Luminance correction method and device and computer readable storage medium

Abstract

The invention relates to a light-emitting brightness correction method and device and a computer readable storage medium, and the method comprises the steps: obtaining a brightness measurement value of a light-emitting to-be-measured object and a brightness value of an interference object, and enabling the interference object to be close to the to-be-measured object; and determining an influence factor of the interference object on the brightness of the to-be-measured object, and correcting the brightness measurement value according to the brightness value of the interference object and the influence factor to determine the actual light-emitting brightness of the to-be-measured object. According to the luminance correction method, the crosstalk influence of the interference object can be removed from the luminance measurement value, and a more accurate luminance detection result of the to-be-detected object can be obtained.

Description

Technical Field

[0001] The present application relates to the field of luminescence detection, and in particular to a luminescence brightness correction method, device and computer-readable storage medium. Background Art

[0002] In current display technology, the size of light-emitting chips continues to shrink. For example, Micro LED (Micro Light Emitting Diode) chips have reduced the size of a single light-emitting chip to within 50um. Small-sized and densely arranged light-emitting chips can bring better display effects, but in the production process, the process difficulty also increases. When detecting the brightness of a single light-emitting chip, the light from other surrounding light-emitting chips will have an impact, resulting in the final measured brightness value being inaccurate. However, in the face of a large number of small-sized and high-density light-emitting chips, the time and process costs required to light up and test a single light-emitting chip one by one or to form physical isolation during brightness detection are extremely high.

[0003] Therefore, how to obtain more accurate actual luminous brightness at low cost is an urgent problem to be solved. Summary of the invention

[0004] In view of the deficiencies of the above-mentioned related technologies, the purpose of the present application is to provide a luminous brightness correction method, device and computer-readable storage medium, aiming to solve the problem of inaccurate results of luminous brightness detection of luminous objects in some application scenarios.

[0005] A method for correcting luminous brightness, comprising:

[0006] Obtaining a brightness measurement value of the object to be measured and a brightness value of an interfering object; wherein the interfering object is disposed adjacent to the object to be measured;

[0007] Determining the influence factor of the interfering object on the brightness of the object to be measured; and

[0008] According to the brightness value of the interfering object and the influencing factor, the brightness measurement value is corrected to determine the actual luminous brightness of the object to be treated.

[0009] The above-mentioned luminous brightness correction method can remove the crosstalk effect of the interfering object from the brightness measurement value by obtaining the brightness value of the interfering object to correct the brightness measurement value of the object to be measured, and in some implementation processes can obtain a more accurate actual luminous brightness of the object to be measured.

[0010] Optionally, before obtaining the brightness measurement value of the object to be measured and the brightness value of the interfering object, the method further includes:

[0011] Simulating and locating the setting position of the light source device from the detection image according to the preset position information;

[0012] The object to be detected and the corresponding interference object are determined from the detection image according to the result of the simulated positioning.

[0013] Simulation positioning can facilitate the determination of the object to be measured, the interfering object and its brightness value. In some implementations, the result of simulation positioning can also be used to determine whether the object to be measured is at the boundary of the array, or whether there is a dark spot area around it.

[0014] Optionally, determining the brightness measurement value according to the grayscale of a pixel corresponding to the object to be detected in the detection image includes:

[0015] Determine the brightness peak position of the object to be detected in the detection image;

[0016] The pixel grayscale within a predetermined range around the brightness peak position is used as the brightness measurement value.

[0017] Finding the brightness peak position of the luminous area and measuring the brightness with the brightness peak position as the center can more accurately reflect the brightness conditions of the object to be measured.

[0018] Optionally, obtaining the brightness value of the interfering object includes:

[0019] The actual luminous brightness of the interfering object is obtained as the brightness value of the interfering object.

[0020] The brightness value of the interfering object obtained is a more accurate actual luminous brightness, and the final brightness correction of the object to be measured will also be more accurate.

[0021] Optionally, the correcting the brightness measurement value according to the brightness value of the interfering object and the influencing factor to determine the actual luminous brightness of the object to be measured includes:

[0022] Determine the influence coefficient according to the preset corresponding relationship between the influence factor and the influence coefficient;

[0023] The actual luminous brightness of the object to be measured is determined by subtracting the brightness influence value of the interfering object from the brightness measurement value of the object to be measured, wherein the brightness influence value of the interfering object is the product of the influence coefficient and the brightness value of the interfering object.

[0024] The brightness influence value of the interfering object on the object to be measured is determined by the influence coefficient and the brightness value of the interfering object. Subtracting the brightness influence value from the brightness measurement value of the object to be measured can obtain an actual luminous brightness that is more accurate than the brightness measurement value.

[0025] Optionally, determining the influence coefficient according to the preset correspondence between the influence factor and the influence coefficient includes any of the following methods:

[0026] Method 1: obtaining a preset influence coefficient set and a correspondence between elements in the influence coefficient set and the influence factor, and determining the influence coefficient from the influence coefficient set according to the correspondence;

[0027] Method 2: Obtain a fitting function of the influencing factor and the influencing coefficient, and determine the influencing coefficient according to the influencing factor and the fitting function.

[0028] Based on the same inventive concept, the present application also provides a luminous brightness correction device, including a processor, a memory and a communication bus;

[0029] The communication bus is used to realize the connection and communication between the processor and the memory;

[0030] The processor is used to execute one or more programs stored in the memory to implement the steps of the luminous brightness correction method as described above.

[0031] The processor of the above-mentioned luminous brightness correction device executes the program in the memory to implement the steps of the above-mentioned luminous brightness correction method, and in some implementation processes, a more accurate actual luminous brightness of the brightness of the object to be measured can be obtained.

[0032] Based on the same inventive concept, the present application also provides a computer-readable storage medium, which stores one or more programs, and the one or more programs can be executed by one or more processors to implement the steps of the luminous brightness correction method as described above.

[0033] The program stored in the computer-readable storage medium can be executed by a processor to implement the steps of the above-mentioned luminous brightness correction method. In some implementation processes, a more accurate actual luminous brightness of the object to be measured can be obtained. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 A schematic diagram of the basic flow of the luminous brightness correction method provided in an embodiment of the present application;

[0035] Figure 2 A schematic diagram of a process for obtaining a brightness measurement value of a luminous object to be measured provided in an embodiment of the present application;

[0036] Figure 3 A schematic diagram of a process for obtaining a detection image provided in an embodiment of the present application;

[0037] Figure 4A schematic flow chart of other steps of the luminous brightness correction method provided in an embodiment of the present application;

[0038] Figure 5 A schematic diagram of a process for determining a brightness measurement value based on a detected image provided in an embodiment of the present application;

[0039] Figure 6 A schematic diagram of pixels in a predetermined range around a brightest point A provided in an embodiment of the present application;

[0040] Figure 7 A schematic diagram of a light pattern provided in an embodiment of the present application;

[0041] Figure 8 A schematic diagram of another light pattern provided in an embodiment of the present application;

[0042] Fig. 9 A schematic diagram of the light emitting angle provided in the embodiment of the present application;

[0043] Fig.10 A schematic diagram of a process for correcting brightness measurement values ​​provided in an embodiment of the present application;

[0044] Fig.11 A schematic diagram of the relationship between the object to be measured and the interference object provided in the embodiment of the present application;

[0045] Fig.12 A schematic diagram of a process for detecting and correcting luminous brightness provided in an embodiment of the present application;

[0046] Fig.13 A schematic diagram of a Micro LED chip on a display panel provided in an embodiment of the present application;

[0047] Fig.14 A schematic diagram of optical imaging provided in an embodiment of the present application;

[0048] Fig.15 Provided in the embodiments of this application Fig.13 A schematic diagram of a detection image;

[0049] Fig.16 A schematic diagram of simulating the positioning of a Micro LED chip provided in an embodiment of the present application;

[0050] Fig.17 A schematic structural diagram of a luminous brightness correction device provided in another optional embodiment of the present application;

[0051] Description of reference numerals:

[0052] 10-light spot; 11-pixel; 13-object to be tested; 141-interference object adjacent to the side of the object to be tested; 142-interference object adjacent to the corner of the object to be tested; 15-display panel; 16-Micro LED chip; 161-Micro LED chip as the object to be tested; 17-optical imaging device; 18-crosstalk area; 19-frame; 1701-processor; 1702-memory; 1703-communication bus; A-brightest point. DETAILED DESCRIPTION

[0053] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. The preferred embodiments of the present application are given in the drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thoroughly and comprehensively understood.

[0054] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application.

[0055] In the related art, when detecting the brightness of a single light-emitting chip, the light from other surrounding light-emitting chips will have an impact, resulting in an inaccurate brightness value finally measured.

[0056] Based on this, the present application hopes to provide a solution that can solve the above-mentioned technical problems, the details of which will be described in the subsequent embodiments.

[0057] Example:

[0058] This embodiment provides a method for calibrating light luminance. Figure 1 , which includes:

[0059] S101, obtaining a brightness measurement value of the object to be measured and a brightness value of the interfering object;

[0060] S102, determining the influence factor of the interference object on the brightness of the object to be measured;

[0061] S103, correcting the brightness measurement value according to the brightness value of the interfering object and the influencing factor to determine the actual luminous brightness of the object to be measured;

[0062] The luminous brightness correction method of this embodiment is not only applicable to the brightness detection of the luminous chip, but also applicable to the brightness detection of other luminous objects. In order to more accurately detect the brightness of the object to be measured 13, the luminous brightness correction method of this embodiment obtains the brightness measurement value of the object to be measured 13, and also obtains the brightness value of the interfering object, thereby excluding the influence of the interfering object from the brightness measurement value, and obtaining a more accurate actual luminous brightness of the object to be measured 13 closer to the true value.

[0063] In this embodiment, the object to be measured 13 is the object to be corrected by the luminous brightness correction method, and the interference object is set near the object to be measured 13; it is understandable that the interference object can be other luminous objects near the object to be measured 13. For example, in actual applications, the light emission angle of the light-emitting chip, the light between the light-emitting chips that are close to each other will be shot to each other's corresponding positions, resulting in a detection result higher than the actual brightness value when detecting the brightness. Therefore, the brightness measurement value of the object to be measured 13 obtained by the present application actually includes the brightness provided by the object to be measured 13 itself (for example, the brightness emitted by the light-emitting chip as the object to be measured 13), and also includes the brightness provided by the interference object (for example, the brightness generated by the large-angle light emitted by other light-emitting chips around). In this embodiment, the object to be measured 13 and the interference object are relative concepts. The object to be measured 13 is determined based on the object currently being corrected, and for two or more luminous objects, they may interfere with each other, and therefore are also interference objects of each other. It should be understood that the interference object near the object to be measured 13 in the present application is not limited to being close to the object to be measured 13 or having no interval with the object to be measured 13. In fact, as long as the distance between the object to be measured 13 and the interference object is sufficient to make the interference object affect the brightness measurement value of the object to be measured 13, the two can be regarded as being close. The object to be measured 13 can be an independent light source such as a light-emitting chip, a light-emitting device, etc., and each independent light source can be detected separately as an object to be measured 13. The object to be measured 13 can also be a light-emitting area, and the light-emitting area can include more than one light source. For example, in some display devices that apply partition backlight control technology, the light-emitting chips may be grouped as 2 or more for backlight control, and the overall light brightness detection can be performed for each group of light-emitting chips. Exemplarily, the overall area where a group of 2*2 light-emitting chips are located is the object to be measured 13, and the overall brightness of the area is detected. Similarly, in the detection process, each interference object can be a single independent light source, or it can also include more than one light source, for example, the surrounding 2*2 partition control light-emitting chip groups are grouped as a whole area in a regional manner, and the whole area is used as an interference object.

[0064] It should be noted that the brightness measurement value is actually the result obtained by performing brightness detection on the object to be measured 13. Since the influence of the interfering object exists objectively physically, the result obtained by performing brightness detection on the object to be measured 13 does not directly exclude the influence of other interfering objects. Therefore, the brightness measurement value reflects the brightness of the object to be measured 13 under the influence of the interfering object. The method of obtaining the brightness measurement value can be arbitrary. For example, the luminous object to be measured 13 can be imaged by optical imaging, and the brightness measurement value of the object to be measured 13 can be obtained from the detection image obtained by imaging; the brightness measurement value can also be obtained by other sensing means, and there is no limitation to this.

[0065] In some embodiments, the brightness measurement value can be determined by acquiring the corresponding detection image. Figure 2 As shown, obtaining the brightness measurement value of the luminous object to be measured 13 includes:

[0066] S201, obtaining a detection image containing an object to be detected;

[0067] S202, determining a brightness measurement value according to the pixel grayscale corresponding to the object to be measured in the detection image;

[0068] The detection image can be a grayscale image, in which the pixel grayscale reflects the brightness of the corresponding area. In some detection processes, color images can also be collected for detection. Each pixel of a color image has three components, RGB. The color image can be converted into a grayscale image through a mapping function, and then the brightness can be judged based on the grayscale. The color detection image can not only realize brightness detection, but also meet other detection needs such as chromaticity.

[0069] The detection image may only include the object to be measured 13, or may include an interfering object. After obtaining the detection image corresponding to the object to be measured 13, the object to be measured 13 is identified and located. In some implementation processes, the object to be measured 13 is presented as a light spot 10 in the detection image, and the light spot 10 is the brightness information obtained for the object to be measured 13. When the detection image includes multiple light spots 10, the coordinates of each light spot 10 can be determined based on the positioning position when the detection image is collected and the position of the light spot 10 in the detection image. Based on the pixel grayscale of the light spot 10 corresponding to the object to be measured 13, the brightness measurement value can be determined. The brightness measurement value can be directly expressed as a grayscale value or converted into other forms, which is not limited by this embodiment.

[0070] It is understandable that when acquiring the detection image, the object to be detected 13 and its corresponding interference object are in a lighted state. Figure 3 In some embodiments, obtaining a detection image including the object to be detected 13 includes:

[0071] S301, lighting up a region including at least the object to be measured and the interference object;

[0072] S302, performing optical imaging on the illuminated area to obtain a detection image;

[0073] Exemplarily, all the light-emitting areas of the entire light-emitting device can be fully illuminated, or the local area where the object to be tested 13 and the interfering object are located can be illuminated. Optical imaging of the illuminated areas includes but is not limited to complete imaging of all illuminated areas, or imaging of a part of the local area containing the object to be tested.

[0074] In some embodiments, see Figure 4 In order to facilitate the identification and positioning of the object to be measured 13 and the interfering object, before obtaining the brightness measurement value of the object to be measured 13 and the brightness value of the interfering object, it also includes:

[0075] S401, simulating and locating the setting position of the light source device from the detection image according to the preset position information;

[0076] S402, determining the object to be detected and its corresponding interference object from the detection image according to the result of the simulation positioning;

[0077] The preset position information includes but is not limited to the number of rows and columns, intervals, etc. of the light source devices. For example, the light-emitting chips in the display backplane are regularly arranged with predetermined intervals and arrangements. Therefore, based on the existing information in the detection image, the positions of the various light source devices can be simulated and located according to the preset position information. Exemplarily, the reference position of the simulated positioning can be determined according to the positions of the various light-emitting objects contained in the detection image. Based on the position distribution of the light-emitting objects already in the detection image, combined with the preset position information, even if there is one or some light source devices that do not emit light, their positions can be located. After determining the object 13 to be measured, based on the results of the simulated positioning, the surrounding interfering objects can be accurately determined. For example, it can be identified whether the object 13 to be measured is at a corner, and whether there are dark spots around it.

[0078] In order to more accurately determine the brightness measurement value, in some embodiments, the brightness peak position of the luminous area is found, and the brightness is measured with the brightness peak position as the center, which can more accurately reflect the brightness of the object 13 to be measured. Figure 5 As shown, determining the brightness measurement value according to the pixel grayscale of the pixel 11 corresponding to the object to be measured 13 in the detection image includes:

[0079] S501, determining the brightness peak position of the object to be detected in the detection image;

[0080] S502, taking the grayscale of pixels within a predetermined range around the brightness peak position as a brightness measurement value;

[0081] See also Figure 6 In the example of , after determining the light spot 10 corresponding to the object to be measured 13 in the detection image, find the brightest point A in the light spot 10, take the pixels 11 (pixels of the detection image) within a predetermined radius centered on the brightest point A, and extract the pixel grayscale of these pixels 11 as the brightness measurement value. The brightness measurement value can be determined based on the average value of the grayscale of these pixels. In some examples, other calculation rules such as the median of the grayscale of these pixels can also be selected. In practical applications, the range of selected pixels 11 can also be other shapes such as a square, and the size of the selected range can also be adjusted according to actual conditions. The size of the pixel 11 range (such as the radius) can be in units of distance. For the pixels 11 at the distance boundary, it can be selected whether to include them in the selection range according to actual conditions. For example, if more than half of the pixels 11 are within the radius range, it can be regarded that the pixel 11 is within the selection range, and the grayscale calculation of the pixel 11 is included in the calculation of the brightness measurement value. The size of the pixel 11 range can also be in units of the number of pixels 11, for example, a square area with the brightest point A as the center and the distance between the brightest point A and the four sides is 2 pixels 11, that is, a 5*5 square area. The selection of the range of the pixel 11 in this example can be set according to actual needs.

[0082] Compared with the brightness measurement value of the object to be measured 13, the brightness value of the interference object can be obtained in a more flexible manner. In some embodiments, the method for obtaining the brightness value of the interference object includes obtaining the brightness measurement value of the interference object as the brightness value of the interference object. In other words, the brightness value of the interference object can be obtained by measurement, and the measurement method includes but is not limited to imaging the luminous interference object by optical imaging, and obtaining the brightness measurement value of the interference object from the detection image obtained by imaging; it can also be obtained by other sensing means, and there is no limitation to this.

[0083] In some embodiments, the interference object and the object to be measured 13 use the same detection method, thereby simplifying the entire process of obtaining the luminous brightness. For example, the interference object and the object to be measured 13 can be imaged by optical imaging, and a single detection image can cover multiple luminous objects, so the brightness value of each luminous object can be measured at one time, thereby obtaining the brightness measurement value of the object to be measured 13 and the brightness measurement value of the corresponding interference object.

[0084] However, it should be noted that the brightness value of the interfering object may not be directly measured. For example, in some implementations, it is feasible to use an estimated value or a result after further correction of the brightness measurement value.

[0085] It is understandable that in some implementations, the interfering object may also be affected by the object to be measured 13 or other luminous objects, so the measurement results of the brightness of these interfering objects are not completely accurate; but the actual impact of the interfering object on the brightness at the object to be measured 13 actually depends mainly on the actual brightness emitted by the interfering object. Therefore, if the brightness value of the interfering object obtained can be as close as possible to its actual luminous brightness, the correction of the object to be measured 13 will be more accurate.

[0086] In some embodiments, obtaining the brightness value of the interference object includes: obtaining the actual luminous brightness of the interference object as its brightness value. The actual luminous brightness of the interference object is obtained by correcting its brightness measurement value. The brightness measurement value of the interference object is the result obtained by measuring the brightness of the corresponding interference object, which is similar to the brightness measurement value of the object to be measured 13, and objectively does not exclude the influence of other interferences. After correcting the brightness measurement value of the interference object, the actual luminous brightness that more accurately reflects the true brightness of the interference object is obtained as its brightness value, which can improve the accuracy of the data, thereby ensuring that the actual luminous brightness of the object to be measured 13 is determined more accurately. As an example, the actual luminous brightness of the interference object can be corrected in the same way as the object to be measured 13, that is, the interference object can also be used as the object to be measured 13 to obtain a more accurate luminous brightness.

[0087] In this embodiment, the influence factor of the interference object on the brightness of the object to be measured 13 includes factors that can affect the degree of influence of the interference object on the brightness of the object to be measured 13. The higher the degree of influence of the interference object, the greater the deviation of the brightness measurement value of the object to be measured 13 from its true brightness caused by the interference object at the same brightness. Exemplarily, the degree of influence can be represented by an influence coefficient and the like, and the influence coefficient can be in the form of a percentage value and the like. In practical applications, the influence factor of the interference object includes but is not limited to at least one of its luminous light type (indicating the light intensity value at different luminous angles), luminous angle, distance from the object to be measured 13 (such as pixel spacing), orientation relationship with the object to be measured 13, and luminous intensity. Generally speaking, the weaker the light intensity at a large angle of the luminous light pattern, the smaller the impact; the smaller the luminous angle, the smaller the impact; the farther the distance between the interfering object and the object to be measured 13, the smaller the impact; the smaller the luminous intensity of the interfering object, the smaller the impact; and the azimuth relationship between the interfering object and the object to be measured 13 is related to the corresponding luminous light pattern, and the corresponding luminous light pattern curve may be different when the interfering object is at different positions of the object to be measured 13. The actual impact of the interfering object on the object to be measured 13 is determined by a combination of factors including but not limited to the above-mentioned factors, but in some examples of this embodiment, only one or part of them may be considered. See. Figure 7As shown in the figure, a luminous light curve is shown. The numbers on the periphery represent the luminous angle, and the distance from the center of the curve represents the luminous intensity. Figure 7 The divergence angle of the luminous light pattern shown is approximately 30°. Figure 8 Another luminous light curve is shown, compared with Figure 7 The light pattern is more divergent, and it also has good luminous intensity near the 60° luminous angle. Fig. 9 The diagram shows the light emission when the light emission angle of the Micro LED chip 16 is 60°. When the light emission angle is larger, the light is more dispersed to the surroundings. On the contrary, when the light emission angle is smaller, the light is more concentrated above the Micro LED chip 16. Therefore, compared with Figure 7 The light type in Figure 8 The light intensity of the illustrated light type is greater at a larger angle, and the interference to the surrounding is relatively greater. In some examples, the light-emitting objects such as the light-emitting chips on the display panel 15 are arranged regularly, and the positions and spacings of other light-emitting chips around each light-emitting chip are fixed. The influence coefficient of a single light-emitting chip on the surrounding light-emitting chips can be pre-set according to the above factors. In some examples, a corresponding function can also be set, and at least one of the above factors is measured based on the actual measurement situation and converted into a function variable, and the influence coefficient is substituted into the function to calculate.

[0088] In some embodiments, Fig.10 According to the brightness value and influencing factor of the interfering object, the brightness measurement value is corrected to determine the actual luminous brightness of the object to be measured 13, including:

[0089] S601, determining the influence coefficient according to the corresponding relationship between the preset influence factor and the influence coefficient;

[0090] S602, subtracting the brightness influence value of the interfering object from the brightness measurement value of the object to be measured to determine the actual luminous brightness of the object to be measured;

[0091] The brightness impact value of the interfering object is the product of the impact coefficient and the brightness value of the interfering object. The corresponding relationship between the preset impact factor and the impact coefficient can include at least one of the following methods:

[0092] Method 1: Obtain a preset influence coefficient set and a correspondence between elements in the influence coefficient set and influence factors, and determine the influence coefficient from the influence coefficient set according to the correspondence.

[0093] For example, a plurality of influence coefficients are preset in the influence coefficient set, and there is a mapping relationship between the influence coefficients and the specific parameters of at least one influence factor. For example, according to the luminous intensity of the influence factor, the influence coefficient corresponding to the luminous intensity is determined from the influence coefficient set. In practical applications, the correspondence between the influence factor and the influence coefficient set may include more than one influence factor, and the influence coefficients preset in the influence coefficient set may be set based on actual conditions.

[0094] Method 2: Obtain a fitting function of the impact factor and the impact coefficient, and determine the impact coefficient based on the impact factor and the fitting function.

[0095] For example, the fitting function can be pre-set according to the actual situation. Before correcting the luminous brightness, the specific parameters of the determined influencing factors are obtained and input into the fitting function to calculate the final influencing coefficient.

[0096] It is understandable that, in some examples, for other factors that are not determined as influencing factors, their influence on the object to be measured 13 may be reflected to a certain extent in the form of constants in the fitting function.

[0097] As an implementation method, the influencing factors of the object to be measured 13 and the interfering object include but are not limited to the positional relationship and distance between the two. In some application scenarios such as the display panel 15, the arrangement pattern between the light-emitting chips is fixed. When each light-emitting chip is used as the object to be measured 13, the positional relationship of other light-emitting chips as its interference objects always has a fixed pattern. Therefore, the corresponding set of influence coefficients can be directly preset according to the fixed pattern. It is only necessary to determine the position of the interfering object in the object to be measured 13, and then directly adopt the corresponding set of influence coefficients. In this example, the influence of other factors that may affect the object to be measured, such as the light type and light intensity of the interfering object, can be reflected in the preset influence coefficient. For example, the influence coefficient in the influence coefficient set is determined based on the theoretical light type and light intensity of the light-emitting chip used by the display panel 15, without measuring and calculating these factors separately in the process of light brightness correction. As a specific example of the above implementation method, see. Fig.11As shown, for ease of explanation, this example takes the luminous objects arranged in an array as an example, and takes the 9 luminous objects of 3*3 as a minimum unit for this calibration. The luminous object at the center is the object to be measured 13 to be calibrated, and the 8 luminous objects around it are the corresponding interference objects. In a regular array arrangement, 8 interference objects distributed in this way can be found around each calibrated object to be measured 13 (except for the luminous objects at the boundary of the array). Therefore, the influence coefficient set only needs to set 8 fixed influence coefficients, which can be applied to the calibration process of any luminous object in the array. In this example, in order to further simplify the brightness correction process, the same influence coefficient can be set for multiple interference objects with the same or similar distance to the object to be measured 13, so as to simplify the setting process of the influence coefficient. For example Fig.11 As shown, in the case of array arrangement, the distance between the interference object 141 adjacent to the side of the object 13 to be measured (i.e., adjacent to one of the four sides of the object 13 to be measured) and the object 13 to be measured is the same or the difference is small, and the distance between the interference object 142 adjacent to the corner of the object 13 to be measured (i.e., adjacent to one of the four corners of the object 13 to be measured) and the object 13 to be measured is also the same or the difference is small. Therefore, in this example, the influence coefficient set can also be set to only two influence coefficients, that is, the influence coefficient of the interference object 141 adjacent to the side of the object 13 to be measured is set to the same a% (a is a number not less than 0 and not greater than 100), and the influence coefficient of the interference object 142 adjacent to the corner of the object 13 to be measured is set to the same b% (b is a number not less than 0 and not greater than 100, and b in this example is less than a). Therefore, in this example, it is only necessary to identify whether the interfering object is close to the four sides or four corners of the object to be measured 13 to determine its corresponding influence coefficient. The orientation relationship between the luminous objects can be easily determined through their corresponding row and column coordinates or directly based on the image.

[0098] As an implementation method, the influencing factors may be used as variables, and these variables are substituted into a predetermined fitting function to calculate the influencing coefficients.

[0099] For example, the parameters of the influencing factors such as the luminous light type of the interfering object, the distance between the interfering object and the object to be measured 13, the azimuth relationship between the interfering object and the object to be measured 13, the luminous angle of the interfering object, and the luminous intensity of the interfering object are measured. The specific parameters of these influencing factors can be measured through the image to be measured or can also be measured in other ways. The specific parameters of these influencing factors are input as variables into the fitting function to calculate the final influence coefficient.

[0100] As an example of the above-mentioned implementation, since the distance between the interfering object and the object to be measured is negatively correlated with the degree of influence of the brightness and is easy to measure directly, the influence coefficient can be determined based on the distance. For some luminous objects, the basic coefficients or constants in the fitting function can be pre-formed based on the influence of the luminous light type and the divergence angle, and the distance value can be used as the variable. When correcting the luminous brightness, the distance between the object to be measured 13 and the interfering object can be determined from the detection image, and the influence coefficient can be calculated by substituting the distance into the function. For ease of explanation, taking the influencing factor including the distance between the interfering object and the object to be measured 13 as an example, it is assumed that the degree of influence of the distance and the brightness is linearly related, then the distance of the interfering object 141 adjacent to the side of the object to be measured 13 is P1, and the distance of the interfering object 142 adjacent to the corner of the object to be measured 13 is 2 0.5 Therefore, in this example, the ratio of the influence coefficient of the interfering object 141 adjacent to the object to be measured 13 to the influence coefficient of the interfering object 142 adjacent to the corner is 2 0.5 : 1. Of course, in practical applications, the degree of influence of distance and brightness is usually not a linear relationship, and the fitting function needs to be determined based on the actual optical situation. This example can determine the influence coefficient based on the fitting function, and the specific parameters of the influencing factor can be substituted for calculation, which is more accurate and can meet more relatively complex application scenarios. Similarly, the influence of other influencing factors such as luminous light type and divergence angle may also be nonlinear. The fitting function is determined comprehensively based on the actual situation. When determining the influence coefficient, it is only necessary to substitute the influencing factors such as the luminous light type and divergence angle of the interfering object into the fitting function in the form of variables.

[0101] In order to better understand the luminous brightness correction method of the present application, the following is a further description of a specific process of detecting and correcting luminous brightness, see Fig.12 The process includes but is not limited to:

[0102] S701, imaging the lit display panel using optical imaging;

[0103] See also Fig.13 As shown, the luminous object to be detected in this example is the Micro LED chip 16 laid on the display panel 15, and the Micro LED chip 16 can be transferred to the display panel 15 by mass transfer or other methods. Since the Micro LED chip 16 is small in size and high in density, a large number of Micro LED chips 16 are transferred on the display panel 15. If a single chip is lit for detection, it will take a lot of time and cost, which is not realistic.

[0104] In this example, the display panel 15 can be lit as a whole, and the display panel 15 can be imaged using an optical imaging method, which greatly saves time and cost. A detection image covering all Micro LED chips 16 to be detected can be formed; for higher imaging accuracy, multiple detection images of Micro LED chips 16 in different areas of the display panel 15 can also be formed. When collecting multiple detection images, the collection position of each detection image is also recorded, so as to locate which part of the display panel 15 each detection image corresponds to. See Fig.14 As shown, a schematic diagram of imaging the Micro LED chip 16 on the display panel 15 by an optical imaging device 17 is illustrated. There is a crosstalk area 18 between adjacent Micro LED chips 16, and the crosstalk of adjacent Micro LED chips 16 will also cause the brightness detection to deviate from the actual value. It can be understood that in order to ensure the accuracy of the detection, each Micro LED chip 16 should be distinguished in the detection image, and the accuracy of the detection image can be higher than the setting density of the Micro LED chip 16, that is, a single Micro LED chip 16 independently occupies at least one pixel 11 in the detection image, avoiding that a single pixel 11 of the detection image simultaneously covers multiple Micro LED chips 16, so as to obtain a more accurate brightness measurement value of a single Micro LED chip 16.

[0105] S702, locating the number and position of rows and columns of Micro LED chips by means of simulation positioning;

[0106] After the detection image is acquired, the Micro LED chips 16 are simulated and positioned to determine the row and column coordinates of each Micro LED chip 16. In this process, if there are bad pixels or missing Micro LED chips 16, they can be easily found. The detection image acquired by optical imaging is not limited to the detection of luminous brightness, but can also be applied to other detection items at the same time.

[0107] The detection image can be a directly acquired image, or an image obtained by processing the acquired image. Fig.15 For example, in this example, the detection image may not directly present the physical image of the Micro LED chip 16 , and the detection image only illustrates the collected light spots 10 , and each light spot 10 actually corresponds to a Micro LED chip 16 . Fig.16 The result of simulated positioning is also illustrated, wherein the frame 19 is the position of the Micro LED chip 16 simulated and positioned according to the array arrangement of the Micro LED chip 16. If the light spot 10 is not collected in a certain part of the frame 19, the corresponding position can be considered as a dark spot area, for example Fig.16 In the example, there is no light spot 10 in the frame 19 simulated and positioned in the last column of the second row, so the area is a dark spot area.

[0108] S703, identifying the contour of the light spot, finding the brightness peak position, and extracting the pixel grayscale within a predetermined radius with the brightness peak position as the center of the circle;

[0109] Identify the outline of each light spot 10 in the detection image, and then find the brightness peak position of each light spot 10. With the brightness peak position as the center, extract the pixel grayscale of the pixels 11 within a predetermined radius, and determine the brightness value corresponding to the luminous object based on the pixel grayscale of these pixels 11. In this example, all Micro LED chips 16 are subjected to brightness detection, so the obtained brightness values ​​are respectively used as the brightness measurement values ​​of the corresponding Micro LED chips 16. The brightness peak position can be one or more pixel points. If there are multiple pixel points, the pixel point at the geometric center of these pixel points can be used as the starting point.

[0110] Based on the above processing, the brightness of all Micro LED chips 16 has been measured, and the brightness measurement value of each Micro LED chip 16 can be corrected based on the measured brightness value. First, a Micro LED chip 161 is determined as the object to be measured, and its brightness measurement value has been obtained, and the interference objects around it are analyzed. Fig.13 As shown, in this example, only other Micro LED chips 16 adjacent to the Micro LED chip 161 to be tested are used as interference objects, and the Micro LED chips 16 to be considered are a 3*3 array (for example Fig.13 In other examples, the Micro LED chip 16 adjacent to the Micro LED chip 161 to be tested may also include a Micro LED chip 16 that is farther away. For example, the center of the 5*5 array is selected as the Micro LED chip 161 to be tested, and other Micro LED chips 16 in the 5*5 array are interference objects.

[0111] S704, calculating the deviation value of brightness detection caused by crosstalk for the eight Micro LED chips in the four-side neighborhood and the four-corner neighborhood, the influence coefficients of the four Micro LED chips in the four-side neighborhood are the same, which is a%, and the influence coefficients of the four Micro LED chips 16 in the four-corner neighborhood are the same, which is b%.

[0112] The four side neighborhoods of the Micro LED chip 161 to be tested have four side neighboring Micro LED chips 16, and the four corner neighborhoods also have four corner neighboring Micro LED chips 16. The deviation value of the brightness detection caused by the optical crosstalk of the eight Micro LED chips 16 in the four side neighborhoods and the four corner neighborhoods is calculated for the Micro LED chip 161 to be tested at the center. Based on the actual optical conditions of these Micro LED chips 16, the technicians determined that the influence coefficients of the four side neighboring Micro LED chips 16 are a%, and the influence coefficients of the four corner neighboring Micro LED chips 16 are b%.

[0113] S705, determining the brightness measurement value of the object to be measured and the brightness measurement value of the Micro LED chip in each neighboring area;

[0114] Assume that the brightness measurement value of the Micro LED chip 161 as the object to be measured is B, and the brightness measurement value of each interfering object is taken as the brightness value. The brightness value of the Micro LED chip 16 in the upper neighboring area is B. 上 , the brightness measurement value of the lower neighboring MicroLED chip 16 is B 下 , then the brightness values ​​of each Micro LED chip 16 as the interference object are B 上 , B 下 , B 左 , B 右 , B 左上 , B 左下 , B 右上 and B 右下 .

[0115] S706, correcting the brightness measurement value of the object to be measured;

[0116] The actual luminous brightness B1 of the Micro LED chip 161 to be tested is calibrated for the first time = B-(B 上 +B 下 +B 左 +B 右 )*a%-(B 左上 +B 左下 +B 右上 +B 右下)b%. In the above manner, by calculating each Micro LED chip 16 in turn, the detection brightness of all Micro LED chips 16 can be corrected to obtain a more accurate actual luminous brightness. It can be understood that, for the Micro LED chip 161 to be detected, which is located at the edge of the row or column, or there is a chip missing inside, at least part of the 8 Micro LED chips 16 as interference objects in the above position relationship are missing. For the case where other Micro LED chips 16 are missing around the Micro LED chip 161 to be detected, the method of this example is still applicable, and the position of the missing Micro LED chip 16 can be directly ignored, or it can be regarded as a virtual Micro LED chip 16 with a brightness value of 0. Exemplarily, the simulated positioning can facilitate the determination of the interference object and its brightness value. It can also be determined by the result of the simulated positioning whether the Micro LED chip 161 to be detected is at the boundary of the array, or whether there is a dark spot area around it, and it can be assumed that there is an interference object with a brightness value of 0 in the area outside the array boundary or in the dark spot area.

[0117] As mentioned above, in the first calibration process, the brightness measurement values ​​of all Micro LED chips 16 can be corrected in turn to obtain the actual luminous brightness B1. In this process, only one imaging is required, and there is no need for separate brightness or forming a physical light isolation structure, so the detection efficiency is high. However, it is understandable that the B used in the first calibration 上 , B 下 , B 左 , B 右 , B 左上 , B 左下 , B 右上 and B 右下 The brightness values ​​are also not accurate, and these brightness values ​​are also measured under the crosstalk of other Micro LED chips 16. However, in this example, after one calibration, the actual luminous brightness that is more accurate than the initial brightness measurement value has been determined for each Micro LED chip 16. If the brightness measurement is calibrated again based on the actual luminous brightness, the accuracy of the detection can be further improved.

[0118] For example, in the detection image, the brightness measurement value corresponding to the Micro LED chip 161 as the object to be detected is B, but now more accurate brightness values ​​of other Micro LED chips 16 have been obtained, that is, the actual luminous brightness of these Micro LED chips 16 as interference objects, assuming that they are B and 1上 , B 1下 , B 1左 , B1右 , B 1左上 , B 1左下 , B 1右上 and B 1右下 .

[0119] Then, the actual luminous brightness that can be obtained by the second correction is B2=B-(B 1上 +B1 下 +B 1左 +B 1右 )*a%-(B 1左上 +B 1左下 +B 1右上 +B 1右下 )b%. Repeating this process, the actual luminous brightness obtained from each calibration can be used as a more accurate brightness value to be applied to the next calibration. The actual luminous brightness B obtained from the nth calibration can be n =B-(B n-1上 +B n-1下 +B n-1左 +B n-1右 )*a%-(B n-1左上 +B n-1左下 +B n-1右上 +B n-1右下 )b%. Among them, B2 and B n respectively represent the actual luminous brightness of the object 13 obtained by the second calibration and the actual luminous brightness obtained by the nth calibration; B 1上 and B n-1 The above are respectively the actual luminous brightness obtained by the 1st and n-1th calibrations when the Micro LED chip 16 in the upper neighboring area is used as the object to be measured 13, and the other variables are similar.

[0120] S707, repeat the calibration at least once to obtain a more accurate actual luminous brightness;

[0121] It is understandable that repeating the above-mentioned actions multiple times can obtain more accurate results, and the more times the repetitions are, the higher the accuracy.

[0122] As another example, the actual luminous brightness B2 obtained by the second correction can be calculated as follows: B2 = B n-1 -(B 1上 +B 1下 +B 1左 +B 1右 )*a%-(B 1左上 +B 1左下 +B 1右上 +B 1右下 )b%. Similarly, the actual luminous brightness B obtained by the nth correction is n The calculation can be done by: B n =Bn-1 -(B n-1上 +B n-1下 +B n-1左 +B n-1右 )*a%-(B n-1左上 +B n-1左下 +B n-1右上 +B n-1右下 )b%. That is to say, in the subsequent repeated calibration process, the actual luminous brightness obtained in the previous calibration can be directly used as the initial value, and then the crosstalk of other interfering objects is subtracted on this basis. In some implementation processes, a more accurate actual luminous brightness of the object to be measured 13 can also be obtained.

[0123] In the above examples, considering the timeliness and accuracy requirements, one or two repetitions can be selected, which can significantly improve the accuracy within a limited number of corrections and is cost-effective.

[0124] The luminous brightness correction method of this embodiment obtains the brightness value of the interfering object to correct the brightness measurement value of the object to be measured 13, so as to remove the crosstalk effect of the interfering object from the brightness measurement value, and in some implementation processes, a more accurate actual luminous brightness of the object to be measured 13 can be obtained.

[0125] Another optional embodiment of the present application:

[0126] This embodiment provides a light luminance correction device. Fig.17 As shown, it includes a processor 1701, a memory 1702 and a communication bus 1703;

[0127] The communication bus 1703 is used to realize the connection and communication between the processor 1701 and the memory 1702;

[0128] The processor 1701 is used to execute one or more programs stored in the memory 1702 to implement at least one of the following steps:

[0129] Obtaining a brightness measurement value of the object to be measured 13 and a brightness value of an interfering object; wherein the interfering object is disposed adjacent to the object to be measured 13;

[0130] Determine the influence factor of the interfering object on the brightness of the object to be measured 13;

[0131] According to the brightness value of the interfering object and the influencing factor, the brightness measurement value is corrected to determine the actual luminous brightness of the object to be measured 13 .

[0132] When the processor 1701 of the luminous brightness correction device of this embodiment executes one or more programs stored in the memory 1702 to implement the above steps, the specific control method can refer to the examples of the above embodiments and will not be described in detail here.

[0133] The present embodiment also provides a computer-readable storage medium, which includes volatile or non-volatile, removable or non-removable media implemented in any method or technology for storing information (such as computer-readable instructions, data structures, computer program modules or other data). Computer-readable storage media include, but are not limited to, RAM (Random Access Memory), ROM (Read-Only Memory), EEPROM (Electrically Erasable Programmable read only memory), flash memory or other memory technology, CD-ROM (Compact Disc Read-Only Memory), digital versatile disk (DVD) or other optical disk storage, magnetic cassettes, magnetic tapes, magnetic disk storage or other magnetic storage devices, or any other medium that can be used to store desired information and can be accessed by a computer.

[0134] The computer-readable storage medium in this embodiment can be used to store one or more computer programs, and the one or more computer programs stored therein can be executed by a processor to implement at least one step of the above-mentioned luminous brightness correction method.

[0135] In addition, it is well known to those skilled in the art that communication media generally contain computer readable instructions, data structures, computer program modules or other data in modulated data signals such as carrier waves or other transmission mechanisms, and may include any information delivery media. Therefore, the present application is not limited to any specific hardware and software combination.

[0136] It should be understood that the application of the present application is not limited to the above examples. For ordinary technicians in this field, improvements or changes can be made based on the above description. All these improvements and changes should fall within the scope of protection of the claims attached to this application.

Claims

1. A method for luminous brightness correction, characterized in that: include: Obtaining a brightness measurement value of the object to be measured and a brightness value of an interfering object; wherein the interfering object is disposed adjacent to the object to be measured; Determining the influence factor of the interfering object on the brightness of the object to be measured; and According to the brightness value of the interfering object and the influencing factor, the brightness measurement value is corrected to determine the actual luminous brightness of the object to be measured.

2. The method for calibrating luminous brightness according to claim 1, wherein: The step of obtaining the brightness measurement value of the object to be measured comprises: Acquire a detection image containing the object to be detected; The brightness measurement value is determined according to the grayscale of a pixel corresponding to the object to be detected in the detection image.

3. The luminous brightness correction method according to claim 2, characterized in that: Before obtaining the brightness measurement value of the object to be measured and the brightness value of the interfering object, the method further includes: Simulating and locating the setting position of the light source device from the detection image according to the preset position information; The object to be detected and the corresponding interference object are determined from the detection image according to the result of the simulated positioning.

4. The luminous brightness correction method according to claim 2, characterized in that: The acquiring of the detection image containing the object to be detected comprises: Lighting up an area at least including the object to be detected and the interfering object; Optical imaging is performed on the illuminated area to obtain the detection image.

5. The luminous brightness correction method according to claim 2, characterized in that: Determining the brightness measurement value according to the pixel grayscale corresponding to the object to be detected in the detection image comprises: Determine the brightness peak position of the object to be detected in the detection image; The pixel grayscale within a predetermined range around the brightness peak position is used as the brightness measurement value.

6. The method for calibrating light luminance according to claim 1, wherein: Obtaining the brightness value of the interfering object includes: The actual luminous brightness of the interfering object is obtained as the brightness value of the interfering object.

7. The method for calibrating luminous brightness according to claim 1, wherein: The correcting the brightness measurement value according to the brightness value of the interfering object and the influencing factor to determine the actual luminous brightness of the object to be measured comprises: Determine the influence coefficient according to the preset corresponding relationship between the influence factor and the influence coefficient; The actual luminous brightness of the object to be measured is determined by subtracting the brightness influence value of the interfering object from the brightness measurement value of the object to be measured, wherein the brightness influence value of the interfering object is the product of the influence coefficient and the brightness value of the interfering object.

8. The method for calibrating light luminance according to claim 7, wherein: Determining the influence coefficient according to the preset correspondence between the influence factor and the influence coefficient includes any of the following methods: Method 1: obtaining a preset influence coefficient set and a correspondence between elements in the influence coefficient set and the influence factor, and determining the influence coefficient from the influence coefficient set according to the correspondence; Method 2: Obtain a fitting function of the influencing factor and the influencing coefficient, and determine the influencing coefficient according to the influencing factor and the fitting function.

9. The luminous brightness correction method according to any one of claims 1 to 8, characterized in that: The influencing factors include at least one of the following: The luminous light pattern of the interfering object; The distance between the interfering object and the object to be measured; The positional relationship between the interfering object and the object to be measured; The luminous angle of the interfering object; The luminous intensity of the interfering object.

10. A luminous brightness correction device, characterized in that: including a processor, a memory and a communication bus; The communication bus is used to realize the connection and communication between the processor and the memory; The processor is used to execute one or more programs stored in the memory to implement the steps of the luminous brightness correction method as described in any one of claims 1-9.

11. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores one or more programs, and the one or more programs can be executed by one or more processors to implement the steps of the luminous brightness correction method as described in any one of claims 1-9.

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