Information processing device, information processing method, and information processing program

Abstract

The invention discloses an information processing apparatus, an information processing method, and an information processing program. The information processing device determines whether or not to reimage a radiation image on the basis of imaging conditions including the imaging direction of the radiation image captured by irradiating the object to be inspected with radiation, and structure information indicating the three-dimensional structure of the object to be inspected.

Description

Technical Field

[0001] The present invention relates to an information processing device, an information processing method and an information processing program. Background Art

[0002] Japanese Patent Application Laid-Open No. 2012-108078 discloses a radiographic imaging device that captures a radiographic image by irradiating a radiation to an irradiated surface of a housing of a radiation detector, and performs a line defect detection process on the radiographic image. The radiographic imaging device re-captures the radiographic image when a line defect set as a re-detection target is present among the line defects detected by the line defect detection process. Summary of the invention

[0003] Technical issues to be solved by the invention

[0004] In non-destructive inspection, in a two-dimensional radiographic image captured by irradiating the inspection object with radiation, defects existing in the inspection object may not be captured due to the thickness of the inspection object, etc. In this case, the user confirms the radiographic image and determines whether the radiographic image needs to be re-photographed. If it is determined that the radiographic image needs to be re-photographed, the inspection object and the radiation irradiation conditions are set again, thereby reducing the inspection efficiency of the non-destructive inspection.

[0005] The present invention has been made in view of the above circumstances, and an object of the present invention is to provide an information processing device, an information processing method, and an information processing program capable of suppressing a decrease in inspection efficiency of non-destructive inspection.

[0006] Means for solving technical problems

[0007] A first method is an information processing device comprising at least one processor, wherein the processor determines whether to retake a radiographic image based on imaging conditions including an imaging direction of a radiographic image taken by irradiating an object under examination with radiation and structural information representing a three-dimensional structure of the object under examination.

[0008] The information processing device of the second mode is based on the information processing device of the first mode, wherein the processor, based on structural information, when setting the photographing direction of the captured radiographic image as the viewpoint direction, determines that the radiographic image needs to be re-shot when it is determined that there is an area in the inspection object where the radiographic image does not reflect defects existing in the inspection object.

[0009] The information processing device of the third mode is based on the information processing device of the first mode or the second mode, wherein the processor detects defects from a captured radiographic image, and when it is determined based on structural information that the inspection object has a thickness greater than a certain thickness along a straight line connecting the defect and the radiation source, it is determined that the radiographic image should be re-shot.

[0010] The information processing device of the fourth aspect is an information processing device of any one of the first to third aspects, wherein the processor, when determining that a radiographic image needs to be retaken, derives the imaging conditions for reshooting based on the imaging conditions of the already-taken radiographic image.

[0011] The information processing device of the fifth aspect is the information processing device of the fourth aspect, wherein the processor, when determining that the radiographic image needs to be re-photographed, derives the imaging conditions for the re-photographing based on the imaging conditions and structural information of the already-photographed radiographic image.

[0012] The sixth method is an information processing method, in which a processor of an information processing device performs the following processing: based on imaging conditions including the imaging direction of the radiation image captured by irradiating the inspection object with radiation and structural information representing the three-dimensional structure of the inspection object, it is determined whether to re-shoot the radiation image.

[0013] The seventh method is an information processing program, which is used to cause a processor of an information processing device to perform the following processing: based on the photographic conditions including the photographic direction of the radiographic image taken by irradiating the inspection object with radiation and the structural information representing the three-dimensional structure of the inspection object, it is determined whether to re-shoot the radiographic image.

[0014] Effects of the Invention

[0015] According to the present invention, it is possible to suppress a decrease in the inspection efficiency of non-destructive inspection. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 This is a block diagram showing a schematic configuration of a radiation imaging device.

[0017] Figure 2 This is a block diagram showing an example of the hardware configuration of the information processing device.

[0018] Figure 3 A diagram for explaining structural information.

[0019] Figure 4 This is a diagram for explaining the learned model.

[0020] Figure 5 This is a block diagram showing an example of the functional structure of the information processing device.

[0021] Figure 6 This is a diagram for explaining the derivation process of the photographing direction.

[0022] Figure 7 This is a diagram for explaining the process of deriving the position of a defect in the structural information.

[0023] Figure 8 This is a diagram for explaining the relationship between the depth of a defect and the degree of blurring of the defect region in an inspection image.

[0024] Fig. 9 This is a diagram for explaining a process of deriving a defect position based on a plurality of inspection images.

[0025] Fig.10 This is a diagram for explaining an example of determination processing for re-shooting an inspection image.

[0026] Fig.11 This is a diagram for explaining an example of determination processing for re-shooting an inspection image.

[0027] Fig.12 This is a diagram for explaining an example of determination processing for re-shooting an inspection image.

[0028] Fig.13 This is a diagram showing an example of a display screen.

[0029] Fig.14 This is a flowchart showing an example of imaging control processing.

[0030] Fig.15 This is a diagram showing an example of the photographing direction of a modification.

[0031] Fig.16 It is a diagram for explaining the determination process of re-shooting the inspection image according to the modification. DETAILED DESCRIPTION

[0032] Hereinafter, examples of modes for implementing the technology of the present invention will be described in detail with reference to the drawings.

[0033] First, refer to Figure 1 The structure of the radiation imaging device 1 of this embodiment is described. The radiation imaging device 1 is used for non-destructive inspection of an inspection object. Figure 1As shown, the radiation imaging device 1 includes an information processing device 10, a radiation source 12, and a radiation detector 14. The information processing device 10, the radiation source 12, and the radiation detector 14 are connected to each other so as to be able to communicate with each other. The information processing device 10 is, for example, a computer such as a personal computer or a server computer.

[0034] The radiation source 12 irradiates the inspection object 0 with radiation R such as X-rays. The radiation source 12 of the present embodiment irradiates the radiation R in a cone beam. The direction from the radiation source 12 to a point on the radiation detector 14 where the radiation R that has passed through the inspection object 0 arrives is referred to as "photographic direction D". In the present embodiment, the case where the direction from the radiation source 12 to a point on the radiation detector 14 where the radiation R that has passed through the center of the inspection object 0 arrives is set as the photographic direction D is described as an example.

[0035] The radiation detector 14 includes a flash as an example of a light-emitting layer that emits light by irradiating radiation R, and a TFT (Thin Film Transistor) substrate. The flash and the TFT substrate are stacked. The TFT substrate has a plurality of pixels arranged in a two-dimensional shape, and each pixel has a sensor unit and a thin film field effect transistor as an example of a conversion element whose generated charge increases as the amount of irradiated radiation increases. The sensor unit absorbs the light emitted by the flash to generate charge and accumulates the generated charge. The thin film field effect transistor converts the charge accumulated in the sensor unit into an electrical signal and outputs it. Through the above structure, the radiation detector 14 generates a two-dimensional radiation image corresponding to the radiation R irradiated from the radiation source 12 to the inspection object O, and outputs the generated radiation image to the information processing device 10.

[0036] Thus, in the radiation imaging device 1, a radiation image captured by irradiating the inspection object 0 with radiation R from the radiation source 12 along the imaging direction D is stored in the information processing device 10. Hereinafter, a radiation image captured by irradiating the inspection object 0 with radiation R along the imaging direction D is referred to as an "inspection image."

[0037] Next, refer to Figure 2 , the hardware structure of the information processing device 10 of this embodiment is described. Figure 2As shown, the information processing device 10 includes a CPU (Central Processing Unit) 20, a memory 21 as a temporary storage area, and a non-volatile storage unit 22. In addition, the information processing device 10 includes a display 23 such as a liquid crystal display, an input device 24 such as a keyboard and a mouse, and a network I / F (InterFace) 25 connected to a network. In addition, the information processing device 10 includes an external I / F 26 connected to the radiation source 12 and the radiation detector 14. The CPU 20, the memory 21, the storage unit 22, the display 23, the input device 24, the network I / F 25, and the external I / F 26 are connected to a bus 27. The CPU 20 is an example of a processor related to the technology of the invention.

[0038] The storage unit 22 is implemented by a HDD (Hard Disk Drive), an SSD (Solid State Drive), or a flash memory, etc. The storage unit 22 as a storage medium stores an information processing program 30. The CPU 20 reads the information processing program 30 from the storage unit 22, expands it into the memory 21, and executes the expanded information processing program 30.

[0039] In addition, the storage unit 22 stores an inspection image, structure information 32, and a learned model 34. The structure information 32 includes information indicating the three-dimensional structure of the inspection object 0. Figure 3 As shown in FIG. 1 , the structure information 32 of the present embodiment is information used when displaying a virtual inspection object 0 on the display 23, and is information that expresses the three-dimensional structure of the inspection object 0 using coordinates of a rectangular coordinate system consisting of three axes: the X-axis, the Y-axis, and the Z-axis. In addition, the structure information 32 also includes the material of each component constituting the inspection object 0. The transmittance of the radiation R of the component is specified according to the material of the component. As an example of the structure information 32, design information such as CAD (Computer Aided Design) data can be cited.

[0040] like Figure 4As shown, the learned model 34 is a learned model that takes the inspection image as input and takes the information related to the defects of the inspection object 0 in the input inspection image as output, and is a learned model that uses multiple groups of inspection images and the information related to the defects of the inspection object 0 in the inspection images as learning data (sometimes also referred to as supervision data) for learning. Examples of information related to defects include the position of the defect in the inspection image, the size of the defect, and the shape of the defect. In this embodiment, the position of the defect in the inspection image is represented by the coordinates of a rectangular coordinate system consisting of two axes, the X-axis and the Y-axis, with a specific point of the two-dimensional inspection image (for example, the point in the upper left corner) as the origin. In addition, the "defect" in this specification is defined as a term for non-destructive inspection, and refers to discontinuous parts such as bubbles, foreign matter, and cracks.

[0041] Next, refer to Figure 5 , the functional structure of the information processing device 10 of this embodiment is described. Figure 5 As shown, the information processing device 10 includes a photographing control unit 40, a detection unit 42, a first derivation unit 44, a second derivation unit 46, a determination unit 48, a third derivation unit 50, and a display control unit 52. The CPU 20 executes the information processing program 30 to function as the photographing control unit 40, the detection unit 42, the first derivation unit 44, the second derivation unit 46, the determination unit 48, the third derivation unit 50, and the display control unit 52.

[0042] The imaging control unit 40 controls the shooting of an inspection image by irradiating the inspection object O with radiation R along the imaging direction D. Specifically, the imaging control unit 40 controls the radiation source 12 to irradiate the radiation R according to the set irradiation conditions of the radiation R via the external I / F 26. The irradiation conditions of the radiation R include, for example, the tube voltage of the radiation source 12, the tube current of the radiation source 12, and the irradiation period of the radiation R, which are set by the user. The imaging control unit 40 controls the turning on and off of the thin film field effect transistor of the radiation detector 14 by comparing the irradiation timing of the radiation R via the external I / F 26. Through this control, the radiation detector 14 generates a two-dimensional inspection image corresponding to the radiation R irradiated from the radiation source 12 to the inspection object O, and outputs the generated inspection image to the information processing device 10.

[0043] The detection unit 42 detects defects of the inspection object 0 in the inspection image based on the inspection image captured by the control of the imaging control unit 40 and the learned model 34. Specifically, the detection unit 42 inputs the inspection image to the learned model 34. The learned model 34 outputs information related to the defects of the inspection object 0 corresponding to the input inspection image. Thus, the detection unit 42 detects defects of the inspection object 0 in the inspection image.

[0044] The detection unit 42 may detect defects of the inspection object 0 in the inspection image using a known detection algorithm. The defects of the inspection object 0 in the inspection image may also be specified by the user via the input device 24. In this case, the detection unit 42 detects the defects specified by the user.

[0045] The first deriving unit 44 derives the imaging direction D in the structure information 32. Figure 6 , a specific example of the derivation process of the photographing direction D in the structural information 32 performed by the first derivation unit 44 is described.

[0046] like Figure 6 As shown on the right side of FIG. 1 , a two-dimensional inspection image is obtained by irradiating the inspection object 0 with radiation R from a radiation source 12 along an imaging direction D. Figure 6 As shown on the left side of , the first derivation unit 44 generates a two-dimensional simulated image by projecting the inspection object 0 along the viewpoint direction when the virtual inspection object 0 is displayed on the display 23 based on the structure information 32. The viewpoint direction is the direction in which the surface of the inspection object 0 becomes the front of the display screen when the virtual inspection object 0 is observed along this direction. Figure 6 The example on the left shows the generation of Figure 6 , that is, an example of a simulated image when observing a virtual inspection object 0 based on the structure information 32 in the direction of arrow A. For example, the viewpoint direction is represented by the coordinates of a point, and the direction from the coordinates through the origin is the viewpoint direction.

[0047] The first deriving unit 44 generates simulation images for different multiple viewpoint directions. In addition, the first deriving unit 44 derives the similarity between each generated simulation image and the inspection image. Specifically, for example, the first deriving unit 44 derives the similarity between the contour of the inspection object 0 in the simulation image and the contour of the inspection object 0 in the inspection image. In addition, the first deriving unit 44 may also extract the contour line of the inspection object 0 in the simulation image and the contour line of the inspection object 0 in the inspection image, respectively, and derive the similarity of the outer shape of the inspection object 0 formed by the extracted contour line.

[0048] Then, the first derivation unit 44 sets the viewpoint direction of the simulated image having the highest similarity to the inspection image as the imaging direction D in the structure information 32 .

[0049] The second deriving unit 46 uses the imaging direction D derived by the first deriving unit 44 to transform the position of the defect of the inspection object 0 in the inspection image detected by the detection unit 42 into the position of the defect in the structural information 32, thereby deriving the three-dimensional coordinates of the defect in the structural information 32. In addition, the second deriving unit 46 may acquire the imaging direction D derived by the external device via the network I / F 25 instead of the first deriving unit 44.

[0050] Specifically, first, the second derivation unit 46 transforms the position of the defect of the inspection object 0 in the inspection image into the position of the structural information 32 in the plane when the photographing direction D is set as the viewpoint direction. For example, the second derivation unit 46 can perform the above-mentioned transformation by matching the scale of the outer shape of the inspection object 0 in the inspection image and the outer shape of the virtual inspection object 0 observed from the photographing direction D in the structural information 32.

[0051] In this way, the position of the defect of the inspection object 0 in the plane when the imaginary inspection object 0 is observed from the photographing direction D in the structure information 32 can be obtained. Figure 7 As shown, as long as the depth L of the defect along the imaging direction D can be obtained, the three-dimensional coordinates of the defect in the structural information 32 can be obtained.

[0052] The second derivation unit 46 of this embodiment derives the depth of the defect along the imaging direction D based on one inspection image. Figure 8 As shown, the smaller the depth of the defect along the imaging direction D, that is, the farther the defect is from the radiation detector 14, the greater the blurriness of the defect region in the inspection image. This is because the farther the defect is from the radiation detector 14, the more easily it is affected by scattered rays. Therefore, the second derivation unit 46 derives the depth of the defect along the imaging direction D based on the blurriness of the defect region in the inspection image. Specifically, the greater the blurriness of the defect region in the inspection image, the greater the value that the second derivation unit 46 derives the depth of the defect along the imaging direction D. Furthermore, the second derivation unit 46 derives a position that is away from the position corresponding to the surface of the inspection object 0 in the structural information 32 by the amount of the depth derived along the imaging direction D as the position of the defect in the structural information 32.

[0053] Through the above-described processing, the second derivation unit 46 can convert the position of the defect of the inspection object 0 in the two-dimensional inspection image into three-dimensional coordinates in the structural information 32 .

[0054] Furthermore, the second derivation unit 46 may also transform the position of the defect of the inspection object 0 in the inspection image into the position of the defect in the structural information 32 based on the plurality of inspection images captured from the different plurality of imaging directions D. In this case, the second derivation unit 46 uses the imaging direction D derived by the first derivation unit 44 to transform the position of the defect in each of the plurality of inspection images into the position of the structural information 32 in the plane when the imaging direction D is set as the viewpoint direction. Fig. 9 As shown, the second deriving unit 46 derives the intersection point P of a plurality of straight lines passing through the position of the defect after the transformation for each of the plurality of inspection images and respectively along the imaging direction D as the position of the defect in the structural information 32. Fig. 9, an example is shown when there are two inspection images.

[0055] The determination unit 48 determines whether to re-shoot the inspection image based on the photographic conditions including the photographic direction D derived by the first derivation unit 44 and the structural information 32. Specifically, based on the structural information 32, when the photographic direction D of the inspection image that has been shot is set as the viewpoint direction, if it is determined that there is an area in the inspection object 0 where the inspection image does not reflect the defects existing in the inspection object 0, the determination unit 48 determines to re-shoot the inspection image. Fig.10 , an example of a situation in which this determination is performed is described.

[0056] like Fig.10 As shown, here, the inspection object 0 is composed of three parts P1, P2, and P3, and the photographing direction D is the direction along the long side direction of the parts P1 and P2. Fig.10 In the example shown, when the thickness of parts P1 and P2 along the photographing direction D is greater than a certain value and the transmittance of radiation R of parts P1 and P2 is less than a certain value, radiation R irradiated to parts P1 and P2 will not reach part P3. That is, in this case, when the photographing direction D is set as the viewpoint direction, it is considered that even if there is a defect in the area of ​​part P3 that becomes the shadow of parts P1 and P2 respectively, the defect will not be reflected in the inspection image. Fig.10 In the example of FIG. 1 , when the photographing direction D is set as the viewpoint direction, the area in the part P3 that becomes the shadow of the part P1 and the part P2 is represented by a rectangle filled with diagonal lines. Then, based on the structure information 32 and the photographing direction D, the determination unit 48 determines whether there is an area in the inspection object 0 where the inspection image does not reflect the defect existing in the inspection object 0, and thereby determines whether to re-shoot the inspection image.

[0057] In addition, when a defect is detected from the inspection image that has been shot, the determination unit 48 determines whether to re-shoot the inspection image based on the structural information 32 and the position of the defect derived by the second derivation unit 46. Specifically, the determination unit 48 detects a defect from the inspection image that has been shot, and when it is determined based on the structural information 32 that the inspection object 0 has a thickness greater than a certain thickness along the straight line connecting the defect and the radiation source 12, it determines to re-shoot the inspection image. Fig.11 and Fig.12 , an example of a situation in which this determination is performed is described.

[0058] like Fig.11 and Fig.12 As shown in FIG. 1 , the inspection object 0 is cylindrical in shape and the radiation R is irradiated from the side of the inspection object 0. Fig.11 and Fig.12 In the example of FIG. 1 , the straight line connecting the defect and the radiation source 12 is shown by a single-point dashed line. Fig.11 In the case of the position shown in FIG. 1 , the thickness of the inspection object 0 along the straight line connecting the defect and the radiation source 12 is the value obtained by adding T1 to T2. Fig.12 In the case of the position shown, the thickness of the inspection object 0 along the straight line connecting the defect and the radiation source 12 is T. When the thickness of the inspection object 0 along the straight line connecting the defect and the radiation source 12 is greater than a certain thickness, a plurality of defects may be shown in the inspection image in an overlapping state. Therefore, the determination unit 48 detects defects from the captured inspection image, and determines whether the inspection object 0 has a thickness greater than a certain thickness along the straight line connecting the defect and the radiation source 12 based on the structure information 32, thereby determining whether to re-shoot the inspection image.

[0059] When the determination unit 48 determines that re-shooting is to be performed, the third derivation unit 50 derives the shooting conditions in the re-shooting based on the shooting conditions of the already shot inspection image and the structure information 32. For example, the third derivation unit 50 derives the shooting direction D in which the radiation R reaches the region in the inspection object 0 that is determined not to have been reached by the radiation R in the already shot inspection image, as the shooting direction D in the re-shooting. In addition, for example, the third derivation unit 50 derives the shooting direction D in which the radiation R reaches the region that is determined to be a defect in the already shot inspection image in an overlapping state, as the shooting direction D in the re-shooting, based on the shooting direction D of the already shot inspection image, the structure information 32, and the position of the defect. As an example of the shooting direction D in the re-shooting in this case, there can be cited a direction orthogonal to the straight line connecting the defect and the radiation source 12.

[0060] Furthermore, when the determination unit 48 determines that re-shooting is to be performed, the third derivation unit 50 may derive the imaging conditions for re-shooting based on the imaging conditions of the already-shot inspection image, without using the structure information 32. In this case, for example, the third derivation unit 50 derives a direction orthogonal to the imaging direction D of the already-shot inspection image as the imaging direction D for re-shooting.

[0061] The display control unit 52 controls the display 23 to display information indicating that reshooting is to be performed based on the shooting direction D derived by the third deriving unit 50. Fig.13As shown, the display control unit 52 controls the display 23 to display a front view F of the inspection object 0 when the photographing direction D is set as the viewpoint direction, and a message M recommending re-photography and urging the inspection object 0 to be set according to the front view F based on the configuration information 32.

[0062] Next, refer to Fig.14 The function of the information processing device 10 of this embodiment is described. The CPU 20 executes the information processing program 30, Fig.14 The shooting control process shown. Fig.14 The imaging control process shown is executed when, for example, a user inputs an instruction to start the execution.

[0063] exist Fig.14 In step S10, as described above, the imaging control unit 40 performs control to capture an inspection image by irradiating the inspection object 0 with radiation R along the imaging direction D. In step S12, as described above, the detection unit 42 detects defects of the inspection object 0 in the inspection image based on the inspection image captured in step S10 and the learned model 34.

[0064] In step S14, as described above, the first derivation unit 44 derives the photographing direction D in the structural information 32. In step S16, as described above, the second derivation unit 46 transforms the position of the defect of the inspection object O in the inspection image detected in step S12 into the position of the defect in the structural information 32 using the photographing direction D derived in step S14, thereby deriving the three-dimensional coordinates of the defect in the structural information 32.

[0065] In step S18, as described above, the determination unit 48 determines whether to re-shoot the inspection image based on the imaging conditions including the imaging direction D derived in step S14 and the structure information 32. If the determination is positive, the process moves to step S20. In step S20, as described above, the third derivation unit 50 derives the imaging conditions for re-shooting based on the imaging conditions and the structure information 32 of the inspection image that has been captured obtained by the process of step S10.

[0066] In step S22, as described above, the display control unit 52 controls the display 23 to display information indicating that re-shooting is to be performed based on the shooting direction D derived in step S20. The user changes the posture of the inspection object O and inputs an instruction for re-shooting based on the information displayed on the display 23. When the instruction for re-shooting is input, in step S24, the shooting control unit 40 controls shooting of the inspection image in the same manner as in step S10.

[0067] When the processing of step S24 is completed, the photography control processing is completed. In addition, when the determination of step S18 is negative, the photography control processing is completed. In addition, after executing step S24, the steps after step S12 may be executed again.

[0068] As described above, according to the present embodiment, after the inspection image is photographed, it is immediately determined whether or not re-photographing is necessary by the information processing device 10. Therefore, it is possible to suppress a decrease in the inspection efficiency of the non-destructive inspection.

[0069] In addition, in the above embodiment, if Fig.15 As shown, when the second deriving unit 46 derives the three-dimensional coordinates of the defect, the imaging direction D may be set to a direction inclined with respect to the direction from the radiation source 12 toward the center of the inspection object O.

[0070] Furthermore, in the above-described embodiment, the imaging conditions may include, in addition to the imaging direction D, the irradiation conditions of the radiation R.

[0071] In the above embodiment, the determination unit 48 may determine to re-shoot the inspection object O based on the structural information 32 and the position of the defect derived by the second derivation unit 46, when the inspection object O has a plurality of intersecting surfaces and it is determined that a defect exists in a portion where at least two of the plurality of surfaces overlap along the imaging direction D. Fig.16 , an example of a situation in which this determination is performed is described. Fig.16 As shown in FIG. 1 , the inspection object O has two intersecting surfaces S1 and S2, and a portion of the two surfaces S1 and S2 overlap along the imaging direction D. In this case, if there is a defect in the overlapping portion of the surfaces S1 and S2, it is difficult to distinguish whether the defect reflected in the inspection image is a defect of the surface S1 or a defect of the surface S2. Therefore, the determination unit 48 may determine to re-shoot in such a case.

[0072] In addition, in the above-mentioned embodiment, for example, various processors as shown below can be used as the hardware structure of the processing unit that executes various processes like each functional unit of the information processing device 10. Among the above-mentioned various processors, in addition to the general-purpose processor that executes software (programs) and functions as various processing units as described above, there are processors such as FPGA (Field Programmable Gate Array) whose circuit structure can be changed after manufacturing, such as programmable logic devices (PLD), ASIC (Application Specific Integrated Circuit) and other processors having a circuit structure specially designed to execute specific processes, such as dedicated circuits.

[0073] A processing unit may be composed of one of these various processors, or a combination of two or more processors of the same or different types (e.g., a combination of multiple FPGAs, a combination of a CPU and an FPGA). In addition, multiple processing units may be composed of one processor.

[0074] As an example of a plurality of processing units being composed of one processor, there is first a method in which a processor is composed of a combination of one or more CPUs and software, such as represented by computers such as clients and servers, and the processor functions as a plurality of processing units. Second, there is a method in which a processor is used to realize the functions of the entire system including a plurality of processing units, such as represented by a system on chip (SoC), using a single IC (Integrated Circuit) chip. In this way, various processing units are composed of one or more of the above-mentioned various processors as a hardware structure.

[0075] Furthermore, as the hardware configuration of these various processors, more specifically, a circuit (circuitry) formed by combining circuit elements such as semiconductor elements can be used.

[0076] In addition, in the above-mentioned embodiment, the information processing program 30 is pre-stored (installed) in the storage unit 22, but the present invention is not limited thereto. The information processing program 30 may also be provided in a recording medium such as a CD-ROM (Compact Disc Read Only Memory), a DVD-ROM (Digital Versatile Disc Read Only Memory), or a USB (Universal Serial Bus) memory. In addition, the information processing program 30 may also be downloaded from an external device via a network.

[0077] The invention of Japanese Patent Application No. 2022-110030 filed on July 7, 2022 is incorporated herein by reference in its entirety. In addition, all documents, patent applications, and technical specifications described in this specification are incorporated herein by reference to the same extent as if each document, patent application, and technical specification was specifically and individually described.

Claims

1. An information processing device comprising at least one processor, wherein: The processor determines whether to re-shoot the radiographic image based on imaging conditions including an imaging direction of a radiographic image captured by irradiating the inspection object with radiation and structure information indicating a three-dimensional structure of the inspection object.

2. The information processing device according to claim 1, wherein: Based on the structural information, when the processor sets the photographing direction of the captured radiographic image as the viewpoint direction, if it is determined that there is an area in the inspection object where defects existing in the inspection object are not reflected in the radiographic image, it is determined to re-shoot the radiographic image.

3. The information processing device according to claim 1 or 2, wherein: The processor detects a defect from the captured radiographic image and determines to re-shoot the radiographic image when it is determined based on the structural information that the inspection object has a thickness greater than a certain thickness along a straight line connecting the defect and the radiation source.

4. The information processing device according to claim 1 or 2, wherein: When determining that the radiographic image should be retaken, the processor derives the imaging condition for retaken based on the imaging condition of the already-photographed radiographic image.

5. The information processing device according to claim 4, wherein: When determining that the radiographic image should be re-photographed, the processor derives the imaging condition for re-photographing based on the imaging condition and the structural information of the already-photographed radiographic image.

6. An information processing method, wherein: The processor included in the information processing device executes the following processing: Whether to re-shoot the radiographic image is determined based on imaging conditions including an imaging direction of a radiographic image captured by irradiating the inspection object with radiation and structure information indicating a three-dimensional structure of the inspection object.

7. An information processing program, wherein: It is used to enable the processor of the information processing device to perform the following processing: Whether to re-shoot the radiographic image is determined based on imaging conditions including an imaging direction of a radiographic image captured by irradiating the inspection object with radiation and structure information indicating a three-dimensional structure of the inspection object.

Images