Gateway equipment testing method, device and system and storage medium

Abstract

The invention discloses a gateway equipment testing method, device and system and a storage medium. The method comprises the following steps: detecting whether to-be-tested gateway equipment is placed in a preset card seat; if it is detected that the to-be-tested gateway equipment is put into the preset card seat, sending a burning instruction to the to-be-tested gateway equipment, so that the to-be-tested gateway equipment carries out file burning and is automatically started after receiving the burning instruction; receiving a start completion message sent by the gateway device to be tested; sequentially sending a function test instruction and a performance test instruction to the to-be-tested gateway device to obtain a test result; judging whether the test of the gateway equipment is passed or not according to the test result; and if the test result is passed, indicating that the test of the gateway equipment is passed. Through the method, the test efficiency and convenience of the gateway equipment can be improved.

Description

Technical Field

[0001] The present application relates to the field of Internet of Things technology, and in particular to a testing method, device, system and storage medium for a gateway device. Background Art

[0002] With the rise of smart cities, smart fire protection and other fields, the Internet of Things plays a very important role. LoRaWAN (LoRa Wide Area Network, the abbreviation of LoRa Wide Area Network, is a wireless communication protocol based on LoRa technology) wireless communication technology plays a very important role in the field of Internet of Things technology.

[0003] The LoRaWAN gateway plays a very important and indispensable role in the entire communication link, so each function and performance of the LoRaWAN gateway needs to be strictly tested before the device leaves the factory to ensure the product quality of the LoRaWAN gateway. However, the LoRaWAN gateway device has no display, mouse, or keyboard, so during the production process, the traditional testing method requires setting up multiple stations on the production line, and each station tests different functions. This testing method has cumbersome procedures and leads to low testing efficiency. Summary of the invention

[0004] The present application provides a testing method, apparatus, system and storage medium for a gateway device, which can improve the testing efficiency and convenience of the gateway device.

[0005] In a first aspect, the present application provides a method for testing a gateway device, wherein a testing device includes a preset CPU, and the preset CPU is connected to a gateway device to be tested, and the method includes:

[0006] Check whether the gateway device to be tested is placed in the preset card holder;

[0007] If it is detected that the gateway device under test has been placed in the preset card holder, a burning instruction is sent to the gateway device under test, so that the gateway device under test burns the file and starts automatically after receiving the burning instruction of the gateway device under test;

[0008] Receiving a startup completion message sent by the gateway device under test;

[0009] Sending a function test instruction and a performance test instruction to the gateway device under test in sequence to obtain a test result;

[0010] According to the test result of the gateway device under test, determine whether the test of the gateway device under test has passed;

[0011] If the test result of the gateway device to be tested is passed, the test result of the gateway device to be tested is displayed as passed.

[0012] A further technical solution is that if the gateway device to be tested passes the test result, the gateway device to be tested method further includes:

[0013] Scan the QR code to enter the product serial number.

[0014] A further technical solution is that if the gateway device to be tested passes the test result, the gateway device to be tested method further includes:

[0015] The indicator lights indicate when the test has passed and the test information is displayed on the LCD screen.

[0016] A further technical solution is that the gateway device under test determines whether the test of the gateway device under test is passed, and the gateway device under test method further includes:

[0017] If the test result of the gateway device to be tested is failed, it means that the test of the gateway device to be tested has failed, then the power of the gateway device to be tested is turned off, the indicator light is used to display the test failure status, and the specific information of the test failure is displayed on the LCD display screen, and the test returns to the step of detecting whether the gateway device to be tested is placed in the preset card holder, and the next test of the gateway device to be tested is performed.

[0018] A further technical solution is that before the gateway device under test sends a burning instruction to the gateway device under test, the gateway device under test method further includes:

[0019] Turn on the power of the gateway device under test;

[0020] Obtain the power supply voltage of each module of the gateway device under test;

[0021] Determine whether the power supply voltage of each module of the gateway device under test is normal;

[0022] If the power supply voltages of the modules are normal, a programming instruction is sent to the gateway device under test.

[0023] A further technical solution is that the gateway device under test determines whether the voltage of each module of the gateway device under test is normal, and further includes:

[0024] If the power supply voltage of any module is abnormal, the power of the gateway device under test is turned off, the indicator light is used to display the test failure, and the specific information of the test failure is displayed on the LCD display screen, and the test returns to the step of detecting whether the gateway device under test is placed in the preset card holder to test the next gateway device under test.

[0025] A further technical solution is that before the gateway device under test sends a burning instruction to the gateway device under test, the gateway device under test method further includes:

[0026] Set all input and output interfaces of the gateway device to be tested to low level one by one, and then set them to high level one by one;

[0027] Using a preset interface to read the level response information of the gateway device under test;

[0028] If the level response information of the gateway device under test is normal, it means that the input and output interface test of the gateway device under test passes, otherwise the input and output interface number that fails the test is recorded.

[0029] In a second aspect, the present application provides a testing device for a gateway device, the testing device for the gateway device comprising a unit for executing any one of the above methods.

[0030] In the third aspect, the present application provides a testing system for a gateway device, which includes a testing device, a spectrum analyzer, a signal generator, a router and a PC. The testing device includes a preset CPU, an indicator light, an LCD display screen and a barcode scanner, and the indicator light, the LCD display screen and the barcode scanner are respectively connected to the preset CPU; the preset CPU is communicatively connected to the gateway device to be tested, the spectrum analyzer and the signal generator; the router of the gateway device to be tested is connected to the spectrum analyzer, the signal generator, the preset CPU and the PC, and the preset CPU is used to execute the steps of any of the above methods.

[0031] In a fourth aspect, the present application provides a computer-readable storage medium, which is used to store a computer program, and when the computer program is executed by a processor, it is used to implement the steps of any of the above methods.

[0032] The beneficial effects of the present application are as follows: different from the prior art, the present application sets a preset CPU to test the test object of the gateway device under test according to a preset test process, that is, to detect whether the gateway device under test is placed in the preset card holder; when it is detected that the gateway device under test has been placed in the preset card holder, a burning instruction is sent to the gateway device under test, so that the gateway device under test performs file burning and starts automatically after receiving the burning instruction of the gateway device under test; receives a startup completion message sent by the gateway device under test; and sends function test instructions and performance test instructions to the gateway device under test in sequence to obtain test results. That is to say, after the gateway device under test is placed in the preset card holder, the preset CPU starts to automatically execute the test task of the gateway device under test according to the preset test process, without manual intervention, thereby reducing errors and time consumption of manual operations.

[0033] In addition, the preset CPU sends functional test instructions and performance test instructions to the gateway device under test in sequence. In this way, all functional tests and performance tests of the gateway device under test can be completed at one workstation, without setting up multiple test workstations and switching between different workstations, thereby improving the testing efficiency and convenience of the gateway device. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. Among them:

[0035] Figure 1 It is a flowchart of a first embodiment of a method for testing a gateway device provided by the present application;

[0036] Figure 2 It is an interactive schematic diagram of a test system for a gateway device provided by the present application;

[0037] Figure 3 It is a test schematic diagram of a test device for a gateway device provided by the present application;

[0038] Figure 4 It is a flowchart of another embodiment of the test method of the gateway device provided by the present application;

[0039] Figure 5 It is a structural schematic diagram of an embodiment of a computer-readable storage medium provided by the present application. DETAILED DESCRIPTION

[0040] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. It will be understood that the specific embodiments described herein are only used to explain the present application, rather than to limit the present application. It should also be noted that, for ease of description, only some but not all structures related to the present application are shown in the drawings. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without making creative work are within the scope of protection of the present application.

[0041] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0042] With the rise of smart cities, smart fire protection and other fields, the Internet of Things plays a very important role. LoRaWAN (LoRa Wide Area Network, the abbreviation of LoRa Wide Area Network, is a wireless communication protocol based on LoRa technology) wireless communication technology plays a very important role in the field of Internet of Things technology.

[0043] The LoRaWAN gateway plays a very important and indispensable role in the entire communication link, so each function and performance of the LoRaWAN gateway needs to be strictly tested before the device leaves the factory to ensure the product quality of the LoRaWAN gateway. However, the LoRaWAN gateway device has no display, mouse, or keyboard, so during the production process, the traditional testing method requires setting up multiple stations on the production line, and each station tests different functions. This testing method has cumbersome procedures and leads to low testing efficiency.

[0044] Therefore, in order to solve the above problems, the present application provides a test method for a gateway device, which can improve the test efficiency and convenience of the gateway device. Please refer to the following embodiments for details.

[0045] See also Figure 1 , Figure 1 1 is a flow chart of a first embodiment of a method for testing a gateway device provided by the present application. The testing device includes a preset CPU, the preset CPU is connected to the gateway device to be tested, and the method includes the following steps:

[0046] Step 110: Detect whether the gateway device to be tested is placed in a preset card holder.

[0047] Among them, the preset card seat is the detection station.

[0048] Step 120: If it is detected that the gateway device under test has been placed in the preset card holder, a burning instruction is sent to the gateway device under test.

[0049] In this way, the gateway device under test can perform file burning and start automatically after receiving the burning instruction of the gateway device under test.

[0050] Step 130: Receive a startup completion message sent by the gateway device under test.

[0051] Step 140: Sending a function test instruction and a performance test instruction to the gateway device under test in sequence to obtain a test result.

[0052] Step 150: According to the test result of the gateway device to be tested, determine whether the test of the gateway device to be tested passes.

[0053] Step 160: If the test result of the gateway device to be tested is passed, it is displayed that the test of the gateway device to be tested has passed.

[0054] In this way, a preset CPU is set to test the test object of the gateway device under test according to a preset test process, that is, to detect whether the gateway device under test is placed in the preset card holder; when it is detected that the gateway device under test has been placed in the preset card holder, a burning instruction is sent to the gateway device under test, so that the gateway device under test burns the file and starts automatically after receiving the burning instruction of the gateway device under test; a startup completion message sent by the gateway device under test is received; and a function test instruction and a performance test instruction are sent to the gateway device under test in sequence to obtain a test result. That is to say, after the gateway device under test is placed in the preset card holder, the preset CPU starts to automatically execute the test task of the gateway device under test according to the preset test process, without manual intervention, thereby reducing errors and time consumption of manual operation.

[0055] In addition, the preset CPU sends functional test instructions and performance test instructions to the gateway device under test in sequence. In this way, all functional tests and performance tests of the gateway device under test can be completed at one workstation, without setting up multiple test workstations and switching between different workstations, thereby improving the testing efficiency and convenience of the gateway device.

[0056] Referring to the second embodiment of the method for testing a gateway device provided by the present application, the method comprises the following steps:

[0057] Step 210: Detect whether the gateway device to be tested is placed in a preset card holder.

[0058] Step 220: If it is detected that the gateway device under test has been placed in the preset card holder, a burning instruction is sent to the gateway device under test, so that the gateway device under test burns the file and starts automatically after receiving the burning instruction.

[0059] Step 230: Receive a startup completion message sent by the gateway device under test.

[0060] Step 240: Sending a function test instruction and a performance test instruction to the gateway device under test in sequence to obtain a test result.

[0061] Step 250: According to the test result of the gateway device to be tested, determine whether the test of the gateway device to be tested passes.

[0062] Step 260: If the test result of the gateway device to be tested is passed, it is displayed that the test of the gateway device to be tested has passed.

[0063] Step 270: Scan the code and write the product serial number.

[0064] Refer to the third embodiment of the gateway device testing method provided in this application. The method comprises the following steps:

[0065] Step 310: Detect whether the gateway device to be tested is placed in a preset card holder.

[0066] Step 320: If it is detected that the gateway device under test has been placed in the preset card holder, a burning instruction is sent to the gateway device under test, so that the gateway device under test burns the file and starts automatically after receiving the burning instruction.

[0067] Step 330: Receive a startup completion message sent by the gateway device under test.

[0068] Step 340: Sending a function test instruction and a performance test instruction to the gateway device under test in sequence to obtain a test result.

[0069] Step 350: Determine whether the test of the gateway device to be tested passes according to the test result of the gateway device to be tested.

[0070] Step 360: If the test result of the gateway device to be tested is passed, it is displayed that the test of the gateway device to be tested has passed.

[0071] Step 370: Use the indicator light to indicate that the test has passed and display the test information on the LCD display.

[0072] Referring to the fourth embodiment of the gateway device testing method provided by the present application, the method comprises the following steps:

[0073] Step 410: Detect whether the gateway device to be tested is placed in a preset card holder.

[0074] Step 420: If it is detected that the gateway device under test has been placed in the preset card holder, a burning instruction is sent to the gateway device under test, so that the gateway device under test burns the file and starts automatically after receiving the burning instruction.

[0075] Step 430: Receive a startup completion message sent by the gateway device under test.

[0076] Step 440: Sending a function test instruction and a performance test instruction to the gateway device under test in sequence to obtain a test result.

[0077] Step 450: Determine whether the test of the gateway device to be tested passes according to the test result of the gateway device to be tested.

[0078] Step 460: If the test result of the gateway device to be tested is passed, it is displayed that the test of the gateway device to be tested has passed.

[0079] Step 470: If the test result of the gateway device to be tested is failed, it means that the test of the gateway device to be tested has failed, then the power of the gateway device to be tested is turned off, the indicator light is used to display the test failure status, and the specific information of the test failure is displayed on the LCD display screen, and the test returns to the step of detecting whether the gateway device to be tested is placed in the preset card holder, and the next test of the gateway device to be tested is performed.

[0080] Referring to the fifth embodiment of the method for testing a gateway device provided by the present application, the method comprises the following steps:

[0081] Step 510: Detect whether the gateway device to be tested is placed in a preset card holder.

[0082] Step 520: If it is detected that the gateway device to be tested has been placed in the preset card holder, the power of the gateway device to be tested is turned on.

[0083] Step 530: Obtain the power supply voltage of each module of the gateway device under test.

[0084] Step 540: Determine whether the power supply voltages of the various modules of the gateway device under test are normal.

[0085] Step 550: If the power supply voltages of the modules are normal, a burning instruction is sent to the gateway device under test, so that the gateway device under test burns the file and starts automatically after receiving the burning instruction.

[0086] In some embodiments, if the power supply voltage of any module is abnormal, the power supply of the gateway device under test is turned off, the test failure is displayed using an indicator light, and specific information about the test failure is displayed on the LCD display, and the process returns to the step of detecting whether the gateway device under test is placed in a preset card holder, and the next gateway device under test is tested.

[0087] In some embodiments, before step 550 sends the burning instruction to the gateway device under test, all input and output interfaces of the gateway device under test may be tested first, which may specifically include the following steps:

[0088] Step 551: All input and output interfaces of the gateway device under test are set to low level one by one, and then to high level one by one.

[0089] Step 552: Read the level response information of the gateway device under test by using a preset interface.

[0090] Step 553: If the level response information of the gateway device under test is normal, it means that the input and output interface test of the gateway device under test passes, otherwise the input and output interface number that fails the test is recorded.

[0091] Step 560: Receive a startup completion message sent by the gateway device under test.

[0092] Step 570: Send a function test instruction and a performance test instruction to the gateway device under test in sequence to obtain a test result.

[0093] Step 580: Determine whether the test of the gateway device to be tested passes according to the test result of the gateway device to be tested.

[0094] Step 590: If the test result of the gateway device to be tested is passed, it is displayed that the test of the gateway device to be tested has passed.

[0095] The present application also provides a testing device for a gateway device, where the testing device for the gateway device includes a unit for executing any one of the above method embodiments.

[0096] Based on the above embodiments, the present application also provides a test system for a gateway device. Figure 2 and Figure 3 The test system of the gateway device includes an automated test device 100, i.e., a test device, a router 200, a PC 300, a spectrum analyzer 400, and a signal generator 500. The test device 100 includes a CPU minimum system 101 (i.e., a preset CPU), a barcode scanner 102, an LED indicator light 103, and an LCD display screen 104.

[0097] Among them, the LED indicator light 103, the LCD display screen 104 and the barcode scanner 102 are respectively connected to the CPU minimum system 101; the CPU minimum system 101 is communicatively connected to the test object 10 (i.e., the gateway device to be tested) the spectrum analyzer 400 and the signal generator 500; the router 200 is connected to the spectrum analyzer 400, the signal generator 500, the CPU minimum system 101 and the PC 300, and the CPU minimum system 101 is used to execute the test method of the gateway device as any of the above items.

[0098] See also Figure 2, connecting the test device 100, the spectrum analyzer 400, the signal generator 500 and the PC 300 to the same router 200 can ensure that the test device 100, the spectrum analyzer 400, the signal generator 500 and the PC 300 are in the same network to achieve network communication.

[0099] In addition, the test device 100 is connected to the spectrum analyzer 400 and the signal generator 500 through a feeder line to test the transmission and reception performance indicators.

[0100] See also Figure 3 The CPU minimum system 101, i.e., the preset CPU, provides a variety of control interfaces to peripheral auxiliary devices or instruments (such as the spectrum analyzer 400, the signal generator 500, and the router 200), wherein the network port is used to connect to the router 200 to achieve network communication.

[0101] The barcode scanner 102 is used to write the product serial number; the LED indicator light 103 is used to indicate the test result and provide an intuitive status for the tester; the LCD display screen 104 is used to display the test result, and the result information of each test item can be viewed.

[0102] In addition, the CPU minimum system 101 provides a communication interface and a control interface to the test object 10 (i.e., the gateway device to be tested), wherein the switch control is used to control the power supply of the test object; the TTL serial port control is mainly used for communication between the CPU minimum system and the test object, i.e., sending test instructions, feeding back test results, etc.; DO and DI (i.e., the preset interface) are mainly used for GPIO (input and output interface) testing, and the CPU minimum system pulls down all the input and output interfaces of the test object one by one, and then pulls them up one by one. If each input and output interface of the test object can be controlled normally, it means that the input and output interface test of the test object has passed, otherwise the input and output interface number of the failed test is recorded; AI is mainly used to test the power supply voltage of each module. For example, when the measured voltage deviates from the target value by more than 5%, it means that the voltage test has failed, and the test item number is recorded on the LCD display.

[0103] Based on the above embodiment and the test system of the gateway device, combined with Figure 4 The test method of the gateway device provided in this application mainly includes the following steps:

[0104] Step 1: Power on.

[0105] That is, power on the test device.

[0106] Step 2: Place the test object into the holder.

[0107] The test object (gateway device to be tested) may be placed into the preset card holder manually, or the test object (gateway device to be tested) may be placed into the preset card holder automatically by a robotic arm, and this application does not limit this.

[0108] Step 3: Determine whether the object is detected.

[0109] That is, the CPU minimum system polls to detect whether the test object is placed in the preset card holder. If it is placed, step 4 is executed, otherwise, it returns to step 2 to continue the detection.

[0110] Step 4: Turn on the test object.

[0111] Step 5: Detect the voltage of each module of the test object.

[0112] Step 6: Determine whether the voltage is normal.

[0113] That is, the power supply voltage of each module of the test object is detected by AI. If the power supply voltage of each module is normal, step 10 is executed, otherwise, steps 7, 8, and 9 are executed;

[0114] Step 7: Power off the test object.

[0115] Step 8: The LED indicator shows the test failed status.

[0116] Step 9: The LCD screen displays detailed information about the test failure, and then returns to step 2.

[0117] Step 10: Send the burning command to the test object.

[0118] In this way, the test object receives the burning instruction of the gateway device to be tested, starts to download the burning file from the PC, and saves it to the memory.

[0119] Step 11: Wait for the test object system to start up.

[0120] That is, after the burning is completed, the system of the test object automatically starts, and after the startup is completed, a startup completion message is sent to the CPU minimum system.

[0121] Step 12: Send test instructions to the test object.

[0122] That is, the CPU minimum system sends a test instruction to the test object, and the test object will enter the production test mode and wait to receive the corresponding test instruction.

[0123] Step 13: Product function testing.

[0124] Among them, product function testing includes wifi, 4G, LED, button and other function tests.

[0125] Step 14: Product performance testing.

[0126] That is, the CPU minimum system controls the test object through the TTL serial port to start the transmission and reception of the LoRa radio frequency, and at the same time exchanges data with the spectrum analyzer and signal generator through the network port to obtain test data.

[0127] Step 15: Check the test results.

[0128] Step 16: Determine whether the test passes.

[0129] That is, analyze and compare the test results. If the test result is passed, execute steps 17-19 and return to step 2 to wait for the next round of testing (i.e., the test of the next gateway device to be tested); if the test result is failed, execute steps 7, 8, and 9 and return to step 2 to wait for the next round of testing.

[0130] Step 17: Scan the QR code and enter the product serial number.

[0131] Step 18: The indicator light shows that the test passed.

[0132] Step 19: The LCD screen displays the test information.

[0133] In this way, the present application only needs to place the test object into the preset card holder of the test device, and all the test processes can be automatically completed through the CPU minimum system, thereby realizing the test of all processes at one workstation, which helps to solve the problem that the existing factories need multiple workstations and multiple test devices to produce LoRaWAN gateway equipment, resulting in high costs, low efficiency, and cumbersome operations. The test process and steps are simplified, the testing efficiency of workers is improved, and the production test cost is reduced. In addition, since the test results are fed back in the form of LED indicators and LCD display screens, they are intuitive and easy to understand. Therefore, the operator only needs to look at the indicator lights and LCD display screens, and no high professional requirements are required.

[0134] See also Figure 5 , Figure 5 The structure of an embodiment of a computer-readable storage medium provided by the present application is shown in FIG. 7 . The computer-readable storage medium 70 is used to store a computer program 71. When the computer program 71 is executed by a processor, it is used to implement the following method steps:

[0135] Check whether the gateway device to be tested is placed in the preset card holder;

[0136] If it is detected that the gateway device to be tested has been placed in a preset card holder, a burning instruction is sent to the gateway device to be tested, so that the gateway device to be tested burns the file and starts automatically after receiving the burning instruction;

[0137] Receiving a startup completion message sent by the gateway device to be tested;

[0138] Sending a function test instruction and a performance test instruction to the gateway device to be tested in sequence to obtain a test result;

[0139] According to the test result, determining whether the test of the gateway device passes;

[0140] If the test result is passed, it means that the test of the gateway device has passed.

[0141] It can be understood that when the computer program 71 is executed by the processor, it is also used to implement the technical solution of any embodiment of the present application.

[0142] In the several embodiments provided in this application, it should be understood that the disclosed methods and devices can be implemented in other ways. For example, the device implementation described above is only illustrative, for example, the division of modules or units is only a logical function division, and there may be other division methods in actual implementation, such as two units or components can be combined or integrated into another system, or some features can be ignored or not executed.

[0143] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on two network units. Some or all of the units may be selected according to actual needs to achieve the purpose of this embodiment.

[0144] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0145] If the integrated units in the above other embodiments are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions to enable a computer device (which can be a personal computer, server, or network device, etc.) or a processor (processor) to perform all or part of the steps of each implementation method of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk and other media that can store program code.

[0146] The above are only implementation methods of the present application, and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A method for testing a gateway device, characterized in that: The test device includes a preset CPU, and the preset CPU is connected to the gateway device to be tested. The method includes: Check whether the gateway device to be tested is placed in the preset card holder; If it is detected that the gateway device to be tested has been placed in a preset card holder, a burning instruction is sent to the gateway device to be tested, so that the gateway device to be tested burns the file and starts automatically after receiving the burning instruction; Receiving a startup completion message sent by the gateway device to be tested; Sending a function test instruction and a performance test instruction to the gateway device to be tested in sequence to obtain a test result; According to the test result, determining whether the test of the gateway device passes; If the test result is passed, it means that the test of the gateway device has passed.

2. The method for testing a gateway device according to claim 1, characterized in that: If the test result is passed, the method further includes: Scan the QR code to enter the product serial number.

3. The method for testing a gateway device according to claim 1, characterized in that: If the test result is passed, the method further includes: The indicator light is used to indicate that the test has passed and the test information is displayed on the LCD display screen.

4. The method for testing a gateway device according to claim 1, characterized in that: The method of determining whether the test of the gateway device passes, further comprising: If the test result is failed, it means that the test of the gateway device has failed, then the power of the gateway device to be tested is turned off, the indicator light is used to display the test failure status, and the specific information of the test failure is displayed on the LCD display, and the process returns to the step of detecting whether the gateway device to be tested is placed in the preset card holder to test the next gateway device to be tested.

5. The method for testing a gateway device according to claim 1, characterized in that: Before sending the burning instruction to the gateway device to be tested, the method further includes: Turning on the power of the gateway device to be tested; Obtaining the power supply voltage of each module of the gateway device to be tested; Determine whether the power supply voltage of each module of the gateway device to be tested is normal; If the power supply voltages of the modules are normal, a burning instruction is sent to the gateway device to be tested.

6. The method for testing a gateway device according to claim 5, characterized in that: The determining whether the voltage of each module of the gateway device to be tested is normal also includes: If the power supply voltage of any module is abnormal, the power supply of the gateway device to be tested is turned off, the indicator light is used to display the test failure, and the specific information of the test failure is displayed on the LCD display screen, and the process returns to the step of detecting whether the gateway device to be tested is placed in the preset card holder to test the next gateway device to be tested.

7. The method for testing a gateway device according to claim 5, characterized in that: Before sending the burning instruction to the gateway device to be tested, the method further includes: All input and output interfaces of the gateway device to be tested are set to low level one by one, and then set to high level one by one; Using a preset interface to read the level response information of the gateway device to be tested; If the level response information of the gateway device to be tested is normal, it means that the input and output interface test of the gateway device to be tested passes, otherwise the input and output interface number that fails the test is recorded.

8. A test device for a gateway device, characterized in that: The testing device of the gateway device comprises a unit for executing the method according to any one of claims 1-7.

9. A test system for a gateway device, characterized in that: The test system of the gateway device includes a test device, a spectrum analyzer, a signal generator, a router and a PC. The test device includes a preset CPU, an indicator light, an LCD display screen and a barcode scanner. The indicator light, the LCD display screen and the barcode scanner are respectively connected to the preset CPU; the preset CPU is communicatively connected to the gateway device to be tested, the spectrum analyzer and the signal generator; the router is connected to the spectrum analyzer, the signal generator, the preset CPU and the PC, and the preset CPU is used to execute the test method of the gateway device as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores program data, and when the program data is executed by a processor, it is used to implement the test method for the gateway device according to any one of claims 1 to 7.

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