Nozzle processing method, system and device

Abstract

The invention relates to a nozzle processing method, system and device. The nozzle treatment method comprises the following steps that a test base material is provided, and the surface of the test base material is provided with a plurality of preset areas; and providing a plurality of nozzles to be detected, and providing ink to the preset area through the nozzles to be detected. And obtaining the optical signal of each preset area as a judgment signal. And comparing the judgment signals, and determining a target nozzle from the plurality of nozzles to be detected.

Description

Technical Field

[0001] The present application relates to the field of inkjet printing technology, and in particular to a nozzle processing method, a nozzle processing system, and a nozzle processing device. Background Art

[0002] Inkjet printing is one of the process methods for preparing organic light-emitting diodes (OLEDs) or quantum dot light-emitting diodes (QLEDs). The preparation of functional layers such as hole injection layer, hole transport layer, and light-emitting layer can all be done by inkjet printing. Currently, in the inkjet printing process, it is necessary to select suitable nozzles for printing tasks before the printing task. However, the traditional nozzle screening method has poor screening effect and needs further improvement. Summary of the invention

[0003] Based on this, it is necessary to provide a nozzle processing method, a nozzle processing system, and a nozzle processing device.

[0004] In a first aspect, the present application provides a nozzle processing method, comprising the following steps:

[0005] Providing a test substrate, wherein the surface of the test substrate has a plurality of preset areas;

[0006] Providing a plurality of nozzles to be tested, and providing ink to the preset area through the nozzles to be tested;

[0007] Acquire the light signal of each of the preset areas as a judgment signal;

[0008] The judgment signals are compared to determine the target nozzle from the plurality of nozzles to be tested.

[0009] In some embodiments, the nozzle processing method comprises the following steps:

[0010] Providing a test substrate, wherein the surface of the test substrate has a plurality of preset areas;

[0011] Providing a plurality of nozzles to be tested, and providing ink to the preset area through the nozzles to be tested to form a plurality of ink droplets, wherein the ink includes a luminescent material;

[0012] Acquire an optical signal of at least one of the ink droplets as a reference signal;

[0013] Acquire the light signal of each of the preset areas as a judgment signal;

[0014] The judgment signals are compared with the reference signals to determine the target nozzle from the plurality of nozzles to be tested.

[0015] In some embodiments, comparing each of the judgment signals with the reference signal to determine a target nozzle from a plurality of nozzles to be tested comprises the following steps:

[0016] When the change rate of the judgment signal relative to the reference signal is less than or equal to a preset threshold, the nozzle corresponding to the preset area is judged to be a qualified nozzle, otherwise the nozzle corresponding to the preset area is judged to be an unqualified nozzle.

[0017] In some embodiments, the reference signal comprises a peak intensity of an optical signal of any ink droplet on the test substrate;

[0018] The judgment signal includes the peak intensity of the light signal of each of the preset areas;

[0019] The change rate is a change rate of the peak intensity of the determination signal relative to the peak intensity of the reference signal.

[0020] In some embodiments, the preset threshold is 0%~5%.

[0021] In some embodiments, acquiring the optical signal of at least one of the ink droplets as a reference signal comprises:

[0022] irradiating at least one ink droplet on the test substrate with an excitation light source so that the ink droplet emits a first excitation signal, and using the first excitation signal as a reference signal;

[0023] Acquiring the light signal of each of the preset areas as a judgment signal includes:

[0024] The preset area is illuminated by the excitation light source, so that the preset area sends out a second excitation signal, and the second excitation signal is used as a judgment signal.

[0025] In some embodiments, the test substrate comprises a light-transmissive substrate.

[0026] In some embodiments, the excitation light source includes an ultraviolet light source.

[0027] In some embodiments, the light transmittance of the light-transmitting substrate is ≥ 80%.

[0028] In some embodiments, the emission wavelength of the excitation light source is λ, 280nm≤λ<400nm.

[0029] In some embodiments, the light-transmitting substrate comprises a hydrophobic light-transmitting substrate; and / or

[0030] The luminescent material comprises at least one of an organic luminescent material and a quantum dot luminescent material; and / or

[0031] The plurality of preset areas are distributed in a dot matrix on the surface of the test substrate.

[0032] In some embodiments, after comparing the judgment signals and determining the target nozzle from the plurality of nozzles to be tested, the following steps are also included:

[0033] Printing is performed using the target nozzle.

[0034] In a second aspect, the present application provides a nozzle processing system, including a control module, a judgment signal acquisition module, and a signal judgment module;

[0035] The test substrate also includes a test substrate having a plurality of preset areas on its surface; the preset areas carry ink;

[0036] The judgment signal acquisition module is used to acquire the light signal of each of the preset areas as a judgment signal;

[0037] The signal judgment module is used to compare the judgment signals and determine the target nozzle from the plurality of nozzles to be tested.

[0038] In a third aspect, the present application provides a nozzle processing device,

[0039] A test substrate and a controller, wherein the surface of the test substrate has a plurality of preset areas;

[0040] The controller is used to control the plurality of nozzles to be tested to provide ink to the preset area;

[0041] The controller is also used to obtain the light signal of each preset area as a judgment signal;

[0042] The controller is also used to compare the judgment signals and determine the target nozzle from the plurality of nozzles to be tested.

[0043] In some embodiments, the nozzle processing device further comprises: a transfer device, an excitation light source and a detection device, wherein the transfer device, the excitation light source and the detection device are all electrically connected to the controller;

[0044] The transport device is used to transport the test substrate;

[0045] The excitation light source is used to illuminate the preset area so that the preset area emits a second excitation signal;

[0046] The detection device is used to receive the second excitation signal;

[0047] The detection device and the excitation light source are located on opposite sides of the test substrate; and / or

[0048] The test substrate includes a light-transmitting substrate.

[0049] The nozzle processing method of the present application can quickly determine the target nozzle from the nozzles to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] Figure 1 A schematic diagram of a nozzle processing method provided in one embodiment of the present application;

[0051] Figure 2 A schematic diagram of the structure of a nozzle processing device provided in one embodiment of the present application;

[0052] Figure 3 A schematic diagram of a preset area and its corresponding stimulated light signal provided in an embodiment of the present application.

[0053] Description of Reference Numerals

[0054] 10. Ink cartridge; 11. Inkjet print head; 20. Light-transmitting substrate; 30. Transfer device; 40. Excitation light source; 50. Detection device; 60. Guide member; 70. Controller. DETAILED DESCRIPTION

[0055] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below. In the following description, many specific details are set forth to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present application, so the present application is not limited by the specific embodiments disclosed below.

[0056] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0057] In this application, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0058] Reference Figure 1 As shown, an embodiment of the present application provides a nozzle processing method, comprising the following steps:

[0059] S10: providing a test substrate, wherein the surface of the test substrate has a plurality of preset areas; providing a plurality of nozzles to be tested, and providing ink to the preset areas through the nozzles to be tested;

[0060] S20: Obtaining light signals from each preset area as judgment signals;

[0061] S30: Compare the judgment signals and determine the target nozzle from the plurality of nozzles to be tested.

[0062] In the nozzle processing method, ink is printed onto the surface of a substrate having a plurality of preset areas, and each nozzle corresponds to a preset area one by one. After obtaining the optical signal of each preset area and comparing it as a judgment signal, the nozzle corresponding to each judgment signal can be screened by screening the judgment signal that is different from other judgment signals. The nozzle processing method can quickly determine the target nozzle. Furthermore, by using the optical signal as the judgment signal, the detection accuracy is high.

[0063] It is understandable that, under normal circumstances, when ink is provided to a preset area through the nozzle to be tested to form multiple ink droplets, some ink droplets may be completely located in the preset area, and some ink droplets may not be completely located in the preset area. When there are ink droplets that are not completely located in the preset area, the judgment signal corresponding to the preset area will be different from other judgment signals. By comparing the judgment signals and finding the judgment signal that is different from other judgment signals, the nozzle corresponding to the preset area can be determined as an unqualified nozzle.

[0064] In some embodiments, the nozzle processing method comprises the following steps:

[0065] Providing a test substrate, wherein the surface of the test substrate has a plurality of preset areas; providing a plurality of nozzles to be tested, and providing ink to the preset areas through the nozzles to be tested to form a plurality of ink droplets, wherein the ink includes a luminescent material;

[0066] Acquire an optical signal of at least one ink droplet as a reference signal;

[0067] Obtaining light signals from each preset area as judgment signals;

[0068] The judgment signals are compared with the reference signal to determine the target nozzle from the plurality of nozzles to be tested.

[0069] By using the optical signal of at least one ink droplet as a reference signal and comparing each judgment signal with the reference signal, the error effect when performing a horizontal comparison on each judgment signal can be reduced. It should be noted that in extreme cases, it is possible that all ink droplets are not completely located within the preset area, and the processing result in this case will have errors. By using the optical signal of at least one ink droplet as a reference signal and comparing each judgment signal with the reference signal, the error effect caused by this extreme situation can be reduced, and the accuracy of nozzle screening can be improved. Furthermore, by using the optical signal as a reference signal and a judgment signal, the detection accuracy is high, and the target nozzle can be screened with high accuracy.

[0070] In some embodiments, comparing each judgment signal with a reference signal and determining a target nozzle from a plurality of nozzles to be tested includes the following steps: when the rate of change of the judgment signal relative to the reference signal is less than or equal to a preset threshold, the nozzle corresponding to the preset area is judged to be a qualified nozzle; otherwise, the nozzle corresponding to the preset area is judged to be an unqualified nozzle.

[0071] When an ink drop is located in the preset area corresponding to it, the change rate of the judgment signal corresponding to the preset area relative to the reference signal will be less than or equal to the preset threshold, and when an ink drop is not completely located in the preset area corresponding to it, the change rate of the judgment signal corresponding to the preset area relative to the reference signal will be greater than the preset threshold. By comparing whether the change rate of the judgment signal corresponding to each preset area relative to the reference signal is less than or equal to the preset threshold, it is possible to screen whether each nozzle is qualified, and to quickly screen qualified nozzles.

[0072] It can be understood that the change rate is the percentage of the absolute value of the difference between the judgment signal and the reference signal to the reference signal.

[0073] In some embodiments, the reference signal includes the peak intensity of the light signal of any ink droplet on the test substrate; the judgment signal includes the peak intensity of the light signal of each preset area; the change rate is the change rate of the peak intensity of the judgment signal relative to the peak intensity of the reference signal. By using the peak intensity of the light signal as the reference signal and the judgment signal, the change rate can be easily calculated, and the judgment result of the nozzle can be intuitively reflected.

[0074] In some embodiments, the preset threshold is 0% to 5%. It is understandable that in different application scenarios, the preset threshold can be set according to requirements to screen nozzles with different accuracies. Optionally, the preset threshold is 5%, 4%, 3%, 2%, 1% or 0%.

[0075] In some embodiments, obtaining the optical signal of at least one ink droplet as a reference signal includes: irradiating at least one ink droplet on the test substrate with an excitation light source so that the ink droplet emits a first excitation signal, and using the first excitation signal as a reference signal. Obtaining the optical signal of each preset area as a judgment signal includes: irradiating the preset area with an excitation light source so that the preset area emits a second excitation signal, and using the second excitation signal as a judgment signal. It can be understood that when any ink droplet is irradiated with an excitation light source so that it emits an excited light signal, the irradiation accuracy of the excitation light source can be controlled so that it just irradiates a single ink droplet, and the first excitation signal of the ink droplet is used as a reference signal. When the excitation light source is used to irradiate the preset area, the excitation light source can also be controlled to irradiate only each preset area. If the corresponding ink droplet is located in the preset area, the change rate between the excited light signal emitted by it and the reference signal will be less than or equal to the reference signal. When the corresponding ink droplet is not completely located in the preset area, the excited light signal corresponding to the preset area is only the excited light signal emitted by a part of the single ink droplet located in the preset area, and the change rate between the excited light signal and the reference signal will be greater than the preset threshold. Meanwhile, if the nozzle corresponding to a preset area is not working or the ejected ink droplets are completely outside the preset area, the light signal corresponding to the preset area is zero.

[0076] In some embodiments, the test substrate includes a light-transmitting substrate. By using the light-transmitting substrate as the test substrate, the surface of the substrate with a preset area can be irradiated with an excitation light source, and the excited light signal can be received on the opposite surface of the surface, which is convenient for operation.

[0077] In some embodiments, the excitation light source includes an ultraviolet light source. The ultraviolet light source has high energy, and the luminescent material can be excited to emit light by irradiating the luminescent material with ultraviolet light. At the same time, ultraviolet light is used as the excitation light source, so that the luminescent material in the ink droplet is excited to emit visible light, which is convenient for receiving the excited light signal.

[0078] In some embodiments, the light transmittance of the light-transmitting substrate is ≥ 80%. It is understood that the light transmittance refers to the percentage of the luminous flux passing through the light-transmitting substrate to its incident luminous flux. Optionally, the light transmittance of the light-transmitting substrate is 80% to 98%. Further optionally, the light transmittance of the light-transmitting substrate is 80%, 81%, 82%, 83%, 84%, 85%, 86%, 87%, 88%, 89%, 90%, 91%, 92%, 93%, 94%, 95%, 96%, 97% or 98%. Alternatively, the light transmittance of the light-transmitting substrate can also be within the range between any two of the above light transmittances.

[0079] In some embodiments, the emission wavelength of the excitation light source is λ, 280nm≤λ<400nm. Optionally, the emission wavelength of the excitation light source is 280nm, 285nm, 290nm, 295nm, 300nm, 305nm, 310nm, 315nm, 320nm, 325nm, 330nm, 335nm, 340nm, 3nm, 350nm, 355nm, 360nm, 365nm, 370nm, 375nm, 380nm, 3nm, 390nm, 395nm or 399nm.

[0080] In some embodiments, a plurality of predetermined regions are distributed in a dot matrix on the surface of the test substrate.

[0081] In some embodiments, a plurality of predetermined regions are distributed in a dot matrix at equal intervals on the surface of the test substrate.

[0082] In some embodiments, the light-emitting material includes an organic light-emitting material or a quantum dot light-emitting material.

[0083] In some embodiments, the organic light-emitting material is selected from at least one of diaromatic anthracene derivatives, distyrene aromatic derivatives, pyrene derivatives or fluorene derivatives, TBPe fluorescent materials emitting blue light, TTPA fluorescent materials emitting green light, TBRb fluorescent materials emitting orange light, and DBP fluorescent materials emitting red light; the quantum dot light-emitting material is selected from at least one of single-structure quantum dots, core-shell structure quantum dots, and perovskite semiconductor materials; the single-structure quantum dots are selected from at least one of II-VI compounds, IV-VI compounds, III-V compounds, and I-III-VI compounds; the II-VI compounds are selected from CdS , CdSe, CdTe, ZnS, ZnSe, ZnTe, ZnO, HgS, HgSe, HgTe, CdSeS, CdSeTe, CdSTe, ZnSeS, ZnSeTe, ZnSTe, HgSeS, HgSeTe, HgSTe, CdZnS, CdZn Se, CdZnTe, CdHgS, CdHgSe, CdHgTe, HgZnS, HgZnSe, HgZnTe, CdZnSeS, CdZnSeTe, CdZnSTe, CdHgSeS, CdHgSeTe, CdHgSTe, HgZnSeS, HgZ At least one of nSeTe and HgZnSTe, the IV-VI group compound is selected from at least one of SnS, SnSe, SnTe, PbS, PbSe, PbTe, SnSeS, SnSeTe, SnSTe, PbSeS, PbSeTe, PbSTe, SnPbS, SnPbSe, SnPbTe, SnPbSSe, SnPbSeTe, SnPbSTe, the III-V group compound is selected from at least one of GaN, GaP, GaAs, GaSb, AlN, AlP, AlAs, AlSb, InN, InP, InAs, InSb, GaNP, GaN At least one of As, GaNSb, GaPAs, GaPSb, AlNP, AlNAs, AlNSb, AlPAs, AlPSb, InNP, InNAs, InNSb, InPAs, InPSb, GaAlNP, GaAlNAs, GaAlNSb, GaAlPAs, GaAlPSb, GaInNP, GaInNAs, GaInNSb, GaInPAs, GaInPSb, InAlNP, InAlNAs, InAlNSb, InAlPAs and InAlPSb, and the I-III-VI group compound is selected from CuInS 2 、CuInSe 2 and AgInS 2At least one of the following: the core of the quantum dot with a core-shell structure is selected from any one of the above-mentioned single-structure quantum dots, and the shell material of the quantum dot with a core-shell structure is selected from at least one of CdS, CdTe, CdSeTe, CdZnSe, CdZnS, CdSeS, ZnSe, ZnSeS and ZnS; the perovskite semiconductor material is selected from doped or undoped inorganic perovskite semiconductors, organic perovskite semiconductors or organic-inorganic hybrid perovskite semiconductors; the general structural formula of the inorganic perovskite semiconductor is AMX 3 , where A is Cs + ion, M is a divalent metal cation selected from Pb 2+ Sn 2+ , Cu 2+ 、Ni 2+ 、Cd 2+ Cr 2+ , Mn 2+ 、Co 2+ , Fe 2+ ,Ge 2+ , Yb 2+ and Eu 2+ At least one of, X is a halogen anion selected from Cl - Br - ,I - At least one of the following; the general structural formula of the organic perovskite semiconductor is CMX 3 , wherein C is a carboxamidino group, M is a divalent metal cation, and M is selected from Pb 2+ Sn 2+ , Cu 2+ 、Ni 2+ 、Cd 2+ Cr 2+ , Mn 2+ 、Co 2+ , Fe 2+ ,Ge 2+ , Yb 2+ and Eu 2+ At least one of, X is a halogen anion selected from Cl - Br - or I - At least one of the following; the general structural formula of the organic-inorganic hybrid perovskite semiconductor is BMX 3 , wherein B is an organic amine cation selected from CH 3 (CH 2 ) n -2NH 3 + or [NH 3 (CH 2 ) n NH 3 ] 2+ , where n≥2, M is a divalent metal cation selected from Pb 2+ Sn 2+ , Cu 2+ 、Ni 2+ 、Cd 2+ Cr 2+ , Mn 2+ 、Co 2+ , Fe 2+ ,Ge 2+ , Yb 2+ and Eu 2+ At least one of, X is a halogen anion selected from Cl - Br - ,I - At least one of .

[0084] In some embodiments, the light-transmitting substrate includes a hydrophobic light-transmitting substrate. Using a hydrophobic light-transmitting substrate as the light-transmitting substrate can make it difficult for ink droplets to spread on the surface of the substrate, and can make the position of the ink droplets on the substrate more accurate, so as to obtain a better determination effect.

[0085] In some embodiments, the hydrophobic and light-transmitting substrate includes at least one of a PI film, a PET film, a PTFE film, a PDMS film, and a PMMA film.

[0086] In some embodiments, after comparing the judgment signals and determining the target nozzle from the plurality of nozzles to be tested, the following steps are also included:

[0087] Print using the targeted nozzles.

[0088] Another embodiment of the present application provides a nozzle processing system, including a control module, a judgment signal acquisition module and a signal judgment module. It also includes a test substrate, the surface of the test substrate has multiple preset areas; the preset areas carry ink. The judgment signal acquisition module is used to obtain the light signal of each preset area as a judgment signal. The signal judgment module is used to compare each judgment signal and determine the target nozzle from multiple nozzles to be tested.

[0089] In some embodiments, the preset area carries a plurality of ink droplets, and the ink droplets are formed by ink provided by the nozzle to be tested, wherein the ink includes a luminescent material.

[0090] In some embodiments, the nozzle processing system further includes a reference signal acquisition module, and the reference signal acquisition module is used to acquire an optical signal of at least one ink droplet as a reference signal.

[0091] In some embodiments, the signal determination module is used to compare the determination signal with the reference signal to determine the target nozzle from a plurality of nozzles to be tested.

[0092] In some embodiments, the nozzle processing system further includes a printing control module, and the printing control module is used to control the target nozzle to perform printing.

[0093] Another embodiment of the present application provides a nozzle processing device, including a test substrate and a controller. The surface of the test substrate has a plurality of preset areas. The controller is used to control the plurality of nozzles to be tested to provide ink to the preset areas. The controller is also used to obtain light signals from each preset area as a judgment signal. The controller is also used to compare the judgment signals and determine a target nozzle from the plurality of nozzles to be tested.

[0094] In some embodiments, the controller is used to control the plurality of nozzles to be tested to provide ink to a preset area to form a plurality of ink droplets, wherein the ink includes a luminescent material.

[0095] In some embodiments, the controller is further configured to obtain an optical signal of at least one ink droplet as a reference signal.

[0096] In some embodiments, the controller is further used to compare the determination signal with the reference signal to determine the target nozzle from the plurality of nozzles to be tested.

[0097] In some embodiments, the controller is further configured to control the target nozzle to perform printing.

[0098] Reference Figure 2 As shown, in some embodiments, the nozzle processing device also includes: a transfer device 30, an excitation light source 40 and a detection device 50, wherein the transfer device 30, the excitation light source 40 and the detection device 50 are all electrically connected to the controller 70. The transfer device 30 is used to transfer the test substrate. The test substrate includes a light-transmitting substrate 20, and the excitation light source 40 is used to illuminate a preset area so that the preset area emits a second excitation signal. The detection device 50 is used to receive the first excitation signal and the second excitation signal. The detection device 50 and the excitation light source 40 are located on opposite sides of the light-transmitting substrate 20. Among them, the dotted line indicates the electrical connection between the devices. The excitation light source 40 and the detection device 50 are arranged on opposite sides of the light-transmitting substrate 20 to facilitate the reception of the excited light signal.

[0099] In some embodiments, the excitation light source 40 is further used to illuminate at least one ink droplet on the test substrate to cause the ink droplet to emit a first excitation signal.

[0100] In some embodiments, the detection device 50 is further configured to receive a first excitation signal.

[0101] In some embodiments, the nozzle processing device further includes an ink cartridge 10 , which is used to store ink and can be installed with an inkjet print head 11 .

[0102] In some embodiments, the excitation light source 40 is disposed toward the surface of the light-transmitting substrate 20 where the preset area is disposed, and the detection device 50 is disposed toward the surface opposite to the surface of the light-transmitting substrate 20 where the preset area is disposed.

[0103] In some embodiments, the nozzle processing device further includes a guide 60, which is used to guide the transparent substrate to the excitation light source 40. The guide 60 can be arranged to turn the transparent substrate 20, which facilitates the arrangement of the excitation light source 40 and the detection device 50, thereby saving the occupied space of the nozzle processing device.

[0104] Another embodiment of the present application provides an inkjet printing method, comprising the following steps: determining a target nozzle according to any of the nozzle processing methods described above; and performing inkjet printing using the target nozzle.

[0105] Another embodiment of the present application provides an inkjet printing system, including a nozzle processing module and a print control module; the nozzle processing module is used to determine the target nozzle according to any of the above nozzle processing methods; the print control module is used to control the target nozzle to perform inkjet printing.

[0106] Another embodiment of the present application provides an inkjet printing device, including a nozzle and a print controller; the nozzle is used to provide ink to a substrate; the print controller is used to determine the target nozzle according to any of the above nozzle processing methods; the print controller is also used to control the target nozzle for inkjet printing.

[0107] Reference Figure 3 In a specific embodiment, the nozzle is processed using the nozzle processing method of the present application. Figure 3 The upper middle diagram is a schematic diagram of inkjet printing on a substrate. Figure 3 The lower middle part shows the light signals corresponding to each preset area. It can be seen that, taking the light signal of the first ink droplet on the left as the reference signal, the ink droplet corresponding to the second preset area on the left is not completely located in the preset area, and the peak intensity of its light signal has a significantly larger change rate relative to the reference signal, which is higher than the preset threshold. The judgment signals corresponding to other preset areas have a smaller change rate relative to the reference signal, which is lower than the preset threshold. The target nozzle can be quickly determined by this nozzle processing method.

[0108] Another embodiment of the present application provides a computer device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of the above-mentioned nozzle processing method and / or the above-mentioned inkjet printing method are implemented.

[0109] Yet another embodiment of the present invention provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the steps of the above-mentioned nozzle processing method and / or the above-mentioned inkjet printing method are implemented.

[0110] It is understandable that a person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be implemented by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided by the present invention may include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0111] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0112] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims, and the description and drawings may be used to interpret the contents of the claims.

Claims

1. A nozzle processing method, characterized in that: The steps include: Providing a test substrate, wherein the surface of the test substrate has a plurality of preset areas; Providing a plurality of nozzles to be tested, and providing ink to the preset area through the nozzles to be tested; Acquire the light signal of each of the preset areas as a judgment signal; The judgment signals are compared to determine the target nozzle from the plurality of nozzles to be tested.

2. The nozzle processing method according to claim 1, characterized in that: The steps include: Providing a test substrate, wherein the surface of the test substrate has a plurality of preset areas; Providing a plurality of nozzles to be tested, and providing ink to the preset area through the nozzles to be tested to form a plurality of ink droplets, wherein the ink includes a luminescent material; Acquire an optical signal of at least one of the ink droplets as a reference signal; Acquire the light signal of each of the preset areas as a judgment signal; The judgment signals are compared with the reference signals to determine the target nozzle from the plurality of nozzles to be tested.

3. The nozzle processing method according to claim 2, characterized in that: Comparing each of the judgment signals with the reference signal to determine a target nozzle from the plurality of nozzles to be tested comprises the following steps: When the change rate of the judgment signal relative to the reference signal is less than or equal to a preset threshold, the nozzle corresponding to the preset area is judged to be a qualified nozzle, otherwise the nozzle corresponding to the preset area is judged to be an unqualified nozzle.

4. The nozzle processing method according to claim 3, characterized in that: The reference signal includes the peak intensity of the optical signal of any ink droplet on the test substrate; The judgment signal includes the peak intensity of the light signal of each of the preset areas; The change rate is a change rate of the peak intensity of the determination signal relative to the peak intensity of the reference signal.

5. The nozzle processing method according to claim 3, characterized in that: The preset threshold is 0%~5%.

6. The nozzle processing method according to any one of claims 2 to 5, characterized in that: Acquiring the optical signal of at least one ink droplet as a reference signal comprises: irradiating at least one ink droplet on the test substrate with an excitation light source so that the ink droplet emits a first excitation signal, and using the first excitation signal as a reference signal; Acquiring the light signal of each of the preset areas as a judgment signal includes: The preset area is illuminated by the excitation light source, so that the preset area sends out a second excitation signal, and the second excitation signal is used as a judgment signal.

7. The nozzle processing method according to claim 6, characterized in that: The test substrate includes a light-transmitting substrate; and / or the excitation light source includes an ultraviolet light source.

8. The nozzle processing method according to claim 7, characterized in that: The light transmittance of the light-transmitting substrate is ≥80%; and / or the light emission wavelength of the excitation light source is λ, 280nm≤λ<400nm.

9. The nozzle processing method according to any one of claims 1 to 5 and 7 to 8, characterized in that: The light-transmitting substrate comprises a hydrophobic light-transmitting substrate; and / or, The luminescent material comprises at least one of an organic luminescent material and a quantum dot luminescent material; and / or, The plurality of preset areas are distributed in a dot matrix on the surface of the test substrate.

10. The nozzle processing method according to any one of claims 1 to 5 and 7 to 8, characterized in that: After comparing the judgment signals and determining the target nozzle from the plurality of nozzles to be tested, the following steps are also included: Printing is performed using the target nozzle.

11. A nozzle processing system, characterized in that: It includes a control module, a judgment signal acquisition module and a signal judgment module; Also included is a test substrate, the surface of which has a plurality of preset areas; the preset areas carry ink; The judgment signal acquisition module is used to acquire the light signal of each of the preset areas as a judgment signal; The signal judgment module is used to compare the judgment signals and determine the target nozzle from the plurality of nozzles to be tested.

12. A nozzle processing device, characterized in that: It comprises a test substrate and a controller, wherein the surface of the test substrate has a plurality of preset areas; The controller is used to control the plurality of nozzles to be tested to provide ink to the preset area; The controller is also used to obtain the light signal of each preset area as a judgment signal; The controller is also used to compare the judgment signals and determine the target nozzle from the plurality of nozzles to be tested.

13. The nozzle treatment device according to claim 12, characterized in that: The nozzle processing device further includes: a transfer device, an excitation light source and a detection device, wherein the transfer device, the excitation light source and the detection device are all electrically connected to the controller; The transport device is used to transport the test substrate; The excitation light source is used to illuminate the preset area so that the preset area emits a second excitation signal; The detection device is used to receive the second excitation signal; The detection device and the excitation light source are located on opposite sides of the test substrate; and / or The test substrate includes a light-transmitting substrate.

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