Method, device, equipment, storage medium and program product for detecting abnormal state of charge

Abstract

The present application relates to a method, device, equipment, storage medium and program product for detecting abnormal state of charge. The method comprises: determining each first SOC change rate according to the first state of charge SOC in the power-down parameters of the battery at multiple moments, determining the target SOC according to the correspondence between voltage and SOC, the maximum voltage and the minimum voltage corresponding to the moment, and determining the simulated SOC change rate as the second SOC change rate based on the target SOC corresponding to each moment, and for each preset SOC interval, determining the abnormal detection result of each first SOC located in the preset SOC interval according to the first SOC change rate and the second SOC change rate corresponding to each first SOC located in the preset SOC interval. Since it is not necessary to leave the battery at rest for a long time, measure the resting voltage of the battery after resting, and fully charge the battery, it is possible to determine whether the SOC is abnormal, thereby saving the time required for SOC abnormality detection and improving the efficiency of SOC abnormality detection.

Description

Technical Field

[0001] The present application relates to the field of battery technology, and in particular to a method, device, equipment, storage medium and program product for detecting abnormal charge state. Background Art

[0002] The state of charge (SOC) of a battery refers to the ratio of the remaining capacity of the battery to its capacity when fully charged. SOC is crucial for battery energy management, safety monitoring, and health maintenance, so it is necessary to test SOC.

[0003] At present, it is usually necessary to place the battery at rest for a long time and measure the resting voltage of the battery after resting. The battery is then fully charged and the resting voltage is used as the open circuit voltage (OCV) of the battery. The target SOC is then determined based on the open circuit voltage and the amount of electricity charged into the battery. The target SOC is then judged whether it is abnormal based on the SOC determined by the battery management system.

[0004] However, current SOC detection methods suffer from the problem of low SOC anomaly detection efficiency. Summary of the invention

[0005] Based on this, it is necessary to provide a state of charge abnormality detection method, device, equipment, storage medium and program product that can improve the efficiency of SOC abnormality detection in response to the above technical problems.

[0006] In a first aspect, the present application provides a method for detecting abnormal state of charge. The method comprises:

[0007] Determine each first SOC change rate according to a first state of charge SOC among the electrical parameters of the battery at multiple times; the electrical parameters include at least a maximum voltage, a minimum voltage, a current, a temperature and a first SOC;

[0008] For each of the moments, according to the correspondence between voltage and SOC, the maximum voltage and the minimum voltage corresponding to the moment, determine a second SOC corresponding to the maximum voltage and a third SOC corresponding to the minimum voltage;

[0009] determining a target SOC corresponding to the moment according to the second SOC and the third SOC;

[0010] determining the second SOC change rate based on the target SOC corresponding to each of the moments;

[0011] For each preset SOC interval, determining an abnormality detection result of each first SOC located in the preset SOC interval according to a first SOC change rate and a second SOC change rate corresponding to each first SOC located in the preset SOC interval;

[0012] The determining the second SOC change rate based on the target SOC corresponding to each of the moments includes:

[0013] Determine a reference simulated SOC from each of the target SOCs based on a target electrical parameter corresponding to each of the target SOCs; the target electrical parameter at least includes data other than the first SOC among the electrical parameters at the time;

[0014] Determine the simulated SOC corresponding to the other moments according to the reference simulated SOC, the rated capacity of the battery cell in the battery, the health status of the battery, and the accumulated power corresponding to other moments; the other moments include moments other than the moments corresponding to the reference simulated SOC;

[0015] A simulated SOC change rate is determined based on each of the simulated SOCs; and the second SOC change rate includes the simulated SOC change rate.

[0016] The method provided in this embodiment determines each first SOC change rate according to the first state of charge SOC in the electrical parameters of the battery at multiple moments, determines the target SOC according to the corresponding relationship between voltage and SOC, the maximum voltage and the minimum voltage corresponding to the moment, and determines the simulated SOC change rate as the second SOC change rate based on the target SOC corresponding to each moment, and determines the abnormal detection result of each first SOC located in the preset SOC interval according to the first SOC change rate and the second SOC change rate corresponding to each first SOC located in the preset SOC interval for each preset SOC interval. Since the electrical parameters at multiple moments are the data already available for the battery in the historical time period, the embodiment of the present application directly uses the existing electrical parameters of the battery in the historical time period to determine the abnormal detection result of the SOC, and does not need to leave the battery at rest for a long time, measure the static voltage of the battery after resting, and fully charge the battery when it is necessary to evaluate whether the SOC is abnormal, thereby saving the time required for SOC abnormal detection and improving the efficiency of SOC abnormal detection.

[0017] In one embodiment, determining the second SOC change rate based on the target SOC corresponding to each moment includes:

[0018] Determine a change in the target SOC between two adjacent moments based on the target SOC corresponding to two adjacent moments in each moment;

[0019] An interpolated SOC change rate is determined based on the change amount of the target SOC at two moments and the time change amount at two moments; the second SOC change rate includes the interpolated SOC change rate.

[0020] The method provided in this embodiment determines the change amount of the target SOC at two moments based on the target SOC corresponding to two adjacent moments in each moment, determines the interpolated SOC change rate based on the change amount of the target SOC at two moments and the time change amount at two moments, and the second SOC change rate includes the interpolated SOC change rate, thereby laying a foundation for determining the abnormal detection result of each first SOC located in the preset SOC interval according to the first SOC change rate and the second SOC change rate corresponding to each first SOC located in the preset SOC interval, and using the interpolated SOC change rate as the second SOC change rate can improve the flexibility of determining the second SOC change rate.

[0021] In one embodiment, determining the abnormality detection result of each first SOC in the preset SOC interval according to the first SOC change rate and the second SOC change rate corresponding to each first SOC in the preset SOC interval includes:

[0022] For each first SOC in a preset SOC interval, determining a change rate difference corresponding to the first SOC according to a first SOC change rate and a second SOC change rate corresponding to the first SOC;

[0023] Based on the change rate differences corresponding to the preset SOC intervals, the abnormality detection results of the first SOCs in the preset SOC intervals are determined.

[0024] The method provided in this embodiment determines the change rate difference corresponding to the first SOC according to the first SOC change rate and the second SOC change rate corresponding to the first SOC, and determines the abnormal detection result of each first SOC in the preset SOC interval based on each change rate difference corresponding to the preset SOC interval. Since it is not necessary to leave the battery at rest for a long time, measure the resting voltage of the battery after resting, and fully charge the battery, it is possible to determine whether the SOC is abnormal, thereby saving the time required for SOC abnormality detection and improving the efficiency of SOC abnormality detection.

[0025] In one embodiment, based on each change rate difference corresponding to the preset SOC interval, determining the abnormality detection result of each first SOC in the preset SOC interval includes:

[0026] Determining an SOC change rate threshold corresponding to a preset SOC interval based on each change rate difference corresponding to a preset SOC interval;

[0027] Determining an SOC change rate threshold interval corresponding to the preset SOC interval based on an SOC change rate threshold corresponding to the preset SOC interval;

[0028] According to the SOC change rate threshold interval corresponding to the preset SOC interval, the abnormality detection result of each first SOC in the preset SOC interval is determined.

[0029] The method provided in this embodiment determines the SOC change rate threshold corresponding to the preset SOC interval based on each change rate difference corresponding to the preset SOC interval, and then determines the SOC change rate threshold interval corresponding to the preset SOC interval based on the SOC change rate threshold, and determines the abnormal detection results of each first SOC in the preset SOC interval according to the SOC change rate threshold interval corresponding to the preset SOC interval. Since this embodiment does not need to perform a specific working condition test when determining, but the SOC change rate threshold interval is determined based on historical data, the SOC calculated by the BMS can be detected in a timely manner, improving the timeliness and convenience of SOC abnormality detection, and saving the time required for SOC abnormality detection, thereby improving the efficiency of SOC abnormality detection.

[0030] In one of the embodiments, based on the SOC change rate threshold corresponding to the preset SOC interval, determining the SOC change rate threshold interval corresponding to the preset SOC interval includes:

[0031] Performing cluster analysis on the SOC change rate thresholds corresponding to the preset SOC intervals to obtain cluster analysis results;

[0032] According to the cluster analysis results, the abnormal SOC change rate threshold is determined from the SOC change rate thresholds;

[0033] The SOC change rate threshold interval is determined based on the SOC change rate thresholds other than the abnormal SOC change rate threshold.

[0034] The method provided in the present embodiment improves the accuracy of the determined SOC change rate threshold interval by determining an abnormal SOC change rate threshold and determining a SOC change rate threshold interval based on an SOC change rate threshold other than the abnormal SOC change rate threshold, thereby improving the accuracy of the abnormal detection result of each first SOC in a preset SOC interval determined based on the SOC change rate threshold interval corresponding to the preset SOC interval.

[0035] In one embodiment, determining the abnormality detection result of each first SOC in the preset SOC interval according to the SOC change rate threshold interval corresponding to the preset SOC interval includes:

[0036] For each first SOC in the preset SOC interval, if a first SOC change rate corresponding to the first SOC is within an SOC change rate threshold interval corresponding to the preset SOC interval, determining that the abnormality detection result is that the first SOC is normal;

[0037] If the first SOC change rate corresponding to the first SOC is outside the SOC change rate threshold interval corresponding to the preset SOC interval, it is determined that the abnormality detection result is that the first SOC is abnormal.

[0038] In the method provided in this embodiment, a preset SOC interval corresponds to an SOC change rate threshold interval, so that whether the first SOC within the preset SOC interval is abnormal can be determined based on the SOC change rate threshold interval corresponding to the preset SOC interval, thereby realizing SOC abnormality detection, saving the time required for SOC abnormality detection, and improving SOC abnormality detection efficiency.

[0039] In one embodiment, the method further comprises:

[0040] Determine a target SOC interval corresponding to each charging time period in a recent preset number of charging time periods, and a first number of target SOC intervals whose abnormal detection result is that the first SOC is normal; the target SOC interval includes a preset SOC interval to which the first SOC in the charging time period belongs;

[0041] Determining a comparison value based on a preset weight corresponding to the target SOC interval during the charging time period and a first number;

[0042] Determining a reference value according to a second number of the first SOC in the charging time period and a preset weight corresponding to each preset SOC interval;

[0043] An abnormality detection result of the first SOC in the charging period is determined based on the comparison value and the reference value.

[0044] The method provided in this embodiment can re-determine the first SOC in the charging time period by determining the abnormal detection result of the first SOC in the charging time period based on the comparison value and the reference value to improve the accuracy of the abnormal detection result of the first SOC in the charging time period.

[0045] In one embodiment, determining the comparison value based on the preset weight corresponding to the preset SOC interval in the charging time period and the first number includes:

[0046] Determine a first weighted value corresponding to the charging time period based on a first product of a preset weight corresponding to a preset SOC interval in the charging time period and the first number;

[0047] The comparison value is determined according to the first weighted value corresponding to each charging time period.

[0048] The method provided in this embodiment determines a first weighted value corresponding to the charging time period based on a first product of a preset weight corresponding to the target SOC interval in the charging time period and a first number, and determines a comparison value according to the first weighted value corresponding to each charging time period, thereby laying a foundation for determining an abnormal detection result of the first SOC in the charging time period according to the comparison value and the reference value, and re-determining the first SOC in the charging time period to improve the accuracy of the abnormal detection result of the first SOC in the charging time period.

[0049] In one embodiment, the reference value is determined according to the second number of the first SOC in the charging time period and the preset weights corresponding to the preset SOC intervals, including:

[0050] Determine a summation result of preset weights corresponding to each preset SOC interval;

[0051] Determine an average value of the second number in each charging time period according to the second number of the first SOC in the charging time period;

[0052] A reference value is determined based on the summed result and the average value.

[0053] The method provided in this embodiment determines the summation result of the preset weights corresponding to each preset SOC interval, and determines the average value of the second number in each charging time period according to the second number of the first SOC in the charging time period, and then determines the reference value based on the summation result and the average value, thereby laying a foundation for determining the abnormal detection result of the first SOC in the charging time period according to the comparison value and the reference value, and re-determining the first SOC in the charging time period to improve the accuracy of the abnormal detection result of the first SOC in the charging time period.

[0054] In one embodiment, determining an abnormality detection result of a first SOC in a charging time period according to a comparison value and a reference value includes:

[0055] If the comparison value is less than the reference value, determining that the abnormality detection result of the first SOC in the charging time period is that the first SOC in at least one charging time period is abnormal;

[0056] If the comparison value is not less than the reference value, it is determined that the abnormality detection result of the first SOC in the charging time period is that the first SOC is normal.

[0057] The method provided in this embodiment can realize re-determination of the first SOC in the charging time period, so as to improve the accuracy of the abnormality detection result of the first SOC in the charging time period.

[0058] In one embodiment, the method further comprises:

[0059] For each moment, based on the target electrical parameters at that moment, determine the operating condition identifier corresponding to that moment;

[0060] According to the working condition identification at each moment, the nearest preset number of charging time periods are determined; the charging time period includes a time period composed of moments corresponding to the working condition identification used to characterize the charging working condition.

[0061] The method provided in this embodiment determines the operating condition identifier corresponding to each moment based on the target electrical parameters at the moment, and determines the most recent preset number of charging time periods according to the operating condition identifier at each moment, so that the first SOC corresponding to the most recent preset number of charging time periods can be detected again for abnormalities, thereby improving the accuracy of the abnormality detection results of the first SOC in the charging time period.

[0062] In a second aspect, the present application also provides a device for detecting abnormal state of charge. The device comprises:

[0063] A first determination module is used to determine each first SOC change rate according to a first state of charge SOC in the electrical parameters of the battery at multiple times; the electrical parameters at least include a maximum voltage, a minimum voltage, a current, a temperature and a first SOC;

[0064] A second determination module is used to determine, at each moment, a second SOC corresponding to the maximum voltage and a third SOC corresponding to the minimum voltage according to the correspondence between the voltage and the SOC, the maximum voltage and the minimum voltage corresponding to the moment;

[0065] A third determination module, configured to determine a target SOC corresponding to a moment according to the second SOC and the third SOC;

[0066] a fourth determination module, configured to determine a second SOC change rate based on a target SOC corresponding to each moment;

[0067] A fifth determination module, for determining, for each preset SOC interval, an abnormality detection result of each first SOC located in the preset SOC interval according to a first SOC change rate and a second SOC change rate corresponding to each first SOC located in the preset SOC interval;

[0068] Wherein, based on the target SOC corresponding to each moment, determining the second SOC change rate includes:

[0069] Based on the target electrical parameters corresponding to the target SOCs, a reference simulated SOC is determined from the target SOCs; the target electrical parameters at least include data other than the first SOC among the electrical parameters at the time instant;

[0070] Determine the simulated SOC corresponding to other moments according to the benchmark simulated SOC, the rated capacity of the battery cells, the health status of the battery, and the accumulated power corresponding to other moments; the other moments include the moments other than the moments corresponding to the benchmark simulated SOC;

[0071] A simulated SOC change rate is determined based on each simulated SOC; and the second SOC change rate includes the simulated SOC change rate.

[0072] In a third aspect, the present application further provides a computer device. The computer device includes a memory and a processor, the memory stores a computer program, and the processor implements the following steps when executing the computer program:

[0073] Determine each first SOC change rate according to a first state of charge SOC in a plurality of power-off parameters of the battery at a time;

[0074] At each moment, according to the correspondence between voltage and SOC, the maximum voltage and the minimum voltage corresponding to the moment, determine the second SOC corresponding to the maximum voltage and the third SOC corresponding to the minimum voltage;

[0075] Determine a target SOC corresponding to the moment according to the second SOC and the third SOC;

[0076] Determining a second SOC change rate based on the target SOC corresponding to each moment;

[0077] For each preset SOC interval, determining an abnormality detection result of each first SOC located in the preset SOC interval according to a first SOC change rate and a second SOC change rate corresponding to each first SOC located in the preset SOC interval;

[0078] Wherein, based on the target SOC corresponding to each moment, determining the second SOC change rate includes:

[0079] Based on the target electrical parameters corresponding to the target SOCs, a reference simulated SOC is determined from the target SOCs; the target electrical parameters at least include data other than the first SOC among the electrical parameters at the time instant;

[0080] Determine the simulated SOC corresponding to other moments according to the benchmark simulated SOC, the rated capacity of the battery cells, the health status of the battery, and the accumulated power corresponding to other moments; the other moments include the moments other than the moments corresponding to the benchmark simulated SOC;

[0081] A simulated SOC change rate is determined based on each simulated SOC; and the second SOC change rate includes the simulated SOC change rate.

[0082] In a fourth aspect, the present application further provides a computer-readable storage medium. The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0083] Determine each first SOC change rate according to a first state of charge SOC in a plurality of power-off parameters of the battery at a time;

[0084] At each moment, according to the correspondence between voltage and SOC, the maximum voltage and the minimum voltage corresponding to the moment, determine the second SOC corresponding to the maximum voltage and the third SOC corresponding to the minimum voltage;

[0085] Determine a target SOC corresponding to the moment according to the second SOC and the third SOC;

[0086] Determining a second SOC change rate based on the target SOC corresponding to each moment;

[0087] For each preset SOC interval, determining an abnormality detection result of each first SOC located in the preset SOC interval according to a first SOC change rate and a second SOC change rate corresponding to each first SOC located in the preset SOC interval;

[0088] Wherein, based on the target SOC corresponding to each moment, determining the second SOC change rate includes:

[0089] Based on the target electrical parameters corresponding to the target SOCs, a reference simulated SOC is determined from the target SOCs; the target electrical parameters at least include data other than the first SOC among the electrical parameters at the time instant;

[0090] Determine the simulated SOC corresponding to other moments according to the benchmark simulated SOC, the rated capacity of the battery cells, the health status of the battery, and the accumulated power corresponding to other moments; the other moments include the moments other than the moments corresponding to the benchmark simulated SOC;

[0091] A simulated SOC change rate is determined based on each simulated SOC; and the second SOC change rate includes the simulated SOC change rate.

[0092] In a fifth aspect, the present application further provides a computer program product. The computer program product includes a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0093] Determine each first SOC change rate according to a first state of charge SOC in a plurality of power-off parameters of the battery at a time;

[0094] At each moment, according to the correspondence between voltage and SOC, the maximum voltage and the minimum voltage corresponding to the moment, determine the second SOC corresponding to the maximum voltage and the third SOC corresponding to the minimum voltage;

[0095] Determine a target SOC corresponding to the moment according to the second SOC and the third SOC;

[0096] Determining a second SOC change rate based on the target SOC corresponding to each moment;

[0097] For each preset SOC interval, determining an abnormality detection result of each first SOC located in the preset SOC interval according to a first SOC change rate and a second SOC change rate corresponding to each first SOC located in the preset SOC interval;

[0098] Wherein, based on the target SOC corresponding to each moment, determining the second SOC change rate includes:

[0099] Based on the target electrical parameters corresponding to the target SOCs, a reference simulated SOC is determined from the target SOCs; the target electrical parameters at least include data other than the first SOC among the electrical parameters at the time instant;

[0100] Determine the simulated SOC corresponding to other moments according to the benchmark simulated SOC, the rated capacity of the battery cells, the health status of the battery, and the accumulated power corresponding to other moments; the other moments include the moments other than the moments corresponding to the benchmark simulated SOC;

[0101] A simulated SOC change rate is determined based on each simulated SOC; and the second SOC change rate includes the simulated SOC change rate.

[0102] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0103] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present application. Moreover, the same reference numerals are used throughout the drawings to represent the same components. In the drawings:

[0104] Figure 1 is an internal structure diagram of a computer device provided in an embodiment of the present application;

[0105] Figure 2 It is a flow chart of a method for detecting abnormal state of charge provided in an embodiment of the present application;

[0106] Figure 3 is a flow chart of a second SOC change rate determination method provided in an embodiment of the present application;

[0107] Figure 4 is a flow chart of another method for determining a second SOC change rate provided in an embodiment of the present application;

[0108] Figure 5 It is a flowchart of a method for determining an abnormal detection result of a first SOC provided in an embodiment of the present application;

[0109] Figure 6 is a flow chart of another method for determining an abnormal detection result of a first SOC provided in an embodiment of the present application;

[0110] Figure 7 It is a flow chart of a method for determining a SOC change rate threshold interval provided in an embodiment of the present application;

[0111] Figure 8 is a flowchart of another method for determining an abnormal detection result of a first SOC provided in an embodiment of the present application;

[0112] Fig. 9 is a flow chart of a method for determining a comparison value provided in an embodiment of the present application;

[0113] Fig.10 It is a flowchart of a reference value determination method provided in an embodiment of the present application;

[0114] Fig.11 It is a flow chart of a method for determining a charging time period provided in an embodiment of the present application;

[0115] Fig.12 It is a flow chart of another method for detecting abnormal state of charge provided in an embodiment of the present application;

[0116] Fig.13 It is one of the structural block diagrams of the abnormal state of charge detection device provided in the embodiment of the present application;

[0117] Fig.14 is a structural block diagram of a fifth determination module provided in an embodiment of the present application;

[0118] Fig.15 is a structural block diagram of a second determination submodule provided in an embodiment of the present application;

[0119] Fig.16 This is the second structural block diagram of the abnormal state of charge detection device provided in the embodiment of the present application;

[0120] Fig.17 It is a structural block diagram of a charging time period determination device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0121] The following embodiments of the technical solution of the present application are described in detail in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application, and are therefore only used as examples, and cannot be used to limit the scope of protection of the present application.

[0122] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0123] In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "multiple" is more than two, unless otherwise clearly and specifically defined.

[0124] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0125] In the description of the embodiments of the present application, the term "and / or" is only a description of the association relationship of the associated objects, indicating that there may be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0126] In the description of the embodiments of the present application, the term "multiple" refers to more than two (including two). Similarly, "multiple groups" refers to more than two groups (including two groups), and "multiple pieces" refers to more than two pieces (including two pieces).

[0127] The state of charge (SOC) of a battery refers to the ratio of the remaining capacity of the battery to its capacity when fully charged. SOC is crucial for battery energy management, safety monitoring, and health maintenance, so it is necessary to test SOC.

[0128] At present, it is usually necessary to place the battery at rest for a long time and measure the resting voltage of the battery after resting. The battery is then fully charged and the resting voltage is used as the open circuit voltage (OCV) of the battery. The target SOC is then determined based on the open circuit voltage and the amount of electricity charged into the battery. The SOC calculated by the battery management system is compared with the target SOC to determine the difference between the SOC calculated by the BMS and the target SOC. If the difference is within a preset range, the SOC calculated by the battery management system is determined to be normal. If the difference is outside the preset range, the SOC calculated by the battery management system is determined to be abnormal.

[0129] However, the current SOC detection method has the problem of low efficiency in SOC abnormality detection because it requires the battery to be left at rest for a long time, the resting voltage of the battery to be measured after the resting, and the battery to be fully charged.

[0130] In order to solve the above technical problems, the present application embodiment provides a method for detecting abnormal state of charge, which can be applied to Figure 1 The computer device shown in the figure may be a terminal. The computer device includes a processor, a memory, a communication interface, a display screen and an input device connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a method for detecting abnormal state of charge is implemented. The display screen of the computer device may be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device may be a touch layer covered on the display screen, or a key, trackball or touchpad provided on the housing of the computer device, or an external keyboard, touchpad or mouse, etc.

[0131] Those skilled in the art will understand that Figure 1 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0132] In one embodiment, Figure 2 As shown, Figure 2is a flow chart of a method for detecting abnormal state of charge provided by an embodiment of the present application, and the method is applied to Figure 1 The computer device in the example is used to illustrate, and the method includes the following steps S201-S205:

[0133] S201 , determining each first SOC change rate according to a first state of charge SOC among a plurality of power-off parameters of a battery at a time.

[0134] The electrical parameters include at least a maximum voltage, a minimum voltage, a current, a temperature and a first SOC.

[0135] In this embodiment, the computer device can obtain the electrical parameters of the battery at each moment from the cloud or the private edge through network transmission. The private edge includes an energy storage system, that is, the electrical parameters of the battery at multiple moments in this embodiment can be data of the battery on the vehicle obtained from the cloud, or data of the battery in the energy storage system obtained from the private edge. The electrical parameters include but are not limited to data such as voltage, current, temperature, state of health (State of Health, SOH), SOC, etc., where the voltage can include the maximum voltage and minimum voltage of the single cell. The first SOC change rate can be determined based on the first SOC in the electrical parameters at each moment.

[0136] In one possible implementation, in order to improve the validity and availability of data, the electrical parameters may be cleaned to eliminate abnormal electrical parameters, and each first SOC change rate may be determined based on the first SOC in the electrical parameters at multiple moments after eliminating abnormal values.

[0137] Exemplarily, the acquired electrical parameters include electrical parameter 1 at time 1, electrical parameter 2 at time 2, ..., electrical parameter 7 at time 7, and electrical parameter 8 at time 8. If the current in electrical parameter 2 is abnormal, electrical parameter 2 is eliminated; if the voltage in electrical parameter 4 is abnormal, electrical parameter 4 is eliminated, that is, if there is at least one abnormal data in the electrical parameter, the electrical parameter is eliminated. After eliminating the abnormal electrical parameters, the remaining electrical parameters include electrical parameter 1 at time 1, electrical parameter 3 at time 3, electrical parameter 5 at time 5, electrical parameter 6 at time 6, electrical parameter 7 at time 7, and electrical parameter 8 at time 8. The remaining electrical parameters are used as target electrical parameters, and the target electrical parameters are sorted in the order of the moments corresponding to the target electrical parameters, and the time difference between two adjacent moments and the change in SOC in the target electrical parameters at the two moments are determined. The SOC change is divided by the time difference to obtain a first SOC change rate.

[0138] That is, as shown in Table 1 below, the first SOC change rate 1 at moment 1 is equal to the difference between the first SOC3 in the electrical parameter 3 and the first SOC1 in the electrical parameter 1 divided by the difference between moment 3 and moment 1; the first SOC change rate 3 at moment 3 is equal to the difference between the first SOC5 and the first SOC3 divided by the difference between moment 5 and moment 3; the first SOC change rate 5 at moment 5 is equal to the difference between the first SOC6 and the first SOC5 divided by the difference between moment 6 and moment 5; the first SOC change rate 6 at moment 6 is equal to the difference between the first SOC7 and the first SOC6 divided by the difference between moment 7 and moment 6; the first SOC change rate 7 at moment 7 is equal to the difference between the first SOC8 in the electrical parameter 8 at moment 8 and the first SOC7 divided by the difference between moment 8 and moment 7.

[0139]

[0140] Table 1

[0141] S202 , for each moment, according to the correspondence between voltage and SOC, the maximum voltage and the minimum voltage corresponding to the moment, determine a second SOC corresponding to the maximum voltage and a third SOC corresponding to the minimum voltage.

[0142] S203, determining a target SOC corresponding to a moment according to the second SOC and the third SOC.

[0143] The target electrical parameter at least includes data of the electrical parameters at the time except the first SOC.

[0144] In a possible implementation, the second SOC corresponding to the maximum voltage and the third SOC corresponding to the minimum voltage can be determined based on the maximum voltage, the minimum voltage, and the OCV-SOC curve at each moment in the target electrical parameter. OCV is the abbreviation of Open Circuit Voltage, which means open circuit voltage. The OCV-SOC curve can represent the corresponding relationship between voltage and SOC. Then based on the formula Determine the target SOC corresponding to each moment, and then determine the interpolated SOC change rate based on the target SOC corresponding to each moment, the second SOC change rate includes the interpolated SOC change rate. Indicates the third SOC corresponding to the minimum voltage, Indicates the second SOC corresponding to the maximum voltage, Indicates the target SOC.

[0145] Combined with the above example, as shown in Table 2 below, the target SOC1 corresponding to time 1, the target SOC3 corresponding to time 3, the target SOC5 corresponding to time 5, the target SOC6 corresponding to time 6, and the target SOC7 corresponding to time 7 can be obtained. Then, based on the target SOC corresponding to each time, the interpolated SOC change rate is determined, and the second SOC change rate includes the interpolated SOC change rate. Among them, the determination method of the second SOC change rate is the same as the determination method of the first SOC change rate mentioned above, which will not be repeated here.

[0146]

[0147] Table 2

[0148] S204, determining a second SOC change rate based on the target SOC corresponding to each moment.

[0149] In a possible implementation, a reference simulated SOC may be determined from each target SOC based on a target electrical parameter corresponding to each target SOC, based on the reference simulated SOC and the target formula: , calculate the simulated SOC corresponding to other moments, and then determine the simulated SOC change rate based on the simulated SOC corresponding to other moments and the reference simulated SOC, the second SOC change rate includes the simulated SOC change rate. For the benchmark simulated SOC, The health status of the battery. is the rated capacity of the battery cell, Indicates the accumulated power corresponding to the moment. It should be noted that the SOH in the target formula can be the data sent by the BMS on the vehicle to the background server, or it can be the data calculated by the background server based on the basic parameters such as voltage, current, temperature, etc. sent by the BMS. Among them, the target electrical parameters at least include the data of the electrical parameters at the moment except the first SOC.

[0150] The reference simulation SOC may be determined based on the current and temperature in the target electrical parameters corresponding to each target SOC.

[0151] After the reference simulated SOC is determined, the simulated SOC corresponding to other moments can be determined based on the reference simulated SOC and the target formula. The corresponding time is time 5, then time 6 corresponds to It is equal to the product of the current in the power parameter at time 6 and the difference between time 7 and time 6. Then the corresponding value of time 7 is Equal to the time 6 corresponding Add the power at time 7, and the power at time 7 is equal to the product of the current in the electrical parameter at time 7 multiplied by the difference between time 8 and time 7. By analogy, the accumulated power corresponding to the target time can be calculated, and then the simulated SOC at the target time can be calculated using the above target formula. The target time includes the time except the time corresponding to the reference simulated SOC. As shown in Table 3 below, based on the reference simulated SOC and the target formula, the simulated SOC1 at time 1, the simulated SOC3 at time 3, the simulated SOC6 at time 6, and the simulated SOC7 at time 7 are determined.

[0152]

[0153] Table 3

[0154] In another possible implementation, the second SOC change rate can be determined based on the electrical parameters at each moment through relevant calculation schemes such as equivalent circuit model, Kalman filter, capacity differentiation, random forest in machine learning, gradient boosting decision tree and its derivative variant algorithm. It should be noted that the determined second SOC change rate is a simulated SOC change rate.

[0155] In one embodiment, Figure 3 As shown, Figure 3 : is a flow chart of a method for determining a second SOC change rate provided in an embodiment of the present application. The embodiment of the present application relates to a possible implementation method of determining a second SOC change rate based on a target SOC corresponding to each moment. Based on the above embodiment, the above S204 may include the following steps S301-S303:

[0156] S301 : determining a reference simulation SOC from each target SOC based on a target electrical parameter corresponding to each target SOC.

[0157] Wherein, based on the target electrical parameters corresponding to each target SOC, determining the reference simulation SOC from each target SOC can be achieved in the following manner:

[0158] Determine the target SOC corresponding to the time when the current is equal to the preset current and the duration of the current is equal to the preset duration. If the temperature in the power-off parameter at the moment corresponding to the target SOC is within the preset temperature range, use the target SOC as the benchmark simulation SOC; if the temperature in the power-off parameter at the moment corresponding to the target SOC is not within the preset temperature range, determine whether the temperature corresponding to the next target SOC of the target SOC is within the preset temperature range. If it is not within the preset temperature range, continue to determine whether the temperature corresponding to the next target SOC is within the preset temperature range, until the target SOC corresponding to the temperature within the preset temperature range is determined, and use the target SOC corresponding to the temperature within the preset temperature range as the benchmark simulation SOC.

[0159] For example, the preset current is 2A and the preset duration is 2 minutes. If the current corresponding to time 1 to time 100 is 2A and the duration is 2 minutes, and the temperature corresponding to time 100 is within the preset temperature range, the target SOC corresponding to time 100 is used as the reference simulation SOC.

[0160] S302, determining the simulated SOC corresponding to other moments according to the benchmark simulated SOC, the rated capacity of the battery cells, the health status of the battery, and the accumulated power corresponding to other moments; the other moments include the moments other than the moments corresponding to the benchmark simulated SOC.

[0161] Based on the baseline simulated SOC and target formula: , calculate the simulated SOC corresponding to other moments, and then determine the simulated SOC change rate based on the simulated SOC corresponding to other moments and the reference simulated SOC, the second SOC change rate includes the simulated SOC change rate. For the benchmark simulated SOC, The health status of the battery. is the rated capacity of the battery cell, Indicates the accumulated power corresponding to the moment.

[0162] S303 , determining a simulated SOC change rate based on each simulated SOC; the second SOC change rate includes the simulated SOC change rate.

[0163] As shown in Table 3 above, the simulated SOC difference between simulated SOC3 and simulated SOC1 is determined, and the time difference between time 3 and time 1 is calculated, and the result of dividing the simulated SOC difference by the time difference is used as the simulated SOC change rate corresponding to time 1. Similarly, the simulated SOC change rates at other times can be determined.

[0164] S205 , for each preset SOC interval, determining an abnormality detection result of each first SOC located in the preset SOC interval according to a first SOC change rate and a second SOC change rate corresponding to each first SOC located in the preset SOC interval.

[0165] In a possible implementation, the difference between the first SOC change rate and the second SOC change rate corresponding to each first SOC in the preset SOC interval can be determined, and the SOC change rate threshold interval corresponding to the preset SOC interval can be obtained for the first SOC change rate, the second SOC change rate, the change rate difference, and the electrical parameter corresponding to each first SOC in the preset SOC interval. For each first SOC in the preset SOC interval, if the first SOC is in the preset SOC interval and the first SOC change rate corresponding to the first SOC is in the SOC change rate threshold interval corresponding to the preset SOC interval, then the abnormality detection result of the first SOC is determined to be normal; if the first SOC change rate corresponding to the first SOC is not in the SOC change rate threshold interval corresponding to the preset SOC interval, then the abnormality detection result of the first SOC is determined to be abnormal.

[0166] In another possible implementation, the ratio of the first SOC change rate and the second SOC change rate corresponding to each first SOC in the preset SOC interval can be determined, and the SOC change rate threshold interval corresponding to the preset SOC interval is obtained for the first SOC change rate, the second SOC change rate, the change rate ratio, and the electrical parameter corresponding to each first SOC in the preset SOC interval. For each first SOC in the preset SOC interval, if the first SOC is in the preset SOC interval and the first SOC change rate corresponding to the first SOC is in the SOC change rate threshold interval corresponding to the preset SOC interval, then the abnormality detection result of the first SOC is determined to be normal; if the first SOC change rate corresponding to the first SOC is not in the SOC change rate threshold interval corresponding to the preset SOC interval, then the abnormality detection result of the first SOC is determined to be abnormal.

[0167] For example, if there are 10 preset SOC intervals in total, one interval is divided every 10%, that is, each preset SOC interval includes [0, 10%], (10%, 20%], (20%, 30%], ..., (90, 100%]. As shown in Table 4 below, Table 4 only shows [0, 10%], the first SOC change rate and the second SOC change rate corresponding to each first SOC located at [0, 10%].

[0168] Taking the [0,10%] interval as an example, the change rate difference 1 between the first SOC change rate 1 and the second SOC change rate 1, the change rate difference 3 between the first SOC change rate 3 and the second SOC change rate 3, the change rate difference 5 between the first SOC change rate 5 and the second SOC change rate 5, the change rate difference 6 between the first SOC change rate 6 and the second SOC change rate 6, and the change rate difference 7 between the first SOC change rate 7 and the second SOC change rate 7 can be calculated. Based on the first SOC change rate, the second SOC change rate, the change rate difference and the electrical parameters corresponding to the [0,10%] interval, the SOC change rate threshold interval corresponding to the [0,10%] interval is determined. If the first SOC change rate 1 is within the SOC change rate threshold interval, the abnormal detection result of the first SOC1 is determined to be normal; if the first SOC change rate 1 is not within the SOC change rate threshold interval, the abnormal detection result of the first SOC1 is determined to be abnormal.

[0169]

[0170] Table 4

[0171] It should be noted that the first SOCs in the preset SOC range in this step may include the first SOC in the electrical parameters at a moment, and may also include the first SOC in the electrical parameters in a future period of time. That is, based on the first SOC change rate and the second SOC change rate at a moment, it can also be determined whether the first SOC in the electrical parameters in the future period of time is normal.

[0172] The method provided in this embodiment determines each first SOC change rate according to the first state of charge SOC in the electrical parameters of the battery at multiple moments, determines the target SOC according to the corresponding relationship between voltage and SOC, the maximum voltage and the minimum voltage corresponding to the moment, and determines the simulated SOC change rate as the second SOC change rate based on the target SOC corresponding to each moment, and determines the abnormal detection result of each first SOC located in the preset SOC interval according to the first SOC change rate and the second SOC change rate corresponding to each first SOC located in the preset SOC interval for each preset SOC interval. Since the electrical parameters at multiple moments are the data already available for the battery in the historical time period, the embodiment of the present application directly uses the existing electrical parameters of the battery in the historical time period to determine the abnormal detection result of the SOC, and does not need to leave the battery at rest for a long time, measure the static voltage of the battery after resting, and fully charge the battery when it is necessary to evaluate whether the SOC is abnormal, thereby saving the time required for SOC abnormal detection and improving the efficiency of SOC abnormal detection.

[0173] In one embodiment, Figure 4 As shown, Figure 4is a flow chart of another method for determining a second SOC change rate provided by an embodiment of the present application. The embodiment of the present application relates to a possible implementation method of determining a second SOC change rate based on a target SOC corresponding to each moment. Based on the above embodiment, the above S204 may include the following steps S401-S402:

[0174] S401, based on the target SOCs corresponding to two adjacent moments in each moment, determine the change amount of the target SOCs between the two moments.

[0175] S402 , determining an interpolated SOC change rate based on the change amount of the target SOC at two moments and the time change amount at two moments; the second SOC change rate includes the interpolated SOC change rate.

[0176] The method provided in this embodiment determines the change amount of the target SOC at two moments based on the target SOC corresponding to two adjacent moments in each moment, determines the interpolated SOC change rate based on the change amount of the target SOC at two moments and the time change amount at two moments, and the second SOC change rate includes the interpolated SOC change rate, thereby laying a foundation for determining the abnormal detection result of each first SOC located in the preset SOC interval according to the first SOC change rate and the second SOC change rate corresponding to each first SOC located in the preset SOC interval, and using the interpolated SOC change rate as the second SOC change rate can improve the flexibility of determining the second SOC change rate.

[0177] In one embodiment, Figure 5 As shown, Figure 5 1 is a flow chart of a method for determining an abnormal detection result of a first SOC provided in an embodiment of the present application. The embodiment of the present application relates to a possible implementation method of determining an abnormal detection result of each first SOC located in a preset SOC interval according to a first SOC change rate and a second SOC change rate corresponding to each first SOC located in a preset SOC interval. Based on the above embodiment, the above S205 may include the following steps S501-S502:

[0178] S501 , for each first SOC in a preset SOC interval, determine a change rate difference corresponding to the first SOC according to a first SOC change rate and a second SOC change rate corresponding to the first SOC.

[0179] In a possible implementation, if the second SOC change rate includes an interpolated SOC change rate, a change rate difference between the first SOC change rate corresponding to each first SOC and the interpolated SOC change rate may be calculated.

[0180] In another possible implementation, if the second SOC change rate includes a simulated SOC change rate, a change rate difference between the first SOC change rate corresponding to each first SOC and the simulated SOC change rate may be calculated.

[0181] In another possible implementation, if the second SOC change rate includes an interpolated SOC change rate and a simulated SOC change rate, the change rate difference between the first SOC change rate and the interpolated SOC change rate, the change rate difference between the first SOC change rate and the simulated SOC change rate, and the change rate difference between the interpolated SOC change rate and the simulated SOC change rate corresponding to each first SOC can be calculated.

[0182] Exemplarily, taking the second SOC change rate including the interpolated SOC change rate and the simulated SOC change rate, and the preset SOC interval being [0, 10%] as an example, combined with the following Table 5, Table 5 shows the first SOC1 in the [0, 10%] interval, the first SOC change rate 1 corresponding to the first SOC1, the interpolated SOC change rate 1, and the simulated SOC change rate 1; the first SOC3, the first SOC change rate 3 corresponding to the first SOC3, the interpolated SOC change rate 3, and the simulated SOC change rate 3; the first SOC5, the first SOC change rate 5 corresponding to the first SOC5, the interpolated SOC change rate 5, and the simulated SOC change rate 5; the first SOC6, the first SOC change rate 6 corresponding to the first SOC6, the interpolated SOC change rate 6, and the simulated SOC change rate 6; the first SOC7, the first SOC change rate 7 corresponding to the first SOC7, the interpolated SOC change rate 7, and the simulated SOC change rate 7.

[0183]

[0184] Table 5

[0185] For each first SOC in the interval [0,10%], the first SOC change rate 1 can be subtracted from the interpolated SOC change rate 1 to obtain the first change rate difference 1, the first SOC change rate 1 can be subtracted from the simulated SOC change rate 1 to obtain the second change rate difference 1, and the interpolated SOC change rate 1 can be subtracted from the simulated SOC change rate 1 to obtain the third change rate difference 1; the first SOC change rate 3 can be subtracted from the interpolated SOC change rate 3 to obtain the first change rate difference 3, the first SOC change rate 3 can be subtracted from the simulated SOC change rate 3 to obtain the second change rate difference 3, and the interpolated SOC change rate 3 can be subtracted from the simulated SOC change rate 3 to obtain the third change rate difference 3. Similarly, the first change rate difference, the second change rate difference, and the third change rate difference corresponding to other first SOCs can be obtained.

[0186] S502 : Determine abnormality detection results of each first SOC in a preset SOC interval based on each change rate difference corresponding to the preset SOC interval.

[0187] In one possible implementation, the SOC change rate threshold interval corresponding to the preset SOC interval can be determined based on the change rate differences corresponding to the preset SOC interval, and the abnormal detection results of each first SOC in the preset SOC interval can be determined according to the SOC change rate threshold interval corresponding to the preset SOC interval.

[0188] In another possible implementation, the SOC change rate threshold interval corresponding to the preset SOC interval can be determined based on the change rate differences corresponding to the preset SOC interval, the first SOC change rate, the second SOC change rate and the electrical parameters at each moment corresponding to the preset SOC interval, and the abnormal detection results of each first SOC in the preset SOC interval can be determined according to the SOC change rate threshold interval corresponding to the preset SOC interval.

[0189] In the current related technologies, the battery needs to be left at rest for a long time, and the resting voltage of the battery after resting is measured before the battery is fully charged. However, the actual probability of long-term resting and full charging is low, and the conditions for sufficient resting are difficult to meet. Most of the specific conditions of long-term rest and full charging will occur simultaneously in specific usage scenarios or test environments. Then, the SOC obtained by OCV interpolation calculation and ampere-hour integration under the specific working conditions is compared with the SOC calculated by the BMS to obtain the difference between the two SOCs, and the SOC calculated by the BMS is judged based on the difference. However, this embodiment does not need to perform the above-mentioned specific working condition test when making a judgment, but based on the SOC change rate threshold interval determined by historical data, the SOC calculated by the BMS can be detected in a timely manner, thereby improving the timeliness and convenience of SOC abnormality detection.

[0190] The method provided in this embodiment determines the change rate difference corresponding to the first SOC according to the first SOC change rate and the second SOC change rate corresponding to the first SOC, and determines the abnormal detection result of each first SOC in the preset SOC interval based on each change rate difference corresponding to the preset SOC interval. Since it is not necessary to leave the battery at rest for a long time, measure the resting voltage of the battery after resting, and fully charge the battery, it is possible to determine whether the SOC is abnormal, thereby saving the time required for SOC abnormality detection and improving the efficiency of SOC abnormality detection.

[0191] In one embodiment, Figure 6 As shown, Figure 6 1 is a flow chart of another method for determining an abnormal detection result of a first SOC provided by an embodiment of the present application. The embodiment of the present application relates to a possible implementation method of determining an abnormal detection result of each first SOC in a preset SOC interval based on each change rate difference corresponding to the preset SOC interval. On the basis of the above embodiment, the above S502 may include the following steps S601-S603:

[0192] S601 , determining an SOC change rate threshold corresponding to a preset SOC interval based on each change rate difference corresponding to a preset SOC interval.

[0193] A statistical cluster analysis may be performed on each change rate difference corresponding to a preset SOC interval to obtain an SOC change rate threshold corresponding to the preset SOC interval. Alternatively, a statistical cluster analysis may be performed on each change rate difference corresponding to the preset SOC interval, the first SOC change rate, the second SOC change rate, and the electrical parameters at each moment corresponding to the preset SOC interval to obtain an SOC change rate threshold corresponding to the preset SOC interval.

[0194] S602 : Determine an SOC change rate threshold interval corresponding to the preset SOC interval based on the SOC change rate threshold corresponding to the preset SOC interval.

[0195] In a possible implementation, the minimum value of the SOC change rate thresholds corresponding to the preset SOC intervals may be used as the lower limit value of the SOC change rate threshold interval, and the maximum value of the SOC change rate thresholds may be used as the upper limit value of the SOC change rate threshold interval.

[0196] In another possible implementation, abnormal values ​​in the SOC change rate threshold corresponding to the preset SOC interval can be eliminated, and the minimum SOC change rate threshold after eliminating the abnormal values ​​is used as the lower limit value of the SOC change rate threshold interval, and the maximum SOC change rate threshold after eliminating the abnormal values ​​is used as the upper limit value of the SOC change rate threshold interval.

[0197] Exemplarily, the following Table 6 shows the SOC change rate threshold intervals corresponding to each preset SOC interval.

[0198]

[0199] Table 6

[0200] S603 , determining abnormality detection results of each first SOC in a preset SOC interval according to the SOC change rate threshold interval corresponding to the preset SOC interval.

[0201] At present, in order to improve the accuracy of SOC anomaly detection, before performing SOC anomaly detection, professionals need to first confirm the software version information of the BMS, and then compare the SOC obtained by the algorithm matching the software version information with the SOC calculated by the BMS under specific working conditions of long-term static and full charging, and obtain the difference between the two SOCs. Based on the difference, it is determined whether the SOC calculated by the BMS is abnormal. The execution of a series of related solutions requires a certain period of time and professional follow-up to complete, which leads to a high threshold for SOC anomaly detection and low efficiency of anomaly detection.

[0202] However, this embodiment can determine the abnormal detection results of each first SOC in the preset SOC interval directly according to the SOC change rate threshold interval corresponding to the preset SOC interval, without the need for professional personnel to follow up, thereby lowering the threshold of SOC abnormal detection and improving the efficiency of abnormal detection.

[0203] The method provided in this embodiment determines the SOC change rate threshold corresponding to the preset SOC interval based on each change rate difference corresponding to the preset SOC interval, and then determines the SOC change rate threshold interval corresponding to the preset SOC interval based on the SOC change rate threshold, and determines the abnormal detection results of each first SOC in the preset SOC interval according to the SOC change rate threshold interval corresponding to the preset SOC interval. Since this embodiment does not need to perform a specific working condition test when determining, but the SOC change rate threshold interval is determined based on historical data, the SOC calculated by the BMS can be detected in a timely manner, improving the timeliness and convenience of SOC abnormality detection, and saving the time required for SOC abnormality detection, thereby improving the efficiency of SOC abnormality detection.

[0204] In one embodiment, Figure 7 As shown, Figure 7 The present invention provides a flow chart of a method for determining an SOC change rate threshold interval provided in an embodiment of the present invention. The present invention relates to a possible implementation method of determining an SOC change rate threshold interval corresponding to a preset SOC interval based on an SOC change rate threshold corresponding to a preset SOC interval. Based on the above embodiment, the above S602 may include the following steps S701-S703:

[0205] S701, performing cluster analysis on the SOC change rate thresholds corresponding to the preset SOC intervals to obtain cluster analysis results.

[0206] S702 , determining an abnormal SOC change rate threshold from the SOC change rate thresholds according to the cluster analysis result.

[0207] According to the cluster analysis results, the abnormal SOC change rate threshold is determined from the SOC change rate threshold. After the abnormal SOC change rate threshold is determined, the abnormal SOC change rate threshold can be eliminated to obtain the remaining normal SOC change rate threshold, and the SOC change rate threshold interval is determined based on the normal SOC change rate threshold.

[0208] S703 , determining an SOC change rate threshold range according to the SOC change rate thresholds other than the abnormal SOC change rate threshold.

[0209] The method provided in the present embodiment improves the accuracy of the determined SOC change rate threshold interval by determining an abnormal SOC change rate threshold and determining a SOC change rate threshold interval based on an SOC change rate threshold other than the abnormal SOC change rate threshold, thereby improving the accuracy of the abnormal detection result of each first SOC in a preset SOC interval determined based on the SOC change rate threshold interval corresponding to the preset SOC interval.

[0210] In one embodiment, the above S603, determining the abnormality detection result of each first SOC in the preset SOC interval according to the SOC change rate threshold interval corresponding to the preset SOC interval, can be implemented as follows:

[0211] For each first SOC in the preset SOC interval, if a first SOC change rate corresponding to the first SOC is within an SOC change rate threshold interval corresponding to the preset SOC interval, determining that the abnormality detection result is that the first SOC is normal;

[0212] If the first SOC change rate corresponding to the first SOC is outside the SOC change rate threshold interval corresponding to the preset SOC interval, it is determined that the abnormality detection result is that the first SOC is abnormal.

[0213] In the method provided in this embodiment, a preset SOC interval corresponds to an SOC change rate threshold interval, so that whether the first SOC within the preset SOC interval is abnormal can be determined based on the SOC change rate threshold interval corresponding to the preset SOC interval, thereby realizing SOC abnormality detection, saving the time required for SOC abnormality detection, and improving SOC abnormality detection efficiency.

[0214] In one embodiment, Figure 8 As shown, Figure 8 1 is a flow chart of another method for determining an abnormal detection result of the first SOC provided by an embodiment of the present application. In this embodiment, a second determination can be made on the first SOC during the charging time period to further improve the accuracy of the abnormal detection result of the first SOC during the charging time period. The method includes the following steps S801-S804:

[0215] S801, determining the target SOC interval corresponding to each charging time period in the most recent preset number of charging time periods, and the first number of target SOC intervals whose abnormal detection result is that the first SOC is normal; the target SOC interval includes the preset SOC interval to which the first SOC in the charging time period belongs.

[0216] Exemplarily, the preset number is equal to 1, and the most recent charging time period includes charging time period 1. Table 7 below shows the data corresponding to charging time period 1. If charging time period 1 corresponds to the first SOC at 10 moments, the target SOC interval corresponding to charging time period 1 includes target SOC interval 1 and target SOC interval 2, and target SOC interval 1 is, for example, [0, 10%], and target SOC interval 2 is, for example, (10%, 20%]. Among them, 7 of the first SOCs at 10 moments are located in target SOC interval 1, and 3 of the first SOCs are located in target SOC interval 2, that is, 7 first SOCs belong to target SOC interval 1, and 3 first SOCs belong to target SOC interval 2. Among the first SOCs at 7 moments corresponding to target SOC interval 1, 6 of them are normal, that is, the first number of the abnormal detection result corresponding to target SOC interval 1 that the first SOC is normal is equal to 6; among the first SOCs at 3 moments corresponding to target SOC interval 2, 2 of them are normal, that is, the first number of the abnormal detection result corresponding to target SOC interval 2 that the first SOC is normal is equal to 2.

[0217]

[0218] Table 7

[0219] S802 : Determine a comparison value based on a preset weight corresponding to the target SOC interval in the charging time period and a first number.

[0220] In a possible implementation, when the preset number is equal to 1, the product of the preset weight corresponding to the target SOC interval and the first number can be determined, and the sum of the products corresponding to each target SOC interval is used as the comparison value. Exemplarily, the comparison value corresponding to charging time period 1 is equal to the preset weight 1×6+the preset weight 2×2.

[0221] In another possible implementation, when the preset number is greater than 1, for each charging time period, the product of the preset weight corresponding to the target SOC interval in the charging time period and the first number can be determined, and the sum of the products corresponding to each target SOC interval can be determined; the average value of the summation results corresponding to each charging time period is determined, and the average value is used as a comparison value.

[0222] S803: Determine a reference value according to the second number of the first SOC in the charging time period and the preset weights corresponding to the preset SOC intervals.

[0223] In one possible implementation, when the preset number is equal to 1, the sum of the preset weights corresponding to the preset SOC intervals can be determined, and the product of the second number and the sum can be determined, and half of the product is used as a reference value.

[0224] Exemplarily, the second number of the first SOC in the charging time period is the total number of the first SOC in the charging time period. In combination with the example in S801 above, the second number in this step is equal to 10. In combination with the introduction of the above embodiment, the embodiment of the present application takes the number of preset SOC intervals as 10 as an example. If the preset SOC interval 1 corresponds to the preset weight 1, the preset SOC interval 2 corresponds to the preset weight 2, ..., the preset SOC interval 10 corresponds to the preset weight 10, and the sum of the 10 preset weights is A, then the reference value can be equal to 10×A / 2.

[0225] In another possible implementation, when the preset number is greater than 1, the average value of the second number of the first SOC in each charging time period can be determined, and the product of the average value and the sum of the preset weights corresponding to each preset SOC interval can be determined, and half of the product is used as a reference value.

[0226] Exemplarily, the preset number is equal to 3, and the three charging time periods include charging time period 1, charging time period 2 and charging time period 3. Charging time period 1 corresponds to the first SOC at 10 moments, charging time period 2 corresponds to the first SOC at 18 moments, and charging time period 3 corresponds to the first SOC at 20 moments. Then, the average value of the second number of the first SOC in the three charging time periods is equal to (10+18+20) / 2, that is, the average value is equal to 16, and the product of the average value and the sum of the preset weights corresponding to each preset SOC interval is calculated, and half of the product is used as a reference value.

[0227] It should be noted that if the preset number is greater than 1, the comparison value and the reference value can be determined in the corresponding manner when the preset number is greater than 1. If the preset number is equal to 1, the comparison value and the reference value can be determined in the corresponding manner when the preset number is equal to 1.

[0228] S804, determining an abnormality detection result of the first SOC in the charging time period according to the comparison value and the reference value.

[0229] If the comparison value is less than the reference value, determining that the abnormality detection result of the first SOC in the charging time period is that the first SOC in at least one charging time period is abnormal;

[0230] If the comparison value is not less than the reference value, it is determined that the abnormality detection result of the first SOC in the charging time period is that the first SOC is normal.

[0231] The method provided in this embodiment can re-determine the first SOC in the charging time period by determining the abnormal detection result of the first SOC in the charging time period based on the comparison value and the reference value to improve the accuracy of the abnormal detection result of the first SOC in the charging time period.

[0232] In one embodiment, Fig. 9 As shown, Fig. 9 1 is a flow chart of a method for determining a comparison value provided by an embodiment of the present application. This embodiment relates to a possible implementation method of determining a comparison value based on a preset weight and a first number corresponding to a preset SOC interval in a charging time period. Based on the above embodiment. The above S802 includes the following steps S901-S902:

[0233] S901 , determining a first weighted value corresponding to the charging time period based on a first product of a preset weight corresponding to a target SOC interval in the charging time period and a first number.

[0234] Exemplarily, when the charging time period includes three charging time periods, the first product 1 of the preset weight 1 corresponding to the target SOC interval 1 and the first number, the first product 2 of the preset weight 2 corresponding to the target SOC interval 2 and the first number in charging time period 1 can be calculated, and the sum of the first product 1 and the first product 2 can be calculated, and the sum is used as the first weighted value corresponding to charging time period 1. In combination with the above Table 6, the first weighted value corresponding to charging time period 1 is equal to the preset weight 1×6+the preset weight 2×2.

[0235] Similar to calculating the first weighted value corresponding to charging time period 1 , the first weighted value corresponding to charging time period 2 and the first weighted value corresponding to charging time period 3 may be determined.

[0236] S902: Determine a comparison value according to a first weighted value corresponding to each charging time period.

[0237] In a possible implementation, an average value of the first weighted values ​​corresponding to each charging time period may be used as the comparison value.

[0238] In another possible implementation, an average value of the first weighted values ​​corresponding to each charging time period may be determined, and a product of a preset coefficient and the average value may be determined to adjust the average value, and the product may be used as a comparison value.

[0239] The method provided in this embodiment determines a first weighted value corresponding to the charging time period based on a first product of a preset weight corresponding to the target SOC interval in the charging time period and a first number, and determines a comparison value according to the first weighted value corresponding to each charging time period, thereby laying a foundation for determining an abnormal detection result of the first SOC in the charging time period according to the comparison value and the reference value, and re-determining the first SOC in the charging time period to improve the accuracy of the abnormal detection result of the first SOC in the charging time period.

[0240] In one embodiment, Fig.10 As shown, Fig.10 It is a flowchart of a reference value determination method provided by an embodiment of the present application. This embodiment involves a possible implementation method of determining a reference value based on the second number of the first SOC in the charging time period and the preset weights corresponding to each preset SOC interval. Based on the above embodiment. The above S803 includes the following steps S1001-S1003:

[0241] S1001, determining a summation result of preset weights corresponding to each preset SOC interval.

[0242] Exemplarily, if a total of 10 preset SOC intervals are divided, the summation result in this step is equal to the sum of the preset weights of the 10 preset SOC intervals.

[0243] S1002: Determine an average value of the second numbers in each charging time period according to the second number of the first SOC in the charging time period.

[0244] S1003, determining a reference value based on the summation result and the average value.

[0245] In a possible implementation, the product of the summation result and the average value may be calculated, and half of the product may be used as a reference value.

[0246] The method provided in this embodiment determines the summation result of the preset weights corresponding to each preset SOC interval, and determines the average value of the second number in each charging time period according to the second number of the first SOC in the charging time period, and then determines the reference value based on the summation result and the average value, thereby laying a foundation for determining the abnormal detection result of the first SOC in the charging time period according to the comparison value and the reference value, and re-determining the first SOC in the charging time period to improve the accuracy of the abnormal detection result of the first SOC in the charging time period.

[0247] In one embodiment, the above S804 can be implemented in the following manner:

[0248] If the comparison value is less than the reference value, determining that the abnormality detection result of the first SOC in the charging time period is that the first SOC in at least one charging time period is abnormal;

[0249] If the comparison value is not less than the reference value, it is determined that the abnormality detection result of the first SOC in the charging time period is that the first SOC is normal.

[0250] The method provided in this embodiment can realize re-determination of the first SOC in the charging time period, so as to improve the accuracy of the abnormality detection result of the first SOC in the charging time period.

[0251] like Fig.11 As shown, Fig.11 1 is a flow chart of a method for determining a charging time period provided in an embodiment of the present application. The method comprises the following steps S1101-S1102:

[0252] S1101, for each moment, based on the target electrical parameters at the moment, determine the operating condition identifier corresponding to the moment.

[0253] In this embodiment, the operating condition identifier corresponding to the moment can be determined based on the current in the target electrical parameter at the moment. If the current in the target electrical parameter at a certain moment is greater than the first preset current, and the duration of the current is not less than the preset duration, then the operating condition identifier corresponding to each moment within the duration is determined to be a charging condition. If the current in the target electrical parameter at a certain moment is less than the second preset current, and the duration of the current is not less than the preset duration, then the operating condition identifier corresponding to each moment within the duration is determined to be a discharging condition. If the current in the target electrical parameter at a certain moment is not less than the second preset current and not greater than the first preset current, and the duration of the current is not less than the preset duration, then the operating condition identifier corresponding to each moment within the duration is determined to be a static condition. It should be noted that the operating condition identifier corresponding to each moment can be used to characterize the operating condition identifier of the electrical parameter at each moment.

[0254] Exemplarily, if the first preset current is 3A, the second preset current is negative 3A, and the preset duration is 3 minutes, if starting from a certain moment, the current in the target electrical parameter at that moment is greater than 3A, and the duration of the current is 4 minutes, then the operating condition corresponding to each moment within the 4 minutes is identified as a charging condition. If the current in the target electrical parameter at that moment is less than negative 3A, and the duration of the current is 4 minutes, then the operating condition corresponding to each moment within the 4 minutes is identified as a discharging condition. If the current in the target electrical parameter at that moment is equal to 1A, and the duration of the current is 4 minutes, then the operating condition corresponding to each moment within the 4 minutes is identified as a static condition.

[0255] S1102, determining a preset number of charging time periods that are closest according to the operating condition identifier at each moment; the charging time period includes a time period composed of moments corresponding to the operating condition identifier that characterizes the charging operating condition.

[0256] Exemplarily, if the operating condition corresponding to the first most recent time period is identified as a discharging condition, the operating condition corresponding to the second most recent time period, the third most recent time period, and the fourth most recent time period is identified as a discharging condition, and the preset number is equal to 3, then the most recent preset number of charging time periods includes the second most recent time period, the third most recent time period, and the fourth most recent time period.

[0257] The method provided in this embodiment determines the operating condition identifier corresponding to each moment based on the target electrical parameters at the moment, and determines the most recent preset number of charging time periods according to the operating condition identifier at each moment, so that the first SOC corresponding to the most recent preset number of charging time periods can be detected again for abnormalities, thereby improving the accuracy of the abnormality detection results of the first SOC in the charging time period.

[0258] like Fig.12 As shown, Fig.12 1 is a flow chart of another method for detecting abnormal state of charge provided in an embodiment of the present application. The method comprises the following steps S1201-S1214:

[0259] S1201, determining each first SOC change rate according to a first state of charge SOC among a plurality of battery power-off parameters at a time.

[0260] S1202 , for each moment, according to the correspondence between voltage and SOC, the maximum voltage and the minimum voltage corresponding to the moment, determine a second SOC corresponding to the maximum voltage and a third SOC corresponding to the minimum voltage.

[0261] S1203, determining a target SOC corresponding to the moment according to the second SOC and the third SOC.

[0262] S1204 , determining a reference simulation SOC from each target SOC based on the target electrical parameters corresponding to each target SOC.

[0263] S1205, determining the simulated SOC corresponding to other times according to the reference simulated SOC, the rated capacity of the battery cells in the battery, the health status of the battery, and the accumulated power corresponding to other times.

[0264] S1206 , determining a simulated SOC change rate based on each simulated SOC; the second SOC change rate includes the simulated SOC change rate.

[0265] S1207 , for each first SOC in the preset SOC range, determine a change rate difference corresponding to the first SOC according to a first SOC change rate and a second SOC change rate corresponding to the first SOC.

[0266] S1208 : Determine an SOC change rate threshold corresponding to the preset SOC interval based on each change rate difference corresponding to the preset SOC interval.

[0267] S1209 , based on the SOC change rate threshold corresponding to the preset SOC interval, determine the SOC change rate threshold interval corresponding to the preset SOC interval.

[0268] S1210 , determining abnormality detection results of each first SOC in a preset SOC interval according to an SOC change rate threshold interval corresponding to a preset SOC interval.

[0269] S1211, determining a target SOC interval corresponding to each charging time period in a recent preset number of charging time periods, and a first number of target SOC intervals in which an abnormality detection result corresponding to the first SOC is normal.

[0270] S1212, determining a comparison value based on a preset weight corresponding to the target SOC interval in the charging time period and a first number.

[0271] S1213: Determine a reference value according to the second number of the first SOC in the charging time period and the preset weights corresponding to the preset SOC intervals.

[0272] S1214, determining an abnormality detection result of the first SOC in the charging time period according to the comparison value and the reference value.

[0273] It should be understood that, although the steps in the flowcharts involved in the above embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0274] Based on the same inventive concept, the embodiment of the present application also provides a charge state abnormality detection device for implementing the charge state abnormality detection method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more charge state abnormality detection device embodiments provided below can refer to the limitations of the charge state abnormality detection method above, and will not be repeated here.

[0275] In one embodiment, Fig.13 As shown, Fig.13 It is one of the structural block diagrams of the charge state abnormality detection device provided in the embodiment of the present application. The device 1300 includes: a first determination module 1301, a second determination module 1302, a third determination module 1303, a fourth determination module 1304 and a fifth determination module 1305, wherein:

[0276] A first determination module 1301 is used to determine each first SOC change rate according to the first state of charge SOC in the electrical parameters of the battery at multiple times; the electrical parameters at least include a maximum voltage, a minimum voltage, a current, a temperature and a first SOC;

[0277] A second determination module 1302 is used to determine, at each moment, a second SOC corresponding to the maximum voltage and a third SOC corresponding to the minimum voltage according to the correspondence between the voltage and the SOC, the maximum voltage and the minimum voltage corresponding to the moment;

[0278] A third determination module 1303, configured to determine a target SOC corresponding to a moment according to the second SOC and the third SOC;

[0279] A fourth determination module 1304 is configured to determine a second SOC change rate based on the target SOC corresponding to each moment;

[0280] A fifth determination module 1305 is used to determine, for each preset SOC interval, an abnormality detection result of each first SOC located in the preset SOC interval according to the first SOC change rate and the second SOC change rate corresponding to each first SOC located in the preset SOC interval;

[0281] Among them, the fourth determination module 1304 is specifically used to determine a baseline simulated SOC from each target SOC based on the target electrical parameters corresponding to each target SOC; determine the simulated SOC corresponding to other moments according to the baseline simulated SOC, the rated capacity of the battery cells in the battery, the health status of the battery, and the accumulated power corresponding to other moments; other moments include moments other than the moments corresponding to the baseline simulated SOC; determine the simulated SOC change rate based on each simulated SOC; the second SOC change rate includes the simulated SOC change rate.

[0282] In one embodiment, the fourth determination module 1304 is specifically used to determine the change in target SOC between two moments based on the target SOC corresponding to two adjacent moments in each moment; determine the interpolated SOC change rate based on the change in target SOC between the two moments and the time change between the two moments; the second SOC change rate includes the interpolated SOC change rate.

[0283] In one embodiment, if Fig.14 As shown, Fig.14 1305 is a structural block diagram of a fifth determination module provided in an embodiment of the present application. The fifth determination module 1305 includes:

[0284] The first determination submodule 1401 is used to determine, for each first SOC in a preset SOC interval, a change rate difference corresponding to the first SOC according to a first SOC change rate and a second SOC change rate corresponding to the first SOC;

[0285] The second determination submodule 1402 is configured to determine the abnormality detection results of each first SOC in the preset SOC interval based on each change rate difference corresponding to the preset SOC interval.

[0286] In one embodiment, if Fig.15 As shown, Fig.15 1402 is a structural block diagram of a second determination submodule provided in an embodiment of the present application. The second determination submodule 1402 includes:

[0287] The first determining unit 1501 is used to determine the SOC change rate threshold corresponding to the preset SOC interval based on each change rate difference corresponding to the preset SOC interval;

[0288] The second determining unit 1502 is configured to determine the SOC change rate threshold interval corresponding to the preset SOC interval based on the SOC change rate threshold corresponding to the preset SOC interval;

[0289] The third determining unit 1503 is configured to determine the abnormality detection result of each first SOC in the preset SOC interval according to the SOC change rate threshold interval corresponding to the preset SOC interval.

[0290] In one of the embodiments, the second determination unit 1502 is specifically used to perform cluster analysis on the SOC change rate thresholds corresponding to the preset SOC intervals to obtain cluster analysis results; determine the abnormal SOC change rate threshold from the SOC change rate thresholds based on the cluster analysis results; and determine the SOC change rate threshold interval based on the SOC change rate thresholds other than the abnormal SOC change rate threshold.

[0291] In one of the embodiments, the third determination unit 1503 is specifically used to, for each first SOC in a preset SOC interval, if the first SOC change rate corresponding to the first SOC is within the SOC change rate threshold interval corresponding to the preset SOC interval, then determine that the abnormal detection result is that the first SOC is normal; if the first SOC change rate corresponding to the first SOC is outside the SOC change rate threshold interval corresponding to the preset SOC interval, then determine that the abnormal detection result is that the first SOC is abnormal.

[0292] In one embodiment, if Fig.16 As shown, Fig.16 This is the second structural block diagram of the abnormal state of charge detection device provided in the embodiment of the present application. The device 1600 includes:

[0293] The sixth determination module 1601 is used to determine the target SOC interval corresponding to each charging time period in the most recent preset number of charging time periods, and the first number of the abnormal detection results corresponding to the target SOC intervals for which the first SOC is normal; the target SOC interval includes the preset SOC interval to which the first SOC in the charging time period belongs;

[0294] A seventh determination module 1602 is used to determine a comparison value based on a preset weight corresponding to the target SOC interval in the charging time period and a first number;

[0295] An eighth determination module 1603 is configured to determine a reference value according to a second number of the first SOC in the charging time period and a preset weight corresponding to each preset SOC interval;

[0296] The ninth determination module 1604 is configured to determine an abnormality detection result of the first SOC in the charging time period according to the comparison value and the reference value.

[0297] In one embodiment, the seventh determination module 1602 is specifically used to determine a first weighted value corresponding to the charging time period based on a preset weight corresponding to a preset SOC interval in the charging time period and a first product of a first number; and determine a comparison value according to the first weighted value corresponding to each charging time period.

[0298] In one embodiment, the eighth determination module 1603 is specifically used to determine the sum of the preset weights corresponding to each preset SOC interval; determine the average value of the second number in each charging time period based on the second number of the first SOC in the charging time period; and determine the reference value based on the summation result and the average value.

[0299] In one embodiment, the ninth determination module 1604 is specifically used to determine that if the comparison value is less than the reference value, the abnormal detection result of the first SOC in the charging time period is that the first SOC in at least one charging time period is abnormal; if the comparison value is not less than the reference value, the abnormal detection result of the first SOC in the charging time period is determined to be that the first SOC is normal.

[0300] In one embodiment, if Fig.17 As shown, Fig.17 1700 is a structural block diagram of a device for determining a charging time period provided in an embodiment of the present application. The device 1700 includes:

[0301] A tenth determining module 1701 is used to determine, for each moment, a working condition identifier corresponding to the moment based on the target electrical parameter at the moment;

[0302] The eleventh determining module 1702 is used to determine the nearest preset number of charging time periods according to the operating condition identifier at each moment; the charging time period includes a time period composed of moments corresponding to the operating condition identifier used to characterize the charging operating condition.

[0303] Each module in the above-mentioned abnormal state of charge detection device can be implemented in whole or in part by software, hardware and a combination thereof. Each of the above-mentioned modules can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute the corresponding operations of each of the above modules.

[0304] In one embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps of any of the above method embodiments when executing the computer program.

[0305] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above method embodiments are implemented.

[0306] In one embodiment, a computer program product is provided, including a computer program, which implements the steps of any of the above method embodiments when executed by a processor.

[0307] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties.

[0308] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0309] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0310] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A method for detecting abnormal state of charge, characterized in that: The method comprises: Determine each first SOC change rate according to a first state of charge SOC among electrical parameters of the battery at multiple times; the electrical parameters at least include a maximum voltage, a minimum voltage, a current, a temperature and the first SOC; For each of the moments, according to the correspondence between voltage and SOC, the maximum voltage and the minimum voltage corresponding to the moment, determine a second SOC corresponding to the maximum voltage and a third SOC corresponding to the minimum voltage; determining a target SOC corresponding to the moment according to the second SOC and the third SOC; determining the second SOC change rate based on the target SOC corresponding to each of the moments; For each preset SOC interval, determining an abnormality detection result of each first SOC located in the preset SOC interval according to a first SOC change rate and a second SOC change rate corresponding to each first SOC located in the preset SOC interval; The determining the second SOC change rate based on the target SOC corresponding to each of the moments includes: Determine a reference simulated SOC from each of the target SOCs based on a target electrical parameter corresponding to each of the target SOCs; the target electrical parameter at least includes data other than the first SOC among the electrical parameters at the moment; Determine the simulated SOC corresponding to the other moments according to the reference simulated SOC, the rated capacity of the battery cell in the battery, the health status of the battery, and the accumulated power corresponding to other moments; the other moments include moments other than the moments corresponding to the reference simulated SOC; A simulated SOC change rate is determined based on each of the simulated SOCs; and the second SOC change rate includes the simulated SOC change rate.

2. The method according to claim 1, characterized in that The determining the second SOC change rate based on the target SOC corresponding to each of the moments includes: Determining a change in the target SOC at two adjacent moments based on the target SOC corresponding to the two adjacent moments in each of the moments; An interpolated SOC change rate is determined based on the change amount of the target SOC at the two moments and the time change amount of the two moments; and the second SOC change rate includes the interpolated SOC change rate.

3. The method according to claim 1 or 2, characterized in that: The determining, according to the first SOC change rate and the second SOC change rate corresponding to each first SOC in the preset SOC interval, the abnormality detection result of each first SOC in the preset SOC interval includes: For each of the first SOCs located in the preset SOC interval, determining a change rate difference corresponding to the first SOC according to a first SOC change rate and a second SOC change rate corresponding to the first SOC; Based on the change rate differences corresponding to the preset SOC intervals, abnormality detection results of the first SOCs in the preset SOC intervals are determined.

4. The method according to claim 3, characterized in that The determining, based on each of the change rate differences corresponding to the preset SOC interval, the abnormality detection result of each first SOC in the preset SOC interval includes: Determining an SOC change rate threshold corresponding to the preset SOC interval based on each of the change rate differences corresponding to the preset SOC interval; Determining an SOC change rate threshold interval corresponding to the preset SOC interval based on the SOC change rate threshold corresponding to the preset SOC interval; According to the SOC change rate threshold interval corresponding to the preset SOC interval, the abnormality detection result of each first SOC in the preset SOC interval is determined.

5. The method according to claim 4, characterized in that The determining, based on the SOC change rate threshold value corresponding to the preset SOC interval, the SOC change rate threshold interval corresponding to the preset SOC interval includes: Performing cluster analysis on the SOC change rate thresholds corresponding to the preset SOC intervals to obtain cluster analysis results; Determining an abnormal SOC change rate threshold from the SOC change rate thresholds according to the cluster analysis result; The SOC change rate threshold interval is determined based on an SOC change rate threshold other than the abnormal SOC change rate threshold.

6. The method according to claim 4 or 5, characterized in that: The determining, according to the SOC change rate threshold interval corresponding to the preset SOC interval, the abnormality detection result of each first SOC in the preset SOC interval includes: For each of the first SOCs in the preset SOC interval, if a first SOC change rate corresponding to the first SOC is within an SOC change rate threshold interval corresponding to the preset SOC interval, determining that the abnormality detection result is that the first SOC is normal; If a first SOC change rate corresponding to the first SOC is outside the SOC change rate threshold interval corresponding to the preset SOC interval, the abnormality detection result is determined to be that the first SOC is abnormal.

7. The method according to claim 6, characterized in that The method further comprises: Determine a target SOC interval corresponding to each of the charging time periods in a recent preset number of charging time periods, and the first number of abnormal detection results corresponding to the target SOC interval for which the first SOC is normal; the target SOC interval includes a preset SOC interval to which the first SOC in the charging time period belongs; Determining a comparison value based on a preset weight corresponding to the target SOC interval in the charging time period and the first number; determining a reference value according to a second number of the first SOC in the charging time period and a preset weight corresponding to each of the preset SOC intervals; An abnormality detection result of the first SOC in the charging time period is determined according to the comparison value and the reference value.

8. The method according to claim 7, characterized in that The determining of the comparison value based on the preset weight corresponding to the preset SOC interval in the charging time period and the first number includes: Determine a first weighted value corresponding to the charging time period based on a first product of a preset weight corresponding to the preset SOC interval in the charging time period and the first number; The comparison value is determined according to the first weighted value corresponding to each of the charging time periods.

9. The method according to claim 8, characterized in that The determining of the reference value according to the second number of the first SOC in the charging time period and the preset weights corresponding to the preset SOC intervals includes: Determine a summation result of preset weights corresponding to each of the preset SOC intervals; Determine an average value of the second numbers in each of the charging time periods according to the second number of the first SOC in the charging time period; The reference value is determined based on the summation result and the average value.

10. The method according to any one of claims 7 to 9, characterized in that: The determining, according to the comparison value and the reference value, an abnormality detection result of the first SOC in the charging time period includes: If the comparison value is less than the reference value, determining that the abnormality detection result of the first SOC in the charging time period is that the first SOC in at least one charging time period is abnormal; If the comparison value is not less than the reference value, it is determined that the abnormality detection result of the first SOC in the charging time period is that the first SOC is normal.

11. The method according to any one of claims 7 to 9, characterized in that: The method further comprises: For each of the moments, based on the target electrical parameters at the moment, determining the operating condition identifier corresponding to the moment; According to the operating condition identifiers at each of the moments, a preset number of charging time periods are determined; the charging time periods include time periods composed of moments corresponding to the operating condition identifiers used to characterize the charging operating conditions.

12. A device for detecting abnormal state of charge, characterized in that: The device comprises: A first determination module, configured to determine each first SOC change rate according to a first state of charge SOC in electrical parameters of the battery at multiple times; the electrical parameters at least include a maximum voltage, a minimum voltage, a current, a temperature and the first SOC; A second determination module is used to determine, for each of the moments, a second SOC corresponding to the maximum voltage and a third SOC corresponding to the minimum voltage according to a correspondence between voltage and SOC, and a maximum voltage and a minimum voltage corresponding to the moment; A third determining module, configured to determine a target SOC corresponding to the moment according to the second SOC and the third SOC; a fourth determining module, configured to determine the second SOC change rate based on the target SOC corresponding to each of the moments; A fifth determination module, configured to determine, for each preset SOC interval, an abnormality detection result of each first SOC located in the preset SOC interval according to a first SOC change rate and a second SOC change rate corresponding to each first SOC located in the preset SOC interval; The determining the second SOC change rate based on the target SOC corresponding to each of the moments includes: Determine a reference simulated SOC from each of the target SOCs based on a target electrical parameter corresponding to each of the target SOCs; the target electrical parameter at least includes data other than the first SOC among the electrical parameters at the moment; Determine the simulated SOC corresponding to the other moments according to the reference simulated SOC, the rated capacity of the battery cell in the battery, the health status of the battery, and the accumulated power corresponding to other moments; the other moments include moments other than the moments corresponding to the reference simulated SOC; A simulated SOC change rate is determined based on each of the simulated SOCs; and the second SOC change rate includes the simulated SOC change rate.

13. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 11 are implemented.

14. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 11 are implemented.

15. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 11 are implemented.

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