Component process performance evaluation method, device, computer equipment and readable storage medium

Abstract

This application relates to a method, apparatus, computer equipment, and readable storage medium for evaluating the process performance of electronic components. The method includes: acquiring initial process performance test indicators of the component; determining the correlation between the initial process performance test indicators and the component's process performance; selecting process performance test indicators from the initial process performance test indicators based on the correlation; evaluating the component's performance according to the process performance test indicators; obtaining process performance test results; determining the indicator weighting coefficients of the process performance test indicators; and generating the component's process performance evaluation result based on the indicator weighting coefficients, the process performance test results, and the process performance test results. This method can accurately evaluate the process performance of electronic components.

Description

Technical Field

[0001] The present application relates to the field of data processing technology, and in particular to a method, device, computer equipment, computer-readable storage medium and computer program product for evaluating component process performance. Background Art

[0002] With the vigorous development of the electronic components industry, the means of testing the hardware functions of components are becoming more and more complete. However, as an important factor affecting the long-term and reliable application of components, the technical means and calculation models for the overall and comprehensive evaluation of component process performance are relatively lacking.

[0003] The existing component process performance testing technology is to conduct process performance testing for a certain process performance, such as pin solderability, coplanarity, and thermal tolerance, to obtain a single-point process test result, and the single-point process test result is represented in the form of a text description, which can describe the single-point process test result of the process performance in detail. However, this traditional method is not accurate and comprehensive enough. It is urgent to provide a component process performance evaluation method that is both accurate and comprehensive to fill the gap in process performance evaluation in the current component performance evaluation and promote the high-quality development of the component industry. Summary of the invention

[0004] Based on this, it is necessary to provide an accurate and comprehensive component process performance evaluation method, device, computer equipment, computer-readable storage medium and computer program product to address the above technical issues.

[0005] In a first aspect, the present application provides a method for evaluating component process performance, comprising:

[0006] Obtain initial process performance test indicators of components;

[0007] Determine the correlation between the initial process performance test indicators and the process performance of the components, and based on the correlation, select the process performance test indicators from the initial process performance test indicators;

[0008] According to the process performance test indicators, the performance of components is evaluated to obtain the process performance test results;

[0009] Determine the indicator weight coefficient of the process performance test indicator, and generate the process performance evaluation results of the components based on the indicator weight coefficient, the process performance test results, and the process performance test results.

[0010] In one embodiment, the process performance evaluation results of the components are generated according to the indicator weight coefficient, the process performance test results and the process performance test results, including:

[0011] Generate the quantitative value of the process performance evaluation of components based on the index weight coefficient and the process performance test results;

[0012] Query the initial process performance evaluation results that match the process performance evaluation quantification value, and obtain the process performance weaknesses of components based on the process performance test results;

[0013] Generate process performance evaluation results of components based on initial process performance evaluation results and process performance weaknesses.

[0014] In one embodiment, querying the initial process performance evaluation result that matches the process performance evaluation quantification value includes:

[0015] When the process performance evaluation quantification value is within the preset first evaluation quantification range, the initial process performance evaluation result is evaluation passed;

[0016] When the process performance evaluation quantification value is within the preset second evaluation quantification range, the initial process performance evaluation result is that the evaluation fails;

[0017] When the process performance evaluation quantification value is within the preset third evaluation quantification range, the initial process performance evaluation result is to be further evaluated.

[0018] In one embodiment, based on the process performance test results, obtaining the process performance weaknesses of the components includes:

[0019] Converting process performance test results into process performance test quantitative values;

[0020] When the process performance test quantization value is within a preset test quantization range, the process performance test index corresponding to the process performance test quantization value is used as the process performance weakness of the component.

[0021] In one embodiment, determining the indicator weight coefficient of the process performance test indicator includes:

[0022] Get the number of test indicators of process performance test indicators;

[0023] Based on the preset process performance allocation parameters corresponding to the process performance test indicators and the number of test indicators, the indicator weight coefficient of the process performance test indicator is generated, wherein the preset process performance allocation parameters are used to characterize the influence of the process performance test indicator on the process performance evaluation of the component.

[0024] In one embodiment, the initial process performance test index includes at least one of component coplanarity, component solderability, component thermal tolerance, component dimensional stability, component thermal stability, component hygroscopicity, component terminal corrosion resistance, component plating consistency, component plating stability, and component terminal tolerance;

[0025] Based on the degree of correlation, process performance test indicators are screened from the initial process performance test indicators, including:

[0026] From at least one of component coplanarity, component solderability, component thermal tolerance, component dimensional stability, component thermal stability, component hygroscopicity, component terminal corrosion resistance, component plating consistency, component plating stability and component terminal tolerance, select a preset number of process performance test indicators with a correlation greater than a preset correlation threshold.

[0027] In a second aspect, the present application also provides a device for evaluating component process performance, comprising:

[0028] An index acquisition module is used to obtain initial process performance test indicators of components;

[0029] An indicator screening module is used to determine the correlation between the initial process performance test indicator and the component process performance, and based on the correlation, screen the process performance test indicator from the initial process performance test indicator;

[0030] The index evaluation module is used to evaluate the performance of components according to the process performance test index and obtain the process performance test results;

[0031] The performance evaluation module is used to determine the indicator weight coefficient of the process performance test indicator, and generate the process performance evaluation results of the components based on the indicator weight coefficient, the process performance test results and the process performance test results.

[0032] In a third aspect, the present application further provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the following steps are implemented:

[0033] Obtain initial process performance test indicators of components;

[0034] Determine the correlation between the initial process performance test indicators and the process performance of the components, and based on the correlation, select the process performance test indicators from the initial process performance test indicators;

[0035] According to the process performance test indicators, the performance of components is evaluated to obtain the process performance test results;

[0036] Determine the indicator weight coefficient of the process performance test indicator, and generate the process performance evaluation results of the components based on the indicator weight coefficient, the process performance test results, and the process performance test results.

[0037] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the following steps are implemented:

[0038] Obtain initial process performance test indicators of components;

[0039] Determine the correlation between the initial process performance test indicators and the process performance of the components, and based on the correlation, select the process performance test indicators from the initial process performance test indicators;

[0040] According to the process performance test indicators, the performance of components is evaluated to obtain the process performance test results;

[0041] Determine the indicator weight coefficient of the process performance test indicator, and generate the process performance evaluation results of the components based on the indicator weight coefficient, the process performance test results, and the process performance test results.

[0042] In a fifth aspect, the present application further provides a computer program product, including a computer program, which implements the following steps when executed by a processor:

[0043] Obtain initial process performance test indicators of components;

[0044] Determine the correlation between the initial process performance test indicators and the process performance of the components, and based on the correlation, select the process performance test indicators from the initial process performance test indicators;

[0045] According to the process performance test indicators, the performance of components is evaluated to obtain the process performance test results;

[0046] Determine the indicator weight coefficient of the process performance test indicator, and generate the process performance evaluation results of the components based on the indicator weight coefficient, the process performance test results, and the process performance test results.

[0047] The above-mentioned component process performance evaluation method, device, computer equipment, computer-readable storage medium and computer program product comprehensively consider the potential process factors that affect the performance of components, and express them in the form of initial process performance test indicators. Through the correlation between the initial process performance test indicators and the process performance of components, process performance test indicators are screened from the initial process performance test indicators, so that the performance test indicators are highly representative, and the accuracy of performance evaluation based on performance test indicators is improved. Furthermore, the concept of empowerment is proposed, and the process performance test results obtained by performance evaluation of components based on process performance test indicators, the indicator weight coefficients corresponding to the process performance test indicators, and the process performance test results are combined to generate process performance evaluation results, thereby achieving comprehensive and multi-dimensional accurate evaluation of component performance. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the drawings required for use in the embodiments of the present application or related technical descriptions will be briefly introduced below. Obviously, the quantitative values ​​of process performance evaluation in the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying any creative work.

[0049] Figure 1 An application environment diagram of a component process performance evaluation method in an embodiment;

[0050] Figure 2 A schematic diagram of a process flow of a component process performance evaluation method in one embodiment;

[0051] Figure 3 A schematic diagram of a process flow of a component process performance evaluation method in another embodiment;

[0052] Figure 4 is a structural block diagram of a device for evaluating component process performance in one embodiment;

[0053] Figure 5 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0054] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the quantitative values ​​of the process performance evaluation of the specific embodiments described herein are used to explain the present application and are not used to limit the present application.

[0055] The existing component process performance evaluation technologies all focus on a certain process performance, such as pin solderability, to carry out process performance testing. The test results are not comprehensive and cannot represent the overall process performance of the component. At the same time, most of these single-point process test results are in the form of text descriptions. They lack appropriate conversion models and cannot be intuitively displayed in the form of quantitative results, nor can they be effectively identified by computers, which hinders the digitalization of detection.

[0056] Therefore, based on the relative lack of current component process performance evaluation methods, the lack of comprehensiveness of existing single-point evaluation methods, and the inability to quantify existing single-point evaluation results, there is an urgent need to provide a systematic, comprehensive and quantifiable component process performance evaluation method to fill the gap in process performance evaluation in the current component performance evaluation and promote the high-quality development of the component industry.

[0057] The component process performance evaluation method provided in the embodiment of the present application can be applied to Figure 1In the application environment shown, the terminal 102 communicates with the server 104 through a network. The data storage system can store data that the server 104 needs to process. The data storage system can be integrated on the server 104, or placed on the cloud or other network servers.

[0058] There are multiple test indicators distributed on the indicator selection interface of terminal 102. The tester selects the initial process performance test indicator of the component on the indicator selection interface of terminal 102, and clicks the upload button to upload the initial process performance test indicator of the component to terminal 102. Terminal 102 obtains the initial process performance test indicator of the component and forwards the initial process performance test indicator of the component to server 104.

[0059] Server 104 determines the correlation between the initial process performance test indicators and the process performance of the components, and based on the correlation, screens the process performance test indicators from the initial process performance test indicators, performs performance evaluation on the process performance test indicators, obtains the process performance test results, determines the indicator weight coefficient of the process performance test indicators, and generates the process performance evaluation results of the components based on the indicator weight coefficient, the process performance test results and the process performance test results.

[0060] Furthermore, the server 104 may also push the process performance evaluation results to the terminal 102 , which will then be displayed to the tester.

[0061] In other embodiments, the component process performance evaluation method can also be applied separately to the terminal 102 / server 104, that is, the terminal 102 / server 104 can independently complete the component process performance evaluation method.

[0062] For example, there are multiple test indicators distributed on the indicator selection interface of terminal 102. The tester selects the initial process performance test indicators of the components on the indicator selection interface of terminal 102, and clicks the upload button to upload the initial process performance test indicators of the components to terminal 102. Terminal 102 obtains the initial process performance test indicators of the components, and based on the initial process performance test indicators of the components, independently completes the component process performance evaluation method through the above method, which will not be repeated here.

[0063] For another example, the server 104 responds to a component process performance evaluation request, obtains initial process performance test indicators of the component from the database, and independently completes the component process performance evaluation method based on the initial process performance test indicators of the component through the above method, which will not be repeated here.

[0064] The terminal 102 may be, but is not limited to, various personal computers, laptops, smart phones, tablet computers, IoT devices, and portable wearable devices. The IoT devices may be smart speakers, smart TVs, smart air conditioners, smart car devices, projection devices, etc. Portable wearable devices may be smart watches, smart bracelets, head-mounted devices, etc. Head-mounted devices may be virtual reality (VR) devices, augmented reality (AR) devices, smart glasses, etc. The server 104 may be an independent physical server, or a server cluster or distributed system consisting of multiple physical servers, or a cloud server that provides cloud computing services.

[0065] In an exemplary embodiment, Figure 2 As shown in the figure, a method for evaluating the process performance of components is provided. Figure 1 The server 104 in FIG. 1 is used as an example for explanation. Among them:

[0066] S200, obtaining initial process performance test indicators of components.

[0067] Among them, the initial process performance test index of components refers to the index that generally needs to be considered when testing the process performance of components. There is more than one initial process performance test index of components.

[0068] Specifically, the server obtains the initial process performance test indicators of the components from the terminal or from its own database. For example, when the tester uploads the initial process performance test indicators of the components to the terminal, the server obtains the initial process performance test indicators of the components from the terminal. For another example, the server stores the initial process performance test indicators of the components in its database, and the server obtains the initial process performance test indicators of the components from the database.

[0069] S400, determining the correlation between the initial process performance test index and the process performance of the component, and based on the correlation, selecting the process performance test index from the initial process performance test index.

[0070] Specifically, the initial process performance test indicators of components refer to the indicators that generally need to be considered when testing the process performance of components, and they are comprehensive. However, some of the initial process performance test indicators are not the indicators required for the process performance evaluation of the component. Therefore, it is necessary to selectively screen out the process performance test indicators that are really needed for the process performance evaluation of the component from the initial process performance test indicators based on the characteristics of the component. In layman's terms, the initial process performance test indicators are the sum of all the test indicators that need to be considered when performing performance testing, and the process performance test indicators are indicators that are specifically selected from them for a certain component. Generally, the screened process performance test indicators do not exceed ten.

[0071] S600, based on the process performance test indicators, the performance of the components is evaluated to obtain the process performance test results.

[0072] Specifically, according to the various selected process performance test indicators, the performance of the components is evaluated respectively to obtain the corresponding process performance test results. For example, when the process performance test indicator is the solderability of the component, a solderability test experiment is carried out on the component to test the solderability of the component. For example, the solderability of the component is evaluated qualitatively and quantitatively through the principle of wetting balance method to obtain the process performance test results corresponding to the solderability.

[0073] S800, determining an indicator weight coefficient of a process performance test indicator, and generating a process performance evaluation result based on the indicator weight coefficient, the process performance test result, and the process performance test result.

[0074] Specifically, according to the application of the components themselves, the indicator weight coefficients of various process performance test indicators are obtained, and the indicator weight coefficients represent the influence of the process performance test indicators on the overall component process performance evaluation results. And the process performance evaluation results of the components are generated by combining the indicator weight coefficient, process performance test results and process performance test results.

[0075] In the above-mentioned component process performance evaluation method, potential process factors affecting component performance are fully considered and expressed in the form of initial process performance test indicators. Through the correlation between the initial process performance test indicators and the component process performance, process performance test indicators are screened from the initial process performance test indicators, so that the performance test indicators are highly representative, and the accuracy of performance evaluation based on performance test indicators is improved. Furthermore, the concept of empowerment is proposed, and the process performance test results obtained by performance evaluation of components based on process performance test indicators, the indicator weight coefficients corresponding to the process performance test indicators, and the process performance test results are combined to generate process performance evaluation results, thereby achieving comprehensive and multi-dimensional accurate evaluation of component performance.

[0076] In an exemplary embodiment, Figure 3 As shown, S800, including:

[0077] S820, generating a quantitative value of the process performance evaluation of the component according to the indicator weight coefficient and the process performance test result.

[0078] S840, querying the initial process performance evaluation result that matches the process performance evaluation quantization value, and obtaining the process performance weaknesses of the components based on the process performance test result.

[0079] S860, generating a process performance evaluation result of the component according to the initial process performance evaluation result and the process performance weaknesses.

[0080] Specifically, according to the process performance test result and the indicator weight coefficient corresponding to the process performance test indicator, the process performance evaluation quantification value of the component is generated, and then the initial process performance evaluation result matching the process performance evaluation quantification value is queried.

[0081] Furthermore, there are n process performance test indicators, and the process performance test indicators correspond one-to-one to the process performance test results, and the process performance test indicators correspond one-to-one to the indicator weight coefficients. Therefore, the process performance test results correspond one-to-one to the indicator weight coefficients, and the indicator weight coefficients corresponding to the process performance test indicators are also the indicator weight coefficients corresponding to the process performance test results.

[0082] Let the process performance test result corresponding to the i-th process performance test index be N i , process performance test results N i The corresponding indicator weight coefficient is σ i , the quantitative value of process performance evaluation is P, then according to the index weight coefficient and the process performance test results, the expression for generating the quantitative value of process performance evaluation of components is:

[0083]

[0084] For example, let the process performance test indicators include indicator A, indicator B and indicator C, and the process performance test results include the process performance test results N corresponding to indicator A. 1 and the index weight coefficient σ 1 , process performance test results N corresponding to index B 2 and the index weight coefficient σ 2 , Process performance test results N corresponding to index C 3 and the index weight coefficient σ 3 , then the quantitative value of the process performance evaluation of the components is:

[0085] P = σ 1 N 1+σ 2 N 2 +σ 3 N 3

[0086] Through the above-mentioned technical means, it is possible to evaluate the quality of component process performance with quantifiable numbers.

[0087] Furthermore, based on the quantifiable process performance evaluation quantification value, the initial process performance evaluation result matching the process performance evaluation quantification value is queried. For example, some process performance evaluation quantification values ​​match the initial process performance evaluation results that have passed the evaluation, and some process performance evaluation quantification values ​​match the initial process performance evaluation results that have failed the evaluation.

[0088] In addition, the present application can also screen out process performance test results that do not meet the conditions, obtain process performance test indicators corresponding to the process performance test results that do not meet the conditions, and determine the process performance test indicators as the weak points of the process performance of the components. The weak points, i.e., the corresponding process performance test indicators, need to be paid special attention to.

[0089] The initial process performance evaluation results are combined with the process performance weaknesses to obtain the process performance evaluation results of the components. That is to say, the process performance evaluation results of the components include the process performance evaluation quantified values ​​obtained by weighting the process performance evaluation quantified values ​​of the components, and also include process performance weakness indicators.

[0090] In the above embodiment, not only is the quantitative value of the process performance evaluation of the component generated based on the indicator weight coefficient and the process performance test result, but also the process performance weaknesses of the component are obtained based on the process performance test result, thereby achieving a comprehensive process performance evaluation of the component and improving the accuracy of the component evaluation.

[0091] In an exemplary embodiment, querying the initial process performance evaluation result that matches the process performance evaluation quantification value includes:

[0092] When the process performance evaluation quantification value is within the preset first evaluation quantification range, the initial process performance evaluation result is that the evaluation passed; when the process performance evaluation quantification value is within the preset second evaluation quantification range, the initial process performance evaluation result is that the evaluation failed; when the process performance evaluation quantification value is within the preset third evaluation quantification range, the initial process performance evaluation result is that further evaluation is pending.

[0093] Specifically, according to the indicator weight coefficient and the process performance test result, the quantitative value of the process performance evaluation of the component is generated, and the obtained quantitative value of the process performance evaluation of the component is represented by numbers.

[0094] Therefore, the present application can evaluate the pros and cons of the process performance of components through quantifiable numbers. Specifically, a first evaluation quantization range, a second evaluation quantization range and a third evaluation quantization range are pre-set, and each evaluation quantization range is regarded as a level. When the process performance evaluation quantization value is at different levels, the corresponding initial process performance evaluation results are different.

[0095] When the process performance evaluation quantification value is within the preset first evaluation quantification range, the initial process performance evaluation result is passed, indicating that the process performance of the component is good at this time; when the process performance evaluation quantification value is within the preset second evaluation quantification range, the initial process performance evaluation result is failed, indicating that the process performance of the component does not meet the use requirements at this time; when the process performance evaluation quantification value is within the preset third evaluation quantification range, the initial process performance evaluation result is pending further evaluation, indicating that the process performance of the component basically meets the use requirements at this time but there is still room for improvement. It is recommended to use it after full evaluation.

[0096] In an exemplary embodiment, taking the process performance evaluation quantization value range of 0-100 as an example, let the preset first evaluation quantization range be [0, 60), the preset second evaluation quantization range be [60, 100), and the preset third evaluation quantization range be 100. If the process performance evaluation quantization value P is 50, then the initial process performance evaluation result is characterized as failure of the evaluation. If the process performance evaluation quantization value P is 62, then the initial process performance evaluation result is to be evaluated further. If the process performance evaluation quantization value P is 200, then the initial process performance evaluation result is characterized as passing the evaluation.

[0097] In the above embodiment, by representing the process performance evaluation result in a digital quantified form and setting a plurality of evaluation quantization ranges, it is determined whether the process performance evaluation result of the component passes, thereby improving the efficiency and accuracy of the component process performance evaluation.

[0098] In an exemplary embodiment, in order to improve the efficiency of component process performance evaluation, the component process performance evaluation method also includes: querying the initial process performance evaluation result that matches the process performance evaluation quantization value, and only obtaining the process performance weaknesses of the component based on the process performance test results when the initial process performance evaluation result is within the preset second evaluation quantization range and the preset third evaluation quantization range; when the initial process performance evaluation result is within the preset first evaluation quantization range, there is no need to judge the process performance weaknesses of the component.

[0099] In an exemplary embodiment, based on the process performance test results, obtaining the process performance weaknesses of the components includes:

[0100] The process performance test result is converted into a process performance test quantification value. When the process performance test quantification value is within a preset test quantification range, the process performance test index corresponding to the process performance test quantification value is used as the process performance weakness of the component.

[0101] Among them, the preset test quantization range represents the weak test quantization range, that is, within the quantization range, the process performance test index corresponding to the process performance test result is the process performance weakness of the component.

[0102] Specifically, a process performance test result is converted into a process performance test quantification value. For example, if a process performance test result is good, the process performance test result can be converted into a process performance test quantification value of 80. The process performance test quantification value is equivalent to scoring the process performance test index of the component to accurately quantify the process performance test result.

[0103] When the process performance test quantification value is within a preset test quantification range, the process performance test index corresponding to the process performance test result is used as the process performance weakness of the component.

[0104] For example, the numerical values ​​are pre-limited to 0, 60, and 100. When the process performance test quantification value is 0, it means that the process performance is unqualified. When the process performance test quantification value is 60, it means that the process performance is basically qualified. When the process performance test quantification value is 100, it means that the process performance is excellent. At this time, the preset test quantification range is [0, 100). If the process performance test quantification value is 59, the process performance test indicator corresponding to the process performance test quantification value is used as the process performance weak point of the component. If the process performance test quantification value is 69, the process performance test indicator corresponding to the process performance test quantification value is used as the process performance weak point of the component.

[0105] Furthermore, there are multiple process performance test quantification values. When all process performance test quantification values ​​are not within the preset test quantification range, it means that all process performance of the component is good, and there is no need to use the process performance test indicator corresponding to the process performance test quantification value as the component's process performance weakness for subsequent focus.

[0106] In the above embodiment, by judging in turn whether each process performance test quantization value is within the preset test quantization range, the process performance test indicator corresponding to the process performance test quantization value within the preset test quantization range can be used as the process performance weakness of the component, so as to accurately determine the process performance weakness for subsequent attention and analysis.

[0107] In an exemplary embodiment, determining the index weight coefficient of the process performance test result includes:

[0108] The number of test indicators of the process performance test indicator is obtained, and the indicator weight coefficient of the process performance test indicator is generated based on the preset process performance allocation parameter corresponding to the process performance test indicator and the number of test indicators.

[0109] Among them, the preset process performance allocation parameters are used to characterize the impact of process performance test indicators on component process performance evaluation, and the value range of the indicator weight coefficient is 0-1.

[0110] Specifically, the number of test indicators of the process performance test indicators is obtained. The value of the number of test indicators is based on the process performance category actually verified, which is generally less than 10 items. The preset process performance allocation parameters corresponding to each process performance test indicator are obtained.

[0111] Since the preset process performance allocation parameters are used to characterize the impact of different process performance test indicators on the process performance evaluation of components, the indicator weight coefficient of the process performance test result can be generated based on the preset process performance allocation parameters corresponding to the process performance test indicators and the number of test indicators.

[0112] Based on the preset process performance allocation parameters X corresponding to the process performance test indicators i With the number of test indicators n, the indicator weight coefficient σ of the i-th process performance test result is generated i ,include:

[0113]

[0114]

[0115] Among them, X i Used to weigh the impact of different process performance on the overall proportion of component process performance evaluation, X i The value of must meet the following requirements:

[0116]

[0117] That is to say, the sum of the preset process performance allocation parameters corresponding to all process performance test indicators is equal to the number of test indicators n. In layman's terms, the process of obtaining the preset process performance allocation parameters corresponding to the process performance test results includes: according to the number of test indicators n, splitting the process performance test indicators of the components into n parts, determining the number of parts occupied by each process performance test indicator, and using the number of parts occupied by each process performance test indicator as the preset process performance allocation parameters corresponding to the process performance test indicators.

[0118] In the above embodiment, since the number of test indicators of the process performance test indicator is also the number of process performance test results, the indicator weight coefficient of the process performance test result can be accurately generated by obtaining the preset process performance allocation parameters corresponding to the process performance test indicator and combining the number of test indicators of the process performance test indicator.

[0119] In an exemplary embodiment, the initial process performance test indicators include at least one of component coplanarity, component solderability, component thermal tolerance, component dimensional stability, component thermal stability, component hygroscopicity, component terminal corrosion resistance, component plating consistency, component plating stability, and component terminal tolerance.

[0120] Based on the degree of correlation, process performance test indicators are screened from the initial process performance test indicators, including:

[0121] From at least one of component coplanarity, component solderability, component thermal tolerance, component dimensional stability, component thermal stability, component hygroscopicity, component terminal corrosion resistance, component plating consistency, component plating stability and component terminal tolerance, select a preset number of process performance test indicators with a correlation greater than a preset correlation threshold.

[0122] Among them, coplanarity, that is, the coplanarity of the pins, refers to the deviation of the pin ends of SMT (Surface Mount Technology) components from the ideal plane. Ideally, all pins should be completely coplanar to ensure good contact with the PCB (Printed Circuit Board) pads during the patch process. Insufficient coplanarity may lead to defects such as poor welding, cold welding, and cold welding, which in turn affects the performance and reliability of electronic products.

[0123] The solderability of components refers to their ability to be soldered within a specified time and temperature. It is related to the thermal properties, wettability, and heat resistance of the components.

[0124] Component thermal tolerance refers to the ability of components to withstand high temperatures. Components must have a high temperature tolerance to ensure that they will not be damaged or fail during high-temperature welding.

[0125] Component dimensional stability: As the size decreases, the components inside the device become smaller and more sensitive to interference from the external environment. For example, the reduction in the size of microelectronic devices may make them more susceptible to factors such as temperature changes and electromagnetic interference, thereby reducing the stability of the device. Therefore, when designing microelectronic devices, it is necessary to consider their stability and take corresponding measures to reduce the impact of the external environment on the device.

[0126] The thermal stability of components refers to the ability of components to maintain their structure and performance without significant changes in high temperature environments.

[0127] Component hygroscopicity refers to the ability of components to absorb moisture in the environment.

[0128] The corrosion resistance of component terminals refers to the ability of component terminals to resist the corrosion and destructive effects of the surrounding medium.

[0129] Component plating consistency. Plating refers to a layer of plastic or a thin layer of metal applied to the metal surface of certain items for the sake of appearance or storage, or a thin layer of precious metal is plated on the surface of ordinary metal to imitate a precious metal. Consistency refers to the consistency of the thin layer plated on the surface of the component.

[0130] The stability of component coating refers to the ability of the coating to not easily crack or peel off. For example, a coating that is too thin is prone to cracking and peeling, thereby reducing the adhesion and protective performance of the coating. However, a coating that is too thick may cause stress concentration and cause the formation of stress corrosion cracks.

[0131] The tolerance of component terminals can be measured by the terminal voltage change caused by load fluctuations.

[0132] Specifically, the initial process performance test indicators include at least one of component coplanarity, component solderability, component thermal tolerance, component dimensional stability, component thermal stability, component hygroscopicity, component terminal corrosion resistance, component plating consistency, component plating stability and component terminal tolerance, which are defined by the tester. It needs to be explained that the initial process performance test indicators include not only the indicators listed above, but also other indicators.

[0133] Taking the initial process performance test indicators including the indicators listed above as an example, the server responds to the screening operation triggered by the tester at the terminal, and screens the process performance test indicators from at least one of component coplanarity, component solderability, component thermal tolerance, component dimensional stability, component thermal stability, component hygroscopicity, component terminal corrosion resistance, component plating consistency, component plating stability and component terminal tolerance.

[0134] The standard for screening process performance test indicators is to screen a preset number of test indicators whose correlation is greater than a preset correlation threshold, wherein the preset number of test indicators is a predefined number, and the correlation refers to the correlation between the initial process performance test indicators and the component process performance evaluation.

[0135] That is to say, the process performance test index with a high correlation with the process performance evaluation of the component is automatically matched in combination with the characteristics of the component. Furthermore, the tester can continue to screen from the process performance test index to obtain the process performance test index required by the tester.

[0136] In an exemplary embodiment, the server can load a first machine learning model that has been trained from a database, process the initial process performance test indicators through the trained first machine learning model, obtain the correlation between the initial process performance test indicators and the component process performance evaluation, and then screen the initial process performance test indicators through the correlation.

[0137] The training process of the first machine learning model is achieved through test data, which includes historical initial process performance test indicators and their corresponding correlations.

[0138] In an exemplary embodiment, the server can load a second machine learning model that has been trained from a database, process the initial process performance test indicators through the second machine learning model that has been trained, and directly output process performance test indicators whose correlation is greater than a preset correlation threshold.

[0139] The training process of the second machine learning model is achieved through test data, which includes multiple historical initial process performance test indicators and historical process performance test indicators whose correlation is greater than a preset correlation threshold.

[0140] In an exemplary embodiment, the present application can also screen the initial process performance test indicators in combination with actual environmental conditions to obtain process performance test indicators. For example, when the components are arranged in an air-conditioned room and the use environment is good, there is no need to test the hygroscopicity of the components.

[0141] In the above embodiment, by obtaining the correlation between multiple initial process performance test indicators and component process performance evaluation, the process performance test indicators are accurately screened from the multiple initial process performance test indicators, thereby improving the accuracy and efficiency of the component process performance evaluation.

[0142] In an exemplary embodiment, the present application also provides a component process performance evaluation system, which includes six parts: an indicator selection unit, a weighting unit, a data processing unit, an evaluation quantitative value acquisition unit, a result evaluation unit, and a report output unit. The functions of the specific modules are as follows:

[0143] The index selection unit is mainly used to combine the characteristics of the selected components, existing test data and machine learning models, and automatically match the component process performance indicators that are highly relevant to the component for testers to screen;

[0144] The weighting unit is mainly used to weight the screened process performance test indicators. The weight value should be positively correlated with the influence of the corresponding process performance test indicators on the use process of components.

[0145] The data processing unit conducts process performance tests on components based on the selected process performance test indicators, and digitizes the test results after the test is completed to form digital results that meet the requirements of the evaluation model;

[0146] The evaluation quantitative value acquisition unit calculates the process performance evaluation quantitative value using the process performance evaluation model according to the process performance test results and the weights of each item;

[0147] The result evaluation unit evaluates the process performance of components based on the calculated process performance evaluation quantification value, and can also locate the weak points of components based on the process performance test results;

[0148] The report output unit is the last module of the system, which is used to output the evaluation results in the form of an evaluation report.

[0149] Based on the above six units, the process performance evaluation of the gullwing pin components for server motherboards (package form: plastic package SOP64) is taken as an example, including:

[0150] (1) Indicator selection unit

[0151] An analysis was conducted on components with SOP64 plastic packaging. Based on the common problems with this type of components in actual applications, the recommended process performance indicators are component coplanarity, component solderability, component thermal stability, component hygroscopicity, component terminal corrosion resistance, and component terminal tolerance. Considering that servers are mainly arranged in air-conditioned rooms with a good operating environment, the process performance test indicators were finally selected after secondary screening based on actual working conditions:

[0152] Index No. 1, component coplanarity;

[0153] Index No. 2, component solderability;

[0154] Indicator No. 3: thermal stability of components.

[0155] (2) Empowerment unit

[0156] For the selected process performance indicators, set the process performance allocation parameter X i X 1 =0.5,X 2 =1.5,X 3 =1;

[0157] Substitute the obtained process performance allocation parameters into:

[0158]

[0159] The index weight coefficients of the process performance test results can be calculated as follows:

[0160] σ 1 =0.17,σ 2 =0.5,σ 3 =0.33.

[0161] (3) Data processing unit

[0162] The selected process performance test indicators are tested, and the specific results are that the coplanarity of the components is qualified, and the evaluation results of the process performance indicators are N 1 The solderability of the components is good, and the evaluation result of its process performance index is N 2 is 100; the thermal stability of the components is good, and the evaluation result of its process performance index is N 3 is 100.

[0163] (4) Evaluation Quantization Value Acquisition Unit

[0164] Import the results of steps (2) and (3) into the process performance evaluation model:

[0165]

[0166] The process performance factor P of the obtained plastic-encapsulated SOP64 component is 93.2.

[0167] (5) Result evaluation unit

[0168] Through the above calculation, we can know that the process performance factor P of this type of plastic-encapsulated SOP64 component is 93.2. Therefore, it can be known that the process performance of this component is good. From the process perspective, this type of component can be used on the server motherboard.

[0169] The thermal stability of the process evaluation index is rated as qualified, indicating that the device has some deformation during welding or high-temperature use, but meets the requirements of the current standard for this performance index. If the process performance of this component needs to be further improved in the future, point-to-point improvement of this performance can be considered.

[0170] (6) Report output unit

[0171] Output the process performance evaluation report corresponding to the component.

[0172] Compared with the closest evaluation scheme, the advantages and benefits of this application are:

[0173] 1. A component process evaluation model was developed for the first time. Compared with the scattered process evaluation projects in the past, this model unified the unquantifiable conclusions in the traditional process evaluation results, such as "poor solderability", "excessive thermal deformation" and "coplanarity meets the requirements", and expressed them in digital form, making it possible to evaluate the process performance of components more intuitively and comprehensively. At the same time, the digital form of expression makes the process performance of components a quantifiable indicator, which is highly adaptable to the comprehensive promotion of industrial intelligence.

[0174] 2. Comprehensively consider the potential factors that affect the process performance of components and express them in the form of component process performance indicators, and list the 10 most concerned process performance indicators of components. Traditional process evaluation often only narrowly evaluates the solderability of components, which is not representative for evaluating the overall performance of components, and the evaluation results are not convincing enough.

[0175] 3. The concept of empowerment is proposed for the process performance indicators of components. Due to the different types and application scenarios of components, the degree of attention paid to the process performance indicators of different components during use should also be different. Traditional process evaluation methods have not paid attention to this part, and for other similar test processes, the failure of the test of a single non-critical parameter will often lead to a poor evaluation of the overall component, which in turn causes component manufacturers to spend more energy on improving non-critical parameters, while user units spend more time on unfocused verification of components.

[0176] In general, this application designs a component process performance evaluation method. The constructed component process performance evaluation model can realize a comprehensive and multi-dimensional evaluation of component process performance. Through this model, the concerns of component application manufacturers about the process performance of the selected components can be effectively resolved, and the test of component selection and verification can be effectively shortened, the efficiency of product development and production can be improved, and the overall cost of products can be reduced; for component manufacturers, this model can effectively evaluate the process performance of products under development or in mass production, and timely discover the process weaknesses of products. It can formulate targeted optimization and improvement measures based on the evaluation results, which can effectively improve the quality and reliability of products. At the same time. Through the designed evaluation system, various process performance indicators can be quickly summarized and output, and complex process performance descriptions can be converted into digital form for output, which greatly reduces the evaluation time and provides a basis for the subsequent industrialization and intelligentization of the model.

[0177] It should be understood that, although the steps in the flowcharts involved in the above embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0178] Based on the same inventive concept, the embodiment of the present application also provides a device for evaluating component process performance for implementing the method for evaluating component process performance involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the method above, so the specific limitations in one or more embodiments of the device for evaluating component process performance provided below can refer to the limitations of the method for evaluating component process performance above, and will not be repeated here.

[0179] In an exemplary embodiment, Figure 4 As shown, a device 1000 for evaluating component process performance is provided, comprising: an index acquisition module 200, an index screening module 400, an index evaluation module 600 and a performance evaluation module 800, wherein:

[0180] The index acquisition module 200 is used to obtain the initial process performance test index of the components;

[0181] The indicator screening module 400 is used to determine the correlation between the initial process performance test indicator and the component process performance, and screen the process performance test indicator from the initial process performance test indicator based on the correlation;

[0182] The index evaluation module 600 is used to evaluate the performance of components according to the process performance test index and obtain the process performance test result;

[0183] The performance evaluation module 800 is used to determine the indicator weight coefficient of the process performance test indicator, and generate the process performance evaluation result of the component according to the indicator weight coefficient, the process performance test result and the process performance test result.

[0184] In one embodiment, the performance evaluation module 800 is also used to generate a process performance evaluation quantification value of a component based on an indicator weight coefficient and a process performance test result, query an initial process performance evaluation result that matches the process performance evaluation quantification value, and obtain process performance weaknesses of the component based on the process performance test result, and generate a process performance evaluation result of the component based on the initial process performance evaluation result and the process performance weaknesses.

[0185] In one embodiment, the performance evaluation module 800 is also used to, when the process performance evaluation quantization value is in a preset first evaluation quantization range, the initial process performance evaluation result is an evaluation pass, when the process performance evaluation quantization value is in a preset second evaluation quantization range, the initial process performance evaluation result is an evaluation failure, and when the process performance evaluation quantization value is in a preset third evaluation quantization range, the initial process performance evaluation result is to be evaluated further.

[0186] In one embodiment, the performance evaluation module 800 is also used to convert the process performance test results into a process performance test quantification value. When the process performance test quantification value is within a preset test quantification range, the process performance test indicator corresponding to the process performance test quantification value is used as the process performance weakness of the component.

[0187] In one embodiment, the performance evaluation module 800 is also used to obtain the number of test indicators of the process performance test indicator, and generate the indicator weight coefficient of the process performance test indicator based on the preset process performance allocation parameters and the number of test indicators corresponding to the process performance test indicator, wherein the preset process performance allocation parameters are used to characterize the impact of the process performance test indicator on the process performance evaluation of the component.

[0188] In one embodiment, the initial process performance test indicators include at least one of component coplanarity, component solderability, component thermal tolerance, component dimensional stability, component thermal stability, component hygroscopicity, component terminal corrosion resistance, component plating consistency, component plating stability and component terminal tolerance; the indicator screening module 400 is also used to screen a preset number of process performance test indicators with a correlation greater than a preset correlation threshold from at least one of component coplanarity, component solderability, component thermal tolerance, component dimensional stability, component thermal stability, component hygroscopicity, component terminal corrosion resistance, component plating consistency, component plating stability and component terminal tolerance.

[0189] Each module in the above-mentioned component process performance evaluation device can be implemented in whole or in part by software, hardware and their combination. Each of the above-mentioned modules can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute the corresponding operations of each of the above modules.

[0190] In an exemplary embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as shown in FIG. Figure 5 As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store data such as initial process performance test indicators. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a component process performance evaluation method is implemented.

[0191] Those skilled in the art will understand that Figure 5 The structure shown in the figure and the quantitative value of process performance evaluation are block diagrams of partial structures related to the scheme of the present application, and do not constitute limitations on the computer device to which the scheme of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0192] In one embodiment, a computer device is further provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above method embodiments when executing the computer program.

[0193] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0194] In one embodiment, a computer program product is provided, including a computer program, which implements the steps in the above method embodiments when executed by a processor.

[0195] A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment method can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, an artificial intelligence (AI) processor, etc., but are not limited to this.

[0196] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0197] The above embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A method for evaluating component process performance, characterized in that: The method comprises: Obtain initial process performance test indicators of components; Determining the correlation between the initial process performance test index and the process performance of the component, and based on the correlation, selecting the process performance test index from the initial process performance test index; According to the process performance test index, the performance of the components is evaluated to obtain a process performance test result; Determine the indicator weight coefficient of the process performance test indicator, and generate the process performance evaluation result of the component according to the indicator weight coefficient and the process performance test result; generate the process performance evaluation result of the component according to the indicator weight coefficient and the process performance test result, including: generating a process performance evaluation quantization value of the component according to the indicator weight coefficient and the process performance test result; query the initial process performance evaluation result that matches the process performance evaluation quantization value, and when the initial process performance evaluation result is within a preset second evaluation quantization range and a preset third evaluation quantization range, obtain the process performance weak point of the component based on the process performance test result; generate the process performance evaluation result of the component according to the initial process performance evaluation result and the process performance weak point.

2. The method according to claim 1, characterized in that: The querying of the initial process performance evaluation result that matches the process performance evaluation quantification value includes: When the process performance evaluation quantization value is within the preset first evaluation quantization range, the initial process performance evaluation result is evaluation passed; When the process performance evaluation quantification value is within the preset second evaluation quantification range, the initial process performance evaluation result is that the evaluation fails; When the process performance evaluation quantization value is within a preset third evaluation quantization range, the initial process performance evaluation result is to be further evaluated.

3. The method according to claim 1, characterized in that The obtaining of process performance weaknesses of the components based on the process performance test results includes: Converting the process performance test result into a process performance test quantified value; When the process performance test quantization value is within a preset test quantization range, the process performance test index corresponding to the process performance test quantization value is used as the process performance weakness of the component.

4. The method according to claim 1, characterized in that: The indicator weight coefficient for determining the process performance test indicator includes: Obtaining the number of test indicators of the process performance test indicator; Based on the preset process performance allocation parameters corresponding to the process performance test indicators and the number of test indicators, the indicator weight coefficient of the process performance test indicator is generated, wherein the preset process performance allocation parameters are used to characterize the impact of the process performance test indicator on the process performance evaluation of components.

5. The method according to claim 1, characterized in that: The initial process performance test index includes at least one of component coplanarity, component solderability, component thermal tolerance, component dimensional stability, component thermal stability, component hygroscopicity, component terminal corrosion resistance, component plating consistency, component plating stability, and component terminal tolerance; The step of screening the process performance test indicators from the initial process performance test indicators based on the correlation degree includes: From at least one of the component coplanarity, the component solderability, the component thermal tolerance, the component dimensional stability, the component thermal stability, the component hygroscopicity, the component terminal corrosion resistance, the component plating consistency, the component plating stability and the component terminal tolerance, select a preset number of process performance test indicators with a correlation greater than a preset correlation threshold.

6. A device for evaluating component process performance, characterized in that: The device comprises: An index acquisition module is used to obtain initial process performance test indicators of components; An indicator screening module, used to determine the correlation between the initial process performance test indicator and the process performance of the component, and based on the correlation, screen the process performance test indicator from the initial process performance test indicator; An index evaluation module, used to perform performance evaluation on the components according to the process performance test index to obtain a process performance test result; A performance evaluation module is used to determine the indicator weight coefficient of the process performance test indicator, and generate the process performance evaluation result of the component according to the indicator weight coefficient and the process performance test result; generate the process performance evaluation result of the component according to the indicator weight coefficient and the process performance test result, including: generating a process performance evaluation quantization value of the component according to the indicator weight coefficient and the process performance test result; querying the initial process performance evaluation result that matches the process performance evaluation quantization value, and when the initial process performance evaluation result is within a preset second evaluation quantization range and a preset third evaluation quantization range, obtaining the process performance weak point of the component based on the process performance test result; generating the process performance evaluation result of the component according to the initial process performance evaluation result and the process performance weak point.

7. The device according to claim 6, characterized in that The performance evaluation module is also used to, when the process performance evaluation quantization value is within a preset first evaluation quantization range, the initial process performance evaluation result is an evaluation pass, when the process performance evaluation quantization value is within a preset second evaluation quantization range, the initial process performance evaluation result is an evaluation failure, and when the process performance evaluation quantization value is within a preset third evaluation quantization range, the initial process performance evaluation result is to be evaluated further.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 5 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

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