A reliability test system for capacitors with multiple specifications

Abstract

The present application provides a reliability testing system for capacitors with multiple specifications, belonging to the field of capacitor technology. The system includes: an image acquisition module configured to acquire image information of a first capacitor to be tested and a second capacitor to be tested after receiving a capacitor test request; a first strategy configuration module configured to determine a first initial test strategy based on the image information of the first capacitor to be tested, and to determine a second initial test strategy based on the image information of the second capacitor to be tested; a second strategy configuration module configured to determine a target test strategy based on a multi-dimensional matching result of the first initial test strategy and the second initial test strategy; and a testing module configured to perform parallel testing on the first capacitor to be tested and the second capacitor to be tested according to the target test strategy to obtain test data for the first capacitor to be tested and the second capacitor to be tested. The present application aims to improve the problem of tedious and time-consuming reliability testing of capacitors with different specifications.

Description

Technical Field

[0001] The present application relates to the technical field of capacitors, and in particular to a reliability testing system for capacitors with multiple specifications. Background Art

[0002] Capacitor reliability testing involves evaluating a capacitor's long-term performance, lifespan, and failure modes through a series of experiments under specific environmental and stress conditions. Capacitors may be affected by varying degrees of temperature fluctuations, voltage stress, and frequent charge and discharge cycles during use. Therefore, reliability testing can help predict the stability and lifespan of capacitors under actual operating conditions.

[0003] Currently, for capacitors used in the rail transit field, due to the large differences in specifications and models of capacitors, testing can usually only be performed on capacitors of a single specification. Therefore, when there are many types of capacitors, the entire testing process is cumbersome and time-consuming. Summary of the Invention

[0004] The present invention provides a multi-specification capacitor reliability testing system, which adopts the following technical solutions:

[0005] In a first aspect, a multi-specification capacitor reliability testing system is provided, comprising:

[0006] an image acquisition module configured to acquire image information of a first capacitor to be tested and a second capacitor to be tested after receiving a capacitor test request, wherein the first capacitor to be tested and the second capacitor to be tested have different specifications;

[0007] A first strategy configuration module is configured to determine a first initial test strategy based on image information of a first capacitor to be tested, and to determine a second initial test strategy based on image information of a second capacitor to be tested;

[0008] A second strategy configuration module is configured to determine a target test strategy based on a multi-dimensional matching result of the first initial test strategy and the second initial test strategy;

[0009] The testing module is configured to perform parallel testing on the first capacitor to be tested and the second capacitor to be tested according to a target testing strategy to obtain test data of the first capacitor to be tested and the second capacitor to be tested.

[0010] In a feasible implementation, the image acquisition module includes:

[0011] A query submodule, configured to determine whether there is a first type tag matching the capacitor to be tested based on the model features in the image information, where the first type tag is used to identify the type of capacitor for which there is a historical test record;

[0012] A first determining submodule is configured to, when there is a first type tag matching the model feature, determine the first type tag as the type tag of the capacitor to be tested;

[0013] The second determining submodule is configured to determine a second type tag as the type tag of the capacitor to be tested if there is no first type tag matching the capacitor to be tested, wherein the second type tag is used to represent a capacitor type for which no historical test record exists.

[0014] In a feasible implementation, the first policy configuration module includes:

[0015] a first configuration submodule, configured to determine an AC test strategy and a DC test strategy for the first capacitor to be tested according to a type label of the first capacitor to be tested, and to determine a first initial test strategy according to the AC test strategy and the DC test strategy of the first capacitor to be tested;

[0016] The second configuration submodule is used to determine the AC test strategy and the DC test strategy of the second capacitor to be tested according to the type label of the second capacitor to be tested, and determine the second initial test strategy according to the AC test strategy and the DC test strategy of the second capacitor to be tested.

[0017] In a feasible implementation, the second policy configuration module includes:

[0018] a combination submodule, configured to determine a plurality of first optimization objectives according to the first initial test strategy, and to determine a plurality of second optimization objectives according to the second initial test strategy;

[0019] The determination submodule is used to determine the target test strategy according to the multi-dimensional matching results of the multiple first optimization objectives and the multiple second optimization objectives.

[0020] In a feasible implementation, the combined submodule includes:

[0021] A matching unit, configured to determine a plurality of candidate test strategies based on multi-dimensional matching results of the plurality of first optimization objectives and the plurality of second optimization objectives;

[0022] The evaluation unit is used to determine the matching scores of multiple candidate test strategies according to a preset evaluation strategy, and determine the target test strategy according to the matching scores.

[0023] In a feasible implementation manner, the matching unit includes:

[0024] A first combining subunit, configured to arbitrarily combine at least one first optimization objective and at least one second optimization objective to obtain a matching result in one dimension;

[0025] The importance evaluation subunit is used to determine the importance evaluation value of the matching result of each dimension and determine the target dimension according to the importance evaluation value;

[0026] The second combination subunit is used to arbitrarily combine the matching results of the target dimensions and determine the corresponding candidate test strategies.

[0027] In a feasible implementation, the evaluation strategy includes a stability evaluation strategy and a time evaluation strategy, and the evaluation unit includes:

[0028] A first evaluation subunit is configured to evaluate the test strategy to be selected according to the stability evaluation strategy to obtain a first evaluation score;

[0029] A second evaluation subunit is used to evaluate the test strategy to be selected according to the time evaluation strategy to obtain a second evaluation score;

[0030] The comprehensive evaluation subunit is used to determine the matching score of each candidate test strategy based on the first evaluation score and the second evaluation score.

[0031] In a feasible implementation, the test module includes:

[0032] a first testing submodule configured to perform a DC test on the first capacitor to be tested to obtain first DC test data, and to perform an AC test on the second capacitor to be tested to obtain first AC test data according to a target test strategy;

[0033] The second testing submodule is configured to perform an AC test on the first capacitor to be tested to obtain second AC test data, and perform a DC test on the second capacitor to be tested to obtain second DC test data.

[0034] In a feasible implementation, the test module further includes a test circuit:

[0035] The test circuit is configured to couple to a first capacitor to be tested and a second capacitor to be tested, and to provide an AC ripple current to the first capacitor to be tested and a DC voltage to the second capacitor to be tested when executing a target test strategy; or

[0036] An AC ripple current is provided to the second capacitor to be tested, and a DC voltage is provided to the first capacitor to be tested.

[0037] The present invention provides a multi-specification capacitor reliability testing system. First, upon receiving a capacitor test request, an image acquisition module can promptly acquire image information of a first capacitor to be tested and a second capacitor to be tested, even though the two capacitors have different specifications. This capability ensures the automation and intelligence of the testing process, allowing the system to quickly identify the specific type and characteristics of the capacitors to be tested, laying the foundation for subsequent test strategy configuration. Next, a first strategy configuration module determines the initial test strategy for each of the first and second capacitors based on the image information. This image-based strategy configuration enables customized test plans for capacitors of different specifications, ensuring optimal test methods and parameters, and effectively evaluating capacitor performance. Then, a second strategy configuration module determines a target test strategy by analyzing the multi-dimensional matching results of the first and second initial test strategies. The advantage of this process is that by comprehensively considering the testing requirements of different capacitors, the final test strategy ensures that the characteristics of both capacitors are taken into account, thereby achieving optimized testing results. This multi-dimensional matching approach ensures the flexibility and adaptability of the test strategy, allowing the system to cope with the complexity that may arise from capacitors of different specifications. Finally, the test module is configured to perform parallel testing on the first and second capacitors to be tested according to the target test strategy. This design significantly improves test efficiency, reduces test time, and allows the testing of the two capacitors to proceed independently, avoiding wasted resources. Through parallel testing, the system can simultaneously collect test data for both capacitors, providing a wealth of basic data for subsequent analysis and evaluation. This efficient testing method not only saves time and costs, but also improves test accuracy and reliability. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 A schematic structural diagram of a multi-specification capacitor reliability testing system provided in an embodiment of the present application;

[0039] Figure 2 A circuit diagram of a test circuit provided in an embodiment of the present application. DETAILED DESCRIPTION

[0040] The technical solution in this application will be described below with reference to the accompanying drawings.

[0041] In order to make the purpose, technical solutions and advantages of this application more clear, the following Figure 1-Figure 2 It should be understood that the specific embodiments described herein are only used to explain the present application and are not intended to limit the present application.

[0042] The terms "first", "second", etc. involved in the embodiments of the present application are only used to distinguish features of the same type and cannot be understood as indicating relative importance, quantity, order, etc.

[0043] The terms "exemplary" or "for example" in the embodiments of this application are used to indicate examples, illustrations, or descriptions. Any embodiment or design described in this application as "exemplary" or "for example" should not be construed as being preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "for example" is intended to present the relevant concepts in a concrete manner.

[0044] The terms "coupling" and "connection" involved in the embodiments of this application should be understood in a broad sense. For example, they may refer to a physical direct connection, or an indirect connection achieved through electronic devices, such as a connection achieved through resistors, inductors, capacitors or other electronic devices.

[0045] In the rail transit sector, capacitors, as key components, are widely used in power supply systems, signal control systems, traction systems, and other scenarios. Rail transit equipment demands high reliability, placing stringent testing requirements on capacitor performance and lifespan. However, the diverse range of capacitors used in rail transit applications, with significant differences in withstand voltage, capacity, temperature, and lifespan between different models and specifications, necessitating specific parameter settings and test conditions during testing. Due to the wide variety of capacitors and their varying performance requirements, a single test solution for all specifications is difficult to apply. Each capacitor specification may require different test parameter settings, including test voltage, test temperature, and load conditions. Consequently, test systems are often limited to testing one specification of capacitor, while other specifications require separate setup and testing. Since parallel testing of multiple specifications is not possible, testers typically need to test each specification individually according to a pre-set process, making the entire process very time-consuming.

[0046] Based on this, the inventors proposed the inventive concept of this application. By presetting a test circuit, capacitors of different specifications can be tested simultaneously. Capacitors of different specifications undergo different types of tests at the same time, that is, one specification of capacitor undergoes a DC test, and another specification of capacitor undergoes an AC test. This can significantly improve testing efficiency and reduce the repeated adjustments of different parameters and test conditions in each test process, thereby meeting the demand for efficient reliability testing of capacitors of various specifications in complex application fields such as rail transportation.

[0047] Reference Figure 1 , the present application provides a multi-specification capacitor reliability testing system, the system comprising:

[0048] The image acquisition module 101 is configured to acquire image information of the first capacitor to be tested and the second capacitor to be tested after receiving a capacitor test request.

[0049] In this embodiment, the first and second capacitors to be tested have different specifications. Once the image acquisition module detects a test request from a user or system, it is activated to begin the image acquisition process. The image acquisition module first locates and captures an image of the first capacitor to be tested. For example, a camera or other imaging device is used to capture a close-up image of the capacitor to ensure sufficient detail for subsequent analysis. After capturing the image of the first capacitor, the module proceeds to capture an image of the second capacitor to be tested. This process is similar to that for the first capacitor and will not be further described.

[0050] After the image information of the first capacitor to be tested and the second capacitor to be tested is acquired, the types of the first capacitor to be tested and the second capacitor to be tested can be determined.

[0051] In one feasible embodiment, the image acquisition module includes a query submodule for determining whether there is a first type tag matching the capacitor to be tested based on the model characteristics in the image information, where the first type tag is used to represent the type of capacitor for which there is a historical test record;

[0052] A first determining submodule is configured to, when there is a first type tag matching the model feature, determine the first type tag as the type tag of the capacitor to be tested;

[0053] The second determining submodule is configured to determine a second type tag as the type tag of the capacitor to be tested if there is no first type tag matching the capacitor to be tested, wherein the second type tag is used to represent a capacitor type for which no historical test record exists.

[0054] In this embodiment, the query submodule's primary task is to analyze model features within the image information. This may include extracting information such as the capacitor's model, size, and shape, and matching it against a known library of labels. After the image acquisition module receives the image of the capacitor to be tested, the query submodule uses a comparison algorithm to search the database for a first-type label that matches the model features. If a matching label is found, it indicates that this capacitor type has a previous test record, and subsequent test analysis will rely on this label. Once the query submodule finds a matching first-type label, the first determination submodule marks and records it. This ensures that subsequent tests can be analyzed based on this type label, leveraging the data and experience provided by historical test records, thereby improving test efficiency and accuracy. If no matching first-type label is found, the second determination submodule automatically generates and assigns a second-type label to characterize the capacitor type for which no historical test record exists. This mechanism ensures that testing can proceed even without historical data, allowing the system to create new test records for new or uncommon capacitor types.

[0055] The first strategy configuration module 102 is configured to determine a first initial test strategy according to the image information of the first capacitor to be tested, and to determine a second initial test strategy according to the image information of the second capacitor to be tested.

[0056] In this embodiment, after obtaining the image information of the first capacitor to be tested and the second capacitor to be tested, the image information of the first capacitor to be tested and the second capacitor to be tested can be used as a basis to determine the initial test strategy of the image information of the first capacitor to be tested and the second capacitor to be tested. The initial test strategy is a test strategy that meets the test requirements of the first capacitor to be tested and the second capacitor to be tested.

[0057] In a feasible implementation, the first policy configuration module includes:

[0058] a first configuration submodule, configured to determine an AC test strategy and a DC test strategy for the first capacitor to be tested according to a type label of the first capacitor to be tested, and to determine a first initial test strategy according to the AC test strategy and the DC test strategy of the first capacitor to be tested;

[0059] The second configuration submodule is used to determine the AC test strategy and the DC test strategy of the second capacitor to be tested according to the type label of the second capacitor to be tested, and determine the second initial test strategy according to the AC test strategy and the DC test strategy of the second capacitor to be tested.

[0060] In this embodiment, the first configuration submodule is responsible for formulating an AC test strategy and a DC test strategy applicable to the capacitor based on the type label of the first capacitor to be tested. By analyzing the type label of the capacitor, the submodule will refer to historical test data and best practices to determine the test parameters and methods suitable for the capacitor. Then, based on these AC and DC test strategies, the first initial test strategy is further integrated to provide specific guidance for the subsequent testing process. Similarly, the function of the second configuration submodule is similar to that of the first configuration submodule, but it is aimed at the second capacitor to be tested. This submodule also formulates its AC test strategy and DC test strategy based on the type label of the second capacitor to be tested, and combines the two to determine the second initial test strategy. In this way, through the collaborative work of these two submodules, the first strategy configuration module can generate personalized test strategies for capacitors of different specifications, thereby ensuring the scientificity, effectiveness and reliability of the test.

[0061] The second strategy configuration module 103 is configured to determine a target test strategy according to the multi-dimensional matching results of the first initial test strategy and the second initial test strategy.

[0062] In this embodiment, the second strategy configuration module receives the first initial test strategy and the second initial test strategy sent from the first strategy configuration module. The two strategies are each formulated for different capacitors to be tested and have different focuses. Then, the module will perform a multi-dimensional matching analysis to compare the consistency and applicability of the two initial test strategies in multiple dimensions, such as voltage range, frequency response, test time, and environmental conditions. Through this multi-dimensional matching, the second strategy configuration module aims to formulate a comprehensive target test strategy so that the first capacitor to be tested and the second capacitor to be tested can have the optimal test strategy at the same time. This target test strategy will take into account the characteristics and test requirements of the two capacitors to ensure that while meeting their respective test requirements, the optimal utilization of resources and the efficiency of the test process are achieved.

[0063] In a feasible implementation, the second policy configuration module includes:

[0064] a combination submodule, configured to determine a plurality of first optimization objectives according to the first initial test strategy, and to determine a plurality of second optimization objectives according to the second initial test strategy;

[0065] The determination submodule is used to determine the target test strategy according to the multi-dimensional matching results of the multiple first optimization objectives and the multiple second optimization objectives.

[0066] In this embodiment, the combination submodule is responsible for determining multiple first optimization targets based on the first initial test strategy, and determining multiple second optimization targets based on the second initial test strategy. These optimization targets may involve different test parameters, such as test accuracy, time efficiency, resource utilization, etc. Through the analysis of the first and second initial test strategies, the combination submodule can identify the key performance indicators and optimization directions related to each capacitor, laying the foundation for subsequent strategy integration. Next, the determination submodule will use the multidimensional matching results obtained from the multiple first optimization targets and the multiple second optimization targets to comprehensively analyze the correlation and applicability between the two optimization targets. Through this multidimensional matching, the integration submodule aims to formulate a target test strategy to ensure that the first capacitor to be tested and the second capacitor to be tested can simultaneously achieve the optimal test effect under different test requirements.

[0067] Ultimately, the target test strategy generated by the second strategy configuration module not only reflects the consideration and optimization of the two capacitors, but also provides clear guidance for the actual testing process to improve test efficiency and accuracy. The target test strategy includes parameter configuration information for the first capacitor to be tested and the second capacitor to be tested, namely DC test configuration information and AC test configuration information. The DC test configuration information for the first capacitor to be tested and the second capacitor to be tested is different, and the AC test configuration information for the first capacitor to be tested and the second capacitor to be tested is also different.

[0068] In a feasible implementation, the combined submodule includes:

[0069] A matching unit, configured to determine a plurality of candidate test strategies based on multi-dimensional matching results of the plurality of first optimization objectives and the plurality of second optimization objectives;

[0070] The evaluation unit is used to determine the matching scores of multiple candidate test strategies according to a preset evaluation strategy, and determine the target test strategy according to the matching scores.

[0071] In this embodiment, the matching unit's function is to determine multiple candidate test strategies based on the multi-dimensional matching results of multiple first optimization objectives and multiple second optimization objectives. The matching unit analyzes the relationship between these two sets of optimization objectives and identifies potential test strategies that can simultaneously meet the first and second requirements of the capacitors to be tested. By evaluating the adaptability and effectiveness of different strategies across various dimensions, the matching unit generates a candidate list containing multiple candidate test strategies. Next, the evaluation unit's primary task is to assess the compatibility of these candidate test strategies based on a pre-set evaluation strategy. The evaluation unit applies a series of evaluation metrics, such as test accuracy, efficiency, and resource consumption, to quantitatively analyze each candidate strategy and derive its compatibility score. The score reflects the extent to which the strategy meets the capacitor requirements in actual testing. Based on these compatibility scores, the evaluation unit further screens and determines the target test strategy. Therefore, the combination submodule not only comprehensively considers multiple optimization objectives but also, through a systematic evaluation process, ensures that the final target test strategy has high applicability and effectiveness, thereby improving the reliability and accuracy of the test.

[0072] In a feasible implementation manner, the matching unit includes:

[0073] A first combining subunit, configured to arbitrarily combine at least one first optimization objective and at least one second optimization objective to obtain a matching result in one dimension;

[0074] The importance evaluation subunit is used to determine the importance evaluation value of the matching result of each dimension and determine the target dimension according to the importance evaluation value;

[0075] The second combination subunit is used to arbitrarily combine the matching results of the target dimensions and determine the corresponding candidate test strategies.

[0076] In this embodiment, the primary task of the first combination subunit is to arbitrarily combine at least one first optimization objective with at least one second optimization objective to obtain a matching result for a dimension. This process helps identify potential connections between different optimization objectives. A combination is selected from multiple first and second optimization objectives. For example, a specific AC test parameter may be selected for combination with a DC test parameter. By analyzing the combined objectives, the first combination subunit generates a new matching result, which is used for subsequent evaluation and analysis. The importance assessment subunit is responsible for assigning an importance assessment value to the matching result for each dimension. This assessment value reflects the importance of the matching result in the overall test strategy formulation. The importance assessment subunit can evaluate the relevance and influence of the matching result for each dimension based on preset standards or rules. For example, certain test objectives may have a greater impact on capacitor performance and therefore have a higher importance assessment value. Through this evaluation, the importance assessment subunit can determine which dimensions are the basis for constructing the target dimension, which facilitates subsequent strategy optimization and selection. The second combination subunit is responsible for arbitrarily combining the matching results based on the determined target dimension to determine the corresponding candidate test strategy. This unit will use the target dimensions provided by the importance assessment sub-unit to conduct further combination analysis. By integrating the matching results of the target dimensions, the second combination sub-unit can generate candidate test strategies that meet multiple optimization objectives. This process ensures that the generated candidate test strategies can achieve optimal performance overall while meeting the characteristics of different capacitors. Through the collaborative work of these three sub-units, the matching unit can effectively integrate multiple optimization objectives, conduct multi-dimensional matching analysis, and ultimately determine the candidate strategies that meet the test requirements. This process not only improves the systematic and scientific nature of the strategy, but also provides practical guidance for actual testing, ensuring the accuracy and reliability of the test.

[0077] In a feasible implementation, the evaluation strategy includes a stability evaluation strategy and a time evaluation strategy, and the evaluation unit includes:

[0078] A first evaluation subunit is configured to evaluate the test strategy to be selected according to the stability evaluation strategy to obtain a first evaluation score;

[0079] A second evaluation subunit is used to evaluate the test strategy to be selected according to the time evaluation strategy to obtain a second evaluation score;

[0080] The comprehensive evaluation subunit is used to determine the matching score of each candidate test strategy based on the first evaluation score and the second evaluation score.

[0081] In this embodiment, the main task of the first evaluation subunit is to evaluate the candidate test strategies according to the stability evaluation strategy, thereby obtaining a first evaluation score. The stability evaluation strategy focuses on the consistency and reliability of the test strategy under different conditions. This subunit will analyze the performance of the candidate test strategies in various environments and usage situations, and evaluate whether they can stably complete the test tasks under different conditions. Ultimately, the first evaluation subunit will generate a first evaluation score for each candidate test strategy, reflecting its stability.

[0082] The second evaluation subunit is tasked with evaluating candidate test strategies based on a time evaluation strategy to obtain a second evaluation score. This time evaluation strategy primarily focuses on the time efficiency and resource utilization of the testing process. This subunit analyzes the time required for each candidate test strategy, including test preparation, execution, and data analysis, to ensure that the test can be completed within a reasonable timeframe. Ultimately, the second evaluation subunit generates a second evaluation score for each candidate test strategy, reflecting its time efficiency.

[0083] The main reason for conducting stability and time assessments is to ensure the effectiveness and efficiency of the test strategy. Stability assessments focus on the consistency and reliability of the test strategy under different conditions. They ensure that the selected strategy can consistently and stably provide accurate test results in actual applications, avoiding fluctuations in test results due to environmental changes or improper operation. On the other hand, time assessments focus on the time efficiency of the testing process, ensuring that the test can be completed within a reasonable time frame, avoiding waste of resources and delays. Through these two assessments, we can fully understand the performance of the candidate test strategy, ensuring that the selected strategy not only meets the stability requirements but also achieves time optimization, thereby improving overall test efficiency and reliability.

[0084] The main task of the comprehensive evaluation sub-unit is to comprehensively determine the matching score of each candidate test strategy based on the first and second evaluation scores. This sub-unit integrates the first and second evaluation scores, taking into account the evaluation results of the two dimensions of stability and time efficiency, to calculate a comprehensive matching score. The comprehensive evaluation can use a weighted average or other algorithm to ensure that the influence of the two evaluation scores is reflected in the final score. Through this process, the comprehensive evaluation sub-unit can provide a comprehensive score for each candidate test strategy to facilitate the subsequent selection of the best test strategy. Through the collaborative work of these three evaluation sub-units, the evaluation unit can comprehensively and systematically evaluate the candidate test strategies to ensure that the final selected test strategy can achieve the best results in terms of both stability and time efficiency. This evaluation mechanism not only enhances the scientific nature of the test strategy selection, but also improves the effectiveness and reliability of the overall testing process.

[0085] In a feasible implementation, the test module includes:

[0086] a first testing submodule configured to perform a DC test on the first capacitor to be tested to obtain first DC test data, and to perform an AC test on the second capacitor to be tested to obtain first AC test data according to a target test strategy;

[0087] The second testing submodule is configured to perform an AC test on the first capacitor to be tested to obtain second AC test data, and perform a DC test on the second capacitor to be tested to obtain second DC test data.

[0088] In this embodiment, the first test submodule is configured to perform a DC test on the first capacitor to be tested according to the target test strategy to obtain first DC test data. The design focus of this test is to evaluate the DC characteristics of the first capacitor, including key parameters such as its capacitance and leakage current, through precise DC voltage and current measurements. This data will help determine the performance of the first capacitor under static conditions to ensure that it meets the requirements for use. At the same time, the submodule will also perform an AC test on the second capacitor to be tested to obtain first AC test data. This process aims to obtain the frequency response, phase angle, and other dynamic characteristics of the second capacitor, thereby comprehensively evaluating its performance at different frequencies. This testing strategy can fully tap the performance potential of the capacitor and provide data support for subsequent applications.

[0089] The second test submodule is responsible for executing the opposite test process from the first submodule. Based on the target test strategy, this submodule performs AC testing on the first capacitor to obtain second AC test data. This test will carefully evaluate the first capacitor's AC performance at different frequencies, revealing its phase response and impedance characteristics. This is crucial for understanding how the capacitor will perform in real-world applications. Simultaneously, the second test submodule also performs DC testing on the second capacitor to obtain second DC test data. This test focuses on evaluating the second capacitor's static characteristics to ensure its reliability and performance under DC conditions.

[0090] By simultaneously testing the first and second capacitors under test, each with different specifications, the test equipment and time can be efficiently utilized. By processing two different types of capacitors in parallel, the overall test efficiency can be significantly improved, reducing the time required for individual tests. Secondly, DC testing of the first capacitor under test can accurately evaluate its static characteristics, such as key parameters such as capacitance, leakage current, and equivalent series resistance, while AC testing of the second capacitor under test can reveal its frequency response and phase characteristics under dynamic signals.

[0091] In a feasible implementation, the test module further includes a test circuit:

[0092] The test circuit is configured to couple to a first capacitor to be tested and a second capacitor to be tested, and to provide an AC ripple current to the first capacitor to be tested and a DC voltage to the second capacitor to be tested when executing a target test strategy; or

[0093] An AC ripple current is provided to the second capacitor to be tested, and a DC voltage is provided to the first capacitor to be tested.

[0094] In this embodiment, see Figure 2 The test circuit shown includes an AC / DC superposition power supply part, a rectifier and filter part, a main power conversion part, a DC high-voltage power supply part, and an output part.

[0095] The three-phase power input enters the circuit through three sets of fuses, F1, F2, and F3, and is connected to the A, B, and C lines. Current sensing is performed using current transformers I11 and I12. The three-phase AC input first passes through a diode rectifier bridge (composed of VD1 through VD6) to rectify it into DC. The rectified current is filtered by filter capacitor C1 to reduce voltage ripple. The rectified and filtered DC current is input to thyristor VT1 and the associated control circuitry, where the DC voltage is regulated by controlling the thyristor's conduction. Diodes VD11 through VD61 below cooperate with VT1 for further rectification and current control. The auxiliary power supply, consisting of diode rectifier bridges VD3 and VD4 and filter capacitors, generates the required auxiliary DC voltage. V1, R3, C1, and KM3 in the auxiliary power supply circuit can be used to protect or stabilize the auxiliary power supply output. The circuit contains multiple relays and resistors, such as KM1, R1, R2, and QM1, that implement switching control and protection functions to prevent short circuits and overcurrent. Q1 and Q3 sense current and provide feedback to the control system for timely protection. The DC output of the entire circuit is isolated by transformer T2, which transmits the DC voltage to the load.

[0096] The output terminals include AC1 and AC2 as well as the positive and negative terminals of DC voltage output (DC+ and DC−), which can be used for different loads.

[0097] The test circuit is coupled to the first and second capacitors under test and provides the required current and voltage according to the target test strategy. A three-phase power input enters the circuit through fuses F1, F2, and F3, connecting to the A, B, and C lines, ensuring power safety and stability. Current transformers I11 and I12 detect the input current, providing real-time feedback for subsequent current control. The three-phase AC power first passes through a diode rectifier bridge (VD1 to VD6) to convert it to DC. This rectification process is a critical step in current supply, as it converts the original AC signal into a stable and controllable DC voltage. The rectified current passes through filter capacitor C1 to reduce voltage ripple and ensure output voltage stability and reliability. This rectified and filtered DC current is fed into thyristor VT1 and its associated control circuitry. Controlling the thyristor's conduction regulates the DC voltage, ensuring a stable DC voltage for the second capacitor under test. During this process, diodes VD11 through VD61 below work with VT1 to provide further rectification and current control, enhancing the circuit's flexibility. The auxiliary power supply's diode rectifier bridges VD3 and VD4 and filter capacitors generate the required auxiliary DC voltage, supporting stable circuit operation. Components in the auxiliary power supply circuit protect or stabilize the auxiliary power supply output, ensuring overall circuit reliability. Furthermore, multiple relays and resistors within the circuit provide switching control and protection against short circuits and overcurrent, which are crucial for safe capacitor testing. During testing, the circuit can flexibly provide either AC ripple current or DC voltage, depending on the capacitor type and test requirements. For example, when AC ripple current is required for the first capacitor under test, the circuit adjusts the corresponding control parameters to ensure that the output meets the AC ripple characteristics. Conversely, when DC voltage is required for the second capacitor under test, the circuit provides a stable DC output through the regulation function of thyristor VT1. This flexible circuit configuration and control mechanism enables the test circuit to efficiently and accurately meet the testing requirements of different capacitors, thereby achieving effective coupling with the first capacitor to be tested and the second capacitor to be tested.

[0098] In a feasible implementation manner, the system further includes an evaluation module for generating a test evaluation report of the capacitor to be tested.

[0099] In this embodiment, the system also includes an evaluation module for generating a test evaluation report for the capacitor under test. This evaluation module analyzes the capacitor's test data, including key parameters such as capacitance, equivalent series resistance (ESR), and leakage current. By comparing these parameters with preset standard values, the evaluation module automatically determines whether the capacitor's performance meets specification requirements. Furthermore, the test evaluation report can provide recommendations on potential failure modes for the capacitor and recommend further testing or remedial measures.

[0100] The present invention provides a multi-specification capacitor reliability testing system. First, upon receiving a capacitor test request, an image acquisition module can promptly acquire image information of a first capacitor to be tested and a second capacitor to be tested, even though the two capacitors have different specifications. This capability ensures the automation and intelligence of the testing process, allowing the system to quickly identify the specific type and characteristics of the capacitors to be tested, laying the foundation for subsequent test strategy configuration. Next, a first strategy configuration module determines the initial test strategy for each of the first and second capacitors based on the image information. This image-based strategy configuration enables customized test plans for capacitors of different specifications, ensuring optimal test methods and parameters, and effectively evaluating capacitor performance. Then, a second strategy configuration module determines a target test strategy by analyzing the multi-dimensional matching results of the first and second initial test strategies. The advantage of this process is that by comprehensively considering the testing requirements of different capacitors, the final test strategy ensures that the characteristics of both capacitors are taken into account, thereby achieving optimized testing results. This multi-dimensional matching approach ensures the flexibility and adaptability of the test strategy, allowing the system to cope with the complexity that may arise from capacitors of different specifications. Finally, the test module is configured to perform parallel testing on the first and second capacitors to be tested according to the target test strategy. This design significantly improves test efficiency, reduces test time, and allows the testing of the two capacitors to proceed independently, avoiding wasted resources. Through parallel testing, the system can simultaneously collect test data for both capacitors, providing a wealth of basic data for subsequent analysis and evaluation. This efficient testing method not only saves time and costs, but also improves test accuracy and reliability.

[0101] The above embodiments can be implemented in whole or in part via software, hardware (e.g., circuits), firmware, or any other combination. When implemented using software, the above embodiments can be implemented in whole or in part in the form of a computer program product. A computer program product comprises one or more computer instructions or computer programs. When the computer instructions or computer program are loaded or executed on a computer, the processes or functions according to the embodiments of the present application are fully or partially generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable system. The computer program or instructions can be stored in a computer-readable storage medium or transferred from one computer-readable storage medium to another. For example, the computer program or instructions can be transferred from one website, computer, server, or data center to another website, computer, server, or data center via wired means (e.g., infrared, wireless, microwave, etc.). The computer-readable storage medium can be any available medium accessible by a computer or a data storage device such as a server or data center that contains a collection of one or more available media. Available media can be magnetic media (e.g., floppy disks, hard disks, magnetic tapes), optical media (e.g., DVDs), or semiconductor media. The semiconductor media can be a solid-state drive.

[0102] It should be understood that the term "and / or" as used herein simply describes a relationship between associated objects, indicating that three possible relationships exist. For example, "A and / or B" can represent: A alone, A and B together, or B alone. A and B can be singular or plural. Furthermore, the character " / " as used herein generally indicates an "or" relationship between the associated objects, but it may also indicate an "and / or" relationship. For specific understanding, please refer to the context.

[0103] In this application, "at least one" means one or more, and "plurality" means two or more. "At least one of the following" or similar expressions refers to any combination of these items, including any combination of single or plural items. For example, "at least one of a, b, or c" can mean: a, b, c, ab, ac, bc, or abc, where a, b, and c can be single or plural.

[0104] It should be understood that in the various embodiments of the present application, the size of the serial numbers of the above-mentioned processes does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0105] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0106] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described systems, systems and units can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0107] In the several embodiments provided in this application, it should be understood that the disclosed systems, systems and methods can be implemented in other ways. For example, the system embodiments described above are merely illustrative. For example, the division of units is only a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, and the indirect coupling or communication connection of the system or unit can be electrical, mechanical or other forms.

[0108] Units described as separate components may or may not be physically separate, and components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0109] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0110] If the function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the existing technology, or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes a number of instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the various embodiments of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM), random access memory (RAM), disk or optical disk, and other media that can store program code.

[0111] The above are only specific embodiments of the present application, but the scope of protection of this application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.

Claims

1. A multi-specification capacitor reliability testing system, characterized in that: The system comprises: an image acquisition module configured to acquire image information of a first capacitor to be tested and a second capacitor to be tested after receiving a capacitor test request, wherein the first capacitor to be tested and the second capacitor to be tested have different specifications; a first strategy configuration module configured to determine a first initial test strategy based on the image information of the first capacitor to be tested, and to determine a second initial test strategy based on the image information of the second capacitor to be tested; A second strategy configuration module is configured to determine a target test strategy according to a multi-dimensional matching result of the first initial test strategy and the second initial test strategy; a testing module configured to perform parallel testing on the first capacitor to be tested and the second capacitor to be tested according to a target testing strategy to obtain test data of the first capacitor to be tested and the second capacitor to be tested; The first policy configuration module includes: a first configuration submodule, configured to determine an AC test strategy and a DC test strategy for the first capacitor to be tested according to the type label of the first capacitor to be tested, and determine the first initial test strategy according to the AC test strategy and the DC test strategy of the first capacitor to be tested; a second configuration submodule, configured to determine an AC test strategy and a DC test strategy for the second capacitor to be tested according to the type label of the second capacitor to be tested, and determine the second initial test strategy according to the AC test strategy and the DC test strategy of the second capacitor to be tested; The second policy configuration module includes: a combining submodule, configured to determine a plurality of first optimization objectives according to the first initial testing strategy, and to determine a plurality of second optimization objectives according to the second initial testing strategy; The determination submodule is configured to determine the target test strategy according to the multi-dimensional matching results of the multiple first optimization objectives and the multiple second optimization objectives.

2. The multi-specification capacitor reliability testing system according to claim 1, characterized in that: The image acquisition module includes: a query submodule, configured to determine, based on the model features in the image information, whether there is a first type tag that matches the capacitor to be tested, wherein the first type tag is used to characterize the type of capacitor for which there is a historical test record; a first determining submodule, configured to, if a first type tag matching the model feature exists, determine the first type tag as the type tag of the capacitor to be tested; The second determining submodule is configured to determine a second type tag as the type tag of the capacitor to be tested if there is no first type tag matching the capacitor to be tested, wherein the second type tag is used to represent a capacitor type for which no historical test record exists.

3. The multi-specification capacitor reliability testing system according to claim 1, characterized in that: The combined submodule includes: a matching unit, configured to determine a plurality of candidate test strategies based on a multi-dimensional matching result between the plurality of first optimization objectives and the plurality of second optimization objectives; An evaluation unit is configured to determine matching scores of the plurality of candidate test strategies according to a preset evaluation strategy, and determine the target test strategy according to the matching scores.

4. The multi-specification capacitor reliability testing system according to claim 3, characterized in that: The matching unit includes: A first combining subunit, configured to arbitrarily combine at least one of the first optimization objectives and at least one of the second optimization objectives to obtain a matching result of one dimension; An importance evaluation subunit, configured to determine an importance evaluation value of the matching result of each dimension, and determine a target dimension according to the importance evaluation value; The second combining subunit is used to arbitrarily combine the matching results of the target dimension to determine the corresponding test strategy to be selected.

5. The multi-specification capacitor reliability testing system according to claim 3, characterized in that: The evaluation strategy includes a stability evaluation strategy and a time evaluation strategy, and the evaluation unit includes: A first evaluation subunit is configured to evaluate the candidate test strategy according to the stability evaluation strategy to obtain a first evaluation score; A second evaluation subunit is configured to evaluate the candidate test strategy according to the time evaluation strategy to obtain a second evaluation score; The comprehensive evaluation subunit is used to determine the matching score of each of the candidate test strategies according to the first evaluation score and the second evaluation score.

6. The multi-specification capacitor reliability testing system according to claim 1, characterized in that: The test module includes: a first testing submodule configured to perform a DC test on the first capacitor to be tested to obtain first DC test data, and to perform an AC test on the second capacitor to be tested to obtain first AC test data according to the target test strategy; The second testing submodule is configured to perform an AC test on the first capacitor to be tested to obtain second AC test data, and perform a DC test on the second capacitor to be tested to obtain second DC test data.

7. The multi-specification capacitor reliability testing system according to claim 6, characterized in that: The test module also includes a test circuit: The test circuit is configured to couple to the first capacitor to be tested and the second capacitor to be tested, and when executing the target test strategy, provide an AC ripple current to the first capacitor to be tested and a DC voltage to the second capacitor to be tested; or provide an AC ripple current to the second capacitor to be tested and a DC voltage to the first capacitor to be tested.

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