Methods, apparatus, and equipment for addressing partial discharge defects based on perfluoroisobutyronitrile (PFOBN) as the insulating medium.

Abstract

This application relates to a method, apparatus, and equipment for detecting partial discharge defects using perfluoroisobutyronitrile (PFOBN) as the insulating medium. The method includes constructing a test platform and acquiring partial discharge parameters; controlling the test platform to simulate partial discharge in the insulating medium based on the partial discharge parameters to obtain partial discharge pulse signals; extracting time-domain and frequency-domain data from the partial discharge pulse signals as partial discharge data, and constructing a phase-resolved spectrum based on the partial discharge data; extracting identification data from the phase-resolved spectrum; and identifying the type of partial discharge defect in the insulating medium based on the identification data. This method acquires partial discharge pulse signals simulated using PFOBN as the insulating medium, extracts partial discharge data in the time and frequency domains from the partial discharge pulse signals, constructs a phase-resolved spectrum using this data, and identifies partial discharge defects in environmentally friendly insulating gases such as PFOBN based on the identification data obtained from the phase-resolved spectrum.

Description

Technical Field

[0001] This application relates to the field of partial discharge defect identification technology, and in particular to a method, apparatus and equipment for identifying partial discharge defects based on perfluoroisobutyronitrile as the insulating medium. Background Technology

[0002] In the field of high voltage and insulation technology, gas-insulated switchgear (GIS) is used to improve the reliability of power systems. Sulfur hexafluoride (SF6) possesses excellent insulation properties, including excellent dielectric strength and arc-quenching performance. Therefore, SF6 is widely used as an insulator in gas-insulated power equipment. However, its use is constrained by environmental protection due to its global warming potential (GWP) being 23,900 times that of carbon dioxide (CO2). Therefore, some research has been conducted to develop environmentally friendly alternative gases. Perfluoroisobutyronitrile (PFOS), C4F7N, an environmentally friendly gas, is one of the most popular alternatives to SF6 and is used in GIS.

[0003] In recent years, gas-insulated electrical equipment, such as gas-insulated metal-enclosed switchgear using perfluoroisobutyronitrile (PFOS) C4F7N as the environmentally friendly insulating gas, has gradually been put into production. However, although the insulation performance of PFOS C4F7N has been studied, research on its partial discharge (PD) characteristics is still limited. Partial discharge (PD) is a manifestation of initial insulation degradation in electrical equipment before insulation breakdown. Furthermore, identifying PD defects once they are detected is crucial for field engineers' maintenance decisions within GIS (Gas Insulation System). Currently, various partial discharge characteristics of sulfur hexafluoride (SF6) have been studied in engineering practice to determine the types of partial discharge defects. However, research on the partial discharge (PD) characteristics of PFOS C4F7N is very limited.

[0004] Therefore, it is necessary to study the partial discharge (PD) characteristics of perfluoroisobutyronitrile (PFOS) C4F7N and identify the defect type of PD based on the partial discharge signal. Summary of the Invention

[0005] This application provides a method, apparatus, and equipment for identifying partial discharge defects based on perfluoroisobutyronitrile (PFOBN) as the insulating medium, which addresses the existing technical problem of not being able to identify partial discharge defects in PFOBN C4F7N, an environmentally friendly gas.

[0006] To achieve the above objectives, this application provides the following technical solution:

[0007] On the one hand, a method for addressing partial discharge defects based on perfluoroisobutyronitrile (PFO) as the insulating medium is provided, comprising the following steps:

[0008] A test platform for partial discharge using perfluoroisobutyronitrile (PFOS) as the insulating medium was constructed, and partial discharge parameters were obtained.

[0009] The test platform is controlled according to the partial discharge parameters to simulate partial discharge on the insulating medium, thereby obtaining a partial discharge pulse signal.

[0010] Time-domain and frequency-domain data are extracted from the partial discharge pulse signal as partial discharge data, and a phase-resolved spectrum is constructed based on the partial discharge data; identification data is extracted from the phase-resolved spectrum, and the identification data includes average discharge quantity, pulse count, and discharge pulse phase angle.

[0011] The type of partial discharge defect in the insulating medium is identified based on the identification data.

[0012] Preferably, identifying the type of partial discharge defect in the insulating medium based on the identification data includes:

[0013] If the average discharge amount is a first charge threshold, the pulse count is a first count threshold, and the discharge pulse phase angle is a first phase threshold, then the partial discharge defect type is a particulate defect.

[0014] If the average discharge amount is a second charge threshold, the pulse count is a second count threshold, and the discharge pulse phase angle is a second phase threshold, then the partial discharge defect type is a solid metal protrusion defect.

[0015] If the average discharge quantity is a third charge threshold, the pulse count is a third count threshold, and the discharge pulse phase angle is a third phase threshold, then the partial discharge defect type is a contamination defect.

[0016] If the average discharge quantity is a fourth charge threshold, the pulse count is a fourth count threshold, and the discharge pulse phase angle is a fourth phase threshold, then the partial discharge defect type is an air gap defect.

[0017] Preferably, the first power threshold is 459mV, the first counting threshold is 183N / s, and the first phase threshold is 0°~360°; and / or, the second power threshold is 32mV, the second counting threshold is 42N / s, and the second phase threshold is 61°~102°; and / or, the third power threshold is 42mV, the third counting threshold is 504N / s, and the third phase threshold is 46°~130° and 254°~302°; and / or, the fourth power threshold is 244mV, the fourth counting threshold is 187N / s, and the fourth phase threshold is 16°~118° and 182°~254°.

[0018] Preferably, the test platform includes: a power frequency transformer, a protective resistor, a simulated gas chamber, a voltage divider capacitor, a coupling capacitor, a detection element, and an oscilloscope. The power frequency transformer is also connected to an inductive voltage regulator. The first end of the power frequency transformer is connected to the first end of the protective resistor. The second end of the protective resistor is connected to the first end of the simulated gas chamber, the first end of the voltage divider capacitor, and the first end of the coupling capacitor. The second end of the coupling capacitor is connected to the first end of the detection element and the oscilloscope. The second end of the detection element, the second end of the simulated gas chamber, the second end of the voltage divider capacitor, and the second end of the power frequency transformer are grounded.

[0019] Preferably, the partial discharge parameters include the power frequency voltage of the power frequency transformer, the transformation ratio of the power frequency transformer, the capacity of the power frequency transformer, the rated current on the secondary side of the power frequency transformer, the resistance value of the protection resistor, the voltage division ratio of the voltage dividing capacitor, the high-frequency current component of the coupling capacitor, the impedance of the detection element, the sampling rate, and the analog bandwidth.

[0020] On the other hand, a partial discharge defect device based on perfluoroisobutyronitrile as the insulating medium is provided, including a platform construction and parameter acquisition module, a discharge simulation module, a data extraction module and a defect identification module;

[0021] The platform construction and parameter acquisition module is used to construct a test platform for partial discharge using perfluoroisobutyronitrile as the insulating medium, and to acquire partial discharge parameters.

[0022] The discharge simulation module is used to control the test platform to simulate partial discharge on the insulating medium according to the partial discharge parameters, and to obtain a partial discharge pulse signal.

[0023] The data extraction module is used to extract time-domain and frequency-domain data from the partial discharge pulse signal as partial discharge data, construct a phase-resolved spectrum based on the partial discharge data, and extract identification data from the phase-resolved spectrum, wherein the identification data includes average discharge quantity, pulse count, and discharge pulse phase angle.

[0024] The defect identification module is used to identify the type of partial discharge defect in the insulating medium based on the identification data.

[0025] Preferably, the defect identification module is further configured to determine the partial discharge defect type as a particulate defect based on the average discharge quantity being a first charge threshold, the pulse count being a first count threshold, and the discharge pulse phase angle being a first phase threshold; or to determine the partial discharge defect type as a solid metal protrusion defect based on the average discharge quantity being a second charge threshold, the pulse count being a second count threshold, and the discharge pulse phase angle being a second phase threshold; or to determine the partial discharge defect type as a contamination defect based on the average discharge quantity being a third charge threshold, the pulse count being a third count threshold, and the discharge pulse phase angle being a third phase threshold; or to determine the partial discharge defect type as an air gap defect based on the average discharge quantity being a fourth charge threshold, the pulse count being a fourth count threshold, and the discharge pulse phase angle being a fourth phase threshold.

[0026] Preferably, the first power threshold is 459mV, the first counting threshold is 183N / s, and the first phase threshold is 0°~360°; and / or, the second power threshold is 32mV, the second counting threshold is 42N / s, and the second phase threshold is 61°~102°; and / or, the third power threshold is 42mV, the third counting threshold is 504N / s, and the third phase threshold is 46°~130° and 254°~302°; and / or, the fourth power threshold is 244mV, the fourth counting threshold is 187N / s, and the fourth phase threshold is 16°~118° and 182°~254°.

[0027] Preferably, the test platform includes: a power frequency transformer, a protective resistor, a simulated gas chamber, a voltage dividing capacitor, a coupling capacitor, a detection element, and an oscilloscope. The power frequency transformer is also connected to an inductive voltage regulator. The first terminal of the power frequency transformer is connected to the first terminal of the protective resistor. The second terminal of the protective resistor is connected to the first terminal of the simulated gas chamber, the first terminal of the voltage dividing capacitor, and the first terminal of the coupling capacitor. The second terminal of the coupling capacitor is connected to the first terminal of the detection element and the oscilloscope. The second terminal of the detection element, the second terminal of the simulated gas chamber, the second terminal of the voltage dividing capacitor, and the second terminal of the power frequency transformer are grounded. And / or, the partial discharge parameters include the power frequency voltage of the power frequency transformer, the transformation ratio of the power frequency transformer, the capacity of the power frequency transformer, the rated secondary current of the power frequency transformer, the resistance value of the protective resistor, the voltage division ratio of the voltage dividing capacitor, the high-frequency current component of the coupling capacitor, the impedance of the detection element, the sampling rate, and the analog bandwidth.

[0028] On the other hand, a terminal device is provided, including a processor and a memory;

[0029] The memory is used to store program code and transmit the program code to the processor;

[0030] The processor is configured to execute the aforementioned partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium, according to instructions in the program code.

[0031] This invention discloses a method, apparatus, and equipment for detecting partial discharge defects based on perfluoroisobutyronitrile (PFOBN) as the insulating medium. The method includes constructing a test platform for partial discharge using PFOBN as the insulating medium and acquiring partial discharge parameters; controlling the test platform to simulate partial discharge on the insulating medium based on the partial discharge parameters to obtain partial discharge pulse signals; extracting time-domain and frequency-domain data from the partial discharge pulse signals as partial discharge data; constructing a phase-resolved spectrum based on the partial discharge data; extracting identification data from the phase-resolved spectrum, including average discharge quantity, pulse count, and discharge pulse phase angle; and identifying the type of partial discharge defect in the insulating medium based on the identification data.

[0032] As can be seen from the above technical solutions, this application has the following advantages: This method for partial discharge defects based on perfluoroisobutyronitrile (PFIR) as the insulating medium obtains partial discharge pulse signals that simulate partial discharge using PFIR as the insulating medium, extracts partial discharge data in the time and frequency domains from the partial discharge pulse signals, and uses this data to construct a phase-resolved spectrum. Based on the identification data obtained from the phase-resolved spectrum, it identifies partial discharge defects in environmentally friendly insulating gases such as PFIR, thus solving the existing technical problem of not being able to identify partial discharge defects in PFIR C4F7N, an environmentally friendly gas.

[0033] This partial discharge defect detection device based on perfluoroisobutyronitrile (PFOS) as the insulating medium works in concert with a platform construction and parameter acquisition module, a discharge simulation module, a data extraction module, and a defect identification module to determine the type of partial discharge defect in the insulating medium based on the identification data. Attached Figure Description

[0034] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0035] Figure 1 This is a flowchart illustrating the steps of the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application.

[0036] Figure 2This is a schematic diagram of the test platform in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application;

[0037] Figure 3 This is a schematic diagram of the needle plate electrode structure in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application;

[0038] Figure 4 This is a schematic diagram of the spherical electrode structure in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application;

[0039] Figure 5 This is a schematic diagram of the structure of the first plate electrode in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application;

[0040] Figure 6 This is a schematic diagram of the structure of the second plate electrode in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application;

[0041] Figure 7 This is a phase-resolved spectrum of particulate defects in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application;

[0042] Figure 8 This is a phase-resolved spectrum of solid metal protrusion defects in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application;

[0043] Figure 9 This is a phase-resolved spectrum of the contamination defect in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application;

[0044] Figure 10 This is a phase-resolved spectrum of the air gap defect in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application;

[0045] Figure 11 This is a schematic diagram of the framework of the partial discharge defect device based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application;

[0046] Figure 12 This is a schematic diagram of the terminal device described in an embodiment of this application. Detailed Implementation

[0047] To make the inventive objectives, features, and advantages of this application more apparent and understandable, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the embodiments described below are only some embodiments of this application, and not all embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0048] In the description of the embodiments of this application, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0049] In the embodiments of this application, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in the embodiments of this application according to the specific circumstances.

[0050] This application provides a method, apparatus, and device for identifying partial discharge defects based on perfluoroisobutyronitrile (PFOBN) as the insulating medium, which solves the existing technical problem of not being able to identify partial discharge defects of PFOBN C4F7N, an environmentally friendly gas.

[0051] Example 1:

[0052] Figure 1 This is a flowchart illustrating the steps of the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application. Figure 2 This is a schematic diagram of the test platform in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application.

[0053] like Figure 1 As shown in the figure, this application provides a method for addressing partial discharge defects based on perfluoroisobutyronitrile (PFOS) as the insulating medium, comprising the following steps:

[0054] S1. Construct a test platform for partial discharge using perfluoroisobutyronitrile as the insulating medium, and obtain partial discharge parameters.

[0055] It should be noted that in step S1, the first step is to construct a test platform, and the second step is to obtain the partial discharge parameters.

[0056] like Figure 2 As shown in this embodiment, the test platform includes: a power frequency transformer 10, a protection resistor 20, a simulated air chamber 30, a voltage divider capacitor 40, a coupling capacitor 50, a detection element 60, and an oscilloscope 70. The power frequency transformer 10 is also connected to an inductive voltage regulator 11. The first end of the power frequency transformer 10 is connected to the first end of the protection resistor 20. The second end of the protection resistor 20 is connected to the first end of the simulated air chamber 30, the first end of the voltage divider capacitor 40, and the first end of the coupling capacitor 50, respectively. The second end of the coupling capacitor 50 is connected to the first end of the detection element 60 and the oscilloscope 70, respectively. The second end of the detection element 60, the second end of the simulated air chamber 30, the second end of the voltage divider capacitor 40, and the second end of the power frequency transformer 10 are grounded.

[0057] It should be noted that the detection element 60 can be a resistor. The simulated gas chamber 30 is provided with an inlet for the insulating medium gas. In this embodiment, a test electrode is installed inside the simulated gas chamber 30 to simulate the partial discharge phenomenon inside electrical equipment. The test electrode can be a needle plate electrode, a spherical electrode, a first plate electrode, or a second plate electrode.

[0058] Figure 3 This is a schematic diagram of the needle-plate electrode structure in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application. Figure 4 This is a schematic diagram of the spherical electrode structure in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application. Figure 5 This is a schematic diagram of the structure of the first plate electrode in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application. Figure 6 This is a schematic diagram of the structure of the second plate electrode in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application.

[0059] like Figure 3 As shown in the embodiment of this application, the needle plate electrode includes a high-voltage electrode and a ground electrode. The high-voltage electrode is made of a needle with a length of 17 mm, and the ground electrode is made of a plate electrode with a diameter of 120 mm and a thickness of 10 mm. The distance between the high-voltage electrode and the ground electrode is 10 mm.

[0060] like Figure 4As shown in this embodiment, the spherical electrode includes an open spherical shell and a high-voltage electrode built into the shell. The high-voltage electrode is composed of spherical electrodes with a diameter of 50 mm, and the shell is made of a metal material with a diameter of 100 mm, a shell thickness of 1.5 mm, and an opening length of 90 mm. The distance between the bottom end of the high-voltage electrode and the inner wall of the shell is 25 mm. Several spherical elements with a diameter of 2 mm are placed in the inner wall of the shell. The spherical elements can be spherical components made of metal materials such as aluminum balls, iron balls, and copper balls. The spherical components can simulate microparticles because the surface of a normal, defect-free device is smooth and free of metal microparticles.

[0061] like Figure 5 As shown in this embodiment, the first plate electrode includes a high-voltage electrode and a ground electrode, with a spacing of 25 mm between them. A columnar epoxy resin column is disposed between the high-voltage electrode and the ground electrode, and a chip strip is disposed within the epoxy resin column. The chip strip can be made of metals such as aluminum, iron, or copper. The length of the chip strip can be 20 mm, and the width can be 4 mm. The spacing between the chip strip and the ground electrode is 2 mm. The diameter of the epoxy resin column is 80 mm. Both the high-voltage electrode and the ground electrode are constructed using plate electrodes with a diameter of 120 mm and a thickness of 10 mm. The chip strip simulates contamination, because in normally defect-free equipment, epoxy resin plays an insulating role; contamination reduces its insulating performance and increases the risk of equipment accidents.

[0062] like Figure 6 As shown in this embodiment, the second plate electrode includes a high-voltage electrode and a ground electrode, with a spacing of 52 mm between them. A columnar oxy-resin column is disposed between the high-voltage electrode and the ground electrode, with its bottom end tightly attached to the ground electrode. A gap is provided between the top end of the oxy-resin column and the high-voltage electrode. The diameter of the oxy-resin column is 80 mm, and its height is 50 mm. Both the high-voltage electrode and the ground electrode are constructed using plate electrodes with a diameter of 120 mm and a thickness of 10 mm. The gap is used to simulate an air gap, because in normally defect-free equipment, if an air gap is generated at a metal depression, it will reduce its insulation performance and increase the risk of equipment failure.

[0063] In this embodiment, the partial discharge parameters include the power frequency voltage of the power frequency transformer, the transformation ratio of the power frequency transformer, the capacity of the power frequency transformer, the rated current on the secondary side of the power frequency transformer, the resistance value of the protection resistor, the voltage division ratio of the voltage dividing capacitor, the high-frequency current component of the coupling capacitor, the impedance of the detection element, the sampling rate, and the analog bandwidth.

[0064] It should be noted that the inductive voltage regulator 11 provides an AC voltage of 0~380V to the power frequency transformer; the power frequency transformer provides the required test voltage for the partial discharge test. The power frequency transformer has a capacity of 50kVA, a transformation ratio of 0.4 / 100kV, a secondary side rated current of 0.4A, and a power frequency voltage range of 0~100kV. The AC high-voltage signal generated by the power frequency transformer 10 is applied to the test electrodes in the simulated gas chamber 30 through the protective resistor 20. The protective resistor 20 has a resistance of 10kΩ. The voltage dividing capacitor 40 has a voltage dividing ratio of 1:1000. The coupling capacitor 50 is used to extract the high-frequency current component in the partial discharge test. The impedance of the detection element is 50Ω. The function of the detection element is to convert the current signal flowing through the detection impedance into a voltage signal; the coupling capacitor 50 and the detection element 60 are used to measure the pulse signal when partial discharge occurs in the simulated gas chamber 30, based on the pulse current method recommended by IEC60270. The oscilloscope 70 is used to acquire and store the voltage signal transmitted from the sensing element. In this embodiment, the oscilloscope 70 can be a Tektronix MDO3054, with a test sampling rate of 10 GS / s and an analog bandwidth of 1 GHz.

[0065] S2. The test platform is controlled according to the partial discharge parameters to simulate partial discharge in the insulating medium and obtain partial discharge pulse signals.

[0066] It should be noted that in step S2, partial discharge simulation of the insulating medium is performed based on the test platform constructed in step S1 to obtain a continuous sequence of partial discharge pulse signals. In this embodiment, the partial discharge signal includes statistical characteristic parameters such as discharge quantity, discharge phase, discharge frequency, and discharge amplitude, as well as waveform characteristic parameters such as duration, pulse width, and rise time of the partial discharge waveform. The time-domain parameters include the duration, pulse width, and rise time of the partial discharge waveform, while the frequency-domain parameters include discharge phase, discharge frequency, and discharge amplitude. The test platform is controlled using the pulse current method to simulate partial discharge of the insulating medium based on the partial discharge parameters. The partial discharge pulse signal can be measured using an oscilloscope based on the pulse current method of IEC60270.

[0067] S3. Extract time-domain and frequency-domain data from the partial discharge pulse signal as partial discharge data, and construct a phase-resolved spectrum based on the partial discharge data; extract identification data from the phase-resolved spectrum, including average discharge quantity, pulse count, and discharge pulse phase angle.

[0068] It should be noted that in step S3, continuous time-domain and frequency-domain data are extracted from the partial discharge pulse signal obtained in step S2 to serve as partial discharge data. The partial discharge data includes at least the discharge phase and its corresponding duration, pulse width, rise time, and discharge amplitude. In this embodiment, the partial discharge data is plotted as a phase-resolved map with the discharge phase as the abscissa and the discharge amplitude as the ordinate. Then, the average discharge quantity, pulse count, and discharge pulse phase angle are directly extracted from the phase-resolved map to provide data for subsequent identification of partial discharge defects.

[0069] S4. Identify the type of partial discharge defect in the insulating medium based on the identification data.

[0070] It should be noted that in step S4, the identification data obtained in step S3 is used to determine which type of partial discharge defect the insulating medium belongs to. In this embodiment, the partial discharge defect types include particulate defects, solid metal protrusion defects, contamination defects, and air gap defects.

[0071] This application provides a method for partial discharge defects based on perfluoroisobutyronitrile (PFIR) as the insulating medium. The method includes constructing a test platform for partial discharge using PFIR as the insulating medium and acquiring partial discharge parameters; controlling the test platform to simulate partial discharge in the insulating medium based on the partial discharge parameters to obtain partial discharge pulse signals; extracting time-domain and frequency-domain data from the partial discharge pulse signals as partial discharge data; constructing a phase-resolved spectrum based on the partial discharge data; extracting identification data from the phase-resolved spectrum, including average discharge quantity, pulse count, and discharge pulse phase angle; and identifying the type of partial discharge defect in the insulating medium based on the identification data. This method for partial discharge defects based on PFIR as the insulating medium obtains partial discharge pulse signals from partial discharge simulation using PFIR as the insulating medium, extracts partial discharge data in the time and frequency domains from the partial discharge pulse signals, constructs a phase-resolved spectrum using this data, and identifies partial discharge defects in environmentally friendly insulating gases such as PFIR using the identification data obtained from the phase-resolved spectrum. This solves the existing technical problem of not being able to identify partial discharge defects in PFIR C4F7N, an environmentally friendly gas.

[0072] It should be noted that this partial discharge defect method based on perfluoroisobutyronitrile (PFOBN) as the insulating medium can also be applied to the identification of partial discharge defects in electrical equipment and in actual engineering projects. The identification results of this method will help in the application of PFOBN C4F7N, an environmentally friendly gas, as an insulating medium in power equipment, allowing the identification results to serve as reference data for asset management, fault identification, and maintenance of such power equipment.

[0073] Figure 7This is a phase-resolved spectrum of particulate defects in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application. Figure 8 This is a phase-resolved spectrum of a solid metal protrusion defect in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application. Figure 9 This is a phase-resolved spectrum of the contamination defect in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application. Figure 10 This is a phase-resolved spectrum of the air gap defect in the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium described in the embodiments of this application.

[0074] like Figures 7 to 10 As shown, in one embodiment of this application, identifying the type of partial discharge defect in the insulating medium based on identification data includes:

[0075] If the average discharge quantity is the first charge threshold, the pulse count is the first count threshold, and the discharge pulse phase angle is the first phase threshold, then the partial discharge defect type is a particulate defect.

[0076] If the average discharge quantity is the second charge threshold, the pulse count is the second count threshold, and the discharge pulse phase angle is the second phase threshold, then the partial discharge defect type is a solid metal protrusion defect.

[0077] If the average discharge quantity is the third charge threshold, the pulse count is the third count threshold, and the discharge pulse phase angle is the third phase threshold, then the partial discharge defect type is a contamination defect.

[0078] If the average discharge quantity is the fourth charge threshold, the pulse count is the fourth count threshold, and the discharge pulse phase angle is the fourth phase threshold, then the partial discharge defect type is an air gap defect.

[0079] It should be noted that the first charge threshold is 459mV, the first count threshold is 183N / s, and the first phase threshold is 0°~360°; and / or, the second charge threshold is 32mV, the second count threshold is 42N / s, and the second phase threshold is 61°~102°; and / or, the third charge threshold is 42mV, the third count threshold is 504N / s, and the third phase threshold is 46°~130° and 254°~302°; and / or, the fourth charge threshold is 244mV, the fourth count threshold is 187N / s, and the fourth phase threshold is 16°~118° and 182°~254°. In this embodiment, the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium can determine different defect types based on the differences in average discharge quantity, pulse count, and discharge pulse phase angle distribution of different defect types.

[0080] Example 2:

[0081] Figure 11 This is a schematic diagram of the partial discharge defect device based on perfluoroisobutyronitrile as the insulating medium, as described in the embodiments of this application.

[0082] like Figure 11 As shown, this application provides a partial discharge defect device based on perfluoroisobutyronitrile as the insulating medium, including a platform construction and parameter acquisition module 100, a discharge simulation module 200, a data extraction module 300, and a defect identification module 400.

[0083] The platform construction and parameter acquisition module 100 is used to construct a test platform for partial discharge using perfluoroisobutyronitrile as the insulating medium, and to acquire partial discharge parameters.

[0084] The discharge simulation module 200 is used to control the test platform to simulate partial discharge of the insulating medium according to the partial discharge parameters and obtain partial discharge pulse signals.

[0085] The data extraction module 300 is used to extract time-domain and frequency-domain data from the partial discharge pulse signal as partial discharge data, construct a phase-resolved spectrum based on the partial discharge data, and extract identification data from the phase-resolved spectrum, including average discharge quantity, pulse count, and discharge pulse phase angle.

[0086] The defect identification module 400 is used to identify the type of partial discharge defect in the insulating medium based on the identification data.

[0087] It should be noted that the modules in this partial discharge defect device based on perfluoroisobutyronitrile (PFIR) as the insulating medium correspond to the steps in the partial discharge defect method based on PFIR as the insulating medium. The steps of the partial discharge defect method based on PFIR as the insulating medium have already been described in Embodiment 1, and will not be repeated in this embodiment. This partial discharge defect device based on PFIR as the insulating medium utilizes a platform construction and parameter acquisition module, a discharge simulation module, a data extraction module, and a defect identification module in cooperation to determine the type of partial discharge defect in the insulating medium based on the identified data.

[0088] In one embodiment of this application, the defect identification module 400 is further configured to determine the partial discharge defect type as a particulate defect based on the following: the average discharge quantity is a first charge threshold, the pulse count is a first count threshold, and the discharge pulse phase angle is a first phase threshold; or the partial discharge defect type is a solid metal protrusion defect based on the following: the average discharge quantity is a second charge threshold, the pulse count is a second count threshold, and the discharge pulse phase angle is a second phase threshold; or the partial discharge defect type is a contamination defect based on the following: the average discharge quantity is a fourth charge threshold, the pulse count is a fourth count threshold, and the discharge pulse phase angle is a fourth phase threshold.

[0089] In one embodiment of this application, the first power threshold is 459mV, the first counting threshold is 183N / s, and the first phase threshold is 0°~360°; and / or, the second power threshold is 32mV, the second counting threshold is 42N / s, and the second phase threshold is 61°~102°; and / or, the third power threshold is 42mV, the third counting threshold is 504N / s, and the third phase threshold is 46°~130° and 254°~302°; and / or, the fourth power threshold is 244mV, the fourth counting threshold is 187N / s, and the fourth phase threshold is 16°~118° and 182°~254°.

[0090] In one embodiment of this application, the test platform includes: a power frequency transformer, a protective resistor, a simulated gas chamber, a voltage dividing capacitor, a coupling capacitor, a detection element, and an oscilloscope. An inductive voltage regulator is installed on the power frequency transformer. The first terminal of the power frequency transformer is connected to the first terminal of the protective resistor. The second terminal of the protective resistor is connected to the first terminal of the simulated gas chamber, the first terminal of the voltage dividing capacitor, and the first terminal of the coupling capacitor, respectively. The second terminal of the coupling capacitor is connected to the first terminal of the detection element and the oscilloscope, respectively. The second terminal of the detection element, the second terminal of the simulated gas chamber, the second terminal of the voltage dividing capacitor, and the second terminal of the power frequency transformer are grounded. And / or, the partial discharge parameters include the power frequency voltage of the power frequency transformer, the transformation ratio of the power frequency transformer, the capacity of the power frequency transformer, the rated current on the secondary side of the power frequency transformer, the resistance value of the protective resistor, the voltage division ratio of the voltage dividing capacitor, the high-frequency current component of the coupling capacitor, the impedance of the detection element, the sampling rate, and the simulated bandwidth.

[0091] Example 3:

[0092] Figure 12 This is a schematic diagram of the terminal device described in an embodiment of this application.

[0093] like Figure 12 As shown, this application provides a terminal device, including a processor and a memory;

[0094] Memory is used to store program code and transfer the program code to the processor;

[0095] The processor is used to execute the above-described partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium according to the instructions in the program code.

[0096] It should be noted that the processor is used to execute the steps in the above-described embodiment of a partial discharge defect treatment method based on perfluoroisobutyronitrile as the insulating medium, according to the instructions in the program code. Alternatively, when the processor executes the computer program, it implements the functions of each module / unit in the above-described system / device embodiments.

[0097] For example, a computer program can be divided into one or more modules / units, one or more of which are stored in memory and executed by a processor to complete this application. One or more modules / units can be a series of computer program instruction segments capable of performing a specific function, which describe the execution process of the computer program in a terminal device.

[0098] Terminal devices can be computing devices such as desktop computers, laptops, handheld computers, and cloud servers. Terminal devices may include, but are not limited to, processors and memory. Those skilled in the art will understand that this does not constitute a limitation on the terminal device, which may include more or fewer components than illustrated, or combinations of certain components, or different components. For example, a terminal device may also include input / output devices, network access devices, buses, etc.

[0099] The processor can be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (dSICs), off-the-shelf programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor can be a microprocessor or any conventional processor, etc.

[0100] Memory can be an internal storage unit of a terminal device, such as a hard drive or RAM. Memory can also be an external storage device, such as a plug-in hard drive, smart memory card (SMC), secure digital card (SD) card, or flash card. Furthermore, memory can include both internal and external storage units. Memory is used to store computer programs and other programs and data required by the terminal device. Memory can also be used to temporarily store data that has been output or will be output.

[0101] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0102] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection between apparatuses or units through some interfaces, and may be electrical, mechanical, or other forms.

[0103] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0104] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0105] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0106] The above-described embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.

Claims

1. A method for addressing partial discharge defects based on perfluoroisobutyronitrile (PFO) as the insulating medium, characterized in that, Includes the following steps: A test platform for partial discharge using perfluoroisobutyronitrile (PFOS) as the insulating medium was constructed, and partial discharge parameters were obtained. The test platform is controlled according to the partial discharge parameters to simulate partial discharge on the insulating medium, thereby obtaining a partial discharge pulse signal. Time-domain and frequency-domain data are extracted from the partial discharge pulse signal as partial discharge data, and a phase-resolved spectrum is constructed based on the partial discharge data; identification data is extracted from the phase-resolved spectrum, and the identification data includes average discharge quantity, pulse count, and discharge pulse phase angle. The type of partial discharge defect in the insulating medium is identified based on the identification data; The types of partial discharge defects in the insulating medium identified based on the identification data include: If the average discharge amount is a first charge threshold, the pulse count is a first count threshold, and the discharge pulse phase angle is a first phase threshold, then the partial discharge defect type is a particulate defect. If the average discharge amount is a second charge threshold, the pulse count is a second count threshold, and the discharge pulse phase angle is a second phase threshold, then the partial discharge defect type is a solid metal protrusion defect. If the average discharge quantity is a third charge threshold, the pulse count is a third count threshold, and the discharge pulse phase angle is a third phase threshold, then the partial discharge defect type is a contamination defect. If the average discharge quantity is a fourth charge threshold, the pulse count is a fourth count threshold, and the discharge pulse phase angle is a fourth phase threshold, then the partial discharge defect type is an air gap defect. The first power threshold is 459mV, the first counting threshold is 183N / s, and the first phase threshold is 0°~360°; and / or, the second power threshold is 32mV, the second counting threshold is 42N / s, and the second phase threshold is 61°~102°; and / or, the third power threshold is 42mV, the third counting threshold is 504N / s, and the third phase threshold is 46°~130° and 254°~302°; and / or, the fourth power threshold is 244mV, the fourth counting threshold is 187N / s, and the fourth phase threshold is 16°~118° and 182°~254°.

2. The partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium according to claim 1, characterized in that, The test platform includes: a power frequency transformer, a protective resistor, a simulated gas chamber, a voltage divider capacitor, a coupling capacitor, a detection element, and an oscilloscope. The power frequency transformer is also connected to an inductive voltage regulator. The first terminal of the power frequency transformer is connected to the first terminal of the protective resistor. The second terminal of the protective resistor is connected to the first terminal of the simulated gas chamber, the first terminal of the voltage divider capacitor, and the first terminal of the coupling capacitor. The second terminal of the coupling capacitor is connected to the first terminal of the detection element and the oscilloscope. The second terminal of the detection element, the second terminal of the simulated gas chamber, the second terminal of the voltage divider capacitor, and the second terminal of the power frequency transformer are grounded.

3. The partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium according to claim 2, characterized in that, The partial discharge parameters include the power frequency voltage of the power frequency transformer, the transformation ratio of the power frequency transformer, the capacity of the power frequency transformer, the rated current on the secondary side of the power frequency transformer, the resistance value of the protection resistor, the voltage division ratio of the voltage dividing capacitor, the high-frequency current component of the coupling capacitor, the impedance of the detection element, the sampling rate, and the analog bandwidth.

4. A partial discharge defect device based on perfluoroisobutyronitrile as the insulating medium, characterized in that, It includes a platform construction and parameter acquisition module, a discharge simulation module, a data extraction module, and a defect identification module; The platform construction and parameter acquisition module is used to construct a test platform for partial discharge using perfluoroisobutyronitrile as the insulating medium, and to acquire partial discharge parameters. The discharge simulation module is used to control the test platform to simulate partial discharge on the insulating medium according to the partial discharge parameters, and to obtain a partial discharge pulse signal. The data extraction module is used to extract time-domain and frequency-domain data from the partial discharge pulse signal as partial discharge data, construct a phase-resolved spectrum based on the partial discharge data, and extract identification data from the phase-resolved spectrum, wherein the identification data includes average discharge quantity, pulse count, and discharge pulse phase angle. The defect identification module is used to identify the type of partial discharge defect in the insulating medium based on the identification data. The defect identification module is further configured to determine the partial discharge defect type as a particulate defect based on the following conditions: the average discharge quantity is a first charge threshold, the pulse count is a first count threshold, and the discharge pulse phase angle is a first phase threshold; or the partial discharge defect type is a solid metal protrusion defect based on the following conditions: the average discharge quantity is a third charge threshold, the pulse count is a third count threshold, and the discharge pulse phase angle is a third phase threshold; or the partial discharge defect type is a contamination defect based on the following conditions: the average discharge quantity is a fourth charge threshold, the pulse count is a fourth count threshold, and the discharge pulse phase angle is a fourth phase threshold. The first power threshold is 459mV, the first counting threshold is 183N / s, and the first phase threshold is 0°~360°; and / or, the second power threshold is 32mV, the second counting threshold is 42N / s, and the second phase threshold is 61°~102°; and / or, the third power threshold is 42mV, the third counting threshold is 504N / s, and the third phase threshold is 46°~130° and 254°~302°; and / or, the fourth power threshold is 244mV, the fourth counting threshold is 187N / s, and the fourth phase threshold is 16°~118° and 182°~254°.

5. The partial discharge defect device based on perfluoroisobutyronitrile as the insulating medium according to claim 4, characterized in that, The test platform includes: a power frequency transformer, a protective resistor, a simulated gas chamber, a voltage dividing capacitor, a coupling capacitor, a detection element, and an oscilloscope. The power frequency transformer is also connected to an inductive voltage regulator. The first terminal of the power frequency transformer is connected to the first terminal of the protective resistor. The second terminal of the protective resistor is connected to the first terminal of the simulated gas chamber, the first terminal of the voltage dividing capacitor, and the first terminal of the coupling capacitor. The second terminal of the coupling capacitor is connected to the first terminal of the detection element and the oscilloscope. The second terminal of the detection element, the second terminal of the simulated gas chamber, the second terminal of the voltage dividing capacitor, and the second terminal of the power frequency transformer are grounded. And / or, the partial discharge parameters include the power frequency voltage of the power frequency transformer, the transformation ratio of the power frequency transformer, the capacity of the power frequency transformer, the rated secondary current of the power frequency transformer, the resistance value of the protective resistor, the voltage division ratio of the voltage dividing capacitor, the high-frequency current component of the coupling capacitor, the impedance of the detection element, the sampling rate, and the analog bandwidth.

6. A terminal device, characterized in that, Including the processor and memory; The memory is used to store program code and transmit the program code to the processor; The processor is configured to execute the partial discharge defect method based on perfluoroisobutyronitrile as the insulating medium as described in any one of claims 1-3, according to the instructions in the program code.

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