Method for measuring luminous flux

By setting up sampling points in the area to be monitored and collecting data using an irradiance meter, and combining direct and indirect measurement methods, the problem of inaccurate measurement of luminous flux under various distances and scenarios was solved, and accurate assessment of luminous flux was achieved.

CN119595095BActive Publication Date: 2025-12-19INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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Patent Information

Application Number
CN202311165236.6
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-09-11
Publication Date
2025-12-19
Estimated Expiration
2043-09-11

AI Technical Summary

Technical Problem

The lack of unified standards in existing technologies leads to inaccuracies in luminous flux measurement methods at various distances and in various scenarios, especially in long-distance measurement scenarios.

Method used

By setting up multiple sampling points in the area to be monitored, collecting irradiance data using a radiometer, and combining the irradiance data change trends over different time periods, the luminous flux is calculated using direct or indirect measurement methods. A suitable radiometer is selected, and a filter is used to screen the target wavelength band, thereby achieving accurate measurement of luminous flux.

Benefits of technology

It enables accurate measurement of luminous flux at different distances and areas, solves the problem of inaccurate luminous flux measurement, and is suitable for light energy assessment of target areas of arbitrary shape and distance.

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Abstract

The application provides a light flux metering method, comprising: determining a sampling point in a to-be-monitored region based on an irradiated region to determine area information of the to-be-monitored region; wherein the number of sampling points is N, and N is an integer greater than or equal to 1; placing an irradiance meter at the sampling point; wherein the irradiance meter is used for collecting irradiation data of the to-be-monitored region at the sampling point; and calculating light flux and irradiance of the to-be-monitored region based on the irradiation data. The light flux metering method provided by the application sets sampling points according to the area size of the to-be-measured region of the irradiated region, realizes flexible measurement and characterization of light flux in different distance and area region scenarios, avoids the problem of inaccurate light flux metering due to uneven light spots or unstable light flux, and is suitable for various application scenarios in different time periods to realize accurate measurement and characterization of light flux.
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Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of luminous flux measurement, in particular to a luminous flux measurement method. BACKGROUND

[0002] With the development of semiconductor devices, light illumination is more popular, and more and more non-natural light appears in people's daily life, such as incandescent lamps, neon lamps, ultraviolet lamps, and light emitted by electronic device screens such as mobile phones and computers. These non-natural light not only brings people a more colorful life, but also may cause harm, such as affecting the rhythm of plants and animals, damaging vision, etc. In order to avoid being invaded and disturbed by excessive light, people need to know the harmful nature and dose degree of light while contacting such light in daily use and experiments, so as to take protective measures. Therefore, it is necessary to determine the measurement method to measure the light energy and obtain reliable light energy information to understand the light energy and control the light energy at the appropriate level.

[0003] Luminous flux is one of the parameters that can effectively reflect light energy, therefore, the accuracy of luminous flux measurement is very important for accurate evaluation of light energy, and the existing luminous flux measurement method lacks unified specification. Common luminous flux measurement methods include the following two methods: chemical titration method, which is relatively complex and difficult to implement and accurately evaluate. Alternatively, it is applied to a close-range measurement scene, such as measuring luminous flux at a distance of 1 cm from the laser light outlet hole. This method often has the problem of inaccurate luminous flux measurement when applied to a long-distance measurement scene. How to realize accurate and convenient measurement of the luminous flux of the target area in various distance measurement scenes is a problem that needs to be solved at present. SUMMARY

[0004] (I) Technical problems to be solved

[0005] The present application provides a luminous flux measurement method for at least partially solving one of the above technical problems.

[0006] (II) Technical solutions

[0007] In one aspect, the present application provides a luminous flux measurement method, comprising: determining a sampling point in a to-be-monitored region based on area information of the to-be-monitored region of an irradiated region; wherein the number of sampling points is N, and N is an integer greater than or equal to 1; placing an irradiance meter at the sampling point; wherein the irradiance meter is used to collect irradiation data of the to-be-monitored region at the sampling point, the irradiation data at least including irradiance and luminous flux; and calculating the luminous flux and irradiance of the to-be-monitored region based on the irradiation data.

[0008] Optionally, the determining the sampling points in the to-be-detected region based on the area information comprises: obtaining area information of the to-be-detected region; determining the number of sampling points in the to-be-detected region according to the area information; and arranging the sampling points in the to-be-detected region based on a preset rule when the number of sampling points is not 1.

[0009] Optionally, the preset rule comprises an axial symmetry rule, a central symmetry rule and a parallel rule.

[0010] Optionally, the placing the irradiance meter at the sampling point comprises: obtaining a light source wavelength of the to-be-detected region; and selecting a corresponding irradiance meter based on the light source wavelength; wherein the measurement range of the irradiance meter is not less than the target light source wavelength range of the to-be-detected region.

[0011] Optionally, when there are multiple wave bands of the light source wavelength, a filter is placed at the irradiance meter to screen the target wave band.

[0012] Optionally, the placing the irradiance meter at the sampling point comprises: placing the irradiance meter perpendicular to the to-be-detected region.

[0013] Optionally, the calculating the luminous flux of the to-be-detected region based on the irradiation data comprises: obtaining instantaneous irradiation data and cumulative irradiation data in a specified time period; and determining a calculation method of the luminous flux based on the variation trend of the irradiation data in the specified time period.

[0014] Optionally, the obtaining the instantaneous irradiation data and the cumulative irradiation data in the specified time period comprises: setting an interval collection time of the irradiance meter, so that the irradiance meter collects multiple groups of irradiation data.

[0015] Optionally, the determining the calculation method of the luminous flux based on the variation trend of the irradiation data in the specified time period comprises: comparing the variation trend of the instantaneous irradiation data in time sequence; in a case where the variation condition of the irradiation data is less than a preset variation range, calculating the average value of the instantaneous irradiation data to determine the luminous flux; and in a case where the variation condition of the instantaneous irradiation data presents an upward trend or a downward trend, calculating the luminous flux in an indirect measurement manner.

[0016] Optionally, the calculating the luminous flux in the indirect measurement manner comprises: obtaining cumulative irradiation data of each sampling point in a specified time; calculating the luminous flux of the sampling point based on the cumulative irradiation data and the specified time; and calculating the luminous flux of the to-be-detected region based on the luminous flux of each sampling point.

[0017] (Three) beneficial effects

[0018] The luminous flux metering method provided by the application at least has the following beneficial effects:

[0019] The irradiation data is measured by setting multiple measuring target points and different time periods, and the light flux is calculated based on multiple sets of irradiation data, effectively solving the problem of inaccurate light flux measurement under multiple distances and different heat effect light sources, and realizing accurate evaluation of light energy of a target region of any shape and distance. BRIEF DESCRIPTION OF DRAWINGS

[0020] Figure 1 A flow chart of the light flux metering method in the embodiment of the application is schematically shown;

[0021] Figure 2 A sampling point example diagram in a small-area circular region in the embodiment of the application is schematically shown;

[0022] Figure 3 A sampling point example diagram in a large-area rectangular region in the embodiment of the application is schematically shown;

[0023] Figure 4 A structure diagram of an irradiance meter in the embodiment of the application is schematically shown.

[0024]

BRIEF DESCRIPTION OF DRAWINGS

[0025] 1 - light receiver; 2 - package appearance; 3 - transmission line; 4 - connection plug; 5 - connection jack; 6 - data display screen; 7 - adjustment selection button. DETAILED DESCRIPTION

[0026] To make the objectives, technical solutions and advantages of the present application clearer, further detailed description will be made to the present application with reference to the embodiments and the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all the other embodiments obtained by those skilled in the art without any creative work fall within the protection scope of the present application.

[0027] The terms used herein are only used for describing the specific embodiments, but not intended to limit the present application. The terms "include", "contain" and the like used herein indicate the existence of the described features, steps, operations and / or components, but do not exclude the existence or addition of one or more other features, steps, operations or components.

[0028] In the present application, unless specifically defined otherwise and limited in the specification, the terms "mount", "connect", "connection", "fixed", and the like, should be construed broadly and do not necessarily require a direct mechanical connection, but can also include an indirect connection through an intermediate medium, and can be a mechanical connection, an electrical connection or can be in communication with each other, and can be a direct connection or an indirect connection through an intermediate medium, or an internal communication of two elements or an interaction relationship between two elements. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0029] In the description of the present application, it should be understood that the terms "longitudinal", "length", "circumferential", "front", "back", "left", "right", "top", "bottom", "inner", "outer" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the purpose of facilitating the description of the present application and simplifying the description, and do not indicate or imply that the subsystems or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application.

[0030] Throughout the drawings, the same elements are denoted by the same or similar reference numerals. When it may cause confusion in understanding the present application, conventional structures or configurations will be omitted. Also, the shape, size, positional relationship of the components in the drawings do not reflect the true size, scale and actual positional relationship. In addition, in the claims, any reference symbol located between parentheses should not be construed as a limitation on the claims.

[0031] Similarly, in order to simplify the present application and help understand one or more of the various disclosed aspects, in the above description of the exemplary embodiments of the present application, various features of the present application are sometimes grouped together in a single embodiment, figure or description thereof. The description of the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In the description, the illustrative description of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0032] In addition, the terms "first", "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly indicating the number of the technical features indicated. Therefore, the features defined with "first", "second" can explicitly or implicitly include one or more of the features. In the description of the present application, the meaning of "multiple" is at least two, for example, two, three, etc., unless otherwise specifically defined.

[0033] In the present application, the center position of the measurement region is generally taken as the primary position for monitoring. According to the shape of the measurement region, measurement points are generally set in the edge region and in the process from the middle to the edge region. The irradiance size and the luminous flux of the overall monitoring region are compared and evaluated.

[0034] In the present application, the information for metering includes the luminous flux and the irradiance, i.e. the luminous flux per unit time.

[0035] In the description of the present application, when more stable data is needed, two ways are used to meter the same monitoring point at the same time, the most reliable one is selected as the calibration value, and more than 3 repeated detections are needed for statistical analysis to obtain the average value, so as to obtain more stable and reliable data. The data obtained by the irradiance meter of the comprehensive multiple target points are statistically analyzed.

[0036] In the present application, the data is measured by using an irradiance meter, and the wavelength of the measured light also needs to be determined, and the irradiance meter corresponding to the response wavelength band is selected accordingly. If the wavelength band to be measured is very accurate, and the spectrum of the light spot emitted by the light source is relatively wide, a filter is needed to filter out the noise. When the overall light energy of the light source needs to be evaluated, the filter is not needed.

[0037] In the description of the present application, the direct and indirect light energy measurement and calculation methods of the irradiance meter, and the arbitrary shape of the target measurement region and the arrangement mode of the multiple sampling points are all within the protection scope of the present application.

[0038] The present application aims to provide a luminous flux metering method, which realizes the accurate measurement of the luminous flux in different distances and different area regions. The present application obtains the target measurement region through the region position marking of the lighting device, sets multiple sampling points in the to-be-monitored region, evaluates the non-uniformity degree of the light spot based on the irradiance size of each sampling point, thereby evaluating the possible influence of the determined light on the irradiated object. And based on the thermal stability of the light source device, different ways are selected to determine the luminous flux, so that the obtained luminous flux is more accurate.

[0039] Figure 1 The flowchart of the luminous flux metering method in the embodiment of the present application is schematically shown.

[0040] As shown in Figure 1 The luminous flux metering method includes operation S110 to operation S130.

[0041] In operation S110, the sampling points in the to-be-monitored region are determined based on the area information of the to-be-monitored region of the irradiated region; wherein the number of sampling points is N, and N is an integer greater than or equal to 1.

[0042] In some embodiments, the area of ​​the light spot is positively correlated with the illumination distance, meaning that the area of ​​the region to be monitored increases with the increase of the illumination distance. After obtaining the area information of the region to be monitored at a certain distance, the number of sampling points in the region to be monitored is determined based on the area information.

[0043] Determining the number of sampling points in the area to be monitored based on area information includes: determining whether the area to be monitored is a large area or a small area by using a predetermined threshold (with the irradiance meter receiver as a reference).

[0044] When the area to be monitored is a small area, the number of sampling points in the area is 1, and this sampling point is set at the center of the small area, such as... Figure 2 As shown in the figure, the shaded areas represent sampling points.

[0045] When the area to be monitored is a large area, the number of sampling points is greater than one. Multiple sampling points are arranged in the area to be monitored based on preset rules, such as... Figure 3 As shown in the figure, the shaded areas represent sampling points. The preset rules include: axisymmetric rule, central symmetry rule, and parallel rule. Arranging the sampling points based on these preset rules can achieve better measurement results and enable accurate measurement of the luminous flux in the monitored area.

[0046] In operation S120, an irradiance meter is placed at the sampling point; wherein, the irradiance meter is used to collect irradiance data of the area to be monitored at the sampling point, and the irradiance data includes at least irradiance and luminous flux, wherein irradiance is luminous flux per unit time.

[0047] In some embodiments, an appropriate amplitude meter for collecting irradiance data needs to be selected based on the wavelength of the light source in the area to be monitored. Different radiometers have different measurement ranges; when the measurement range of the radiometer is not less than (covers) the wavelength of the light source in the area to be monitored, the obtained irradiance data is more accurate. An irradiance meter, after being packaged, is sensitive to the light being measured and can respond to it, transmitting the signal to a connected data component via electrical conduction, thus representing it in digital form. There are many types of irradiance meters; due to the different light-sensitive wavelengths of the absorbing materials, irradiance meters have corresponding response wavelengths as evaluation criteria. For this device, when in use, the receiver is placed vertically in the area being measured, and the data display is turned on to obtain instantaneous and cumulative measurement data.

[0048] Among them, the use of an irradiance meter to collect irradiance data has the advantages of higher accuracy and greater convenience. Compared with other irradiance measurement methods (such as titration), the irradiance meter has a wider range of applications, not only in laboratory settings but also in daily life. The irradiance data measured by the irradiance meter is less affected by the environment and has strong applicability.

[0049] Figure 4 The structure diagram of the irradiance meter is shown schematically, as shown in the figure, the irradiance meter comprises a light receiver 1, an encapsulation appearance 2, a transmission line 3, a connection plug 4, a connection jack 5, a data display screen 6 and an adjustment selection button 7. The irradiance meter is placed on the sampling point perpendicular to the area to be monitored, and the connection plug 4 is inserted into the connection jack 5, so that the irradiance data of the sampling point can be viewed through the data display screen. Figure 4

[0050] In the specific implementation process, the irradiance set is used to collect the irradiance data of the area to be monitored at the sampling point, including: 1) demarcating the target area (i.e. the area to be monitored); 2) marking the sampling point with paper and pen (or other); 3) the irradiance meter is turned on and ready, usually one person is responsible for operation and another person is responsible for recording data. 4) First, turn on the irradiance meter, and then turn on the light source; measure the irradiance and collect the irradiance data. For example, measure 16 groups of irradiance at equal intervals of 2 min within 30 min, and record the light flux for 30 min. 5) Analyze and count the irradiance to determine the light flux calculation method. 6) Repeat the experiment more than three times to improve the accuracy of the measurement results.

[0051] When the light emitted by the light source device includes multiple wave bands, a filter can be placed at the light receiver 1 of the irradiance meter, and the special coating layer on the filter can absorb the light of non-target wave bands, so as to realize the screening of the target wave band, so that the irradiance meter only receives the light of the target wave band and obtains the irradiance data of the target wave band, avoiding the problem that the irradiance data is inaccurate due to the energy of other non-target wave band light.

[0052] In operation S130, the light flux and the irradiance of the area to be monitored are calculated based on the irradiance data.

[0053] In some embodiments, if the light source device has good thermal insulation effect and the irradiance of the light is not easily affected by time, the light flux can be calculated by the instantaneous irradiance data (i.e. the irradiance). When the light source device has poor thermal insulation effect, it is easy to cause the output power of the light source device to be unstable, so that the irradiance of the light is greatly affected by time, at this time, the light flux needs to be calculated by the cumulative irradiance data.

[0054] By setting the interval collection time of the irradiance data, the irradiance meter can collect multiple groups of instantaneous irradiance data, obtain multiple groups of instantaneous irradiance data within a specified time period, determine the change trend of the irradiance data within the specified time period, and then obtain the thermal insulation effect of the light source device. Based on the thermal insulation effect of the light source device, the calculation method of the light flux is determined.

[0055] ​In the specific implementation process, the method for evaluating the heat insulation of the light source device comprises: monitoring data at multiple sampling points using an irradiance meter, respectively measuring irradiance, comparing the change of instantaneous irradiance with time, and obtaining the heat insulation of the light source device, and then using different light flux calculation methods to obtain corresponding light flux data.

[0056] The irradiance and light flux are measured and calculated by using direct monitoring method and indirect monitoring method.

[0057] The direct measurement method comprises: measuring multiple equally spaced instantaneous irradiance using an irradiance meter, and statistically obtaining an average value as the average irradiance, and then combining the time to obtain the total light flux. The indirect measurement method comprises: measuring the total light flux during the entire irradiation time using an irradiance meter, and then combining the time to obtain the average irradiance.

[0058] When the irradiance does not change significantly during the entire monitoring period, the data is relatively stable, the actual measured cumulative light flux is basically consistent with the light flux obtained by multiplying the average irradiance (which is the average of multiple instantaneous irradiance) and the time, and at this time, the direct measurement method is used for light flux measurement. When the irradiance changes greatly within the monitoring time, it indicates that the internal heat dissipation performance of the lighting device is poor, which affects the output of the light power, and at this time, the indirect measurement method should be used, that is, the total light flux is measured using an irradiance meter, and then the average irradiance is obtained by dividing the total light flux by the time. According to the light flux information (light flux and irradiance) measured by multiple target points, the uniformity of the light spot distribution is evaluated. The light flux data of the to-be-monitored region is obtained from the average value of the light flux data of each sampling point.

[0059] The change trend of instantaneous irradiance data is compared in time sequence, and in the case that the change of instantaneous irradiance data shows an upward trend or a downward trend, the light flux is calculated in an indirect measurement manner. The indirect measurement method for calculating the light flux comprises: obtaining the cumulative irradiance data of each sampling point within a specified time; calculating the light flux of the sampling point based on the cumulative irradiance data and the specified time; and calculating the light flux of the to-be-monitored region based on the light flux of each sampling point. For example, 16 groups of instantaneous irradiance data (i.e., measuring the instantaneous irradiance and the total light flux every 2 minutes) within 30 minutes are obtained, and if the irradiance data all shows an upward trend or a downward trend with time, the cumulative value of the light flux of the sampling point is effective data. The cumulative irradiance data of the sampling point is divided by the specified measurement time (i.e., 30 minutes) to obtain the average irradiance of the sampling point. The same operation is repeated for each sampling point to obtain the irradiance data of each sampling point, i.e., the total light flux and the average irradiance. The light flux and the average irradiance of the to-be-monitored region are calculated through the light flux and the average irradiance of each sampling point. The light flux of the to-be-monitored region is obtained from the average value of the light flux data of each sampling point.

[0060] The light flux measurement method provided by the present application sets sampling points according to the area size of the region to be measured, realizes accurate measurement of light flux in various distance and arbitrary irradiation area region scenarios, avoids inaccurate light flux measurement caused by uneven light spots, and realizes accurate and convenient measurement of light flux. The present disclosure provides a light flux measured by an irradiance meter. The measurable area is obtained by marking the position of the region reached by the lighting device, and different irradiances are obtained by measuring a plurality of sampling points, so as to evaluate the unevenness of the light spot and infer the possible influence of the light on the irradiated object. Moreover, the irradiance meter measurement method well monitors the internal packaging state of the lighting device, and a large difference indicates poor heat dissipation, which affects the service life of the circuit and device and has a greater impact on the irradiated object. When the difference is small, the data consistency is good, and the measured irradiance can be used to evaluate the light flux and better evaluate the influence of light on the irradiated object.

[0061] The present application is suitable for light flux statistics of equal plane light receiving regions and is also suitable for light energy data statistics of non-equal plane light irradiation regions. The present application standardizes the reliable calibration method of the irradiance meter for measuring the size of light energy, and realizes the use principle of safety and protection devices.

[0062] The above specific embodiments further illustrate the technical solutions of the present application, and it should be understood that the above description is only for specific embodiments of the present application and is not intended to limit the present application. Any modification, equivalent replacement, improvement, etc. within the spirit and principles of the present application should be included in the protection scope of the present application.

Claims

1. A method of photometric metrology, characterized by, The method comprises the following steps: determining sampling points in the to-be-monitored area based on area information of the to-be-monitored area of the irradiated area; wherein the number of sampling points is N, and N is an integer greater than or equal to 1; placing an irradiance meter at the sampling points; wherein the irradiance meter is used to collect irradiation data of the to-be-monitored area at the sampling points, and the irradiation data at least includes irradiance and luminous flux; calculating luminous flux and irradiance of the to-be-monitored area based on the irradiation data; the method for calculating luminous flux of the to-be-monitored area based on the irradiation data comprises the following steps: acquiring instantaneous irradiation data and cumulative irradiation data within a specified time period; determining the calculation method of luminous flux based on the change trend of irradiation data within the specified time period; the method for determining the calculation method of luminous flux based on the change trend of irradiation data within the specified time period comprises the following steps: comparing the change trend of instantaneous irradiation data in time sequence; in the case that the change condition of the irradiation data is less than the preset change range, the average value of the instantaneous irradiation data is calculated to determine the luminous flux; in the case that the change condition of the instantaneous irradiation data presents an upward trend or a downward trend, the luminous flux is calculated in an indirect measurement manner.

2. The luminous flux metrology method of claim 1, wherein, the method for determining the sampling points in the to-be-monitored area based on the area information comprises the following steps: acquiring area information of the to-be-monitored area; determining the number of sampling points in the to-be-monitored area according to the area information; in the case that the number of sampling points is not 1, arranging the sampling points in the to-be-monitored area based on a preset rule.

3. The luminous flux metrology method of claim 2, wherein, the preset rule comprises the following rules: axial symmetry rule, central symmetry rule and parallel rule.

4. The luminous flux metrology method of claim 1, wherein, the method for placing an irradiance meter at the sampling points comprises the following steps: acquiring the wavelength of the light source of the to-be-monitored area; selecting a corresponding irradiance meter based on the wavelength of the light source; wherein the measurement range of the irradiance meter is not less than the target light source wavelength range of the to-be-monitored area.

5. The luminous flux metrology method of claim 4, wherein, the method further comprises the following steps: when there are multiple wave bands of the wavelength of the light source, placing a filter at the irradiance meter to screen the target wave band.

6. The luminous flux metrology method of claim 4, wherein, the method for placing an irradiance meter at the sampling points comprises the following steps: the irradiance meter is placed vertically to the to-be-monitored area.

7. The luminous flux metrology method of claim 1, wherein, the method for acquiring instantaneous irradiation data and cumulative irradiation data within a specified time period comprises the following steps: setting the interval collection time of the irradiance meter, so that the irradiance meter collects multiple groups of irradiation data.

8. The luminous flux metrology method of claim 1, wherein, the method for calculating luminous flux in an indirect measurement manner comprises the following steps: acquiring the cumulative irradiation data of each sampling point within a specified time; calculating the luminous flux of the sampling point based on the cumulative irradiation data and the specified time; calculating the luminous flux of the to-be-monitored area based on the luminous flux of each sampling point.

Citation Information

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