Testing method and testing device of imaging system

Abstract

The invention provides a testing method and a testing device for an imaging system. The method comprises the following steps: carrying out imaging design of an air environment and a vacuum environment of the imaging system; establishing a collimator simulation test light path in the air environment; adding design parameters of an imaging system in a vacuum environment into a collimator simulation test light path in an air environment; adjusting a slit position of a slit plate in the simulation test light path until an image of emergent light of the collimator coincides with a focal plane; building an actual adjustment and measurement light path according to the vacuum environment test position of the slit plate; and actual adjustment and focal plane adjustment and transfer function measurement of the measurement light path are carried out in the air environment, so that the focal plane adjustment and transfer function measurement result of the imaging system in the vacuum environment can be obtained. According to the invention, the focal plane adjustment and transfer function test result of the imaging system in the vacuum environment can be obtained in the air environment without adding other equipment or components, and the adjustment and test difficulty of the imaging system in the vacuum environment is effectively reduced.

Description

Technical Field

[0001] The invention relates to the field of photometric measurement technology, and in particular to a testing method and a testing device for an imaging system. Background Art

[0002] Focus plane adjustment and transfer function test (optical transfer function) are tests that must be performed when developing the imaging system, reflecting the actual imaging quality of the imaging system. In the focus plane adjustment and transfer function test of the imaging system, the focal plane needs to be adjusted repeatedly to determine the position with the best imaging quality.

[0003] However, for satellite-borne imaging systems working in a vacuum environment, the imaging state is different from that in an air environment. Therefore, for the imaging system, not only the focal plane adjustment and transmission function measurement in an air environment are required, but the focal plane adjustment and transmission function measurement in a vacuum environment is also very important.

[0004] In the related art, the focal plane adjustment and transfer function measurement of the imaging system only reflect the imaging quality in the air environment, but cannot reflect the imaging quality in the vacuum environment, and cannot predict the imaging difference between the two environments. If you want to obtain the best imaging quality position of the imaging system in a vacuum, you need to place the imaging system in a vacuum box for focal plane adjustment and transfer function measurement. Due to the limitations of the vacuum box, it is very difficult for the imaging system to adjust the angle and other states inside. In addition, the window deformation caused by the vacuum has a negative impact on the focal plane adjustment and transfer function measurement test results, and the cost is relatively high. Summary of the invention

[0005] In order to solve the above technical problems, the present invention provides a testing method for an imaging system.

[0006] The invention also provides a testing device for the imaging system.

[0007] The technical solution adopted by the present invention is as follows:

[0008] The first aspect of the present invention provides a testing method for an imaging system, comprising the following steps: performing an air environment imaging design and a vacuum environment imaging design of the imaging system; establishing a collimator simulation test optical path in an air environment according to the focal length of the collimator in an actual environment, wherein the collimator comprises: a parabolic reflector, a plane reflector, a slit plate and a light source; adding the design parameters of the imaging system in the vacuum environment to the collimator simulation test optical path in the air environment; adjusting the slit position of the slit plate in the simulation test optical path until the imaging of the light emitted by the collimator coincides with the focal plane, and using the slit position as the vacuum environment test position of the slit plate; building an actual collimator according to the vacuum environment test position of the slit plate, and building an actual imaging system according to the design parameters of the imaging system in the air environment; building an actual adjustment and measurement optical path according to the actual collimator and the actual imaging system; performing focal plane adjustment and transmission function measurement of the actual adjustment and measurement optical path in an air environment, and using the focal plane adjustment result and the transmission function measurement result as the focal plane adjustment result and the transmission function measurement result of the imaging system in a vacuum environment.

[0009] The imaging system testing method proposed in the present invention also has the following additional technical features:

[0010] According to one embodiment of the present invention, the mathematical model of the internal calibration timing target radiation characteristic measurement device is obtained according to the following formula: the imaging system includes an objective lens assembly.

[0011] According to an embodiment of the present invention, the slit size of the slit plate corresponds to the angular resolution of the imaging system.

[0012] According to an embodiment of the present invention, the design parameters of the imaging system include: focal plane position.

[0013] The second aspect of the present invention proposes a testing device for an imaging system, comprising: a design module, which is used to perform air environment imaging design and vacuum environment imaging design of the imaging system; a simulation module, which is used to establish a simulation test light path of a collimator in an air environment according to the focal length of the collimator in an actual environment, and add the design parameters of the imaging system in the vacuum environment to the simulation test light path of the collimator in the air environment, wherein the collimator comprises: a parabolic reflector, a plane reflector, a slit plate and a light source; an adjustment module, which is used to adjust the slit position of the slit plate in the simulation test light path until the focal length of the collimator is within the actual environment. When the image of the light emitted by the collimator coincides with the focal plane, the slit position is used as the vacuum environment test position of the slit plate; a building module, the building module is used to build an actual collimator according to the vacuum environment test position of the slit plate, build an actual imaging system according to the design parameters of the imaging system in the air environment, and build an actual adjustment and measurement optical path according to the actual collimator and the actual imaging system; a measuring module, the measuring module is used to perform focal plane adjustment and transfer function measurement of the actual adjustment and measurement optical path in the air environment, and use the focal plane adjustment result and the transfer function measurement result as the focal plane adjustment result and the transfer function measurement result of the imaging system in the vacuum environment.

[0014] The imaging system testing device of the present invention also has the following additional technical features:

[0015] According to one embodiment of the present invention, the imaging system comprises an objective lens assembly.

[0016] According to an embodiment of the present invention, the slit size of the slit plate corresponds to the angular resolution of the imaging system.

[0017] According to an embodiment of the present invention, the design parameters of the imaging system include: focal plane position.

[0018] The present invention has the following beneficial effects:

[0019] The present invention first determines the best image plane of the optical system in a vacuum environment through simulation, and keeps it fixed. According to the focal length of the collimator during actual measurement, a measurement optical path is built in the simulation software, the imaging system and the collimator are placed in the simulation optical path, and the slit position of the collimator is adjusted to make the optical system have the best slit imaging effect. At this time, the slit position of the collimator can be used as a reference to complete the focal plane adjustment and transmission function test of the optical system in a vacuum environment under air conditions. In this way, the focal plane adjustment and transmission function test results of the imaging system in a vacuum environment can be obtained in an air environment without adding other equipment or components, effectively reducing the difficulty of adjustment and testing of the imaging system in a vacuum environment, improving efficiency, and ensuring accurate results. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 is a flow chart of a method for testing an imaging system according to an embodiment of the present invention;

[0021] Figure 2 is a schematic diagram of the structure of the adjustment and measurement optical path according to an embodiment of the present invention;

[0022] Figure 3 FIG. 4 is a block diagram of a testing device for an imaging system according to an embodiment of the present invention. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0024] The following is a description of a testing method for an imaging system and a testing device for an imaging system provided in an embodiment of the present invention in conjunction with the accompanying drawings.

[0025] Figure 1 FIG. 1 is a flow chart of a method for testing an imaging system according to an embodiment of the present invention. Figure 1 As shown, the method comprises the following steps:

[0026] S1, carry out air environment imaging design and vacuum environment imaging design of the imaging system.

[0027] Specifically, Figure 2 As shown, the imaging system 200 includes: an objective lens assembly 210. The design parameters for imaging design of the imaging system include: lens data, material parameters, etc., such as the focal plane position. Figure 2 , 220 represents the focal plane position of the imaging system in a vacuum environment, and 230 represents the focal plane position of the imaging system in an air environment.

[0028] S2, establishing a collimator simulation test light path in an air environment according to the focal length of the collimator in an actual environment, wherein the collimator includes: a parabolic reflector, a plane reflector, a slit plate and a light source.

[0029] Specifically, Figure 2 As shown, the collimator 100 includes: a parabolic reflector 110, a plane reflector 120, a slit plate and a light source 150. Figure 2130 is the test position of the slit plate in the air environment, and 140 is the test position of the slit plate in the vacuum environment. The light source 150 can emit visible light or infrared light to illuminate the slit plate. Figure 2 The simulated test light path of the collimator 100 in an air environment is shown.

[0030] S3, adding the design parameters of the imaging system in the vacuum environment into the collimator simulation test light path in the air environment.

[0031] Specifically, in the simulation software, the design parameters (lens data, material parameters, etc.) of the imaging system under vacuum environment in step S1 are added to the parallel light tube simulation test light path under air environment to form Figure 2 Simulation test optical path.

[0032] S4, adjusting the slit position of the slit plate in the simulation test light path until the image of the light emitted by the collimator coincides with the focal plane, and using the slit position as the vacuum environment test position of the slit plate.

[0033] Specifically, in the simulation test software, the front and rear positions of the slit of the collimator are set as variables, and the slit position of the slit plate is adjusted so that the imaging of the light emitted by the collimator coincides with the focal plane, and the slit plate vacuum environment test position 140 is obtained, which is the slit position when the imaging system is in the optimal imaging state under a vacuum environment.

[0034] S5, build an actual collimator according to the vacuum environment test position of the slit plate, and build an actual imaging system according to the design parameters of the imaging system in the air environment.

[0035] S6, build the actual adjustment and measurement optical path according to the actual collimator and the actual imaging system.

[0036] Specifically, the slit plate is placed at the slit plate vacuum environment test position 140 obtained in step S4, an actual collimator 100 is constructed, and an actual imaging system 200 is constructed according to the design parameters of the imaging system in the air environment in step S1, forming a Figure 2 The actual installation and measurement optical path are shown.

[0037] S7, performing actual adjustment and measurement of the focal plane adjustment and transmission function measurement of the optical path in an air environment, and using the focal plane adjustment results and transmission function measurement results as the focal plane adjustment results and transmission function measurement results of the imaging system in a vacuum environment.

[0038] Specifically, the actual adjustment and measurement optical path of S6 can be used to perform focal plane adjustment and full-field transmission function measurement in an air environment. The adjustment and measurement results are the focal plane adjustment results and transmission function measurement results of the imaging system 200 in a vacuum environment.

[0039] In an embodiment of the present invention, the slit size of the slit plate corresponds to the angular resolution of the imaging system.

[0040] In summary, according to the testing method of the imaging system of the embodiment of the present invention, the best image plane of the optical system in a vacuum environment is first determined by simulation and kept fixed. According to the focal length of the collimator during actual measurement, a measurement optical path is built in the simulation software, the imaging system and the collimator are placed in the simulation optical path, and the slit position of the collimator is adjusted to make the optical system have the best imaging effect on the slit. At this time, the slit position of the collimator can be used as a reference to complete the focal plane adjustment and transmission function test of the optical system in a vacuum environment under air conditions. In this way, the focal plane adjustment and transmission function test results of the imaging system in a vacuum environment can be obtained in an air environment without adding other equipment or components, effectively reducing the difficulty of adjustment and testing of the imaging system in a vacuum environment, improving efficiency, and ensuring accurate results.

[0041] Corresponding to the above-mentioned imaging system testing method, the present invention also provides an imaging system testing device. Since the device embodiment of the present invention corresponds to the above-mentioned method embodiment, details not disclosed in the device embodiment can be referred to the above-mentioned method embodiment, and will not be repeated in the present invention.

[0042] Figure 3 is a block diagram of a testing device for an imaging system according to an embodiment of the present invention. Figure 3 As shown, the device includes: a design module 1, a simulation module 2, an adjustment module 3, a construction module 4 and a measurement module 5.

[0043] Among them, the design module 1 is used to perform air environment imaging design and vacuum environment imaging design of the imaging system; the simulation module 2 is used to establish a collimator simulation test optical path in the air environment according to the focal length of the collimator in the actual environment, and add the design parameters of the imaging system in the vacuum environment to the collimator simulation test optical path in the air environment, wherein the collimator includes: a parabolic reflector, a plane reflector, a slit plate and a light source; the adjustment module 3 is used to adjust the slit position of the slit plate in the simulation test optical path until the imaging of the light emitted by the collimator coincides with the focal plane, and the slit position is used as the vacuum environment test position of the slit plate; the construction module 4 is used to build an actual collimator according to the vacuum environment test position of the slit plate, build an actual imaging system according to the design parameters of the imaging system in the air environment, and build an actual adjustment and measurement optical path according to the actual collimator and the actual imaging system; the measurement module 5 is used to perform focal plane adjustment and transmission function measurement of the actual adjustment and measurement optical path in the air environment, and use the focal plane adjustment results and the transmission function measurement results as the focal plane adjustment results and the transmission function measurement results of the imaging system in the vacuum environment.

[0044] According to one embodiment of the present invention, an imaging system includes an objective lens assembly.

[0045] According to one embodiment of the present invention, the slit size of the slit plate corresponds to the angular resolution of the imaging system.

[0046] According to an embodiment of the present invention, the design parameters of the imaging system include: focal plane position.

[0047] According to the testing device of the imaging system of the embodiment of the present invention, the best image plane of the optical system in a vacuum environment is first determined by simulation and kept fixed. According to the focal length of the collimator during actual measurement, a measurement optical path is built in the simulation software, the imaging system and the collimator are placed in the simulation optical path, and the slit position of the collimator is adjusted to achieve the best imaging effect of the optical system on the slit. At this time, the slit position of the collimator can be used as a reference to complete the focal plane adjustment and transmission function test of the optical system in a vacuum environment under air conditions. In this way, the focal plane adjustment and transmission function test results of the imaging system in a vacuum environment can be obtained in an air environment without adding other equipment or components, effectively reducing the difficulty of adjustment and testing of the imaging system in a vacuum environment, improving efficiency, and ensuring accurate results.

[0048] In the description of the present invention, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. "Multiple" means two or more, unless otherwise clearly and specifically defined.

[0049] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, unless they are contradictory.

[0050] Any process or method description in a flowchart or otherwise described herein may be understood to represent a module, segment or portion of code comprising one or more executable instructions for implementing the steps of a custom logical function or process, and the scope of the preferred embodiments of the present invention includes alternative implementations in which functions may not be performed in the order shown or discussed, including performing functions in a substantially simultaneous manner or in reverse order depending on the functions involved, which should be understood by those skilled in the art to which the embodiments of the present invention belong.

[0051] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as an ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute the instructions), or in combination with these instruction execution systems, devices or apparatuses. For the purpose of this specification, "computer-readable medium" can be any device that can contain, store, communicate, propagate or transmit a program for use by an instruction execution system, device or apparatus, or in combination with these instruction execution systems, devices or apparatuses. More specific examples of computer-readable media (a non-exhaustive list) include the following: an electrical connection with one or more wires (electronic device), a portable computer disk box (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), a fiber optic device, and a portable compact disk read-only memory (CDROM). In addition, the computer-readable medium may even be paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium and then editing, interpreting or processing in other suitable ways if necessary, and then stored in a computer memory.

[0052] It should be understood that the various parts of the present invention can be implemented by hardware, software, firmware or a combination thereof. In the above-mentioned embodiments, a plurality of steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0053] A person skilled in the art may understand that all or part of the steps in the method for implementing the above-mentioned embodiment may be completed by instructing related hardware through a program, and the program may be stored in a computer-readable storage medium, which, when executed, includes one or a combination of the steps of the method embodiment.

[0054] In addition, each functional unit in each embodiment of the present invention may be integrated into a processing module, or each unit may exist physically separately, or two or more units may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of a software functional module. If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it may also be stored in a computer-readable storage medium.

[0055] The storage medium mentioned above can be a read-only memory, a magnetic disk or an optical disk, etc.

[0056] Although the embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and are not to be construed as limitations of the present invention. A person skilled in the art may change, modify, replace and vary the above embodiments within the scope of the present invention.

Claims

1. A method for testing an imaging system, characterized in that: The following steps are involved: Performing air environment imaging design and vacuum environment imaging design of the imaging system; Establishing a collimator simulation test optical path in an air environment according to the focal length of the collimator in an actual environment, wherein the collimator includes: a parabolic reflector, a plane reflector, a slit plate and a light source; Adding the design parameters of the imaging system in the vacuum environment to the collimator simulation test light path in the air environment; Adjusting the slit position of the slit plate in the simulation test light path until the image of the light emitted by the collimator coincides with the focal plane, and using the slit position as the vacuum environment test position of the slit plate; Building an actual collimator according to the vacuum environment test position of the slit plate, and building an actual imaging system according to the design parameters of the imaging system in the air environment; Building an actual adjustment and measurement optical path according to the actual collimator and the actual imaging system; The focal plane adjustment and transmission function measurement of the actual adjustment and measurement optical path are performed in an air environment, and the focal plane adjustment results and transmission function measurement results are used as the focal plane adjustment results and transmission function measurement results of the imaging system in a vacuum environment.

2. The imaging system testing method according to claim 1, characterized in that: The imaging system includes an objective lens assembly.

3. The imaging system testing method according to claim 1, characterized in that: The slit size of the slit plate corresponds to the angular resolution of the imaging system.

4. The imaging system testing method according to claim 1, characterized in that: The design parameters of the imaging system include: focal plane position.

5. A testing device for an imaging system, characterized in that: include: A design module, the design module is used to perform air environment imaging design and vacuum environment imaging design of the imaging system; A simulation module, wherein the simulation module is used to establish a simulation test light path of a collimator under an air environment according to the focal length of the collimator under an actual environment, and add the design parameters of the imaging system under the vacuum environment to the simulation test light path of the collimator under the air environment, wherein the collimator includes: a parabolic reflector, a plane reflector, a slit plate and a light source; An adjustment module, the adjustment module is used to adjust the slit position of the slit plate in the simulation test light path until the image of the light emitted by the collimator coincides with the focal plane, and the slit position is used as the vacuum environment test position of the slit plate; A building module, wherein the building module is used to build an actual collimator according to the vacuum environment test position of the slit plate, build an actual imaging system according to the design parameters of the imaging system in the air environment, and build an actual adjustment and measurement optical path according to the actual collimator and the actual imaging system; A measuring module is used to perform the focal plane adjustment and transfer function measurement of the actual adjustment and the measuring optical path in an air environment, and use the focal plane adjustment results and transfer function measurement results as the focal plane adjustment results and transfer function measurement results of the imaging system in a vacuum environment.

6. The imaging system testing device according to claim 5, characterized in that: The imaging system includes an objective lens assembly.

7. The imaging system testing method according to claim 5, characterized in that: The slit size of the slit plate corresponds to the angular resolution of the imaging system.

8. The imaging system testing device according to claim 5, characterized in that: The design parameters of the imaging system include: focal plane position.

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