Laser chip near-field image data acquisition system, method, computer device, storage medium, and program product

Abstract

The present application relates to a near-field image data acquisition system for a laser chip, a near-field image data acquisition method for a laser chip, a computer device, a computer-readable storage medium, and a computer program product. Among them, a near-field image data acquisition system for a laser chip includes a driving module and an image acquisition module. The driving module is configured to drive at least two light-emitting channels of the laser chip to be tested to light up according to a preset driving timing. The image acquisition module is configured to continuously expose the laser chip to be tested while at least two light-emitting channels are lit, so as to obtain near-field image data of the laser chip to be tested; wherein, the near-field image data contains energy distribution data of at least two light-emitting channels that are lit. The present application can effectively improve the test efficiency.

Description

Technical Field

[0001] The present application relates to the field of chip testing technology, and in particular to a near-field image data acquisition system for a laser chip, a near-field image data acquisition method for a laser chip, a computer device, a computer-readable storage medium, and a computer program product. Background Art

[0002] The energy distribution parameter of the output surface is a commonly used evaluation index of laser chips. This index is also called near-field light distribution.

[0003] Some laser chips include multiple light-emitting channels. For such chips, the test efficiency is low when testing the energy distribution of the chip's output surface (i.e., near-field light distribution). Summary of the invention

[0004] Based on this, it is necessary to provide a near-field image data acquisition system for a laser chip, a near-field image data acquisition method for a laser chip, a computer device, a computer-readable storage medium and a computer program product that can improve the test efficiency in response to the above technical problems.

[0005] A near-field image data acquisition system for a laser chip is configured to test a laser chip to be tested, wherein the laser chip to be tested includes a plurality of light-emitting channels, including:

[0006] A driving module, configured to drive at least two light-emitting channels of the laser chip to be tested to light up according to a preset driving timing;

[0007] The image acquisition module is configured to continuously expose the laser chip to be tested while the at least two light-emitting channels are illuminated, so as to obtain near-field image data of the laser chip to be tested; wherein the near-field image data includes energy distribution data of the at least two illuminated light-emitting channels.

[0008] In one embodiment, the near-field image data acquisition system of the laser chip further includes:

[0009] A control module is connected to the driving module and the image acquisition module respectively, and the control module is configured to send a trigger signal; the trigger signal is configured to trigger the driving module to drive at least two light-emitting channels of the laser chip to be tested to light up according to a preset driving timing, and trigger the image acquisition module to continuously expose the laser chip to be tested; and / or,

[0010] The preset driving sequence includes time-division lighting or simultaneous lighting.

[0011] In one embodiment, the driving module is configured to provide a driving signal to each of the light-emitting channels according to the trigger signal to light up the light-emitting channels; and / or,

[0012] The driving signal includes a driving frame composed of a plurality of pulse signals.

[0013] In one embodiment, after receiving the trigger signal, the driving module starts to output the driving signal after a first delay time, and / or,

[0014] After receiving the trigger signal, the image acquisition module starts exposure after a second delay time.

[0015] In one embodiment, the exposure start time of the image acquisition module is no later than the start time of the driving module driving the first light-emitting channel; or,

[0016] The exposure start time of the image acquisition module is no later than the end time of the driving module driving the first light-emitting channel; or,

[0017] The exposure end time of the image acquisition module is not earlier than the driving end time of the driving module for the last lighted light-emitting channel; or,

[0018] The exposure end time of the image acquisition module is not earlier than the driving start time of the driving module for the last lighted light-emitting channel.

[0019] In one embodiment, the continuous exposure time of the image acquisition module is not less than the sum of the total time when each of the light-emitting channels is illuminated and the total time when each of the light-emitting channels is switched; or

[0020] The continuous exposure time of the image acquisition module is equal to the sum of the total time that each of the light-emitting channels is illuminated and the total time that each of the light-emitting channels is switched.

[0021] In one embodiment, the near-field image data acquisition system of the laser chip further includes a testing machine and / or a light collection module:

[0022] The testing machine is connected to the image acquisition module and is configured to receive the near-field image data;

[0023] The light collecting module is located between the laser chip to be tested and the image acquisition module, and is configured to control the laser beam emitted by the laser chip to be tested to be within the photosensitivity range of the image acquisition module.

[0024] A method for acquiring near-field image data of a laser chip is configured to test a laser chip to be tested, wherein the laser chip to be tested includes a plurality of light-emitting channels, including:

[0025] Controlling a driving module to light up at least two light-emitting channels of the laser chip to be tested according to a preset driving timing; and

[0026] An image acquisition module is controlled to continuously expose the laser chip to be tested during the period when the at least two light-emitting channels are illuminated, so as to obtain near-field image data of the laser chip to be tested; wherein the near-field image data includes energy distribution data of the at least two illuminated light-emitting channels.

[0027] In one embodiment, the method further comprises:

[0028] Sending a trigger signal, wherein the trigger signal is configured to trigger the driving module and the image acquisition module to operate; and / or,

[0029] After sending a trigger signal, the driving module and the image acquisition module are controlled to work after a first delay time and a second delay time respectively; wherein the first delay time is the same as the second delay time or the first delay time is different from the second delay time; and / or,

[0030] The near-field image data is received.

[0031] In one embodiment, it also includes:

[0032] Control the driving module to drive one of the light-emitting channels to light up at a time in the form of multiple pulse signals; and / or,

[0033] The driving module is controlled to switch to lighting the next light-emitting channel immediately after lighting of a single light-emitting channel is completed.

[0034] In one embodiment, it also includes:

[0035] Controlling the image acquisition module to start exposure no later than the start time of driving the first light-emitting channel by the driving module; or,

[0036] Controlling the image acquisition module to start exposure no later than the moment when the driving module ends driving the first light-emitting channel; or,

[0037] Controlling the image acquisition module to end exposure no earlier than the driving module ends driving the last light-emitting channel that is lit; or,

[0038] The image acquisition module is controlled to end exposure no earlier than the start time of driving the last lighted light-emitting channel by the driving module.

[0039] A computer device comprises a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the above method when executing the computer program.

[0040] A computer-readable storage medium stores a computer program, which implements the steps of the above method when executed by a processor.

[0041] A computer program product comprises a computer program, and when the computer program is executed by a processor, the steps of the above method are implemented.

[0042] A computer device comprises a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the above method when executing the computer program.

[0043] A computer-readable storage medium stores a computer program, which implements the steps of the above method when executed by a processor.

[0044] A computer program product comprises a computer program, and when the computer program is executed by a processor, the steps of the above method are implemented.

[0045] In the above-mentioned near-field image data acquisition system for laser chips, near-field image data acquisition method for laser chips, computer equipment, computer-readable storage medium and computer program product, the driving module drives at least two light-emitting channels of the laser chip to be tested according to a preset driving timing, and the image acquisition module continuously exposes the laser chip to be tested while the at least two light-emitting channels are illuminated. Therefore, during one exposure process, the image acquisition module can obtain the near-field image data of the laser chip to be tested, which includes the energy distribution data of at least two illuminated light-emitting channels. Therefore, it is not necessary to perform a data transmission process independently for each light-emitting channel, thereby effectively reducing the total data transmission time and effectively improving the overall test efficiency.

[0046] At the same time, the image formed by one exposure of the image acquisition module includes images of at least two light-emitting channels. Each light-emitting channel can effectively occupy the image space, thereby effectively increasing the effective data ratio of the light-emitting channel. Therefore, after the exposure is completed, the image acquisition module can quickly output the test data to the outside. Therefore, the data transmission time can be more effectively reduced, thereby improving the test efficiency. At the same time, the effective data of the light-emitting channel is greatly increased, thereby effectively reducing the data storage space.

[0047] At the same time, in the actual application of laser chips, there will be leakage crosstalk between adjacent or close light-emitting channels. In the traditional test method, each light-emitting channel is tested independently, and the problem cannot be detected synchronously. In the present application, the image acquisition module continuously exposes at least two light-emitting channels. When one light-emitting channel is lit, other light-emitting channels may also be lit, thereby increasing the final brightness of other light-emitting channels. Therefore, this embodiment can detect the existence of leakage crosstalk between light-emitting channels when uneven light emission exists between light-emitting channels in the same test image. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the conventional technology, the drawings required for use in the embodiments or the conventional technology descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0049] Figure 1a A timing diagram of a chip test in one embodiment;

[0050] Figure 1b It is a single near-field image in the prior art (i.e., a near-field light distribution image, i.e., an energy distribution image);

[0051] Figure 2 is a structural block diagram of a near-field image data acquisition system of a laser chip in one embodiment;

[0052] Figure 3 A timing diagram of a chip test in another embodiment;

[0053] Figure 4 is a single near-field image (i.e., a near-field light distribution image, i.e., an energy distribution image) in one embodiment;

[0054] Figure 5 is a structural block diagram of a near-field image data acquisition system of a laser chip in another embodiment;

[0055] Figure 6 is a timing diagram of chip testing in yet another embodiment;

[0056] Figure 7 A structural block diagram of a near-field image data acquisition system of a laser chip in yet another embodiment;

[0057] Figure 8 Schematic diagram of a process for acquiring near-field image data of a laser chip in one embodiment.

[0058] Description of reference numerals:

[0059] 100 - control module, 200 - driving module, 210 - first driving circuit, 220 - second driving circuit, 300 - image acquisition module, 400 - testing machine. DETAILED DESCRIPTION

[0060] In order to facilitate understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Embodiments of the present application are provided in the drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive.

[0061] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application.

[0062] It can be understood that the terms "first", "second", etc. used in the present application can be configured herein to describe various elements, but these elements are not limited by these terms. These terms are only configured to distinguish the first element from another element.

[0063] It should be noted that when an element is considered to be "connected" to another element, it can be directly connected to the other element, or connected to the other element through an intermediate element. In addition, the "connection" in the following embodiments should be understood as "electrical connection", "communication connection", etc. if there is transmission of electrical signals or data between the connected objects.

[0064] When used herein, the singular forms "a", "an", and "said / the" may also include plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include / comprise" or "have" and the like specify the presence of stated features, wholes, steps, operations, components, parts, or combinations thereof, but do not exclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts, or combinations thereof. At the same time, the term "and / or" used in this specification includes any and all combinations of the relevant listed items.

[0065] As mentioned in the background technology, in the prior art, there is a problem of low efficiency in testing the state of energy distribution (i.e., near-field light distribution) of the output surface of a multi-channel laser chip. The inventors have found that the reason for this problem is:

[0066] For this type of chip, the traditional test method requires testing each light-emitting channel independently through an image acquisition device such as a camera. The test process of each light-emitting channel requires receiving trigger signals, exposure, data transmission, and information interaction with other modules (including sending information to the control module that the data transmission of the current light-emitting channel has been completed). This results in a long data transmission time for each light-emitting channel, which limits the overall test efficiency.

[0067] Also, see Figure 1b Due to the limited size of the light channel, the light channel only occupies a small image space in the image formed by each light channel. Therefore, in the entire set of data collected by the image acquisition device for a single light channel, the effective data of the light channel accounts for a very small proportion (e.g., 0.4%~0.5%).

[0068] This results in longer data transmission time for each channel and also creates greater pressure on data storage resources.

[0069] Based on this, the present application provides a near-field image data acquisition system for a laser chip, a near-field image data acquisition method for a laser chip, a computer device, a computer-readable storage medium, and a computer program product that can improve test efficiency.

[0070] In one embodiment, see Figure 2 , a near-field image data acquisition system for a laser chip is provided. The near-field image data acquisition system for a laser chip is configured to test a laser chip to be tested, and includes a driving module 200 and an image acquisition module 300 .

[0071] The laser chip to be tested includes a plurality of light-emitting channels. The laser chip to be tested may include but is not limited to a laser chip having a plurality of light-emitting channels such as a vertical cavity surface emitting laser (VCSEL).

[0072] See also Figure 3 The driving module 200 is configured to drive at least two light-emitting channels of the laser chip to be tested to light up according to a preset driving timing.

[0073] The preset driving sequence can be set according to actual needs. For example, the preset driving sequence includes lighting up in different time periods or lighting up at the same time.

[0074] Exemplarily, the driving module 200 may include a driving board, which may be a specially made board configured to drive different light-emitting channels of the laser chip to be tested.

[0075] It should be noted that, in the driving module 200 “driving at least two light-emitting channels of the laser chip to be tested to light up”, “at least two light-emitting channels” may be all the light-emitting channels on the laser chip to be tested, or may be part of the light-emitting channels on the laser chip to be tested (such as 1 / 2 of the light-emitting channels or 1 / 3 of the light-emitting channels).

[0076] See also Figure 3 as well as Figure 4 The image acquisition module 300 is configured to continuously expose the laser chip to be tested during the period when at least two light-emitting channels are illuminated, so as to obtain near-field image data of the laser chip to be tested. The near-field image data includes energy distribution data of at least two illuminated light-emitting channels.

[0077] Exemplarily, the image acquisition module 300 may include a sensor unit.

[0078] The sensor unit may be configured to perform exposure imaging on the light emitting channel, and may include a charge coupled device (CCD) or a complementary metal oxide semiconductor (CMOS), etc.

[0079] Exemplarily, the near-field image data acquisition system of the laser chip may further include a light collection module (such as a microscope). The light collection module is located between the laser chip to be tested and the image acquisition module and is configured to control the laser beam emitted by the laser chip to be tested within the photosensitivity range of the image acquisition module.

[0080] The energy beam emitted from the exit surface of each light-emitting channel of the laser chip to be tested can be projected onto the sensor unit through the light-collecting module. The imaging field of view of the light-collecting module can be set to ensure that all light-emitting channels on the laser chip to be tested are within the light-sensitive range of the sensor unit. At this time, the exit energy of all light-emitting channels of the entire chip can be captured without mechanical displacement.

[0081] In this embodiment, the driving module 200 is configured to drive at least two light-emitting channels of the laser chip to be tested to light up according to a preset driving timing. At the same time, the image acquisition module 300 is configured to continuously expose the laser chip to be tested while at least two light-emitting channels are lit. During one exposure process, the image acquisition module 300 can obtain near-field image data of the laser chip to be tested that includes energy distribution data of at least two light-emitting channels that are lit up. Therefore, it is not necessary to independently perform a data transmission process for each light-emitting channel, thereby effectively reducing the total data transmission time and effectively improving the overall test efficiency.

[0082] Meanwhile, the near-field image formed by one exposure of the image acquisition module 300 includes images of at least two light-emitting channels (see Figure 4). Each light-emitting channel can effectively occupy the image space, thereby effectively increasing the effective data ratio of the light-emitting channel. Therefore, after the exposure is completed, the image acquisition module 300 can output the test data more quickly. Therefore, the data transmission time can be more effectively reduced and the test efficiency can be improved. At the same time, the effective data of the light-emitting channel is greatly increased, thereby effectively reducing the data storage space.

[0083] At the same time, in the actual application of the laser chip, there will be a problem of leakage crosstalk between adjacent or close light-emitting channels. In the traditional test method, each light-emitting channel is tested independently, and the problem cannot be detected synchronously. In this embodiment, the image acquisition module 300 continuously exposes at least two light-emitting channels. When one light-emitting channel is lit, other light-emitting channels may also be lit, thereby increasing the final brightness of other light-emitting channels. Therefore, this embodiment can detect the existence of leakage crosstalk between light-emitting channels when uneven light emission exists between light-emitting channels in the same test image.

[0084] In one embodiment, see Figure 5 The near-field image data acquisition system of the laser chip also includes a control module 100.

[0085] The control module 100 is connected to the driving module 200 and the image acquisition module 300 respectively.

[0086] The control module 100 is configured to send a trigger signal. The trigger signal is configured to trigger the driving module 200 to drive at least two light-emitting channels of the laser chip to be tested to light up according to a preset driving timing, and trigger the image acquisition module 300 to continuously expose the laser chip to be tested.

[0087] Specifically, the control module 100 may send a trigger signal to the driving module 200 and the image acquisition module 300 to trigger the driving module 200 and the image acquisition module 300 .

[0088] After receiving the trigger signal, the driving module 200 can drive at least two light-emitting channels of the laser chip to be tested to light up according to a preset driving timing.

[0089] After receiving the trigger signal, the image acquisition module 300 can control the sensor unit to expose according to the preset duration, so that the sensor unit can expose all the light-emitting channels (at least two light-emitting channels) lit in one driving process of the driven module 200. The preset duration can be set according to actual needs.

[0090] In this embodiment, the control module 100 only needs to send a trigger signal, the driving module 200 can independently control the driving according to the trigger signal, and the image acquisition module 300 can independently control the exposure according to the trigger signal, thereby effectively improving the test response speed.

[0091] In one embodiment, the driving module 200 is configured to provide a driving signal to each light-emitting channel according to the trigger signal, so as to light up the light-emitting channel.

[0092] For example, see Figure 5 The driving module 200 includes a first driving circuit 210 and a second driving circuit 220 .

[0093] The first driving circuit 210 is configured to enable light-emitting channels. The first driving circuit 210 can enable different light-emitting channels in different time periods.

[0094] Exemplarily, each light-emitting channel may be provided with a corresponding gate switch. The first driving circuit 210 may input an effective level to the gate switch, so that the gate switch is turned on, thereby turning on the corresponding light-emitting channel. At the same time, when the first driving circuit 210 turns on one of the light-emitting channels, the other light-emitting channels are turned off.

[0095] Specifically, the first driving circuit 210 may input a valid level (such as a high level) to the gate switch of the i-th light-emitting channel in the first time period to gate the i-th light-emitting channel. Then, an invalid level (such as a low level) may be input to the gate switch of the i-th light-emitting channel in the second time period to turn off the i-th light-emitting channel. Thereafter, a valid level (such as a high level) may be input to the gate switch of the i+1-th light-emitting channel in the third time period to gate the i+1-th light-emitting channel, and so on, directly gate all light-emitting channels.

[0096] The second driving circuit 220 is configured to provide driving signals to each light-emitting channel to light up each light-emitting channel. The driving signal may be a driving voltage or a driving current, which may be set according to actual needs.

[0097] For example, see Figure 1a The driving module 200 may further include a driving control unit. The driving control unit may receive a trigger signal from the control module 100, and after receiving the trigger signal from the control module 100, control the first driving circuit 210 to turn on the gating switches of different light-emitting channels according to a preset driving timing, thereby gating different light-emitting channels in a time-sharing (or simultaneous) manner. Furthermore, the driving control unit may control the second driving circuit 220 to provide a driving signal to each light-emitting channel when each light-emitting channel is turned on.

[0098] In one embodiment, a driving signal includes a driving frame composed of multiple pulse signals. Exemplarily, the driving signal may include a periodic pulse signal (such as a pulse voltage). The pulse width, duty cycle, frequency, waveform and other parameters of the pulse signal may be adjusted as needed.

[0099] At this time, during the gating period of each light-emitting channel: when the pulse signal is at a valid level (such as a high level), the light-emitting channel is lit. When the pulse signal is at an invalid level (such as a low level), the light-emitting channel is extinguished. When the pulse signal is at a valid level (such as a high level) again, the light-emitting channel is lit again.

[0100] By setting a driving signal including a driving frame composed of multiple pulse signals, each light-emitting channel can be illuminated multiple times during the gating period, thereby increasing the output energy of the light-emitting channel. Therefore, the image acquisition device can receive sufficient energy, so that each light-emitting channel can be effectively exposed. At the same time, it is not always illuminated during the gating period, thereby saving power consumption.

[0101] In other embodiments, the driving signal may also be configured to include a direct current signal. The direct current signal may have a sufficient duration so that the image acquisition device can receive sufficient energy, thereby effectively exposing each light-emitting channel.

[0102] In one embodiment, see Figure 6 After receiving the trigger signal, the driving module 200 starts to output the driving signal after a first delay time to start lighting up at least two light-emitting channels.

[0103] At this time, the driving module 200 may start driving after determining that the trigger signal is stable, thereby preventing erroneous driving caused by interference signals.

[0104] The first delay duration can be set according to actual needs.

[0105] Of course, in other embodiments, the driving module 200 can also start to light up multiple light-emitting channels in a time-sharing manner immediately after receiving the trigger signal. At the same time, it can be understood that in the actual circuit, after the control module 100 sends out the trigger signal, the trigger signal needs a certain time for the rising edge. Therefore, in terms of timing, even if the driving module 200 starts the driving work immediately after receiving the trigger signal, the actual driving start time of the driving module 200 will be delayed for a period of time relative to the time when the control module 100 sends out the touch signal.

[0106] In one embodiment, see Figure 6 After receiving the trigger signal, the image acquisition module 300 starts exposure after a second delay time.

[0107] At this time, the image acquisition module 300 may start exposure after determining that the trigger signal is stable, thereby preventing erroneous exposure caused by interference signals.

[0108] The second delay time can be set according to actual needs. The second delay time can be the same as or different from the first delay time.

[0109] Of course, in other embodiments, the image acquisition module 300 may also start the exposure work immediately after receiving the trigger signal. At the same time, it can be understood that in the actual circuit, after the control module 100 sends the trigger signal, the trigger signal needs a certain time of rising edge time. Therefore, in terms of timing, even if the image acquisition module 300 starts the driving work immediately after receiving the trigger signal, the actual exposure start time of the image acquisition module 300 will be delayed for a period of time relative to the time when the control module 100 sends the touch signal.

[0110] In one embodiment, the exposure start time of the image acquisition module 300 is no later than the driving start time of the driving module 200 for the first light-emitting channel to be illuminated.

[0111] That is, the exposure start time of the image acquisition module 300 may be the same as the driving start time of the driving module 200 for the first illuminated light-emitting channel, or may be earlier than the driving start time of the driving module 200 for the first illuminated light-emitting channel. Exemplarily, the driving start time may be the gating start time of the first driving circuit 210 of the driving module 200.

[0112] Exemplarily, the second delay time can be set to be less than or equal to the first delay time, so that the exposure start time of the image acquisition module 300 is no later than the driving start time of the driving module 200 for the first illuminated light emitting channel.

[0113] In one embodiment, the exposure end time of the image acquisition module 300 is not earlier than the driving end time of the driving module 200 for the last lighted light-emitting channel.

[0114] That is, the exposure end time of the image acquisition module 300 may be the same as the driving end time of the last light-emitting channel that is lit by the driving module 200, or may be later than the driving end time of the last light-emitting channel that is lit by the driving module 200. Exemplarily, the driving end time may be the gating end time of the first driving circuit 210 of the driving module 200.

[0115] In some embodiments, the exposure start time of the image acquisition module 300 can be set to be no later than the driving start time of the driving module 200 for the first light-emitting channel that is lit, and the exposure end time of the image acquisition module 300 can be set to be no earlier than the driving end time of the driving module 200 for the last light-emitting channel that is lit. At this time, by effectively limiting the exposure start time and exposure end time of the image acquisition module 300, it can be ensured that the image acquisition module 300 can effectively expose and collect data for each light-emitting channel lit by the driving module 200.

[0116] In one embodiment, the exposure start time of the image acquisition module 300 is not later than the driving end time of the driving module 200 on the first light-emitting channel to be lit, so that the first light-emitting channel to be lit can be exposed.

[0117] In one embodiment, the exposure end time of the image acquisition module 300 is not earlier than the driving start time of the driving module 200 for the last light-emitting channel that is lit, so that the last light-emitting channel that is lit can be exposed.

[0118] In one embodiment, the continuous exposure time of the image acquisition module is not less than the sum of the total time when each light-emitting channel is illuminated and the total switching time of each light-emitting channel.

[0119] The continuous exposure time of the image acquisition module may be greater than or equal to the total time of the driving module 200 driving the at least two light-emitting channels.

[0120] The total duration of driving the at least two light-emitting channels by the driving module 200 may be equal to the sum of the total duration of the driving module 200 gating each light-emitting channel and the total duration of the switching of each light-emitting channel. The total duration of the driving module 200 gating each light-emitting channel is the sum of the gating durations of the driving module 200 gating each light-emitting channel.

[0121] Exemplarily, the driving signal for the light-emitting channel includes a DC signal. At this time, the lighting duration of each light-emitting channel is equal to the strobing duration of the light-emitting channel. Then, the continuous exposure duration of the image acquisition module can be greater than or equal to the sum of the total lighting duration of each light-emitting channel and the total switching duration of each light-emitting channel.

[0122] Exemplarily, the driving signal for the light-emitting channel includes a plurality of pulse signals. At this time, the lighting duration of the light-emitting channel is shorter than the gating duration of the light-emitting channel. Then, the continuous exposure duration of the image acquisition module may be greater than the sum of the total lighting duration of each light-emitting channel and the total switching duration of each light-emitting channel.

[0123] In one embodiment, see Figure 7 The near-field image data acquisition system of the laser chip also includes a testing machine 400.

[0124] The test machine 400 is connected to the image acquisition module 300 and is configured to receive near-field image data. That is, the image acquisition module 300 of the near-field image data acquisition system of the laser chip can output the near-field image data to the test machine 400.

[0125] Exemplarily, the control module 100 is located in the testing machine 400 .

[0126] At this time, the test machine 400 may send a trigger signal to trigger the driving module 200 and the image acquisition module 300 to perform a test.

[0127] In other embodiments, the control module 100 may not be located in the test machine 400. The test machine 400 may send a test instruction to the control module 100. After receiving the test instruction, the control module 100 sends a trigger signal to trigger the driving module 200 and the image acquisition module 300 to perform a test.

[0128] In one embodiment, a method for acquiring near-field image data of a laser chip is also provided, which is configured to test a laser chip to be tested, wherein the laser chip to be tested includes a plurality of light-emitting channels, and the method includes:

[0129] Step S20, controlling a driving module 200 to drive at least two light-emitting channels of the laser chip to be tested to light up according to a preset driving timing.

[0130] The laser chip to be tested may include, but is not limited to, a laser chip having multiple light-emitting channels, such as a vertical cavity surface emitting laser (VCSEL).

[0131] The preset driving sequence can be set according to actual needs. For example, the preset driving sequence includes lighting up in different time periods or lighting up at the same time.

[0132] Step S30, controlling an image acquisition module 300 to continuously expose the laser chip to be tested while at least two light-emitting channels are illuminated, so as to obtain near-field image data of the laser chip to be tested; wherein the near-field image data includes energy distribution data of at least two illuminated light-emitting channels.

[0133] Exemplarily, the image acquisition module 300 may include a sensor unit.

[0134] The sensor unit may be controlled to perform exposure according to a preset duration, so that the sensor unit may perform one exposure on all light-emitting channels that are lit up by the driven module 200 during one driving process.

[0135] In this embodiment, a driving module 200 is controlled to drive at least two light-emitting channels of the laser chip to be tested to light up according to a preset driving timing, and the image acquisition module 300 is synchronously controlled to continuously expose the laser chip to be tested during the period when at least two light-emitting channels are lit up. Therefore, during one exposure process, the image acquisition module 300 can obtain near-field image data of the laser chip to be tested that includes energy distribution data of at least two light-emitting channels that are lit up. Therefore, it is not necessary to independently perform a data transmission process for each light-emitting channel, thereby effectively reducing the total data transmission time and effectively improving the overall test efficiency.

[0136] At the same time, the near-field image formed by one exposure of the image acquisition module 300 includes images of at least two light-emitting channels. Each light-emitting channel can effectively occupy the image space, thereby effectively increasing the proportion of effective data of the light-emitting channel. Therefore, after the exposure is completed, the image acquisition module 300 can output the test data to the outside more quickly. Therefore, the data transmission time can be more effectively reduced, thereby improving the test efficiency. At the same time, the effective data of the light-emitting channel is greatly increased, thereby effectively reducing the data storage space.

[0137] At the same time, in the actual application of the laser chip, there will be a problem of leakage crosstalk between adjacent or close light-emitting channels. In the traditional test method, each light-emitting channel is tested independently, and the problem cannot be detected synchronously. In this embodiment, the image acquisition module 300 continuously exposes at least two light-emitting channels. When one light-emitting channel is lit, other light-emitting channels may also be lit, thereby increasing the final brightness of other light-emitting channels. Therefore, this embodiment can detect the existence of leakage crosstalk between light-emitting channels when uneven light emission exists between light-emitting channels in the same test image.

[0138] In one embodiment, see Figure 8 , the near-field image data acquisition method of the laser chip also includes:

[0139] Step S10, sending a trigger signal, the trigger signal is configured to trigger the driving module and the image acquisition module to work.

[0140] After the trigger signal is sent in step S10, step S20 and step S30 may be performed. For example, step S30 may be controlled to start before step S20 starts. In this case, it is ensured that the image acquisition module 300 can completely acquire data of each light-emitting channel. Of course, step S20 and step S30 may also start at the same time, and the start order of the two is not limited here.

[0141] In one embodiment, after the trigger signal is sent, the driving module 200 and the image acquisition module 300 are controlled to work after a first delay time and a second delay time respectively.

[0142] That is, after the trigger signal is sent in step S10, step S20 controls the driving module 200 to start lighting the light channel after the first delay time. And after the trigger signal is sent in step S10, step S30 controls the image acquisition module 300 to start exposing after the second delay time.

[0143] The first delay time length and the second delay time length may be the same, or the first delay time length and the second delay time length may be different.

[0144] In one embodiment, the method for acquiring near-field image data of a laser chip further includes:

[0145] Step S40, receiving near-field image data.

[0146] That is, after step S30 , the near-field image data output by the image acquisition module 300 may also be received.

[0147] In one embodiment, in step S20, the control driving module drives a light-emitting channel to light up once in the form of multiple pulse signals, so that when a light-emitting channel is selected, the light-emitting channel can be lit up multiple times.

[0148] In one embodiment, in step S20, the control driving module 200 switches to lighting the next light-emitting channel immediately after lighting a single light-emitting channel, thereby reducing the test time.

[0149] In one embodiment, the image acquisition module 300 is controlled to start exposure no later than the start time of driving the first light-emitting channel that is lit by the driving module 200.

[0150] In one embodiment, the image acquisition module 300 is controlled to end the exposure no earlier than the time when the driving module 200 ends driving the last light-emitting channel that is lit.

[0151] In one embodiment, the image acquisition module 300 is controlled to start exposure no later than the moment when the driving module 200 ends driving the first light-emitting channel that is lit.

[0152] In one embodiment, the image acquisition module 300 ends the exposure no earlier than the start time of driving the last light-emitting channel that is lit by the driving module 200.

[0153] It should be understood that although Figure 8The steps in the flowchart are shown in sequence as indicated by the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified in this document, there is no strict order restriction for the execution of these steps, and these steps can be executed in other orders. Moreover, Figure 8 At least part of the steps may include multiple steps or multiple stages. These steps or stages are not necessarily performed at the same time, but can be performed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed in turn or alternately with other steps or at least part of the steps or stages in other steps.

[0154] In one embodiment, a computer device is further provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above method embodiments when executing the computer program.

[0155] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0156] In one embodiment, a computer program product is provided, including a computer program, characterized in that when the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0157] In the description of this specification, the description with reference to the terms "one embodiment", "other embodiments", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic description of the above terms does not necessarily refer to the same embodiment or example.

[0158] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0159] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. A near-field image data acquisition system for a laser chip, configured to test a laser chip to be tested, wherein the laser chip to be tested includes a plurality of light-emitting channels, and is characterized in that: include: A driving module, configured to drive at least two light-emitting channels of the laser chip to be tested to light up according to a preset driving sequence, wherein the preset driving sequence includes a time-sharing lighting sequence, wherein when the driving module turns on one of the light-emitting channels, the other light-emitting channels are turned off, and when each light-emitting channel is turned on, the driving module provides a driving signal to the light-emitting channel to light up the light-emitting channel; The image acquisition module is configured to continuously expose the laser chip to be tested during the period when the at least two light-emitting channels are illuminated, so as to obtain near-field image data of the laser chip to be tested; wherein the near-field image data includes energy distribution data of at least two illuminated light-emitting channels, and the image acquisition module performs exposure according to a preset duration, so as to perform one exposure on all light-emitting channels that are time-sharingly illuminated by the driving module during one driving process.

2. The near-field image data acquisition system of a laser chip according to claim 1, characterized in that: The near-field image data acquisition system of the laser chip also includes: A control module is connected to the driving module and the image acquisition module respectively, and the control module is configured to send a trigger signal; the trigger signal is configured to trigger the driving module to drive at least two light-emitting channels of the laser chip to be tested to light up according to a preset driving timing, and trigger the image acquisition module to continuously expose the laser chip to be tested.

3. The near-field image data acquisition system of a laser chip according to claim 2, characterized in that: The driving module is configured to provide a driving signal to each of the light-emitting channels according to the trigger signal, so as to light up the light-emitting channel; and / or, The driving signal includes a driving frame composed of a plurality of pulse signals.

4. The near-field image data acquisition system of a laser chip according to claim 3, characterized in that: After receiving the trigger signal, the driving module starts to output the driving signal after a first delay time, and / or, After receiving the trigger signal, the image acquisition module starts exposure after a second delay time.

5. The near-field image data acquisition system of a laser chip according to any one of claims 1 to 4, characterized in that: The exposure start time of the image acquisition module is no later than the start time of the driving module driving the first light-emitting channel; or, The exposure start time of the image acquisition module is no later than the end time of the driving module driving the first light-emitting channel; or, The exposure end time of the image acquisition module is not earlier than the driving end time of the driving module for the last lighted light-emitting channel; or, The exposure end time of the image acquisition module is not earlier than the driving start time of the driving module for the last lighted light-emitting channel.

6. According to any one of claims 1 to 4, the near-field image data acquisition system of the laser chip, the continuous exposure time of the image acquisition module is not less than the sum of the total time of each of the light-emitting channels being lit and the total time of each of the light-emitting channels being switched; or The continuous exposure time of the image acquisition module is equal to the sum of the total time that each of the light-emitting channels is illuminated and the total time that each of the light-emitting channels is switched.

7. The near-field image data acquisition system of a laser chip according to any one of claims 1 to 4, characterized in that: The near-field image data acquisition system of the laser chip also includes a testing machine and / or a light collection module: The testing machine is connected to the image acquisition module and is configured to receive the near-field image data; The light collecting module is located between the laser chip to be tested and the image acquisition module, and is configured to control the laser beam emitted by the laser chip to be tested to be within the photosensitivity range of the image acquisition module.

8. A method for acquiring near-field image data of a laser chip, characterized in that: The laser chip to be tested is configured to test a laser chip to be tested, wherein the laser chip to be tested comprises a plurality of light-emitting channels, including: Control a driving module to drive at least two light-emitting channels of the laser chip to be tested to light up according to a preset driving sequence, wherein the preset driving sequence includes a time-sharing lighting sequence, and when the driving module turns on one of the light-emitting channels, the other light-emitting channels are turned off, and when each light-emitting channel is turned on, the driving module provides a driving signal to the light-emitting channel to light up the light-emitting channel; and An image acquisition module is controlled to continuously expose the laser chip to be tested during the period when the at least two light-emitting channels are illuminated, so as to obtain near-field image data of the laser chip to be tested; wherein the near-field image data includes energy distribution data of at least two illuminated light-emitting channels, and the image acquisition module performs exposure according to a preset duration, so as to perform one exposure on all light-emitting channels that are time-sharingly illuminated by the driven module during one driving process.

9. The method for acquiring near-field image data of a laser chip according to claim 8, characterized in that: The method further comprises: Sending a trigger signal, wherein the trigger signal is configured to trigger the driving module and the image acquisition module to operate; and / or, After sending a trigger signal, the driving module and the image acquisition module are controlled to work after a first delay time and a second delay time respectively; wherein the first delay time is the same as the second delay time or the first delay time is different from the second delay time; and / or, The near-field image data is received.

10. The method for acquiring near-field image data of a laser chip according to claim 9, characterized in that: Also includes: Control the driving module to drive one of the light-emitting channels to light up at a time in the form of multiple pulse signals; and / or, The driving module is controlled to switch to lighting the next light-emitting channel immediately after lighting of a single light-emitting channel is completed.

11. The method for acquiring near-field image data of a laser chip according to claim 8, characterized in that: Also includes: Controlling the image acquisition module to start exposure no later than the start time of driving the first lighted light-emitting channel by the driving module; or, Controlling the image acquisition module to start exposure no later than the moment when the driving module ends driving the first light-emitting channel; or, Controlling the image acquisition module to end exposure no earlier than the moment when the driving module ends driving the last light-emitting channel that is lit; or, The image acquisition module is controlled to end exposure no earlier than the start time of driving the last lighted light-emitting channel by the driving module.

12. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 8 to 11 are implemented.

13. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 8 to 11 are implemented.

14. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 8 to 11 are implemented.

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