Optical power detection circuit, system and method and laser

Abstract

The invention relates to an optical power detection circuit, system and method and a laser. The circuit comprises: an analog signal processing circuit configured to convert a laser pulse signal emitted by a laser into an analog circuit signal; a peak detection circuit configured to perform peak signal detection on the analog circuit signal output by the analog signal processing circuit and output a peak signal of the analog circuit signal; an integration circuit configured to perform integration processing on the analog circuit signal output by the analog signal processing circuit and output an integrated value signal of the analog circuit signal; and a microcontroller configured to receive the peak signal and the integrated value signal, and calculate an output parameter of the laser according to the peak signal and the integrated value signal. By adopting the method, the efficiency of optical power detection can be improved.

Description

Technical Field

[0001] The present application relates to the field of laser technology, and in particular to an optical power detection circuit, system, method and laser. Background Art

[0002] With the development of laser technology, optical power feedback modules have emerged. The optical power feedback modules can sample the output of the laser and perform power detection, thereby performing power feedback.

[0003] In traditional technology, after the laser emits light, it undergoes analog signal processing such as amplification and filtering, and then the MCU (MicroController Unit) directly collects the analog circuit signal and calculates related parameters such as the output power of the laser light pulse. However, the computing resources and capabilities of the MCU are limited, and the computing pressure is high, resulting in low calculation efficiency of related parameters such as output power, which in turn leads to untimely and inaccurate optical power detection and feedback. Especially for laser equipment used in the medical field, untimely optical power detection may lead to equipment safety issues. Summary of the invention

[0004] Based on this, it is necessary to provide an optical power detection circuit, system, method and laser method, device, computer equipment and storage medium that can improve the efficiency of laser power detection in response to the above technical problems.

[0005] In a first aspect, an optical power detection circuit is provided. The optical power detection circuit is applied to a laser. The optical power detection circuit includes:

[0006] an analog signal processing circuit configured to convert a laser pulse signal emitted by the laser into an analog circuit signal;

[0007] a peak detection circuit configured to perform peak signal detection on the analog circuit signal output by the analog signal processing circuit and output a peak signal of the analog circuit signal;

[0008] an integration circuit configured to perform integration processing on the analog circuit signal output by the analog signal processing circuit and output an integration value signal of the analog circuit signal;

[0009] The microcontroller is configured to receive the peak value signal and the integral value signal, and calculate the output parameter of the laser according to the peak value signal and the integral value signal.

[0010] In some embodiments, the peak detection circuit includes a front-end comparison follower circuit, a first unidirectional conductive element, a field effect transistor element, and a first capacitor element, wherein:

[0011] The first input terminal of the front-end comparison follower circuit is configured to receive an analog circuit signal, and the output terminal of the front-end comparison follower circuit is connected to the positive electrode of the first unidirectional conductive element;

[0012] The cathode of the first unidirectional conductive element is connected to the second end of the field effect transistor element;

[0013] The first end of the field effect transistor element is used to output a sub-peak signal, and the third end of the field effect transistor element is connected to the first end of the first capacitor element;

[0014] A second terminal of the first capacitive element is grounded.

[0015] In some embodiments, the peak detection circuit further includes a negative feedback circuit, wherein:

[0016] The non-inverting input terminal of the negative feedback circuit is connected to the first terminal of the field effect transistor element;

[0017] The output end of the negative feedback circuit is connected to the inverting input end of the negative feedback circuit, the cathode of the first unidirectional conductive element, the second end of the field effect transistor element and the second input end of the front-end comparison follower circuit.

[0018] In some embodiments, the front-end comparison follower circuit includes a first operational amplifier, a second unidirectional conductive element, and a second capacitive element; wherein,

[0019] The non-inverting input terminal of the first operational amplifier is configured to receive an analog circuit signal;

[0020] The inverting input terminal of the first operational amplifier is connected to the negative electrode of the second unidirectional conductive element, the first terminal of the second capacitive element and the output terminal of the negative feedback circuit;

[0021] The output terminal of the first operational amplifier is connected to the anode of the second unidirectional conducting element, the second terminal of the second capacitive element, and the anode of the first unidirectional conducting element.

[0022] In some embodiments, the integration circuit includes a second operational amplifier, a third capacitance element, a fourth capacitance element, a first resistance element, a second resistance element, and a third resistance element; wherein,

[0023] The inverting input terminal of the second operational amplifier is connected to the first terminal of the third capacitor element and the first terminal of the first resistor element, and the second terminal of the first resistor element is grounded;

[0024] The non-inverting input terminal of the second operational amplifier is connected to the first terminal of the second resistor element and the first terminal of the fourth capacitor element, the second terminal of the fourth capacitor element is grounded, and the second terminal of the second resistor element is connected to the output terminal of the analog signal processing circuit;

[0025] The output end of the second operational amplifier is connected to the second end of the third capacitor element and the first end of the third resistor element, and the second end of the third resistor element is connected to the analog-to-digital conversion pin of the microcontroller.

[0026] In some embodiments, the optical power detection circuit further includes:

[0027] a trigger signal generating circuit, which is configured to perform trigger detection on the analog circuit signal output by the analog signal processing circuit, and transmit the analog circuit signal to the microcontroller for pulse width detection after the amplitude of the analog circuit signal is greater than a preset trigger threshold;

[0028] The microcontroller is further configured to calculate the output parameter of the laser according to the peak value signal, the integrated value signal and the pulse width value.

[0029] In some embodiments, the optical power detection circuit further includes:

[0030] The pulse detection circuit is connected to the analog signal processing circuit, the trigger signal generating circuit and the microcontroller, and is configured to amplify the analog circuit signal output by the analog signal processing circuit, and connect the amplified analog circuit signal to the trigger signal generating circuit for trigger detection.

[0031] In some embodiments, the trigger signal generating circuit includes a comparator, a fourth resistor element, a fifth resistor element and a level converter; wherein,

[0032] The non-inverting input terminal of the comparator is connected to the output terminal of the analog signal processing circuit;

[0033] The inverting input terminal of the comparator is connected to the first end of the fourth resistance element and the first end of the fifth resistance element, the second end of the fourth resistance element is connected to the power supply voltage, and the second end of the fifth resistance element is grounded;

[0034] The output end of the comparator is connected to the input end of the level converter, and the output end of the level converter is connected to the analog-to-digital conversion pin of the microcontroller.

[0035] In some embodiments, the pulse detection circuit is implemented using a common-mode proportional amplifier circuit.

[0036] In a second aspect, an optical power detection system is also provided, the system comprising a power supply circuit, a bus circuit, a photoelectric sensor and the optical power detection circuit of any one of the first aspects; wherein,

[0037] The power supply circuit is configured to supply power to the optical power detection circuit, the photoelectric sensor and the bus circuit;

[0038] The photoelectric sensor is configured to collect the laser pulse signal of the laser and convert the laser pulse signal into a current signal and input it into the analog signal processing circuit;

[0039] The bus circuit is configured to connect the microcontroller and the laser host computer.

[0040] In a third aspect, an optical power detection method is further provided, the method being applied to a microprocessor of the optical power detection circuit of any one of the first aspects, the method comprising:

[0041] In response to detecting a laser pulse signal of a laser, enabling an optical power detection circuit to collect an analog circuit signal output by an analog signal processing circuit;

[0042] Obtaining a peak signal and an integral value signal output by the optical power detection circuit, and calculating output parameters of the laser according to the peak signal and the integral value signal; and

[0043] The peak signal, the integral value signal and the calculated output parameters are sent to the host computer, so that the host computer compares the peak signal, the integral value signal and the calculated output parameters with the corresponding preset standard parameters, and adjusts the next light output parameters of the laser according to the comparison result.

[0044] In a fourth aspect, a laser is also provided, the laser comprising a host computer, a main control board circuit and the optical power detection system of the second aspect.

[0045] The above-mentioned optical power detection circuit, system, method and laser, by adding a peak detection circuit and an integration circuit at the front end of the signal acquisition path of the microcontroller, that is, between the analog signal processing circuit and the microcontroller, can perform some pre-processing on the analog circuit signal based on the hardware circuit before the microcontroller acquires the analog circuit signal, so as to obtain a peak signal and an integral value signal, and then directly transmit the peak signal and the integral value signal to the microcontroller for subsequent calculation of output parameters such as the output power of the laser. Since the peak detection circuit and the integration circuit share part of the calculation pressure of the microcontroller, and the signal processing speed based on the hardware circuit is faster than the calculation based on the software, the microcontroller can calculate the output parameters of the laser more timely and quickly, thereby reducing the calculation pressure of the microcontroller, improving the calculation speed of the microcontroller, and thus improving the efficiency of optical power detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] Figure 1 Schematic diagram of the structure of the optical power detection circuit in some embodiments;

[0047] Figure 2 is a schematic diagram of the structure of a peak detection circuit in some embodiments;

[0048] Figure 3 is a schematic diagram of the structure of an integration circuit in some embodiments;

[0049] Figure 4 Schematic diagram of the structure of the optical power detection circuit in other embodiments;

[0050] Figure 5 is a schematic diagram of the structure of a trigger signal generating circuit in some embodiments;

[0051] Figure 6 It is a schematic diagram of the structure of the pulse detection circuit in some embodiments;

[0052] Figure 7 is a structural block diagram of a laser optical power detection system in some embodiments;

[0053] Figure 8 Schematic diagram of the process of optical power detection method in some embodiments. DETAILED DESCRIPTION

[0054] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0055] In some embodiments, Figure 1 As shown, an optical power detection circuit 100 is provided. The optical power detection circuit 100 can be applied to Figure 7 In the optical power detection system 1 of the laser shown, the optical power detection circuit 10 may include:

[0056] The analog signal processing circuit 100 is configured to convert the laser pulse signal emitted by the laser into an analog circuit signal;

[0057] A peak detection circuit 201, which is configured to perform peak signal detection on the analog circuit signal output by the analog signal processing circuit, and output a peak signal of the analog circuit signal;

[0058] An integration circuit 202, which is configured to perform integration processing on the analog circuit signal output by the analog signal processing circuit, and output an integration value signal of the analog circuit signal;

[0059] The microcontroller 300 is configured to receive the peak value signal and the integral value signal, and calculate the output parameter of the laser according to the peak value signal and the integral value signal.

[0060] The above-mentioned optical power detection circuit 10, by adding a peak detection circuit 201 and an integration circuit 202 at the front end of the signal acquisition path of the microcontroller 300, that is, between the analog signal processing circuit 100 and the microcontroller 300, can perform some pre-processing on the analog circuit signal based on the hardware circuit before the microcontroller 300 acquires the analog circuit signal, so as to obtain a peak signal and an integral value signal, and then directly transmit the peak signal and the integral value signal to the microcontroller 300 for subsequent calculation of output parameters such as the output power of the laser. Since the peak detection circuit 201 and the integration circuit 202 share part of the calculation pressure of the microcontroller 300, and the signal processing speed based on the hardware circuit is faster than the calculation based on the software, the microcontroller 300 can calculate the output parameters of the laser more timely and quickly, thereby reducing the calculation pressure of the microcontroller 300, improving the calculation speed of the microcontroller 300, and further improving the efficiency of optical power detection.

[0061] In some embodiments, reference Figure 2 As shown, Figure 2 The peak detection circuit 201 may include a front-end comparison follower circuit 2011, a first unidirectional conductive element D2, a field effect transistor element Q1 and a first capacitor element C3.

[0062] The first input terminal of the front-end comparison follower circuit 2011 is configured to receive the analog circuit signal PD_OUT, and the output terminal of the front-end comparison follower circuit 2011 is connected to the positive electrode D2+ of the first unidirectional conducting element D2;

[0063] The cathode D2 of the first unidirectional conductive element D2 is connected to the second end (gate G, pin 2) of the field effect transistor element Q1;

[0064] The first end (drain D, pin 1) of the field effect transistor element Q1 can be used to output the peak value signal PEAK_OUT, and the third end (source S, pin 3) of the field effect transistor element Q1 is connected to the first end of the first capacitor element C3; and

[0065] A second terminal of the first capacitive element C3 is connected to the ground GND.

[0066] Exemplarily, the field effect transistor element Q1 can be, for example, a JFET (Junction Field-Effect Transistor). JFET is a three-terminal active device with an amplification function, which can be divided into N-channel or P-channel. In practical applications, the connection method of the three terminals of JFET can be adaptively adjusted according to the selected type.

[0067] Exemplarily, the first capacitor element C3 can be a polystyrene capacitor, for example. Since the polystyrene material itself has high chemical stability, the use of a capacitor made of polystyrene can make the charging speed faster and the discharging speed slower, and the capacitance value is not easily affected by working conditions and temperature changes, and can better store charge, thereby making the peak value finally obtained by the peak detection circuit 201 more accurate.

[0068] In this embodiment, when a signal is input to the input end of the front-end comparison follower circuit 2011, peak detection can be started. Since the first unidirectional conductive element D2 has a certain conduction voltage drop, when the input analog circuit signal PD_OUT is less than the conduction voltage drop of the first unidirectional conductive element D2, the first unidirectional conductive element D2 will not be turned on, that is, the peak detection circuit 201 will be in a failure state, or when the difference between the voltage of the input analog circuit signal PD_OUT and the conduction voltage drop of the first unidirectional conductive element D2 is less than the threshold value, the charging speed of the first capacitor element C3 will be very slow. , all of which will affect the detection efficiency of the peak detection circuit 201. Therefore, by adding a front-end comparison follower circuit 2011 at the front end of the first unidirectional conduction element D2, on the one hand, it can play a voltage following role, isolate and buffer the front and rear stage circuits, so that the operation of the front stage analog signal processing circuit is not affected. On the other hand, even when the voltage of the input analog circuit signal PD_OUT is small, it can capture and amplify the voltage signal so that it can quickly meet the conduction condition of the first unidirectional conduction element D2, thereby timely and accurately triggering the normal operation of the peak detection circuit 201. Then, by connecting a first-level field effect transistor element Q1 after the first unidirectional conduction element D2, since the field effect transistor element Q1 has a smaller leakage current and a smaller junction capacitance than the crystal diode, the configuration here can make the discharge speed of the first capacitor element C3 slower. Since the above configuration makes the charging speed of the first capacitor element C3 faster and the discharging speed slower, the peak holding effect of the peak detection circuit 201 can be better, thereby improving the stability and accuracy of the peak signal output.

[0069] Furthermore, by adding a negative feedback circuit 2012 after the field effect transistor element Q1, Figure 2 As shown, the negative feedback circuit 2012 may include an operational amplifier U1B, resistor elements R1, R3 and R4, and the connection relationship between the negative feedback circuit 2012 and other units in the peak detection circuit 201 may be:

[0070] The non-inverting input terminal of the negative feedback circuit 2012 (e.g., U1B+, pin 5 of U1B) is connected to the first terminal (drain D, pin 1) of the field effect transistor element Q1;

[0071] The output end of the negative feedback circuit 2012 (for example, pin 7 of U1B) is connected to the reverse input end of the negative feedback circuit 2012 (for example, U1B-, pin 6 of U1B), the negative electrode D2- of the first unidirectional conductive element D2, the second end of the field effect transistor element Q1 (gate G, pin 2) and the second input end of the front-end comparator follower circuit 2011. Figure 2 The resistance value, quantity and connection method of the resistor elements R1, R3 and R4 can be adjusted according to the actual application, as long as the function of the negative feedback circuit can be achieved.

[0072] In this embodiment, the negative feedback circuit 2012 formed based on the operational amplifier U1B can make the operation of the operational amplifier of the current-end comparison follower circuit 2011 more stable, thereby making the output of the entire peak detection circuit 201 more stable. In addition, the operational amplifier U1B in the negative feedback circuit 2012 can also play the role of a voltage follower. By utilizing the characteristics of the voltage follower itself with high input impedance and low output impedance, it can isolate and buffer the previous and next stage circuits, so that the peak signal PEAK_OUT output to the microcontroller 300 will not be affected.

[0073] In some embodiments, continue to refer to Figure 2 As shown, the front-end comparison follower circuit 2011 may include a first operational amplifier U5B, a second unidirectional conducting element D1 and a second capacitor element C2; wherein, the non-inverting input terminal U5B+ of the first operational amplifier U5B is configured to access the analog circuit signal PD_OUT; the inverting input terminal U5B- of the first operational amplifier U5B is connected to the negative electrode D1- of the second unidirectional conducting element D1, the first end of the second capacitor element C2 and the output end of the negative feedback circuit 2012; the output end of the first operational amplifier U5B is connected to the positive electrode D1+ of the second unidirectional conducting element D1, the second end of the second capacitor element C2 and the positive electrode D2+ of the first unidirectional conducting element D2.

[0074] In this embodiment, the functions of the front-end operational amplifier comparator and the voltage follower can be realized by the first operational amplifier U5B and the second capacitor element C2. When a signal is input to the in-phase input terminal U5B+ (pin 5) of the first operational amplifier U5B, the peak detection circuit 201 can start peak detection. If there is no first operational amplifier U5B, when the input analog circuit signal PD_OUT is less than the conduction voltage drop of the first unidirectional conduction element D2, the first unidirectional conduction element D2 will not be turned on, that is, the peak detection circuit 201 will be in a failure state, or when the difference between the voltage of the input analog circuit signal PD_OUT and the conduction voltage drop of the first unidirectional conduction element D2 is less than the threshold value, the charging speed of the first capacitor element C3 will be very slow, all of which will affect the detection efficiency of the peak detection circuit 201. Therefore, by configuring the first operational amplifier U5B and the second capacitor element C2 for preventing self-excitation, on the one hand, it can play a voltage following role, isolate and buffer the front and rear stage circuits, so that the operation of the front stage analog signal processing circuit is not affected. On the other hand, even when the voltage of the input analog circuit signal PD_OUT is small, it can capture and amplify the voltage signal so that it can quickly meet the conduction condition of the first unidirectional conduction element D2. Further, a second unidirectional conduction element D1 with the same conduction capacity can be configured to further compensate for the conduction voltage drop of the first unidirectional conduction element D2, thereby further improving the charging speed of the first capacitor element C3 and improving the working efficiency of the peak detection circuit 201.

[0075] In some embodiments, reference Figure 3 As shown, Figure 3 Schematic diagram of the structure of the integration circuit in some embodiments is shown, the integration circuit 202 may include a second operational amplifier U3B, a third capacitor element C5, a fourth capacitor element C7, a first resistor element R6, a second resistor element R8 and a third resistor element R7; wherein,

[0076] The inverting input terminal U3B- (pin 6) of the second operational amplifier U3B is connected to the first end of the third capacitor element C5 and the first end of the first resistor element R6, and the second end of the first resistor element R6 is grounded to GND;

[0077] The in-phase input terminal U3B+ (pin 5) of the second operational amplifier U3B is connected to the first end of the second resistor R8 and the first end of the fourth capacitor C7, the second end of the fourth capacitor C7 is grounded GND, and the second end of the second resistor R8 is connected to the output end of the analog signal processing circuit 100 to access the analog circuit signal PD_OUT;

[0078] The output end (pin 7) of the second operational amplifier U3B is connected to the second end of the third capacitor C5 and the first end of the third resistor R7. The second end of the third resistor R7 is connected to the analog to digital converter (ADC) pin of the microcontroller 300.

[0079] In this embodiment, the integration circuit 202 can adopt a common-phase integration circuit. The specific structure can be referred to in Figure 3 As shown, the input analog circuit signal PD_OUT is subjected to hardware-based integration processing through the integration circuit 202, and the integrated value signal INTE_OUT after the integration processing is connected to the microprocessor 300, and data is read through the ADC pin of the microprocessor 300. The integration feedback can be realized through the integration circuit 202, and the integration circuit 202 can realize hardware-based integration calculation. The integration time and rate can be adjusted by adjusting the components in the integration circuit 202. Therefore, by configuring the integration circuit 202, part of the calculation pressure of the microprocessor 300 can be shared to improve its operation speed. The microprocessor 300 does not need to calculate the integral value through software control, but only needs to collect the integral value signal INTE_OUT to obtain the integral value related to the output power. Moreover, the hardware-based integration calculation response is faster, thereby improving the calculation efficiency of the output parameters related to the optical power.

[0080] In some embodiments, reference Figure 4 As shown, Figure 4 The structure diagram of the optical power detection circuit in some other embodiments is shown. The optical power detection circuit 10 may also include:

[0081] The trigger signal generating circuit 203 is configured to perform trigger detection on the analog circuit signal PD_OUT output by the analog signal processing circuit 100, and after the amplitude of the analog circuit signal PD_OUT is greater than a preset trigger threshold, transmit the analog circuit signal PD_OUT to the microcontroller 300 for pulse width detection;

[0082] The microcontroller 300 is further configured to calculate the output parameter of the laser according to the peak value signal PEAK_OUT, the integral value signal INTE_OUT and the pulse width value.

[0083] In this embodiment, the use of the trigger signal generating circuit 203 for hardware triggering is simpler than the software control triggering of the microcontroller 300. Since the software control triggering of the microcontroller 300 requires the microcontroller 300 to continuously monitor the signal, it may cause a waste of computing resources of the microcontroller 300. By configuring the trigger signal generating circuit 203, the resource usage of the microcontroller 300 can be further reduced, thereby improving the overall resource utilization and computing efficiency of the microcontroller 300.

[0084] In some embodiments, reference Figure 5 As shown, Figure 5 A schematic diagram of the structure of the trigger signal generating circuit 203 in some embodiments is shown.

[0085] The trigger signal generating circuit 203 may include a comparator U9, a fourth resistor element R17, a fifth resistor element R18 and a level converter U8; wherein,

[0086] The non-inverting input terminal U9+ (pin 3) of the comparator U9 is connected to the output terminal of the analog signal processing circuit 100;

[0087] The inverting input terminal U9- (pin 4) of the comparator U9 is connected to the first end of the fourth resistor element R17 and the first end of the fifth resistor element R18, the second end of the fourth resistor element R17 is connected to the power supply voltage VDD, and the second end of the fifth resistor element R18 is grounded GND;

[0088] The output end (pin 1) of the comparator U9 is connected to the input end (pin B) of the level converter U8, and the output end (pin A) of the level converter U8 is connected to the analog-to-digital conversion pin ADC of the microcontroller 300. The other pins of the comparator U9 and the level converter U8 can be referred to Figure 5 As shown, other connection configurations may also be performed according to actual application scenarios.

[0089] In this embodiment, the trigger threshold of the trigger signal generating circuit 203 can be changed by adjusting the resistance values ​​of the fourth resistor element R17 and the fifth resistor element R18. When the input analog circuit signal PD_OUT is greater than the trigger threshold, the comparator U9 outputs a positive voltage signal, and then U8 converts the voltage signal into a voltage signal that meets the receiving conditions of the microprocessor 300 through level conversion, and then connects to the analog-to-digital conversion pin ADC of the microprocessor 300.

[0090] In some embodiments, continue to refer to Figure 4 As shown, the optical power detection circuit 10 may also include: a pulse detection circuit 204, which is connected to the analog signal processing circuit, the trigger signal generating circuit and the microcontroller, and is configured to amplify the analog circuit signal output by the analog signal processing circuit, and connect the amplified analog circuit signal to the trigger signal generating circuit for trigger detection.

[0091] For example, reference may be made to Figure 6 As shown, Figure 6 FIG. 2 shows a schematic diagram of the structure of the pulse detection circuit 204 in some embodiments.

[0092] In this embodiment, the pulse detection circuit 204 can be implemented by using a common-phase proportional amplifier circuit. The pulse detection circuit 204 can include an operational amplifier U10B, resistor elements R16, R20, and R21. Figure 6 The connection mode shown can constitute an in-phase proportional amplifier circuit, and the amplification factor of the pulse detection circuit 204 for the input analog circuit signal PD_OUT can be adjusted by adjusting the resistance values ​​of the resistor elements R16 and R20, so that the input smaller analog circuit signal PD_OUT is appropriately amplified to within the acceptable range of the MCU, thereby outputting the amplified analog circuit signal PD_OUT_S, and connecting the amplified analog circuit signal PD_OUT_S to the trigger signal generation circuit 203. Since the analog circuit signal is appropriately amplified, the trigger signal generation circuit 203 can detect the starting position of the amplified analog circuit signal PD_OUT_S more accurately and quickly, thereby improving the accuracy of the pulse width value acquisition of the trigger microcontroller 300, and further improving the accuracy of the output parameter calculation.

[0093] In some embodiments, an optical power detection system 1 is also provided, referring to Figure 1-Figure 7 As shown, Figure 7 A structural schematic diagram of an optical power detection system in some embodiments is shown. The optical power detection system 1 may include a power supply circuit 20, a bus circuit 30, a photoelectric sensor 40, and an optical power detection circuit 10 according to any one or more of the above-mentioned embodiments; wherein the power supply circuit 20 is configured to supply power 30 to the optical power detection circuit 10, the photoelectric sensor 40, and the bus circuit; the photoelectric sensor 40 is configured to collect laser pulse signals of a laser, and convert the laser pulse signals into current signals and input them into an analog signal processing circuit 100; the bus circuit 30 is configured to connect a microcontroller 300 and a host computer 2 of the laser.

[0094] The photoelectric sensor 40 may be, but is not limited to, a photodiode (PD), an organic photodiode (OPD), or the like.

[0095] More specifically, see Figure 7As shown, the power supply circuit 20 may include a power supply circuit A, a power supply circuit B and a power supply circuit C. The power supply circuit A may be provided with a set of suitable power supplies by the main control board circuit 3, and generate an isolation voltage VCC1 through the power module U1, which is respectively supplied to the analog signal processing circuit 100, the photoelectric sensor 40, the trigger signal generating circuit 203 and the pulse detection circuit 204 for operation; the power supply circuit B generates a voltage VCC2 through the power module U2 by VCC1, which is respectively supplied to the microcontroller 300 and the bus circuit 30 for operation; the power supply circuit C generates a voltage VCC3 through the power module U3 by VCC2, which is respectively supplied to the peak detection circuit 201 and the integration circuit 202 for operation. In other embodiments, the specific power supply distribution of the power supply circuit 20 may be planned according to the actual application situation, which is not limited here.

[0096] Exemplarily, the microcontroller 300 may include a gain control pin for controlling the analog signal processing circuit 100, a discharge control pin for controlling the peak detection circuit 201, and a discharge control pin for controlling the integration circuit 202, and level signals are input to the three functions respectively. It may also include a CAN communication pin for data interaction with the bus circuit 30.

[0097] The detailed description of the optical power detection circuit 10 in the optical power detection system 1 may refer to the description of the optical power detection circuit 10 in the above-mentioned embodiment, which will not be repeated here.

[0098] In some embodiments, the present application also provides an optical power detection method, which can be implemented based on a microprocessor of the optical power detection circuit involved in the present application, referring to Figure 8 As shown, Figure 8 The following is a schematic flow chart of the optical power detection method in some embodiments. Specifically, the following may be included:

[0099] Step S802: in response to detecting a laser pulse signal from a laser, enabling an optical power detection circuit to collect an analog circuit signal output by an analog signal processing circuit.

[0100] Specifically, the trigger signal generating circuit 203 can feed back to the microcontroller 300 after detecting the laser light emission to perform external hardware triggering, so that the optical power detection circuit 10 starts signal sampling. For example, the indicator light can be turned on to indicate that the optical power detection circuit 10 is in working state.

[0101] After the optical power detection circuit 10 is triggered to start, the peak detection circuit 204 detects the analog circuit signal PD_OUT output by the analog signal processing circuit 100 and outputs a peak signal PEAK_OUT. Then, the peak signal PEAK_OUT is input to the microcontroller 300 for processing.

[0102] The integration circuit 202 detects the analog circuit signal PD_OUT output by the analog signal processing circuit 100 and outputs an integration value signal PEAK_OUT. Then, the integration value signal INTE_OUT is input to the microcontroller 300 for processing.

[0103] Further, in the case where the optical power detection circuit 10 includes a trigger signal generating circuit 203 and a pulse detection circuit 204, the pulse detection circuit 204 amplifies the analog circuit signal PD_OUT output by the analog signal processing circuit 100 in accordance with preset requirements, and outputs the amplified analog circuit signal PD_OUT_S. The trigger signal generating circuit 203 detects the amplified analog circuit signal PD_OUT_S, and triggers after detecting that the amplitude of the amplified analog circuit signal PD_OUT_S is greater than a preset threshold, so that the microcontroller 300 starts to detect the amplified analog circuit signal PD_OUT_S and performs pulse width value detection.

[0104] Step S804: Acquire the peak value signal and the integral value signal output by the optical power detection circuit, and calculate the output parameters of the laser according to the peak value signal and the integral value signal.

[0105] Specifically, after receiving the peak signal PEAK_OUT output by the peak detection circuit 204 and the integral value signal INTE_OUT output by the integration circuit 202, the microcontroller 300 can further combine the pulse width value obtained by collecting the analog circuit signal PD_OUT or the amplified analog circuit signal PD_OUT_S through the ADC pin, perform data analysis and processing, and calculate the output parameters such as the output power and frequency of the laser pulse signal using the least square method. Then, the microcontroller 300 can upload the collected peak signal PEAK_OUT, the integral value signal INTE_OUT, and the calculated output parameters such as the output power and frequency to the host computer 2 through the bus circuit 30.

[0106] Step S806: Send the peak signal, integral value signal and calculated output parameters to the host computer, so that the host computer compares the peak signal, integral value signal and calculated output parameters with the corresponding preset standard parameters, and adjusts the next light output parameters of the laser according to the comparison result.

[0107] Specifically, after the microcontroller 300 uploads the collected peak signal PEAK_OUT, integral value signal INTE_OUT, and calculated output parameters such as output power and frequency to the host computer 2, the host computer 2 compares the peak signal PEAK_OUT, integral value signal INTE_OUT, and calculated output parameters with their respective corresponding preset standard parameters. If the comparison result shows that the collected and calculated parameters are inconsistent with the preset standard parameters, the host computer 2 can adjust the next light output parameters of the laser according to the calculated output parameters. If the comparison result shows that the collected and calculated parameters are consistent with the preset standard parameters, the host computer 2 may not adjust the next light output parameters of the laser, and control the next light emission with the current output parameters.

[0108] Furthermore, after the laser stops emitting light, the indicator light goes out, and the process of optical power detection is entered again after waiting for the next time the laser emits light. The main control board circuit 3 controls the light emission of the laser according to the new data (the next light output parameter) sent by the host computer 2. The optical power detection circuit 10 starts working after detecting the light source, and the cycle is repeated to form a closed loop.

[0109] In the above optical power detection method, after the optical power detection circuit is triggered, the microcontroller can directly obtain the peak signal and the integral value signal obtained after processing by the optical power detection circuit, and can calculate the output parameters of the laser such as output power and frequency more quickly and timely based on the peak signal and the integral value signal. Moreover, through the interaction between the microcontroller and the host computer, the host computer can compare the current dynamically calculated output parameters with the preset standard parameters, so as to adjust the output parameters of the laser light output next time more timely, efficiently and accurately according to the comparison results, thereby realizing efficient and accurate optical power feedback.

[0110] It should be understood that although Figure 8 The steps in the flowchart are shown in sequence as indicated by the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified in this document, there is no strict order restriction for the execution of these steps, and these steps can be executed in other orders. Moreover, Figure 8 At least part of the steps may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily executed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be executed in turn or alternately with other steps or at least part of the sub-steps or stages of other steps.

[0111] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0112] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. An optical power detection circuit, the optical power detection circuit is applied to a laser, the optical power detection circuit comprising: an analog signal processing circuit configured to convert the laser pulse signal emitted by the laser into an analog circuit signal; a peak detection circuit, configured to perform peak signal detection on the analog circuit signal output by the analog signal processing circuit, and output a peak signal of the analog circuit signal; an integration circuit configured to perform integration processing on the analog circuit signal output by the analog signal processing circuit, and output an integration value signal of the analog circuit signal; The microcontroller is configured to receive the peak value signal and the integral value signal, and calculate the output parameter of the laser according to the peak value signal and the integral value signal.

2. The circuit according to claim 1, characterized in that The peak detection circuit includes a front-end comparison follower circuit, a first unidirectional conductive element, a field effect transistor element and a first capacitor element, wherein: The first input end of the front-end comparison follower circuit is configured to receive the analog circuit signal, and the output end of the front-end comparison follower circuit is connected to the positive electrode of the first unidirectional conductive element; The cathode of the first unidirectional conductive element is connected to the second end of the field effect transistor element; The first end of the field effect transistor element is used to output the sub-peak signal, and the third end of the field effect transistor element is connected to the first end of the first capacitor element; A second terminal of the first capacitive element is grounded.

3. The circuit according to claim 2, characterized in that The peak detection circuit also includes a negative feedback circuit, wherein: The non-inverting input terminal of the negative feedback circuit is connected to the first terminal of the field effect transistor element; The output end of the negative feedback circuit is connected to the inverting input end of the negative feedback circuit, the cathode of the first unidirectional conducting element, the second end of the field effect transistor element and the second input end of the front-end comparison follower circuit.

4. The circuit according to claim 3, characterized in that The front-end comparison follower circuit includes a first operational amplifier, a second unidirectional conductive element and a second capacitive element; wherein, The non-inverting input terminal of the first operational amplifier is configured to receive the analog circuit signal; The inverting input terminal of the first operational amplifier is connected to the negative electrode of the second unidirectional conductive element, the first terminal of the second capacitive element and the output terminal of the negative feedback circuit; An output terminal of the first operational amplifier is connected to the anode of the second unidirectional conducting element, the second terminal of the second capacitive element, and the anode of the first unidirectional conducting element.

5. The circuit according to claim 1, characterized in that The integration circuit includes a second operational amplifier, a third capacitance element, a fourth capacitance element, a first resistance element, a second resistance element and a third resistance element; wherein, The inverting input terminal of the second operational amplifier is connected to the first terminal of the third capacitor and the first terminal of the first resistor, and the second terminal of the first resistor is grounded; The non-inverting input terminal of the second operational amplifier is connected to the first terminal of the second resistor element and the first terminal of the fourth capacitor element, the second terminal of the fourth capacitor element is grounded, and the second terminal of the second resistor element is connected to the output terminal of the analog signal processing circuit; The output end of the second operational amplifier is connected to the second end of the third capacitor element and the first end of the third resistor element, and the second end of the third resistor element is connected to the analog-to-digital conversion pin of the microcontroller.

6. The circuit according to claim 1, characterized in that The optical power detection circuit also includes: a trigger signal generating circuit, configured to perform trigger detection on the analog circuit signal output by the analog signal processing circuit, and transmit the analog circuit signal to the microcontroller to detect the pulse width value after the amplitude of the analog circuit signal is greater than a preset trigger threshold; The microcontroller is further configured to calculate an output parameter of the laser according to the peak signal, the integrated value signal and the pulse width value.

7. The circuit according to claim 6, characterized in that The optical power detection circuit also includes: A pulse detection circuit is connected to the analog signal processing circuit, the trigger signal generating circuit and the microcontroller, and is configured to amplify the analog circuit signal output by the analog signal processing circuit, and connect the amplified analog circuit signal to the trigger signal generating circuit for trigger detection.

8. The circuit according to claim 6, characterized in that The trigger signal generating circuit includes a comparator, a fourth resistor element, a fifth resistor element and a level converter; wherein, The non-inverting input terminal of the comparator is connected to the output terminal of the analog signal processing circuit; The inverting input terminal of the comparator is connected to the first end of the fourth resistor element and the first end of the fifth resistor element, the second end of the fourth resistor element is connected to the power supply voltage, and the second end of the fifth resistor element is grounded; The output end of the comparator is connected to the input end of the level converter, and the output end of the level converter is connected to the analog-to-digital conversion pin of the microcontroller.

9. The circuit according to claim 7, characterized in that The pulse detection circuit is implemented by using a common-phase proportional amplifier circuit.

10. An optical power detection system, comprising a power supply circuit, a bus circuit, a photoelectric sensor, and an optical power detection circuit according to any one of claims 1 to 9; wherein: The power supply circuit is configured to supply power to the optical power detection circuit, the photoelectric sensor and the bus circuit; The photoelectric sensor is configured to collect the laser pulse signal of the laser, and convert the laser pulse signal into a current signal and input it into the analog signal processing circuit; The bus circuit is configured to connect the microcontroller and a host computer of the laser.

11. An optical power detection method, the method being applied to a microcontroller of an optical power detection circuit according to any one of claims 1 to 9, the method comprising: In response to detecting the laser pulse signal of the laser, enabling the optical power detection circuit to collect the analog circuit signal output by the analog signal processing circuit; Acquire the peak value signal and the integral value signal output by the optical power detection circuit, and calculate the output parameters of the laser according to the peak value signal and the integral value signal; as well as The peak signal, the integral value signal and the calculated output parameter are sent to a host computer, so that the host computer compares the peak signal, the integral value signal and the calculated output parameter with corresponding preset standard parameters, and adjusts the next light output parameter of the laser according to the comparison result. 12 . A laser, comprising a host computer, a main control board circuit and the optical power detection system according to claim 10 .

Images