Pressure instrument performance testing device and testing method

Abstract

The present invention discloses a pressure instrument performance testing device and testing method. The testing device includes a pressure pipeline, a standard pressure source, a constant temperature device, a gas buffer, a pressure generator, a high-temperature box, a high-temperature chamber, a pressure sensor, a pressure transmitter, and a data acquisition module. The pressure pipeline includes a first pipe section and a second pipe section. The first end of the first pipe section is connected to the standard pressure source, and the second end of the first pipe section is connected to the gas buffer after passing through the constant temperature device. The high-temperature chamber is disposed in the high-temperature box, with a closed isolation chamber between the high-temperature box and the high-temperature chamber. The first end of the second pipe section is connected to the gas buffer, and the second end of the second pipe section is connected to the high-temperature chamber. The pressure generator is connected to the gas buffer. The pressure sensor is disposed on the high-temperature chamber. The pressure transmitter is disposed in the isolation chamber and connected to the pressure sensor. The data acquisition module is used to collect data. The present invention achieves the technical effect of testing the metrological performance of a pressure instrument under high-temperature working conditions.

Description

Technical Field

[0001] The present invention relates to the field of sensor detection technology, and in particular to a pressure instrument performance testing device and testing method. Background Art

[0002] Pressure testing is essentially the physical concept of pressure measurement, which refers to the force acting vertically on a unit area. Pressure is a critical parameter in industrial production, and accurate pressure testing is essential for safety in critical scenarios. Pressure instruments are widely used in aerospace, petroleum, petrochemical, automotive, and other fields, often operating in harsh environments, particularly high temperatures. For example, in the aerospace sector, where pressure instruments are used to monitor operating status and assess health, combustion chamber outlet temperatures can reach 500°C and lubricating oil system temperatures can reach 200°C; in the oil extraction industry, temperatures can reach 200°C; in thermal and nuclear power plants, temperatures can reach 600°C; in the chemical industry, saturated steam temperatures can reach 250°C; and in medical and food sterilization, temperatures can reach 150°C.

[0003] Typically, under high-temperature conditions, the force sensor and pressure transmitter are separated into two parts, connected by wires. These components are collectively referred to as pressure instruments. As a pressure-sensitive element, the pressure sensor's pressure-sensing surface is in direct contact with the high-temperature medium, converting the physical quantity of pressure into an electrical signal. The pressure transmitter processes the electrical signal and converts it into a standard analog signal commonly used in industry, such as (4-20) mA, 0-5 V, or a digital signal, for local display or remote transmission. For example, to measure the pressure inside a high-temperature pressure vessel, the typical measurement method is to connect the pressure sensor to the pressure vessel via threads or a pressure-inducing tube. The pressure sensor's pressure-sensing surface is in direct contact with the high-temperature medium inside the pressure vessel, reaching temperatures as high as 500°C. The pressure sensor and transmitter are located in a relatively low-temperature operating environment.

[0004] The pressure sensor contains a sensitive element that converts the pressure value into a raw electrical signal and transmits it to the pressure transmitter. The pressure transmitter processes the electrical signal through a method, filtering, and other methods before converting it into a standard signal commonly used in industry, such as (4-20) mA and 0-5 V. The final measurement result is output as a standard signal by the pressure transmitter.

[0005] Because the set value plays a crucial role in the output of pressure instruments, metrological calibration is a crucial tool for ensuring accurate measurement of pressure sensors and transmitters. Currently, there are no officially published national standards, regulations, or methods for evaluating the metrological performance of pressure instruments under high-temperature operating conditions, either domestically or internationally. A common problem with testing pressure instruments used in high-temperature conditions is the "normal temperature testing, high-temperature use" problem. Due to the lack of performance evaluation methods for pressure instruments under operating conditions, the performance of pressure instruments cannot be evaluated when operating conditions exceed the scope of existing technical regulations. Summary of the Invention

[0006] The main purpose of the present invention is to provide a pressure instrument performance testing device to solve the problem in the related art that there is a lack of a pressure instrument performance evaluation method under working conditions and the measurement performance of the pressure instrument cannot be evaluated under high temperature conditions.

[0007] In order to achieve the above-mentioned object, the present invention provides a pressure instrument performance testing device, comprising: a pressure pipeline, a standard pressure source, a constant temperature device, a gas buffer, a pressure generator, a high temperature box, a high temperature chamber, a pressure sensor, a pressure transmitter and a data acquisition module;

[0008] The pressure pipeline includes a first pipe section and a second pipe section, the first end of the first pipe section is connected to the standard pressure source, and the second end of the first pipe section is connected to the gas buffer after passing through the constant temperature device;

[0009] The high temperature chamber is arranged in the high temperature box, the temperature in the high temperature chamber is adjustable, and a closed isolation chamber is provided between the high temperature box and the high temperature chamber, the temperature in the isolation chamber is adjustable;

[0010] A first end of the second pipe segment is connected to the gas buffer, and a second end of the second pipe segment is connected to the high-temperature chamber;

[0011] The pressure generator is connected to the gas buffer;

[0012] The pressure sensor is provided on the high temperature chamber, and the pressure sensing surface of the pressure sensor is in contact with the medium in the high temperature chamber;

[0013] The pressure transmitter is arranged in the isolation cavity and connected to the pressure sensor;

[0014] The data acquisition module is used to acquire data from the standard pressure source, the pressure generator and the pressure transmitter.

[0015] Furthermore, it also includes a first temperature sensor, a second temperature sensor, a third temperature sensor, a fourth temperature sensor, a fifth temperature sensor and a sixth temperature sensor electrically connected to the data acquisition module;

[0016] The first temperature sensor is used to detect the temperature of a portion of the first pipe segment located between the standard pressure source and the constant temperature device;

[0017] The second temperature sensor is used to detect the temperature inside the constant temperature device;

[0018] The third temperature sensor is used to detect the temperature of a portion of the first pipe segment located between the constant temperature device and the gas buffer;

[0019] The fourth temperature sensor is used to detect the temperature of a portion of the second pipe segment located between the gas buffer and the high temperature box;

[0020] The fifth temperature sensor is used to detect the temperature in the isolation cavity;

[0021] The sixth temperature sensor is used to detect the temperature in the high-temperature chamber.

[0022] Furthermore, the first pipe section includes a bellows, and the bellows is located in the constant temperature device and is kept at a constant temperature by the constant temperature device.

[0023] Furthermore, the constant temperature equipment includes a constant temperature water tank, and the bellows section is located in the constant temperature water tank.

[0024] Furthermore, it also includes a control valve, which is arranged on the gas buffer, and the control valve is electrically connected to the data acquisition module, and the opening and closing of the control valve is controlled by the data acquisition module.

[0025] Furthermore, a first temperature control component is provided in the high temperature box, and the first temperature control component is used to control the temperature in the isolation cavity;

[0026] A second temperature control component is provided in the high temperature cavity, and the second temperature control component is used to control the temperature in the high temperature cavity.

[0027] According to another aspect of the present invention, a pressure instrument performance testing method is provided, which uses the above-mentioned pressure instrument performance testing device and includes the following steps:

[0028] S100, controlling the temperature in the high-temperature chamber to a first temperature value T6, and controlling the temperature in the isolation chamber to a second temperature value T5, wherein 200°C ≤ T6 ≤ 500°C, and 20°C ≤ T5 ≤ 90°C;

[0029] S200, setting a target pressure value, charging the gas medium to be measured into the gas buffer through the pressure generator, filling the first pipe segment and the second pipe segment with the gas medium to be measured, and turning off the pressure generator when the pressure values ​​in the first pipe segment and the second pipe segment approach the target pressure value;

[0030] S300, controlling the temperature of the gas medium to be measured passing through the constant temperature device at T2, 15° C. ≤ T2 ≤ 25° C. by the constant temperature device;

[0031] S400: Fine-tune the pressure values ​​in the first pipe segment and the second pipe segment by using the standard pressure source, so that the pressure values ​​obtained by the standard pressure source reach the target pressure value;

[0032] S500, obtaining a measured pressure value output by the pressure transmitter;

[0033] S600: Determine an error value between the measured pressure value and the target pressure value based on the target pressure value and the measured pressure value.

[0034] S700: Use the target pressure value, the first temperature value, and the second temperature value as unique variables of a test condition, respectively, to obtain an error value between the measured pressure value and the target pressure value under multiple test conditions.

[0035] Furthermore, it also includes:

[0036] S800: Determine whether the pressure sensor meets the measurement performance requirements based on the error value; if not,

[0037] S900, performing curve fitting based on the measured pressure value and the target pressure value, and determining a correction method based on the curve fitting result;

[0038] S1000. Correct the pressure transmitter based on the correction method so that the pressure value error output by the pressure transmitter meets the measurement performance requirement.

[0039] Furthermore, it also includes:

[0040] S1100 , execute S100 - S800 using the modified pressure transmitter. If yes, end the performance test.

[0041] Furthermore, before executing step S400, the method further includes:

[0042] Acquire detection temperature values ​​detected by the first temperature sensor, the second temperature sensor, the third temperature sensor, the fourth temperature sensor, the fifth temperature sensor, and the sixth temperature sensor;

[0043] Determine whether the temperature of each part of the test device meets the test requirements based on the detected temperature value, and if so, execute step S400;

[0044] If not, the test device is inspected and debugged.

[0045] In the embodiment of the present invention, a pressure pipeline, a standard pressure source, a constant temperature device, a gas buffer, a pressure generator, a high temperature box, a high temperature chamber, a pressure sensor, a pressure transmitter and a data acquisition module are provided; the pressure pipeline includes a first pipe section and a second pipe section, the first end of the first pipe section is connected to the standard pressure source, and the second end of the first pipe section is connected to the gas buffer after passing through the constant temperature device; the high temperature chamber is provided in the high temperature box, the temperature in the high temperature chamber is adjustable, and a closed isolation chamber is provided between the high temperature box and the high temperature chamber, and the temperature in the isolation chamber is adjustable; the first end of the second pipe section is connected to the gas buffer, and the second end of the second pipe section is connected to the high temperature chamber; the pressure generator is connected to the gas buffer; the pressure sensor is provided on the high temperature chamber, and the pressure sensing surface of the pressure sensor is in contact with the medium in the high temperature chamber; the pressure transmitter It is located in the isolation cavity and connected to the pressure sensor; the data acquisition module is used to collect data from the standard pressure source, pressure generator and pressure transmitter, so as to achieve the purpose of controlling the temperature of the high-temperature cavity and the high-temperature box during the detection process, establishing a high-temperature medium test condition for the pressure sensor and pressure transmitter, and at the same time controlling the temperature of the constant temperature equipment to establish a normal temperature medium test condition for the standard pressure source, thereby achieving the technical effect of being able to compare the pressure value detected by the standard pressure source with the pressure value output by the pressure transmitter under the high-temperature medium condition to evaluate the metering performance of the pressure instrument under high-temperature conditions, thereby solving the problem in the related technology that there is a lack of a performance evaluation method for pressure instruments under working conditions, and the metering performance of the pressure instrument cannot be evaluated under high-temperature conditions. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] The accompanying drawings, which constitute part of the present invention, are intended to provide a further understanding of the present invention and to make other features, objects, and advantages of the present invention more apparent. The accompanying drawings and descriptions of the exemplary embodiments of the present invention are intended to explain the present invention and do not constitute an undue limitation of the present invention. In the accompanying drawings:

[0047] Figure 1 is a schematic diagram of the layout of a testing device according to an embodiment of the present invention;

[0048] Among them, 1 is the first pipe section, 2 is the gas buffer, 3 is the pressure generator, 4 is the high temperature box, 5 is the isolation chamber, 6 is the pressure sensor, 7 is the pressure transmitter, 8 is the control valve, 9 is the constant temperature device, 10 is the standard pressure source, 11 is the data acquisition module, 12 is the first temperature sensor, 13 is the second temperature sensor, 14 is the third temperature sensor, 15 is the fourth temperature sensor, 16 is the second pipe section, 17 is the fifth temperature sensor, 18 is the sixth temperature sensor, and 19 is the high temperature chamber. DETAILED DESCRIPTION

[0049] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of the present invention.

[0050] It should be noted that the terms "first," "second," and the like in the specification and claims of the present invention and the accompanying drawings are used to distinguish similar objects and are not necessarily used to describe a particular order or sequence. It should be understood that the terms used in this manner are interchangeable where appropriate to facilitate the description of the embodiments of the present invention.

[0051] In the present invention, the terms "upper," "lower," "inner," and the like indicate positions or locations based on those shown in the accompanying drawings. These terms are primarily intended to better describe the present invention and its embodiments and are not intended to limit the devices, elements, or components indicated to having a specific orientation, or to being constructed or operated in a specific orientation.

[0052] Furthermore, some of the above terms may be used to express other meanings besides indicating a position or location. For example, the term "on" may also be used to indicate a dependency or connection in certain circumstances. Those skilled in the art will understand the specific meanings of these terms in the present invention based on the specific circumstances.

[0053] Furthermore, the terms "disposed," "provided with," "connected," and "fixed" should be interpreted broadly. For example, "connected" can mean a fixed connection, a removable connection, or an integral structure; it can be a mechanical connection or an electrical connection; it can be a direct connection, an indirect connection through an intermediary, or an internal communication between two devices, elements, or components. Those skilled in the art will understand the specific meanings of these terms in the present invention based on the specific circumstances.

[0054] Additionally, the term "plurality" shall mean two or more.

[0055] It should be noted that, in the absence of conflict, the embodiments and features of the embodiments of the present invention can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0056] To solve related technical problems, such as Figure 1As shown, an embodiment of the present invention provides a pressure instrument performance test device, comprising: a pressure pipeline, a standard pressure source 10, a constant temperature device 9, a gas buffer 2, a pressure generator 3, a high temperature box 4, a high temperature chamber 19, a pressure sensor 6, a pressure transmitter 7 and a data acquisition module 11;

[0057] The pressure pipeline includes a first pipe section 1 and a second pipe section 16. The first end of the first pipe section 1 is connected to the standard pressure source 10, and the second end of the first pipe section 1 is connected to the gas buffer 2 after passing through the constant temperature device 9.

[0058] The high temperature chamber 19 is provided in the high temperature box 4. The temperature in the high temperature chamber 19 is adjustable. A closed isolation chamber 5 is provided between the high temperature box 4 and the high temperature chamber 19. The temperature in the isolation chamber 5 is adjustable.

[0059] A first end of the second pipe section 16 is connected to the gas buffer 2 , and a second end of the second pipe section 16 is connected to the high-temperature chamber 19 ;

[0060] The pressure generator 3 is connected to the gas buffer 2;

[0061] The pressure sensor 6 is provided on the high temperature chamber 19, and the pressure sensing surface of the pressure sensor 6 is in contact with the medium in the high temperature chamber 19;

[0062] The pressure transmitter 7 is arranged in the isolation chamber 5 and connected to the pressure sensor 6;

[0063] The data acquisition module 11 is used to collect data from the standard pressure source 10 , the pressure generator 3 and the pressure transmitter 7 .

[0064] like Figure 1 As shown, in this embodiment, a standard pressure source 10, a first pipe section 1, a gas buffer 2, a second pipe section 16, and a high-temperature chamber 19 are connected in sequence. The high-temperature chamber 19 is disposed within a high-temperature box 4. A pressure generator 3 is connected to the gas buffer 2. The first pipe section 1 passes through a constant temperature device 9, and a pressure sensor 6 is connected to the high-temperature chamber 19. A sealed isolation chamber 5 is provided between the high-temperature box 4 and the high-temperature chamber 19, and a pressure transmitter 7 is disposed within the isolation chamber 5. In this embodiment, the constant temperature device 9, as an independently temperature-controlled device, is capable of controlling the temperature of the medium passing through the constant temperature device 9 at room temperature. The high-temperature chamber 19 and the high-temperature box 4 are both independently temperature-controlled. After being connected to the second pipe section 16, the high-temperature chamber 19 is capable of admitting a medium. High-temperature working conditions can be simulated through the high-temperature chamber 19, providing a high-temperature environment for the pressure-sensing surface of the pressure sensor 6.

[0065] In one embodiment, the temperature of high-temperature chamber 19 can be adjusted between 50°C and 500°C. High-temperature chamber 4 controls the temperature within isolation chamber 5, thereby simulating the actual operating environment of a pressure instrument. Except for the pressure-sensing surface of pressure sensor 6, which is exposed to the high-temperature conditions within high-temperature chamber 19, the remainder of pressure sensor 6 and pressure transmitter 7 are located within the simulated environment of high-temperature chamber 4 (i.e., within isolation chamber 5). In one embodiment, the temperature of isolation chamber 5 can be adjusted between room temperature and 85°C.

[0066] In this embodiment, the test device can be used to test the metering performance of the pressure sensor 6 and the pressure transmitter 7 under high-temperature conditions. Specifically, during the test, the high-temperature chamber 19, the high-temperature box 4, and the thermostat 9 are first controlled to set temperatures. For example, the temperature within the high-temperature chamber 19 is controlled at 300°C, the temperature within the thermostat 5 is controlled at 50°C, and the temperature within the thermostat 9 is controlled at 20°C. Then, a gaseous medium is introduced into the gas buffer 2 via the pressure generator 3. The gaseous medium enters the first pipe section 1 and the second pipe section 16 through the gas buffer 2. When the gas pressure within the pipe section approaches the set target pressure value, the pressure generator 3 is turned off, and the pressure within the pipe section is fine-tuned to the target pressure value, for example, 6 MPa, via the standard pressure source 10. At this point, the temperature of the medium within the high-temperature chamber 19 is approximately 300°C, the temperature of the medium passing through the thermostat 9 is approximately 20°C, and the ambient temperature of the pressure transmitter 7 is approximately 50°C. The pressure value output by the pressure transmitter 7 and the pressure value output by the standard pressure source 10 can be read by the data acquisition module 11. By comparing the two pressure values, the metering performance of the pressure sensor 6 and the pressure transmitter 7 under the current working conditions can be evaluated.

[0067] It will be appreciated that the specific numerical values ​​for the high-temperature chamber 19, the isolation chamber 5, the constant temperature device 9, and the target pressure values ​​described above are not intended to be limiting and may be set by those skilled in the art based on actual testing standards. Furthermore, during the testing process, the measurement performance of the pressure sensor 6 and the pressure transmitter 7 may be evaluated under various operating conditions by using any one or more of the temperature within the high-temperature chamber 19, the temperature within the isolation chamber 5, and the target pressure value as variables for testing.

[0068] The present invention achieves the purpose of being able to control the temperature of the high-temperature chamber 19 and the high-temperature box 4 during the detection process, establish a high-temperature medium test condition for the pressure sensor 6 and the pressure transmitter 7, and at the same time control the temperature of the constant temperature device 9 to establish a normal-temperature medium test condition for the standard pressure source 10, so as to compare the pressure value detected by the standard pressure source 10 with the pressure value output by the pressure transmitter 7 under the high-temperature medium condition to evaluate the metering performance of the pressure instrument under high-temperature conditions, thereby solving the problem in the related art that there is a lack of a pressure instrument performance evaluation method under working conditions, and the metering performance of the pressure instrument cannot be evaluated under high-temperature conditions.

[0069] In one embodiment, the constant temperature device 9 can be a constant temperature water tank. The first pipe section 1 passes through the constant temperature water tank, so that the portion of the first pipe section 1 located within the constant temperature water tank is maintained at a normal temperature, thereby ensuring that the gas medium contacted by the standard pressure source 10 is a normal temperature medium. Of course, the constant temperature device 9 can also be of other types, such as a constant temperature box, which maintains a constant temperature in a manner similar to air conditioning. The pressure generator 3 includes an air compressor, etc.

[0070] The purpose of providing the gas buffer 2 in this embodiment is to eliminate the influence of the gas volume expansion caused by temperature changes on the fluctuation of the detection results. Specifically, the volume of the entire pressure pipeline is increased by the provision of the gas buffer 2. When the gas medium in the high-temperature chamber 19 is affected by temperature and expands in volume, the gas buffer 2 with a larger volume can absorb the volume expansion of the gas to a certain extent, thereby reducing the influence of the gas expansion on the entire pressure pipeline, and further reducing the fluctuation of the pressure value detection. In addition, in this embodiment, the pressure generator 3 can quickly fill the gas buffer 2, which can significantly improve the experimental efficiency. Moreover, due to the presence of the gas buffer 2, the high-pressure gas output by the pressure generator 3 will not directly impact the pressure sensor 6, thereby reducing the influence on the pressure sensor 6.

[0071] In one embodiment, the data acquisition module 11 serves as a signal acquisition terminal and can be electrically connected to the standard pressure source 10, the pressure generator 3, and the pressure transmitter 7 in a wired or wireless manner to collect corresponding data. In another embodiment, the data acquisition module 11 can also serve as a control terminal, controlling the pressure transmitter 7 to supply gas to the gas buffer 2 and controlling the standard pressure source 10 to adjust the gas pressure in the pressure pipeline.

[0072] Since the present invention uses temperature control to simulate the metering performance of the pressure instrument at high temperature, it is important to detect the temperature of some areas in the test device. Figure 1As shown, the test device in this embodiment further includes a first temperature sensor 12, a second temperature sensor 13, a third temperature sensor 14, a fourth temperature sensor 15, a fifth temperature sensor 17 and a sixth temperature sensor 18 electrically connected to the data acquisition module 11;

[0073] The first temperature sensor 12 is used to detect the temperature of the portion of the first pipe section 1 between the standard pressure source 10 and the constant temperature device 9;

[0074] The second temperature sensor 13 is used to detect the temperature inside the constant temperature device 9;

[0075] The third temperature sensor 14 is used to detect the temperature of the portion of the first pipe section 1 between the constant temperature device 9 and the gas buffer 2;

[0076] The fourth temperature sensor 15 is used to detect the temperature of the portion of the second pipe section 16 located between the gas buffer 2 and the high temperature box 4;

[0077] The fifth temperature sensor 17 is used to detect the temperature inside the isolation cavity 5;

[0078] The sixth temperature sensor 18 is used to detect the temperature in the high-temperature chamber 19 .

[0079] Specifically, in this embodiment, a first temperature sensor 12, disposed on the first pipe section 1 and located between the standard pressure source 10 and the thermostat 9, detects the temperature of the gas medium in contact with the standard pressure source 10, thereby ensuring that the temperature of the gas medium in contact with the standard pressure source 10 is a set room temperature. A second temperature sensor 13 detects the temperature within the thermostat 9, thereby ensuring that the constant temperature controlled by the thermostat 9 is a set room temperature. A third temperature sensor 14, disposed on the first pipe section 1 and located between the thermostat 9 and the gas buffer 2, detects the temperature of the gas medium before entering the thermostat 9, thereby enabling the thermostat 9 to adjust the temperature of the thermostat 9 based on the temperature of the gas medium to maintain the temperature of the gas medium in contact with the standard pressure source 10 at a set room temperature.

[0080] A fourth temperature sensor 15, located on the second pipe section 16 and between the gas buffer 2 and the high-temperature box 4, measures the temperature of the gas medium before it enters the high-temperature box 4. A fifth temperature sensor 17, located within the isolation chamber 5, measures the temperature within the isolation chamber 5 to ensure that the ambient temperature of the pressure transmitter 7 and the pressure sensor 6, excluding the pressure-sensing surface, is at the set temperature. A sixth temperature sensor 18, located within the high-temperature chamber 19, measures the temperature of the gas medium within the high-temperature chamber 19 to ensure that the gas medium temperature is at the set high-temperature operating temperature.

[0081] In this embodiment, the data acquisition module 11 is also electrically connected to the first temperature sensor 12, the second temperature sensor 13, the third temperature sensor 14, the fourth temperature sensor 15, the fifth temperature sensor 17 and the sixth temperature sensor 18, so that the temperatures detected by each temperature sensor can be centrally obtained, thereby facilitating the control of the entire testing device.

[0082] In one embodiment, Figure 1 As shown, the first pipe section 1 includes a bellows, which is located in a constant temperature device 9 and is kept at a constant temperature by the constant temperature device 9 .

[0083] Specifically, in this embodiment, the portion of the first pipe section 1 located within the thermostatic device 9 is configured as a bellows, which significantly increases the contact area between the first pipe section 1 and the thermostatic device 9. For example, if the thermostatic device 9 is a thermostatic water bath, the bellows on the first pipe section 1 located within the thermostatic water bath can maintain the gas within the bellows at a predetermined normal temperature due to the larger contact area, facilitating the standard pressure source 10 to detect the pressure of the gas at normal temperature.

[0084] To facilitate the pressure relief of the pressure line after the test is completed, Figure 1 As shown, the testing device in this embodiment further includes a control valve 8 , which is provided on the gas buffer 2 . The control valve 8 is electrically connected to the data acquisition module 11 , and the opening and closing of the control valve 8 is controlled by the data acquisition module 11 .

[0085] After the control valve 8 is electrically connected to the data acquisition module 11, the data acquisition module 11 must first close the control valve 8 before testing begins. After the test is complete, the data acquisition module 11 can open the control valve 8 to relieve pressure in the pressure line. In this embodiment, the control valve 8 can be any type of electrically controlled valve, such as a solenoid valve, a gate valve, or the like.

[0086] In order to facilitate the control of the temperature in the high temperature box 4 and the high temperature cavity 19, a first temperature control component is provided in the high temperature box 4 in this embodiment, and the first temperature control component is used to control the temperature in the isolation cavity 5;

[0087] A second temperature control component is provided in the high temperature chamber 19 , and the second temperature control component is used to control the temperature in the high temperature chamber 19 .

[0088] Specifically, in one embodiment, the first temperature control component and the second temperature control component may be electric heating rods, electric heating wires, and the like.

[0089] According to another aspect of the present invention, a pressure instrument performance testing method is provided, which uses the above-mentioned pressure instrument performance testing device and includes the following steps:

[0090] S100, controlling the temperature in the high-temperature chamber 19 to a first temperature value T6, and controlling the temperature in the isolation chamber 5 to a second temperature value T5, wherein 200°C ≤ T6 ≤ 500°C, and 20°C ≤ T5 ≤ 90°C; in a specific embodiment, according to different side-view working conditions, the first temperature value T6 and the second temperature value T5 can select a specific value within the corresponding range.

[0091] S200, set the target pressure value, fill the gas medium to be measured into the gas buffer 2 through the pressure generator 3, and fill the first pipe section 1 and the second pipe section 16 with the gas medium to be measured. When the pressure values ​​in the first pipe section 1 and the second pipe section 16 are close to the target pressure value, turn off the pressure generator 3; in a specific embodiment, according to different test conditions, the target pressure value also has different options, and the target pressure value under the corresponding test condition can be determined according to the test specification.

[0092] S300. The temperature of the gas medium to be measured passing through the constant temperature device 9 is controlled at T2, 15°C ≤ T2 ≤ 25°C by the constant temperature device 9. In a specific embodiment, the constant temperature device 9 is used to control the temperature of the gas medium to be measured at room temperature, generally needing to be controlled at (20±2)°C.

[0093] S400, fine-tuning the pressure values ​​in the first pipe section 1 and the second pipe section 16 by using the standard pressure source 10, so that the pressure value obtained by the standard pressure source 10 reaches the target pressure value;

[0094] S500, obtaining the measured pressure value output by the pressure transmitter 7;

[0095] S600 : Determine an error value between the measured pressure value and the target pressure value based on the target pressure value and the measured pressure value.

[0096] S700 , using the target pressure value, the first temperature value, and the second temperature value as the only variables of the test conditions, respectively, to obtain the error value between the measured pressure value and the target pressure value under multiple test conditions.

[0097] In the present invention, through this testing method, the metering performance of the pressure instrument under different test conditions can be tested and evaluated, which solves the problem in the related art that there is a lack of a pressure instrument performance evaluation method under working conditions, and the metering performance of the pressure instrument cannot be evaluated under high temperature conditions.

[0098] In this embodiment, three variables need to be controlled during the performance test of the pressure instrument, namely the target pressure value in the pressure pipeline, the first temperature value in the high temperature chamber 19 and the second temperature value in the isolation chamber 5 of the high temperature box 4.

[0099] In a specific embodiment, a pressure meter with an accuracy of level 0 or 5 is used as a test object, the pressure measurement range is 0-6 MPa, and the temperature range of the measurement medium is 50° C.-500° C.

[0100] According to the existing JJG875 digital pressure gauge calibration procedure, calibration must be performed at (20±2)°C, ignoring the effect of actual temperature on pressure measurements. Typically, the pressure gauge under test is measured at six points: 0, 2MPa, 3MPa, 4MPa, 5MPa, and 6MPa. The maximum allowable error required is ±0.5%.

[0101] The maximum allowable error calculation formula is:

[0102] ;

[0103] During the test:

[0104] : Maximum allowable error;

[0105] : Forward and reverse stroke indication of measuring point;

[0106] : Standard value of measuring point;

[0107] : Maximum measured value.

[0108] Table 1 Error of the pressure instrument under test under standard environment (20±2)℃

[0109]

[0110] As shown in Table 1, the pressure instrument under test fully meets the requirements when calibrated under standard environment.

[0111] In order to test the measurement performance of the pressure instrument under high temperature conditions, the following tests are carried out:

[0112] Test condition 1:

[0113] The first temperature value T6 in the high-temperature chamber 19 is set at 300°C, and the second temperature value T5 in the isolation chamber is set at (50±2)°C. The temperature of the gas medium to be measured passing through the constant temperature device is controlled at T2 at (20±2)°C by the constant temperature device. The target pressure values ​​are set at five measurement points, namely 2MPa, 3MPa, 4MPa, 5MPa, and 6MPa. The test results are shown in Table 2:

[0114] Table 2 Error of the measured pressure instrument at high temperature

[0115]

[0116] Table 2 shows that the error of the pressure instrument under test under this test condition is significantly different from that under the standard condition.

[0117] Test condition 2:

[0118] The target pressure value is set to 6 MPa, the second temperature value T5 in the isolation chamber is set to (50±2)°C, and the temperature of the gas medium to be measured passing through the constant temperature device is controlled at T2 at (20±2)°C by the constant temperature device. The first temperature value T6 in the high-temperature chamber 19 is used as a variable to measure the measured pressure values ​​at 50°C, 100°C, 200°C, 400°C, and 600°C in sequence. The results are shown in Table 3:

[0119] Table 3 Error of the measured pressure instrument at high temperature

[0120]

[0121] Table 3 shows that under the same pressure conditions, the measurement error of the pressure instrument under test changes with the temperature of the measuring medium, and the measurement error changes significantly compared with that under the standard environment.

[0122] Test condition three:

[0123] The target pressure value is set to 6 MPa, the first temperature value T6 in the high-temperature chamber 19 is set to 300°C, and the temperature of the gas medium to be measured passing through the constant temperature device is controlled at T2 at (20±2)°C by the constant temperature device. The second temperature value T5 in the isolation chamber is set as a variable, and the variable is measured at the measured pressure values ​​at 25°C, 50°C, and 80°C in sequence. The test results are shown in Table 4:

[0124] Table 4 Error of the measured pressure instrument at high temperature

[0125]

[0126] The above test method can be used to obtain the pressure measurement values ​​and error values ​​of the pressure instrument under different high-temperature test conditions. In order to ensure that the pressure instrument under test can output accurate pressure measurement values ​​under high-temperature conditions, it is necessary to calibrate the pressure instrument based on the test results so that the pressure instrument can output pressure measurement values ​​within the allowable error range based on the current test environment.

[0127] Specifically, the pressure instrument primarily consists of a pressure sensor 6 and a pressure transmitter 7. The pressure sensor 6 contains a sensitive element that converts the pressure value into a raw electrical signal and transmits it to the pressure transmitter 7. The pressure transmitter 7 amplifies and filters the electrical signal and converts it into a standard signal commonly used in industry, such as (4-20) mA and 0-5 V. The final measurement result is output as a standard signal by the pressure transmitter 7.

[0128] Each pressure sensor 6 typically has its own characteristics. During the measurement process, the raw signal output by the sensor must be processed to a fixed value before it can be used properly. This process is called calibration. This calibration is performed by the pressure transmitter 7, which currently generally includes a microprocessor. This calibration process compares the measured value with a standard value, corrects any errors using a mathematical algorithm within the processor, and outputs the correct pressure value. Because temperature has a certain influence on the measured value of the pressure sensor 6, only by correcting the information output by the pressure sensor 6 under the actual temperature environment can the pressure value under the actual working conditions be accurately obtained.

[0129] In one embodiment, the data acquired through this testing method can be used to perform curve fitting. Specifically, interpolation or other methods can be used for curve fitting. Based on the fitting results, a pressure correction equation algorithm is developed. This pressure correction equation algorithm is then integrated into the processor of the pressure transmitter 7 to correct the pressure measurement results and output the correct measured pressure value. After using the above-described testing device and testing method, the combination of the operating environment temperature, the measured medium temperature, and the target pressure measurement value can be adjusted as needed to ultimately form a suitable correction equation for calibrating the pressure instrument under test, ensuring accurate measurement results under the expected operating conditions of the pressure instrument under test.

[0130] Based on this, the testing method in this embodiment also includes:

[0131] S800, judging whether the pressure sensor 6 meets the measurement performance requirements according to the error value, if not,

[0132] S900, performing curve fitting based on the measured pressure value and the target pressure value, and determining a correction method based on the curve fitting result;

[0133] S1000: Correct the pressure transmitter 7 based on the correction method so that the pressure value error output by the pressure transmitter 7 meets the measurement performance requirement.

[0134] To further verify the modified pressure transmitter 7, the test method in this embodiment further includes:

[0135] S1100 , execute S100 - S800 using the corrected pressure transmitter 7 , if yes, then end the performance test.

[0136] In other words, in this embodiment, the corrected pressure transmitter 7 is put into the test again, and the metering performance of the corrected pressure transmitter 7 is evaluated based on the measured pressure values ​​and error values ​​under different test conditions. After the evaluation finds that the metering performance requirements are met, the pressure instrument can output accurate measured pressure values ​​when applied to different environmental conditions.

[0137] Since it is necessary to test the metering performance of the pressure instrument under high temperature conditions, the temperature values ​​at various key locations of the test device need to be strictly controlled to ensure the accuracy of the test results. To this end, before executing step S400, this embodiment also includes:

[0138] Obtaining the detected temperature values ​​detected by the first temperature sensor 12, the second temperature sensor 13, the third temperature sensor 14, the fourth temperature sensor 15, the fifth temperature sensor 17, and the sixth temperature sensor 18; in a specific embodiment, the corresponding detected temperature values ​​are obtained by the data acquisition module 11 in a wired or wireless manner;

[0139] Based on the detected temperature value, it is determined whether the temperature of each part of the test device meets the test requirements. If so, step S400 is executed;

[0140] If not, check and debug the test device.

[0141] The foregoing description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Those skilled in the art will readily appreciate that various modifications and variations of the present invention are possible. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present invention shall be included within the scope of protection of the present invention.

Claims

1. A pressure instrument performance testing device, characterized in that: include: Pressure piping, standard pressure source, constant temperature equipment, gas buffer, pressure generator, high temperature box, high temperature chamber, pressure sensor, pressure transmitter and data acquisition module; The pressure pipeline includes a first pipe section and a second pipe section, wherein the first end of the first pipe section is connected to the standard pressure source, and the second end of the first pipe section is connected to the gas buffer after passing through the constant temperature device; the constant temperature device is used to control the temperature of the gas medium to be measured passing through the constant temperature device at T2; The high-temperature chamber is disposed within the high-temperature box, the temperature of the high-temperature chamber is adjustable, and a closed isolation chamber is provided between the high-temperature box and the high-temperature chamber, the temperature of the isolation chamber is adjustable. During testing, the temperature of the high-temperature chamber is controlled at a first temperature value T6, and the temperature of the isolation chamber is controlled at a second temperature value T5. The pressure is controlled at a target pressure value via a pressure generator and a standard pressure source. The first end of the second pipe segment is connected to the gas buffer, and the second end of the second pipe segment is connected to the high-temperature chamber. The pressure generator is connected to the gas buffer; the pressure sensor is provided on the high-temperature chamber, and the pressure-sensitive surface of the pressure sensor is in contact with the medium in the high-temperature chamber; The pressure transmitter is arranged in the isolation cavity and connected to the pressure sensor; The data acquisition module is used to collect data from the standard pressure source, the pressure generator and the pressure transmitter; During the test, the target pressure value, the first temperature value, and the second temperature value are used as variables of the test conditions, and the error value between the measured pressure value of the pressure transmitter and the target pressure value under multiple test conditions is obtained.

2. The pressure instrument performance testing device according to claim 1, characterized in that: Also included are a first temperature sensor, a second temperature sensor, a third temperature sensor, a fourth temperature sensor, a fifth temperature sensor, and a sixth temperature sensor electrically connected to the data acquisition module; The first temperature sensor is used to detect the temperature of a portion of the first pipe segment located between the standard pressure source and the constant temperature device; The second temperature sensor is used to detect the temperature inside the constant temperature device; The third temperature sensor is used to detect the temperature of a portion of the first pipe segment located between the constant temperature device and the gas buffer; The fourth temperature sensor is used to detect the temperature of a portion of the second pipe segment located between the gas buffer and the high temperature box; The fifth temperature sensor is used to detect the temperature in the isolation cavity; The sixth temperature sensor is used to detect the temperature in the high-temperature chamber.

3. The pressure instrument performance testing device according to claim 1, characterized in that: The first pipe section includes a bellows, which is located in the constant temperature device and is kept at a constant temperature by the constant temperature device.

4. The pressure instrument performance testing device according to claim 3, characterized in that: The constant temperature equipment includes a constant temperature water tank, and the bellows section is located in the constant temperature water tank.

5. The pressure instrument performance testing device according to claim 1, characterized in that: It also includes a control valve, which is arranged on the gas buffer and is electrically connected to the data acquisition module. The opening and closing of the control valve is controlled by the data acquisition module.

6. The pressure instrument performance testing device according to claim 1, characterized in that: A first temperature control component is provided in the high temperature box, and the first temperature control component is used to control the temperature in the isolation cavity; A second temperature control component is provided in the high temperature cavity, and the second temperature control component is used to control the temperature in the high temperature cavity.

7. A pressure instrument performance testing method, characterized in that: The pressure instrument performance testing device according to claim 2 is used, and includes the following steps: S100, controlling the temperature in the high-temperature chamber to a first temperature value T6, and controlling the temperature in the isolation chamber to a second temperature value T5, wherein 200°C ≤ T6 ≤ 500°C, and 20°C ≤ T5 ≤ 90°C; S200, setting a target pressure value, charging the gas medium to be measured into the gas buffer through the pressure generator, filling the first pipe segment and the second pipe segment with the gas medium to be measured, and turning off the pressure generator when the pressure values ​​in the first pipe segment and the second pipe segment approach the target pressure value; S300, controlling the temperature of the gas medium to be measured passing through the constant temperature device at T2, 15° C. ≤ T2 ≤ 25° C. by the constant temperature device; S400: Fine-tune the pressure values ​​in the first pipe segment and the second pipe segment by using the standard pressure source, so that the pressure values ​​obtained by the standard pressure source reach the target pressure value; S500, obtaining a measured pressure value output by the pressure transmitter; S600, determining an error value between the measured pressure value and the target pressure value based on the target pressure value and the measured pressure value; S700: Use the target pressure value, the first temperature value, and the second temperature value as unique variables of a test condition, respectively, to obtain an error value between the measured pressure value and the target pressure value under multiple test conditions.

8. The pressure instrument performance testing method according to claim 7, characterized in that: Also includes: S800: Determine whether the pressure sensor meets the measurement performance requirements based on the error value; if not, S900, performing curve fitting based on the measured pressure value and the target pressure value, and determining a correction method based on the curve fitting result; S1000. Correct the pressure transmitter based on the correction method so that the pressure value error output by the pressure transmitter meets the measurement performance requirement.

9. The pressure instrument performance testing method according to claim 8, characterized in that: Also includes: S1100 , execute S100 - S800 using the modified pressure transmitter. If yes, end the performance test.

10. The pressure instrument performance testing method according to claim 8, characterized in that: Before executing step S400, the method further includes: Acquire detection temperature values ​​detected by the first temperature sensor, the second temperature sensor, the third temperature sensor, the fourth temperature sensor, the fifth temperature sensor, and the sixth temperature sensor; Determine whether the temperature of each part of the test device meets the test requirements based on the detected temperature value, and if so, execute step S400; If not, the test device is inspected and debugged.

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