An automotive electronics FCT test device

Abstract

The present invention relates to the field of FCT testing technology, and in particular to an automotive electronic FCT testing device, comprising a support plate, a rotating shaft, a transmission chain plate, a positioning motor, a clamping unit, a testing unit, and a fastening unit. The present invention can solve the following problems existing in the prior art during testing of automotive electronic motherboards: the inability to plug in and power on the motherboard to be tested and perform corresponding functional tests, the inability to simulate the vibrations experienced by the motherboard during vehicle driving, and the connection stability of terminals on the motherboard to be tested, which affect test results and accuracy. The present invention can fully clamp and limit the motherboard to be tested in all directions to ensure its stability during testing. The present invention can also drive the motherboard to be tested to vibrate, thereby simulating the vibration effect caused by the motherboard inside the car when driving on a bumpy road. Thus, the motherboard to be tested can be subjected to a vibration test while undergoing a functional test, thereby improving test results and accuracy.

Description

Technical Field

[0001] The present invention relates to the technical field of FCT testing, and in particular to an automotive electronic FCT testing device. Background Art

[0002] FCT is a testing method that performs functional testing on the electronic motherboard under test, simulating its operation in various design states, thereby obtaining parameters in each state to verify its normal operation. When FCT testing is applied to the field of automotive electronic products, it is usually used to test automotive electronic motherboards to ensure that they can work normally as expected.

[0003] However, there are usually some problems when testing automotive electronic motherboards. With the development of science and technology, technicians in related fields have also carried out a lot of optimization on the testing of automotive electronic motherboards. In order to make a more accurate comparison, for example, Chinese patent publication number CN114839513A discloses an automotive electronic FCT testing device, including a conveying device, a containing device installed in the conveying device, fixed frames fixedly connected on both sides of the conveying device, a hydraulic telescopic rod and a second motor fixedly connected to the upper end of the fixed frame, a toggle device fixedly connected to the output end of the hydraulic telescopic rod, the toggle device is located inside the fixed frame, a lifting device is installed in the fixed frame, a test board is fixedly connected to the lower end of the lifting device, the test board is fixedly connected to the support plate through a linkage mechanism, and the support plate is located directly below the test plate.

[0004] When the above-mentioned prior art is in use, the motherboard to be tested is placed inside the holding device, and then the conveying device conveys the motherboard to be tested to the lower end of the test board. Then, under the action of the second motor, the transmission mechanism and the lifting device, the test board is brought into contact with the motherboard to be tested to complete the test of the motherboard to be tested; at the same time, the support plate supports the motherboard to be tested to prevent the test board from excessively squeezing the motherboard to be tested, thereby protecting the motherboard and reducing the damage rate of the product.

[0005] However, the above-mentioned prior art still has some deficiencies in the process of testing automotive electronic motherboards:

[0006] 1. Since there are multiple terminals on the motherboard to be tested, it is necessary to connect to its terminals to complete the functional test when testing the motherboard to be tested. However, the above-mentioned existing technology only tests by contacting the test board with the motherboard to be tested, and cannot plug in the motherboard to be tested and power it on and perform the corresponding functional test, thus affecting the test effect. It is not only difficult to accurately test whether the motherboard to be tested can be used normally, but also affects the test accuracy.

[0007] 2. Since a car may pass through bumpy roads while driving, the motherboard inside the car will be subject to vibrations caused by the bumps of the car. Therefore, it is necessary to test the vibration resistance of the car motherboard. However, the above-mentioned existing technology cannot simulate the vibration that the motherboard is subjected to during the driving of the car, nor the connection stability of the terminals on the motherboard to be tested, which further affects the test effect.

[0008] Therefore, based on the above-mentioned viewpoints, there is still room for improvement in the existing automotive electronic motherboard testing methods. Summary of the Invention

[0009] In order to solve the above problems, the present invention provides an automotive electronic FCT testing device, comprising two vertically arranged support plates, wherein opposite sides of the two support plates are provided with multiple equidistantly distributed rotating shafts that rotate together along the length direction, and the outer walls of the multiple rotating shafts are jointly sleeved with a transmission chain plate, and a positioning motor connected to any one of the rotating shafts is provided on the side wall of any support plate through a motor base.

[0010] The outer wall of the conveyor chain plate is provided with a plurality of clamping units for mounting the mainboard to be tested, the clamping unit includes a supporting block installed on the outer wall of the conveyor chain plate, a placement plate is provided on the side of the supporting block away from the conveyor chain plate, a test unit for performing functional testing on the mainboard to be tested is installed on the placement plate, and the test unit includes a vibration component installed between the supporting block and the support plate and used to enhance the test effect.

[0011] As a preferred technical solution of the present invention, the clamping unit also includes a supporting rubber strip installed in the middle of the side of the placement plate away from the supporting block, and sliding grooves are provided on the four sides of the placement plate away from the supporting block. An execution bar is slidably docked inside the sliding groove, and a supporting spring is installed between the execution bar and the inner wall of the sliding groove away from the supporting rubber strip. A clamping plate is installed on the side of the execution bar away from the placement plate.

[0012] As a preferred technical solution of the present invention, the clamping plate is successively installed with an elastic limit strip and a bottom support plate on the upper and lower sides close to the supporting strip. The elastic limit strip has an arc-shaped protrusion on the side close to the supporting strip, and the upper end of the bottom support plate is flush with the upper end of the supporting strip.

[0013] As a preferred technical solution of the present invention, the test unit includes a controller and a test plug installed on the side of the placement plate away from the support block. The controller and the test plug are electrically connected, and an indicator light is also electrically connected to the controller. There are multiple test plugs and they include plug connectors for connecting to multiple different models of motherboards to be tested.

[0014] As a preferred technical solution of the present invention, the vibration assembly includes a positioning rod, and two positioning rods are symmetrically arranged along the upper and lower conveying chain plates on opposite sides of the two support plates, and a wave guide groove is opened on the side of the positioning rod close to the conveying chain plate;

[0015] The side of the supporting block away from the placement plate is connected to the conveying chain plate through a pad. Multiple contraction spring rods are installed between the supporting block and the pad. Support rods are provided on the side walls of the supporting block close to the two support plates, and the support rods are slidably docked inside the wave guide groove.

[0016] As a preferred technical solution of the present invention, the wave guide groove is composed of a plurality of mutually connected inclined grooves, and two adjacent inclined grooves are symmetrically arranged so that the connecting point of the two inclined grooves is convex upward or concave downward, and a guide groove connected to the wave guide groove is provided at the end of the positioning rod.

[0017] As a preferred technical solution of the present invention, the conveying chain plate is composed of a plurality of link plates hinged to each other, and a plurality of supporting blocks are distributed at intervals on the outer side walls of the plurality of link plates.

[0018] As a preferred technical solution of the present invention, it also includes a fastening unit for further fixing and limiting the mainboard to be tested, and the fastening unit includes a limiting sliding hole opened in the middle of the supporting block, the limiting sliding hole passes through the width direction of the supporting block, and an execution block is slidably passed through the inside of the limiting sliding hole, and a connecting block is provided on the side of the execution block away from the conveying chain plate, and a pull rope is installed between the connecting block and the side of multiple execution strips on the same supporting block close to the supporting rubber strip.

[0019] As a preferred technical solution of the present invention, the outer wall of the conveying chain plate is provided with a plurality of fixed blocks spaced apart from the supporting blocks, the fixed blocks are provided with linkage holes corresponding to the positions of the limiting sliding holes, a support shaft is installed inside the linkage hole, and two telescopic plates are symmetrically rotatably sleeved on the outer wall of the support shaft, and the telescopic plate is rotatably connected between the side away from the support shaft and the corresponding execution block.

[0020] As a preferred technical solution of the present invention, a force-bearing block is installed after any end of the support shaft slides out to the outside of the fixed block, and a horizontal U-shaped frame is installed on the side wall of the support plate close to the force-bearing block. The opening of the U-shaped frame has two horizontal sections that are flush with the force-bearing block, and the force-bearing block and the U-shaped frame slide in contact with each other;

[0021] The outer wall of the fixed block is provided with a limiting sleeve which is slidably sleeved on the outer wall of the supporting shaft.

[0022] In summary, this application includes at least one of the following beneficial technical effects:

[0023] 1. The present invention uses multiple clamping plates to rest against the outer wall of the motherboard to be tested, and uses supporting rubber strips and multiple bottom plates to provide multi-directional support for the motherboard to be tested. Subsequently, multiple elastic limit strips rest against the upper end of the four sides of the motherboard to be tested to press it in multiple directions. In this way, the motherboard to be tested can be fully clamped and limited in multiple directions, ensuring its stability during the test process and preventing it from shaking or falling during the test and affecting the test progress.

[0024] 2. The present invention drives the main board to be tested to move by a transmission chain plate while controlling the main board to be tested to vibrate back and forth, thereby simulating the vibration effect caused to the internal main board of a car when it is driving on a bumpy road, and testing its vibration resistance by monitoring whether the main board to be tested is damaged or defective under the vibration effect; thus, the main board to be tested can be subjected to a vibration test while undergoing a functional test, thereby improving the test effect and accuracy, and can simulate the test results of the main board to be tested in different environments.

[0025] 3. In the present invention, when the force-bearing block contacts the side wall of the U-shaped frame, it can drive the supporting shaft, the telescopic plate and the executing block to move to the side away from the U-shaped frame. The executing block drives the clamping plate to move closer to the side of the motherboard to be tested through the connecting block and the pull rope, thereby increasing the resistance force between the clamping plate and the motherboard to be tested, thereby achieving tightening on the basis of clamping and limiting the motherboard to be tested, further enhancing the stability of the motherboard to be tested, and preventing it from falling during the vibration test. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] The present invention will be further described below with reference to the accompanying drawings and examples.

[0027] Figure 1 It is a structural schematic diagram of the present invention.

[0028] Figure 2 It is a schematic diagram of the structure between the conveying chain plate and the clamping unit of the present invention.

[0029] Figure 3 It is a structural schematic diagram of the clamping unit of the present invention.

[0030] Figure 4 This invention Figure 3 A partial enlarged view of point A.

[0031] Figure 5 It is a schematic diagram of the structure between the conveying chain plate and the testing unit of the present invention.

[0032] Figure 6 This invention Figure 5 A partial enlarged view of point B.

[0033] Figure 7 It is a schematic diagram of the structure between the conveying chain plate and the fastening unit of the present invention.

[0034] Figure 8 It is a structural schematic diagram of the fastening unit of the present invention.

[0035] Figure 9 This invention Figure 8 A partial enlarged view of point C.

[0036] Figure 10 This invention Figure 8 A partial enlarged view of point D.

[0037] In the figure, 1. support plate; 2. rotating shaft; 3. transmission chain plate; 4. positioning motor; 5. clamping unit; 51. supporting block; 511. pad; 52. placement plate; 53. supporting rubber strip; 54. sliding groove; 55. execution bar; 56. supporting spring; 57. clamping plate; 571. elastic limiting strip; 572. bottom support plate; 6. testing unit; 61. vibration component; 611. positioning rod; 612. wave guide groove; 613. contraction spring rod; 614. support rod; 615. guide groove; 62. controller; 63. indicator light; 64. plug connector; 7. fastening unit; 71. limiting slide hole; 72. execution block; 73. connecting block; 74. pull rope; 75. fixing block; 76. support shaft; 77. telescopic plate; 78. force block; 79. U-shaped frame; 70. limiting sleeve. DETAILED DESCRIPTION

[0038] The following is combined with Figures 1-10 The embodiments of the present invention are described in detail.

[0039] The embodiment of the present application discloses an automotive electronic FCT test device. It should be noted that the automotive electronic FCT test device of the present application is mainly used in the process of functional testing of automotive electronic mainboards. In terms of technical effects, it can fully clamp and limit the mainboard to be tested in all directions, and secondly perform functional testing on the mainboard to be tested and monitor the test results in real time, and display the test results of the mainboard to be tested by lighting up the lights; in particular, during the test process, vibration can be applied to it while performing functional testing to simulate the vibration effect caused to the internal mainboard of the car when driving on a bumpy road. By monitoring whether the mainboard to be tested is damaged or defective under the vibration effect, its vibration resistance is tested, and then the test results of the mainboard to be tested under different environments are simulated; further, the automotive electronic FCT test device of the present application can also be further tightened on the basis of being clamped and fixed, thereby enhancing the stability of the mainboard to be tested during the test process and preventing it from falling during the vibration test.

[0040] Example 1:

[0041] Reference Figure 1 and Figure 2As shown, an automotive electronic FCT test device includes two vertically arranged support plates 1. Multiple equally spaced rotating shafts 2 are provided on opposite sides of the two support plates 1 for common rotation along the length direction. Conveyor chain plates 3 are provided on the outer walls of the multiple rotating shafts 2. A positioning motor 4 connected to any rotating shaft 2 is provided on the side wall of any support plate 1 through a motor base.

[0042] Furthermore, in this embodiment, a plurality of clamping units 5 for mounting the mainboard to be tested are provided on the outer wall of the conveying chain plate 3. The clamping unit 5 includes a supporting block 51 installed on the outer wall of the conveying chain plate 3. A placement plate 52 is provided on the side of the supporting block 51 away from the conveying chain plate 3. A test unit 6 for performing functional testing on the mainboard to be tested is installed on the placement plate 52. The test unit 6 includes a vibration component 61 installed between the supporting block 51 and the support plate 1 and used to enhance the test effect.

[0043] It should be noted that the conveying chain plate 3 is composed of a plurality of link plates hinged to each other, and a plurality of supporting blocks 51 are distributed at intervals on the outer side walls of the plurality of link plates.

[0044] During the specific implementation process, the positioning motor 4 is first started, and the positioning motor 4 drives the conveyor chain plate 3 to rotate through the rotating shaft 2. Secondly, the mainboard to be tested is placed on multiple placement plates 52 on the outer wall of the conveyor chain plate 3 in turn, and then the mainboard to be tested is correspondingly limited and fixed by the clamping unit 5, so that the conveyor chain plate 3 drives the mainboard to be tested to move synchronously through the placement plate 52; during this period, the mainboard to be tested is functionally tested by the test unit 6, and the vibration effect is applied to the mainboard to be tested by the vibration component 61 to enhance the test effect and comprehensiveness of the mainboard to be tested.

[0045] Reference Figure 2 and Figure 3 As shown, in order to ensure the stability of the mainboard to be tested during the test, it is necessary to limit and fix it accordingly so that the conveying chain plate 3 can drive the mainboard to be tested to move circumferentially. Based on this, a clamping unit 5 is provided in this embodiment. Specifically, the clamping unit 5 also includes a support rubber strip 53 installed in the middle of the side of the placement plate 52 away from the supporting block 51. The placement plate 52 is provided with sliding grooves 54 near its four side edges on the side away from the supporting block 51. An execution bar 55 is slidably docked inside the sliding groove 54. A supporting spring 56 is installed between the execution bar 55 and the inner wall of the sliding groove 54 on the side away from the support rubber strip 53. A clamping plate 57 is installed on the side of the execution bar 55 away from the placement plate 52.

[0046] It should be noted that the support strip 53 is used to support the motherboard to be tested, and the top of the support strip 53 is made of flexible material to prevent the support strip 53 from causing damage to the motherboard to be tested; in addition, the supporting spring 56 always applies a pushing force to the execution strip 55, so that the execution strip 55 has a tendency to move toward the side of the support strip 53 in the initial state.

[0047] During the specific implementation process, after the motherboard to be tested is placed on the placement plate 52, the motherboard to be tested contacts the supporting rubber strip 53, and then the execution bar 55 drives the clamping plate 57 to move to the side close to the supporting rubber strip 53 under the action of the supporting spring 56, so that multiple clamping plates 57 are against the outer wall of the motherboard to be tested, so that the motherboard to be tested can be clamped and fixed in multiple directions to ensure its stability during the test process.

[0048] Reference Figure 4 As shown, in order to prevent the motherboard to be tested from falling during the test, the clamping plate 57 in this embodiment can also limit the motherboard to be tested accordingly on the basis of applying a clamping effect to it. The side of the clamping plate 57 close to the supporting rubber strip 53 is successively installed with an elastic limiting strip 571 and a bottom support plate 572. The side of the elastic limiting strip 571 close to the supporting rubber strip 53 has an arc-shaped protrusion, and the upper end of the bottom support plate 572 is flush with the upper end of the supporting rubber strip 53.

[0049] During the specific implementation process, after the motherboard to be tested is placed on the supporting rubber strip 53, the four sides of the motherboard to be tested are respectively against multiple bottom support plates 572, so as to cooperate with the supporting rubber strip 53 to provide multi-directional support to the motherboard to be tested; at the same time, the elastic limit strip 571 is against the upper end of the four sides of the motherboard to be tested, thereby realizing multi-directional pressing of the motherboard to be tested, and under the action of the clamping plate 57, the motherboard to be tested can be further clamped and limited in all directions to prevent it from shaking or falling during the test and affecting the test progress.

[0050] Reference Figure 3 and Figure 4 As shown, in order to facilitate functional testing of the motherboard to be tested, it is necessary to connect it to the power supply and simulate the load, and perform functional testing on it under the load state. The test unit 6 includes a controller 62 and a test plug installed on the side of the placement plate 52 away from the supporting block 51. The controller 62 is electrically connected to the test plug, and an indicator light 63 is also electrically connected to the controller 62. There are multiple test plugs and they include plug connectors 64 for connecting with multiple different models of motherboards to be tested.

[0051] It should be noted that the controller 62 used in this embodiment is a prior art, which is used to receive test information of the plug connector 64 and output a signal to the indicator light 63. Its specific working principle will not be repeated here.

[0052] During the specific implementation process, after the motherboard to be tested is clamped and fixed, the corresponding plug connector 64 is plugged into the terminals of the motherboard to be tested, and then the controller 62 performs a functional test on the motherboard to be tested through the connection between the plug connector 64 and the terminals, and monitors the motherboard to be tested in real time; during the test process, the indicator light 63 is always on. If the motherboard to be tested fails, the controller 62 receives the signal and transmits the signal to the indicator light 63, and the indicator light 63 goes out to prompt the tester of the test result of the motherboard to be tested; if the motherboard to be tested passes the test, the indicator light 63 is always on, thereby realizing the functional test of the motherboard to be tested and improving the test accuracy.

[0053] Reference Figure 5 and Figure 6 As shown, since the car may pass through bumpy sections during normal driving, the mainboard inside the car is easily subjected to bumpy vibrations. Therefore, in order to simulate the test effects of the mainboard to be tested in different environments, a vibration component 61 is also provided in this embodiment. Specifically, the vibration component 61 includes a positioning rod 611. Two positioning rods 611 are symmetrically arranged along the upper and lower sides of the conveying chain plate 3 on the opposite sides of the two support plates 1. A wave guide groove 612 is provided on the side of the positioning rod 611 close to the conveying chain plate 3; the side of the supporting block 51 away from the placement plate 52 is connected to the conveying chain plate 3 through the pad 511, and a plurality of retractable spring rods 613 are installed between the supporting block 51 and the pad 511. The side walls of the supporting block 51 close to the two support plates 1 are provided with support rods 614, and the support rods 614 are slidably docked inside the wave guide groove 612.

[0054] Continue to refer to Figure 6 As shown, further, in this embodiment, the wave guide groove 612 is composed of a plurality of inclined grooves connected to each other, and two adjacent inclined grooves are symmetrically arranged so that the connecting point of the two inclined grooves is convex upward or concave downward, and a guide groove 615 connected to the wave guide groove 612 is provided at the end of the positioning rod 611.

[0055] It should be noted that the contraction spring rod 613 always applies a contraction force to the support block 51, so that the support block 51 has a tendency to move toward the side of the pad 511 in the initial state, so that the distance between the support block 51 and the placement plate 52 and the conveying chain plate 3 is the smallest in the initial state. At this time, the support rod 614 is flush with the middle of the guide groove 615, so that the support rod 614 can slide smoothly into the guide groove 615.

[0056] During the specific implementation process, when the function test of the motherboard to be tested is carried out, the transmission chain plate 3 drives the motherboard to be tested to move through the supporting block 51 and the placement plate 52, so that the supporting block 51 drives the support rod 614 to move synchronously; during this period, when the support rod 614 moves to the convex part of the wave guide groove 612, it drives the supporting block 51, the placement plate 52 and the motherboard to be tested to move upward as a whole, and then the support rod 614 moves to the concave part of the wave guide groove 612, so that the supporting block 51 drives the placement plate 52 and the motherboard to be tested as a whole under the action of the contraction spring rod 613. It moves down quickly to reset; thus, the support rod 614 drives the supporting block 51, the placement plate 52 and the main board to be tested on its upper end to vibrate back and forth as a whole under the action of the wave guide groove 612, thereby simulating the vibration effect caused to the internal main board of a car when it is driving on a bumpy road section, and testing its vibration resistance by monitoring whether the main board to be tested is damaged or defective under the vibration effect; thus, the main board to be tested can be subjected to a vibration test while undergoing a functional test, thereby improving the test effect and accuracy, and simulating the test results of the main board to be tested in different environments.

[0057] In addition, by applying vibration effects to the motherboard under test, the stability of its terminals after plugging in can be tested to prevent the terminals from becoming loose due to vibration during use, which may affect normal use.

[0058] Example 2:

[0059] Reference Figure 7 、 Figure 8 、 Figure 9 and Figure 10 As shown, on the basis of Example 1, in order to prevent the mainboard to be tested from falling off the placement plate 52 during the vibration test, which not only easily causes damage to the mainboard to be tested but also affects the test progress, a fastening unit 7 for further fixing and limiting the mainboard to be tested is also provided in this embodiment. Specifically, the fastening unit 7 includes a limiting slide hole 71 opened in the middle of the supporting block 51, and the limiting slide hole 71 passes through the width direction of the supporting block 51. An execution block 72 is slidably penetrated inside the limiting slide hole 71, and a connecting block 73 is provided on the side of the execution block 72 away from the conveying chain plate 3. A pull rope 74 is installed between the connecting block 73 and the side of multiple execution strips 55 on the same supporting block 51 close to the support rubber strip 53.

[0060] The locking cam 76 is fixed on the locking cam 74 and the locking cam 76 is fixed on the locking cam 74. The locking cam 76 is fixed on the locking cam 74 and the locking cam 76 is fixed on the locking cam 74.

[0061] When the cam 78 is in the unlock state, the locking cam 78 is locked and the locking cam 78 is in the unlock state, so that the cam 78 can slide in and out of the unlock state, thereby locking the cam 78 in the unlock state.

[0062] In the initial state, the execution block 72 is located in the middle of the limiting slide hole 71 under the action of multiple execution bars 55 and the pull rope 74, and the execution block 72 drives the force block 78 and the fixed block 75 to the maximum distance through the telescopic plate 77 and the support shaft 76, so as to facilitate interference and cooperation between the force block 78 and the U-shaped frame 79.

[0063] When the clamping plate 57 is closed, the fixing block 75 is moved to the end of the horizontal section of the U-shaped frame 79, and the force block 78 contacts the upper half of the side wall of the U-shaped frame 79 and drives the support shaft 76 to move to the side away from the U-shaped frame 79. The support shaft 76 drives the execution block 72 to move synchronously in the limiting slide hole 71 through the telescopic plate 77, so that the execution block 72 applies tension to multiple pull ropes 74 at the same time through the connecting block 73. The pull rope 74 drives the clamping plate 57 to move closer to the side of the motherboard to be tested through the execution bar 55, thereby increasing the resistance between the clamping plate 57 and the motherboard to be tested, thereby achieving tightening on the basis of the clamping limit of the motherboard to be tested, further enhancing the stability of the motherboard to be tested, and preventing it from falling during the vibration test.

[0064] During the testing process of the motherboard to be tested, the conveying chain plate 3 drives the motherboard to be tested to move to the bottom of the conveying chain plate 3 through the supporting block 51. At this time, the force block 78 is still in conflict with the side wall of the U-shaped frame 79; after the test of the motherboard to be tested is completed, the force block 78 is detached from the U-shaped frame 79, so that the force block 78, the support shaft 76, the telescopic plate 77, the execution block 72 and the clamping plate 57 are reset, so that the tested motherboard can be removed and the motherboard to be tested can be installed on the placement plate 52 for testing; by combining the above steps, the automated continuous testing of the motherboard to be tested can be realized.

[0065] During operation: Step 1: First, start the positioning motor 4, which drives the conveying chain plate 3 to rotate through the rotating shaft 2, and then place the motherboard to be tested on multiple placement plates 52 on the outer wall of the conveying chain plate 3 in sequence.

[0066] Step 2: When the motherboard to be tested is placed on the placement plate 52, it conflicts with the supporting rubber strip 53. Then, the execution bar 55 drives the clamping plate 57 to move to the side close to the supporting rubber strip 53 under the action of the supporting spring 56, so that multiple clamping plates 57 are pressed against the outer wall of the motherboard to be tested to initially clamp and fix it; at the same time, the four sides of the motherboard to be tested are respectively pressed against multiple bottom supporting plates 572, so as to cooperate with the supporting rubber strip 53 to provide multi-directional support to the motherboard to be tested, and the elastic limiting strip 571 is pressed against the upper end of the four sides of the motherboard to be tested, so as to achieve multi-directional pressing of the motherboard to be tested, and under the action of the clamping plate 57, the motherboard to be tested can be further clamped and limited in multiple directions to prevent it from shaking or falling during the test and affecting the test progress.

[0067] Step 3: Plug the terminals of the motherboard to be tested into the corresponding plug connector 64, and then the controller 62 performs a functional test on the motherboard to be tested through the connection between the plug connector 64 and the terminals, and monitors the motherboard to be tested in real time; during the test, whether the motherboard to be tested is qualified is monitored by whether the indicator light 63 is on, so as to prompt the tester of the test result of the motherboard to be tested, thereby realizing the functional test of the motherboard to be tested and improving the test accuracy.

[0068] Step 4: During the functional test of the mainboard to be tested, the conveying chain plate 3 drives the mainboard to be tested to move through the supporting block 51 and the placing plate 52, so that the supporting block 51 drives the support rod 614 to move synchronously; during this period, the support rod 614 and the wave guide groove 612 cooperate with each other to drive the supporting block 51, the placing plate 52 and the mainboard to be tested on its upper end to vibrate back and forth as a whole, thereby simulating the vibration effect caused to the mainboard inside the car when driving on a bumpy road, and testing its anti-vibration performance by monitoring whether the mainboard to be tested is damaged or defective under the vibration effect; thus, the vibration test can be performed on the mainboard to be tested while the functional test is being performed on it, and the test results of the mainboard to be tested in different environments can be simulated.

[0069] The fifth step: when the transmission chain plate 3 drives the fixed block 75 to move to the end of the horizontal section of the U-shaped frame 79, the force block 78 contacts the upper half of the side wall of the U-shaped frame 79 and drives the support shaft 76 to move to the side away from the U-shaped frame 79. The support shaft 76 drives the execution block 72 to move synchronously in the limit slide hole 71 through the telescopic plate 77, so that the execution block 72 applies tension to multiple pull ropes 74 at the same time through the connecting block 73. The pull rope 74 drives the clamping plate 57 to move closer to the side of the motherboard to be tested through the execution bar 55, thereby increasing the resistance between the clamping plate 57 and the motherboard to be tested, thereby achieving tightening on the basis of clamping and limiting the motherboard to be tested, further enhancing the stability of the motherboard to be tested, and preventing it from falling during the vibration test.

[0070] During the testing process of the motherboard to be tested, the conveying chain plate 3 drives the motherboard to be tested to move to the bottom of the conveying chain plate 3 through the supporting block 51. At this time, the force block 78 is still in conflict with the side wall of the U-shaped frame 79; after the test of the motherboard to be tested is completed, the force block 78 is detached from the U-shaped frame 79, so that the force block 78, the support shaft 76, the telescopic plate 77, the execution block 72 and the clamping plate 57 are reset, so that the tested motherboard can be removed and the motherboard to be tested can be installed on the placement plate 52 for testing; by combining the above steps, the automated continuous testing of the motherboard to be tested can be realized.

[0071] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention.

[0072] In addition, it should be understood that although this specification is described in terms of implementation methods, not every implementation method contains only one independent technical solution. This narrative method of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment can also be appropriately combined to form other implementation methods that can be understood by those skilled in the art.

Claims

1. An automotive electronics FCT test device, comprising two vertically arranged support plates, with multiple equally spaced rotating shafts disposed on opposite sides of the two support plates for common rotation along their lengths. A transmission chain plate is sleeved on the outer walls of the multiple rotating shafts. A positioning motor connected to any of the rotating shafts is disposed on the side walls of any support plate via a motor mount. The device is characterized by: The outer wall of the conveyor chain plate is provided with a plurality of clamping units for mounting the motherboard to be tested. The clamping units include a supporting block mounted on the outer wall of the conveyor chain plate. A placement plate is provided on the side of the supporting block away from the conveyor chain plate. A test unit for performing a functional test on the motherboard to be tested is mounted on the placement plate. The test unit includes a vibration component mounted between the supporting block and the support plate and used to enhance the test effect. The clamping unit also includes a supporting rubber strip installed in the middle of the side of the placement plate away from the supporting block, and the side of the placement plate away from the supporting block is provided with sliding grooves near its four sides, and the sliding grooves are slidably docked with an execution strip; The vibration assembly includes a positioning rod. Two positioning rods are symmetrically arranged on the upper and lower sides of the conveying chain plate on the opposite sides of the two support plates. A wave guide groove is opened on the side of the positioning rod close to the conveying chain plate. The side of the supporting block away from the placement plate is connected to the conveyor chain plate through a pad. A plurality of retractable spring rods are installed between the supporting block and the pad. The side walls of the supporting block close to the two support plates are provided with support rods, which are slidably docked inside the wave guide groove. It also includes a fastening unit for further fixing and limiting the mainboard to be tested, the fastening unit includes a limiting sliding hole opened in the middle of the supporting block, the limiting sliding hole runs through the width direction of the supporting block, an execution block is slidably passed through the limiting sliding hole, a connecting block is provided on the side of the execution block away from the conveying chain plate, and a pull rope is installed between the connecting block and the side of multiple execution strips on the same supporting block close to the supporting rubber strip; The outer wall of the transmission chain plate is provided with a plurality of fixed blocks spaced apart from the supporting blocks. The fixed blocks are provided with linkage holes corresponding to the positions of the limit sliding holes. A support shaft is installed inside the linkage hole. Two telescopic plates are symmetrically sleeved on the outer wall of the support shaft. The side of the telescopic plate away from the support shaft is rotatably connected to the corresponding execution block. After either end of the support shaft slides out to the outside of the fixed block, a force block is installed. A horizontal U-shaped frame is installed on the side wall of the support plate close to the force block. The opening of the U-shaped frame has two horizontal sections and is flush with the force block. The force block and the U-shaped frame slide in contact with each other.

2. The automotive electronic FCT test device according to claim 1, characterized in that: A supporting spring is installed between the execution bar and the inner wall of the sliding groove away from the supporting rubber strip, and a clamping plate is installed on the side of the execution bar away from the placement plate.

3. The automotive electronic FCT test device according to claim 2, characterized in that: The side of the clamping plate close to the supporting strip is sequentially installed with an elastic limiting strip and a bottom supporting plate. The side of the elastic limiting strip close to the supporting strip has an arc-shaped protrusion, and the upper end of the bottom supporting plate is flush with the upper end of the supporting strip.

4. The automotive electronic FCT test device according to claim 1, characterized in that: The test unit includes a controller and a test plug installed on the side of the placement plate away from the supporting block. The controller and the test plug are electrically connected, and an indicator light is also electrically connected to the controller. There are multiple test plugs and they include plug connectors for connecting to multiple different models of motherboards to be tested.

5. The automotive electronic FCT test device according to claim 1, characterized in that: The wave guide groove is composed of a plurality of mutually connected inclined grooves, two adjacent inclined grooves are symmetrically arranged, and the end of the positioning rod is provided with a guide groove connected to the wave guide groove.

6. The automotive electronic FCT test device according to claim 1, characterized in that: The conveying chain plate is composed of a plurality of link plates hinged to each other, and a plurality of supporting blocks are distributed at intervals on the outer side walls of the plurality of link plates.

7. The automotive electronic FCT test device according to claim 1, characterized in that: The outer wall of the fixed block is provided with a limiting sleeve which is slidably sleeved on the outer wall of the supporting shaft.

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