A method for evaluating reliability of a kinetic-based locking release mechanism

Abstract

The application provides a kind of based on the reliability evaluation method of locking release mechanism of dynamics, including the randomness modeling of the initial position of stud in locking release mechanism;Degradation characteristic modeling is carried out for the piezoelectric coefficient degradation of piezoelectric stack;The randomness of stud and the degradation characteristic of piezoelectric stack are introduced into the dynamics model of locking release mechanism;The response of mechanism under different conditions is analyzed by numerical simulation;The failure mode of locking release mechanism is defined in combination with simulation results;The reliability of locking release mechanism is evaluated by using Kaplan-Meier survival analysis method.The application improves the accuracy and effectiveness of reliability evaluation, accurately evaluates the dynamic response of locking release mechanism under different working conditions, more accurately predicts the possible failure mode and failure probability of mechanism after long time operation;It can better simulate and evaluate the influence of these complex environments on system reliability to ensure stability and safety in actual tasks.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of space equipment evaluation, and particularly to a reliability evaluation method for a locking and releasing mechanism based on dynamics. BACKGROUND

[0002] In a gravitational wave detection mission, the design and implementation of the locking and releasing mechanism are crucial to ensuring the accurate release of the test mass in orbit. The design and reliability of this key component directly affect the success rate of the detection mission.

[0003] Currently, the locking and releasing of the test mass are mainly achieved through mechanical or electrical methods. For example, a common method includes the use of piezoelectric stacks to achieve high-precision release. However, with the increasing complexity of the space environment, these existing locking and releasing mechanisms face many challenges in terms of reliability evaluation during long-term use.

[0004] In the current technology, the degradation characteristics of piezoelectric materials are a significant problem. Over time, the performance of piezoelectric stacks gradually decreases, leading to a decrease in release precision and directly affecting the stability of the locking and releasing mechanism. In addition, mechanical components such as studs may be affected by factors such as vibrations and temperature fluctuations in the space environment, causing their initial positions to shift, further affecting the reliability of the release process.

[0005] To address these challenges, existing technical solutions often enhance the reliability of the mechanism by improving material quality or increasing redundancy design. However, these methods fail to fully consider the complex relationship between dynamic behavior and material degradation characteristics, making it difficult to effectively predict the long-term reliability of the system in extreme environments. SUMMARY

[0006] To address the shortcomings of the prior art, the present application provides a reliability evaluation method for a locking and releasing mechanism based on dynamics to solve the technical problem that the long-term reliability of the locking and releasing mechanism cannot be effectively predicted in a complex space environment. The present application considers the randomness and degradation characteristics of the mechanism, and through dynamic modeling and simulation, combined with the Kaplan-Meier survival analysis method, provides a basis for the design and reliability improvement of the locking and releasing mechanism.

[0007] The technical solution of the present application is as follows: a reliability evaluation method for a locking and releasing mechanism based on dynamics, comprising the following steps:

[0008] S1), randomly modeling the initial position of the stud in the locking and releasing mechanism;

[0009] S2), modeling the degradation characteristics of the piezoelectric coefficient degradation of the piezoelectric stack;

[0010] S3), introducing the randomness of the stud and the degradation characteristics of the piezoelectric stack into the dynamic model of the lock release mechanism; analyzing the response of the mechanism under different conditions through numerical simulation;

[0011] S4), defining the failure modes of the lock release mechanism in combination with the simulation results;

[0012] S5), using the Kaplan-Meier survival analysis method to evaluate the reliability of the lock release mechanism.

[0013] As preferred, in step S1), the initial position of the stud in the lock release mechanism is modeled randomly, specifically including the following steps:

[0014] S11), determine the initial position of the stud, taking the gap D0 between the probe and the test mass as the reference;

[0015] S12), in combination with the force condition of the stud in the actual flight environment, assume that the position offset of the stud obeys the semi-normal distribution;

[0016] S13), use Monte Carlo simulation to generate n initial position samples of the stud, and calculate the probe offset D σj resulted therefrom;

[0017] S14), import the generated stud displacement samples into the dynamic model to analyze their influence on the system amplitude and failure modes.

[0018] As preferred, in step S13), S initial position samples of the stud are generated using Monte Carlo simulation, and the probe offset D σj is calculated therefrom; specifically including the following steps:

[0019] S131), set parameters, define the z-axis coordinate of the standard position of the stud as 0; use Monte Carlo simulation to generate the position disturbance of the stud, assume that the position disturbance obeys the semi-normal distribution, and the standard deviation of the disturbance is 0.5 microns;

[0020] S132), generate samples, use the normrnd function in MATLAB to generate S initial position samples of the stud; the standard deviation is 0.5 microns, and the mean is 0;

[0021] S133), equivalent probe offset, equivalent the generated initial position samples of the stud into the offset of the probe resulting therefrom.

[0022] As preferred, in step S14), the dynamic model is a mass-spring-damper system model, and its expression is:

[0023]

[0024] In the formula, m1, m2, m3 respectively represent the mass of the force sensor and the plunger, the mass of the spacer block and the two piezoelectric stacks, and the mass of the top needle; z1(t), z2(t), z3(t) respectively represent the displacement corresponding to the three degrees of freedom respectively; respectively represent the speed corresponding to the three degrees of freedom respectively; respectively represent the acceleration corresponding to the three degrees of freedom respectively; F p , F TM respectively represent the force output by the piezoelectric stack and the pre-tightening force applied by the top needle to the test mass; c p,1 , c p,2 respectively represent the damping of the upper and lower piezoelectric stacks; k f , k p , k d respectively represent the stiffness of the force sensor, the piezoelectric stack, and the disc spring.

[0025] As preferred, in step S14), the generated stud displacement sample is introduced into the dynamic model to analyze its influence on the system amplitude and the failure mode, specifically including the following steps:

[0026] S141), a dynamic model is established, and the dynamic model of the system is first defined as a mass-spring-damper system model;

[0027] S142), the initial position sample data of the stud generated in step S13) is taken as the input in the dynamic model;

[0028] S143), the system amplitude and the failure mode are evaluated, the data is brought into MATLAB, the system amplitude is analyzed after the simulation is completed, and whether the system will fail under different offsets is judged in combination with the preset failure mode.

[0029] As preferred, in step S2), a degradation characteristic model is established for the piezoelectric coefficient degradation of the piezoelectric stack, specifically including the following steps:

[0030] S21), a piezoelectric material is selected, and its piezoelectric coefficient d 33 is measured under different cycle numbers,

[0031] The initial d 33 is set as a conventional value;

[0032] S22), the relationship expression between the output displacement L of the piezoelectric stack and the piezoelectric coefficient d 33 is:

[0033] L = n·d 33 V;

[0034] In the formula, n is the number of piezoelectric ceramics, and V is the input voltage;

[0035] S23), based on the test data, the d 33 The model decays over time, and the maximum operating voltage is set to 150V;

[0036] S24), using Matlab for dynamic simulation, analyze the output displacement of piezoelectric stack and system response under different degradation states; that is:

[0037]

[0038] In the formula, m1, m2, m3 represent the mass of the force sensor and the plunger, the mass of the spacer and the two piezoelectric stacks, and the mass of the needle, respectively; z1(t), z2(t), z3(t) represent the displacement corresponding to the three degrees of freedom, respectively; respectively represent the speed corresponding to the three degrees of freedom, respectively; respectively represent the acceleration corresponding to the three degrees of freedom, respectively; k1, k2, k3 represent the stiffness of the force sensor connected to the outside, the stiffness of the piezoelectric stack, and the stiffness of the disc spring, respectively; c represents the damping coefficient of the piezoelectric stack; F p , F TM are the force output by the piezoelectric stack and the pre-tightening force applied by the needle to the test mass, respectively.

[0039] As preferred, in step S3), the randomness of the stud and the degradation characteristics of the piezoelectric stack are introduced into the dynamic model of the locking and releasing mechanism; the response of the mechanism under different conditions is analyzed through numerical simulation, which includes the following steps:

[0040] S31), import the initial position sample of the stud and the coefficient of the piezoelectric stack

[0041] The initial position sample data of the stud generated in step S13) is taken as the input in the dynamic model, and the degradation characteristics of the piezoelectric stack are considered, which decays with the number of uses, and the maximum amplitude output is obtained by substituting into the dynamic model;

[0042] S32), evaluate the system amplitude and failure mode

[0043] After the simulation is completed, the response data of the system is analyzed, especially the amplitude of the system; the graph of the change of the system amplitude with time or frequency is drawn, whether there is an abnormally increased amplitude is observed; and combined with the preset failure mode, the possible failure mode is identified.

[0044] As preferred, in step S4), the failure mode of the locking and releasing mechanism is defined combined with the simulation results, which includes the following steps:

[0045] S41), taking the amplitude of the plunger and the change of the gap between the plunger and the test mass as the criterion, set the failure threshold;

[0046] S42), by multiple simulations, statistics of the maximum amplitude A and the gap G of the system under different stud initial positions and piezoelectric stack degradation degrees;

[0047] S43), calculating the failure index a, and setting different failure criteria according to the failure index a, wherein the expression of the failure index a is:

[0048]

[0049] In the formula, A0 and G0 respectively represent the maximum amplitude of the plunger and the gap between the plunger and the test mass without considering randomness and degradation; A t , G t represent the maximum amplitude of the plunger and the gap between the plunger and the test mass after t cycles considering randomness and degradation characteristics.

[0050] As preferred, in step S5), the reliability of the locking and releasing mechanism is evaluated by using the Kaplan-Meier survival analysis method, which specifically includes the following steps:

[0051] S51), the randomness of the stud and the degradation characteristics of the piezoelectric stack are introduced into the dynamic model at the same time to simulate the working state of the locking and releasing mechanism in the actual environment;

[0052] S52), the initial position samples of S studs are simulated and analyzed, and N cycles are inserted K time points, and the response data of the system are recorded;

[0053] S53), the collected response data are statistically analyzed to evaluate the reliability of the locking and releasing mechanism, the survival curve of the system is generated by Kaplan-Meier survival analysis, and the 95% confidence interval is determined;

[0054] S54), the evaluation results are applied to the design and optimization of the locking and releasing mechanism.

[0055] The beneficial effects of the present application are:

[0056] 1. The present application significantly improves the accuracy and effectiveness of evaluating the long-term reliability of complex mechanical systems. The present application introduces the randomness of stud displacement and the degradation characteristics of piezoelectric stack piezoelectric coefficient into the dynamic model, generates multiple samples by Monte Carlo simulation, accurately evaluates the dynamic response of the locking and releasing mechanism under different working conditions, and can more accurately predict the failure mode and failure probability of the mechanism after long-time operation;

[0057] 2. This invention, by employing the Kaplan-Meier survival analysis method, can intuitively plot the survival curve of the locking and releasing mechanism, helping to analyze the reliability changes of the system during long-term operation; it is not only applicable to the design and optimization of locking and releasing mechanisms, but also provides a basis for subsequent fault prediction and maintenance strategies.

[0058] 3. The method of the present invention, by introducing modeling of randomness and degradation, can better simulate and evaluate the impact of these complex environments on system reliability, thereby ensuring the stability and safety of the locking and releasing mechanism in actual tasks. Attached Figure Description

[0059] Figure 1 This is a schematic flowchart of the method of the present invention;

[0060] Figure 2 The diagram shows the system reliability results under different failure criteria in the embodiments of the present invention. Detailed Implementation

[0061] The specific embodiments of the present invention will be further described below with reference to the accompanying drawings:

[0062] like Figure 1 As shown, this embodiment provides a dynamic-based method for evaluating the reliability of a locking and releasing mechanism, including the following steps:

[0063] S1) Model the initial position of the stud in the locking and releasing mechanism for randomness; specifically, this includes the following steps:

[0064] S11) Determine the initial position of the stud, using the gap D0 between the ejector pin and the test mass as a reference. In this embodiment, D0 is 4μm.

[0065] S12) Considering the stress conditions of the stud in the actual flight environment, it is assumed that the positional offset of the stud follows a semi-normal distribution, and the standard deviation is set to 0.5μm;

[0066] S13) Use Monte Carlo simulation to generate initial position samples for 500 studs and calculate the resulting pin offset D. σj Where j = 1, 2, ... 500;

[0067] S14) Import the generated initial position sample of the stud into the dynamic model and analyze its impact on the system amplitude and failure mode.

[0068] In a preferred embodiment, in step S13), Monte Carlo simulation is used to generate initial position samples of 500 studs, and the resulting pin offset D is calculated. σj Specifically, the steps include the following:

[0069] S131), set parameters, define the z-axis coordinates of the standard position of the stud as 0; generate the position perturbation of the stud using Monte Carlo simulation, assuming that the position perturbation obeys a semi-normal distribution, and the standard deviation of the perturbation is 0.5 microns;

[0070] S132), generate samples, use the normrnd function in MATLAB to generate 500 initial position samples of the stud; the standard deviation is 0.5 microns, and the mean is 0;

[0071] S133), equivalent needle offset, the generated initial position sample of the stud is equivalent to the offset caused by the needle.

[0072] As preferred in this embodiment, in step S14), the dynamic model is a mass-spring-damper system model, and its expression is:

[0073]

[0074] In the formula, m1, m2, m3 respectively represent the mass of the force sensor and the plunger, the mass of the spacer and the two piezoelectric stacks, and the mass of the needle; z1(t), z2(t), z3(t) respectively represent the displacement corresponding to the three degrees of freedom respectively; respectively represent the speed corresponding to the three degrees of freedom respectively; respectively represent the acceleration corresponding to the three degrees of freedom respectively; F p , F TM respectively represent the force output by the piezoelectric stack and the pre-tightening force applied by the needle to the test mass; c p,1 , c p,2 respectively represent the damping of the upper and lower piezoelectric stacks; k f , k p , k d respectively represent the stiffness of the force sensor, the piezoelectric stack, and the disc spring.

[0075] As preferred in this embodiment, in step S14), by introducing the generated stud displacement sample into the dynamic model, the influence of the stud displacement sample on the system amplitude and the failure mode is analyzed, which specifically includes the following steps:

[0076] S141), establish a dynamic model, first define the dynamic model of the system as a mass-spring-damper system model;

[0077] S142), use the initial position sample data of the stud generated in step S13) as input in the dynamic model;

[0078] S143), evaluate the system amplitude and failure mode, bring the data into MATLAB, analyze the amplitude of the system after simulation is completed; and combine the preset failure mode to determine whether the system will fail under different offset conditions.

[0079] S2), degradation characteristic modeling for piezoelectric coefficient degradation of piezoelectric stack; specifically comprising the following steps:

[0080] S21), selecting piezoelectric material such as PZT ceramic, and measuring its piezoelectric coefficient d 33 Under different cycle times, the initial d 33 is set as a regular value;

[0081] S22), the relationship expression between the output displacement L of piezoelectric stack and the piezoelectric coefficient d 33 is as follows:

[0082] L = n·d 33 V;

[0083] In the formula, n is the number of piezoelectric ceramics, V is the input voltage, and in the embodiment, V = 120 V;

[0084] S23), based on the test data, a model of d 33 decay with time is established, and the maximum working voltage is set as 150 V;

[0085] S24), using Matlab for dynamic simulation, analyzing the output displacement of piezoelectric stack and the system response under different degradation states; that is:

[0086]

[0087] In the formula, m1, m2, and m3 respectively represent the mass of the force sensor and the plunger, the mass of the spacer block and the two piezoelectric stacks, and the mass of the top needle; z1(t), z2(t), and z3(t) respectively represent the displacement corresponding to the three degrees of freedom respectively; respectively represent the speed corresponding to the three degrees of freedom respectively; respectively represent the acceleration corresponding to the three degrees of freedom respectively; k1, k2, and k3 respectively represent the stiffness of the force sensor connected to the outside, the stiffness of the piezoelectric stack, and the stiffness of the disc spring; c represents the damping coefficient of the piezoelectric stack; F p , and F TM respectively represent the force output by the piezoelectric stack and the pre-tightening force applied by the top needle to the test mass.

[0088] S3), introducing the randomness of the stud and the degradation characteristics of the piezoelectric stack into the dynamic model of the locking and releasing mechanism; analyzing the response of the mechanism under different conditions through numerical simulation; specifically comprising the following steps:

[0089] S31), importing the initial position sample of the stud and the piezoelectric stack coefficient

[0090] The initial position sample data of the stud generated in step S13) is taken as input in the dynamic model, and the degradation characteristics of the piezoelectric stack are considered, which degrade over time and are substituted into the dynamic model to obtain the output maximum amplitude;

[0091] S32), evaluating system amplitude and failure mode

[0092] After the simulation is completed, the response data of the system is analyzed, especially the amplitude of the system; a graph of the change of the system amplitude with time or frequency is drawn to observe whether there is an abnormally increased amplitude; and in combination with the preset failure mode, the possible failure mode is identified.

[0093] S4), in combination with the simulation results, defining the failure mode of the locking and releasing mechanism, specifically including the following steps:

[0094] S41), taking the amplitude of the plunger and the change of the gap between the plunger and the test mass as the criterion, setting the failure threshold;

[0095] S42), by multiple simulations, the maximum amplitude A and the gap G of the system under different initial positions of the stud and degradation degrees of the piezoelectric stack are counted;

[0096] S43), calculating the failure index a, and setting different failure criteria according to the failure index a, such as a>25%, a>20%, a>15%; wherein the expression of the failure index a is:

[0097]

[0098] In the formula, A0, G0 respectively represent the maximum amplitude of the plunger and the gap between the plunger and the test mass without considering randomness and degradation; A t , G t represent the maximum amplitude of the plunger and the gap between the plunger and the test mass after t cycles considering randomness and degradation characteristics.

[0099] S5), the reliability of the locking and releasing mechanism is evaluated by using the Kaplan-Meier survival analysis method, specifically including the following steps:

[0100] S51), the randomness of the stud and the degradation characteristics of the piezoelectric stack are introduced into the dynamic model at the same time to simulate the working state of the locking and releasing mechanism in the actual environment;

[0101] S52), the initial position sample of 500 studs is simulated and analyzed, and 10 7 times of interpolation are performed on 1000 time points, and the response data of the system is recorded;

[0102] S53), statistical analysis of the collected response data, evaluation of the reliability of the locking release mechanism, generation of the survival curve of the system through Kaplan-Meier survival analysis, and determination of the 95% confidence interval thereof;

[0103] S54), application of the evaluation results to the design and optimization of the locking release mechanism.

[0104] As Figure 2 shown, a large number of dynamic simulations and reliability analyses were performed in the embodiment, the failure mode recognition of the system was more accurate in consideration of the randomness of the stud displacement and the degradation characteristics of the piezoelectric stack, the Kaplan-Meier survival analysis results showed that there were significant differences in the survival rates of the locking release mechanism under different failure criteria, and the system reliability under different failure criteria was 0.966, 0.902 and 0.710 respectively after 10 7 cycles. The system reliability gradually decreased with the relaxation of the failure criterion, which indicated that the method of the present application could effectively capture the degradation process of the system performance over time.

[0105] The above embodiment and description only illustrate the principles and the best embodiment of the present application, and the present application can have various changes and improvements without departing from the spirit and scope of the present application, and these changes and improvements all fall within the scope of the claimed present application.

Claims

1. A reliability assessment method for a dynamic locking and releasing mechanism, characterized in that, Includes the following steps: S1) Model the initial position of the stud in the locking and releasing mechanism for randomness; specifically including the following steps: S11) Determine the initial position of the stud, using the gap D0 between the ejector pin and the test mass as a reference; S12) Based on the force conditions of the stud in the actual flight environment, it is assumed that the positional offset of the stud follows a semi-normal distribution; S13) Use Monte Carlo simulation to generate initial position samples for n studs, and calculate the resulting pin offset D. σj ; S14) Import the initial position sample of the generated stud into the dynamic model and analyze its impact on the system amplitude and failure mode; S2) Modeling the degradation characteristics of the piezoelectric coefficient of the piezoelectric stack; specifically including the following steps: S21) Select a piezoelectric material and measure its piezoelectric coefficient d. 33 The change of initial d under different number of iterations 33 Set to a normal value; S22), Output displacement L of the piezoelectric stack and piezoelectric coefficient d 33 The relational expression is: ； In the formula, n is the number of piezoelectric ceramics, and V is the input voltage; S23) Based on experimental data, establish d 33 A model that decays over time was used, and the maximum operating voltage was set to 150 V; S24) Use Matlab to perform dynamic simulations and analyze the output displacement and system response of the piezoelectric stack under different degradation states; that is: In the formula, , , These represent the masses of the force sensor and plunger, the mass of the spacer block and the two piezoelectric stacks, and the mass of the ejector pin, respectively. , , These represent the displacements corresponding to the three degrees of freedom, respectively. , , These represent the velocities corresponding to the three degrees of freedom, respectively. , , These represent the accelerations corresponding to the three degrees of freedom, respectively. , , These represent the stiffness of the force sensor connected to the external system, the stiffness of the piezoelectric stack, and the stiffness of the disc spring, respectively; c represents the damping coefficient of the piezoelectric stack. , These are the force output by the piezoelectric stack and the preload applied to the test mass by the ejector pin, respectively. S3) Introduce the randomness of the stud and the degradation characteristics of the piezoelectric stack into the dynamic model of the locking and releasing mechanism; analyze the response of the mechanism under different conditions through numerical simulation; specifically including the following steps: S31) Import the initial position sample of the stud and the piezoelectric stacking coefficient. The initial position sample data of the stud generated in step S13) is used as the input to the dynamic model. At the same time, the degradation characteristics of the piezoelectric stack are considered, which continuously decay with the number of uses. The maximum amplitude of the output is obtained by substituting it into the dynamic model. S32) Evaluate system amplitude and failure modes After the simulation is completed, analyze the system's response data, including the system's amplitude; Plot the system amplitude over time or frequency and observe whether there are any abnormally large amplitudes. It also identifies possible fault modes by combining preset fault modes; S4) Based on the simulation results, define the failure modes of the locking and releasing mechanism; S5) The reliability of the locking and releasing mechanism is evaluated using Kaplan-Meier survival analysis.

2. The reliability assessment method for a dynamic locking and releasing mechanism according to claim 1, characterized in that: In step S13), Monte Carlo simulation is used to generate initial position samples for S studs, and the resulting pin offset D is calculated. σj Specifically, the steps include the following: S131) ​​Set parameters and define the z-axis coordinate of the standard position of the stud as 0; use Monte Carlo simulation to generate the position perturbation of the stud, assuming that the position perturbation follows a semi-normal distribution and the standard deviation of the perturbation is 0.5 micrometers; S132) Generate samples: Use the normrnd function in MATLAB to generate S initial position samples of studs; the standard deviation is 0.5 micrometers and the mean is 0. S133), equivalent ejector pin offset, which converts the initial position sample of the generated stud into the offset of the ejector pin.

3. The reliability assessment method for a dynamic locking and releasing mechanism according to claim 1, characterized in that: In step S14), the dynamic model is a mass-spring-damper system model, and its expression is: ； In the formula, , , These represent the masses of the force sensor and plunger, the mass of the spacer block and the two piezoelectric stacks, and the mass of the ejector pin, respectively. , , These represent the displacements corresponding to the three degrees of freedom, respectively. , , These represent the velocities corresponding to the three degrees of freedom, respectively. , , These represent the accelerations corresponding to the three degrees of freedom, respectively. , These are the force output by the piezoelectric stack and the preload applied to the test mass by the ejector pin, respectively. , These represent the damping of the upper and lower piezoelectric stacks, respectively; , , These represent the stiffness of the force sensor, piezoelectric stack, and disc spring, respectively.

4. The reliability evaluation method for a dynamic locking and releasing mechanism according to claim 3, characterized in that: In step S14), the generated stud displacement samples are imported into the dynamic model to analyze their impact on the system amplitude and failure mode. This includes the following steps: S141) Use the initial position sample data of the stud generated in step S13) as input to the dynamic model; S143) Evaluate the system amplitude and fault modes, input the data into MATLAB, analyze the system amplitude after the simulation is completed, and determine whether the system will fail under different offset conditions by combining the preset fault modes.

5. The reliability assessment method for a dynamic locking and releasing mechanism according to claim 1, characterized in that: In step S4), based on the simulation results, the failure modes of the locking and releasing mechanism are defined, specifically including the following steps: S41) Set the failure threshold based on the changes in plunger amplitude and the gap between the plunger and the test mass; S42) Through multiple simulations, the maximum amplitude A and gap G of the system under different initial stud positions and piezoelectric stack degradation degrees were statistically analyzed; S43) Calculate the failure index α, and set different failure criteria based on the failure index α, wherein the expression for the failure index α is: ； In the formula, A0 and G0 represent the maximum amplitude of the plunger and the gap between the plunger and the test mass, respectively, without considering randomness and degradation; A t G t This represents the maximum amplitude of the plunger and the gap between the plunger and the test mass after t cycles, taking into account randomness and degradation characteristics.

6. The reliability assessment method for a dynamic locking and releasing mechanism according to claim 1, characterized in that: In step S5), the reliability of the locking and releasing mechanism is evaluated using the Kaplan-Meier survival analysis method, specifically including the following steps: S51) The randomness of the stud and the degradation characteristics of the piezoelectric stack are simultaneously introduced into the dynamic model to simulate the working state of the locking and releasing mechanism under actual conditions. S52) Simulate and analyze the initial position samples of S studs, and repeat N times, interpolating K time points, and record the system response data; S53) Perform statistical analysis on the collected response data to evaluate the reliability of the locking and releasing mechanism. Generate the system's survival curve through Kaplan-Meier survival analysis and determine its 95% confidence interval. S54) Apply the evaluation results to the design and optimization of the locking and releasing mechanism.

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