Metering abnormity analysis method and system

Abstract

The invention discloses a metering abnormity analysis method and system, and the method comprises the following steps: repeatedly measuring the same metering value through metering equipment, building a broken line graph, and analyzing the broken line graph, so as to rapidly judge whether the metering equipment is abnormal or not; the metering device obtains the metering value again and calculates the metering difference value, and the metering difference value and the metering difference value threshold value are compared and analyzed, so that whether the metering value is abnormal or not can be judged; by acquiring the metering temperature of the metering device when the metering value is acquired, calculating the temperature difference value, then calculating the temperature influence value according to the metering difference value and the temperature difference value, and comparing and analyzing the temperature influence value and the temperature influence threshold value, whether the temperature has influence on the metering device when the metering device acquires the metering value can be judged; a curve graph is drawn through historical data, a curvilinear equation is obtained, a metering difference value is calculated according to the temperature difference value during metering and the curvilinear equation, and therefore an actual value can be obtained.

Description

Technical Field

[0001] The present invention relates to the technical field of data processing and anomaly detection, and in particular to a method and system for analyzing measurement anomalies. Background Art

[0002] In industrial production and management, measurement data is of great significance for ensuring product quality and improving production efficiency. However, in actual operations, measurement data may be abnormal due to equipment failure, operational errors, etc. How to timely discover and analyze these abnormal data is of great significance for ensuring production stability and improving enterprise benefits.

[0003] Chinese patent number CN103499804B discloses an abnormal analysis system for an electric energy metering device, which is characterized by comprising: a data acquisition device, a collection database and a data analysis server, the data acquisition device is connected to the electric energy metering device, the collection database is connected to the data acquisition device, and the data analysis server is connected to the collection database. The present invention also discloses an analysis method for the abnormal analysis system for an electric energy metering device.

[0004] However, in the prior art, the measurement anomaly analysis method cannot quickly locate the cause of the measurement anomaly, nor can it obtain the actual data through the measurement anomaly data, which makes it difficult to meet the needs of large-scale and high-efficiency production. Summary of the invention

[0005] The object of the present invention is to provide a method and system for analyzing measurement anomalies to solve the technical problems in the above background.

[0006] The purpose of the present invention can be achieved through the following technical solutions:

[0007] A method and system for analyzing measurement anomalies, the specific method comprising the following steps:

[0008] Step 1: repeatedly measure the same measurement value through the measuring device to obtain multiple measurement values, and construct a line graph in the XY two-dimensional coordinate system based on the multiple measurement values, and analyze the line graph to determine whether the measuring device is abnormal;

[0009] Step 2: When the metering device is normal, the metering value is re-acquired through the metering device, and the metering difference is calculated according to the re-acquired metering value, and the metering difference is compared and analyzed with the metering difference threshold, so as to determine whether the metering value is abnormal;

[0010] Step 3: When the metering device obtains an abnormal metering value, obtain the metering temperature of the metering device when obtaining the metering value, calculate the temperature difference according to the metering temperature, and then calculate the temperature influence value according to the metering difference and the temperature difference, compare and analyze the temperature influence value with the temperature influence threshold, and determine whether the temperature has an impact on the metering device when obtaining the metering value;

[0011] Step 4: Draw a curve graph based on historical data and derive the curve equation. Calculate the measurement difference based on the temperature difference during measurement and the curve equation to obtain the actual value.

[0012] As a further solution of the present invention: the specific steps of determining whether the measuring device is abnormal are:

[0013] D1: The same measurement value is repeatedly measured by a measuring device to obtain multiple measurement values, and the measurement values ​​are marked as ai, i = 1, 2, 3, ..., n. The measuring device includes: a sensor, an instrument, etc.; the measurement value includes a pressure value, a flow value, an electric energy loss value, etc.:

[0014] D2: Based on the measured measurement value and measurement times, a line graph is constructed in the XY two-dimensional coordinate system, where X represents the measurement times, Y represents the measurement value, and f is the fitting line;

[0015] D3: Calculate the shaded area enclosed by the broken line and the fitted straight line in the line graph, and mark the shaded area as G;

[0016] D4: Compare and analyze the shadow area G with the shadow area threshold;

[0017] If the shadow area G ≤ the shadow area threshold, the measuring device is judged to be normal;

[0018] If the shadow area G>the shadow area threshold, the metering device is determined to be abnormal.

[0019] As a further solution of the present invention: the specific steps of determining whether the measurement value is abnormal are:

[0020] A1: When the metering device is normal, the metering value is re-obtained through the metering device, and the metering difference is calculated based on the difference between the re-obtained metering value and the actual value, and the metering difference is marked as S;

[0021] A2: Compare and analyze the measurement difference S with the measurement difference threshold;

[0022] If the measurement difference S ≤ the measurement difference threshold, the measurement value is determined to be normal;

[0023] If the measurement difference S>the measurement difference threshold, the measurement value is determined to be abnormal.

[0024] As a further solution of the present invention: the specific steps of determining whether the temperature has an impact on the measurement value obtained by the measuring device are:

[0025] B1: When the metering device obtains an abnormal metering value, obtain the metering temperature of the metering device when obtaining the metering value;

[0026] B2: Calculate the difference between the measurement temperature and the standard operating temperature of the measurement equipment to obtain the temperature difference, and mark the temperature difference as W;

[0027] B3: Process the measurement difference S and temperature difference W, and use the formula: M = a 1 ×S 2 ×W 2 +a 2 , obtain the temperature influence value M, where a 1 and a 2 are preset scaling factors, and are all greater than 0;

[0028] B4: Compare and analyze the temperature impact value M with the temperature impact threshold;

[0029] If the temperature influence value M ≤ the temperature influence threshold, it is determined that the temperature is not the main cause of the abnormality in obtaining the measurement value of the measuring device;

[0030] If the temperature influence value M>the temperature influence threshold, it is determined that the temperature is the main cause of the abnormality when the metering device obtains the metering value.

[0031] As a further solution of the present invention: the specific steps of calculating the measurement difference are:

[0032] C1: Draw a curve chart based on the historical data of the measurement value measured by the measuring device, the historical data including: the historical measurement difference of the measuring device and the corresponding temperature difference;

[0033] C2: According to the historical data and curve graph of the measuring equipment, the curve equation is: S 2 =2pW, where S≥0, W≥0, p>0;

[0034] C3: Re-measure with the metering device to obtain the metering value, metering temperature and temperature difference, and calculate the metering difference based on the temperature difference and the curve equation.

[0035] As a further solution of the present invention: the specific steps of calculating the actual value are:

[0036] K1: Re-measure with the metering device to obtain the metering value, metering temperature and temperature difference, and mark the metering value and temperature difference obtained this time as: metering value ae, temperature difference We;

[0037] K2: Substitute the temperature difference We into the curve equation: S 2 =2pW, so the measurement difference is ±Se;

[0038] K3: According to the curve chart, compare and analyze the current measurement temperature with the standard operating temperature of the measurement equipment to calculate the actual value;

[0039] As a further solution of the present invention: the measuring temperature is compared and analyzed with the standard operating temperature of the measuring device, and the method for calculating the actual value is:

[0040] When the current measurement temperature is ≤ the standard operating temperature of the measurement equipment, the actual value = measurement value ae + measurement difference Se;

[0041] When the current measurement temperature is greater than the standard operating temperature of the measurement equipment, the actual value = the measurement value ae-the measurement difference Se.

[0042] As a further solution of the present invention: comprising:

[0043] A data metering module, the data metering module is used to repeatedly measure the same metering value through a metering device, thereby obtaining multiple metering values, and obtaining the metering temperature of the metering device when obtaining the metering values;

[0044] A drawing module, the drawing module is used to construct a line graph in an XY two-dimensional coordinate system according to a plurality of measurement values;

[0045] A data processing module, the data processing module is used to re-acquire the metering value through the metering device, and calculate the metering difference according to the re-acquired metering value; calculate the temperature difference according to the metering temperature, and then calculate the temperature influence value according to the metering difference and the temperature difference; draw a curve graph according to historical data, and obtain the curve equation, and calculate the difference according to the temperature difference during metering and the curve equation to obtain the metering difference, so as to obtain the actual value;

[0046] The data analysis module is used to analyze the line graph to determine whether the metering device is abnormal; compare and analyze the metering difference with the metering difference threshold to determine whether the metering value is abnormal; compare and analyze the temperature influence value with the temperature influence threshold to determine whether the temperature has an impact on the metering device when obtaining the metering value.

[0047] Beneficial effects of the present invention:

[0048] (1) Repeatedly measure the same measurement value through the measuring equipment to obtain multiple measurement values, and establish a line graph, analyze the line graph, so as to quickly determine whether the measuring equipment is abnormal;

[0049] (2) reacquiring the measurement value through the measurement device, calculating the measurement difference based on the reacquired measurement value, and comparing and analyzing the measurement difference with the measurement difference threshold, so as to determine whether the measurement value is abnormal;

[0050] (3) By obtaining the metering temperature of the metering device when obtaining the metering value, calculating the temperature difference according to the metering temperature, and then calculating the temperature influence value according to the metering difference and the temperature difference, the temperature influence value is compared and analyzed with the temperature influence threshold, so as to determine whether the temperature has an influence on the metering device when obtaining the metering value;

[0051] (4) A curve graph is drawn using historical data to obtain the curve equation. The measurement difference is calculated based on the temperature difference during measurement and the curve equation, thereby obtaining the actual value. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] The present invention will be further described below in conjunction with the accompanying drawings.

[0053] Figure 1 is a flow chart of the method of the present invention;

[0054] Figure 2 is a line graph in the present invention;

[0055] Figure 3 It is a curve diagram in the present invention;

[0056] Figure 4 It is a system module diagram of the present invention. DETAILED DESCRIPTION

[0057] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0058] Embodiment 1:

[0059] See also Figure 1 - Figure 4 As shown, a method for analyzing measurement anomalies according to an embodiment of the present invention includes: repeatedly measuring the same measurement value by a measurement device under the same environment, thereby obtaining multiple measurement values, and constructing a line graph in an XY two-dimensional coordinate system according to the multiple measurement values, analyzing the line graph, thereby determining whether the measurement device is abnormal;

[0060] The same environment includes but is not limited to: the same temperature, the same humidity, the same pressure;

[0061] The specific method includes the following steps:

[0062] Step 1: Under the same environment, repeatedly measure the same measurement value through the measuring equipment to obtain multiple measurement values, and mark the measurement values ​​as ai, i = 1, 2, 3, ..., n. The measuring equipment includes: one of sensors and meters; the measurement value includes one of pressure value, flow value, power loss value, etc.:

[0063] Step 2: Based on the measured value and measurement times, construct a line chart in the XY two-dimensional coordinate system, such as Figure 2 In the figure, X represents the number of measurements, Y represents the measurement value, and f is the fitting straight line;

[0064] Step 3: Calculate the shaded area enclosed by the broken line and the fitted straight line in the line graph, and mark the shaded area as G;

[0065] Step 4: Compare and analyze the shadow area G with the shadow area threshold;

[0066] If the shadow area G ≤ the shadow area threshold, it means that under the same environment, when the measuring device repeatedly measures the same measurement value, the deviation of each measurement value is not large, that is, the measuring device is judged to be normal;

[0067] If the shadow area G>the shadow area threshold, it means that under the same environment, when the measuring device repeatedly measures the same measurement value, the deviation of each measurement value is large, and the measuring device is judged to be abnormal.

[0068] Embodiment 2:

[0069] On the basis of the first embodiment, the method for analyzing measurement anomalies according to the embodiment of the present invention further includes the following steps:

[0070] Step 1: When the metering device is normal, re-obtain the metering value through the metering device, calculate the metering difference based on the re-obtained metering value, compare and analyze the metering difference with the metering difference threshold, so as to determine whether the metering value is abnormal. The specific steps are as follows:

[0071] A1: When the metering device is normal, the metering value is re-obtained through the metering device, and the metering difference is calculated based on the difference between the re-obtained metering value and the actual value, and the metering difference is marked as S;

[0072] A2: Compare and analyze the measurement difference S with the measurement difference threshold;

[0073] If the measurement difference S ≤ the measurement difference threshold, it means that the error of the measurement value is within the normal error range of the actual value, that is, the measurement value is judged to be normal;

[0074] If the measurement difference S>the measurement difference threshold, it means that the error of the measurement value exceeds the normal error range of the actual value, that is, the measurement value is judged to be abnormal;

[0075] Step 2: When the metering device obtains an abnormal metering value, obtain the metering temperature of the metering device when obtaining the metering value, calculate the temperature difference according to the metering temperature, and then calculate the temperature influence value according to the metering difference and the temperature difference. Compare and analyze the temperature influence value with the temperature influence threshold to determine whether the temperature has an impact on the metering device when obtaining the metering value. The specific steps are as follows:

[0076] B1: When the metering device obtains an abnormal metering value, obtain the metering temperature of the metering device when obtaining the metering value;

[0077] B2: Calculate the difference between the measurement temperature and the standard operating temperature of the measurement equipment to obtain the temperature difference, and mark the temperature difference as W;

[0078] B3: Process the measurement difference S and temperature difference W, and use the formula: M = a 1 ×S 2 ×W 2 +a 2 , obtain the temperature influence value M, where a 1 and a 2 are preset scaling factors, and are all greater than 0;

[0079] B4: Compare and analyze the temperature impact value M with the temperature impact threshold;

[0080] If the temperature influence value M ≤ the temperature influence threshold, it means that the temperature has little influence on the measuring device, that is, it is determined that the temperature is not the main reason for the abnormality when the measuring device obtains the measuring value;

[0081] If the temperature influence value M> the temperature influence threshold, it means that the temperature has a great influence on the metering device, that is, it is determined that the temperature is the main reason for the abnormality when the metering device obtains the metering value;

[0082] Step 3: Draw a curve graph based on historical data and derive the curve equation. Calculate the measurement difference based on the temperature difference during measurement and the curve equation to obtain the actual value. The specific steps are as follows:

[0083] C1: Draw a curve chart based on the historical data of the measurement value measured by the measuring equipment, such as Figure 3 ,The historical data includes: the historical measurement difference of the measuring device and the corresponding temperature difference;

[0084] C2: According to the historical data and curve graph of the measuring equipment, the curve equation is: S 2 =2pW, where S≥0, W≥0, p>0;

[0085] C3: Re-measure with the metering device to obtain the metering value, metering temperature and temperature difference. Calculate the metering difference based on the temperature difference and the curve equation to obtain the actual value. The specific method is as follows:

[0086] Re-measure with the metering device to obtain the metering value, metering temperature and temperature difference, and mark the metering value and temperature difference obtained this time as: metering value ae, temperature difference We;

[0087] Substitute the temperature difference We into the curve equation: S 2 =2pW, so the measurement difference is ±Se;

[0088] According to the curve chart, the current measurement temperature is compared with the standard operating temperature of the measurement equipment to calculate the actual value;

[0089] When the current measurement temperature is ≤ the standard operating temperature of the measurement equipment, the actual value = measurement value ae + measurement difference Se;

[0090] When the current measurement temperature is greater than the standard operating temperature of the measurement equipment, the actual value = measurement value ae-measurement difference Se;

[0091] Embodiment three:

[0092] On the basis of the first and second embodiments, a measurement abnormality analysis system according to an embodiment of the present invention includes:

[0093] A data metering module, wherein the data metering module is used to obtain a metering value and a metering temperature, wherein the metering value includes a pressure value, a flow value, an electric energy loss value, etc.;

[0094] A drawing module, which is used to construct a line graph in an XY two-dimensional coordinate system according to the measured measurement values ​​and measurement times, where X represents the measurement times, Y represents the measurement values, and f is a fitted straight line; draw a curve graph according to historical data and derive a curve equation;

[0095] A data processing module, the data processing module is used to calculate the shaded area enclosed by the broken line and the fitted straight line in the broken line graph; calculate the metering difference; calculate the temperature difference; calculate the temperature influence value by a formula based on the metering difference and the temperature difference; calculate the metering difference based on the temperature difference and the curve equation, thereby calculating the actual value;

[0096] The data analysis module is used to compare and analyze the shadow area with the shadow area threshold; compare and analyze the metering difference S with the metering difference threshold; compare and analyze the temperature influence value M with the temperature influence threshold; and compare and analyze the metering temperature with the standard operating temperature of the metering equipment according to the curve chart.

[0097] The above is a detailed description of an embodiment of the present invention, but the content is only a preferred embodiment of the present invention and cannot be considered to limit the scope of implementation of the present invention. All equivalent changes and improvements made within the scope of the present invention should still fall within the scope of the patent coverage of the present invention.

Claims

1. A method for analyzing measurement anomalies, characterized in that: The specific method includes the following steps: Step 1: repeatedly measure the same measurement value through the measuring device to obtain multiple measurement values, and construct a line graph in the XY two-dimensional coordinate system based on the multiple measurement values, and analyze the line graph to determine whether the measuring device is abnormal; Step 2: When the metering device is normal, the metering value is re-acquired through the metering device, and the metering difference is calculated according to the re-acquired metering value, and the metering difference is compared and analyzed with the metering difference threshold, so as to determine whether the metering value is abnormal; Step 3: When the metering device obtains an abnormal metering value, obtain the metering temperature of the metering device when obtaining the metering value, calculate the temperature difference according to the metering temperature, and then calculate the temperature influence value according to the metering difference and the temperature difference, compare and analyze the temperature influence value with the temperature influence threshold, and determine whether the temperature has an impact on the metering device when obtaining the metering value; Step 4: Draw a curve graph based on historical data and derive the curve equation. Perform difference calculation based on the temperature difference during measurement and the curve equation to obtain the measurement difference, thereby obtaining the actual value.

2. The method for analyzing measurement anomalies according to claim 1, characterized in that: The specific steps of determining whether the measuring device is abnormal are as follows: D1: The same measurement value is repeatedly measured by a measuring device to obtain multiple measurement values, and the measurement values ​​are marked as ai, i = 1, 2, 3, ..., n. The measuring device includes: a sensor, an instrument, etc.; the measurement value includes a pressure value, a flow value, an electric energy loss value, etc.: D2: Based on the measured measurement value and measurement times, a line graph is constructed in the XY two-dimensional coordinate system, where X represents the measurement times, Y represents the measurement value, and f is the fitting line; D3: Calculate the shaded area enclosed by the broken line and the fitted straight line in the line graph, and mark the shaded area as G; D4: Compare and analyze the shadow area G with the shadow area threshold; If the shadow area G ≤ the shadow area threshold, the measuring device is judged to be normal; If the shadow area G>the shadow area threshold, the metering device is determined to be abnormal.

3. The method for analyzing measurement anomalies according to claim 1, characterized in that: The specific steps of determining whether the measurement value is abnormal are: A1: When the metering device is normal, the metering value is re-obtained through the metering device, and the metering difference is calculated based on the difference between the re-obtained metering value and the actual value, and the metering difference is marked as S; A2: Compare and analyze the measurement difference S with the measurement difference threshold; If the measurement difference S ≤ the measurement difference threshold, the measurement value is determined to be normal; If the measurement difference S>the measurement difference threshold, the measurement value is determined to be abnormal.

4. The method for analyzing measurement anomalies according to claim 1, characterized in that: The specific steps of determining whether the temperature has an impact on the measurement value obtained by the measuring device are: B1: When the metering device obtains an abnormal metering value, obtain the metering temperature of the metering device when obtaining the metering value; B2: Calculate the difference between the measurement temperature and the standard operating temperature of the measurement equipment to obtain the temperature difference, and mark the temperature difference as W; B3: Process the measurement difference S and temperature difference W through the formula: M=a1×S 2 ×W 2 +a2, obtain the temperature influence value M, where a1 and a2 are preset proportional factors and both are greater than 0; B4: Compare and analyze the temperature impact value M with the temperature impact threshold; If the temperature influence value M ≤ the temperature influence threshold, it is determined that the temperature is not the main cause of the abnormality in obtaining the measurement value of the measuring device; If the temperature influence value M>the temperature influence threshold, it is determined that the temperature is the main cause of the abnormality when the metering device obtains the metering value.

5. The method for analyzing measurement anomalies according to claim 1, characterized in that: The specific steps of calculating the measurement difference are: C1: Draw a curve chart based on the historical data of the measurement value measured by the measuring device, the historical data including: the historical measurement difference of the measuring device and the corresponding temperature difference; C2: According to the historical data and curve graph of the measuring equipment, the curve equation is: S 2 =2pW, where S≥0, W≥0, p>0; C3: Re-measure with the metering device to obtain the metering value, metering temperature and temperature difference, and calculate the metering difference based on the temperature difference and the curve equation.

6. The method for analyzing measurement anomalies according to claim 1, characterized in that: The specific steps of calculating the actual value are: K1: Re-measure with the metering device to obtain the metering value, metering temperature and temperature difference, and mark the metering value and temperature difference obtained this time as: metering value ae, temperature difference We; K2: Substitute the temperature difference We into the curve equation: S 2 =2pW, so the measurement difference is ±Se; K3: According to the curve chart, compare and analyze the current measurement temperature with the standard operating temperature of the measurement equipment to calculate the actual value.

7. The method for analyzing measurement anomalies according to claim 1, characterized in that: The measuring temperature is compared and analyzed with the standard operating temperature of the measuring equipment, and the method for calculating the actual value is: When the current measurement temperature is ≤ the standard operating temperature of the measurement equipment, the actual value = measurement value ae + measurement difference Se; When the current measurement temperature is greater than the standard operating temperature of the measurement equipment, the actual value = the measurement value ae-the measurement difference Se.

8. A measurement anomaly analysis system, characterized in that: include: A data metering module, the data metering module is used to repeatedly measure the same metering value through a metering device, thereby obtaining multiple metering values, and obtaining the metering temperature of the metering device when obtaining the metering values; A drawing module, the drawing module is used to construct a line graph in an XY two-dimensional coordinate system according to a plurality of measurement values; A data processing module, the data processing module is used to re-acquire the metering value through the metering device, and calculate the metering difference according to the re-acquired metering value; calculate the temperature difference according to the metering temperature, and then calculate the temperature influence value according to the metering difference and the temperature difference; draw a curve graph according to historical data, and obtain the curve equation, and calculate the difference according to the temperature difference during metering and the curve equation to obtain the metering difference, so as to obtain the actual value; A data analysis module, which is used to analyze the line graph to determine whether the metering equipment is abnormal; Compare and analyze the measurement difference with the measurement difference threshold to determine whether the measurement value is abnormal; The temperature impact value is compared with the temperature impact threshold to determine whether the temperature has an impact on the measurement value obtained by the metering device.

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