Inspection device and inspection method for energy cell production industry and production method for inspection device

Abstract

The invention relates to an inspection device (1) for the energy cell production industry, said inspection device (1) being provided for inspecting flat elements (2) suitable for forming a cell stack, said inspection device (1) comprising a plurality of inspection units (4) which can be moved relative to a stationary part (5) of the inspection device (1) by means of a conveying device (3), the inspection units (4) each comprise at least two contact surfaces (6, 7, 8) for electrically and / or signally contacting the flat element (2) to be inspected, and wherein the inspection units (4) each comprise a support (9) having an electrically insulating property, by means of which the contact surfaces (6, 7, 8) of the respective inspection units (4) are arranged in a predetermined position and orientation relative to one another, the support (9) of the inspection unit (4) is fastened on the conveying device (3).

Description

Technical Field

[0001] The invention relates to an inspection device for the energy cell production industry, which is designed to inspect flat elements suitable for forming a cell stack. In addition, the invention also relates to a corresponding inspection method and a production method for producing the inspection device. Background Art

[0002] Energy cells or energy storage cells, such as battery cells, are used, for example, in electric accumulators (galvanische Akkumulatoren) in motor vehicles, other land vehicles, ships and aircraft, where a large amount of energy must be stored in a manner that can be used over a long period of time. For this purpose, such energy cells have a structure consisting of a large number of flat elements stacked in a stack, which will be referred to as a cell stack in the following text. These flat elements are formed, for example, by single-chamber electrolyzer cells (Monozellen). Single-chamber electrolyzer cells are all alternating anode sheets and cathode sheets, which are also called electrodes, which are separated from each other by separator sheets. Single-chamber electrolyzer cells therefore usually have a layer sequence: separator - electrode (e.g. anode) - separator - electrode (e.g. cathode).

[0003] The flat elements are precut during the production process and are then stacked in a predetermined sequence to form a single cell stack and connected to one another, for example by lamination.

[0004] Plants for producing battery cells are known, for example, from WO 2016 / 041713 A1 and DE 10 2017 216 213 A1.

[0005] It may happen that flat elements are damaged during the production process. For example, in the case of flat elements in the form of single-chamber electrolyser cells, it may happen that the separators are damaged during the production process. If single-chamber electrolyser cells with damaged separators are used to form a cell stack, this may have a negative impact on the functionality and service life of the cell stack.

[0006] For example, an energy cell can also be a fuel cell or a solar cell, wherein the flat elements can also be damaged during the production process.

[0007] It is therefore known in principle from the prior art to check the flat elements before the stacking process and, if necessary, to remove them from the production process so that only intact flat elements are used to form the cell stack.

[0008] Such inspection processes must be carried out taking into account the production performance and conveying speeds of today's production facilities. Therefore, it is known in principle from the prior art to provide a testing device that travels with the flat element during the production process and that checks the flat element alternately. For this purpose, the testing device actively contacts the so-called conductor flaps. The conductor tabs are an integral part of the electrodes of the flat element. However, in this inspection method, the performance of the machine is limited due to the discontinuous movement. In addition, the flat element may be damaged when it contacts the conductor tabs. Summary of the invention

[0009] The object of the present application is to specify an improved testing device for testing flat elements, a corresponding testing method and a production method for the testing device.

[0010] This object is achieved by the features of the independent claim. Further preferred embodiments of the invention can be derived from the dependent claims, the drawings and the associated description.

[0011] According to a first aspect of the present application, an inspection device for the energy cell production industry is proposed to solve this problem, wherein the inspection device is configured to inspect flat elements suitable for forming a cell stack, wherein the inspection device comprises a plurality of inspection units, which can be moved relative to a fixed part of the inspection device by means of a conveying device, wherein the inspection units each comprise at least two contact surfaces for electrical and / or signaling contact with the flat element to be inspected, wherein the inspection units each comprise a support with electrically insulating properties, via which the contact surfaces of the respective inspection units are arranged in a predetermined position and orientation with respect to one another, wherein the supports of the inspection units are fastened to the conveying device.

[0012] By positioning the contact surfaces by means of the support, these contact surfaces can be fastened to the conveying device in a simple manner. Furthermore, due to the insulating properties of the support, the contact surfaces of each inspection unit are arranged in an electrically insulated manner from one another, so that the flat element can be inspected without being disturbed by abutting against the contact surfaces of the inspection unit. For this purpose, the contact surfaces are preferably connected to the measuring device or can be connected to the measuring device. Furthermore, the contact surfaces are electrically insulated from the conveying device by the support, so that, for example, the conveying device can be designed to be electrically conductive. The support element can, for example, be formed only partially, further, for example, only at the surface, of an electrically insulating material. However, the support preferably consists completely of an electrically insulating material, such as plastic.

[0013] The flat element to be inspected is preferably a single-chamber electrolysis cell.

[0014] Preferably, the number of supports fastened to the conveying device is a multiple of three or four. In particular, exactly 12 supports have proven to be advantageous, since this number represents an ideal compromise between parallelization of the measurements on the one hand and a still reasonable number of measuring devices on the other hand.

[0015] The conveying device is preferably formed by a rotatably mounted drum, to the radially outer side of which the inspection unit is fastened. Thus, the flat element to be inspected can be measured while it moves on a circular trajectory; thus, the measurement can be performed particularly easily and effectively during the conveying movement of the flat element. In this case, the inspection device can also be referred to as an inspection drum.

[0016] It is further proposed that the inspection unit comprises a first and a second contact surface, respectively, which are arranged to electrically contact and / or signal-technically contact two electrodes of the flat element when the flat element is abutted against the inspection unit, wherein the inspection unit comprises a third contact surface, respectively, which is used for electrically contacting and / or signal-technically contacting the partition of the flat element abutting against the inspection unit. By this arrangement of the three contact surfaces of the inspection unit on the support, the partitions of the single-chamber electrolyzer cell can be inspected separately from each other in an advantageous manner without removing the single-chamber electrolyzer cell from the inspection unit. Therefore, the third contact surface is used as a temporary electrode assigned to the inspection device, through which the external partition of the flat element can be inspected. The disclosure of the present application should also explicitly include the proposed inspection device together with a flat element or multiple flat elements, for example in the form of a single-chamber electrolyzer cell, stored in the inspection unit.

[0017] Preferably, the contact surfaces are each formed from a metal plate. In practice, the use of a metal plate has proven to be advantageous, since it can be easily brought into the desired shape and at the same time forms a flat and therefore gentle support for the conductor tab. The metal plate is preferably formed from a material having very good electrical conductivity, for example from copper, gold, silver, nickel, aluminum or steel. It is also conceivable to use purified metal plates, for example metal plates having a coating consisting of nickel and / or gold.

[0018] Preferably, the contact surface is fastened to the support by a material-locking or form-locking connection. A possible material-locking connection is, for example, an adhesive connection. In the case of a form-locking connection, this can be formed, for example, by a screw connection, wherein it has proven to be advantageous to screw corresponding screws to the contact surface from the side of the conveying device; thus, it can be ensured that the flat element lies against the contact surface during the inspection without the disruptive influence of the screw connection. If the conveying device is formed by a rotatably mounted drum, the contact surface is screwed to the support from the radial inside accordingly.

[0019] Preferably, the support is formed by a preferably one-piece, removable support element, which is fastened to the conveying device by means of a fastening means. The fastening means is preferably formed by a fastening means that can be removed by means of a tool. Further preferably, the fastening means is formed by a countersunk screw, so that the screw head does not protrude from the upper side of the support element, to which the contact surface is also fastened. The threaded connection also offers the advantage that the individual inspection units can be replaced with little effort when necessary, for example in the event of damage or for maintenance measures. The inspection unit then forms a module that can be replaced as a whole. The contact surface can be mounted on the support before the support is fastened to the conveying device; this shortens the downtime of the inspection device during installation or maintenance work.

[0020] The support is preferably formed by a non-conductive (dielektrische) structure, for example the support is formed by a plastic component. In addition, for example, the support can be a cast component or a 3D printed component.

[0021] If the conveying device is formed by a roller, different geometries are considered for the support: If the roller has a cylindrical side, the support preferably has a concave surface with a radius corresponding to the roller on its lower side facing the roller. If the side has a plurality of flat surfaces, the support preferably has a flat surface on its lower side facing the roller. Depending on the design of the contact surface, the upper side of the support facing the contact surface can be designed to be flat or convex. In a first embodiment, the surface of the contact surface is convex so that the contact surface formed by the metal sheet is bent so that it is placed flat on the convex upper side of the support. In this way, the side of the contact surface facing the flat element is also concave. In a second embodiment, the plate forming the contact surface is designed to be thicker than in the first embodiment. It can then be placed flat on the flat upper side of the support. The concave shape of the following side of the contact surface can be produced, for example, by cutting, and the flat element is abutted against the side during operation.

[0022] If in the context of this application reference is made to a convex or concave surface of a support or of a contact surface, this geometry refers to the corresponding cross section of the mounted support or of the contact surface, which extends perpendicularly to the axis of rotation of the drum.

[0023] As an alternative to designing the support as a removable support element, the support can also be formed by an adhesive layer. The adhesive layer then also has electrically insulating properties. The adhesive electrically insulates the contact surfaces from one another and from the transport device; moreover, the orientation and arrangement of the contact surfaces of the inspection unit relative to one another can be determined in a simple manner by means of the adhesive.

[0024] It is further proposed that a recess is provided on the upper side of the support, which recess is designed to correspond in shape to the contact surface. The recess leads to a more secure alignment of the contact surface.

[0025] The support preferably has a plurality of air channels, which fluidically connect the bottom side of the support to the top side of the support. The air channels can be connected, for example, to a line system of a conveying device and can be acted upon by negative pressure. Preferably, at least one contact surface of each inspection unit has at least one flow-through region, which is operatively connected to at least one air channel of the respective support. In this way, the flow-through region of the contact surface can also be acted upon by negative pressure, so that the flat element to be inspected is sucked to the contact surface.

[0026] Preferably, the flow cross section of the air channel at the upper side of the support is smaller than the flow cross section of the flow-through region of the contact surface operatively connected thereto. In this way, the holding force acting on the flat element due to the negative pressure can be distributed over a larger surface, thereby making it possible for the flat element to be gently contacted by the inspection unit. The smaller flow cross section of the air channel of the support element increases the stability of the support element on the one hand and creates sufficient space for the fastening means, more precisely, on the one hand for fastening the support to the conveying device and on the other hand for fastening the contact surface to the support.

[0027] Flat elements, in particular conductor wings, can be held particularly gently by negative pressure, since grippers and / or clamps that could damage the conductor wings can be omitted. The flow-through area can be arranged at the first, second and / or third contact surface. The flow-through area can be formed, for example, by one or more retaining holes or by micropores of a porous material that is permeable to air. For example, such a porous material can be produced by producing the support using a 3D printing method; for example, this is achieved by reducing the material density in the flow-through area. The porosity of the material must be selected in such a way that the flat element can be sucked.

[0028] Alternatively, however, the flat element can also be held on the inspection unit by mechanical means, for example by belts or rollers.

[0029] Preferably, the support comprises at least one cable duct in which a cable is guided, which is connected to one of the contact surfaces in an electrical and / or signal-technical manner. The cable duct allows a predefined guidance and placement of the cable, so that possible interference effects can be reduced. Preferably, the cable is a coaxial cable having the following structure, starting from the radial inside to the radial outside: an inner conductor, an insulator, an outer conductor and a protective sheath. The protective sheath preferably does not extend completely to the welding point, via which the inner conductor is connected to the corresponding contact surface. By means of a screw, which is screwed to the support via its thread, the outer conductor can be pressed against the grounded part of the conveying device in the section not covered by the protective sheath; thus, interference effects are reduced. The contact surface is preferably connected to the inner conductor of the cable by a welded connection. In order to reduce interference effects as much as possible, the outer conductor for shielding preferably extends shortly before the welding point; the length of the part of the cable not covered by the outer conductor is preferably less than 1 cm, further preferably less than 0.5 cm, particularly preferably less than 0.1 cm. Each contact surface is preferably connected to a separate cable; each cable is preferably also guided in a dedicated cable duct of the respective support.

[0030] The previously proposed recesses, air channels and / or cable ducts of the support can be provided not only when the support element is removable, but also when the support is formed by an adhesive layer. In this case, the adhesive can, for example, be poured and / or distributed around a negative mold provided for this purpose. Alternatively, however, the functional unit, for example a cable or a contact surface, can also itself form such a negative mold.

[0031] According to another preferred embodiment, the inspection units are each configured to receive and transport flat elements. Preferably, the third contact surface simultaneously forms a transport support or at least a part of a transport support for the respective flat element. Thus, the transport support simultaneously not only assumes the function of transporting the flat element but also assumes the function of electrical connection or signal technology connection of the partitions of the transported flat element. For example, if a flat element in the form of a single-chamber electrolyzer cell is transported in the inspection unit, the flat element to be inspected is preferably placed with one of its partitions on the transport support of the respective inspection unit. The two electrodes of the flat element are then contacted by the first and second contact surfaces via the mentioned conductor tabs, which protrude beyond the bottom surface of the partition.

[0032] According to another preferred embodiment, a pure transport support can also be provided instead of the third contact surface. In this embodiment, the pure transport support preferably consists of an insulating material, for example in order to reduce parasitic capacitances when measuring via the first and second contact surfaces. The pure transport support is preferably formed by a surface segment of the carrier provided for this purpose.

[0033] In this way, the flat element positioned in the inspection unit can be transported by the conveying device, wherein the flat element can be inspected via the contact surface during transport. To prevent the flat element from slipping during transport, the previously described embodiment can be used, wherein the contact surface can be subjected to negative pressure.

[0034] Preferably, the flat extension of the third contact surface corresponds to the surface of the electrode of the corresponding flat element (without its conductor tab). Preferably, the flat extension of the third contact surface deviates from the flat extension of the electrode by less than 100%, preferably less than 50%, further preferably less than 25%, in particular less than 10%. In this way, the third contact surface forms an electrode pair with the nearest electrode of the adjacent flat element, which electrode pair provides a measurement result suitable for quality inspection.

[0035] As an alternative to an inspection unit that is provided for receiving and transporting flat elements simultaneously, a transport facility can also be provided, for example, for transporting flat elements from a receiving point to a delivery point along a conveying path, wherein the conveying device is arranged to bring one or more of its inspection units into contact with the flat elements during the transport of the flat elements by the transport facility, wherein the contact between the respective inspection unit and the respective flat element is maintained along a portion of the conveying path or the entire conveying path. In this embodiment, the transport facility takes over the transport of the flat elements, while the inspection device takes over the inspection of the flat elements. The inspection device is preferably arranged to press the inspection unit against the flat element transported by the transport facility with a predetermined force.

[0036] If the transport means is formed by transport rollers, on the sides of which the flat element moves on a circular path, the conveyor device is provided for guiding the inspection unit at least on a portion of the corresponding circular path. This can be achieved, for example, by the conveyor device moving the inspection unit on a sickle-shaped path, which corresponds to the geometry of the transport rollers.

[0037] Preferably, at least one measuring device is provided, wherein at least two contact surfaces of a respective one of the testing units can be interconnected with the at least one measuring device by means of a switching matrix.

[0038] If the inspection unit comprises at least two contact surfaces, at least one of the two separators of a single-chamber electrolysis cell can be measured.

[0039] Preferably, the checking units each comprise at least three contact surfaces, further preferably exactly three contact surfaces.

[0040] The switch matrix is ​​preferably provided for interconnecting at least two or three contact surfaces of one of the test units in different ways, so that measurements can be carried out by at least one measuring device in a predetermined circuit or in different circuits.

[0041] A switch matrix in the sense of the present application preferably comprises at least one input channel and at least one output channel, preferably a plurality of output channels, wherein advantageously one or more input channels are interconnected or interconnectable with one or more output channels in a predetermined configuration.

[0042] By connecting at least two contact surfaces of the test unit to the output channels of the switch matrix, they can be interconnected with at least one measuring device connected to at least one input channel. In principle, at least one measuring device can also be connected to the switch matrix via two or more input channels.

[0043] Preferably, all contact surfaces of the test unit are connected to the switch matrix on the output channel side. In addition, all measuring devices are preferably also connected to the switch matrix on the input channel side.

[0044] It goes without saying that the switch matrix can in principle include additional input channels and / or additional output channels that are not connected to at least one measuring device or contact surface. Thus, for example, additional input channels can be provided, via which a voltage source is connected to the switch matrix.

[0045] At least two of the at least three contact surfaces of the inspection unit can preferably be connected to the measuring instrument at the same time. Thus, for example, a conclusion about the system state of the corresponding flat element can be drawn based on the measurement of the impedance, ohmic resistance or capacitance between two of the at least three contact surfaces. The ohmic resistance can be measured under direct current or under alternating voltage as the reciprocal of the real part of the complex admittance, for example at a frequency of 1 kHz, 10 kHz or 1000 kHz. The capacitance can also be measured under alternating voltage. By means of breakdown measurement, for example, foreign bodies can be identified whose diameter or length is less than the layer thickness of the partition. If, for example, the flat element to be inspected is formed by a single cell of the above-mentioned single-chamber electrolyzer, the resistance between the two electrodes will decrease when the partition arranged between the electrodes is damaged.

[0046] At least three contact surfaces, preferably exactly three contact surfaces, per test unit result in a so-called three-port measurement of the flat element arranged at the test unit. This has the advantage that the two partitions of a single cell of a single-chamber electrolyzer can be tested individually and / or together. Thus, not only the partition of the flat element arranged between the first electrode and the second electrode can be tested, but also the partition located outside, which is only contacted by the electrodes of the adjacent flat element when the single cell stack is formed. The corresponding measurement can be performed by intelligently interconnecting the contact surfaces with at least one measuring instrument.

[0047] According to a preferred embodiment, a plurality of measuring devices are provided, wherein a switch matrix is ​​provided for electrically and / or signal-technically interconnecting one or more contact surfaces of one of the respective inspection units with different measuring devices. Thus, the flat element can be connected to different measuring devices without having to remove it from the respective inspection unit, which allows particularly gentle measurement of different parameters of the product. For example, it is also possible to inspect flat elements that are attached to or placed on different inspection units in parallel.

[0048] Preferably, the switch matrix is ​​designed to: interconnect the first and second contact surfaces simultaneously with the same measuring instrument; interconnect the first and third contact surfaces simultaneously with the same measuring instrument; and / or interconnect the second and third contact surfaces simultaneously with the same measuring instrument. For example, if a flat element in the form of a single-chamber electrolyzer cell is placed against a test unit for testing purposes, then, for example, the three contact surfaces of the test unit contact the flat element used as follows:

[0049] The flat element is placed on the third contact surface with a first separator; a first electrode adjacent to the first separator (for example, in the form of an anode) rests with its conductor wing on the first contact surface; a second electrode (for example, in the form of a cathode) separated from the first electrode by a second separator rests with its conductor wing on the second contact surface.

[0050] If the first contact surface and the second contact surface are simultaneously interconnected with at least one measuring device, the second partition wall arranged between them can be checked.

[0051] If the first contact surface and the third contact surface are simultaneously interconnected to at least one measuring device, the first web arranged outside the flat element can be checked.

[0052] If the second and third contact surfaces are interconnected simultaneously with a measuring device, the first and second partitions can be checked simultaneously. Depending on the switch configuration, the first and second partitions are then arranged in a series or parallel circuit between the second and third contact surfaces.

[0053] These switch configurations, which can be adjusted via the switch matrix, allow comprehensive testing of the flat components to be inspected.

[0054] The switch matrix is ​​preferably arranged to interconnect the three contact surfaces of one of the corresponding inspection units in different ways, so that measurements can be performed in different circuits by means of at least one measuring instrument. For example, depending on whether the first partition plate, the second partition plate or the two partition plates of a single-chamber electrolyzer single cell are to be inspected, the switch configuration may be different. In this way, a large number of measurements can be performed at the flat element when the flat element is against the inspection unit. By avoiding the transfer of the flat element to be inspected to another inspection device, a flat element measurement that is particularly gentle on the product can be performed. In particular, the extremely sensitive conductor tabs of the electrode already mentioned at the beginning do not have to be contacted multiple times. For example, two or more contact surfaces of the inspection unit can also be short-circuited to each other.

[0055] The switch matrix is ​​preferably arranged to interconnect one or more contact surfaces of a respective one of the inspection units to a voltage source and / or to switch it to ground.By these types of interconnections, further switch configurations can be realized, thereby being able to expand the measurement possibilities.

[0056] Preferably, the switch matrix includes a plurality of relays for interconnecting the contact surfaces to each other and / or interconnecting a single or multiple contact surfaces with one or more measuring instruments. For example, the relays can be controlled or adjusted by a control unit. Due to the large number of switch combinations, it has been proven that it is advantageous to operate the switch matrix using relays. The switch matrix and therefore also the relays can be realized, for example, by means of the position of the conveying device relative to the fixed part of the inspection device. Of course, alternatively or additionally, other input parameters can be used to control or adjust the switch matrix or relays. Switching a single or multiple contact surfaces to ground and / or interconnecting with a voltage source is also preferably realized by relays. The main advantages of relays are passive, galvanically isolated switching and minimally invasive behavior with respect to changing the measurement path. In addition, relays can conduct direct current and alternating current; switching transistors can only do this to a limited extent. In addition, switching transistors have an influence on the measurement path to a considerable extent.

[0057] The switch matrix is ​​preferably a component of the conveying device. In this way, the interconnection with the conveying device can be carried out effectively.

[0058] Furthermore, it is advantageous if at least one measuring device is configured to measure capacitance and / or ohmic resistance, more generally to measure the real part and / or imaginary part of the electrical impedance, and / or to perform a breakdown measurement. By checking the flat element by means of measuring the ohmic resistance and / or capacitance, reliable conclusions can be drawn about the system state of the flat element to be checked.

[0059] Preferably, at least one measuring device is part of a fixed part of the inspection device. Thus, the at least one measuring device does not have to be moved together with the transport device. This is particularly advantageous when the inspection device comprises a plurality of measuring devices. Furthermore, the measuring devices can then advantageously also be interconnected with contact surfaces of different inspection units, so that a smaller number of measuring devices is required. However, in principle, one or more measuring devices can also be integrated in the transport device.

[0060] According to another preferred embodiment, it is proposed that the electrical and / or signaling connection of the conveying device to the fixed part is carried out via a sliding contact arrangement. Sliding contacts have proven to be advantageous for the electrical and / or signaling connection of a mobile (e.g. rotating) conveying device to a fixed part of the inspection device.

[0061] According to a second aspect of the application, a production method for producing an inspection device is proposed to solve this problem, wherein, in method step a), a metal plate with oversize is provided to form the contact surface; in method step b), the metal plate is fastened to the conveying device by means of a support; and in method step c), the metal plate fastened to the conveying device by means of the support is processed by a cutting tool. By means of the proposed method, the surfaces of the contact surfaces can in particular be processed in such a way that they have a predetermined surface geometry. For example, the metal plate can also be divided by cutting processing in such a way that individual contact surfaces of the inspection unit are formed therefrom. Alternatively or additionally, the flow-through areas to which negative pressure can be applied during operation can also be formed by cutting processing (for example by drilling).

[0062] According to a third aspect of the application, the object is achieved by a method for inspecting flat elements which are provided for forming a cell stack for the energy cell production industry. Here, the flat elements are inspected using an inspection device as described above, wherein the flat elements to be inspected are each placed against a contact surface of one of the inspection units.

[0063] The inspection of the flat element preferably takes place during transport of the flat element, ie while the conveying device is moving relative to the stationary part of the inspection apparatus.

[0064] Further preferably, the detection of damaged or inferior flat elements leads to their removal from the production process. This can be done, for example, by the inspection device itself, or alternatively can be done by a separate device, for example in the form of an ejection drum.

[0065] However, alternatively or additionally, the quality parameters of the flat elements can also be detected by the inspection device for later use without having to remove them from the process. In this way, for example, the formed single cell piles can be sorted into different quality classes.

[0066] With regard to the technical effects and advantages associated with the proposed method, reference is made to the previous statements regarding the inspection device. BRIEF DESCRIPTION OF THE DRAWINGS

[0067] The present invention will be explained below with reference to the accompanying drawings using preferred embodiments.

[0068] Figure 1 An inspection device is shown with a conveying device in the form of a roller without its fixed parts;

[0069] Figure 2 A support having three contact surfaces is shown;

[0070] Figure 3 In a first cross section perpendicular to the axis of rotation of the drum, the inspection unit with the flat element arranged thereon is shown;

[0071] Figure 4 In a first cross section parallel to the axis of rotation of the drum, the inspection unit with the flat element arranged thereon is shown;

[0072] Figure 5 The three contact surfaces are shown in perspective view;

[0073] Figure 6 The support is shown in a perspective view from its upper side;

[0074] Figure 7 The support is shown in a perspective view from its underside;

[0075] Figure 8 shows a cross-sectional view of a support with a cable laid therein;

[0076] Fig. 9 shows an end view of the delivery device including the cover;

[0077] Fig.10 A first embodiment of an inspection unit having a holder which can be detachably fastened to a conveying device is shown;

[0078] Fig.11 A second embodiment of an inspection unit having a holder which can be detachably fastened to a conveying device is shown;

[0079] Fig.12 An end view of the delivery device without a cover is shown;

[0080] Fig.13 A sectional view of an inspection device with a first variant of wiring is shown;

[0081] Fig.14shows a perspective view of an inspection device with a second variant of wiring;

[0082] Fig.15 shows a perspective view of a conveying device with an attached contact surface;

[0083] Fig.16 shows a cross-sectional view of a delivery device with an attached contact surface; and

[0084] Fig.17 A further embodiment of an inspection device is shown. DETAILED DESCRIPTION

[0085] Figure 1 The inspection device 1 is shown without its fixed part 5, but the fixed part is Fig.13 . The inspection device 1 comprises a conveying device 3, which is formed by a roller rotatably mounted about an axis of rotation 32. Twelve flat surfaces are arranged on the side 25 of the conveying device 3, wherein a support 9 is fastened only to every third flat surface of these flat surfaces; one of the supports 9 is hidden in the perspective view shown. The fact that not every flat surface is occupied by a support 9 serves to improve visibility; in principle, supports 9 are fastened to all twelve flat surfaces of the conveying device 3. In principle, the conveying device can have any number of receiving surfaces for supports, wherein in particular a number divisible by three or four is provided for the purpose of parallelization, which will be explained in detail below. Furthermore, it can be seen that a first contact surface 6 and a second contact surface 7 as well as a third contact surface 8 arranged therebetween are arranged on each support 9. Accordingly, the support 9 and the contact surfaces 6, 7 and 8 arranged thereon form a modular unit in the form of an inspection unit 4, which will be explained below with the aid of Figure 2 The modular unit is explained. In addition, it can be seen that a switch matrix 26 is provided at the end face of the conveying device 3, which is used to connect the contact surfaces 6, 7 and 8 with the measuring device 27 (see Fig.13 )interconnection.

[0086] Figure 2 A modular unit consisting of a support 9 and contact surfaces 6, 7 and 8 arranged thereon is shown. In this embodiment, the contact surfaces 6, 7, 8 are bonded to the support 9 so that they are positioned relative to one another by the support 9 in a predetermined orientation and arrangement. Furthermore, through-holes 33 are provided, via which the support 9 can be fastened to a flat surface of the conveying device 3 by means of countersunk screws (not shown). It can also be seen that the underside 15 of the support 9 has a flat surface so that it rests flatly on a likewise flat surface of the side surface 25 of the conveying device 3 (see Figure 1 ).

[0087] The upper side 14 of the support 9 has a convex curvature, against which the contact surfaces 6, 7 and 8 also rest flatly. The contact surfaces 6, 7 and 8 formed from sheet metal can be adapted to the convex geometry of the support 9 and bonded thereto without great expenditure of force.

[0088] In this embodiment, the support 9 is made of non-conductive plastic. However, the support 9 can also be made of other non-conductive materials as an alternative. Therefore, the contact surfaces 6, 7, 8 are arranged in an electrically insulated manner relative to each other and relative to the conveying device 3.

[0089] Furthermore, air channels 19 can be seen, which interact with the flow-through region 20 of the contact surface. The reference numerals for the air channels 19 are in Figure 3 The first contact surface 6 and the second contact surface 7 also have a flow-through region 20, which is only schematically arranged at the third contact surface 8, and the flow-through region is effectively connected to the air channel 19. In this way, the flow-through region 20 of the contact surfaces 6, 7 and 8 can be subjected to negative pressure, so that the flat element 2 to be inspected (see Figure 3 and 4 ) are sucked onto contact surfaces 6, 7 and 8.

[0090] Figure 3 A schematic cross-sectional view of a flat element 2 arranged on a testing unit 4 is shown, wherein the cross section is arranged at a position parallel to the rotation axis 32 of the conveying device 3 (see Figure 1 ) in a vertical plane.

[0091] Figure 3 and Figure 4 The flat element 2 shown in FIG. 1 has the following layer structure from bottom to top: first separator 10—first electrode 11—second separator 12—second electrode 13. In this embodiment, the first electrode 11 is formed by an anode and the second electrode 13 is formed by a cathode. However, in principle, the first electrode 11 can also be formed by a cathode and the second electrode 13 can also be formed by an anode.

[0092] exist Figure 3 The cross-sectional view shows Figure 1 One of the inspection units 4. Figure 3 It can be seen from the sectional view shown that the third contact surface 8 is supported by a support 9. Since the support 9 is made of a non-conductive material, the third contact surface 8 is arranged in an electrically insulated manner relative to the conveying device 3. The flat element 2 is placed on the third contact surface 8 with the first separator 10, which at the same time forms a suitable transport support for the flat element 2. It can also be seen that, without taking into account the conductor wings 34 and 35 (see FIG. Figure 4), the flat extension of the third contact surface 8 substantially coincides with the base surface of the first electrode 11 and the second electrode 13. In this way, the third contact surface 8 together with the first electrode 11 arranged above the first separator 10 can form an electrode pair suitable for checking the first separator 10 arranged between them. The first electrode 11 is then contacted by placing its conductive tab 34 against the first contact surface 6.

[0093] also, Figure 3 The first electrode 11 is shown to be followed by a second separator 12 and a second electrode 13. Thus, the first electrode 11 and the second electrode 13 also form an electrode pair suitable for checking the second separator 12 arranged between them.

[0094] Figure 4 A further sectional view of the flat element 2 arranged on the inspection unit 4 is shown, wherein the section is parallel to the rotation axis 32 of the conveying device 3 (see Figure 1 ). In this figure, it can be seen that the first electrode 11 contacts the first contact surface 6 by means of its conductor fin 34. In addition, it can be seen that the second electrode 13 contacts the second contact surface 7 by means of its conductor fin 35. In order to avoid bending of the conductor fins 34, 35, the contact surfaces 6, 7 can have a correspondingly adjusted height in the radial direction; therefore, the height of the first contact surface 6 is smaller than the height of the second contact surface 7 in the radial direction.

[0095] Figure 5 The contact surfaces 6, 7, 8 are shown without the support 9. It can be seen that these contact surfaces are formed by metal plates, for example copper, gold, silver, nickel, aluminum or steel; in addition, metal plates with a coating made of nickel and / or gold are also conceivable.

[0096] Figure 6 The support 9 is shown without the contact surfaces 6, 7 and 8 applied thereto. Figure 5 The positions where the contact surfaces 6, 7 and 8 are arranged are provided with recesses 16, 17 and 18, which correspond to the flat extensions of the contact surfaces 6, 7 and 8. The recess 16 is used for positioning and aligning the first contact surface 6; the recess 17 is used for positioning and aligning the second contact surface 7; and the recess 18 is used for positioning and aligning the third contact surface 8. Figure 6 The support 9 shown in FIG. 1 is formed by a one-piece plastic component; such a plastic support can be, for example, a cast component or a 3D printed component. Figure 6 As can be seen in FIG. 1 , the corresponding four air passages 19 effectively connected to the third contact surface 8 intersect the upper side 14 at the groove bottom of the groove 36. In this way, the corresponding four air passages 19 are connected to the third contact surface 8 (see FIG. 1 ). Figure 5 ) can be connected to each other fluidically before in the flow-through areas 20.

[0097] Figure 7 The underside 14 of the support 9 is shown, at which the cable duct 21 extends. The first cable duct 21a is provided for the cables 22 (see Fig.12 and Fig.13 ) is guided from the end face 37 of the support 9 to the first contact surface 6, and accordingly, the second cable duct 21b is guided to the second contact surface 7, and the third cable duct 21c is guided to the third contact surface 8 (see Figure 2 The cable ducts 21a, 21b and 21c are open at the bottom 15 and are closed by the side 25 of the conveying device 3 by attaching the support 9 to the conveying device 3 (see Figure 1 ). It can also be seen that the air channel 19 intersects the flat underside 15 of the support 9. The air channel 19 can be connected to the flat underside 15 of the support 9 via a pipeline system 23 (see FIG. 2 ) provided for this purpose of the conveying device 3. Fig.13 ) to apply negative pressure to these air passages.

[0098] Figure 8 A schematic cross section through the support 9 in a plane parallel to the axis of rotation 32 of the conveying device 3 is shown; see Figure 1 . This view shows a cable 22 laid in a cable duct 21c, which is connected to the third contact surface 8. The cable 22 is designed as a coaxial cable: an inner conductor 40 extends radially inwardly, which is welded to the third contact surface 8. This is followed by an outer conductor 42 for shielding, which is separated from the inner conductor 40 by an insulator 41. This is followed radially on the outside by a protective sheath 38. The cable 22 is parallel to the axis of rotation 32 (see Figure 1 ) until it intersects the welding point at a right angle, here in a radial direction relative to the rotation axis 32. The protective sheath 38 extends until just before the right-angled direction changes, so that the outer conductor 42 is exposed in a section of the cable 22. The outer conductor 42 is pressed against the electrically conductive conveying device 3 by means of the end face 43 of the grounding screw 39, which is screwed into the support 9 with its thread, in order to produce a defined grounding. In the same way, the cable 22 leading to the first contact surface 6 and the second contact surface 7 is laid in the support 9.

[0099] Fig. 9 A front view of the conveying device 3 with the support 9 mounted thereon is shown. Figure 1 As in the embodiment, only every third support 9 is installed on the conveying device 3. It can also be seen that by installing the support 9 on the conveying device 3, the cable duct 21 is also closed at the bottom 15 of the support 9. In addition, a cover 44 is provided, which covers the switch matrix 26 at the end face (see Fig.12).

[0100] Fig.10 and Fig.11 The contact surfaces 6, 7 and 8 and the support 9 are shown. Figure 2 Two alternative bonding schemes are shown in FIG. Fig.10 and Fig.11 In the embodiment of the invention, the contact surfaces 6, 7 and 8 can be fastened to the support 9 individually by means of detachable threaded connections. Fig.10 and Fig.11 This principle is explained with the aid of the third contact surface 8 ; however, the first contact surface 6 and the second contact surface 7 can be fastened at the support 9 in a similar manner.

[0101] Fig.10 and Fig.11 A flat section of the side surface 25 of the conveying device 3 designed as a roller is shown, as has also been described in Figure 1 As shown in . The contact surface 8 can be tightened with the support 9 by a screw (not shown), which is screwed in radially from the inside. For this purpose, a blind hole 58 is provided, which completely penetrates the support 9 and whose bottom hole is located in the third contact surface 8. An internal thread 60 is arranged in the third contact surface 8, into which a screw (not shown) is embedded. The blind hole 58 has a corresponding countersunk diameter in the support, so that the screw head of the countersunk screw (not shown) is completely sunk into the support 9 in the tightened state. By tightening from the radial inside, the upper side of the contact surface 8 is not damaged. Before the support 9 is installed on the conveying device 3, the contact surface 8 has been tightened with the support 9.

[0102] In accordance with Fig.10 In the embodiment of the embodiment of the present invention, the support 9 is fastened to the conveying device 3 via a blind hole 57, which completely penetrates both the contact surface 8 and the support 9. A blind hole bottom and an internal thread 62 are arranged in the conveying device 3. In addition, the blind hole 57 has a countersunk diameter so that a screw (not shown) does not protrude from the third contact surface 8 in the installed state, which could lead to damage to the flat element 2 placed thereon.

[0103] In accordance with Fig.11 In the embodiment of FIG. 1 , the unit consisting of the contact surfaces 6, 7 and 8 (only the contact surface 8 is visible in this plane) is fastened radially from the inside to the conveying device 3 by means of a screw connection. The corresponding blind hole 59 completely penetrates the conveying device 3, while a bottom hole and an internal thread 61 are arranged in the support 9. The corresponding counterbore diameter is set so that the screw head of the screw (not shown) does not protrude from the hole.

[0104] The holes described here do not necessarily have to be produced by machining.

[0105] Fig.12The electrical and signal connection of the contact surfaces 6, 7 and 8 of the test unit 4 to a switch matrix 26 is shown, which in turn is connected to a measuring device 27 (see Fig.13 ) are connected in an electrical and signaling manner. The switch matrix 26 comprises a plurality of relays which are designed to interconnect the cables 22 with the cables of the input channel cable bundle 49. In principle, the flat element 2 (see Figure 3 and 4 ) with any measuring instrument 27 (see Fig.13 ) interconnection. However, in practice, it has been proven that the inspection unit 4 is interconnected in parallel in time with the measuring device 27. This means that a plurality of measuring devices 27 are provided, wherein the same measuring device 27 is always assigned to each inspection unit 4.

[0106] The time available for testing the flat element 2 can be extended by parallelization. Fig.12 In the embodiment of FIG. 1 , exactly 12 inspection units 4 are arranged on the conveying device 3 .

[0107] If no parallelization is provided at all, the flat element 2 located in the testing unit 4 can only be tested over an angular section of 360° / 12=30°; only a correspondingly short time period is available.

[0108] In a parallelization with a factor of 2, the inspection unit 4 is alternately assigned to the first group of measuring instruments 27-A1 and 27-B1, and the second half of the inspection unit is assigned to the second group of measuring instruments 27-A2 and 27-B2. The measuring instruments with the letter "A", here the measuring instruments 27-A1 and 27-A2, are provided for measuring capacitance. The measuring instruments with the letter "B", here 27-B1 and 27-B2, are provided for measuring ohmic resistance and for performing breakdown measurements. In a parallelization with a factor of 2, the flat element 2 located in the inspection unit 4 can be inspected over an angular section of (360° / 12)*2=60°; thus, compared to the above case, twice as much time is available, assuming the same rotation speed of the conveying device 3.

[0109] Now we should use Fig.12 and Fig.13 A parallelization with a factor of 3 is described in detail.

[0110] First, in Fig.13As can be seen in FIG. 2 , the switch matrix 26 is divided into three electronic units 46, 47 and 48 according to a parallelization with a factor of 3. The contact surfaces 6, 7 and 8 of the test units 4-1, 4-4, 4-7 and 4-10 are connected to the first electronic unit 46 by means of the cable 22, via which an interconnection with the measuring instruments 27-A1 and 27-B1 is possible. Thus, for example, any two of the three contact surfaces 6, 7, 8 of the test unit 4 can be interconnected in pairs with the measuring instrument 27, so that the corresponding flat element 2 (see FIG. 2 ) can be connected to the measuring instrument 27. Figure 3 and Figure 4 )'s two partitions 10 and 12 can be inspected.

[0111] exist Fig.12 The wiring of the contact surfaces 6, 7 and 8 of the test units 4-2, 4-5, 4-8 and 4-11 to the second electronic unit 47, through which the interconnection with the measuring instruments 27-A2 and 27-B2 is carried out (see also Fig.13 ).

[0112] exist Figure 3 Likewise, the wiring of the contact surfaces 6, 7 and 8 of the test units 4-3, 4-6, 4-9 and 4-12 to the third electronic unit 48, through which the interconnection with the measuring instruments 27-A3 and 27-B3 is carried out (see also Fig.13 ).

[0113] Thus, for a parallelization with a factor of 3, a total of six measuring devices 27-A1 to 27-B3 are required, since different measuring device types (designated with the letters "A" and "B") are required for the capacitance measurement and for the resistance measurement and the breakdown measurement, respectively. This parallelization enables the flat element 2 located in the test unit 4 to be checked over an angular section of (360° / 12)*3=90°. In practice, a parallelization with a factor of 3 has proven to be advantageous, since this provides an ideal compromise between, on the one hand, a still acceptable number of relatively expensive measuring devices 27-A1 to 27-B3 and, on the other hand, a sufficiently large measuring section of 90° and the measurement duration that can therefore be used.

[0114] Of course, parallelization by factors of 4 or 6 is also possible in a corresponding manner. Since the number 12 is divisible by the values ​​2, 3, 4 and 6, there are in principle four possibilities for parallelization.

[0115] In principle, regardless of the parallelization factor, there is of course the possibility of supplementing with one or more other measuring device types in order to carry out the corresponding measurements.

[0116] The three electronic units 46, 47, 48 of the switch matrix 26 are mounted on the end face of the conveyor device 3 designed as a roller. The switch matrix 26 is then arranged relatively close to the inspection unit 4, whereby better quality measurement results can be obtained. Furthermore, the switch matrix 26 can thus be easily installed.

[0117] In accordance with Fig.12 In the embodiment of , 12*3=36 cables 22 are connected to the output channel 53 of the switch matrix 26, which is arranged radially outside relative to the rotation axis 32. Then, a connection with the measuring instruments 27-A1 to 27-B3 can be established via the input channel 52 located radially inside. The input channel 52 and the output channel 53 can be connected to each other by means of a communication line and can be interconnected in a desired manner by means of a relay. The input channel 52 and the output channel 53 each include a coaxial connector for connecting the corresponding coaxial cable, such as an SMA threaded connector.

[0118] It goes without saying that the switch matrix 26 can in principle also be connected to other lines, for example with lines for grounding or switching one or more contact surfaces 6 , 7 and / or 8 to ground, or also with control lines for controlling the switch matrix 26 .

[0119] Fig.13 A sectional view of the testing device 1 is shown, from which the electrical and / or signal-technical connection of the contact surfaces 6, 7 and 8 of the testing unit 4 to the measuring device 27 is apparent. The cable 22 leading out of the testing unit 4 is connected to the output channel 53 of the switch matrix 26, which is connected to the conveyor 3 in a rotationally fixed manner. Starting from the input channel 52 of the switch matrix 26, the input cable bundle 49 extends into the interior of the conveyor 3 designed as a roller to a sliding contact device 50 formed by a slip ring. The sliding contact device 50 is located, for example, on a rotating hollow shaft 24 in the interior of the roller. In an alternative embodiment, the sliding contact ring can also be arranged on the outside of the shaft 24, for example on the side of the cover. Fig.14 In the region of the stator 55 in the test device 1. In the region of the input channel 52, the input cable harness 49 is guided through the hollow shaft 24 and connected via a sliding contact arrangement 50 in the form of a slip ring to a measuring cable harness 51, which is assigned to the stationary part 5 of the test device 1. The measuring cable harness 51 is then connected to the measuring instruments 27-A1 to 27-B3, which are components of the stationary part 5 of the test device 1.

[0120] In addition to signal cables that can be directly interconnected with the cable 22 , the input cable harness 49 and the measurement cable harness 51 also include data cables and voltage feed cables that are likewise connected to the switch matrix 26 .

[0121] The testing device 1 thus comprises three cable bundles: A first cable bundle comprises cables 22 which connect the contact surfaces 6, 7 and 8 of the testing device 4 to the output channels 53 of the switch matrix 26. An input cable bundle 49 assigned to the rotatable conveying device 3 connects the input channels 52 of the switch matrix 26 to the sliding contact device 50. A measuring cable bundle 51 assigned to the stationary part 5 of the testing unit 4 connects the sliding contact device 50 to a measuring device 27 or other devices, such as, for example, a control unit or a voltage source.

[0122] In addition, from Fig.13 3, the inspection unit 4 can also be loaded with negative pressure via the conveying device 3. It goes without saying that the line system 23 is arranged to apply negative pressure only to a part of the inspection unit 4, depending on the rotation angle of the conveying device 3 relative to the fixed part 5, so that the flat element 2 is sucked onto the contact surfaces 6, 7 and 8 of the inspection unit 4 only in certain sections (see also Figure 3 and Figure 4 ).

[0123] Fig.14 Shown with Fig.13 The embodiment shown in FIG. is an alternative embodiment of the wiring compared to the embodiment shown in FIG. However, in other aspects, Fig.14 The inspection equipment 1 and according to Fig.13 The same inspection device 1. Fig.14 In the embodiment of the present invention, the input cable bundle 49 is not guided into the interior of the conveying device 3 designed as a roller, but is connected to the rotor 54, which is arranged in the center of the annular circuit board of the switch matrix 26. The connection to the stator 55 is made via the sliding contact device 50, and the measuring cable bundle 51 is connected to the measuring instruments 27-A1 to 27-B3 from the stator. In this embodiment, the sliding contact device 50 and the measuring instruments 27-A1 to 27-B3 are arranged in front of the end face of the conveying device 3.

[0124] Fig.15 An embodiment of the inspection device 1 is shown in which the support 9 is not formed by a removable support element, but by an adhesive layer. Here too, three contact surfaces 6 , 7 and 8 are provided for each inspection unit 4 .

[0125] exist Fig.16 In the cross-sectional view, Fig.15 , in which the cross section also extends perpendicularly to the axis of rotation. The third contact surfaces 8 visible in this figure are each held on the conveying device 3 by means of a support 9 in the form of an adhesive. Since the adhesive has electrically insulating properties, in this embodiment, the contact surfaces 6, 7 and 8 are also electrically insulated relative to the conveying device 3 and from each other.

[0126] This embodiment allows the contact surfaces 6, 7 and 8 to be subsequently machined so that they have an ideal rounding which forms a partial cross section of an imaginary cylindrical surface. Fig.15 , 7 and 8 shown in . Subsequently, in method step b), the metal plate is fastened to the conveying device 3 by means of a support 9 made of an adhesive material. The adhesive material can be applied separately for each inspection unit 4 or for each contact surface 6, 7 and 8; however, as an alternative, the adhesive material can also be applied first to all inspection units 4 so that the contact surfaces 6, 7 and 8 can then be placed on them. Then, in method step c), the metal plate fastened to the conveying device 3 by means of the support 9 is processed by a cutting tool so that the surfaces of the contact surfaces 6, 7, 8 have the desired geometry. The contact surfaces 6, 7, 8 and the conveying device 3 can then be easily made of different metal materials. It is also possible to subsequently introduce a device for fluidically connecting the contact surfaces 6, 7 and 8 to the conveying device 3 (see Fig.13 ) of the pipeline system 23.

[0127] Of course, if the support 9 is formed by a removable support element, such as Figure 1 , Figure 2 as well as Figure 6-Figure 14 As shown in , the contact surfaces 6 , 7 and 8 can then also be machined.

[0128] Fig.17 An alternative embodiment is shown in which the flat elements 2 are transported by a separate transport device 28 along a conveying path 29 from a receiving point 30 to a delivery point 31. At the receiving point 30, the flat elements 2 are received by a first transport roller 45 and delivered to a second transport roller 56 at the delivery point 31. The transport device 3 is arranged so that during the transport of the flat elements its plurality of inspection units 4 come into contact with the flat elements 2 transported by the transport device 28 with a defined pressure. Here, the bare first separator 10 (see FIG. 1 ) is shown in the direction of the inspection device 4. Figure 3 and Figure 4). The flat element 2 is accordingly placed on the transport facility 28 together with the electrode 13 located on the outside. In this embodiment, the contact between the respective inspection unit 4 and the respective flat element 2 is maintained almost along the entire transport path 29. For this purpose, the transport device 3 moves the inspection unit 4 through a sickle-shaped continuous trajectory around the transport facility 28, wherein the smaller sickle radius, i.e. the inner radius, is placed around a part of the transport facility 28. In this embodiment, the transport facility 28 is designed as a pure transport roller, wherein the flat element 2 is held on the side by the effect of negative pressure. However, it is also possible, alternatively, that the transport facility 28 itself is also designed as an inspection roller, so that the test of this inspection roller and the test performed by the inspection unit 4 of the transport device 3 complement each other.

[0129] In another possible embodiment, as an alternative or in addition to suction by negative pressure, the conveying device 3 is used only to press the flat element 2 and then does not necessarily have to perform the measurement itself. This has the advantage that the pressure is more constant for reproducible measurements. List of reference symbols:

[0130] 1. Check the equipment

[0131] 2 flat elements

[0132] 3. Conveying device

[0133] 4 Inspection Unit

[0134] 5 Fixed part

[0135] 6First contact surface

[0136] 7 Second contact surface

[0137] 8Third contact surface

[0138] 9 supports

[0139] 10 partition

[0140] 11 electrodes

[0141] 12 Partition

[0142] 13 electrodes

[0143] 14 Upper side of the support

[0144] 15. Lower side of the support

[0145] 16 first recess

[0146] 17 second recess

[0147] 18 Third recess

[0148] 19 air channels

[0149] 20 Area where flow can pass 21 Cable duct

[0150] 22 Cable

[0151] 23Pipeline system

[0152] 24 Hollow shaft

[0153] 25 Side

[0154] 26 switch matrix

[0155] 27 Measuring instrument

[0156] 28Transportation facilities

[0157] 29 conveying path

[0158] 30 receiving points

[0159] 31 Delivery Points

[0160] 32 Rotation axis

[0161] 33 channel opening

[0162] 34 Conductor wings

[0163] 35 Conductor Wings

[0164] 36 grooves

[0165] 37 (Support) end face

[0166] 38 protective cover

[0167] 39 ground screw

[0168] 40 Inner conductor

[0169] 41 Insulator

[0170] 42 External conductor

[0171] 43 (ground screw) end face

[0172] 44 Cover

[0173] 45 First transport roller

[0174] 46 First Electronic Unit

[0175] 47 Second Electronic Unit

[0176] 48 Third Electronic Unit

[0177] 49 Input cable harness

[0178] 50 Sliding contact device

[0179] 51 measuring cable bundle

[0180] 52 input channels

[0181] 53 output channels

[0182] 54 rotor

[0183] 55 stator

[0184] 56 Second transport roller

[0185] 57 blind holes

[0186] 58 blind holes

[0187] 59 blind holes

[0188] 60 internal thread

[0189] 61 internal thread

[0190] 62 internal thread.

Claims

1. An inspection device (1) for the energy cell production industry, wherein the inspection device (1) is configured to inspect flat elements (2) suitable for forming a cell stack, wherein: The inspection device (1) comprises a plurality of inspection units (4) which can be moved relative to a fixed part (5) of the inspection device (1) by means of a transport device (3), wherein: The testing unit (4) comprises at least two contact surfaces (6, 7, 8) for electrical and / or signal-related contacting of the flat element (2) to be tested, wherein: The test units (4) each comprise a support (9) having electrically insulating properties, by means of which the contact surfaces (6, 7, 8) of the respective test unit (4) are arranged in a predetermined position and orientation relative to one another, wherein: The support (9) of the inspection unit (4) is fastened to the conveying device (3).

2. The inspection device (1) according to claim 1, characterized in that The conveying device (3) is formed by a rotatably mounted drum, to the radially outer side (25) of which the inspection unit (4) is fastened.

3. Inspection device (1) according to any one of the preceding claims, characterized in that The test unit (4) comprises a first and a second contact surface (6, 7), respectively, which are provided for electrically and / or signal-contacting two electrodes (11, 13) of the flat element (2) when the flat element (2) is in contact with the test unit (4), wherein: The test units (4) each comprise a third contact surface (8) which serves for electrical and / or signal-related contacting of a web (10) of the flat element (2) resting against the test unit (4).

4. Inspection device (1) according to any one of the preceding claims, characterized in that - The contact surfaces (6, 7, 8) are all formed from metal sheets.

5. Inspection device (1) according to any one of the preceding claims, characterized in that The contact surfaces (6, 7, 8) are fastened to the support (9) by a material-locking or form-locking connection.

6. Inspection device (1) according to any one of the preceding claims, characterized in that The support (9) is formed by a preferably one-piece, removable support element which is fastened to the conveying device (3) by means of fastening means.

7. Inspection device (1) according to any one of claims 1 to 5, characterized in that The support (9) is formed by an adhesive layer.

8. Inspection device (1) according to any one of the preceding claims, characterized in that Recesses (16, 17, 18) are provided on the upper side (14) of the support (9), said recesses being designed to correspond in shape to the contact surfaces (6, 7, 8).

9. Inspection device (1) according to any one of the preceding claims, characterized in that The support (9) has a plurality of air ducts (19) which fluidically connect the underside (15) of the support (9) to the upper side (14) of the support (9).

10. Inspection device (1) according to claim 9, characterized in that At least one contact surface (6, 7, 8) of each inspection unit has at least one flow-through region (20) which is operatively connected to at least one air channel (19) of the corresponding support (9).

11. Inspection device (1) according to any one of the preceding claims, characterized in that The support (9) comprises at least one cable duct (21) in which a cable (22) is guided, which cable is connected electrically and / or signal-wise to one of the contact surfaces (6, 7, 8).

12. Inspection device (1) according to any one of the preceding claims, characterized in that - The inspection units (4) are each provided for receiving and transporting the flat elements (2).

13. Inspection device (1) according to any one of claims 1 to 11, characterized in that a transport facility (28) is provided for transporting the flat elements (2) along a conveying path (29) from a receiving point (30) to a delivery point (31), wherein The conveying device (3) is arranged to bring its one or more inspection units (4) into contact with the flat element (2) during the transport of the flat element by the transport facility (28), wherein: - the contact between the respective inspection unit (4) and the respective flat element (2) is maintained along a portion of the conveying path (29) or along the entire conveying path (29).

14. Inspection device (1) according to any one of the preceding claims, characterized in that - at least one measuring device (27) is provided, wherein: At least two contact surfaces (6, 7, 8) of one of the respective testing units (4) can be interconnected with at least one measuring device (27) by means of a switching matrix (26).

15. Inspection device (1) according to claim 14, characterized in that - A plurality of measuring instruments (27) are provided, wherein: The switch matrix (26) is provided for electrically and / or signal-technically interconnecting one or more contact surfaces (6, 7, 8) of one of the respective test units (4) with different measuring devices (27).

16. Inspection device (1) according to claim 14 or 15 referring back to claim 3, characterized in that - The switch matrix (26) is configured to: - interconnecting the first and second contact surfaces (6, 7) simultaneously to the same measuring device (27); - interconnecting the first and third contact surfaces (6, 8) simultaneously to the same measuring device (27); and / or - interconnecting the second and third contact surfaces (7, 8) simultaneously with the same measuring device (27).

17. Inspection device (1) according to any one of claims 14 to 16, characterized in that A switch matrix (26) is provided for interconnecting three contact surfaces (6, 7, 8) of one of the respective test units (4) in different ways, so that measurements can be carried out in different circuits by means of at least one measuring device (27).

18. Inspection device (1) according to any one of claims 14 to 17, characterized in that At least one measuring device (27) is provided for measuring the real part and / or the imaginary part of an impedance, for example a capacitance and / or an ohmic resistance, and / or for carrying out a breakdown measurement.

19. A production method for producing an inspection device (1) according to any one of the preceding claims, characterized in that - in method step a), a metal sheet having oversize is provided for forming the contact surface (6, 7, 8); In method step b), the metal sheet is fastened to the conveying device (3) by means of a support (9); wherein: In method step c), the metal sheet fastened to the conveying device ( 3 ) by means of the abutment ( 9 ) is processed by means of a cutting tool.

20. An inspection method for inspecting flat elements (2) which are provided for forming a cell stack for the energy cell production industry, characterized in that: - inspecting flat components (2) using the inspection device (1) according to any one of claims 1 to 18, wherein the flat components (2) to be inspected each bear against a contact surface (6, 7, 8) of one of the inspection units (4).

Images