Method and apparatus for measuring the angle of a planar light reflecting object
By recording initial parameters and deflection angles using an angle measurement device, and combining platform movement and beam path changes, the problem of inaccurate measurement caused by changes in the distance of the reflection point after the deflection of a planar light-reflecting object is solved, thus achieving more accurate and wider angle measurement.
Patent Information
- Application Number
- CN202411673403.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-21
- Publication Date
- 2025-12-09
- Estimated Expiration
- 2044-11-21
AI Technical Summary
In existing technologies, the change in distance between the reflection point and the light source after the object deflects on the plane leads to poor measurement accuracy.
An angle measurement device is used to record initial parameters and deflection angle parameters through a light source, a reflector, and a light receiver. By utilizing the movement of the platform and the change of the beam path, the deflection angle of the planar light-reflecting object is calculated. By combining interpolation to process non-coincident points, the accurate deflection angle and vertical distance are obtained.
This improves the accuracy and reliability of measuring the deflection angle of planar light-reflecting objects, expands the measurement range, and enhances the applicability and scope of use of the device.
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Figure CN119533342B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of angle measurement technology, and in particular to a method and apparatus for measuring the angle of a planar light-reflecting object. Background Technology
[0002] Angle measurement is an important component of metrology. With the continuous development of production and science, angle measurement is increasingly widely used in various fields such as mechanics, optics, aviation, aerospace, and navigation, and its technical level and measurement accuracy are constantly improving. Various angle measuring instruments have been developed to meet diverse needs. When a planar light-reflecting object deflects at a certain angle, the reflected light path will change accordingly. Therefore, measuring the deflection angle of a planar light-reflecting object is very important in practical applications.
[0003] Existing methods for measuring the angle of planar light-reflecting objects typically involve directly shining a light beam onto the object and reflecting it. The angle of the object is then determined by the change in the reflection angle. However, the distance from the reflection point to the light source changes after the object deflects, leading to inaccurate measurement results. Summary of the Invention
[0004] In view of this, the present invention proposes an angle measurement method and apparatus for planar light-reflecting objects, in order to solve the technical problem mentioned in the background art that the distance from the reflection point to the light source changes after the planar light-reflecting object is deflected, resulting in poor accuracy of the measurement results.
[0005] The technical solution of this invention is implemented as follows:
[0006] In a first aspect, the present invention provides a method for measuring the angle of a planar light-reflecting object, comprising:
[0007] An angle measuring device is used, comprising a curved light-reflecting object, a platform, a light source, at least one reflector, and a light receiver. The curved light-reflecting object is mounted on the platform. A directional light beam emitted from the light source is reflected by at least one of the reflectors onto the curved light-reflecting object. After being reflected by the curved light-reflecting object, the directional light beam is transmitted to the light receiver to record an initial parameter and a plurality of deflection angle parameters. The measurement methods for the initial parameter and the deflection angle parameters include:
[0008] The angle measuring device is assembled according to a predetermined test parameter, and is in an initial state. The deflection angle parameter of the light beam path falling on a first point of the light receiver in this initial state is recorded, and the deflection angle parameter of the first point is used as an initial parameter; and
[0009] moving the platform in a horizontal direction (x, y) so that a light beam path of the light source transmits through the curved light reflecting object, recording a plurality of deflection angle parameters of a plurality of points falling on the light receiver, each of the deflection angle parameters comprising at least an x-axis incident angle of the horizontal direction, a y-axis incident angle of the horizontal direction, a pixel X coordinate of the light receiver, and a pixel Y coordinate of the light receiver; and
[0010] replacing the curved light reflecting object in the initial state with a planar light reflecting object to be measured on the platform, recording a pixel coordinate (X', Y') of a measurement point on the light receiver after the directional light beam of the light source is reflected by the planar light reflecting object, and calculating a deflection angle of the planar light reflecting object by comparing the pixel coordinate of the measurement point with the initial parameter and the plurality of deflection angle parameters.
[0011] On the basis of the above technical solution, preferably, the relative positional relationship among the light source, the at least one reflecting mirror, and the light receiver is fixed.
[0012] On the basis of the above technical solution, preferably, the plurality of points falling on the light receiver are uniformly distributed with the first point as the center.
[0013] On the basis of the above technical solution, preferably, the deflection angle of the planar light reflecting object is calculated by comparing the pixel coordinate of the measurement point with the initial parameter and the plurality of deflection angle parameters, including: if the measurement point does not coincide with the first point or the plurality of points, an interpolation method is used to calculate the deflection angle.
[0014] On the basis of the above technical solution, preferably, the platform is further moved in a vertical direction z, and each of the deflection angle parameters further comprises: a change value Z of a distance through which the directional light beam of the light source is transmitted between the light receiver and the curved light reflecting object, and a z-axis incident angle of the vertical direction.
[0015] A vertical distance by which the planar light reflecting object is offset is obtained by comparing the measurement point with the initial parameter and the plurality of deflection angle parameters.
[0016] On the basis of the above technical solution, preferably, the predetermined test parameter comprises: a predetermined distance W through which the directional light beam of the light source is transmitted between the light receiver and the curved light reflecting object, an incident angle θ1 of a reflection point through which the light beam path of the light source is transmitted to the curved light reflecting object through the reflecting mirror, and a reflection angle θ2 of the light receiver relative to a normal line of the reflection point of the curved light reflecting object.
[0017] Preferably, the value of the incident angle θ1 is equal to the value of the negative reflection angle θ2.
[0018] In a second aspect, the application provides an angle measuring device for a planar light reflecting object, comprising a curved surface light reflecting object, a planar light reflecting object and a platform, and a light source, at least one mirror and a light receiver fixed in relative position relationship, wherein:
[0019] The platform is used for mounting the curved surface light reflecting object or the planar light reflecting object, and the platform is capable of moving in a horizontal direction;
[0020] The light source emits a directional light beam towards at least one of the mirrors;
[0021] At least one of the mirrors is used for reflecting the directional light beam as incident light onto the curved surface light reflecting object or the planar light reflecting object;
[0022] The light receiver is used for receiving reflected light beams reflected by the curved surface light reflecting object or the planar light reflecting object.
[0023] Preferably, the platform is also capable of moving in a vertical direction.
[0024] Preferably, two mirrors are provided, and the two mirrors have the same or different distances to the origin in the y direction in the horizontal direction.
[0025] The angle measuring method for the planar light reflecting object of the application has the following beneficial effects compared with the prior art:
[0026] (1) By establishing initial parameters and a plurality of deflection angle parameters, the planar light reflecting object is mounted on the platform instead of the curved surface light reflecting object, the pixel coordinates (X', Y') of the measuring points on the light receiver after the light beam of the light source is reflected by the planar light reflecting object are recorded, the deflection angle of the planar light reflecting object is calculated by comparing the pixel coordinates of the measuring points with the relationship between the initial parameters and the plurality of deflection angle parameters, the light source of the measuring method is unique, the deflection angle of the planar light reflecting object is obtained by comparison, and the result is accurate and reliable;
[0027] (2) The plurality of points on the light receiver are uniformly distributed with the first point as the center, so that the parameters of the plurality of points are more uniform, the distribution range is larger, the range of the deflection angle that can be measured is larger, and the applicability of the device is improved;
[0028] (3) If the measuring point does not coincide with the first point or the plurality of points, the deflection angle is calculated by interpolation, so that the measurement result is closer to the true value, and the accuracy and reliability of the measurement result are improved;
[0029] (4) By moving the platform in the vertical direction z, the vertical distance of the plane light reflecting object offset can be obtained by comparing the relationship between the measuring point and the initial parameters and the plurality of deflection angle parameters. Not only the attitude of the plane light reflecting object in the three-dimensional space can be obtained, but also the position of the plane light reflecting object in the three-dimensional space can be obtained, and the use range of the device is improved. BRIEF DESCRIPTION OF DRAWINGS
[0030] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed to be used in the embodiments or the prior art description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.
[0031] Figure 1 The structural schematic diagram of the angle measuring device for the plane light reflecting object in the embodiment of the present application;
[0032] Figure 2 The structural schematic diagram of the two reflecting mirrors (the first scheme) in the embodiment of the present application;
[0033] Figure 3 The structural schematic diagram of the two reflecting mirrors (the second scheme) in the embodiment of the present application;
[0034] Figure 4 The flowchart of the angle measuring method for the plane light reflecting object in the embodiment of the present application.
[0035] Explanation of reference numerals: 1 - curved surface light reflecting object, 2 - platform, 3 - light source, 4 - reflecting mirror, 5 - light receiver; 100 - plane light reflecting object. DETAILED DESCRIPTION
[0036] The technical solutions in the embodiments of the present application will be described clearly and completely in combination with the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.
[0037] Reference Figures 1-3As shown, a first aspect of the present invention provides an angle measuring device for a planar light-reflecting object, comprising a curved light-reflecting object 1 and a platform 2, and a light source 3, at least one reflector 4, and a light receiver 5 with fixed relative positions, wherein:
[0038] The platform 2 is used to install curved light-reflecting object 1 or planar light-reflecting object 100. The platform 2 is capable of moving in the horizontal direction. An x, y, z axis coordinate system is constructed, and the platform 2 is set parallel to the horizontal plane containing the x-axis and y-axis.
[0039] The directional light beam emitted by the light source 3 is directed toward at least one of the reflectors 4; the directional light beam may be a laser or other parallel light.
[0040] At least one of the reflectors 4 is used to reflect the directional light beam and then direct it as incident light onto the curved light reflector 1 or the planar light reflector 100.
[0041] The light receiver 5 is used to receive the reflected light beam after being reflected by the curved light reflecting object 1 or the flat light reflecting object 100.
[0042] It should be noted that the fixed relative positional relationship in this embodiment refers to the fixed relative position and angle of the light source 3, at least one reflector 4, and the light receiver 5. In the initial state, at least one reflector 4 can reflect the directional light beam emitted by the light source 3 and then incident on the curved light reflector 1 on the platform 2. The angle of the directional light beam incident on the curved light reflector 1 is uniform, and the distance from the reflection point of the curved light reflector 1 to the light receiver 5 is fixed. The path of the light beam emitted by the light source 3 is: light source 3 - reflector 4 - curved light reflector 1 or planar light reflector 100 - light receiver 5.
[0043] In some embodiments, the platform 2 is also capable of moving vertically. By moving the platform 2 vertically, the vertical distance of the offset of the planar light-reflecting object 100 can also be measured, thereby increasing the applicability of the device. The specific method for measuring the vertical distance of the offset of the planar light-reflecting object 100 will be described in detail in later method embodiments.
[0044] In some embodiments, such as Figure 2 As shown, two reflectors 4 are provided, and the two reflectors 4 are equidistant from the origin in the horizontal y-direction. The line connecting the center points of the two reflectors 4 is parallel to the horizontal x-axis. The light beam emitted by the light source 3 is reflected by one of the reflectors 4, then reflected again by the other reflector 4, and then incident on the curved light reflecting object 1 or the flat light reflecting object 100. By using two or more reflectors 4, the beam path can be changed, which facilitates the arrangement of the light source 3 and improves the convenience of arrangement.
[0045] In some embodiments, as shown in Figure 3 Two mirrors 4 are provided, and the distances from the two mirrors 4 to the origin in the horizontal direction y are different. The line connecting the center points of the two mirrors 4 has an angle with the horizontal direction x, and the light beam emitted by the light source 3 is reflected by one of the mirrors 4, then reflected by the other mirror 4, and then incident on the curved light reflecting object 1 or the planar light reflecting object 100. By using two or more mirrors 4, the light beam path can be changed, the arrangement of the light source 3 is facilitated, and the arrangement convenience is improved.
[0046] In combination with Figure 4 The second aspect of the present application provides a method for measuring the angle of a planar light reflecting object, which uses the device for measuring the angle of a planar light reflecting object according to the first aspect of the present application. The method comprises the following steps:
[0047] Step S1: Assemble the device for measuring the angle according to predetermined test parameters, and record the deflection angle parameter of the light beam path of the light source 3 falling on the first point of the light receiver 5 in the initial state, and take the deflection angle parameter of the first point as the initial parameter. The predetermined test parameters include: a predetermined distance W between the light source 3 and the curved light reflecting object 1, an incident angle θ1 of the light beam path of the light source 3 passing through the mirror 4 to a reflection point of the curved light reflecting object 1, and a reflection angle θ2 of the light receiver 5 relative to the normal line of the reflection point of the curved light reflecting object 1.
[0048] Step S2: Move the platform 2 in the horizontal direction (x, y) so that the light beam path of the light source 3 passes through the curved light reflecting object 1, and record a plurality of deflection angle parameters of a plurality of points falling on the light receiver 5, which include at least the x-axis incident angle in the horizontal direction, the y-axis incident angle in the horizontal direction, the pixel X coordinate of the light receiver 5, and the pixel Y coordinate of the light receiver 5.
[0049] In order to facilitate the understanding of the relationship between the initial parameter and the plurality of deflection angle parameters, the present embodiment will use numerical values to illustrate the relationship between the initial parameter and the plurality of deflection angle parameters. It should be understood that the numerical values of the initial parameter and the plurality of deflection angle parameters are not intended to limit the present application. Using different predetermined test parameters or different curved light reflecting objects 1, the numerical values of the initial parameter and the plurality of deflection angle parameters will be different.
[0050] Assume the initial parameters are: the x-axis incident angle of the light source 3 to the initial reflection point of the curved light reflecting object 1 is 10°, the y-axis incident angle is 0°, the pixel x coordinate of the light receiver 5 is 0, and the pixel y coordinate of the light receiver 5 is 0. Table 1 can be drawn as follows:
[0051] Table 1
[0052] x-axis incident angle y-axis incident angle pixel X coordinate pixel Y coordinate initial parameters 10° 0° 0 0
[0053] After the initial parameters are obtained, the next step is to collect the deflection angle parameters. In this process, the platform 2 moves along the horizontal direction (x, y) and drives the curved light reflecting object 1 to move along the horizontal direction (x, y). Since the curved light reflecting object 1 is curved, the movement of the curved light reflecting object 1 along the horizontal direction (x, y) is equivalent to the corresponding change of the incident angle.
[0054] For example, the curved light reflecting object 1 moves 1 point vector along the x-axis direction of the horizontal direction and 0 point vector along the y-axis direction of the horizontal direction. At this time, the x-axis incident angle of the light beam of the light source 3 to the curved light reflecting object 1 is equal to 11.233°, the y-axis incident angle is equal to 7.725°, and the light receiver 5 receives the light beam corresponding to the reflection of the curved light reflecting object 1 at the pixel x coordinate of 3.012 and the pixel y coordinate of 1.818. Table 2 can be drawn as follows:
[0055] Table 2
[0056] x-axis incident angle y-axis incident angle pixel X coordinate pixel Y coordinate initial parameters 10° 0° 0 0 angle parameter 1 11.233° 7.725° 3.012 1.818
[0057] Next, the curved light reflecting object 1 moves in different directions along the horizontal direction, and the corresponding pixel coordinates of the light receiver 5 are obtained. Table 3 can be drawn as follows:
[0058] Table 3
[0059] x-axis incident angle y-axis incident angle pixel X coordinate pixel Y coordinate initial parameters 10° 0° 0 0 angle parameter 1 11.233° 7.725° 3.012 1.818 angle parameter 2 13.875° 8.588° 17.288 -5.181 angle parameter 3 6.545° -12.657° -7.213 13.665 ... ... ... ... ...
[0060] Accordingly, the initial parameters and the deflection angle parameters are constructed. It should be particularly noted that the more deflection angle parameters obtained, the more accurate the subsequent deflection angle measurement of the planar light reflecting object 100 will be.
[0061] Step S3: the planar light-reflecting object 100 to be measured is installed on the platform 2 to replace the curved light-reflecting object 1 in the initial state, and the pixel coordinates (X', Y') of the measuring point on which the light beam of the light source 3 falls after being reflected by the planar light-reflecting object 100 are recorded, and the deflection angle of the planar light-reflecting object 100 is calculated by comparing the pixel coordinates of the measuring point with the initial parameters and the plurality of deflection angle parameters.
[0062] For example, if the pixel coordinates (X', Y') of the measuring point received by the light receiver 5 and reflected by the planar light-reflecting object 100 fall at (pixel X coordinate 17.288, pixel Y coordinate -5.181), it represents that the deflection angle of the planar light-reflecting object 100 is deflected by 13.875° along the x-axis direction and by 8.588° along the y-axis direction.
[0063] In some embodiments, the plurality of points falling on the light receiver 5 are uniformly distributed around the first point. By uniformly distributing the plurality of points around the first point falling on the light receiver 5, the parameters of the plurality of points are more uniform, the distribution range is larger, the range of the deflection angle that can be measured is larger, and the applicability of the device is improved.
[0064] In some embodiments, the deflection angle of the planar light-reflecting object 100 is calculated by comparing the pixel coordinates of the measuring point with the initial parameters and the plurality of deflection angle parameters, including: if the measuring point does not coincide with the first point or the plurality of points, the deflection angle is calculated by interpolation.
[0065] For example, if the pixel coordinates (X', Y') of the measuring point received by the light receiver 5 and reflected by the planar light-reflecting object 100 are X' = 1.506, which is half of the sum of the pixel X coordinates of the initial parameters and the angle parameter 1, and Y' = 0.606, which is 1 / 3 of the sum of the pixel Y coordinates of the initial parameters and the angle parameter 1, then the difference operation is performed between the initial parameters and the angle parameter 1, and the x-axis incidence angle of the corresponding light beam on the planar light-reflecting object 100 = (10 + 11.233) / 2 = 10.617°, and the y-axis incidence angle = (0 + 7.725) / 3 = 2.575°, that is, the deflection angle of the planar light-reflecting object 100 is deflected by 10.617° along the x-axis direction and by 2.575° along the y-axis direction.
[0066] In some embodiments, further comprising: moving the platform 2 in a vertical direction z, the deflection angle parameters further comprising: a change value Z of a distance of a light beam of the light source 3 passing between the light receiver 5 and the curved light reflecting object 1, and a z-axis incident angle of the vertical direction; and obtaining a vertical distance of the planar light reflecting object 100 offset by comparing the measured point with the initial parameters, the plurality of deflection angle parameters.
[0067] When the curved light reflecting object 1 moves in the three-dimensional space (x, y, z) to generate a plurality of deflection angle parameters, the method is similar to the foregoing embodiments, and thus is not described in detail. Unlike the foregoing embodiments, the vertical direction z movement of the curved light reflecting object 1 changes the distance W of the light beam of the light source 3 passing between the light receiver 5 and the curved light reflecting object 1, and the change value of these changes is the change value Z. In this way, Table 4 can be obtained as follows:
[0068] Table 4
[0069]
[0070] In this way, when the planar light reflecting object 100 is installed on the platform 2 instead of the curved light reflecting object 1, as described above, if the pixel point of the measured point reflected by the planar light reflecting object 100 and received by the light receiver 5 is at the pixel X coordinate 17.288 and the pixel Y coordinate -5.181, in addition to the deflection angle of the planar light reflecting object 100, the vertical distance of the planar light reflecting object 100 offset can be obtained as -0.454, and the position and attitude of the planar light reflecting object 100 in the three-dimensional space can be determined accordingly.
[0071] In some embodiments, the value of the incident angle θ1 is equal to the value of the reflection angle θ2.
[0072] The above only describes the preferred embodiments of the present application and is not intended to limit the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.
Claims
1. A method of measuring the angle of a planar light-reflecting object, characterized by, The application relates to a method for measuring an angle, comprising: using an angle measuring device, the angle measuring device comprising a curved light reflecting object, a platform, a light source, at least one reflecting mirror and a light receiver, the curved light reflecting object being installed on the platform, a directional light beam emitted by the light source being reflected by at least one of the reflecting mirrors onto the curved light reflecting object, the directional light beam being reflected by the curved light reflecting object and then transmitted onto the light receiver so as to record an initial parameter and a plurality of deflection angle parameters, the method for measuring the initial parameter and the deflection angle parameters comprising: assembling the angle measuring device according to a predetermined test parameter, at this time being in an initial state, recording a deflection angle parameter of a light beam path of the light source in the initial state falling on a first point of the light receiver, taking the deflection angle parameter of the first point as an initial parameter; and moving the platform in a horizontal direction (x, y) so that the light beam path of the light source transmits through the curved light reflecting object, recording a plurality of deflection angle parameters of a plurality of points falling on the light receiver, each of the deflection angle parameters comprising at least an x-axis incident angle of the horizontal direction, a y-axis incident angle of the horizontal direction, a pixel X coordinate of the light receiver and a pixel Y coordinate of the light receiver; and replacing the curved light reflecting object in the initial state with a planar light reflecting object to be measured on the platform, recording pixel coordinates (X', Y') of a measurement point of the directional light beam of the light source falling on the light receiver after being reflected by the planar light reflecting object, calculating a deflection angle of the planar light reflecting object by comparing the pixel coordinates of the measurement point with the initial parameter and the plurality of deflection angle parameters.
2. The method of claim 1, wherein the step of measuring the angle of the planar light reflecting object is performed by a method comprising: The relative position relationship of the light source, at least one of the reflecting mirrors and the light receiver is fixed.
3. The method of claim 1, wherein the step of measuring the angle of the planar light reflecting object is performed by a method comprising: The plurality of points falling on the light receiver are uniformly distributed with the first point as the center.
4. The method for measuring the angle of a planar light-reflecting object as described in claim 1, characterized in that, The deflection angle of the planar light reflecting object is calculated by comparing the pixel coordinates of the measurement point with the initial parameter and the plurality of deflection angle parameters, comprising: if the measurement point does not coincide with the first point or the plurality of points, an interpolation method is used to calculate the deflection angle.
5. The method of claim 1, wherein the step of measuring the angle of the planar light reflecting object is performed by using a light source and a light detector. The application further relates to a method for measuring an angle, comprising: moving the platform in a vertical direction z, each of the deflection angle parameters further comprising a change value Z of a distance of the directional light beam of the light source transmitting between the light receiver and the curved light reflecting object, and a z-axis incident angle of the vertical direction; obtaining a vertical distance of deflection of the planar light reflecting object by comparing the measurement point with the initial parameter and the plurality of deflection angle parameters.
6. The method of claim 1, wherein the step of measuring the angle of the planar optical reflecting article is performed by a method comprising: The predetermined test parameter comprises a predetermined distance W of the directional light beam of the light source transmitting between the light receiver and the curved light reflecting object, an incident angle θ1 of a reflection point of the light beam path of the light source transmitting to the curved light reflecting object through the reflecting mirror, and a reflection angle θ2 of the light receiver relative to a normal line of the reflection point of the curved light reflecting object.
7. The method of claim 6, wherein the step of measuring the angle of the planar optical reflecting article is performed by using a laser displacement sensor. The value of the incidence angle θ1 is equal to the value of the negative reflection angle θ2.
8. An apparatus for measuring an angle of a planar light reflecting article using the method for measuring an angle of a planar light reflecting article according to claim 1, characterized by, The system comprises a curved light-reflecting object, a flat light-reflecting object and a platform, and a light source, at least one mirror and a light receiver fixed in relative position relationship, wherein: The platform is used for mounting the curved light-reflecting object or the flat light-reflecting object, and the platform is capable of moving in horizontal direction; The light source emits a directional light beam towards at least one of the mirrors; At least one of the mirrors is used for reflecting the directional light beam as incident light onto the curved light-reflecting object or the flat light-reflecting object; The light receiver is used for receiving the reflected light beam reflected by the curved light-reflecting object or the flat light-reflecting object.
9. The apparatus of claim 8, wherein the light source is a laser diode. The platform is also capable of moving in vertical direction.
10. The apparatus of claim 8, wherein the light source is a laser diode. The mirror is provided with two mirrors, and the two mirrors are the same or different in distance to the origin in horizontal direction y.
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