.

[0131] S404, when it is determined that the battery pack to be tested has a defect to be detected according to the digital image information, defect plane detection information of the defect to be detected is obtained.

[0132] Among them, the defects to be detected are defects that meet the precise detection conditions. The precise detection conditions are preset judgment conditions for determining whether the defects in the battery pack to be tested need to be precisely scanned and detected. The precise detection conditions are related to the importance of the defects in the battery pack to be tested. For example, for defects with higher importance, in order to improve the safety of the battery pack, subsequent precise scans may be further performed to determine the detection results of the defects. For defects with lower importance, such as defects that do not have a significant impact on the safety of the battery pack, in order to reduce the detection cost and improve the detection efficiency, subsequent precise scans may no longer be performed. It can be understood that the number of defects to be detected on the battery pack to be tested is related to the production quality of the battery pack to be tested, and the battery pack to be tested may include zero, single or multiple defects to be detected.

[0133] The defect plane detection information of the defect to be detected is information data used to characterize the defect detection result mapped on the detection plane of the defect to be detected. For example, the defect plane detection information may include the defect position of the defect to be detected on the detection plane of the battery pack to be detected, the defect size mapped on the detection plane, the defect nature, etc.

[0134] In some optional embodiments, the controller can determine whether the battery pack to be tested has a defect to be detected that meets the precise detection conditions based on the two-dimensional projection image information of the battery pack to be tested represented by the digital image information. When it is determined that the battery pack to be tested has a defect to be detected, defect plane detection information of the defect to be detected can be obtained, thereby providing a data basis for subsequent precise scanning and detection of the defect to be detected.

[0135] In some of the embodiments, the controller is pre-configured with a defect detection model trained based on precise detection conditions. After obtaining the digital image information of the battery pack to be tested, the digital image information can be input into the defect detection model to obtain the plane defect detection result of the battery pack to be tested. The plane defect detection result can include all plane display defects, plane display defect information, defects to be detected, and defect plane detection information of the defects to be detected in the battery pack to be tested. If the battery pack to be tested does not have the defects to be detected, the defect detection model can only output all plane display defects and plane display defect information in the battery pack to be tested.

[0136] S406, based on the defect plane detection information, determine precise scanning parameters for precise detection of the defect to be detected.

[0137] Among them, the precise scanning parameters are the control guidance parameters required by the controller when controlling the scanning component to accurately scan the defects to be detected. For example, the precise scanning parameters may include the precise detection area on the battery pack to be tested, the scanning method for accurately scanning the battery pack to be tested, the scanning speed, etc.

[0138] In some optional embodiments, since the precise detection scan only needs to scan the defects to be detected on the battery pack to be detected, the controller can determine the plane mapping of the defect to be detected on the battery pack to be tested based on the defect plane detection information of the defect to be detected, and preliminarily determine the position, plane size and other information of the defect to be detected on the battery pack to be tested according to the plane mapping of the defect to be detected, and then determine the precise scanning parameters for precise detection of the defect to be detected.

[0139] In some of the embodiments, the controller can extract key information from the defect plane detection information, determine the scanning-related information of the defect to be detected, such as the defect position and defect size of the defect to be detected on the detection plane, and determine the precise scanning parameters that match the scanning-related information based on the scanning-related information and the correspondence between the preset scanning-related information and the precise scanning parameters.

[0140] S408, accurately scanning the defect to be detected according to the accurate scanning parameters to obtain a defect detection result of the defect to be detected.

[0141] Among them, the process of accurately scanning the defects to be detected refers to the process of using computed tomography (CT) technology to perform computed tomography imaging scanning on the defects to be detected. By accurately scanning the defects to be detected in the battery pack to be tested, a three-dimensional image of the defects to be detected can be obtained, thereby accurately and intuitively displaying the defect situation of the defects to be detected inside the battery pack to be tested.

[0142] Among them, the defect detection result of the defect to be detected can be used to reflect the complete defect of the defect to be detected inside the battery pack to be tested. For example, the defect detection result can include a three-dimensional stereo image of the defect to be detected, the defect type, the defect location, the defect size, the defect severity, etc.

[0143] In some optional embodiments, the controller can accurately scan the defects to be detected on the battery pack to be tested according to precise scanning parameters to obtain three-dimensional projection information of the defects to be detected, and analyze and determine the defect detection results of the defects to be detected based on the defect conditions of the defects to be detected inside the battery pack to be tested represented by the three-dimensional projection information.

[0144] In some of the embodiments, after obtaining the three-dimensional projection information of the defect to be detected, the controller can reorganize and reconstruct the three-dimensional projection information according to a preset projection data reconstruction method to obtain a tomographic image of the defect to be detected, and then perform defect analysis on the three-dimensional tomographic image to obtain a defect detection result of the defect to be detected.

[0145] In the above-mentioned battery pack defect detection method, first, an overall digital imaging scan is performed on the battery pack to be tested to obtain digital image information of the battery pack to be tested, and whether there are defects to be detected that meet the precise detection conditions in the battery pack to be tested is determined based on the digital image information. When it is determined that there are defects to be detected, precise scanning parameters for precise detection of the defects to be detected can be determined based on the defect plane detection information of the defects to be detected. Since the precise scanning parameters are determined based on the defect plane detection information of the defects to be detected, they can be matched with the defects to be detected existing in the battery pack. Subsequently, the defects to be detected are precisely scanned according to the precise scanning parameters to obtain defect detection results of the defects to be detected. By first performing an overall digital imaging scan to determine whether there are defects to be detected, and then performing a more matched precise scan of the defects to be detected, the accuracy of battery pack defect detection can be improved while improving the detection efficiency of battery pack defect detection. Moreover, the entire battery pack defect detection process is performed by scanning, and there is no need to damage the battery pack, thereby reducing the risk of damage to the battery pack due to defect detection.

[0146] In order to improve the accuracy of the battery pack defect detection method, in some embodiments, such as Figure 5 As shown, S402, performing an overall digital imaging scan on the battery pack to be tested to obtain digital image information of the battery pack to be tested, including:

[0147] S502: Obtain battery pack information of the battery pack to be tested.

[0148] Among them, the battery pack information is information data used to reflect the basic situation of the battery pack. The battery pack information may include battery pack production information and battery pack detection information. Among them, the battery pack production information may include information such as battery pack size and material. The battery pack detection information is information data used to reflect the basic detection requirements of the battery pack, such as scanning image detection requirements when scanning the battery pack.

[0149] In some optional embodiments, the controller may pre-acquire the battery pack information of the battery pack to be tested before performing defect detection on the battery pack to be tested. It is understandable that the battery pack information of the battery pack to be tested may be pre-uploaded to the controller by the inspector.

[0150] S504: Determine basic scanning parameters for image scanning based on the battery pack information.

[0151] Among them, the basic scanning parameters are scanning parameters that need to be used for the overall digital imaging scan of the battery pack to be tested and the subsequent precise scanning of the defects to be detected. For example, the basic scanning parameters may include the ray emission intensity and image quality parameters used in the image scanning. The image quality parameters may include image matrix parameters, sampling time parameters, etc. It can be understood that if the battery pack information of the battery pack to be tested reflects different battery pack production information and battery pack detection information, the basic scanning parameters for the image scanning of the battery pack to be tested will also be different accordingly.

[0152] In some optional embodiments, the controller may extract the battery pack production information of the battery pack to be tested and the scanning image detection requirement information of the battery pack based on the battery pack information, and determine the basic scanning parameters for image scanning based on the battery pack production information and the scanning image detection requirement information.

[0153] In some of the embodiments, the controller can determine the battery pack size and battery pack material of the battery pack to be tested based on the battery pack production information, and determine the ray emission intensity that matches the battery pack size and battery pack material of the battery pack to be tested based on the preset correspondence between the ray emission intensity and the battery pack size and battery pack material.

[0154] In some of the embodiments, the controller may determine basic image quality parameters when performing image scanning on the battery pack to be tested based on the scanning image detection requirement information, and then determine image quality parameters when performing image scanning on the battery pack to be tested based on the battery pack size reflected by the battery pack production information and the basic image quality parameters.

[0155] S506 , performing an overall digital imaging scan on the battery pack to be tested according to the basic scanning parameters to obtain digital image information of the battery pack to be tested.

[0156] In some optional embodiments, the controller may control the scanning component to perform an overall digital imaging scan on the battery pack to be tested according to the basic scanning parameters to obtain digital image information of the battery pack to be tested.

[0157] In the above embodiment, basic scanning parameters matching the battery pack to be tested can be determined according to the battery pack information of the battery pack to be tested, which can effectively improve the scanning accuracy when performing image scanning on the battery pack to be tested, thereby improving the accuracy of battery pack defect detection.

[0158] How to determine whether the battery pack to be tested has defects that meet the conditions for accurate detection is an important step in determining whether to perform accurate detection. The following will illustrate the process of how to determine whether the battery pack to be tested has defects to be detected through several embodiments.

[0159] In some embodiments, Figure 6As shown, the battery pack defect detection method also includes the following steps:

[0160] S602, performing image analysis on the digital image information to obtain plane defect information of the battery pack to be tested mapped on the detection plane.

[0161] The digital image information may include a two-dimensional projection image of the battery pack to be tested on the test plane. Plane defect information is information data used to characterize defect information of each plane display defect in the battery pack to be tested. Plane display defects refer to defects displayed in the two-dimensional projection image of the battery pack to be tested. Plane defect information may include whether the battery pack to be tested has a plane display defect, the plane defect characteristics of each plane display defect, the nature of the defect, the severity of the defect, etc.

[0162] In some optional embodiments, the controller may perform image analysis on the two-dimensional projection image reflected by the digital image information to obtain planar defect information of the battery pack to be tested mapped on the detection plane.

[0163] In some of the embodiments, the controller may input the two-dimensional projection image of the digital image information feedback into a pre-trained defect information detection model for image analysis to obtain the plane defect information output by the defect information detection model.

[0164] S604, when it is determined that the battery pack to be tested has at least one plane display defect according to the plane defect information, evaluate the importance of the plane display defect.

[0165] Among them, the significance assessment is an evaluation method used to determine whether the flat panel display defect has a significant impact on the safe use of the battery pack under test.

[0166] In some optional embodiments, the controller may first determine whether there is a plane display defect in the battery pack to be tested based on the plane defect information, and when it is determined that there is at least one plane display defect in the battery pack to be tested, the importance of the plane display defect may be evaluated.

[0167] In some of the embodiments, a trained defect importance assessment model is pre-configured in the controller. When the controller determines that the battery pack to be tested has at least one flat display defect, the controller can directly input the flat defect information into the defect importance assessment model, and perform importance assessment on the flat display defect based on the defect importance assessment model to obtain an importance assessment result of the flat display defect.

[0168] S606, determining the plane display defect whose importance evaluation result is important as a defect to be detected that meets the precise detection condition.

[0169] In some optional embodiments, when the importance assessment result of the flat display defect is important, it can be considered that the flat display defect has a significant impact on the safe use of the battery pack to be tested and meets the precise detection conditions, and further precise scanning and detection is required. Therefore, the controller can determine the flat display defect with the importance assessment result of important as a defect to be detected that meets the precise detection conditions.

[0170] In the above embodiment, when it is determined that the battery pack to be tested has at least one flat display defect, the flat display defects are evaluated for importance, and defects to be detected that have a significant impact on the safe use of the battery pack to be tested are screened out from the flat display defects. Subsequently, targeted and precise scanning and detection can be performed on the defects to be detected, which can reduce the cost of precise detection and improve the efficiency of defect detection while improving the safety of battery pack use.

[0171] In some embodiments, the plane defect information includes defect feature information of the plane display defect, and the importance assessment of the plane display defect in S604 includes: determining the defect severity of each plane display defect based on the defect feature information of each plane display defect, and for each plane display defect, when the defect severity reaches a preset threshold, determining that the importance assessment result of the plane display defect is important.

[0172] The defect characteristic information is characteristic information used to reflect the planar shape of the planar display defect. For example, the defect characteristic information may include information such as the defect plane size and defect plane position of the planar display defect.

[0173] The preset severity threshold is a preset judgment threshold parameter used to determine whether the severity of a flat panel display defect will have a significant impact on the safety of use of the battery pack under test.

[0174] In some optional embodiments, the controller may determine the defect severity of each plane display defect based on the defect characteristic information of each plane display defect, and compare, for each plane display defect, the defect severity of the plane display defect with a preset severity threshold; when the defect severity of the plane display defect reaches the preset severity threshold, determine that the importance assessment result of the plane display defect is important, thereby achieving the effect of screening out defects to be detected from various plane display defects.

[0175] In some of the embodiments, the controller stores a preset mapping relationship between defect feature information and each defect severity. After obtaining the defect feature information of each plane display defect, the controller can directly find the defect severity that matches the defect feature information of the plane display defect from the preset mapping relationship between the defect feature information and each defect severity, and determine it as the defect severity of the plane display defect.

[0176] In other embodiments, a severity determination model may be pre-configured in the controller, and the controller may input defect feature information of each plane display defect into the severity determination model to determine the defect severity of each plane display defect.

[0177] In the above embodiment, the defect severity of each plane display defect is determined by the defect feature information of each plane display defect, and then the importance of each plane display defect is evaluated based on the comparison result between the preset degree threshold and each defect severity. This can effectively improve the accuracy and evaluation efficiency of the importance evaluation results, thereby improving the accuracy and detection efficiency of battery pack defect detection.

[0178] In addition to flat display defects whose severity reaches the preset threshold, which can be determined as defects to be detected, the battery pack may also include some key defects, such as structural fractures, wiring harness detachment, etc. Even if the severity of the key defect does not reach the preset threshold, due to its special nature, it also needs to be focused on in order to effectively improve the safety of battery pack use.

[0179] Based on this, in some embodiments, the plane defect information also includes the defect properties of the plane display defect; and the battery pack defect detection method also includes:

[0180] When the severity of the defect does not reach the preset threshold, the defect property of the flat display defect is matched with the preset key defect property. When the defect property matches the preset key defect property successfully, the importance assessment result of the flat display defect is determined to be important.

[0181] Among them, defect properties are property parameters used to reflect the defect type to which the flat display defect belongs. For example, the defect properties of flat display defects may include structural faults, pole piece wrinkles, wiring harness plug-in and pull-out detachment, metal foreign matter, etc. The key defect properties are defect characteristics that will affect the safety of battery pack use. The key defect properties can be pre-certified and determined by the inspection personnel based on the actual situation of the battery pack to be tested. The number of key defect properties can be single or multiple.

[0182] In some optional embodiments, for each plane display defect, if the defect severity of the plane display defect does not reach a preset threshold, it means that from the perspective of defect severity, the plane display defect will not have a significant impact on the safety of battery pack use. At this time, in order to further improve the accuracy of major defect detection, the controller may match the defect nature of the plane display defect with the preset key defect nature. If the defect nature of the plane display defect successfully matches the preset key defect nature, it means that from the perspective of defect nature, the plane display defect may still have a significant impact on the safety of battery pack use. The controller may determine that the importance assessment result of the plane display defect is important, and the plane display defect is a defect to be detected.

[0183] In other embodiments, when the defect properties of the plane display defect fail to match the preset key defect properties, it means that from the perspective of the defect properties, the plane display defect will not have a significant impact on the safety of battery pack use. The controller can determine that the importance assessment result of the plane display defect is not important, and will no longer perform further precise scanning and detection on the plane display defect, thereby reducing the defect detection cost of the battery pack and improving the defect detection efficiency.

[0184] In the above embodiment, by performing further property matching operations on the flat display defects whose defect severity does not reach the preset threshold, the key defects that may affect the safe operation of the battery pack can be screened out from the flat display defects for secondary precise detection, thereby effectively improving the accuracy and comprehensiveness of battery pack defect detection.

[0185] When performing precise scanning on defects to be detected, precise scanning parameters will have an important impact on the precise scanning process. Therefore, the process of determining precise scanning parameters is also one of the important steps in battery pack defect detection. The following will illustrate how to determine precise scanning parameters for precise detection of defects to be detected through several embodiments.

[0186] In some embodiments, the defect plane detection information includes defect position information of the defect to be detected, and the precise scanning parameters include a scanning detection area for precise scanning. Figure 7 As shown, S406, based on the defect plane detection information, determining precise scanning parameters for precise detection of the defect to be detected, including:

[0187] S702 , merging the defects to be detected that meet the defect area merging condition according to the defect position information of the defects to be detected to obtain a defect group to be detected.

[0188] The defect position information is used to characterize the position of the defect to be detected on the detection plane. It can be understood that the defect position information can include the defect coordinates of the defect to be detected, and the defect area of ​​the defect to be detected can be determined on the detection plane through the defect position information of the defect to be detected.

[0189] The defect area merging condition is a preset judgment condition for determining whether the defects to be detected can be merged. The defect area merging condition can be determined based on the baseline scanning size of the scanning component. When each defect to be detected satisfies the defect area merging condition, it can be considered that the scanning component can complete the scanning of multiple defects to be detected that meet the conditions in one scan.

[0190] In some optional embodiments, the controller may determine the defect area of ​​each defect to be detected according to the defect position information of each defect to be detected, and based on the defect area of ​​each defect to be detected and the pre-set defect area merging condition, merge at least two defects to be detected that meet the defect area merging condition to obtain a defect group to be detected. It can be understood that the defects to be detected in each group of the defect group to be detected meet the defect area merging condition.

[0191] S704 , for each defect group to be detected, based on the defect position information of the defects to be detected in each group contained in the defect group to be detected, determine a defect group detection area of ​​the defect group to be detected.

[0192] In some optional embodiments, for each defect group to be detected, the controller can determine the minimum area required to contain the defects to be detected in each group based on the defect position information of the defects to be detected in each group contained in the defect group to be detected, and determine the minimum area as the defect group detection area of ​​the defect group to be detected.

[0193] In some of the embodiments, the defect position includes the defect coordinates of the defect to be detected. The controller can connect the coordinates of the outermost defects in each group to be detected, and the obtained defect area can be determined as the defect group detection area of ​​the defect group to be detected.

[0194] S706, determining the defect group detection area as a scanning detection area for accurately scanning the defects to be detected in each group.

[0195] In some optional embodiments, the controller may determine the defect group detection area as a scanning detection area for accurately scanning the defects to be detected in each group. When performing subsequent accurate scanning, only one scanning operation is required to complete the scanning of all the defects to be detected in each group.

[0196] In the above embodiment, by merging the defects to be detected that meet the defect area merging conditions into a defect group to be detected, and determining the defect group detection area of ​​the defect group to be detected as the scanning detection area for accurately scanning the defects to be detected in each group, the operating time of the scanning component during precise scanning can be effectively reduced, the service life of the scanning component can be increased, and the detection cost of battery pack defect detection can be reduced.

[0197] Furthermore, in some embodiments, Figure 8 As shown, the battery pack defect detection method also includes the following steps:

[0198] S802, determining the defect size of each defect to be detected along the scanning moving direction according to the defect position information of each defect to be detected.

[0199] The scanning movement direction is the movement direction of the battery pack to be tested when scanning.

[0200] In some optional embodiments, the controller may determine the defect size of each defect to be detected along the scanning movement direction according to the defect position information of each defect to be detected.

[0201] In some of the embodiments, the defect position information includes the defect coordinates of the defect to be detected. Since the defect position information represents the position information of the defect to be detected on the detection plane, the defect coordinates may include a first coordinate and a second coordinate that are perpendicular to each other. The controller may determine the directional coordinate in the scanning moving direction from the first coordinate and the second coordinate, and then determine the defect size of the defect to be detected along the scanning moving direction according to the directional coordinates contained in the defect to be detected.

[0202] For example, the defect coordinates of the defect to be detected include (x1y1, x2y2, ..., x n y n ), the controller determines the direction coordinate in the scanning movement direction as the x coordinate, then according to x1, x2, ...x n , determine the defect size of the defect to be detected along the scanning movement direction.

[0203] S804: for each defect to be detected, when the defect size of the defect to be detected is smaller than the reference scanning size, determine a combinable size range of the defect to be detected according to the reference scanning size.

[0204] Among them, the reference scanning size refers to the size range that can be detected when the scanning component rotates around the battery pack to be tested for one circle when performing precise scanning detection. It can be understood that the reference scanning size is also the scanning size range mapped on the detection plane.

[0205] In some optional embodiments, for each defect to be detected, the controller may compare the defect size of each defect to be detected with the reference scanning size. When the defect size of the defect to be detected is smaller than the reference scanning size, it indicates that there is a possibility that the defect to be detected may be merged with other defects to be detected. The controller may determine the mergeable size range of the defect to be detected based on the reference scanning size.

[0206] S806, when other defects to be detected are included in the mergeable size range, the defect to be detected and other defects to be detected included in the mergeable size range are determined as defects to be detected that meet the defect area merging condition.

[0207] In some optional embodiments, the controller may search whether other defects to be detected are included in the mergeable size range. When it is determined that other defects to be detected are included in the mergeable size range, the controller may determine the defects to be detected and other defects to be detected included in the mergeable size range as defects to be detected that meet the defect area merging conditions.

[0208] In the above embodiment, by determining the defect size of the defect to be detected in the scanning movement direction, and dividing the defect to be detected into a merging size range based on the reference scanning size and the defect size of the defect to be detected, the accuracy of merging the defects to be detected can be effectively improved, thereby effectively improving the detection efficiency of battery pack defect detection.

[0209] In other embodiments, Fig. 9 As shown, the battery pack defect detection method also includes the following steps:

[0210] S902: Determine the defects to be detected that do not meet the defect area merging condition as independent defects to be detected.

[0211] In some optional embodiments, the controller may determine the defects to be detected that do not meet the defect area merging condition as independent defects to be detected.

[0212] S904, for each independent defect to be detected, determine a defect detection area of ​​the independent defect to be detected according to defect position information of the independent defect to be detected.

[0213] In some optional embodiments, for each independent defect to be detected, the controller can determine the defect area of ​​the independent defect to be detected along the scanning movement direction based on the defect position information of the independent defect to be detected, and determine the defect area of ​​the independent defect to be detected as the defect detection area of ​​the independent defect to be detected.

[0214] S906: Determine the defect detection area as a scanning detection area for accurately scanning the independent defects to be detected.

[0215] In some optional embodiments, the controller may determine the defect detection area of ​​the independent defect to be detected as a scanning detection area for accurately scanning the independent defect to be detected.

[0216] In the above embodiment, for independent defects to be detected that cannot be merged with other defects to be detected, the controller can directly determine the defect area of ​​the independent defect to be detected as the defect detection area of ​​the independent defect to be detected, which can effectively improve the scanning accuracy during subsequent precise scanning, thereby improving the accuracy of battery pack defect detection.

[0217] In some embodiments, the defect plane detection information includes defect position information of the defect to be detected, and the precise scanning parameters include a scanning method for performing precise scanning. Fig.10 As shown, S406, based on the defect plane detection information, determining precise scanning parameters for precise detection of the defect to be detected, including:

[0218] S1002, based on the defect position information of each defect to be detected, clustering processing is performed on each defect to be detected to obtain each defect cluster to be detected.

[0219] Among them, clustering processing can be considered as a partitioning operation that clusters and divides each defect to be detected according to the interval distance. By clustering each defect to be detected, the defects to be detected with closer interval distances can be clustered together as a defect cluster to be detected. It can be understood that clustering each defect to be detected will not change the defect position of each defect to be detected.

[0220] In some optional embodiments, the controller may perform clustering processing on each defect to be detected based on the defect position information of each defect to be detected and in accordance with a preset clustering processing method to obtain each defect cluster to be detected.

[0221] S1004 , for each defect cluster to be detected, determine the defect cluster size of the defect cluster to be detected according to defect position information of defects in each cluster in the defect cluster to be detected.

[0222] The defect cluster size refers to the area size of the minimum defect area including defects in each cluster in the defect cluster to be detected along the scanning movement direction.

[0223] In some optional embodiments, for each defect cluster to be detected, the controller may determine the defect cluster size of each defect cluster to be detected based on the defect position information of the defects in each cluster in each defect cluster to be detected. It can be understood that the way in which the controller determines the defect cluster size is roughly the same as the way in which the defect size of the defect to be detected is determined in the above text, and will not be repeated here.

[0224] S1006 , determining a scanning method for accurately scanning the defect cluster to be detected based on the defect cluster size of the defect cluster to be detected.

[0225] Among them, the scanning method for accurate scanning of the defect cluster to be detected may include fixed-point scanning of the battery pack and mobile scanning of the battery pack. Fixed-point scanning of the battery pack means that the battery pack is fixed in the scanning area of ​​the scanning component and does not move while scanning. After scanning a scanning detection area, it moves along the scanning movement direction until the next scanning detection area is in the scanning area of ​​the scanning component. Mobile scanning of the battery pack means that the battery pack moves at a constant speed along the scanning movement direction at a fixed speed while scanning. It can be understood that when scanning using the mobile scanning method of the battery pack, the scanning trajectory of the scanning component can be considered as a spiral trajectory.

[0226] In some optional embodiments, the controller may determine a scanning method for performing precise scanning on the defective cluster to be detected based on the defective cluster size of the defective cluster to be detected.

[0227] In the above embodiment, by performing clustering processing on each defect to be detected and matching a suitable scanning mode for each defect cluster to be detected according to the defect cluster size of each defect cluster to be detected, the adaptability of the scanning mode to the actual defect distribution during precise scanning can be effectively improved, thereby reducing the number of scans and the scanning time, so as to achieve the effect of reducing the detection cost and increasing the service life of the scanning component.

[0228] In some embodiments, S1006, based on the defect cluster size of the defect cluster to be detected, determining a scanning method for performing precise scanning on the defect cluster to be detected includes:

[0229] When the defect cluster size of the defect cluster to be detected is less than or equal to the moving reference scanning size, the scanning method for performing precise scanning on the defect cluster to be detected is determined to be the battery pack moving scanning. When the defect cluster size of the defect cluster to be detected is greater than the moving reference scanning size, the scanning method for performing precise scanning on the defect cluster to be detected is determined to be the battery pack fixed-point scanning.

[0230] The moving reference scanning size refers to the size of the area that can be scanned on the detection plane when the scanning component rotates and scans the moving battery pack to be tested for one circle when the battery pack is being moved for scanning. It can be understood that the specific size of the moving reference scanning size is related to the component parameters of the scanning component, such as the scanning area of ​​the scanning component, the rotation speed of the scanning component, and the moving speed of the battery pack during the scanning process.

[0231] In some optional embodiments, for each defect cluster to be detected, the controller may compare the defect cluster size of the defect cluster to be detected with the moving reference scanning size of the scanning component. When the defect cluster size of the defect cluster to be detected is less than or equal to the moving reference scanning size, it indicates that the defect cluster to be detected is scanned in a spiral shape by rotating one circle. The scanning range can cover all defects within the cluster in the defect cluster to be detected. Then, the battery cluster to be detected is accurately scanned and detected using the battery pack moving scanning method, which is more efficient and consumes less scanning cost. Therefore, the controller can determine that the scanning method for accurately scanning the defect cluster to be detected is the battery pack moving scanning method.

[0232] When the defect cluster size of the defect cluster to be detected is larger than the moving reference scanning size, it means that the interval distance between the defects in each cluster in the defect cluster to be detected is large. The defect cluster to be detected is scanned in a spiral shape and rotated for one circle. The scanning range cannot cover all the intra-cluster defects in the defect cluster to be detected. At this time, using the battery pack moving scanning method to perform accurate scanning and detection of the battery cluster to be detected is not as energy-efficient as using the battery pack fixed-point scanning method. Therefore, the controller can determine that the scanning method for accurate scanning of the defect cluster to be detected is battery pack fixed-point scanning.

[0233] In the above embodiment, by comparing the defect cluster size with the moving reference scanning size, an accurate scanning method that is more in line with the defect cluster size can be matched for each defect cluster size to be detected, thereby effectively reducing the accurate scanning cost and improving the detection efficiency of battery pack defect detection.

[0234] In some embodiments, Fig.11 As shown, a battery pack defect scanning method is provided, which is used to perform non-destructive detection of defects on the power battery pack of a new energy vehicle. The method specifically includes the following steps:

[0235] S1101, determining basic scanning parameters for image scanning based on battery pack information of the battery pack to be tested.

[0236] S1102 , performing a DR scan on the battery pack to be tested according to basic scanning parameters to obtain a DR image of the battery pack to be tested.

[0237] Among them, the controller can control the carrying and transporting assembly to drive the battery pack to be tested to move between the linear accelerator and the detector. During the movement of the battery pack to be tested, DR imaging is continuously performed on the battery pack to be tested to obtain image information at different positions of the battery pack to be tested, so that the moving path of the battery pack to be tested covers all areas that need to be inspected.

[0238] S1103, pre-processing the DR image of the battery pack to be tested.

[0239] The controller may perform preprocessing on the acquired DR image, such as performing denoising, contrast enhancement and the like, to improve the image quality of the DR image and obtain an enhanced DR image.

[0240] S1104, performing image analysis on the DR image to obtain defect feature information, defect properties and defect location information of defects displayed on each plane of the battery pack to be tested mapped on the detection plane.

[0241] The defect feature information includes the size and shape of the plane display defect, and the defect position information includes the defect coordinate data of the plane display defect. It can be understood that the defect coordinates can be the defect contour coordinates of the plane display defect.

[0242] S1105, determining the severity of each plane display defect based on the defect characteristic information.

[0243] S1106, determine whether the severity of the defect reaches a preset threshold, if so, execute S1110, if not, execute S1107.

[0244] S1107, matching the defect properties of the plane display defect with the preset key defect properties.

[0245] S1108, determine whether the defect property matches the preset key defect property, if not, execute S1109, if matching, execute S1110.

[0246] S1109, determining that there is no defect to be detected in the battery pack to be tested.

[0247] Among them, when there are no defects to be detected in the battery pack to be tested, the controller can output plane defect information of defects displayed on each plane, that is, defect characteristic information, defect nature and defect location information of defects displayed on each plane of the battery pack to be tested mapped on the detection plane, as well as the defect severity of defects displayed on each plane.

[0248] S1110, determining the plane display defect as a defect to be detected that meets the CT scanning detection condition.

[0249] S1111, obtaining defect plane detection information of the defect to be detected.

[0250] S1112, based on the defect plane detection information, determine CT scanning parameters for performing CT scanning detection on the defect to be detected.

[0251] The controller may determine a CT scanning area and a CT scanning method for performing CT scanning detection based on the defect plane detection information.

[0252] S1113, performing CT scanning on the defect to be detected according to the CT scanning parameters to obtain CT scanning projection data of the defect to be detected.

[0253] Among them, the controller can control the carrying and transporting assembly to move the battery pack to be tested to the starting position of the CT scan, and the battery pack to be tested is placed on the support plate of the carrying and transporting assembly, and the center of the battery pack to be tested is aligned with the rotation axis of the scanning assembly, so as to facilitate uniform scanning of the battery pack to be tested from all angles of the battery pack to be tested. The controller can then perform a CT scan on the battery pack to be tested according to the determined CT scanning area and CT scanning method. It can be understood that each time the scanning assembly rotates a small angle, such as 1 degree, a set of projection data will be collected until all CT scanning areas that require CT scanning imaging are scanned.

[0254] S1114, reorganize and reconstruct the CT scan projection data to obtain a tomographic image of the defect to be detected.

[0255] The controller may reorganize the acquired CT scanning projection data, and then reconstruct the reorganized data to obtain a tomographic image of the defect to be detected.

[0256] S1115, performing image processing and analysis on the tomographic image of the defect to be detected to obtain a defect detection result of the defect to be detected.

[0257] The present embodiment provides a method for nondestructive detection of defects in power battery packs of new energy vehicles. By using battery pack defect detection equipment to perform nondestructive detection on the power battery pack, the current problems of long battery pack disassembly detection time and lossy detection are effectively solved. It can realize nondestructive detection of internal defects of different types of battery packs without disassembling them.

[0258] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0259] Based on the same inventive concept, the embodiment of the present application also provides a battery pack defect detection device for implementing the battery pack defect detection method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more battery pack defect detection device embodiments provided below can refer to the limitations of the battery pack defect detection method above, and will not be repeated here.

[0260] In some embodiments, Fig.12 As shown, a battery pack defect detection device 1200 is provided, comprising: a digital imaging scanning module 1201, a detection information acquisition module 1202, a scanning parameter determination module 1203 and a precise scanning module 1204, wherein:

[0261] The digital imaging scanning module 1201 is used to perform overall digital imaging scanning on the battery pack to be tested to obtain digital image information of the battery pack to be tested.

[0262] The detection information acquisition module 1202 is used to obtain defect plane detection information of the defect to be detected when it is determined that the battery pack to be detected has a defect to be detected based on the digital image information; the defect to be detected is a defect that meets the precise detection conditions.

[0263] The scanning parameter determination module 1203 is used to determine precise scanning parameters for precise detection of the defect to be detected based on the defect plane detection information.

[0264] The precise scanning module 1204 is used to precisely scan the defect to be detected according to the precise scanning parameters to obtain a defect detection result of the defect to be detected.

[0265] In some embodiments, the digital imaging scanning module 1201 is used to: obtain battery pack information of the battery pack to be tested; determine basic scanning parameters for image scanning based on the battery pack information; and perform an overall digital imaging scan on the battery pack to be tested according to the basic scanning parameters to obtain digital image information of the battery pack to be tested.

[0266] In some embodiments, the battery pack defect detection device further includes:

[0267] The image analysis module is used to perform image analysis on the digital image information to obtain the planar defect information of the battery pack to be tested mapped on the detection plane.

[0268] The importance assessment module is used to assess the importance of the plane display defect when it is determined that the battery pack to be tested has at least one plane display defect based on the plane defect information.

[0269] The module for determining defects to be detected is used to determine the plane display defects whose importance assessment results are important as defects to be detected that meet the precise detection conditions.

[0270] In some embodiments, the plane defect information includes defect feature information of the plane display defect. The importance assessment module is used to: determine the defect severity of each plane display defect based on the defect feature information of each plane display defect; for each plane display defect, when the defect severity reaches a preset degree threshold, determine the importance assessment result of the plane display defect as important.

[0271] In some embodiments, the plane defect information also includes the defect property of the plane display defect. The importance assessment module is also used to: when the defect severity does not reach the preset degree threshold, match the defect property of the plane display defect with the preset key defect property; when the defect property successfully matches the preset key defect property, determine that the importance assessment result of the plane display defect is important.

[0272] In some embodiments, the defect plane detection information includes defect position information of the defect to be detected; the precise scanning parameter includes a scanning detection area for precise scanning. The scanning parameter determination module 1203 is used to: merge the defects to be detected that meet the defect area merging conditions according to the defect position information of each defect to be detected to obtain a defect group to be detected; for each defect group to be detected, based on the defect position information of the defects to be detected in each group contained in the defect group to be detected, determine the defect group detection area of ​​the defect group to be detected; determine the defect group detection area as the scanning detection area for precise scanning of the defects to be detected in each group.

[0273] In some embodiments, the battery pack defect detection device further includes:

[0274] The defect size determination module is used to determine the defect size of each defect to be detected along the scanning movement direction according to the defect position information of each defect to be detected; the scanning movement direction is the movement direction of the battery pack to be tested when scanning.

[0275] The module for determining the composable size range is used to determine the composable size range of the defect to be detected according to the reference scanning size for each defect to be detected when the defect size of the defect to be detected is smaller than the reference scanning size.

[0276] The module for determining defects to be detected is used to determine the defects to be detected and other defects to be detected contained in the merging size range as defects to be detected that meet the defect area merging conditions when other defects to be detected are contained in the merging size range.

[0277] In some embodiments, the battery pack defect detection device further includes:

[0278] The independent to-be-detected defect determination module is used to determine the to-be-detected defects that do not meet the defect area merging conditions as independent to-be-detected defects.

[0279] The defect detection area determination module is used to determine the defect detection area of ​​each independent defect to be detected according to the defect position information of the independent defect to be detected.

[0280] The scanning detection area determination module is used to determine the defect detection area as a scanning detection area for accurately scanning the independent defects to be detected.

[0281] In some embodiments, the defect plane detection information includes defect position information of the defect to be detected; the precise scanning parameter includes a scanning method for performing precise scanning. The scanning parameter determination module 1203 is used to: based on the defect position information of each defect to be detected, perform clustering processing on each defect to be detected to obtain each defect cluster to be detected; for each defect cluster to be detected, determine the defect cluster size of the defect cluster to be detected according to the defect position information of the defects in each cluster in the defect cluster to be detected; based on the defect cluster size of the defect cluster to be detected, determine the scanning method when performing precise scanning on the defect cluster to be detected.

[0282] In some embodiments, the scanning method includes battery pack fixed-point scanning and battery pack mobile scanning. The scanning parameter determination module 1203 is used to: when the defect cluster size of the defect cluster to be detected is less than or equal to the mobile reference scanning size, determine that the scanning method for performing precise scanning on the defect cluster to be detected is battery pack mobile scanning; when the defect cluster size of the defect cluster to be detected is greater than the mobile reference scanning size, determine that the scanning method for performing precise scanning on the defect cluster to be detected is battery pack fixed-point scanning.

[0283] Each module in the above-mentioned battery pack defect detection device can be implemented in whole or in part by software, hardware, or a combination thereof. Each of the above-mentioned modules can be embedded in or independent of a processor in an electronic device in the form of hardware, or can be stored in a memory in the electronic device in the form of software, so that the processor can call and execute the corresponding operations of each of the above modules.

[0284] In some embodiments, an electronic device is provided. The electronic device may be a controller, and its internal structure diagram may be as follows: Fig.13As shown. The electronic device includes a processor, a memory and a network interface connected via a system bus. Among them, the processor of the electronic device is used to provide computing and control capabilities. The memory of the electronic device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the electronic device is used to store data such as digital image information, defect plane detection information, precise scanning parameters, defect detection results, etc. The network interface of the electronic device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a battery pack defect detection method is implemented.

[0285] Those skilled in the art will understand that Fig.13 The structure shown in the figure is merely a block diagram of a partial structure related to the scheme of the present application, and does not constitute a limitation on the electronic device to which the scheme of the present application is applied. The specific electronic device may include more or fewer components than shown in the figure, or combine certain components, or have a different arrangement of components.

[0286] In some embodiments, an electronic device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the specific steps in the above-mentioned battery pack defect detection method embodiment are implemented.

[0287] In some embodiments, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the specific steps in the above-mentioned battery pack defect detection method embodiment are implemented.

[0288] In some embodiments, a computer program product is provided, including a computer program, which, when executed by a processor, implements the specific steps in the above-mentioned battery pack defect detection method embodiment.

[0289] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties. In addition, the acquisition, storage, processing, and transmission of data are in compliance with relevant laws and regulations.

[0290] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0291] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0292] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A battery pack defect detection method, characterized in that: The method comprises: Acquire battery pack information of the battery pack to be tested, and determine basic scanning parameters for image scanning based on the battery pack information; Performing an overall digital imaging scan on the battery pack to be tested according to the basic scanning parameters to obtain digital image information of the battery pack to be tested; When it is determined that the battery pack to be tested has a defect to be detected according to the digital image information, defect plane detection information of the defect to be detected is obtained; the defect to be detected is a defect that meets the precise detection conditions; Based on the defect plane detection information, determining precise scanning parameters for performing precise detection on the defect to be detected; Precisely scanning the defect to be detected according to the precise scanning parameters to obtain a defect detection result of the defect to be detected; The defect plane detection information includes defect position information of the defect to be detected; the precise scanning parameter includes a scanning mode for performing precise scanning; and the precise scanning parameter for performing precise detection on the defect to be detected based on the defect plane detection information includes: Based on the defect position information of each defect to be detected, clustering the defects to be detected to obtain each defect cluster to be detected; For each of the defect clusters to be detected, determining a defect cluster size of the defect cluster to be detected according to defect position information of defects in each cluster in the defect cluster to be detected; Based on the defect cluster size of the defect cluster to be detected, a scanning mode for accurately scanning the defect cluster to be detected is determined.

2. The method according to claim 1, characterized in that The method further comprises: Performing image analysis on the digital image information to obtain plane defect information of the battery pack to be tested mapped on the detection plane; When it is determined that the battery pack to be tested has at least one plane display defect according to the plane defect information, evaluating the importance of the plane display defect; The plane display defects whose importance evaluation results are important are determined as defects to be detected that meet the precise detection conditions.

3. The method according to claim 2, characterized in that The plane defect information includes defect feature information of the plane display defect; and the importance assessment of the plane display defect includes: Determining the defect severity of each of the planar display defects based on the defect feature information of each of the planar display defects; For each of the planar display defects, when the severity of the defect reaches a preset severity threshold, the importance assessment result of the planar display defect is determined to be important.

4. The method according to claim 3, characterized in that The plane defect information also includes the defect properties of the plane display defect; the method also includes: When the severity of the defect does not reach the preset severity threshold, matching the defect property of the plane display defect with a preset key defect property; In the case where the defect property successfully matches the preset key defect property, it is determined that the importance assessment result of the plane display defect is important.

5. The method according to claim 2, characterized in that: The defect plane detection information includes defect position information of the defect to be detected; the precise scanning parameters include a scanning detection area for precise scanning; The step of determining precise scanning parameters for accurately detecting the defect to be detected based on the defect plane detection information includes: According to the defect position information of each of the defects to be detected, each of the defects to be detected that meets the defect area merging condition is merged to obtain a defect group to be detected; For each of the defect groups to be detected, determining a defect group detection area of ​​the defect group to be detected based on defect position information of defects to be detected in each group contained in the defect group to be detected; The defect group detection area is determined as a scanning detection area for accurately scanning the defects to be detected in each of the groups.

6. The method according to claim 5, characterized in that The method further comprises: Determine the defect size of each defect to be detected along a scanning moving direction according to the defect position information of each defect to be detected; the scanning moving direction is the moving direction of the battery pack to be detected when scanning; For each defect to be detected, when the defect size of the defect to be detected is smaller than the reference scanning size, determining a combinable size range of the defect to be detected according to the reference scanning size; In the case that other defects to be detected are included in the mergeable size range, the defect to be detected and other defects to be detected included in the mergeable size range are determined as the defects to be detected that meet the defect area merging condition.

7. The method according to claim 5 or 6, characterized in that: The method further comprises: Determine the defects to be detected that do not meet the defect area merging condition as independent defects to be detected; For each of the independent defects to be detected, determining a defect detection area of ​​the independent defect to be detected according to defect position information of the independent defect to be detected; The defect detection area is determined as a scanning detection area for accurately scanning the independent defect to be detected.

8. The method according to claim 1, characterized in that The scanning method includes battery pack fixed-point scanning and battery pack mobile scanning; The determining, based on the defect cluster size of the defect cluster to be detected, a scanning method for accurately scanning the defect cluster to be detected includes: When the defect cluster size of the defect cluster to be detected is less than or equal to the moving reference scanning size, determining that the scanning mode for performing precise scanning on the defect cluster to be detected is battery pack moving scanning; When the defect cluster size of the defect cluster to be detected is larger than the moving reference scanning size, it is determined that the scanning mode for performing precise scanning on the defect cluster to be detected is battery pack fixed-point scanning.

9. A battery pack defect detection device, characterized in that: The device comprises: A digital imaging scanning module, used to obtain battery pack information of the battery pack to be tested, and determine basic scanning parameters for image scanning based on the battery pack information; and perform overall digital imaging scanning on the battery pack to be tested according to the basic scanning parameters to obtain digital image information of the battery pack to be tested; A detection information acquisition module, used for acquiring defect plane detection information of the defect to be detected when it is determined that the battery pack to be detected has a defect to be detected according to the digital image information; the defect to be detected is a defect that meets the precise detection conditions; A scanning parameter determination module, used to determine precise scanning parameters for precise detection of the defect to be detected based on the defect plane detection information; A precise scanning module, used for precisely scanning the defect to be detected according to the precise scanning parameters to obtain a defect detection result of the defect to be detected; Among them, the defect plane detection information includes the defect position information of the defect to be detected; the precise scanning parameters include the scanning method for performing precise scanning; the scanning parameter determination module is used to cluster each of the defects to be detected based on the defect position information of each defect to be detected to obtain each defect cluster to be detected; for each defect cluster to be detected, the defect cluster size of the defect cluster to be detected is determined according to the defect position information of the defects in each cluster in the defect cluster to be detected; based on the defect cluster size of the defect cluster to be detected, the scanning method for performing precise scanning on the defect cluster to be detected is determined.

10. An electronic device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 8 are implemented.

11. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 8 are implemented.

12. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 8 are implemented.

13. A battery pack defect detection device, characterized in that: The device includes a load-carrying and transporting component, a scanning component, and a controller respectively connected to the load-carrying and transporting component and the scanning component in communication; The carrying and transporting assembly is used to carry the battery pack to be tested and drive the battery pack to be tested to move along the scanning movement direction; The scanning component is used to perform overall digital imaging scanning on the battery pack to be tested, and to perform accurate scanning on defects to be detected on the battery pack to be tested; The controller is used to execute the steps of the method described in any one of claims 1 to 8.

14. The battery pack defect detection device according to claim 13, characterized in that: The carrying and transporting assembly includes an active supporting component and an auxiliary supporting component; the scanning assembly includes a ray linear accelerator and a linear array detector; A scanning gap is provided between the active supporting component and the auxiliary supporting component, and the ray linear accelerator and the linear array detector are relatively arranged through the scanning gap; the gap width of the scanning gap is determined according to the detection width of the linear array detector.

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