Spatial symmetry measurement device and method

Abstract

The present invention belongs to the field of mechanical processing, and relates to a spatial symmetry measuring device and method, which can realize the measurement of symmetry within a spatial range. The spatial symmetry measuring device includes: a first measuring seat and a second measuring seat. The first measuring seat includes a first measuring plate and a first mapping plate, and a plurality of first measuring holes are arranged on the first measuring plate, and the first mapping plate is vertically fixed to the first measuring plate. The second measuring seat includes a second measuring plate and a second mapping plate, and a plurality of second measuring holes are arranged on the second measuring plate, and the second mapping plate is vertically fixed to the second measuring plate. The spatial symmetry measuring device method includes: the first measuring holes on the first measuring plate are fixedly connected to the first mounting holes on both sides of the reference on the first plane, and the second measuring holes on the second measuring plate are fixedly connected to the second mounting holes on both sides of the reference on the second plane, and the spacing difference between the first mapping plate and the second mapping plate is obtained twice.

Description

Technical Field

[0001] The invention belongs to the field of mechanical processing and relates to a spatial symmetry measuring device and method. Background Art

[0002] In mechanical equipment, some large frame workpieces are distributed with a large number of interrelated spatial structures, and interrelated matching parts or integral matching parts are usually installed on two mutually perpendicular sides of the spatial structure.

[0003] Among them, symmetry is a more common tolerance, and the reference of the symmetry of the position to be processed on the side surface is located on another vertical side surface.

[0004] During machining, the horizontal surface of the workpiece is machined with a vertical spindle tool, and the vertical surface of the workpiece is machined with a horizontal spindle tool. The workpiece is usually clamped once, and it is impossible to directly measure the symmetry in the spatial structure.

[0005] At present, when the processing position and the reference are located in two perpendicular planes, an angle head is often used to convert the spindle angle to take into account the problem that the reference and the processing position are in different planes. However, the precision of the angle head itself affects the accuracy of the spindle conversion angle. At the same time, it is also impossible to measure during the processing process and the spindle position cannot be adjusted in time, leaving hidden dangers for the subsequent processing accuracy, installation and quality. Summary of the invention

[0006] In order to overcome the defects in the above-mentioned related technologies, on the one hand, the present invention proposes a spatial symmetry measuring device, which can measure symmetry within a spatial range.

[0007] In order to achieve the above technical objectives, the present invention provides a spatial symmetry measuring device. The spatial symmetry measuring device comprises: a first measuring seat and a second measuring seat. The first measuring seat comprises a first measuring plate and a first mapping plate, at least one side of the first measuring plate is a plane, a plurality of first measuring holes are arranged on the first measuring plate, and the first mapping plate is vertically fixed to the first measuring plate. The second measuring seat comprises a second measuring plate and a second mapping plate, at least one side of the second measuring plate is a plane, a plurality of second measuring holes are arranged on the second measuring plate, and the second mapping plate is vertically fixed to the second measuring plate.

[0008] The first measurement plate is arranged horizontally, the second measurement plate is arranged vertically, and the first mapping plate is parallel to the second mapping plate.

[0009] Preferably, the spatial symmetry measuring device further comprises a locking assembly, which comprises: a locking plate and a locking rod. At least one side of the locking plate is a plane, the plane of the locking plate is coplanar with the plane of the first measuring plate, a threaded hole is provided on the locking plate, a locking hole is provided on the locking plate, and the locking hole is provided with an internal thread. The locking rod is a threaded rod, the locking rod is adapted to the locking hole, and one end of the locking rod contacts the first measuring plate.

[0010] Preferably, the first measuring seat further comprises a positioning member, which is vertically fixedly connected to the first measuring plate, and when the first measuring hole and the blind hole of the measured object are fastened by screws, the vertical side surface of the positioning member fits with the vertical side surface of the measured object.

[0011] On the other hand, the present invention also proposes a spatial symmetry measurement method, which is applied to a workpiece in which a reference and a measured surface are respectively in two planes, wherein the reference is set on a first plane, and at least two first mounting holes are set on the first plane on both sides of the reference, and the measured surface is a second plane, and at least two second mounting holes are set on the second plane.

[0012] The spatial symmetry measurement method adopts the spatial symmetry measurement device described in the above aspect, and the spatial symmetry measurement device includes: a first measurement plate, a first mapping plate, a second measurement plate and a second mapping plate.

[0013] The spatial symmetry measurement method includes: placing the first measurement plate on the first plane, and fixing the first measurement hole on the first measurement plate to the first mounting hole corresponding to one side of the reference. Placing the second measurement plate on the second plane, and fixing the second measurement hole on the second measurement plate to the second mounting hole corresponding to one side of the reference. Obtaining the spacing between the first mapping plate and the second mapping plate as the first distance. Placing the first measurement plate on the first plane, and fixing the first measurement hole on the first measurement plate to the first mounting hole corresponding to the other side of the reference. Placing the second measurement plate on the second plane, and fixing the second measurement hole on the second measurement plate to the second mounting hole corresponding to the other side of the reference. Obtaining the spacing between the first mapping plate and the second mapping plate as the second distance. Obtaining the difference between the first distance and the second distance as the symmetry.

[0014] Preferably, the spatial symmetry measuring device further comprises: a locking plate, a locking rod and a positioning member.

[0015] Before the first measuring hole on the first measuring plate is fixedly connected to the first mounting hole corresponding to the reference side, the spatial symmetry measuring method further includes: aligning the first measuring hole with the first mounting hole corresponding to the reference side, and setting screws in the first measuring hole and the first mounting hole, and the first measuring plate and the workpiece maintain relative sliding. The locking plate is fixed to the plane of the workpiece on which the first measuring plate is installed, and the locking rod is adjusted so that the positioning member fits the side perpendicular to the plane of the workpiece. The gap between the positioning member and the side perpendicular to the plane of the workpiece is less than the thickness of the feeler gauge of 1 / 10 of the symmetry tolerance value. The first measuring hole is fixedly connected to the first mounting hole.

[0016] The beneficial effects of the present invention are:

[0017] The symmetry detection of the spatial structure can be realized conveniently and quickly, the detection cycle can be reduced, and the detection accuracy can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or related technologies, the drawings required for use in the embodiments or related technical descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 is a structural diagram of the spatial symmetry measuring device of the present invention;

[0020] Figure 2 A top view of the spatial symmetry measuring device of the present invention;

[0021] Figure 3 It is a structural diagram of the first measuring seat of the spatial symmetry measuring device of the present invention;

[0022] Figure 4 A state diagram of the spatial symmetry measurement method of the present invention;

[0023] Figure 5 This is another state diagram of the spatial symmetry measurement method described in the present invention.

[0024] In the figure: 11, first measuring plate; 12, first mapping plate; 111, first measuring hole; 21, second measuring plate; 22, second mapping plate; 211, second measuring hole; 3, positioning member; 31, locking plate; 32, locking rod. DETAILED DESCRIPTION

[0025] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and easy to understand, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work belong to the scope of protection of the present invention.

[0026] In the description of the present invention, it should be understood that the terms "center", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0027] The terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, "plurality" means two or more.

[0028] like Figures 1 to 3 As shown, the present invention provides a spatial symmetry measuring device. The spatial symmetry measuring device comprises: a first measuring seat and a second measuring seat. The first measuring seat comprises a first measuring plate 11 and a first mapping plate 12, at least one side of the first measuring plate 11 is a plane, a plurality of first measuring holes 111 are arranged on the first measuring plate 11, and the first mapping plate 12 is vertically fixed to the first measuring plate 11. The second measuring seat comprises a second measuring plate 21 and a second mapping plate 22, at least one side of the second measuring plate 21 is a plane, a plurality of second measuring holes 211 are arranged on the second measuring plate 21, and the second mapping plate 22 is vertically fixed to the second measuring plate 21.

[0029] The first measurement plate 11 is arranged horizontally, the second measurement plate 21 is arranged vertically, and the first mapping plate 12 and the second mapping plate 22 are parallel.

[0030] The spatial symmetry measuring device further includes a locking assembly, which includes a locking plate 31 and a locking rod 32. At least one side of the locking plate 31 is a plane, and the plane of the locking plate 31 is coplanar with the plane of the first measuring plate 11. The locking plate 31 is provided with a threaded hole, and the locking plate 31 is provided with a locking hole, and the locking hole is provided with an internal thread. The locking rod 32 is a threaded rod, and the locking rod 32 is adapted to the locking hole, and one end of the locking rod 32 is in contact with the first measuring plate 11.

[0031] The first measuring seat further comprises a positioning member 3, which is vertically fixedly connected to the first measuring plate 11, and when the first measuring hole 111 and the blind hole of the measured object are fastened by screws, the vertical side surface of the positioning member 3 fits with the vertical side surface of the measured object.

[0032] In some examples, the processing may include two vertical planes, the first plane S is a horizontal plane, two through hole groups are arranged on the first plane S, the two through hole groups are symmetrically arranged, the symmetry line of the two through hole groups is the reference line, each through hole group has four through holes, the center point connection line of the four through holes is a square, and square through grooves are arranged on the horizontal plane between the four through holes.

[0033] The second plane Q is a vertical plane, on which two hole groups to be measured are arranged, and the two hole groups to be measured are symmetrically arranged with the reference line in the first plane S. Four through holes are arranged in each hole group to be measured.

[0034] The first measurement plate 11 is a square plate, and is provided with four first measurement holes 111 adapted to the four through holes on the through hole group. The first mapping plate 12 is a square plate, and is vertically fixedly connected to the first measurement plate 11 .

[0035] In this embodiment, a square through groove is provided between the four through holes of the first plane S, that is, the first mapping plate 12 can extend from the first plane S into the square through groove, and a positioning member 3 can be fixed on the first mapping plate 12, and the positioning member 3 can be a square plate, and the vertical side surface of the positioning member 3 is in contact with the side surface of the square through groove.

[0036] The first plane S may also be provided with other through holes in addition to the two through hole groups. The locking plate 31 of the locking assembly is a square plate. The locking plate 31 is fastened to other through holes on the first plane S through threaded holes. The locking rod 32 passes through the locking hole and contacts the first measuring plate 11. By twisting the locking rod 32, the positioning member 3 can be tightly attached to the side of the square through groove until a feeler gauge with a thickness of 1 / 10 of the symmetry tolerance value cannot be inserted between the positioning member 3 and the side of the square through groove, and the first measuring plate 11 is fastened to the first plane S.

[0037] The second measuring plate 21 is a square plate, on which a plurality of through holes corresponding to a hole group to be measured on the second plane Q are arranged, and the second measuring plate 21 is fixed to the second plane Q. The second mapping plate 22 is vertically fixed to the second measuring plate 21, and the second mapping plate 22 is kept parallel to the first mapping plate 12, so as to measure the distance between the first mapping plate 12 and the second mapping plate 22.

[0038] Then, the first measuring plate 11 is fixed to another through hole group on the first plane S by the above steps, and the second measuring plate 21 is fixedly connected to another through hole group to be measured on the second plane Q, and the spacing between the first mapping plate 12 and the second mapping plate 22 is measured again. The difference between the two spacings is the symmetry of the two through hole groups to be measured.

[0039] On the other hand, Figure 4 and Figure 5 As shown, the present invention also proposes a spatial symmetry measurement method, which is applied to a workpiece in which a reference and a measured surface are respectively in two planes, wherein the reference is set on a first plane, and at least two first mounting holes are set on the first plane on both sides of the reference, and the measured surface is a second plane, and at least two second mounting holes are set on the second plane.

[0040] The spatial symmetry measurement method adopts the spatial symmetry measurement device described in the above aspect, and the spatial symmetry measurement device includes: a first measurement plate, a first mapping plate, a second measurement plate and a second mapping plate.

[0041] The spatial symmetry measurement method comprises:

[0042] S1. The first measuring plate is placed in contact with the first plane, and a first measuring hole on the first measuring plate is fixedly connected to a first mounting hole corresponding to one side of the reference.

[0043] S2. The second measuring plate is placed in contact with the second plane, and the second measuring hole on the second measuring plate is fixedly connected to the second mounting hole corresponding to the reference side.

[0044] S3. Acquire a first distance L1 between the first mapping plate and the second mapping plate.

[0045] S4, placing the first measurement plate in contact with the first plane, and fixing the first measurement hole on the first measurement plate to the first mounting hole corresponding to the other side of the reference.

[0046] S5, placing the second measurement plate on the second plane, and fixing the second measurement hole on the second measurement plate to the second mounting hole corresponding to the other side of the reference. Obtaining the distance between the first mapping plate and the second mapping plate as a second distance L2.

[0047] S6. Acquire a difference between the first distance and the second distance as a degree of symmetry.

[0048] The spatial symmetry measuring device also includes: a locking plate, a locking rod and a positioning member.

[0049] Before the first measuring hole on the first measuring plate is fixedly connected to the first mounting hole corresponding to the reference side, the spatial symmetry measuring method further includes: aligning the first measuring hole with the first mounting hole corresponding to the reference side, and setting screws in the first measuring hole and the first mounting hole, and the first measuring plate and the workpiece maintain relative sliding. The locking plate is fixed to the plane of the workpiece on which the first measuring plate is installed, and the locking rod is adjusted so that the positioning member fits the side perpendicular to the plane of the workpiece. The gap between the positioning member and the side perpendicular to the plane of the workpiece is less than the thickness of the feeler gauge of 1 / 10 of the symmetry tolerance value. The first measuring hole is fixedly connected to the first mounting hole.

[0050] In the description of this specification, specific features, structures, materials or characteristics may be combined in an appropriate manner in any one or more embodiments or examples.

[0051] The above are only specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that can be easily thought of by a person skilled in the art within the technical scope disclosed by the present invention should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

Claims

1. A spatial symmetry measuring device, characterized in that: include: a first measuring seat, the first measuring seat comprising a first measuring plate and a first mapping plate, at least one side of the first measuring plate is a plane, a plurality of first measuring holes are arranged on the first measuring plate, and the first mapping plate is vertically fixed to the first measuring plate; a second measuring seat, the second measuring seat comprising a second measuring plate and a second mapping plate, at least one side of the second measuring plate being a plane, a plurality of second measuring holes being arranged on the second measuring plate, and the second mapping plate being vertically fixed to the second measuring plate; The first measurement plate is arranged horizontally, the second measurement plate is arranged vertically, and the first mapping plate is parallel to the second mapping plate.

2. The spatial symmetry measuring device according to claim 1, characterized in that: The spatial symmetry measuring device further comprises a locking assembly, and the locking assembly comprises: A locking plate, wherein at least one side of the locking plate is a plane, the plane of the locking plate is coplanar with the plane of the first measuring plate, the locking plate is provided with a threaded hole, the locking plate is provided with a locking hole, and the locking hole is provided with an internal thread; A locking rod, wherein the locking rod is a threaded rod, the locking rod is adapted to the locking hole, and one end of the locking rod is in contact with the first measuring plate.

3. The spatial symmetry measuring device according to claim 1, characterized in that: The first measuring seat also includes a positioning member, which is vertically fixedly connected to the first measuring plate, and when the first measuring hole and the blind hole of the measured object are fastened by screws, the vertical side surface of the positioning member fits with the vertical side surface of the measured object.

4. A spatial symmetry measurement method is applied to a workpiece whose reference surface and measured surface are located in two planes respectively, wherein: The reference is set on a first plane, and at least two first mounting holes are set on the first plane on both sides of the reference, and the measured surface is a second plane, and at least two second mounting holes are set on the second plane; The spatial symmetry measurement method adopts the spatial symmetry measurement device according to any one of claims 1 to 3, and the spatial symmetry measurement device comprises: a first measurement plate, a first mapping plate, a second measurement plate, and a second mapping plate; characterized in that the spatial symmetry measurement method comprises: The first measuring plate is placed in contact with the first plane, and the first measuring hole on the first measuring plate is fixedly connected to the first mounting hole corresponding to the reference side; The second measuring plate is placed in contact with the second plane, and the second measuring hole on the second measuring plate is fixedly connected to the second mounting hole corresponding to the reference side; Acquire a first distance between the first mapping plate and the second mapping plate; The first measuring plate is placed in contact with the first plane, and the first measuring hole on the first measuring plate is fixedly connected to the first mounting hole corresponding to the other side of the reference; The second measuring plate is placed in contact with the second plane, and the second measuring hole on the second measuring plate is fixedly connected to the second mounting hole corresponding to the other side of the reference; Acquire a distance between the first mapping plate and the second mapping plate as a second distance; The difference between the first distance and the second distance is obtained as the degree of symmetry.

5. The method for measuring spatial symmetry according to claim 4, characterized in that: The spatial symmetry measuring device further comprises: a locking plate, a locking rod and a positioning member; Before the first measuring hole on the first measuring plate is fixedly connected to the first mounting hole corresponding to the reference side, the spatial symmetry measurement method further includes: Align the first measuring hole with the first mounting hole corresponding to the reference side, and set screws in the first measuring hole and the first mounting hole, so that the first measuring plate and the workpiece maintain relative sliding; Fixing the locking plate to the plane of the workpiece on which the first measuring plate is installed, and adjusting the locking rod so that the positioning member is in contact with the side surface perpendicular to the plane of the workpiece; The gap between the side surface of the positioning member and the plane of the workpiece perpendicular to each other is less than the thickness of the feeler gauge of 1 / 10 of the symmetry tolerance value; The first measuring hole is fixedly connected to the first mounting hole.

Images