Connecting device for testing and testing system

Abstract

The embodiment of the invention relates to the technical field of product testing, and discloses a connecting device for testing and a testing system. The connecting device for testing comprises a base, a pin assembly and an adapter. The base is provided with a positioning structure. The pin assembly comprises a plurality of test pins, the first end of each test pin is used for being connected to a port to be tested, the second end of each test pin is provided with a shell, and the shell is detachably connected with the base and can move along the positioning structure. The adapter comprises an adapter connector and transmission cables in one-to-one correspondence with the plurality of test pins, one ends of the plurality of transmission cables are electrically connected to the adapter connector, the other ends of the plurality of transmission cables are electrically connected with the second ends of the corresponding test pins, and the adapter connector is used for being connected with test equipment. According to the test connecting device and the test system provided by the embodiment of the invention, the test cable can be prevented from being wrongly connected, and the wiring efficiency is improved.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of product testing technology, and in particular to a testing connection device and a testing system. Background Art

[0002] With the continuous development of electronic technology, various products are increasingly equipped with electronic devices, and the application of these electronic devices has enriched the automation functions of products. The use of electronic devices can help realize the automatic control of products. For example, elevators are equipped with elevator control cabinets, which can send instructions to the elevator drive device to accurately control the up and down movements, running speed and other working states of the elevator.

[0003] The normal use of these products using electronic devices is inseparable from professional electrical function testing, which ensures that the functions of the relevant components of the product are normal and the program is correct. During the test, the tester needs to connect the test cable to the corresponding interface in the product before starting the functional test. Since there are many and complicated test cables, wrong connection may occur, and the wiring efficiency is low. Therefore, how to avoid wrong connection of test cables and improve wiring efficiency is an important issue. Summary of the invention

[0004] The purpose of the embodiments of the present application is to provide a test connection device and a test system, which can help avoid incorrect connection of test cables and improve wiring efficiency.

[0005] In order to solve the above technical problems, the embodiments of the present application provide a test connection device. The test connection device includes a base, a pin assembly and an adapter. The base is provided with a positioning structure. The pin assembly includes a plurality of test pins, the first end of each test pin is used to connect to the port to be tested, and the second end of each test pin is provided with a shell, which is detachably connected to the base and can move along the positioning structure. The adapter includes an adapter connector and transmission cables corresponding to the plurality of test pins one by one, one end of the plurality of transmission cables is electrically connected to the adapter connector, and the other end of the plurality of transmission cables is electrically connected to the second end of the corresponding test pin, and the adapter connector is used to connect the test equipment.

[0006] The embodiment of the present application further provides a test system, which includes a test device and the above-mentioned test connection device, wherein the adapter connector of the adapter of the test connection device is connected to the test device.

[0007] The test connection device and test system provided by the embodiments of the present application adopt the form of cooperation between the test pin and the adapter, and the test pin can be connected to the test equipment through the adapter. At the same time, the test pin can be inserted into the port to be tested, and then the product to be tested can be connected to the test circuit for specific testing. The position of the test pin can be adjusted and fixed by the base, and the test pins can be integrated from a scattered state, and the relative position relationship of the test pins can be located. This improves the wiring efficiency and can avoid connecting the wrong test cable.

[0008] In some embodiments, the base includes a first surface and a second surface that are arranged opposite to each other, the positioning structure includes a groove body that is recessed from the first surface toward the second surface, and a limiting portion that limits the movement of the shell in a direction perpendicular to the first surface, and at least a portion of the shell is located in the groove body and abuts against the limiting portion. In this way, by forming a positioning structure in the form of a groove, it is convenient to achieve a detachable connection between the shell and the base, and limit the shell on the base.

[0009] In some embodiments, the slot body penetrates the base in a first direction parallel to the first surface, the housing includes a main body and a clamping portion connected to each other, the main body is connected to the test pin, the clamping portion is clamped into the slot body and is limited in the slot body by the limiting portion. In this way, the slot body can form a penetrating structure, which can facilitate the clamping portion of the housing to be clamped into the slot body and removed from the slot body.

[0010] In some embodiments, a plurality of positioning recesses distributed along a first direction are provided in the groove body, and the housing includes a locking portion connected to the main body and capable of elastic deformation, the locking portion can cooperate with the positioning recesses to limit the movement position of the housing, and can move between different positioning recesses under elastic deformation. In this way, the installation position of the housing on the base can be effectively fixed by the cooperation between the locking portion and the positioning recesses.

[0011] In some embodiments, the locking portion includes a first part and a second part connected to each other, the first part is connected to the main body, the second part and the main body are spaced apart, a positioning protrusion is provided at the edge of the second part away from the first part, the positioning protrusion is located on the side of the second part away from the main body, and the positioning protrusion can be inserted into different positioning recesses during the movement. In this way, by forming a cantilever beam structure, the locking portion can be easily elastically deformed, thereby reducing the resistance when the housing is moved.

[0012] In some embodiments, there are multiple slots and multiple engaging portions, and the multiple slots are spaced apart from each other in the second direction, the second direction is perpendicular to the first direction, and the housing is provided with a clearance area corresponding to the spacing area between two adjacent slots. In this way, the structural stability of the housing and the slots when they are matched can be improved by forming multiple engaging areas.

[0013] In some embodiments, the housing is provided with a receiving cavity and a cover body that closes the receiving cavity, each test pin includes a conductor and an insulating layer that is encapsulated around the conductor and exposes a first end and a second end, the insulating layer is connected to the housing, the second end is located in the receiving cavity, and one end of the transmission cable corresponding to the test pin is inserted into the receiving cavity and connected to the second end. In this way, a relatively closed environment can be provided for the junction area between the end of the test pin and the transmission cable through the receiving cavity.

[0014] In some embodiments, there are multiple bases, each of which is provided with at least one splicing position, each of which is provided with a splicing column or a splicing hole, and the positioning column of one of any two bases can be inserted into the mounting hole of the other to splice together. In this way, the number of test pins can be expanded by splicing multiple bases.

[0015] In some embodiments, the adapter is provided with signal lights corresponding to the plurality of test pins one by one, so that the test situation can be indicated by the signal lights. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] One or more embodiments are exemplarily described by pictures in the corresponding drawings, and these exemplified descriptions do not constitute limitations on the embodiments. Elements with the same reference numerals in the drawings represent similar elements, and unless otherwise stated, the figures in the drawings do not constitute proportional limitations.

[0017] Figure 1 is a schematic diagram of the structure of a test connection device provided in some embodiments of the present application;

[0018] Figure 2 is a schematic structural diagram of a test connection device provided in some embodiments of the present application from another perspective;

[0019] Figure 3 is a schematic diagram of the structure of a test connection device provided in other embodiments of the present application;

[0020] Figure 4 is a schematic diagram of the three-dimensional structure of a base in a test connection device provided in some embodiments of the present application;

[0021] Figure 5 It is a schematic diagram of the connection structure between the test pin and the transmission cable in the test connection device provided in some embodiments of the present application;

[0022] Figure 6 is a schematic diagram of the connection structure between a test pin and a transmission cable in a test connection device provided in some embodiments of the present application from another perspective;

[0023] Figure 7It is a schematic diagram of the matching structure of the test pin and the transmission cable in the test connection device provided in some embodiments of the present application;

[0024] Figure 8 is a schematic cross-sectional view of the connection between a test pin and a transmission cable in a test connection device provided in some embodiments of the present application;

[0025] Fig. 9 It is a schematic diagram of the splicing structure of the base in the test connection device provided in some embodiments of the present application;

[0026] Fig.10 is a schematic diagram of the three-dimensional structure of an adapter in a test connection device provided in some embodiments of the present application;

[0027] Fig.11 is a schematic diagram of the internal structure of an adapter in a test connection device provided in some embodiments of the present application;

[0028] Fig.12 is a schematic diagram of the three-dimensional structure of the test connection device provided by some embodiments of the present application when in use;

[0029] Fig.13 It is a schematic diagram of the three-dimensional structure of the test connection device provided in other embodiments of the present application when in use. DETAILED DESCRIPTION

[0030] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, each embodiment of the present application will be described in detail below in conjunction with the accompanying drawings. However, it will be appreciated by those skilled in the art that in each embodiment of the present application, many technical details are proposed in order to enable the reader to better understand the present application. However, even without these technical details and various changes and modifications based on the following embodiments, the technical scheme claimed in the present application can also be implemented. The division of the following embodiments is for the convenience of description, and the specific implementation of the present application should not constitute any limitation, and the various embodiments can be combined with each other and referenced to each other without contradiction.

[0031] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0032] In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installed", "connected", "connected" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the embodiments of the present application can be understood according to the specific circumstances.

[0033] The normal use of the product is inseparable from the testing process. By executing rigorous test items, we can know the operation status and potential risks of the product. Especially some products related to public safety, such as elevators. Elevators are controlled by elevator control cabinets. The elevator control cabinet is the "brain" of the elevator, responsible for controlling the start and stop and operation status of the elevator, and providing power and control signals to the traction machine. As the electrical device and signal control center of the elevator, the elevator control cabinet has the main functions of operation control and drive control. By sending instructions to the elevator drive device, the control cabinet can accurately control the up and down movement, running speed, etc. of the elevator to ensure that the elevator runs in the predetermined direction and speed. The control cabinet is connected to various electrical devices for real-time monitoring of key parameters such as the position, speed, load, door status, etc. of the elevator. There are also various safety protection devices, such as overload protection, fault protection, electrical protection, etc. Once the elevator has an abnormal situation, such as overload, door not closed, etc., the control cabinet will automatically detect and take corresponding protection measures, such as stopping the elevator operation, issuing alarm signals, etc., to ensure the safety of personnel and elevators.

[0034] Before the elevator control cabinet leaves the factory, it needs to undergo professional electrical function testing to ensure that the relevant components of the control cabinet function normally and the program is correct. The tester must first connect the power harness and various signal harnesses of the test bench to the corresponding interfaces in the control cabinet before starting the functional test.

[0035] Since the configurations of various control cabinets are different, the sizes of their ports are also different, and it is difficult to unify the ports. The power harness from the test bench is usually bare wire. Testers need to connect the bare wires one by one to the ports of the terminals or circuit breakers and other components in the cabinet according to the terminal definitions on the control cabinet. This wiring method is inefficient and prone to the risk of wrong connection. It is necessary to find a safe and fast connection solution.

[0036] In order to facilitate product testing, some embodiments of the present application provide a test connection device. The connection device is provided with an adapter to connect the test equipment, transmit the signal emitted by the test equipment and transmit the signal to the test equipment. At the same time, the connection device includes a plurality of test pins, and the test pins can be inserted into the test ports on the product to be tested to connect the product to be tested to the test circuit. Both the test pins and the adapter can be replaced, and the type of the test pin and the position on the base can be adjusted according to the type of the product to be tested. In addition, a corresponding relationship is formed between the test pin and the adapter connector port of the adapter, which is conducive to avoiding the risk of wrong connection and improving wiring efficiency.

[0037] Combine the following Figures 1 to 13 The structure of the test connection device provided in some embodiments of the present application is described.

[0038] like Figures 1 to 13 As shown, a test connection device provided by some embodiments of the present application includes a base 11, a pin assembly and an adapter 14. The base 11 is provided with a positioning structure. The pin assembly includes a plurality of test pins 12, the first end 121 of each test pin 12 is used to connect to the port to be tested, and the second end 122 of each test pin 12 is provided with a shell 13, and the shell 13 is detachably connected to the base 11 and can be moved along the positioning structure. The adapter 14 includes an adapter connector 141 and transmission cables 142 corresponding to the plurality of test pins 12 one by one, one end of the plurality of transmission cables 142 is electrically connected to the adapter connector 141, and the other end of the plurality of transmission cables 142 is electrically connected to the second end 122 of the corresponding test pin 12, and the adapter connector 141 is used to connect the test equipment.

[0039] The base 11 provides a basis for fixing the test pins 12. After selecting the type of the test pins 12, the test pins 12 required for testing the product to be tested can be connected to the base 11. At the same time, the base 11 is provided with a positioning structure, which can be set in the form of a groove, or a through hole, or a combination of a groove and a through hole. It is convenient to adjust the positional relationship between the test pins 12 on the base 11 so that the position of each test pin 12 corresponds to the position of the test port of the product to be tested. During the test, each test pin 12 is inserted into the test port at the corresponding position, and the product to be tested can be connected to the test loop to perform the corresponding test items.

[0040] The pin assembly matches the product to be tested, that is, for a certain product to be tested, a corresponding type of test pin 12 can be selected. For example, when testing a circuit breaker, the corresponding test pin 12 can be selected as a right-angle bent pin. When testing the terminals of an elevator control cabinet, the corresponding test pin 12 can be selected as a straight pin. At the same time, the number of test pins 12 can be selected according to the number of ports required for access to the test. For example, when three test ports of the product to be tested need to be accessed, three test pins 12 can be selected. When more than three test ports of the product to be tested need to be counted, the number of test pins 12 can be increased accordingly. In addition, each test pin 12 is equipped with a housing 13, which can cooperate with the base 11 so that the test pins 12 required for the test can be installed on the base 11, and the positional relationship of each test pin 12 on the base 11 can be adjusted to smoothly connect the test pin 12 to the corresponding port to be tested to avoid wrong insertion. In actual situations, the cross-section of the test pin 12 may be a regular shape such as a rectangle or a circle, or an irregular shape. Each test pin 12 may have the same cross-sectional shape or different cross-sectional shapes.

[0041] The adapter 14 is the part that is connected to the test equipment. The adapter 14 has an adapter connector 141, which can match with the attachment connector 211 of the connector 21 led out from the test equipment, so as to achieve connection with the test end. The adapter connector 141 on the adapter 14 and the attachment connector 211 of the connector 21 can be in the form of a standard plug and socket. At the same time, the adapter 14 and the test pins 12 can be replaced or combined, so that different numbers of test pins 12 or different types of test pins 12 can be used in corresponding test items.

[0042] The test connection device provided in some embodiments of the present application adopts the form of a test pin 12 and an adapter 14, and the test pin 12 can be connected to the test equipment through the adapter 14. At the same time, the test pin 12 can be inserted into the port to be tested, and then the product to be tested can be connected to the test loop for specific testing. The position of the test pin 12 can be adjusted and fixed by the base 11, and the test pins 12 are integrated from a scattered state, and the relative position relationship of the test pins 12 is located. This improves the wiring efficiency and can avoid connecting the wrong test cable.

[0043] like Figure 4 As shown, the base 11 may include a first surface 101 and a second surface 102 that are arranged opposite to each other, the positioning structure includes a groove body 111 that is recessed from the first surface 101 toward the second surface 102, and a limiting portion 112 that limits the movement of the shell 13 in a direction vertical to the first surface 101, and at least a portion of the shell 13 is located in the groove body 111 and abuts against the limiting portion 112.

[0044] The first surface 101 and the second surface 102 are two surfaces with larger areas in the base 11, which can provide sufficient area for the setting of the positioning structure. At the same time, the positioning structure can be set in the form of a groove. The shell 13 set on the test pin 12 can cooperate with the positioning structure on the base 11. On the one hand, the shell 13 can be engaged with the positioning structure in the form of a groove, so as to be installed on the base 11. On the other hand, the shell 13 can move relative to the groove, so as to adjust the relative position relationship between the test pins 12.

[0045] The engagement between the housing 13 and the slot 111 can be achieved through the limiting portion 112. The limiting portion 112 can be arranged at a position of the slot 111 close to the first surface 101. After the housing 13 is inserted into the slot 111, the limiting portion 112 can limit the housing 13 from being separated from the slot 111.

[0046] like Figure 4 As shown, in the flat-plate-shaped base 11, a slot 111 extending in the length direction is provided. A limiting protrusion is formed on the inner wall surface of the slot 111, and the limiting protrusion reduces the cross-sectional width of the slot 111 at a position close to the first surface 101, so that after the shell 13 is connected to the base 11, the movement of the shell 13 in a direction perpendicular to the first surface 101 is limited. In actual situations, the base 11 can be set to a regular shape such as a flat plate, or it can be set to an irregular special-shaped shape.

[0047] In addition, the slot body 111 can penetrate the base 11 in a first direction parallel to the first surface 101, and the shell 13 includes a connected main body 131 and a clamping portion 132, the main body 131 is connected to the test pin 12, and the clamping portion 132 is clamped into the slot body 111 and restricted in the slot body 111 by the limiting portion 112.

[0048] like Figure 4As shown, the slot body 111 is in a through shape in the length direction of the base 11, that is, the housing 13 can enter the slot body 111 from any end of the slot body 111, and then engage with the slot body 111. The main body 131 is the main part of the housing 13, which can be used to engage the test pin 12 with the transmission cable 142. The engaging portion 132 is the part of the housing 13 that engages with the slot body 111, and the engaging portion 132 is adapted to the shape of the slot body 111. The engaging portion 132 includes a portion extending along the depth direction of the slot body 111 and a portion abutting against the limiting portion 112. After entering the slot body 111, the engaging portion 132 can adjust its position and can be fixed on the base 11 after adjustment. The position of the engaging portion 132 can be adjusted according to the position of the port to be tested where the test pin 12 needs to be inserted, and at the same time, the relative position relationship of each test pin 12 can be adjusted according to the relative position relationship between the ports to be tested where the test pin 12 needs to be inserted.

[0049] The slot body 111 provides a directional guide for the position adjustment of the housing 13, and the housing 13 can be moved under the guidance of the slot body 111. In this way, the position adjustment of the test pin 12 can be facilitated, and when the test pin 12 needs to be replaced, the original test pin 12 can be removed and a new test pin 12 can be installed.

[0050] In some embodiments, a plurality of positioning recesses 113 distributed along a first direction may be provided in the groove body 111, and the shell 13 includes a locking portion 133 connected to the main body 131 and capable of elastic deformation. The locking portion 133 may cooperate with the positioning recess 113 to limit the moving position of the shell 13, and may move between different positioning recesses 113 under elastic deformation.

[0051] The positioning recesses 113 may be arranged in a uniform or uneven distribution. There is a gap between two adjacent positioning recesses 113, and each positioning recess 113 may define the position of the housing 13. The locking portion 133 of the housing 13 may cooperate with the positioning recess 113 to complete the position locking. This prevents the test pin 12 from shaking during the test. At the same time, the locking portion 133 of the housing 13 may be elastically deformed under the action of an external force, thereby changing the position between the positioning recesses 113, and further adjusting the relative position relationship between the test pins 12.

[0052] like Figure 5 and Figure 6As shown, the locking portion 133 of the shell 13 may include a first part 1331 and a second part 1332 that are connected. The first part 1331 is connected to the main body 131. There is a gap between the second part 1332 and the main body 131. A positioning protrusion 1333 is provided at the edge of the second part 1332 away from the first part 1331. The positioning protrusion 1333 is located on a side of the second part 1332 away from the main body 131. The positioning protrusion 1333 can be stuck in different positioning recesses 113 during the movement.

[0053] The first portion 1331 is the portion where the locking portion 133 is connected to the main body 131, thereby forming an integral structure with the main body 131. The second portion 1332 is the portion where the locking portion 133 is not directly constrained. At the same time, there is a gap between the second portion 1332 and the main body 131, and the second portion 1332 can move toward or away from the main body 131 when elastic deformation occurs, so that the positioning protrusion 1333 provided on the second portion 1332 can change position between each positioning recess 113.

[0054] The first part 1331 and the second part 1332 form a cantilever beam structure as a whole. When an external force acts, the locking part 133 undergoes elastic deformation and moves toward the direction close to the main body 131, forming a compressed state. When the positioning protrusion 1333 reaches the appropriate position and engages with the corresponding positioning recess 113, the locking part 133 also restores a certain degree of elastic deformation, and then stably engages with the groove 111 of the base 11. Through the cooperation between the positioning protrusion 1333 and the positioning recess 113, the position of the housing 13 on the base 11 can be stabilized, thereby preventing the test pin 12 from changing its position along the groove 111 at will due to lack of fixation, thereby avoiding affecting the normal test process.

[0055] In some embodiments, there may be multiple slots 111 and snap-fitting portions 132 , and the multiple slots 111 are spaced apart from each other in a second direction, the second direction is perpendicular to the first direction, and the shell 13 is provided with a yield area 134 corresponding to the spacing area between two adjacent slots 111 .

[0056] That is to say, more than two slots 111 can be provided, and at the same time, more than two engaging portions 132 can be provided on the shell 13. By increasing the matching area between the base 11 and the shell 13, the structural stability when the base 11 and the shell 13 are connected can be improved, thereby ensuring the stability of the test pin 12 when it is inserted into the port to be tested. For example, two slots 111 can be provided on the base 11, and the limiting portions 112 are provided on the inner wall surfaces of the two slots 111. The shell 13 is provided with two corresponding engaging portions 132, and a locking portion 133 is formed between the two engaging portions 132. The two engaging portions 132 can be engaged with the corresponding slots 111. At the same time, the locking portion 133 can enter into one of the slots 111 and cooperate with the positioning recess 113 in one of the slots 111, thereby realizing a relatively stable detachable connection between the shell 13 and the slot 111.

[0057] In some embodiments, the shell 13 may be provided with a accommodating cavity 135 and a cover 136 that closes the accommodating cavity 135. Each test pin 12 includes a conductor 123 and an insulating layer 124 that is encapsulated around the conductor 123 and exposes the first end 121 and the second end 122. The insulating layer 124 is connected to the shell 13. The second end 122 is located in the accommodating cavity 135. One end of the transmission cable 142 corresponding to the test pin 12 is inserted into the accommodating cavity 135 and connected to the second end 122.

[0058] like Figure 7 and Figure 8 As shown, the accommodating cavity 135 can provide an accommodating space for the connection between the second end 122 of the test pin 12 and the transmission cable 142. In addition, the accommodating cavity 135 can be closed by a cover 136 to ensure that the connection area is protected from interference from the external environment.

[0059] In some embodiments, there may be multiple bases 11, each base 11 is provided with at least one splicing position, each splicing position is provided with a splicing column 114 or a splicing hole 115, and the positioning column of any two bases 11 can be inserted into the installation hole of the other and spliced ​​together.

[0060] That is to say, there can be multiple bases 11 to meet the installation of a large number of test pins 12. By splicing multiple bases 11 together, a longer slot 111 can be formed to expand the number of test pins 12. At the same time, the bases 11 can be spliced ​​together in the form of shaft hole matching. Fig. 9As shown, two bases 11 are spliced ​​together, and each base 11 is provided with a splicing hole 115 at one end in the length direction and a splicing column 114 at the other end. When the two bases 11 need to be combined together, the splicing column 114 on one base 11 is inserted into the splicing hole 115 on the other base 11. By splicing multiple bases 11 into a whole, the number of installed test pins 12 can be effectively expanded, so as to adapt to the use in the test scenario with more ports to be tested.

[0061] In some embodiments, Fig.10 As shown, the adapter 14 may be provided with signal lights 143 corresponding one-to-one to the plurality of test pins 12 .

[0062] In the actual test process, the current flow can be reflected by the signal light 143. The signal light 143 can be an LED (light emitting diode) light. The signal light 143 is connected to the circuit where the test pin 12 is located, and can effectively indicate the power supply status of the test pin 12, so that the tester can judge whether the test process is carried out accurately. Fig.11 As shown, the adapter includes a PCB (Printed Circuit Board) board 144, one side of the PCB board 144 is electrically connected to the adapter connector 141, and the other side of the PCB board 144 is electrically connected to the transmission cable 142. The overall structure of the adapter 14 is encapsulated by a housing 145.

[0063] The following is an example of the test connection device described above in combination with two test applications.

[0064] like Fig.12 As shown, when the wiring harness of the test bench is to be connected to the circuit breaker 31 of the control cabinet, the corresponding test pin 12 is selected as a right-angle bent pin. According to the number of wiring harnesses to be connected, select an equal number of pin assemblies, and install the pin assemblies into the base 11 along the guide groove of the base 11. Adjust the spacing of each test pin 12 so that the spacing of the test pins 12 is basically consistent with the spacing of the circuit breaker interface 311 on the circuit breaker 31. Circuit breakers 31 of different specifications have different spacings of the circuit breaker interface 311. The guide groove of the base 11 and the structure of the shell 13 on the test pin 12 facilitate the adjustment of the spacing between adjacent test pins 11, so that it can adapt to circuit breakers 31 of different sizes. The limit convex point structure of the shell 13 on the test pin 12 and the wavy limit structure of the base 11 cooperate with each other, and the beam deformation at the limit convex point of the shell 13 is stressed to generate corresponding resistance to prevent the shaking of the test pin 12.

[0065] After the circuit breaker interface 311 is connected to the test pin 12, the connector 21 led out of the test equipment can be connected to the adapter 14. The socket on the adapter 14 and the plug on the connector 21 are standard male and female plugs and sockets, which are convenient for plugging and unplugging. After the plug and socket are connected, the corresponding test operation can be performed. After the test is completed, the test bench harness is powered off and in a safe state. First unplug the connector 21 at the test end, then withdraw the test pin 12, and take it out together with the base 11, and then enter the test preparation work of the next control cabinet.

[0066] like Fig.13 As shown, when the wiring harness of the test bench is to be connected to the terminal 41 of the control cabinet, the corresponding test pin 12 is selected as a straight pin. According to the number of wiring harnesses that need to be connected, select an equal number of pin assemblies, and install the pin assemblies into the base 11 along the guide groove of the base 11. Adjust the spacing of the test pins 12 so that the spacing of the test pins 12 is basically consistent with the spacing of the terminal interface 411 of the terminal 41. Terminals 41 of different specifications have different spacings of the terminal interface 411. The guide groove of the base 11 and the structure of the shell 13 on the test pin 12 facilitate the adjustment of the spacing between adjacent test pins 12 so that it can adapt to terminals 41 of different sizes. The limiting convex point structure of the shell 13 on the test pin 12 and the wavy limiting structure of the base 11 cooperate with each other, and the beam deformation force at the limiting convex point of the shell 13 generates corresponding resistance to prevent the shaking of the test pin 12.

[0067] After the terminal interface 411 is connected to the test pin 12, the connector 21 led out of the test equipment can be connected to the adapter 14. The socket on the adapter 14 and the plug on the connector 21 are standard male and female plugs and sockets, which are convenient for plugging and unplugging. After the plug and socket are connected, the corresponding test operation can be performed. After the test is completed, the test bench harness is powered off and in a safe state. First unplug the connector 21 at the test end, then withdraw the test pin 12, and take it out together with the base 11, and then enter the test preparation work of the next control cabinet.

[0068] Some embodiments of the present application further provide a test system, which includes a test device and the above-mentioned test connection device, and the adapter connector 141 of the adapter 14 of the test connection device is connected to the test device.

[0069] When testing the product to be tested, the test equipment and the port to be tested can be connected through the above-mentioned test connection device. The test connection device includes a base 11, a replaceable pin assembly and a replaceable adapter 14. The base 11 has a structure that can adjust the spacing of the test pins 12. The test pins 12 are used to transmit test signals. The housing 13 provided at the end of the test pins 12 can be designed with a positioning structure and a limit locking structure. The adapter 14 is provided with a standard adapter connector 141, which can be adapted to the attachment connector 211 of the connector 21 led out of the test equipment, so as to connect the port to be tested to the test loop.

[0070] By adopting the above-mentioned test connection device, different types of circuit breakers, contactors and wiring terminals can be compatible. During the test process, there is no need to adjust the existing wiring of the elevator control cabinet. Compared with the existing bare wire connection, it has better protection effect and anti-misinsertion effect, and can improve the wiring efficiency. In addition, multiple groups of bases 11 can be used in combination to further improve the wiring efficiency.

[0071] Those skilled in the art will appreciate that the above-mentioned embodiments are specific examples for implementing the present application, and in actual applications, various changes may be made thereto in form and detail without departing from the spirit and scope of the present application.

Claims

1. A test connection device, characterized in that: include: A base is provided with a positioning structure; A pin assembly, comprising a plurality of test pins, wherein a first end of each of the test pins is used to connect to a port to be tested, and a second end of each of the test pins is provided with a housing, wherein the housing is detachably connected to the base and can move along the positioning structure; The adapter comprises an adapter connector and transmission cables corresponding to the plurality of test pins one by one, wherein one end of the plurality of transmission cables is electrically connected to the adapter connector, and the other end of the plurality of transmission cables is electrically connected to the second end of the corresponding test pins, and the adapter connector is used to connect the test equipment.

2. The test connection device according to claim 1, characterized in that: The base includes a first surface and a second surface arranged opposite to each other, the positioning structure includes a groove body recessed from the first surface toward the second surface, and a limiting portion limiting the movement of the shell in a direction vertical to the first surface, at least a portion of the shell is located in the groove body and abuts against the limiting portion.

3. The test connection device according to claim 2, characterized in that: The slot body penetrates the base in a first direction parallel to the first surface. The shell includes a main body and a clamping part connected to each other. The main body is connected to the test pin. The clamping part is clamped into the slot body and is restricted in the slot body by the limiting part.

4. The test connection device according to claim 3, characterized in that: A plurality of positioning recesses distributed along the first direction are arranged in the groove body, and the shell includes a locking portion connected to the main body and capable of elastic deformation. The locking portion can cooperate with the positioning recesses to limit the moving position of the shell, and can move between different positioning recesses under elastic deformation.

5. The test connection device according to claim 4, characterized in that: The locking portion includes a first part and a second part that are connected to each other, the first part is connected to the main body, the second part and the main body are spaced apart, a positioning protrusion is provided at an edge of the second part away from the first part, the positioning protrusion is located on a side of the second part away from the main body, and the positioning protrusion can be stuck in different positioning recesses during movement.

6. The test connection device according to claim 3, characterized in that: There are a plurality of the groove bodies and the engaging parts, and the plurality of the groove bodies are spaced apart from each other in a second direction, the second direction is perpendicular to the first direction, and the shell is provided with a clearance area corresponding to the spacing area between two adjacent groove bodies.

7. The test connection device according to claim 1, characterized in that: The shell is provided with a receiving cavity and a cover body closing the receiving cavity. Each of the test pins includes a conductor and an insulating layer encapsulated around the conductor and exposing the first end and the second end. The insulating layer is connected to the shell. The second end is located in the receiving cavity. One end of the transmission cable corresponding to the test pin is inserted into the receiving cavity and connected to the second end.

8. The test connection device according to claim 1, characterized in that: There are multiple bases, each of which is provided with at least one splicing position, and each of which is provided with a splicing column or a splicing hole. The positioning column of any two bases can be inserted into the installation hole of the other and spliced ​​together.

9. The test connection device according to claim 1, characterized in that: The adapter is provided with signal lights corresponding one-to-one to the plurality of test pins.

10. A testing system, characterized in that: The invention comprises a test device and a test connection device according to any one of claims 1 to 9, wherein an adapter connector of an adapter of the test connection device is connected to the test device.

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