Multi-channel data sampling method and system based on semiconductor equipment

Abstract

The invention discloses a multi-channel data sampling method based on semiconductor equipment, and relates to the technical field of semiconductor manufacturing, and the multi-channel data sampling method based on the semiconductor equipment comprises the steps: setting an analog quantity sensing device; outputting an analog voltage signal based on the analog quantity sensing device; inputting the analog voltage signal into an analog-to-digital conversion device, configuring a benchmark reference voltage and an amplification factor according to a benchmark reference model, and generating a reference voltage signal; converting and storing the reference voltage signal by using an analog-to-digital conversion device, and generating a voltage storage byte; carrying out full scale conversion and floating point calculation on the voltage storage bytes, and generating a floating point calculation value; converting the floating point operation value, storing the converted floating point operation value to a data cache channel, and generating a data cache value; and based on the data cache value, reading and packaging the data cache value and sending the data cache value to a data management device.

Description

Technical Field

[0001] The present application relates to the field of semiconductor manufacturing technology, and in particular to a multi-channel data sampling method and system based on semiconductor equipment. Background Art

[0002] With the rapid development of chip technology, the requirements for the real-time, high efficiency and reliability of semiconductor equipment are becoming higher and higher, and the process requirements for semiconductor equipment are also becoming higher and higher. Among them, the sampling process of semiconductor equipment is indispensable.

[0003] Semiconductor equipment usually requires high-speed data communication capabilities to support rapid response and accurate control. When sampling semiconductor equipment, it is very necessary to monitor a large amount of data. By monitoring a large amount of data, it can ensure that the performance and parameters of the semiconductor equipment during operation meet expectations, and any abnormalities or changes can be discovered in time. However, the amount of data generated by semiconductor equipment is relatively large and complex. If the data acquisition system or processor is not capable of quickly processing and analyzing this data, it will affect the reliability of monitoring when a large amount of data needs to be processed.

[0004] In view of this, we need a multi-channel data sampling method and system based on semiconductor devices to solve the above problems. Summary of the invention

[0005] The purpose of this application is to solve the problem that existing sampling methods cannot monitor large amounts of data. In order to solve the above technical problems, a multi-channel data sampling method and system based on semiconductor devices is provided, which can monitor large amounts of data.

[0006] To achieve the above-mentioned purpose, the embodiment of the present application adopts the following technical scheme: a multi-channel data sampling method based on a semiconductor device, wherein the method includes: setting an analog quantity sensing device; outputting an analog voltage signal based on the analog quantity sensing device; inputting the analog voltage signal into an analog-to-digital conversion device, configuring the reference reference voltage and the amplification factor according to the reference reference model, and generating a reference voltage signal; using the analog-to-digital conversion device to convert and store the reference voltage signal, and generate a voltage storage byte; performing full-scale conversion and floating-point calculation on the voltage storage byte, and generating a floating-point operation value; converting the floating-point operation value and storing it in a data cache channel, and generating a data cache value; based on the data cache value, reading the data cache value and encapsulating it and sending it to a data management device.

[0007] Further, according to an embodiment of the present application, an analog quantity sensing device is set, and the method also includes: setting an analog quantity sensor, wherein the number of sensor channels of the analog quantity sensor is at least eight; summarizing according to the analog quantity sensor and generating an analog quantity sensing device, wherein the number of sensor device channels of the analog quantity sensing device is at least eighty.

[0008] Further, according to an embodiment of the present application, an analog voltage signal is input into an analog-to-digital conversion device, a reference reference voltage and a gain are configured according to a reference reference model, and a reference voltage signal is generated. The method also includes: obtaining a positive reference voltage value and a negative reference voltage value in real time; generating a reference reference voltage based on subtracting the positive reference voltage value and the negative reference voltage value; amplifying the signal based on the analog voltage signal and the gain to generate a voltage amplification signal; and performing internal conversion based on the voltage amplification signal and the reference reference voltage to generate a reference voltage signal.

[0009] Further, according to an embodiment of the present application, a reference voltage signal is converted and stored using an analog-to-digital conversion device to generate a voltage storage byte. The method also includes: based on the reference voltage signal, converting and generating voltage sampling data using the analog-to-digital conversion device; based on the voltage sampling data, the microcontroller reads through a communication channel and stores it according to storage specifications, and generates a voltage storage byte.

[0010] Further, according to an embodiment of the present application, the voltage storage byte is subjected to full-scale conversion and floating-point calculation, and a floating-point operation value is generated. The method also includes: obtaining the full-scale voltage value; based on the full-scale voltage value and the analog-to-digital conversion device, converting the full-scale voltage value into a voltage millivolt value, and generating full-scale sampling data; performing floating-point calculation based on the voltage millivolt value, the full-scale sampling data and the voltage storage byte, and generating a floating-point operation value.

[0011] Further, according to an embodiment of the present application, the floating-point operation value is converted and stored in a data cache channel, and a data cache value is generated. The method also includes: according to a character conversion device, the floating-point operation value is converted to generate a character encoding signal; the character encoding information is stored in the data cache channel according to a storage format to generate a data cache value.

[0012] Further, according to an embodiment of the present application, based on the data cache value, the data cache value is read and encapsulated and sent to the data management device. The method includes: based on the data cache value, sending multiple data cache values ​​to the slave control device; the slave control device encapsulates the multiple data cache values ​​into the data link layer and forms a data field; and sending the data field to the data management device.

[0013] To achieve the above-mentioned purpose, the embodiment of the present application also adopts the following technical scheme: a multi-channel data sampling system based on a semiconductor device, the system comprising: a sensor device setting module, the sensor device setting module is used to set an analog quantity sensor device; a signal output module, the signal output module is used to output an analog voltage signal based on the analog quantity sensor device; a voltage reference module, the voltage reference module is used to input the analog voltage signal into the analog-to-digital conversion device, configure the reference reference voltage and the amplification factor according to the reference reference model, and generate a reference voltage signal; a voltage conversion module, the voltage conversion module is used to convert and store the reference voltage signal using the analog-to-digital conversion device, and generate a voltage storage byte; a voltage calculation module, the voltage calculation module is used to perform full-scale conversion and floating-point calculation on the voltage storage byte, and generate a floating-point operation value; a numerical storage module, the numerical storage module is used to convert the floating-point operation value and store it in the data cache channel, and generate a data cache value; a read encapsulation module, the read encapsulation module is used to read the data cache value based on the data cache value and encapsulate it and send it to the data management device.

[0014] To achieve the above-mentioned purpose, an embodiment of the present application also discloses an electronic device, which includes a processor; a memory, in which computer program instructions are stored. When the computer program instructions are executed by the processor, the processor executes a multi-channel data sampling method and system based on a semiconductor device as described above.

[0015] To achieve the above objectives, an embodiment of the present application further discloses a computer-readable storage medium on which computer program instructions are stored. When the computer program instructions are executed by a processor, the processor executes a multi-channel data sampling method and system based on a semiconductor device as described above.

[0016] Beneficial effects:

[0017] The present application is based on an analog quantity sensing device outputting an analog voltage signal; inputting the analog voltage signal into an analog-to-digital conversion device, configuring a reference reference voltage and a magnification factor according to a reference reference model, and generating a reference voltage signal; using the analog-to-digital conversion device to convert and store the reference voltage signal, and generating a voltage storage byte; performing full-scale conversion and floating-point calculation on the voltage storage byte, and generating a floating-point operation value; converting the floating-point operation value and storing it in a data cache channel, and generating a data cache value; based on the data cache value, reading the data cache value, encapsulating it and sending it to a data management device, thereby achieving the technical effect of being able to monitor a large amount of data, and solving the technical problem that the existing sampling method cannot monitor a large amount of data. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The present application is further described below in conjunction with the accompanying drawings and embodiments.

[0019] Figure 1 It is a flowchart of a multi-channel data sampling method based on semiconductor equipment in the present application.

[0020] Figure 2 This is a structural diagram of a multi-channel data sampling system based on semiconductor devices in the present application.

[0021] Figure 3 It is a structural diagram of the electronic device of this application. DETAILED DESCRIPTION

[0022] In order to make the purpose and technical solution of the present invention clearly and completely described, and the advantages more clearly understood, the embodiments of the present invention are further described in detail with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are part of the embodiments of the present invention, rather than all of the embodiments, and are only used to explain the embodiments of the present invention, and are not used to limit the embodiments of the present invention. All other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0023] In the description of the present invention, it should be noted that the terms "center", "middle", "upper", "lower", "left", "right", "inner", "outer", "top", "bottom", "side", "vertical", "horizontal" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "one", "first", "second", "third", "fourth", "fifth", "sixth" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance.

[0024] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0025] For the purpose of simplicity and illustration, the principles of the embodiments are mainly described by reference to examples. In the following description, many specific details are proposed to provide a thorough understanding of the embodiments. However, it is obvious that for those of ordinary skill in the art, these embodiments may not be limited to these specific details in practice. In some instances, known methods and structures are not described in detail to avoid making these embodiments unnecessarily difficult to understand. In addition, all embodiments can be used in combination with each other.

[0026] Embodiment 1:

[0027] like Figure 1 As shown, this embodiment provides a multi-channel data sampling method based on a semiconductor device, wherein the method includes:

[0028] S10, setting an analog quantity sensor device;

[0029] The method further comprises the following steps:

[0030] An analog sensor is provided, wherein the number of sensor channels of the analog sensor is at least eight;

[0031] The analog sensors are aggregated and an analog sensor device is generated, wherein the analog sensor device has at least eighty sensor device channels.

[0032] Specifically, in the sampling process of semiconductor equipment, it is necessary to carry out actual and effective data monitoring and control to meet the expected standards. The multi-channel data sampling method based on semiconductor equipment provided in the present application is applied to a multi-channel data sampling system based on semiconductor equipment, which is connected to an analog quantity sensor device, which is an auxiliary device for real-time parameter acquisition. The number of sensor channels in the analog quantity sensor device is set to at least 80. Real-time parameter acquisition is carried out through multiple channels, which can process a large amount of data, and under the condition of real-time control, it will not affect the stability of communication display.

[0033] S20, outputting an analog voltage signal based on the analog quantity sensor device;

[0034] Specifically, the analog quantity sensor device is powered on and works, so that the analog quantity sensor device outputs an analog voltage signal of 0-10V, so as to ensure that the current voltage state information sampled by the semiconductor device can be output.

[0035] S30, inputting the analog voltage signal into the analog-to-digital conversion device, configuring the reference reference voltage and the amplification factor according to the reference reference model, and generating a reference voltage signal;

[0036] The method further comprises the following steps:

[0037] Obtain the positive and negative values ​​of the reference voltage in real time;

[0038] Generate a reference voltage based on the subtraction of the positive reference voltage value and the negative reference voltage value;

[0039] Amplify the signal based on the analog voltage signal and the amplification factor to generate a voltage amplified signal;

[0040] The reference voltage signal is generated by internal conversion based on the voltage amplification signal and the reference voltage.

[0041] Specifically, a 0-10V analog voltage signal is connected to the input end of the analog-to-digital conversion device, and a 2.5V reference voltage is obtained according to the reference voltage = positive reference voltage value - negative reference voltage value. The signal is then amplified according to the amplification factor. Exemplarily, the amplification factor can be 1. An internal conversion is performed based on the voltage amplification signal and the reference reference voltage to generate a reference voltage signal. Exemplarily, the reference voltage signal is 0-5V.

[0042] S40, using an analog-to-digital conversion device to convert and store the reference voltage signal, and generate a voltage storage byte;

[0043] The method further comprises the following steps:

[0044] Based on the reference voltage signal, convert and generate voltage sampling data using an analog-to-digital conversion device;

[0045] Based on the voltage sampling data, the microcontroller reads it through the communication channel and stores it according to the storage specification, and generates a voltage storage byte.

[0046] Specifically, an analog-to-digital conversion device is used to convert a 0-5V reference voltage signal into 24-bit voltage sampling data, which is read by a microcontroller unit through a communication channel and then stored as a 3-byte voltage storage byte according to a storage specification. Exemplarily, the storage specification can be stored in a low address space with the high bit of the data and a high address space with the low bit of the data.

[0047] S50, performing full-scale conversion and floating-point calculation on the voltage storage bytes, and generating a floating-point operation value;

[0048] The method further comprises the following steps:

[0049] Get the full-scale voltage value;

[0050] Based on the full-scale voltage value and the analog-to-digital conversion device, the full-scale voltage value is converted into a voltage millivolt value, and full-scale sampling data is generated;

[0051] Perform floating-point calculation based on the voltage millivolt value, full-scale sampling data, and voltage storage bytes, and generate a floating-point operation value.

[0052] Specifically, according to the configuration of the analog-to-digital conversion device, the full-scale voltage value is obtained, and then the full-scale voltage value is converted into a voltage millivolt value. For example, the full-scale voltage value is 5V, and the voltage millivolt value after conversion is 5×10 3 mV, the corresponding full-scale sampling data is 2 24 , that is, 16777216, is calculated by multiplying the voltage storage byte by the voltage millivolt value and then dividing it by the full-scale sampling data to obtain the floating-point operation value.

[0053] S60, converting the floating-point operation value and storing it in the data cache channel, and generating a data cache value;

[0054] The method further includes:

[0055] According to the character conversion device, the floating point operation value is converted to generate a character code signal;

[0056] The character encoding information is stored in the data cache channel according to the storage format to generate a data cache value.

[0057] Specifically, the floating point operation value is converted to generate a corresponding character encoding signal, which is then stored in an 18-byte data cache channel according to a storage format, and a data cache value is generated. Exemplarily, the storage format is a 2-byte ID number, a 2-byte channel number, a 4-byte timestamp, a 6-byte character encoding signal integer part, and a 4-byte character encoding signal decimal part.

[0058] Repeat the above steps to obtain the data cache values ​​of the 8 channels corresponding to each analog-to-digital conversion device, and store them in the corresponding data cache channels in an 18-byte format. Repeat the above steps to obtain the data cache values ​​of all channels of multiple analog-to-digital conversion devices, and store them in the data cache channels in an 18-byte format. In this way, real-time parameter acquisition is performed through multiple channels, a large amount of data can be processed, and the stability of the communication display will not be affected under real-time control.

[0059] S70: Based on the data cache value, read the data cache value, encapsulate it and send it to the data management device.

[0060] The method further includes:

[0061] Based on the data cache values, sending the plurality of data cache values ​​to the slave control device;

[0062] The slave control device encapsulates the plurality of data buffer values ​​into the data link layer and forms a data field;

[0063] The data fields are sent to the data management device.

[0064] Specifically, using the communication thread, multiple 18*80-byte data cache values ​​are sent to the slave control device, the slave control device encapsulates the 18*80-byte data cache values ​​into the data link layer in the Ethernet protocol and forms a data field, and then sends the data field to the data management device to realize real-time data monitoring.

[0065] The present application is based on an analog quantity sensing device outputting an analog voltage signal; inputting the analog voltage signal into an analog-to-digital conversion device, configuring a reference reference voltage and a magnification factor according to a reference reference model, and generating a reference voltage signal; using the analog-to-digital conversion device to convert and store the reference voltage signal, and generating a voltage storage byte; performing full-scale conversion and floating-point calculation on the voltage storage byte, and generating a floating-point operation value; converting the floating-point operation value and storing it in a data cache channel, and generating a data cache value; based on the data cache value, reading the data cache value, encapsulating it and sending it to a data management device, thereby achieving the technical effect of being able to monitor a large amount of data, and solving the technical problem that the existing sampling method cannot monitor a large amount of data.

[0066] Embodiment 2:

[0067] like Figure 2 As shown, based on the same inventive concept as the multi-channel data sampling method based on a semiconductor device in the aforementioned embodiment, the present invention also provides a multi-channel data sampling system based on a semiconductor device, the system comprising:

[0068] A sensor device setting module 10, the sensor device setting module is used to set an analog sensor device;

[0069] A signal output module 20, the signal output module is used to output an analog voltage signal based on the analog sensor device;

[0070] A voltage reference module 30, the voltage reference module is used to input the analog voltage signal into the analog-to-digital conversion device, configure the reference reference voltage and the amplification factor according to the reference reference model, and generate a reference voltage signal;

[0071] A voltage conversion module 40, the voltage conversion module is used to convert and store the reference voltage signal using an analog-to-digital conversion device, and generate a voltage storage byte;

[0072] A voltage calculation module 50, which is used to perform full-scale conversion and floating-point calculation on the voltage storage bytes and generate floating-point operation values;

[0073] A value storage module 60, which is used to convert floating-point operation values ​​and store them in a data cache channel, and generate data cache values;

[0074] The read encapsulation module 70 is used to read the data cache value based on the data cache value, encapsulate it and send it to the data management device.

[0075] The various variations and specific examples of the multi-channel data sampling method based on semiconductor devices in the aforementioned embodiment 1 are also applicable to a multi-channel data sampling system based on semiconductor devices in this embodiment. Through the aforementioned detailed description of a multi-channel data sampling method based on semiconductor devices, those skilled in the art can clearly understand the implementation method of a multi-channel data sampling system based on semiconductor devices in this embodiment, so for the sake of brevity of the specification, it will not be described in detail here.

[0076] Embodiment three:

[0077] like Figure 3 As shown, the electronic device includes one or more processors and memory.

[0078] The processor may be a central processing unit (CPU) or other forms of processing units with data processing capabilities and / or instruction execution capabilities, and may control other components in the electronic device to perform desired functions.

[0079] The memory may include one or more computer program products, which may include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. The volatile memory may include, for example, random access memory (RAM) and / or cache memory (cache), etc. The non-volatile memory may include, for example, read-only memory (ROM), hard disk, flash memory, etc. One or more computer program instructions may be stored on the computer-readable storage medium, and the processor may run the program instructions to implement the above-mentioned multi-channel data sampling method based on semiconductor devices and / or other desired functions of various embodiments of the present application. Various contents may also be stored in the computer-readable storage medium, and the volatile memory can save the functions related to the present application.

[0080] Secondly, the electronic device also includes an input device and an output device, and these components are interconnected via a bus system and / or other forms of connection mechanisms (not shown).

[0081] For example, when the electronic device is a stand-alone device, the input device may be a communication network connector. In addition, the input device may also include, for example, a keyboard, a mouse, and the like.

[0082] The output device can output various information to the outside, including the generated time sequence reading data, character encoding information, etc. The output device can include, for example, a display, a speaker, a printer, and a communication network and its connected remote output device.

[0083] Of course, for the sake of simplicity, the figure only shows some of the components in the electronic device related to the present application, omitting components such as bus, input / output interface, etc. In addition, the electronic device may also include any other appropriate components according to specific application conditions.

[0084] In addition, an embodiment of the present application may also be a computer-readable storage medium having computer program instructions stored thereon, which, when executed by a processor, enables the processor to execute the steps of a multi-channel data sampling method based on a semiconductor device according to various embodiments of the present application described in the above “Exemplary Method” section of this specification.

[0085] The computer readable storage medium can adopt any combination of one or more readable media. The readable medium can be a readable signal medium or a readable storage medium. The readable storage medium can include, for example, but is not limited to, a system, device or device of electricity, magnetism, light, electromagnetic, infrared, or semiconductor, or any combination of the above. More specific examples (non-exhaustive list) of readable storage media include: an electrical connection with one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0086] Although the above describes the illustrative specific implementation methods of the present application so that technicians in this technical field can understand the present application, the present application is not limited to the scope of the specific implementation methods. For ordinary technicians in this technical field, as long as various changes are within the spirit and scope of the present application defined and determined by the attached claims, all application creations using the concept of the present application are protected.

Claims

1. A multi-channel data sampling method based on semiconductor devices, wherein: The method comprises: Set up analog quantity sensing device; Outputting an analog voltage signal based on the analog quantity sensor device; Inputting the analog voltage signal into an analog-to-digital conversion device, configuring a reference reference voltage and an amplification factor according to a reference reference model, and generating a reference voltage signal; The reference voltage signal is converted and stored by using an analog-to-digital conversion device, and a voltage storage byte is generated; Performing full-scale conversion and floating-point calculation on the voltage storage bytes, and generating floating-point operation values; Converting the floating point operation value and storing it in a data cache channel, and generating a data cache value; Based on the data cache value, the data cache value is read and packaged and sent to the data management device.

2. A multi-channel data sampling method based on semiconductor equipment according to claim 1, characterized in that: Setting an analog quantity sensing device, the method further comprises: An analog quantity sensor is provided, wherein the number of sensor channels of the analog quantity sensor is at least eight; The analog quantity sensors are aggregated to generate the analog quantity sensing device, wherein the analog quantity sensing device has at least eighty sensing device channels.

3. The multi-channel data sampling method based on semiconductor equipment according to claim 1, characterized in that: The analog voltage signal is input into an analog-to-digital conversion device, a reference reference voltage and an amplification factor are configured according to a reference reference model, and a reference voltage signal is generated. The method further includes: Obtain the positive and negative values ​​of the reference voltage in real time; Generate the base reference voltage based on the subtraction of the positive reference voltage value and the negative reference voltage value; Amplify the analog voltage signal and the amplification factor to generate an amplified voltage signal; An internal conversion is performed based on the voltage amplification signal and the base reference voltage to generate a reference voltage signal.

4. The multi-channel data sampling method based on semiconductor equipment according to claim 1, characterized in that: The reference voltage signal is converted and stored by using an analog-to-digital conversion device to generate a voltage storage byte. The method further includes: Based on the reference voltage signal, convert and generate voltage sampling data using the analog-to-digital conversion device; Based on the voltage sampling data, the microcontroller reads the data through a communication channel and stores the data according to a storage specification, and generates the voltage storage byte.

5. The multi-channel data sampling method based on semiconductor equipment according to claim 1, characterized in that: The voltage storage byte is subjected to full-scale conversion and floating-point calculation, and a floating-point operation value is generated. The method further comprises: Get the full-scale voltage value; Based on the full-scale voltage value and the analog-to-digital conversion device, convert the full-scale voltage value into a voltage millivolt value, and generate full-scale sampling data; A floating point calculation is performed based on the voltage millivolt value, the full-scale sampling data and the voltage storage byte, and a floating point operation value is generated.

6. The multi-channel data sampling method based on semiconductor equipment according to claim 1, characterized in that: The floating point operation value is converted and stored in a data cache channel, and a data cache value is generated. The method further includes: According to the character conversion device, the floating point operation value is converted to generate a character encoding signal; The character encoding information is stored in a data cache channel according to a storage format to generate the data cache value.

7. A multi-channel data sampling method based on semiconductor equipment according to claim 6, characterized in that: Based on the data cache value, the data cache value is read and packaged and sent to a data management device, the method comprising: Based on the data cache value, sending a plurality of the data cache values ​​to a slave control device; The slave control device encapsulates the plurality of data cache values ​​into a data link layer to form a data field; The data field is sent to the data management device.

8. A multi-channel data sampling system based on semiconductor devices, characterized in that: The system comprises: A sensor device setting module, wherein the sensor device setting module is used to set an analog sensor device; A signal output module, the signal output module is used to output an analog voltage signal based on the analog quantity sensor device; A voltage reference module, the voltage reference module is used to input the analog voltage signal into the analog-to-digital conversion device, configure the reference reference voltage and the amplification factor according to the reference reference model, and generate a reference voltage signal; A voltage conversion module, the voltage conversion module is used to convert and store the reference voltage signal using an analog-to-digital conversion device, and generate a voltage storage byte; A voltage calculation module, the voltage calculation module is used to perform full-scale conversion and floating-point calculation on the voltage storage bytes and generate a floating-point operation value; A numerical storage module, the numerical storage module is used to convert the floating-point operation value and store it in a data cache channel, and generate a data cache value; A read encapsulation module is used to read the data cache value based on the data cache value, encapsulate the data and send it to the data management device.

9. An electronic device, comprising: processor; A memory, wherein computer program instructions are stored in the memory, and when the computer program instructions are executed by the processor, the processor executes the multi-channel data sampling method based on a semiconductor device as claimed in any one of claims 1 to 7.

10. A computer-readable storage medium having computer program instructions stored thereon, wherein when the computer program instructions are executed by a processor, the processor is enabled to execute the multi-channel data sampling method based on a semiconductor device as claimed in any one of claims 1 to 7.

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