Test method and test device

Abstract

The invention provides a test method and a test device. The method can be applied to the technical field of detection. The method comprises the following steps: acquiring a pulse sequence in a real failure scene of a control link of a laser emission unit, wherein the pulse sequence comprises abnormal pulses; controlling a laser emission unit to emit a pulse sequence capable of simulating the real failure scene, and determining energy capable of reaching an emission limit value and an abnormal pulse; and according to the determined reachable emission limit value and the energy of the abnormal pulse, determining whether the pulse sequence in the real failure scene can meet the human eye safety requirement or not. The embodiment of the invention can be used for evaluating the performance of laser products such as laser radars of new energy vehicles or intelligent driving vehicles, and can evaluate whether the laser products such as the laser radars meet human eye safety requirements or not in a failure scene.

Description

Technical Field

[0001] The present application relates to the field of detection technology, and more specifically, to a testing method and a testing device. Background Art

[0002] Laser technology is widely used in industrial production and life, such as ophthalmic laser curvature meters and laser scanners. Due to the narrow wavelength and concentrated energy characteristics of lasers, they may cause health problems to people, such as damage to people's eyes and skin. As one of the key sensors of intelligent driving systems, Lidar usually operates in a band that the human eye cannot perceive, making it easier for users to ignore the radiation intensity of the laser it emits and the risks it may cause to the human eye. In intelligent driving systems, the control link where the Lidar is located may have multiple failure modes. When the control link fails, the continuous emission time of the laser will become uncontrollable, and it is more likely to cause health problems such as eye damage to people. How to determine whether laser products such as Lidar may cause damage to people in failure scenarios has become an urgent problem to be solved. Summary of the invention

[0003] The present application provides a testing method and a testing device that can evaluate whether laser products such as lidar meet human eye safety requirements in failure scenarios.

[0004] In a first aspect, a test method is provided, which can be performed by a test device of a laser emitting unit, or by a chip or processor in the test device. In some possible implementations, the method can be performed by a test system consisting of a laser emitting unit and a test device. In some possible implementations, since laser products such as laser radars contain laser emitting units, the method can also be performed by a test device of a laser product, or by a chip or processor in the test device.

[0005] The method includes: controlling a first laser emitting unit to emit a first pulse sequence, the first pulse sequence including a plurality of first pulses, the first pulse including an abnormal pulse at the end of a second pulse sequence emitted by a second laser emitting unit, the first laser emitting unit and the second laser emitting unit being laser emitting units of the same type; determining a first accessible emission limit (AEL) and a first pulse energy according to the first pulse sequence; and determining whether the second pulse sequence meets eye safety requirements according to the first pulse energy and the first AEL.

[0006] In actual testing, in order to evaluate the performance of a certain type of laser product under a real failure scenario, it may be necessary to damage the laser product. For example, the laser product includes a laser emitting unit, and the control link of the laser emitting unit may include a drive unit and a drive switch, as well as other related processing circuits, control circuits and / or devices. When all or part of the control chain of the laser emitting unit is integrated in the laser product, and this part of the control link includes a failure element corresponding to the scenario to be tested, it may be necessary to destroy the laser product in order to test its performance under real failure. For example, assuming that the drive switch is integrated in a laser radar, and the failure scenario to be tested is a short circuit of the drive switch, in order to obtain the pulse sequence emitted by the laser radar under this failure scenario, it is necessary to destroy the drive switch in the laser radar.

[0007] Exemplarily, the second laser emitting unit can be understood as a laser emitting unit with a real failure in its control link. The second pulse sequence can be understood as a pulse sequence emitted by the second laser emitting unit with a failure in the control link. The first pulse is an abnormal pulse in the second pulse sequence. The first pulse sequence can be obtained by periodically repeating the first pulse. The first pulse energy can be the energy of the abnormal pulse.

[0008] In one embodiment, the second laser emitting unit and the first laser emitting unit for emitting the first pulse sequence may be different laser emitting units of the same type. For example, part or all of the control link of the laser emitting unit is integrated in the laser product. In order to test the performance of the laser product under real failure, if the laser product needs to be destroyed, since the laser product sample for emitting the second pulse sequence has been damaged, the first pulse sequence can be emitted by the sample of the same model.

[0009] In another embodiment, the second laser emitting unit and the first emitting unit may be the same laser emitting unit. For example, a control link of the laser emitting unit is disposed outside the laser product. For another example, a portion of the control link of the laser emitting unit is disposed outside the laser product, and the portion of the control link includes a failure element corresponding to the scene to be tested.

[0010] Exemplarily, when the energy of the abnormal pulse is greater than the first AEL, it can be considered that the laser product does not meet the human eye safety requirements and may cause damage to human eyes, etc. When the energy of the abnormal pulse is less than or equal to the first AEL, it can be considered that the laser product meets the human eye safety requirements.

[0011] Since the emission duration of laser pulses is usually in the nanosecond level, it is difficult to accurately measure the energy of abnormal pulses included in the pulse sequence, as well as emission parameters such as the central wavelength of the laser corresponding to the abnormal pulses in real failure scenarios. In this application, when testing a certain type of laser product, the abnormal pulses in the pulse sequence in the real failure scenario are simulated by the first pulse sequence, and it is possible to evaluate whether the laser product can meet the eye safety requirements in the failure scenario based on the energy of the abnormal pulses and the corresponding achievable emission limit.

[0012] In combination with the first aspect, in certain implementations of the first aspect, the second pulse sequence also includes a normal pulse, and the position of the normal pulse in the second pulse sequence is before the abnormal pulse. Determining whether the first pulse sequence meets the human eye safety requirement based on the first pulse energy and the first AEL may include: determining the second pulse energy based on the first pulse energy, the energy of the normal pulse and the number of normal pulses in the second pulse sequence; determining that the second pulse sequence meets the human eye safety requirement when the second pulse energy is less than or equal to the first AEL; or determining that the second pulse sequence does not meet the human eye safety requirement when the second pulse energy is greater than the first AEL.

[0013] For example, in a real failure scenario, the time when the failure occurs may be random, resulting in the number of pulses in the second pulse sequence being random. In a real failure scenario, the abnormal pulse is located at the end of the second pulse sequence. There may be one or more normal pulses before the abnormal pulse. The second pulse energy may be the energy of an average single pulse of the second pulse sequence. In other words, it is the average energy of a single pulse in the second pulse sequence.

[0014] Since the failure is random in real failure scenarios, in this application, the average single pulse energy in the failure scenario can be obtained by combining the number of normal pulses in the second pulse sequence in the real failure scenario. Based on the average single pulse energy in the failure scenario, whether the laser product meets the eye safety requirements can be evaluated, which can improve the accuracy of the test results.

[0015] In combination with the first aspect, in some implementations of the first aspect, the abnormal pulse may be a pulse emitted by the second laser emitting unit when the driving switch is short-circuited.

[0016] Exemplarily, the control link of the laser emission unit may include a driving unit and a driving switch. The driving unit may have failures such as short circuit and abnormal output. The laser emission unit may have failures such as wavelength drift and power drop. In the scenario where there is a failure in the control link, the pulse sequence emitted by the laser emission unit will contain abnormal pulses.

[0017] Compared with other failure modes, a short circuit in the drive switch is more likely to cause the laser emission unit to continuously emit lasers. This failure scenario is more likely to cause damage to the human eye than other failure scenarios. In this application, by evaluating the performance of the laser product when the drive switch is short-circuited, the test items of the laser product can be reduced while ensuring the accuracy of the evaluation results, which can shorten the test process and improve the test efficiency.

[0018] In combination with the first aspect, in certain implementations of the first aspect, a failure protection circuit for driving a switch may be provided in the control link of the second laser emitting unit, and the failure protection circuit is used to control the second laser emitting unit to shut down within a first time from the start time of the abnormal pulse, and the first time includes the response time of the entire control link of the second laser emitting unit.

[0019] In the present application, unexpected damage caused by continuous operation of the laser emitting unit can be avoided by setting a failure protection circuit.

[0020] In combination with the first aspect, in some implementations of the first aspect, determining the first AEL according to the first pulse sequence includes: determining a first parameter according to the first pulse sequence, the first parameter including one or more of a central wavelength of the first pulse, an emission duration of the first pulse, and a first apparent source subtending angle; determining an achievable emission limit AEL of a single pulse according to the first parameter. 单 , the single pulse in the second time can reach the emission limit AEL S.P.T and the single pulse of the first pulse train can reach the emission limit AEL 串 , where AEL 单 It is determined based on the central wavelength of the first pulse and the emission duration of the first pulse. S.P.T It is determined according to the achievable emission limit within the second time and the number of pulses within the second time, the second time is the emission duration of the first pulse sequence, the first pulse train is the pulse train within the third time, and when the third time includes multiple first pulses, AEL 串 is determined based on the third time; AEL 单 、AEL S.P.T and AEL 串 The minimum value among is determined as the first AEL.

[0021] In this application, by 单 、AEL S.P.T and AEL 串 The minimum value in is used as the first AEL, which can obtain the requirements for human eye safety in various evaluation scenarios and ensure that the laser products that pass the test can also meet the human eye safety requirements in failure scenarios.

[0022] In combination with the first aspect, in certain implementations of the first aspect, determining the first pulse energy according to the first pulse sequence may include: determining the first pulse energy according to the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse within a second time, where the second time is the emission duration of the first pulse sequence.

[0023] In the present application, the first pulse energy is determined by the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse within its emission duration. For pulses with an emission duration of nanoseconds, a relatively accurate energy of the abnormal pulse can also be obtained, which can improve the accuracy of the test results.

[0024] In a second aspect, a testing device is provided, which includes: a control unit for controlling a first laser emitting unit to emit a first pulse sequence, the first pulse sequence including multiple first pulses, the first pulse including an abnormal pulse at the end of a second pulse sequence emitted by a second laser emitting unit, and the first laser emitting unit and the second laser emitting unit are laser emitting units of the same type; a processing unit for determining a first achievable emission limit AEL and a first pulse energy according to the first pulse sequence; and determining whether the second pulse sequence meets the human eye safety requirements according to the first pulse energy and the first AEL.

[0025] In combination with the second aspect, in certain implementations of the second aspect, the second pulse sequence also includes a normal pulse, and the position of the normal pulse in the second pulse sequence is before the abnormal pulse. The processing unit can be used to: determine the second pulse energy according to the first pulse energy, the energy of the normal pulse and the number of normal pulses in the second pulse sequence; when the second pulse energy is less than or equal to the first AEL, determine that the second pulse sequence meets the human eye safety requirement; or, when the second pulse energy is greater than the first AEL, determine that the second pulse sequence does not meet the human eye safety requirement.

[0026] In combination with the second aspect, in some implementations of the second aspect, the abnormal pulse may be a pulse emitted by the second laser emitting unit when the driving switch is short-circuited.

[0027] In combination with the second aspect, in certain implementations of the second aspect, a failure protection circuit for driving a switch may be provided in the control link of the second laser emitting unit, and the failure protection circuit may be used to control the second laser emitting unit to shut down within a first time from the start time of the abnormal pulse, and the first time includes the response time of the entire control link of the second laser emitting unit.

[0028] In combination with the second aspect, in some implementations of the second aspect, the processing unit may be used to: determine a first parameter according to the first pulse sequence, where the first parameter includes one or more of a central wavelength of the first pulse, an emission duration of the first pulse, and a first apparent source subtending angle; determine an achievable emission limit AEL of a single pulse according to the first parameter. 单 , the single pulse in the second time can reach the emission limit AEL S.P.T and the single pulse of the first pulse train can reach the emission limit AEL 串 , where AEL 单 It is determined based on the central wavelength of the first pulse and the emission duration of the first pulse. S.P.T It is determined according to the achievable emission limit within the second time and the number of pulses within the second time, the second time is the emission duration of the first pulse sequence, the first pulse train is the pulse train within the third time, and when the third time includes multiple first pulses, AEL 串 is determined based on the third time; AEL 单 、AEL S.P.T and AEL 串 The minimum value among is determined as the first AEL.

[0029] In combination with the second aspect, in certain implementations of the second aspect, the processing unit can be used to: determine the first pulse energy based on the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse within the second time, where the second time is the emission duration of the first pulse sequence.

[0030] In a third aspect, a testing device is provided, comprising: a memory for storing a computer program; and a processor for executing the computer program stored in the memory, so that the device executes the method in the above-mentioned first aspect and any possible implementation manner thereof.

[0031] In a fourth aspect, a test system is provided, which includes a laser emitting unit and a test platform, and the test platform includes the device of the second aspect or the third aspect and any possible implementation thereof.

[0032] In a fifth aspect, a computer program product is provided, the computer program product comprising: a computer program code, when the computer program code is run on a computer, the computer executes the method in the first aspect and any possible implementation thereof.

[0033] In a sixth aspect, a computer-readable storage medium is provided, wherein the computer-readable medium stores a computer program, and when the computer program runs on a computer, the computer executes the method in the first aspect and any possible implementation thereof.

[0034] In a seventh aspect, a chip is provided, which includes a circuit for executing the method in the above-mentioned first aspect and any possible implementation manner thereof. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 It is a schematic diagram of a system architecture provided by an embodiment of the present application;

[0036] Figure 2 is a schematic diagram of a pulse sequence provided in an embodiment of the present application;

[0037] Figure 3 is a schematic diagram of a test scenario provided in an embodiment of the present application;

[0038] Figure 4 It is a flow chart of a testing method provided in an embodiment of the present application;

[0039] Figure 5 is a schematic diagram of a pulse sequence for testing provided in an embodiment of the present application;

[0040] Figure 6 is a schematic diagram of the waveform of an abnormal pulse provided in an embodiment of the present application;

[0041] Figure 7 It is a schematic diagram of another testing method provided in an embodiment of the present application;

[0042] Figure 8 is a schematic diagram of a testing device provided in an embodiment of the present application;

[0043] Fig. 9 It is a schematic diagram of another testing device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0044] First, some technical terms involved in the embodiments of the present application are introduced.

[0045] 1. Accessible emission limit (AEL): It can be used to classify laser products and can be understood as the maximum accessible emission level allowed within a specific category. AEL can be calculated based on the maximum permissible exposure (MPE). Different AEL values ​​can be used in different evaluation items.

[0046] AEL 单 , used to represent the achievable emission limit of a single pulse, which can be determined based on the duration and central wavelength of a single pulse, and can also be recorded as AEL single .

[0047] AEL T, used to represent the achievable emission limit within the selected time reference T, which can be determined based on the selected time reference T.

[0048] AEL S.P.T =AEL T / N T , represents the achievable emission limit for a single pulse within a selected time base T, N T It can represent the number of pulses within the time base T.

[0049] AEL 串 , used to represent the achievable emission limit of any single pulse in a pulse train, also known as AEL train For example, in time period T i When there are multiple pulse trains within a certain period (e.g., within 5 microseconds), the multiple pulse trains can be regarded as one pulse, and the AEL of any single pulse in the pulse train can be obtained. 串 =AEL 单 (T i )*C 5 , C 5 is the correction factor. For example, when the single pulse duration is less than 0.25s, C 5 =N -0.25 , where N is the number of valid pulses in the pulse train within the evaluated transmission duration.

[0050] In some possible scenarios, AEL can be 单 , AEL S.P.T and AEL 串 The minimum value among the above is taken as the AEL of the evaluated laser product. The description of AEL can be referred to the relevant technical documents and will not be repeated here.

[0051] The technical solution in this application will be described below in conjunction with the accompanying drawings.

[0052] For example, Figure 1 Schematic diagram of a system architecture provided by an embodiment of the present application. Figure 1 As shown, the system architecture 100 may include a driving unit 110, a driving switch 120, and a laser emitting unit 130. The driving unit 110 may provide a stable current and voltage for the laser emitting unit 130, so that the laser emitting unit 130 can output a laser of a specified wavelength and power. The driving switch 120 may be used to control the on-off between the driving unit 110 and the laser emitting unit 130. In some possible implementations, the driving switch 120 may be a metal-oxide-semiconductor field-effect transistor (MOSFET).

[0053] The system architecture 100 can be applied to various types of laser products. The laser product can include a laser emitting unit 130, and the driving unit 110 and / or the driving switch 120 can be arranged outside the laser product or integrated in the laser product, which is not limited in the embodiment of the present application. The following description takes the laser product as a laser radar as an example.

[0054] Exemplarily, the laser radar may include the laser emitting unit 130, and may also include a driving unit 110 and a driving switch 120. The laser radar may emit a laser pulse sequence (referred to as a pulse sequence for short), and the pulse sequence may include one or more pulses. Figure 2 Briefly introduce the pulse sequence output by the laser emitting unit.

[0055] In one embodiment, when the laser radar is in a normal working state, the pulse sequence emitted by the laser radar may include multiple normal pulses. The multiple normal pulses may have the same energy and pulse width, and the time intervals between adjacent pulses may also be the same, such as Figure 2 As shown in (a) in the figure, the energy, pulse width and / or time interval between adjacent pulses of the plurality of normal pulses may also have deviations within the allowable error range.

[0056] The risks posed by laser products to human health are related to the parameters of the laser. The mechanisms by which laser irradiation causes damage to biological tissues may include thermal reactions, thermoacoustic transients, photochemical effects, and nonlinear effects. The inherent physical parameters of the laser irradiation source, such as wavelength, pulse width, focal size, irradiance, and irradiation dose, affect the main damage mechanisms. For example, when the laser irradiation time is in the nanosecond or sub-nanosecond levels, the main damage mechanisms are acoustic transient effects and nonlinear effects. For another example, when the laser irradiation time is from 1 millisecond to several seconds, the main damage mechanism is thermal effects. For another example, when the laser irradiation time exceeds 10 seconds, the main damage mechanism is photochemical effects.

[0057] Laser products can be divided into multiple levels according to the hazards of laser to human health. For example, for Class 1 laser products, it is safe to look directly into the beam for a long time during use, or even when the human eye is exposed to the laser when using an optical observation instrument. For another example, for Class 1M laser products, it is safe to look directly into the beam with the naked eye for a long time during use. For another example, for Class 2 laser products, it is safe during instantaneous irradiation, but it may be harmful when the human eye intentionally looks at the laser beam. For another example, for Class 4 laser products, both looking into the beam and irradiating the skin are dangerous. In actual test scenarios, other classification methods can also be used.

[0058] For eye safety, laser products of different levels may correspond to different AELs. For the same laser product, when emitting different pulse sequences, the corresponding AEL can be determined based on the emission parameters. For example, when the laser radar is working normally, the corresponding AEL can be determined based on parameters such as the working center wavelength, pulse timing, and apparent source angle of the laser radar. The AEL can be used to evaluate whether the laser radar will cause damage to human eyes. The AEL of the laser radar in normal working scenarios can be determined based on relevant technical documents (such as IEC 60825, etc.). For another example, by measuring the average optical power and maximum optical power of the light spot emitted by the laser radar after passing through the hole grating, the actual maximum single pulse energy of the laser radar can be determined. When the maximum single pulse energy of the laser radar is greater than the AEL of the laser radar, it can be considered that the laser radar will cause damage to the eyes; when the maximum single pulse energy of the laser radar is less than or equal to the AEL, it can be considered that the laser radar will not cause damage to the eyes.

[0059] For example, Figure 3 is a schematic diagram of a scenario for measuring parameters of a laser radar provided in an embodiment of the present application. Figure 3 Its parameters are determined in the manner shown.

[0060] like Figure 3 As shown in (a) in the figure, the central wavelength of the pulse emitted by the laser radar (also called the working central wavelength of the laser radar) can be measured by a spectrum analyzer.

[0061] like Figure 3 As shown in (b) of Figure 1, the laser radar optical power can be measured by an integrating sphere power meter to determine the energy of the laser pulse emitted by the laser radar. For example, in this scenario, the total energy of normal pulses within a period of time can be obtained, and combined with the number of normal pulses within this period of time, the single pulse energy of the normal pulse can be calculated (denoted as E normal ).

[0062] like Figure 3 As shown in (c), through the photoelectric conversion device and the oscilloscope, the timing information of the pulses sent by the laser radar, such as the start and end time, energy peak time, and the interval between adjacent pulses, can be determined.

[0063] like Figure 3 As shown in (d) in the figure, the apparent source angle of the laser pulse emitted by the lidar can be determined by a photosensitive camera and a hole grating (such as a 7 mm hole grating).

[0064] In actual scenarios, each unit in the system architecture 100 may fail. For example, the drive unit 110 may have failures such as short circuit, no output, abnormal output, etc. For another example, the MOSFET may have failures such as gate (gate, G)-drain (drain, D)-source (source, S) short circuit, drain / source voltage drop, drain-source on resistance (drain-source on resistance, RDSon) increase, gate leakage increase, DS leakage increase, threshold voltage drift, gate parasitic resistance increase, etc. For another example, the laser emitting unit 130 may have failures such as wavelength drift, power drop, no light emission, etc.

[0065] Even if the laser radar does not cause health hazards to the eyes in normal working scenarios, it may cause damage to the eyes in scenarios where there is a failure in the entire control link of the laser radar. For example, when the driving switch 120 is short-circuited, the laser emitting unit 130 may continue to emit lasers, such as Figure 2 As shown in (b) in FIG. 1 , for example, when the wavelength of the laser emitting unit 130 drifts, it may cause the working center wavelength of the laser radar to change, thereby affecting the corresponding AEL.

[0066] In some possible implementations, in order to cope with possible failure scenarios, a failure protection circuit can be set in the system architecture to avoid unexpected consequences caused by failure of the driving unit 100, the driving switch 120 and / or the laser emitting unit 130. For example, when the driving switch 120 is short-circuited, within a preset time when the abnormal pulse appears, the corresponding failure protection circuit can successfully shut down the laser emitting unit 130 to avoid unexpected damage caused by its continued operation, such as Figure 2 However, even if a failure protection circuit is provided, the performance and parameters of laser products such as LiDAR may still change compared to their normal working state. Therefore, it is of great significance to evaluate whether laser products such as LiDAR may cause damage to personnel in the failure scenario.

[0067] In view of this, the embodiments of the present application provide a testing method and a testing device that can evaluate whether laser products such as lidar can meet the safety requirements of human eyes in random pulse failure scenarios.

[0068] For example, Figure 4 400 is a flow chart of a test method provided in an embodiment of the present application. The method 400 can be used to test laser products such as laser radar. The method 400 can be executed by a test device for a laser product, or by a chip or processor in the test device, or by a test system composed of the test device and the laser product. The method 400 may include:

[0069] S410, control the first laser emitting unit to emit a first pulse sequence, the first pulse sequence includes multiple first pulses, the first pulse includes an abnormal pulse at the end of a second pulse sequence emitted by the second laser emitting unit, and the first laser emitting unit and the second laser emitting unit are laser emitting units of the same type.

[0070] Exemplarily, the control link of the laser emitting unit may include its driving unit and driving switch. In the actual test scenario, the control link may also include other processing circuits, control circuits and / or control devices. When there is a failure in the control link of the laser control unit, the pulse sequence emitted by the laser emitting unit may include abnormal pulses. For example, the driving unit may have failures such as short circuit and output abnormality. For another example, MOSFET may have failures such as GDS short circuit, drain / source voltage drop, RDSon increase, gate leakage increase, DS leakage increase, threshold voltage drift, gate parasitic resistance increase. For another example, the laser emitting unit may have failures such as wavelength drift and power drop.

[0071] Because in real failure scenarios, the pulse sequence emitted by the laser emitting unit often only has one abnormal pulse at the end of the sequence, and the pulse emission duration is usually in the nanosecond level. This makes it difficult to accurately measure the optical power of the abnormal pulse included in the pulse sequence and the emission parameters corresponding to the abnormal pulse (for example, the working center wavelength, etc.) in real failure scenarios.

[0072] Furthermore, in order to evaluate the performance of a certain type of laser product under a real failure scenario, it may be necessary to damage the laser product, for example, when part or all of the control chain of the laser emission unit is integrated into the laser product.

[0073] Exemplarily, the second laser emitting unit can be understood as a laser emitting unit with a real failure in its control link. The pulse sequence emitted by the second laser emitting unit with a failure in the control link is the second pulse sequence. The first pulse is an abnormal pulse in the second pulse sequence, and the first pulse sequence can be obtained by periodically repeating the first pulse.

[0074] The second laser emitting unit and the first laser emitting unit for emitting the first pulse sequence may be the same laser emitting unit, or may be different laser emitting units of the same type.

[0075] In one embodiment, it is assumed that laser radar samples #1 and sample #2 are of type A (it can also be said that sample #1 and sample #2 are of the same model), and the laser radar of type A integrates a driving switch, a driving unit, and a laser emitting unit. In a normal working scenario, sample #1 and sample #2 can emit a normal pulse sequence (recorded as pulse sequence #0), such as Figure 2 To test whether the laser radar of type A meets the eye safety requirements in a failure scenario, the control link of the laser emission unit of sample #1 can be destroyed, such as by short-circuiting the drive switch and controlling sample #1 to emit laser pulses, thereby obtaining the pulse sequence (referred to as pulse sequence #1) emitted by the laser radar of type A in a real failure scenario, such as Figure 2 As shown in (b) in the figure. Figure 3 In the test scenario (c) in FIG, the abnormal pulse emitted by sample #1 can be obtained. Based on the abnormal pulse, a pulse sequence for testing (referred to as pulse sequence #2) can be constructed. Since sample #1 is damaged, sample #2 can be controlled to emit pulse sequence #2 to evaluate whether this type of lidar can meet the eye safety requirements in the failure scenario.

[0076] In another embodiment, it is assumed that sample #3 and sample #4 are both laser products of type B. The laser product of type B is provided with a laser emitting unit, but its driving switch and / or driving unit are provided outside the laser product. The driving switch and / or driving unit are rendered inoperable by technical means without causing damage to the laser product. In this case, when evaluating whether the laser product of type B meets human safety needs in a scenario where the control chain fails, sample #3 can be controlled to emit pulse sequence #1. Based on the abnormal pulses in pulse sequence #1, pulse sequence #2 is constructed. Then, sample #3 is controlled to emit pulse sequence #2, and whether the laser product of type B meets human safety needs is evaluated based on the test results.

[0077] In another embodiment, in a real failure scenario, the time when the failure occurs may be random, and pulse sequence #1 will end after the failure occurs, resulting in the number of pulses in pulse sequence #1 being random, and the abnormal pulse exists at the end of the sequence of pulse sequence #1. For example, the pulse sequence #1 may include only one pulse, and the pulse is an abnormal pulse. For another example, the pulse sequence #1 may also include one or more normal pulses, and the position of the normal pulse in the pulse sequence #1 is located before the abnormal pulse.

[0078] The pulse sequence #1 in the above embodiment can be understood as the second pulse sequence in step S410, and the pulse sequence #2 can be understood as the first pulse sequence in step S410.

[0079] S420: Determine a first achievable emission limit AEL and a first pulse energy according to the first pulse sequence.

[0080] For example, according to Figure 3 In the scenario shown in (b) of FIG. 1 , the energy of the first pulse sequence can be measured. Combined with the number of pulses in the first pulse sequence, the energy of the first pulse can be calculated. In other words, the energy of the abnormal pulse in the second pulse sequence can be obtained. The first pulse energy includes the energy of the abnormal pulse.

[0081] For example, in Figure 3 In the scenario shown, according to the first pulse sequence, a first parameter can be obtained. The first parameter may include one or more of the working center wavelength, the duration of a single pulse emission, and the apparent source subtending angle, etc. According to the measured first parameter of the laser radar, the corresponding first AEL can be determined.

[0082] In one embodiment, according to the actual use scenario of the laser product, AEL 单 、AEL S.P.T or AEL 串 Determined as the first AEL.

[0083] For example, the first AEL may be AEL 单 、AEL S.P.T and AEL 串 The minimum value of the AEL 单 、AEL S.P.T and AEL 串 can be obtained from the corresponding parameters. For example, the AEL 单 It can be obtained from the central wavelength of the first pulse and the emission duration; AEL S.P.T It can be determined by the emission duration of the first pulse sequence and the number of pulses within the time; when a preset time (such as 5 microseconds) includes multiple pulses, the AEL can be determined according to the preset time. 串 .

[0084] S430: Determine whether the second pulse sequence meets the eye safety requirement according to the first AEL and the first pulse energy.

[0085] As described above, in a real failure scenario, the time when the failure occurs is random. Accordingly, whether the second pulse sequence includes normal pulses and the number of normal pulses included may be random.

[0086] In one embodiment, when the second pulse sequence includes only abnormal pulses, when the first pulse energy is less than or equal to the first AEL, it can be determined that the second pulse sequence meets the human eye safety requirement. When the first pulse energy is greater than the first AEL, it can be considered that the second pulse sequence does not meet the human eye safety requirement and may cause damage to the human eye.

[0087] In another embodiment, when the second pulse sequence also includes normal pulses, the second pulse energy can be determined according to the first pulse energy, the number and energy of normal pulses in the second pulse sequence. The second pulse energy can represent the energy of an average single pulse in the second pulse sequence. When the second pulse energy is less than or equal to the first AEL, it can be determined that the second pulse sequence meets the eye safety requirement. Otherwise, it can be considered that the second pulse energy does not meet the eye safety requirement.

[0088] Exemplarily, the energy of the first pulse may be determined according to the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse in the first pulse sequence.

[0089] The following is an example of evaluating whether the laser radar meets the safety requirements of the human eye in the event of failure. Figures 5 to 7 The method 400 is briefly described. Figures 5 to 7 The method embodiment in can be understood as a variation or expansion of method 400. When other laser products are involved, or when assessing whether the safety requirements of the skin are met, the relevant parameters can be adaptively adjusted.

[0090] Compared with other possible failure modes of the system architecture 100, a short circuit in the drive switch 120 may cause the laser emitting unit 130 to continuously emit lasers, and this failure mode is more likely to cause damage to the human eye. In other words, in terms of the human eye safety requirements that the laser radar needs to meet, the failure scenario in which the drive switch is short-circuited is more likely to cause damage to the human eye than other failure scenarios. Therefore, this failure scenario can be considered the most stringent test scenario. By evaluating the performance of the laser radar when the drive switch is short-circuited, it can be determined whether the laser radar can meet the human eye safety requirements under various failure scenarios. In this way, while ensuring the accuracy of the evaluation results, the test items for the laser radar can be reduced and the test process can be shortened.

[0091] The following is an example of a failure scenario in which a drive switch in a control link is short-circuited.

[0092] For example, it can be based on Figure 3The waveform parameters of the pulse sequence in the actual failure scenario of the driving switch are determined according to the scenario shown in (c) in FIG. 1 . In the actual failure scenario, the abnormal pulse may appear at any position in the pulse sequence. For example, in the pulse sequence, there may be one or more normal pulses before the abnormal pulse, or there may be no pulse before the abnormal pulse.

[0093] In a real failure scenario, the pulse sequence includes only one abnormal pulse, which exists at the end of the pulse sequence. However, the pulse width of the LiDAR is usually at the nanosecond (ns) level. In a real failure scenario, it is difficult to accurately measure the optical power of an abnormal pulse included in the pulse sequence.

[0094] As described above, pulse sequence #1 can represent the pulse sequence emitted by the laser radar in a real failure scenario. By determining the waveform of the abnormal pulse in the real failure scenario, the laser radar can be controlled to emit pulse sequence #2 including multiple abnormal pulses. That is, after determining the abnormal pulse in pulse sequence #1, the laser radar can be controlled to periodically emit the abnormal pulse. For example, Figure 2 Taking the failure scenario shown in (b) as an example, pulse sequences #1 and #2 can be Figure 5 As another example, the position of the abnormal pulse in pulse sequence #1 or the order in the sequence may be determined, and the number of normal pulses in pulse sequence #1 may also be determined.

[0095] For example, Figure 6 Schematic diagram of the waveform of abnormal pulse provided by the embodiment of the present application. In the case where the failure protection circuit of the driving switch is not provided in the control chain of the laser radar, when the driving switch is short-circuited, the waveform of the abnormal pulse in pulse sequence #1 can be as follows Figure 6 In the case where a failure protection circuit of the driving switch is provided in the control chain of the laser radar, when the driving switch is short-circuited, the waveform of the abnormal pulse in the pulse sequence #1 can be as follows Figure 6 As shown in (b) in the figure. The starting time of the abnormal pulse is t 0 .

[0096] In one embodiment, for a laser radar without a fail-safe circuit in the control chain, when a short circuit occurs in the driving switch, the pulse emitted by the laser radar will inevitably experience a power drop after a period of time. The pulse starting from the start time of the abnormal pulse can be divided into two parts. For example, Figure 6 As shown in (a), t 1 is the starting point of the DC component, which can be determined according to t 1 The pulse starting from the start time of the abnormal pulse is divided into an abnormal pulse and a DC component. The abnormal pulse may include t0 and t 1 For example, t 0 and t 1 The pulse between the two pulses is denoted as pulse #1, and the periodic repetition of pulse #1 can constitute pulse sequence #2.

[0097] In some possible implementations, the first part and the second part may be determined in other ways, for example, t1 corresponds to a time point of 1% or 5% of the peak power of the trailing edge of the abnormal pulse.

[0098] In another embodiment, for a laser radar with a failure protection circuit in the control chain, when a short circuit occurs in the driving switch, assuming that the laser emitting unit of the laser radar can be successfully turned off at time t2, (t 2 -t 0 ) is recorded as the safety deadline t. 0 and t 2 The waveform between t and t is used as the reference to construct pulse sequence #2. 0 and t 2 The pulses in between are recorded as pulse #2, and pulse sequence #2 can be composed of these multiple pulses #2. The periodic repetition of pulse #2 can constitute pulse sequence #2.

[0099] By obtaining the working center wavelength, timing information, apparent source angle and other parameters of the laser radar corresponding to pulse sequence #2, the AEL corresponding to pulse sequence #2 can be determined. 失效 For example, the AEL corresponding to the pulse sequence #2 can be determined 单 、AEL S.P.T and AEL 串 , and take the minimum value as the AEL in the failure scenario 失效 The AEL 失效 It can be understood as the first AEL in steps S420 and S430.

[0100] For example, according to Figure 3 In the scenario shown in (b), the maximum optical power P received by the human eye at the failed light spot corresponding to pulse sequence #2 can be measured. max and the human eye receiving efficiency γ. According to the emission time T of pulse sequence #2 1 As well as the pulse repetition frequency (PRF) during this period, the energy of a single abnormal pulse can be calculated according to the following formula:

[0101] E′=P max *T 1 / PRF*γ

[0102] Assuming that the nth pulse in pulse sequence #1 is an abnormal pulse (n is a positive integer), the energy of a single pulse in the case of failure can satisfy E average =(E′+(n-1)*E normal ) / n. For example, in E average Less than or equal to AEL 失效 When E average Greater than AEL 失效 When the laser radar fails, it can be considered that it cannot meet the requirements of human eye safety.

[0103] For example, Figure 7 4 is a flow chart of another measurement method provided in an embodiment of the present application. The method 700 can be understood as an extension or deformation of the method 400. The method 700 can include the following steps:

[0104] S701, power on, simulate failure scenario, and start measurement.

[0105] For example, before step S701, Figure 3 Build a test environment based on the scenario shown.

[0106] Exemplarily, the actual failure scenario of the drive switch short circuit can be determined before the test. For example, the number of normal pulses in pulse sequence #1, the energy of the normal pulses, and the waveform of the abnormal pulses are determined. For another example, when a failure protection circuit for a drive switch short circuit is provided in the control link of the laser radar, the corresponding safety cutoff time is determined. For another example, when a failure protection circuit for a drive switch short circuit is not provided in the control link of the laser radar, the non-DC part of the abnormal waveform is determined. After the above preparations, the laser radar can be controlled to transmit pulse sequence #2 subsequently.

[0107] S702, measuring parameters in a laser radar failure scenario.

[0108] For example, by controlling the laser radar to transmit pulse sequence #2, parameters such as the corresponding working center wavelength, the apparent source subtending angle, and the emission duration of a single pulse in pulse sequence #2 can be measured.

[0109] S703, calculate the achievable energy limit AEL 失效 .

[0110] For example, according to the parameters determined in step S702, the AEL corresponding to the pulse sequence #2 can be determined. 单 、AEL S.P.T and AEL 串 , the minimum value of the three can be determined as AEL 失效 .

[0111] S704, measuring the energy E′ of a single abnormal pulse.

[0112] For example, the maximum average optical power P corresponding to pulse sequence #2 can be measured. max and human eye reception efficiency γ.

[0113] It should be understood that step S702 may be performed first, or step S704 may be performed first, or steps S702 and S704 may be performed simultaneously, which is not limited in the embodiments of the present application.

[0114] S705: Under the random failure scenario, calculate the average single-shot energy E of the accumulated normal pulses and abnormal pulses. average .

[0115] For example, according to the number of normal pulses in pulse sequence #1, the single pulse energy of normal pulses and the abnormal pulse energy E′, the average single shot energy E of pulse sequence #1 can be calculated. average .

[0116] S706, determine AEL 失效 Is it greater than E? average .

[0117] At AEL 失效 Greater than E average When AEL 失效 Less than or equal to E average When , jump to step S707.

[0118] S707, meets eye safety requirements.

[0119] At AEL 失效 Less than or equal to E average When the driving switch is short-circuited, the performance of the lidar meets the safety requirements of the human eye.

[0120] S708, does not meet eye safety requirements.

[0121] At AEL 失效 Greater than E average When the driving switch is short-circuited, the performance of the lidar does not meet the safety requirements of the human eye.

[0122] Combined with the above Figures 4 to 7 The method provided in the embodiment of the present application is described in detail. Figure 8 and Fig. 9 The device provided in the embodiment of the present application is described in detail. The description of the device embodiment corresponds to the description of the method embodiment, so the contents not described in detail can be referred to the method embodiment above.

[0123] For example, Figure 8 A schematic block diagram of a testing device 1000 (hereinafter referred to as device 1000 ) provided in an embodiment of the present application is shown. The device may include a control unit 1010 and a processing unit 1020 .

[0124] The apparatus 1000 may include executing Figures 4 to 7 The units of any method in the apparatus 1000 can be used to perform the above Figures 4 to 7 The corresponding process in any method embodiment.

[0125] The device 1000 is used to perform Figure 4 When the method 400 is performed, the control unit 1010 can be used to execute step S410 in the method 400, and the processing unit 1020 can be used to execute steps S420 and S430 in the method 400.

[0126] Specifically, the control unit 1010 can be used to control the first laser emitting unit to emit a first pulse sequence, the first pulse sequence includes a plurality of first pulses, the first pulse includes an abnormal pulse at the end of a second pulse sequence emitted by the second laser emitting unit, and the first laser emitting unit and the second laser emitting unit are laser emitting units of the same type. The processing unit 1020 can be used to determine a first AEL and a first pulse energy according to the first pulse sequence; and determine whether the second pulse sequence meets the eye safety requirement according to the first AEL and the first pulse energy.

[0127] In one embodiment, the apparatus 1000 may be Figure 3 In the scenario shown, the laser emitting unit to be tested, or the corresponding laser product, is controlled to emit a pulse sequence to obtain a measurement result.

[0128] Exemplarily, the second pulse sequence also includes a normal pulse, and the position of the normal pulse in the second pulse sequence is before the abnormal pulse. The processing unit 1020 can be used to determine the second pulse energy according to the first pulse energy, the energy of the normal pulse and the number of normal pulses in the second pulse sequence. The second pulse energy can be the energy of an average single pulse of the second pulse sequence.

[0129] In some possible implementations, the abnormal pulse in the second pulse sequence may be a pulse emitted by the second laser emitting unit when the driving switch is short-circuited.

[0130] In some possible implementations, a failure protection circuit of a driving switch is provided in the control link of the second laser emitting unit, and the failure protection circuit is used to control the second laser emitting unit to shut down within a first time from the start time of the abnormal pulse, and the first time includes the response time of the entire control link of the second laser emitting unit.

[0131] In some possible implementations, the processing unit 1020 may be used to: determine a first parameter according to the first pulse sequence, the first parameter including one or more of a central wavelength of the first pulse, an emission duration of the first pulse, and a first apparent source subtending angle; determine an achievable emission limit AEL of a single pulse according to the first parameter. 单 , the single pulse in the second time can reach the emission limit AEL S.P.T and the single pulse of the first pulse train can reach the emission limit AEL 串 , where AEL 单 It is determined based on the central wavelength of the first pulse and the emission duration of the first pulse. S.P.T It is determined according to the achievable emission limit within the second time and the number of pulses within the second time, the second time is the emission duration of the first pulse sequence, the first pulse train is the pulse train within the third time, and when the third time includes multiple first pulses, AEL 串 is determined based on the third time; AEL 单 、AEL S.P.T and AEL 串 The minimum value among is determined as the first AEL.

[0132] In some possible implementations, the processing unit 1020 may be configured to determine the first pulse energy based on the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse within a second time, where the second time is the emission duration of the first pulse sequence.

[0133] The division of the units in the above devices is only a division of logical functions. In actual implementation, they can be fully or partially integrated into one physical entity, or physically separated. All units of the above devices can be implemented in the form of a processor calling software, or in the form of hardware circuits, or in part in the form of a processor calling software, and the rest in the form of hardware circuits.

[0134] In a specific implementation process, the control unit 1010 may be implemented by at least one transceiver or transceiver-related circuits, and the processing unit 1020 may be implemented by at least one processor or processor-related circuits. In one example, one or more processors may determine a first AEL based on a first pulse sequence. In one example, one or more processors may determine a first pulse energy based on a first pulse sequence. In one example, one or more processors may determine an average single pulse energy of a second pulse sequence based on the first pulse energy, the energy of a normal pulse, and the number of normal pulses in the second pulse sequence. Exemplarily, in a specific implementation process, the device 1000 may be Figure 3 The test device corresponding to the laser emitting unit in the scenario shown, or the chip or processor arranged in the test device.

[0135] For example, Fig. 9 It is a schematic block diagram of another test device 2000 (hereinafter referred to as device 2000) provided in an embodiment of the present application. The device 2000 may include: a processor 2010, an interface circuit 2020 and a memory 2030. Among them, the processor 2010, the interface circuit 2020 and the memory 2030 are connected through an internal connection path, the memory 2030 is used to store instructions, the processor 2010 is used to execute the instructions stored in the memory 2030, and the interface circuit 2020 receives / sends part of the parameters. Optionally, the memory 2030 can be coupled to the processor 2010 through an interface, and can also be integrated with the processor 2010.

[0136] It should be noted that the interface circuit 2020 may include, but is not limited to, a transceiver such as an input / output interface to achieve communication between the device 2000 and other devices or communication networks. For example, the interface circuit 2020 may communicate with a laser emitting unit and / or a driving unit of the laser emitting unit. For another example, the interface circuit 2020 may communicate with a laser radar to control the laser radar to emit a first pulse sequence.

[0137] An embodiment of the present application also provides a testing system, which includes a laser emitting unit and the above-mentioned device 1000 or device 2000.

[0138] The present application also provides a computer program product, which includes: a computer program code, when the computer program code is run on a computer, the computer executes the above Figures 4 to 7 Any method embodiment and any possible implementation thereof.

[0139] The present application also provides a computer-readable storage medium, which stores program codes or instructions. When the computer program codes or instructions are executed by a processor of a computer, the processor implements the above-mentioned Figures 4 to 7 Any method embodiment and any possible implementation thereof.

[0140] The present application also provides a chip, including a circuit, for executing the above Figures 4 to 7 Any method embodiment and any possible implementation thereof.

[0141] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0142] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes and beneficial effects of the above-described systems, devices and units can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0143] In the several embodiments provided in the present application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0144] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0145] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0146] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application can be essentially or partly embodied in the form of a software product that contributes to the prior art. The computer software product is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in the various embodiments of the present application. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory, a random access memory, a magnetic disk, or an optical disk.

[0147] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A testing method, characterized in that: include: Controlling a first laser emitting unit to emit a first pulse sequence, wherein the first pulse sequence includes a plurality of first pulses, wherein the first pulse includes an abnormal pulse at the end of a second pulse sequence emitted by a second laser emitting unit, wherein the first laser emitting unit and the second laser emitting unit are laser emitting units of the same type; Determining a first achievable emission limit AEL and a first pulse energy according to the first pulse sequence; Determine whether the second pulse sequence meets eye safety requirements according to the first pulse energy and the first AEL.

2. The method according to claim 1, characterized in that The second pulse sequence also includes a normal pulse, and the position of the normal pulse in the second pulse sequence is before the abnormal pulse. The determining, according to the first pulse energy and the first AEL, whether the first pulse sequence meets the human eye safety requirement includes: determining a second pulse energy according to the first pulse energy, the energy of the normal pulse and the number of the normal pulses in the second pulse sequence; When the second pulse energy is less than or equal to the first AEL, determining that the second pulse sequence meets the eye safety requirement; or, When the second pulse energy is greater than the first AEL, it is determined that the second pulse sequence does not meet the human eye safety requirement.

3. The method according to claim 1 or 2, characterized in that: The abnormal pulse is a pulse emitted by the second laser emitting unit when a driving switch is short-circuited.

4. The method according to claim 3, characterized in that A failure protection circuit of the driving switch is provided in the control link of the second laser emitting unit, and the failure protection circuit is used to control the second laser emitting unit to shut down within a first time from the starting moment of the abnormal pulse, and the first time includes the response time of the entire control link of the second laser emitting unit.

5. The method according to any one of claims 1 to 4, wherein determining a first attainable emission limit AEL according to the first pulse sequence comprises: Determine a first parameter according to the first pulse sequence, the first parameter comprising one or more of a central wavelength of the first pulse, an emission duration of the first pulse, and a first apparent source subtending angle; According to the first parameter, the single pulse reachable emission limit AEL is determined 单 , the single pulse in the second time can reach the emission limit AEL S.P.T and the single pulse of the first pulse train can reach the emission limit AEL 串 , Among them, the AEL 单 is determined according to the central wavelength of the first pulse and the emission duration of the first pulse, the AEL S.P.T is determined according to the achievable emission limit within the second time and the number of pulses within the second time, the second time is the emission duration of the first pulse sequence, the first pulse train is the pulse train within the third time, and when the third time includes multiple first pulses, AEL 串 is determined according to the third time; The AEL 单 、The AEL S.P.T and the AEL 串 The minimum value among them is determined as the first AEL.

6. The method according to any one of claims 1 to 5, characterized in that The step of determining a first pulse energy according to the first pulse sequence comprises: The first pulse energy is determined according to the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse within a second time, where the second time is the emission duration of the first pulse sequence.

7. A testing device, characterized in that: include: a control unit, configured to control the first laser emitting unit to emit a first pulse sequence, wherein the first pulse sequence includes a plurality of first pulses, wherein the first pulse includes an abnormal pulse at the end of a second pulse sequence emitted by the second laser emitting unit, and the first laser emitting unit and the second laser emitting unit are laser emitting units of the same type; a processing unit, configured to determine a first achievable emission limit AEL and a first pulse energy according to the first pulse sequence; Determine whether the second pulse sequence meets eye safety requirements according to the first pulse energy and the first AEL.

8. The testing device according to claim 7, characterized in that: The second pulse sequence further includes a normal pulse, and the position of the normal pulse in the second pulse sequence is before the abnormal pulse, and the processing unit is used to: determining a second pulse energy according to the first pulse energy, the energy of the normal pulse and the number of the normal pulses in the second pulse sequence; When the second pulse energy is less than or equal to the first AEL, determining that the second pulse sequence meets the eye safety requirement; or, When the second pulse energy is greater than the first AEL, it is determined that the second pulse sequence does not meet the human eye safety requirement.

9. The testing device according to claim 7 or 8, characterized in that: The abnormal pulse is a pulse emitted by the second laser emitting unit when a driving switch is short-circuited.

10. The testing device according to claim 9, characterized in that: A failure protection circuit of the driving switch is provided in the control link of the second laser emitting unit, and the failure protection circuit is used to control the second laser emitting unit to shut down within a first time from the starting moment of the abnormal pulse, and the first time includes the response time of the entire control link of the second laser emitting unit.

11. The testing device according to any one of claims 7 to 10, characterized in that: The processing unit is used for: Determine a first parameter according to the first pulse sequence, the first parameter comprising one or more of a central wavelength of the first pulse, an emission duration of the first pulse, and a first apparent source subtending angle; According to the first parameter, the single pulse reachable emission limit AEL is determined 单 , the single pulse in the second time can reach the emission limit AEL S.P.T and the single pulse of the first pulse train can reach the emission limit AEL 串 , Among them, the AEL 单 is determined according to the central wavelength of the first pulse and the emission duration of the first pulse, the AEL S.P.T is determined according to the achievable emission limit within the second time and the number of pulses within the second time, the second time is the emission duration of the first pulse sequence, the first pulse train is the pulse train within the third time, and when the third time includes multiple first pulses, AEL 串 is determined according to the third time; The AEL 单 、The AEL S.P.T and the AEL 串 The minimum value among them is determined as the first AEL.

12. The testing device according to any one of claims 7 to 11, characterized in that: The processing unit is used for: The first pulse energy is determined according to the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse within a second time, where the second time is the emission duration of the first pulse sequence.

13. A testing device, characterized in that: The device comprises: Memory for storing computer programs; A processor, configured to execute the computer program stored in the memory, so that the apparatus performs the method according to any one of claims 1 to 6.

14. A testing system, characterized in that: The system comprises a laser emitting unit and a testing platform, wherein the testing platform comprises the device according to any one of claims 7 to 13.

15. A computer-readable storage medium, characterized in that: A computer program is stored thereon, and when the computer program is executed by a computer, the method according to any one of claims 1 to 6 is implemented.

16. A computer program product, characterized in that The computer program product comprises a computer program code. When the computer program code is run on a computer, the method according to any one of claims 1 to 6 is executed.

Images