An x-ray based dynamic measurement system for etch pit evolution

Abstract

The application discloses a kind of based on X-ray's pit evolution dynamic measurement system, it is related to lunar exploration technical field, including: X-ray generator module, lunar soil container module, imager module, data processing and analysis module, experimental control and synchronization module and data display and report module.The application based on X-ray's pit evolution dynamic measurement system, overcome the limitation of traditional visible light imaging technology under the dynamic interference of lunar dust, X-ray can penetrate lunar dust, not be affected by obstruction, ensure high signal-to-noise ratio and accurate pit data, the system passes through the attenuation information of X-ray after through lunar soil container, directly inverts the size, depth and evolution process of pit, provides high-precision, simple and convenient dynamic measurement, in addition, X-ray imaging can carry out three-dimensional structure reconstruction of pit, real-time tracking the morphological change of pit, enhance dynamic monitoring capability, X-ray system is more suitable for complex lunar environment, with higher experimental feasibility and reliability.

Description

TECHNICAL FIELD

[0001] The application relates to the technical field of rice crust cutting devices, in particular to a X-ray-based erosion pit evolution dynamic measurement system. BACKGROUND

[0002] With the deepening of human exploration of the moon, the lunar lander and the probe are faced with complex environmental challenges in the landing process, one of which is the erosion pit problem formed by the engine plume on the lunar surface. The strong airflow generated by the engine in the landing and take-off process causes strong erosion to the lunar surface material. The lunar dust is stirred up by the high-speed airflow and moves along the surface of the erosion pit, thereby affecting the stability of the lander and even possibly causing the destruction of the shape of the lander support surface. In addition, the reflection between the plume and the lunar surface also complicates the thermal protection evaluation, so it is particularly important to accurately and quickly monitor the lunar erosion process.

[0003] The existing lunar erosion pit simulation experiment usually uses a visible light camera to record the dynamic process of the erosion pit formed when the engine is working. However, this method based on visual images has many limitations. Due to the lunar dust under the action of the engine plume, part of the surface of the erosion pit is blocked, especially during the dynamic movement of the lunar dust, the line of sight is often blocked, making it difficult for the camera to clearly capture the image of the pit surface. In addition, the lunar surface itself lacks obvious texture features, which brings more challenges to visible light imaging. These factors make the traditional image method unreliable in real-time dynamic monitoring of the evolution of the lunar erosion pit, so there is an urgent need for a new technical means to overcome the limitations of visible light imaging technology, especially the difficulties in the problem of lunar dust blocking, to achieve efficient and accurate monitoring of the lunar erosion process. SUMMARY

[0004] The purpose of the present application is to provide a X-ray-based erosion pit evolution dynamic measurement system to solve the problems raised in the background.

[0005] A X-ray-based erosion pit evolution dynamic measurement system, comprising:

[0006] An X-ray generator module: the X-ray generator module is used to generate an X-ray beam and emit X-rays to a lunar soil container;

[0007] A lunar soil container module: the lunar soil container module is electrically connected with the X-ray generator module, and the lunar soil container module is used to simulate the lunar surface environment, place lunar soil, simulate lunar dust, and generate erosion pits under the action of the engine plume;

[0008] An imager module: the imager module is electrically connected with the lunar soil container module, and the imager module is used to receive the image formed after the X-rays penetrate the lunar soil container and convert the image into an electronic signal;

[0009] Data processing and analysis module: the data processing and analysis module is electrically connected with the imager module, and is used for processing and analyzing image data output by the imager based on an image processing algorithm, calculating the size, depth and evolution process of the etch pits;

[0010] Experiment control and synchronization module: the experiment control and synchronization module is electrically connected with the data processing and analysis module, the imager module, the lunar soil container module and the X-ray generator module, and is used for controlling the working state of the system, synchronously starting X-ray scanning, data acquisition and imaging operation, and ensuring the time sequence and accuracy of experimental data;

[0011] Data display and reporting module: the data display and reporting module is electrically connected with the experiment control and synchronization module, and is used for displaying the processed etch pit evolution data in a visual form and generating an experimental report.

[0012] Preferably, the X-ray generator module specifically comprises:

[0013] X-ray tube unit: the electron accelerator accelerates the electron flow to impact the anode target material through the vacuum tube, the anode material collides with the electron, and X-rays are released;

[0014] High-voltage power supply unit: the high-voltage power supply system accelerates the current to the speed required by the electron flow, and generates a high-energy electron beam;

[0015] X-ray beam adjustment unit: by selecting different filters, the energy spectrum of the X-ray beam is adjusted, the emission direction, intensity and width of the X-rays are controlled, so as to ensure that the X-ray beam accurately irradiates on the lunar soil container;

[0016] Cooling unit: based on the water cooling system, heat is taken away through the circulating water flow;

[0017] X-ray intensity control and monitoring unit: based on the X-ray intensity meter, the output intensity of the X-rays is monitored in real time, and the high-voltage power supply is adjusted according to the monitored intensity data to maintain constant output;

[0018] X-ray source shielding unit: based on the lead shielding, the X-ray radiation is blocked, the lead material prevents the radiation from spreading by absorbing or scattering the X-rays, and the laboratory environment is ensured to be safe.

[0019] Preferably, the lunar soil container module specifically comprises:

[0020] Lunar soil and lunar dust simulation unit: simulating the soil and dust on the moon surface, and reproducing the reaction of the lunar surface dust under the action of the engine plume;

[0021] Lunar soil conditioning unit: by controlling the pressure of the compaction device, simulating the physical properties of lunar soil, adjusting its looseness and density, making it simulate the real moon surface situation;

[0022] Vacuum chamber and environment conditioning unit: using a vacuum pump system to remove air from the container, maintaining a low pressure state, controlling the temperature inside the container, simulating the temperature difference between day and night on the moon, based on temperature and humidity monitoring equipment to monitor the temperature and humidity inside the container in real time;

[0023] Jet flow simulation unit: based on the experimental nozzle to simulate the gas flow of the jet, simulate the effect of engine plume on the moon surface, introduce gas into the nozzle, and adjust the gas flow rate through the control valve, simulate the plume intensity that occurs during the landing process on the moon, control the direction of the jet flow;

[0024] Erosion crater formation and monitoring unit: based on X-ray, sensor and laser scanning technology, real-time monitoring and recording the dynamic evolution process of the erosion crater in the lunar soil container;

[0025] X-ray detector unit: connected with X-ray generator, scanning the erosion crater in the lunar soil container, recording its morphological changes;

[0026] Sensor data collector unit: collects experimental parameters, including gas flow velocity, lunar soil temperature and lunar dust movement;

[0027] Computer analysis system: receives data output by sensors, analyzes through data processing software, generates the morphology of the erosion crater.

[0028] Preferably, the imager module specifically includes:

[0029] X-ray receiving unit: receives X-rays that penetrate the lunar soil container, converts X-ray signals into processable electronic signals;

[0030] Photodiode: converts the signal of the detector into an electrical signal;

[0031] Electronic amplifier: amplifies the signal from the detector to reach a suitable processing level;

[0032] Image data acquisition and processing unit: further processes the electronic signals obtained from the detector and conversion unit, converts them into digital images, and performs noise removal and gray value adjustment processing;

[0033] Image display and storage unit: displays the processed digital images, and stores the processed image data.

[0034] Preferably, the image data acquisition and processing unit specifically includes:

[0035] First, the signal obtained from the detector and the conversion unit is converted into a digital signal through an ADC;

[0036] The image is smoothed by calculating the average value of the neighborhood pixels, wherein the average value of the neighborhood pixels is calculated according to the following formula:

[0037]

[0038] In the formula, is the image after denoising, and is the size of the filter window, is the pixel value of the position in the input image, and are variables used to traverse the neighborhood range in the convolution operation;

[0039] The gray value of the image is adjusted based on histogram equalization, which improves the contrast of the image and enhances the details of the image, wherein the calculation formula based on histogram equalization is as follows:

[0040]

[0041] In the formula, is the cumulative distribution function of the original image gray value , and and are the minimum and maximum values of the CDF, respectively, is the number of gray levels;

[0042] After denoising and adjusting the gray value, the image data will be generated into the final X-ray image.

[0043] Preferably, the data processing and analysis module specifically comprises:

[0044] The feature extraction unit extracts the shape and size of the etch pit region based on the contour detection algorithm, calculates the area of the etch pit, and calculates the depth of the etch pit through the gray value and color value of the image combined with the imaging depth information of the imager;

[0045] The three-dimensional reconstruction and depth analysis unit reconstructs the three-dimensional model of the etch pit according to the image data of multiple different angles, calculates the relative depth of the etch pit based on the depth information of the image, performs surface fitting on the surface of the etch pit, calculates the surface normal and curvature parameters, and further infers the morphology and depth change;

[0046] Pit evolution analysis unit: analyze multi-time point image data, monitor the change process of the pit at different times, calculate the change of the pit including size, depth and morphology change by comparing the images at different time points, predict the further evolution trend of the pit based on regression analysis, and speculate the rate of pit expansion and deepening.

[0047] Preferably, the feature extraction unit specifically comprises:

[0048] Based on the contour detection algorithm, the pit boundary in the image is extracted, binaryzation processing is carried out, a binary image is obtained, the contour is found, a contour list is returned, each contour and its related information are extracted, and the area and boundary of the contour cannot be seen, wherein the contour detection algorithm formula is:

[0049]

[0050] In the formula, represents a set of points, is and is the coordinate of the point, represents that the value of a function at the coordinate point is 1, represents that the value of the function at the coordinate point is 0;

[0051] Through the contour information, the geometric features of the pit are calculated, and the output pit features include area, perimeter, shape description and depth.

[0052] Preferably, the three-dimensional reconstruction and depth analysis unit specifically comprises:

[0053] Three-dimensional reconstruction is performed on the images and depth data from different angles, three-dimensional point cloud data is extracted by using image data through structured light and stereo vision;

[0054] Filtering and denoising processing is performed on the reconstructed three-dimensional point cloud to retain key point cloud information, and a continuous three-dimensional surface model is obtained by using a point cloud reconstruction algorithm to convert sparse point cloud into continuous three-dimensional surface model, so as to obtain a three-dimensional mesh model approximating the surface of the pit;

[0055] Based on the three-dimensional point cloud data obtained by reconstruction, the relative depth of the pit in the three-dimensional space is calculated, the surface of the pit is fitted, the discrete point cloud is converted into a continuous smooth surface, so as to obtain the accurate geometric shape of the pit;

[0056] Based on the results of surface fitting, normal and curvature analysis, the morphological features of the pit are inferred, the surface is analyzed by region, different morphological regions are identified, and the differences of the morphology are further analyzed.

[0057] Preferably, the etch pit evolution analysis unit specifically comprises:

[0058] Obtain the geometric characteristics of the etch pit, calculate the changes in the shape, size and depth of the etch pit by comparing the etch pit areas at different time points;

[0059] Combine the depth map data to calculate the depth changes of the etch pit at different time points, evaluate the expansion and contraction of the etch pit by calculating the changes in the area of the etch pit at different time points, evaluate the shape changes of the etch pit, and determine whether there is expansion and deformation;

[0060] Use known change data, including etch pit area, depth and shape at different time points, to construct a regression model, use the etch pit change data at multiple time points as input to train the regression model, learn the rules of etch pit changes, fit the model, and obtain the prediction function of the etch pit evolution process;

[0061] Use the trained regression model to predict the change trend of the etch pit in the future, predict the future area, depth and shape changes of the etch pit, further infer the expansion and deepening rate of the etch pit, and obtain the long-term trend of the etch pit evolution.

[0062] Preferably, the regression model specifically comprises:

[0063] Wherein, the regression model expression is:

[0064]

[0065] In the formula, is the predicted target variable, is the time variable, is the intercept term in the model, is the first-order term coefficient in the model, is the second-order term coefficient, is the high-order term coefficient in the model, is the order of the polynomial.

[0066] By adopting the above technical solution, dynamic measurement of etch pit evolution is realized.

[0067] Compared with the prior art, the beneficial effects of the present application are:

[0068] The application is based on an X-ray-based erosion pit evolution dynamic measurement system, which overcomes the limitations of traditional visible light imaging technology under the dynamic interference of lunar dust, X-rays can penetrate lunar dust and are not affected by shielding, ensuring high signal-to-noise ratio and accurate erosion pit data, the system directly inverts the size, depth and evolution process of the erosion pit through the attenuation information of the X-rays after penetrating the lunar soil container, provides high-precision and simple dynamic measurement, in addition, X-ray imaging can perform three-dimensional structure reconstruction of the erosion pit, real-time track the morphological changes of the erosion pit, and enhance the dynamic monitoring capability, compared with the traditional image method, the X-ray system is more suitable for complex lunar environment, has higher experimental feasibility and reliability, and provides solid data support for lunar erosion research and lander design. BRIEF DESCRIPTION OF DRAWINGS

[0069] Figure 1 The system framework diagram of the application is shown in the figure;

[0070] Figure 2 The system internal framework diagram of the X-ray generator module in the application is shown in the figure;

[0071] Figure 3 The system internal framework diagram of the lunar soil container module in the application is shown in the figure;

[0072] Figure 4 The system internal framework diagram of the imager module in the application is shown in the figure;

[0073] Figure 5 The system internal framework diagram of the data processing and analysis module in the application is shown in the figure. DETAILED DESCRIPTION

[0074] The technical solutions in the embodiments of the application will be clearly and completely described below with reference to the drawings in the embodiments of the application. Obviously, the described embodiments are only part of the embodiments of the application, rather than all the embodiments. Based on the embodiments in the application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the application.

[0075] Please refer to Figures 1-5 The application provides a technical solution: an X-ray-based erosion pit evolution dynamic measurement system, comprising: an X-ray generator module: the X-ray generator module is used to generate an X-ray beam and emit X-rays to a lunar soil container;

[0076] A lunar soil container module: the lunar soil container module is electrically connected with the X-ray generator module, and the lunar soil container module is used to simulate a lunar environment, place lunar soil, simulate lunar dust, and generate erosion pits under the action of engine plume;

[0077] Imager module: The imager module is electrically connected to the lunar soil container module. The imager module is used to receive the image formed after the X-ray penetrates the lunar soil container and convert the image into an electronic signal.

[0078] Data processing and analysis module: The data processing and analysis module is electrically connected to the imager module. The data processing and analysis module is used to process and analyze the image data output by the imager based on image processing algorithms, calculate the size, depth, and evolution process of the etch pits.

[0079] Experimental control and synchronization module: The experimental control and synchronization module is electrically connected to the data processing and analysis module, imager module, lunar soil container module, and X-ray generator module. The experimental control and synchronization module is used to control the working state of the system, synchronize the start of X-ray scanning, data acquisition, and imaging operations, and ensure the timing and accuracy of experimental data.

[0080] Data display and reporting module: The data display and reporting module is electrically connected to the experimental control and synchronization module. The data display and reporting module is used to display the processed etch pit evolution data in a visual form and generate an experimental report.

[0081] Reference Figure 2 The X-ray generator module specifically includes:

[0082] X-ray tube unit: The electron accelerator accelerates the electron flow to impact the anode target material through the vacuum tube. The anode material collides with the electrons, releasing X-rays.

[0083] High-voltage power supply unit: The high-voltage power supply system accelerates the current to the speed required by the electron flow, generating a high-energy electron beam.

[0084] X-ray beam adjustment unit: By selecting different filters, the energy spectrum of the X-ray beam is adjusted, the emission direction, intensity, and width of the X-rays are controlled to ensure that the X-ray beam accurately irradiates the lunar soil container.

[0085] Cooling unit: Based on the water cooling system, the circulating water flow carries away heat.

[0086] X-ray intensity control and monitoring unit: Based on the X-ray intensity meter, the output intensity of the X-rays is monitored in real time. According to the monitored intensity data, the high-voltage power supply is adjusted to maintain constant output.

[0087] X-ray source shielding unit: Based on lead shielding, X-ray radiation is blocked. Lead material prevents radiation diffusion by absorbing or scattering X-rays, ensuring laboratory environment safety.

[0088] It is worth noting that X-rays can penetrate lunar dust, overcoming the limitations of traditional visible light imaging methods in dynamic lunar dust interference, and X-rays have high-resolution imaging capabilities, which can capture small changes in the dynamic erosion process.

[0089] Referring to Figure 3 As shown in the figure, the lunar soil container module specifically includes:

[0090] Lunar soil and lunar dust simulation unit: simulate the soil and dust on the moon, and reproduce the reaction of lunar dust under the action of engine plume;

[0091] Lunar soil conditioning unit: simulate the physical properties of lunar soil by controlling the pressure of the compaction device, adjust its looseness and density, and make it simulate the real lunar surface;

[0092] Vacuum chamber and environment conditioning unit: use a vacuum pump system to remove air from the container, maintain low pressure, control the temperature in the container, simulate the temperature difference between day and night on the moon, and monitor the temperature and humidity in the container in real time based on temperature and humidity monitoring equipment;

[0093] Jet flow simulation unit: simulate the gas flow based on the experimental nozzle, simulate the effect of engine plume on the moon, introduce gas into the nozzle, and adjust the gas flow rate through the control valve, simulate the plume intensity during the landing process on the moon, and control the jet direction;

[0094] Erosion crater formation and monitoring unit: based on X-ray, sensor and laser scanning technology, real-time monitoring and recording of the dynamic evolution process of the erosion crater in the lunar soil container;

[0095] X-ray detector unit: connected with X-ray generator, scanning the erosion crater in the lunar soil container, recording its morphological changes;

[0096] Sensor data collector unit: collects experimental parameters, including air flow velocity, lunar soil temperature and lunar dust movement;

[0097] Computer analysis system: receives data output by sensors, analyzes through data processing software, and generates the morphology of the erosion crater.

[0098] It is worth noting that the diameter, depth and width of the erosion crater are calculated, the boundary information of the erosion crater is extracted according to the sensor data, and the specific size is calculated, the surface profile of the erosion crater is reconstructed through high-precision processing of sensor data, and its three-dimensional morphology under different scales is displayed, helping to analyze the evolution process of the crater.

[0099] Referring to Figure 4 As shown in the figure, the imager module specifically includes:

[0100] X-ray receiving unit: receiving X-ray that penetrates the lunar soil container and converting the X-ray signal into a processable electronic signal;

[0101] Photodiode: converting the signal of the detector into an electrical signal;

[0102] Electronic amplifier: amplifying the signal from the detector to reach a suitable processing level;

[0103] Image data acquisition and processing unit: further processing the electronic signal obtained from the detector and conversion unit, converting it into a digital image, and performing noise removal and gray value adjustment processing;

[0104] Image display and storage unit: displaying the processed digital image and storing the processed image data;

[0105] First, the signal obtained from the detector and conversion unit is converted into a digital signal through an ADC;

[0106] The image is smoothed by calculating the average value of the neighborhood pixels, thereby removing noise, wherein the average value of the neighborhood pixels is calculated according to the following formula:

[0107]

[0108] In the formula, is the image after noise removal, and is the size of the filter window, is the pixel value of the input image at position , and are variables used to traverse the neighborhood range in the convolution operation;

[0109] The gray value of the image is adjusted based on histogram equalization to improve the contrast of the image and enhance the details of the image, wherein the calculation formula based on histogram equalization is as follows:

[0110]

[0111] In the formula, is the cumulative distribution function of the original image gray value , and are the minimum and maximum values of the CDF, respectively, is the number of gray levels;

[0112] After denoising and gray value adjustment, the image data will generate the final X-ray image.

[0113] Referring to Figure 5As shown, the data processing and analysis module specifically includes:

[0114] The feature extraction unit extracts the shape and size of the etch pit region based on a contour detection algorithm, calculates the area of the etch pit, and calculates the depth of the etch pit by combining the gray value and color value of the image with the imaging depth information of the imager;

[0115] The etch pit boundary in the image is extracted based on a contour detection algorithm, binarization processing is performed to obtain a binary image, the contour is searched, and a contour list is returned, each contour and its related information are extracted, and the area and boundary of the contour are unable to be seen, wherein the contour detection algorithm formula is:

[0116]

[0117] In the formula, represents a set of points, is and is the coordinate of the point, represents that the value of a function at the coordinate point is 1, represents that the value of the function at the coordinate point is 0.

[0118] The geometric characteristics of the etch pit are calculated through the contour information, and the output etch pit characteristics include area, perimeter, shape description, and depth.

[0119] The three-dimensional reconstruction and depth analysis unit reconstructs a three-dimensional model of the etch pit according to image data at multiple different angles, calculates the relative depth of the etch pit based on the depth information of the image, performs surface fitting on the etch pit surface, calculates the surface normal and curvature parameters, and further infers the morphology and depth variation thereof;

[0120] The image and depth data from different angles are reconstructed in three dimensions, and three-dimensional point cloud data is extracted through structured light and stereo vision using the image data;

[0121] The reconstructed three-dimensional point cloud is filtered and denoised to retain key point cloud information, and a continuous three-dimensional surface model is converted from the sparse point cloud using a point cloud reconstruction algorithm, thereby obtaining a three-dimensional mesh model approximating the surface of the etch pit;

[0122] Based on the reconstructed three-dimensional point cloud data, the relative depth of the etch pit in the three-dimensional space is calculated, the surface of the etch pit is fitted, the discrete point cloud is converted into a continuous smooth surface, and the accurate geometric shape of the etch pit is obtained;

[0123] Based on the results of surface fitting, normal and curvature analysis, the morphological characteristics of the pits are inferred, the surface is analyzed by partition, different morphological regions are identified, and the differences of the morphology are further analyzed.

[0124] The pit evolution analysis unit: analyzes the image data at multiple time points, monitors the change process of the pits at different times, compares the images at different time points, calculates the changes of the pits, including size, depth and morphology, predicts the further evolution trend of the pits based on regression analysis, and predicts the expansion and deepening rate of the pits;

[0125] The geometric characteristics of the pits are obtained, and the changes of the pit morphology, size and depth are calculated by comparing the pit regions at different time points;

[0126] Combined with the depth map data, the depth changes of the pits at different time points are calculated, the expansion and contraction of the pits are evaluated by calculating the area changes of the pits at different time points, the shape changes of the pits are evaluated, and whether there is expansion and deformation;

[0127] Using known change data, including pit area, depth and shape at different time points, a regression model is constructed, multiple time point pit change data is used as input to train the regression model, the change rule of the pit is learned, the model is fitted, and a prediction function of the pit evolution process is obtained;

[0128] Using the trained regression model, the change trend of the pits in the future is predicted, the future area, depth and morphology changes of the pits are predicted, the expansion and deepening rate of the pits is further predicted, and the long-term trend of the pit evolution is obtained;

[0129] Wherein, the regression model expression is:

[0130]

[0131] In the formula, is the predicted target variable, is the time variable, is the intercept term in the model, is the first-order term coefficient in the model, is the second-order term coefficient, is the high-order term coefficient in the model, is the order of the polynomial.

[0132] By adopting the above technical scheme, dynamic measurement of pit evolution is realized.

[0133] In summary, the advantages of the present application are:

[0134] X-rays can penetrate lunar dust, overcoming the limitations of traditional visible light imaging methods that cannot clearly capture crater images under dynamic lunar dust interference. X-rays have high-resolution imaging capabilities, can capture small changes in the dynamic erosion process, and provide detailed three-dimensional structural information of lunar erosion. X-rays can work in complex optical environments, especially in high-intensity airflow environments generated by engine plumes, and can effectively respond to high-contrast changes. The intensity attenuation of X-rays after penetrating the lunar soil container is directly related to factors such as the density and thickness of the lunar soil. Using this attenuation information, the measurement and calculation process of the crater can be simplified, avoiding the complex image processing and feature extraction steps in traditional image methods.

[0135] Traditional visible light imaging technology is easily affected by dynamic movement of lunar dust, resulting in low image signal-to-noise ratio and difficulty in accurately observing changes in craters. X-rays can penetrate lunar dust and are not affected by its obstruction, ensuring the reliability and accuracy of the data.

[0136] Through the attenuation information of X-rays after penetrating the lunar soil container, the size and depth of the crater can be directly inverted, the calculation process is simple and additional errors are not easily introduced.

[0137] X-ray imaging can provide accurate three-dimensional geometric information for craters. By analyzing X-ray images at different time points, three-dimensional reconstruction of the crater can be performed, and changes in its shape and depth can be tracked, providing more accurate dynamic measurement data.

[0138] Compared with traditional image methods, X-ray imaging does not require complex optical lenses and image processing systems, but is based on simple detectors and sensors. It can be used in vacuum environments, has higher experimental feasibility, and has higher experimental repeatability. It can work stably under different experimental conditions, ensuring the reliability of experimental data and providing solid data support for engineering applications.

Claims

1. An X-ray based dynamic measurement system of etch pit evolution, characterized by, include: X-ray generator module: The X-ray generator module is used to generate an X-ray beam and emit X-rays into the lunar regolith container; Lunar soil container module: The lunar soil container module is electrically connected to the X-ray generator module. The lunar soil container module is used to simulate the lunar surface environment, place lunar soil, simulate lunar dust, and generate pits under the action of the engine plume. Imager module: The imager module is electrically connected to the lunar soil container module. The imager module is used to receive the image formed after X-rays pass through the lunar soil container and convert the image into an electronic signal. Data processing and analysis module: The data processing and analysis module is electrically connected to the imager module. The data processing and analysis module is used to process and analyze the image data output by the imager based on image processing algorithms, and calculate the size, depth and evolution process of the erosion pits. Experimental control and synchronization module: The experimental control and synchronization module is electrically connected to the data processing and analysis module, the imager module, the lunar soil container module, and the X-ray generator module. The experimental control and synchronization module is used to control the working status of the system, synchronously start X-ray scanning, data acquisition and imaging operations, and ensure the timing and accuracy of experimental data. Data Display and Reporting Module: The data display and reporting module is electrically connected to the experimental control and synchronization module. The data display and reporting module is used to display the processed pit evolution data in a visual form and generate an experimental report.

2. The X-ray based etch pit evolution dynamic measurement system of claim 1, wherein, The X-ray generator module specifically includes: X-ray tube unit: The electron accelerator accelerates the electron flow through the vacuum tube to collide with the anode target. The anode material collides with the electrons and releases X-rays. High-voltage power supply unit: Accelerates the current to the speed required for electron flow through a high-voltage power supply system, generating a high-energy electron beam; X-ray beam adjustment unit: By selecting different filters, the energy spectrum of the X-ray beam is adjusted, and the emission direction, intensity and width of the X-rays are controlled to ensure that the X-ray beam accurately irradiates the lunar soil container; Cooling unit: Based on a water cooling system, heat is removed through circulating water flow; X-ray intensity control and monitoring unit: Based on the X-ray intensity meter, it monitors the output intensity of X-rays in real time, and adjusts the high-voltage power supply according to the monitored intensity data to maintain a constant output; X-ray source shielding unit: Based on lead shielding to block X-ray radiation, lead material prevents radiation diffusion by absorbing or scattering X-rays, ensuring a safe laboratory environment.

3. The X-ray based etch pit evolution dynamic measurement system of claim 2, wherein, The lunar soil container module specifically includes: Lunar Soil and Dust Simulation Unit: Simulates the soil and dust on the lunar surface, reproducing the reaction of lunar dust under the action of engine plumes; Lunar Soil Adjustment Unit: By controlling the pressure of the compaction device, the physical properties of lunar soil are simulated, and its looseness and density are adjusted to simulate the conditions of the real lunar surface. Vacuum Chamber and Environmental Control Unit: The vacuum pump system is used to remove the air from the container, maintain a low pressure, control the temperature inside the container, simulate the temperature difference between day and night on the lunar surface, and monitor the temperature and humidity inside the container in real time based on temperature and humidity monitoring equipment. Jet simulation unit: based on the experimental nozzle to simulate the jet gas flow, simulate the effect of engine plume on the lunar surface, introduce gas into the nozzle, and adjust the gas flow rate by controlling the valve to simulate the plume intensity during the lunar landing process, control the jet direction; Erosion crater formation and monitoring unit: based on X-ray, sensor and laser scanning technology, real-time monitoring and recording the dynamic evolution process of the erosion crater in the lunar soil container; X-ray detector unit: connected with X-ray generator, scanning the erosion crater in the lunar soil container, recording its morphological changes; Sensor data collector unit: collects experimental parameters, including gas flow velocity, lunar soil temperature and lunar dust movement.

4. The X-ray based etch pit evolution dynamic measurement system of claim 3, wherein, The imager module specifically includes: X-ray receiving unit: receives X-rays that pass through the lunar soil container, and converts the X-ray signals into processable electronic signals; Image data acquisition and processing unit: further processes the electronic signals obtained from the detector and conversion unit, converts them into digital images, and performs noise removal and gray value adjustment processing; Image display and storage unit: displays the processed digital images and stores the processed image data.

5. The X-ray based etch pit evolution dynamic measurement system of claim 4, wherein, The image data acquisition and processing unit specifically includes: First, the signal obtained from the detector and conversion unit is converted into a digital signal through an ADC; Smooth the image by calculating the average value of the neighborhood pixels, where the average value of the neighborhood pixels is calculated as: ； wherein, is the denoised image, and is the size of the filter window, is the pixel value at position in the input image, and are variables used to traverse the neighborhood range in the convolution operation; Adjust the gray value of the image based on histogram equalization to improve the contrast of the image and enhance the details of the image, where the calculation formula based on histogram equalization is: ； where, is the original image gray value is the cumulative distribution function of and are the minimum and maximum values of the CDF, respectively, is the number of gray levels; After denoising and gray value adjustment, the image data will generate the final X-ray image.

6. The X-ray based etch pit evolution dynamic measurement system of claim 5, wherein, The data processing and analysis module specifically includes: Feature extraction unit: based on contour detection algorithm to extract the shape and size of the erosion crater region, calculate the area of the erosion crater, calculate the depth of the erosion crater through the gray value and color value of the image combined with the imaging depth information of the imager; Three-dimensional reconstruction and depth analysis unit: reconstruct the three-dimensional model of the erosion crater based on multiple images at different angles, calculate the relative depth of the erosion crater based on the depth information of the image, perform surface fitting on the surface of the erosion crater, calculate the surface normal and curvature parameters, and further infer its shape and depth change; Erosion crater evolution analysis unit: analyze the image data at multiple time points, monitor the change process of the erosion crater at different times, calculate the change of the erosion crater including size, depth and shape by comparing images at different time points, predict the further evolution trend of the erosion crater based on regression analysis, and speculate the rate of erosion crater expansion and deepening.

7. The X-ray based etch pit evolution dynamic measurement system of claim 6, wherein, The feature extraction unit specifically includes: Based on the contour detection algorithm to extract the erosion crater boundary in the image, perform binaryzation processing to obtain a binary image, find the contour and return a contour list, extract each contour and its related information, and cannot see the area and boundary of the contour, where the contour detection algorithm formula is: ； In the formula, Represents a set of points. yes and These are the coordinates of that point. Indicates at coordinate point A function at a certain position The value is 1. Indicates at coordinate point Above, function The value is 0; Calculate the geometric features of the erosion crater through the contour information, and output the erosion crater features including area, perimeter, shape description and depth.

8. The X-ray based etch pit evolution dynamic measurement system of claim 7, wherein, The three-dimensional reconstruction and depth analysis unit specifically includes: The three-dimensional reconstruction is performed on the images and depth data from different perspectives, the three-dimensional point cloud data is extracted by using the image data and through the structured light and stereo vision; The reconstructed three-dimensional point cloud is filtered and denoised to retain key point cloud information, the sparse point cloud is converted into a continuous three-dimensional surface model by using a point cloud reconstruction algorithm, and a three-dimensional mesh model approximating the surface of the etch pit is obtained; Based on the reconstructed three-dimensional point cloud data, the relative depth of the etch pit in the three-dimensional space is calculated, the surface of the etch pit is fitted, the discrete point cloud is converted into a continuous smooth surface, and thus the accurate geometric shape of the etch pit is obtained; Based on the results of the surface fitting, the normal and the curvature analysis, the morphological characteristics of the etch pit are inferred, the surface is analyzed by zones, and different morphological regions are identified, and the differences in the morphology are further analyzed.

9. The X-ray based etch pit evolution dynamic measurement system of claim 8, wherein, The etch pit evolution analysis unit specifically includes: The geometric characteristics of the etch pit are obtained, the changes in the morphology, size and depth of the etch pit are calculated by comparing the etch pit regions at different time points; In combination with the depth map data, the depth changes of the etch pit at different time points are calculated, the expansion and contraction of the etch pit are evaluated by calculating the area changes of the etch pit at different time points, the shape changes of the etch pit are evaluated, and whether there is expansion and deformation; Using the known change data including the etch pit area, depth and shape at different time points, a regression model is constructed, the etch pit change data at multiple time points is taken as input to train the regression model, the change rule of the etch pit is learned, the model is fitted, and a prediction function of the etch pit evolution process is obtained; Using the trained regression model, the change trend of the etch pit in the future period of time is predicted, the future area, depth and morphological changes of the etch pit are predicted, the expansion and deepening rate of the etch pit is further inferred, and the long-term trend of the etch pit evolution is obtained.

10. The X-ray based etch pit evolution dynamic measurement system of claim 9, wherein, The regression model specifically includes: The regression model expression is: ​ ； wherein is the target variable to be predicted, is the time variable, is the intercept term in the model, is the linear term coefficient in the model, is the quadratic term coefficient, is the higher order term coefficient in the model, is the order of the polynomial.

Images