A method, equipment, medium, and product for non-destructive measurement of coating thickness.

Abstract

This invention discloses a non-destructive measurement method, device, medium, and product for coating thickness, relating to the field of coating thickness measurement. The method includes: acquiring a phosphorescent beam; the phosphorescent beam is a beam obtained by irradiating the surface of a coating to be measured with an excitation beam emitted from an excitation source; the coating to be measured contains a phosphorescent substance, which emits a phosphorescent beam under stimulated emission; filtering the phosphorescent beam through a filter to obtain a single-wavelength phosphorescent beam; performing photoelectric data processing on the single-wavelength phosphorescent beam to obtain the phosphorescent intensity of the single wavelength; and determining the thickness of the coating to be measured based on the correspondence between the phosphorescent intensity of the single wavelength and the thickness of the coating. This invention achieves non-contact, non-destructive online measurement of coating thickness by doping the coating to be measured with a phosphorescent substance to give it the characteristic of stimulated emission of phosphorescence, and by determining the thickness of the coating to be measured through the relationship between the intensity of the phosphorescent beam emitted by the stimulated emission of phosphorescence and its thickness.

Description

Technical Field

[0001] This invention relates to the field of coating thickness measurement, and in particular to a non-destructive measurement method, equipment, medium, and product for coating thickness. Background Technology

[0002] With the development of aerospace technology, the temperature at the turbine inlet of aero-engines has gradually increased, exceeding the maximum withstand temperature of high-temperature alloy materials. Currently, the main methods to solve the high-temperature problem of turbine blades include developing materials with higher temperature resistance, developing advanced cooling technologies, and adopting thermal barrier coatings. Among these, thermal barrier coating technology is low-cost and an effective means to improve the temperature resistance of engine blades.

[0003] Thermal barrier coatings (TBCs) consist of a ceramic layer and a bonding layer, and are typically applied to the surface of turbine blade alloy substrates to ensure stable operation of the turbine blades in high-temperature environments. Due to prolonged operation in harsh environments, and the effects of thermal cycling loads, erosion corrosion, and other factors, TBCs can thin or even detach, potentially leading to turbine blade damage. Therefore, effective detection of the ceramic layer thickness in TBCs is a crucial research area in nondestructive testing. Furthermore, coating thickness is a key quality indicator of TBCs, affecting their service life, stress, and bonding strength, as well as the consumption and cost of coating materials. Therefore, monitoring the thickness of TBCs is essential.

[0004] To ensure the safe operation of turbine blades, it is necessary to monitor the thickness of the thermal barrier coating on the turbine blades in real time during the operation of the aero-engine. Currently, the main technologies applicable to the measurement of thermal barrier coating thickness include eddy current thickness measurement and ultrasonic thickness measurement, both of which are contact measurements. However, the harsh working environment of aero-engine turbine blades, characterized by high temperature, high pressure, and high speed, makes it difficult to install and operate contact coating thickness measurement devices. Therefore, there is an urgent need to invent a non-contact online thickness measurement method to support non-contact, non-destructive online measurement of thermal barrier coating thickness. Summary of the Invention

[0005] The purpose of this invention is to provide a non-destructive measurement method, device, medium, and product for coating thickness, which can realize non-contact, non-destructive online measurement of coating thickness.

[0006] To achieve the above objectives, the present invention provides the following solution:

[0007] In a first aspect, the present invention provides a non-destructive measurement method for coating thickness, the non-destructive measurement method for coating thickness comprising:

[0008] Acquire a phosphorescent beam; the phosphorescent beam is a beam obtained by irradiating the surface of the coating under test with an excitation beam emitted by an excitation source; the coating under test contains a phosphorescent substance, and the phosphorescent substance emits a phosphorescent beam upon stimulation.

[0009] The phosphorescent beam is filtered through a filter to obtain a phosphorescent beam of a single wavelength.

[0010] The phosphorescent beam of a single wavelength is subjected to photoelectric data processing to obtain the phosphorescent intensity of the single wavelength.

[0011] The thickness of the coating to be tested is determined based on the correspondence between the phosphorescence intensity of the single wavelength and the thickness of the coating to be tested.

[0012] Optionally, the expression for the relationship between the phosphorescence intensity of a single wavelength and the thickness of the coating to be measured is as follows:

[0013] J = I0·q·f(d,K,K1,S,S1);

[0014] Where J is the phosphorescence intensity of a single wavelength, I0 is the excitation light intensity, q is the quantum yield of phosphorescence, d is the thickness of the coating to be tested, K is the absorption coefficient of the coating to be tested for excitation light, K1 is the absorption coefficient of the coating to be tested for phosphorescence, S is the scattering coefficient of the coating to be tested for excitation light, and S1 is the scattering coefficient of the coating to be tested for phosphorescence.

[0015] Optionally, the wavelength of the phosphorescent beam is different from the wavelength of the excitation beam.

[0016] Optionally, the coating to be tested is a semi-transparent coating.

[0017] Optionally, the coating to be tested is a thermal barrier coating; the thermal barrier coating includes a ceramic layer and an adhesive layer.

[0018] The ceramic layer is a semi-transparent coating.

[0019] The adhesive layer is a transition layer between the ceramic layer and the metal substrate.

[0020] Optionally, the phosphorescent material is a rare earth ion.

[0021] Optionally, the material of the coating to be tested is a mixture of yttrium oxide-stabilized zirconium oxide substrate and phosphorescent material doping.

[0022] In a second aspect, the present invention provides a computer device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the non-destructive coating thickness measurement method described in any one of the above-described methods.

[0023] Thirdly, the present invention provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the non-destructive coating thickness measurement method described in any one of the above descriptions.

[0024] Fourthly, the present invention provides a computer program product, including a computer program that, when executed by a processor, implements the non-destructive measurement method for coating thickness described above.

[0025] According to specific embodiments provided by the present invention, the present invention discloses the following technical effects:

[0026] This invention provides a non-destructive measurement method, equipment, medium, and product for coating thickness. By doping the coating under test with phosphorescent material to give it the characteristic of stimulated phosphorescence, the thickness of the coating under test is determined by the relationship between the intensity of the phosphorescent beam emitted by the stimulated emission of phosphorescence and the thickness. This invention achieves non-contact, non-destructive online measurement of coating thickness and supports non-contact, non-destructive online measurement of thermal barrier coating thickness. Attached Figure Description

[0027] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0028] Figure 1 This is a flowchart illustrating a non-destructive measurement method for coating thickness according to an embodiment of the present invention.

[0029] Figure 2 This is a flowchart illustrating a non-destructive measurement method for the thickness of a translucent coating, as provided in an embodiment of the present invention.

[0030] Figure 3 This is a schematic diagram of a semi-transparent coating structure provided in an embodiment of the present invention.

[0031] Figure 4 This is a flowchart illustrating a non-destructive measurement method for thermal barrier coating thickness according to an embodiment of the present invention.

[0032] Figure 5 This is a schematic diagram of a thermal barrier coating structure provided in an embodiment of the present invention.

[0033] Figure 6 This is a schematic diagram of the structure of a computer device provided in an embodiment of the present invention.

[0034] Figure label:

[0035] 11. Semi-transparent coating; 12. Substrate; 21. Ceramic layer; 22. Adhesive layer; 23. Metal substrate. Detailed Implementation

[0036] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0037] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0038] In one exemplary embodiment, such as Figure 1 As shown, a non-destructive measurement method for coating thickness is provided, which includes the following steps S1 to S4. Wherein:

[0039] S1: Obtain a phosphorescent beam; the phosphorescent beam is a beam obtained by irradiating the surface of the coating under test with an excitation beam emitted by an excitation source; the coating under test contains phosphorescent material, and the phosphorescent material emits a phosphorescent beam upon stimulation.

[0040] S2: The phosphorescent beam is filtered through a filter to obtain a phosphorescent beam of a single wavelength.

[0041] S3: Perform photoelectric data processing on the single-wavelength phosphorescent beam to obtain the phosphorescent intensity of the single wavelength.

[0042] S4: Determine the thickness of the coating to be tested based on the correspondence between the phosphorescence intensity of the single wavelength and the thickness of the coating to be tested.

[0043] By implementing steps S1 to S4 above, the present invention enables non-contact, non-destructive online measurement of coating thickness by doping the coating with phosphorescent material to give it the characteristic of stimulated emission of phosphorescence, and by determining the thickness of the coating through the relationship between the intensity of the phosphorescent beam emitted by the coating under stimulated emission and the thickness.

[0044] like Figure 2 As shown, a non-destructive method for measuring the thickness of a translucent coating includes:

[0045] Step A1: The excitation light source emits an excitation beam that irradiates the surface of the translucent coating to be tested. The translucent coating to be tested contains phosphorescent material, which emits phosphorescent light beam when excited. The wavelength of the phosphorescent light beam is different from that of the excitation light.

[0046] like Figure 3 As shown, a translucent coating 11 is applied to the substrate 12.

[0047] The substrate 12 is usually a metal substrate. The semi-transparent coating 11 is a mixture of a semi-transparent matrix and a phosphorescent substance. The phosphorescent substance is a rare earth ion. The mixing should not affect the preparation process of the semi-transparent coating itself. After mixing, the matrix containing the phosphorescent substance is sprayed onto the surface of the substrate 12 by atmospheric plasma spraying or electron beam physical vapor deposition.

[0048] When the excitation light source emits an excitation beam that irradiates the surface of the translucent coating 11 to be tested, due to the translucent nature of the translucent coating 11 to the ultraviolet or visible light band where the excitation light is located, the excitation light can excite the phosphorescent material in the translucent coating 11 to produce phosphorescence when it propagates within the translucent coating 11.

[0049] The semi-transparent coating 11 has semi-transparent properties in the visible light band where phosphorescence is located, and phosphorescence can effectively penetrate the semi-transparent coating 11 to radiate outward.

[0050] Step A2: The phosphorescent beam with a relatively wide wavelength range is filtered by the filter into a single wavelength phosphorescent beam.

[0051] Phosphorescent light beams have a relatively wide wavelength range, which differs from that of the excitation beam. High-energy photons from the excitation beam excite the phosphorescent material from its ground state to an excited state. After vibrational relaxation and other processes, the excited photons distribute themselves to different excited state energy levels, consuming energy in the process. They then transition back to the ground state from these excited state levels, emitting phosphorescence. The energy of phosphorescent photons is lower than that of excitation photons, therefore, the phosphorescence wavelength is longer than the excitation wavelength. Because phosphorescence is emitted from the transitions between different excited state energy levels back to the ground state, the phosphorescence wavelength range is relatively wide.

[0052] To establish the correlation between phosphorescence intensity and the thickness of the translucent coating, it is necessary to obtain the absorption coefficient, scattering coefficient, transmittance, and reflectance of phosphorescence within the translucent coating, as well as the transmittance and reflectance at the boundaries. The absorption and scattering coefficients for a single wavelength are relatively easy to obtain. Therefore, to facilitate the establishment of this correlation, a filter is used to reduce the phosphorescence beam, which has a relatively wide wavelength range, to a single wavelength. To ensure sufficient phosphorescence intensity, a wavelength with high intensity should be selected as the detection wavelength.

[0053] Step A3: After the phosphorescent beam of a single wavelength is received by the photodetector, the light intensity of the phosphorescent beam can be obtained through data processing.

[0054] After a single-wavelength phosphorescent beam is received by a photodetector, the optical signal is converted into an electrical signal within the photodetector. The light intensity of the phosphorescent beam is then obtained based on the photoelectric properties of the photodetector.

[0055] Step A4: Based on the calibrated phosphorescence intensity and its correspondence with thickness, (prepare standard samples of different thicknesses, collect the phosphorescence signal of the standard samples, measure the phosphorescence intensity of different thicknesses, and thus establish the correspondence between phosphorescence intensity and thickness) determine the thickness of the semi-transparent coating 11 to be tested.

[0056] Based on the pre-calibrated relationship between phosphorescence intensity and thickness, the thickness of the translucent coating 11 to be tested is determined according to the phosphorescence intensity.

[0057] The relationship between phosphorescence intensity and thickness is expressed as follows:

[0058]

[0059] in,

[0060] Therefore, the above formula can be simplified as:

[0061] J = I0·q·f(d,K,K1,S,S1);

[0062] Where J is the phosphorescence intensity of a single wavelength, I0 is the excitation light intensity, q is the quantum yield of phosphorescence, d is the thickness of the coating to be tested, K is the absorption coefficient of the coating to be tested for excitation light, K1 is the absorption coefficient of the coating to be tested for phosphorescence, S is the scattering coefficient of the coating to be tested for excitation light, and S1 is the scattering coefficient of the coating to be tested for phosphorescence.

[0063] Wherein, K, K1, S, and S1 are related to the semi-transparent coating material and wavelength, and are constants once the semi-transparent coating material, excitation light, and phosphorescence wavelength are determined; q is related to the phosphorescent material and temperature, and is a constant at a stable temperature once the material is determined; I0 is the excitation light intensity, which is a constant once the excitation light is determined. Under constant temperature conditions, when a specific material is excited by excitation light of a specific wavelength, the phosphorescence intensity of that specific wavelength emitted is a single-valued function of the thickness. The thickness of the semi-transparent coating can be calculated through calibration and measurement of the phosphorescence intensity.

[0064] It should be noted that α, α1, β, β1, φ 1s , C1, C2, C3, and C4 are dependent variables of K, K1, S, and S1, and are intermediate variables in this embodiment. They only change when K, K1, S, and S1 change; if K, K1, S, and S1 do not change, these variables will not change. α and β are only related to the absorption coefficient K and scattering coefficient S of the coating under test for excitation light; α1 and β1 are only related to the absorption coefficient K1 and scattering coefficient S1 of the coating under test for phosphorescence; C1, C2, C3, and C4 are related to the absorption / scattering of excitation light and phosphorescence by the coating under test.

[0065] like Figure 4As shown, a non-destructive measurement method for thermal barrier coating thickness includes:

[0066] Step B1: An excitation light source emits an excitation beam to illuminate the surface of the thermal barrier coating to be tested. The thermal barrier coating to be tested includes a ceramic layer 21 and an adhesive layer 22. The ceramic layer is a semi-transparent coating. The ceramic layer 21 contains a phosphorescent material. The phosphorescent material emits a phosphorescent beam when stimulated. The wavelength of the phosphorescent beam is different from the wavelength of the excitation beam.

[0067] like Figure 5 As shown, the thermal barrier coating includes a ceramic layer 21 and an adhesive layer 22, which are coated on a metal substrate 23.

[0068] The metal substrate 23 is typically a turbine blade, and the adhesive layer 22 is a transition layer between the ceramic layer 21 and the metal substrate 23. The ceramic layer 21 is made by mixing a ceramic matrix with a phosphorescent substance, and the mixing should not affect the preparation process of the thermal barrier coating itself.

[0069] The phosphorescent material doped in the ceramic layer 21 is rare earth ions. The rare earth ion-doped ceramic layer powder is sprayed onto the surface of the adhesive layer 22 by atmospheric plasma spraying or electron beam physical vapor deposition.

[0070] Doping the ceramic layer 21 with phosphorescent material does not change the original thermal insulation performance of the thermal barrier coating.

[0071] When the excitation light shines on the surface of the ceramic layer 21, due to the semi-transparent nature of the ceramic layer to the wavelengths of the excitation light and phosphorescence, the excitation light can penetrate the ceramic heat insulation layer 21 and reach the adhesive layer 22. When the excitation light propagates in the ceramic layer, it can excite the phosphorescent material in the ceramic layer 21 to produce phosphorescence.

[0072] The ceramic layer 21 is semi-transparent to ultraviolet and visible light. Excitation light can effectively penetrate the ceramic layer 21 and excite the phosphorescent material in the ceramic layer 21, causing it to radiate phosphorescence. The phosphorescence can effectively penetrate the ceramic layer 21 and radiate outward.

[0073] The adhesive layer 22 is used to relieve the internal stress caused by the mismatch in the thermal expansion coefficients of the metal substrate 23 and the surface ceramic layer 21, and to extend the service life of the thermal barrier coating.

[0074] Step B2: The phosphorescent beam with a relatively wide wavelength range is filtered by a filter into a single wavelength phosphorescent beam.

[0075] Phosphorescent light beams have a relatively wide wavelength range, which differs from that of the excitation beam. High-energy photons from the excitation beam excite the phosphorescent material from its ground state to an excited state. After vibrational relaxation and other processes, the excited photons distribute themselves to different excited state energy levels, consuming energy in the process. They then transition back to the ground state from these excited state levels, emitting phosphorescence. The energy of phosphorescent photons is lower than that of excitation photons, therefore, the phosphorescence wavelength is longer than the excitation wavelength. Because phosphorescence is emitted from the transitions between different excited state energy levels back to the ground state, the phosphorescence wavelength range is relatively wide.

[0076] To establish the correlation between phosphorescence intensity and thermal barrier coating thickness, it is necessary to obtain the absorption coefficient, scattering coefficient, transmittance, and reflectance of phosphorescence within the thermal barrier coating, as well as at the boundary. The absorption and scattering coefficients for a single wavelength are relatively easy to obtain. Therefore, to facilitate the establishment of this correlation, a filter is used to reduce the phosphorescence beam, which has a relatively wide wavelength range, to a single wavelength. To ensure sufficient phosphorescence intensity, a wavelength with high intensity should be selected as the detection wavelength.

[0077] Step B3: After the phosphorescent beam of a single wavelength is received by the photodetector, the light intensity of the phosphorescent beam is obtained through data processing.

[0078] After a single-wavelength phosphorescent beam is received by a photodetector, the optical signal is converted into an electrical signal within the photodetector. The intensity of the phosphorescent beam is then obtained based on the photoelectric properties of the detector.

[0079] Step B4: Determine the thickness of the thermal barrier coating to be tested based on the calibrated phosphorescence intensity and its correspondence with the thickness.

[0080] Based on the pre-calibrated relationship between phosphorescence intensity and thickness, the thickness of the thermal barrier coating ceramic layer 21 is determined according to the phosphorescence intensity.

[0081] J = I0·q·f(d,K,K1,S,S1);

[0082] Where J is the phosphorescence intensity of a single wavelength, I0 is the excitation light intensity, q is the quantum yield of phosphorescence, d is the thickness of the coating to be tested, K is the absorption coefficient of the coating to be tested for excitation light, K1 is the absorption coefficient of the coating to be tested for phosphorescence, S is the scattering coefficient of the coating to be tested for excitation light, and S1 is the scattering coefficient of the coating to be tested for phosphorescence.

[0083] Wherein, K, K1, S, and S1 are related to the thermal barrier coating material and wavelength, and are constants once the thermal barrier coating material, excitation light, and phosphorescence wavelength are determined; q is related to the phosphorescent material and temperature, and is a constant at a stable temperature once the material is determined; I0 is the excitation light intensity, which is a constant once the excitation light is determined. Under constant temperature conditions, when a specific material is excited by excitation light of a specific wavelength, the phosphorescence intensity of that specific wavelength emitted is a single-valued function of the thickness. The thickness of the thermal barrier coating can be calculated by measuring the phosphorescence intensity through prior calibration.

[0084] It should be noted that when calculating the thickness of the thermal barrier coating, it may also be related to the transmittance of excitation light incident from the thermal barrier coating to the air, the transmittance of phosphorescence incident from the thermal barrier coating to the air, the transmittance of excitation light incident from the air to the thermal barrier coating, the reflectance of excitation light at the interface between the ceramic layer and the adhesive layer, and the reflectance of phosphorescence at the interface between the ceramic layer and the adhesive layer.

[0085] As an optional implementation, the coating material includes, but is not limited to, a mixture of a substrate material such as yttrium-stabilized zirconium oxide and a phosphorescent material doped with it.

[0086] This invention enables non-contact, non-destructive online measurement of the thickness of a semi-transparent coating by doping it with phosphorescent materials to give it the characteristic of stimulated phosphorescence. The thickness of the semi-transparent coating is determined by the relationship between the intensity of the phosphorescent beam emitted by the stimulated phosphorescence and the thickness of the coating.

[0087] This invention also provides an application scenario in which the above-described non-destructive coating thickness measurement method is applied. Specifically, the non-destructive coating thickness measurement method provided in this embodiment can be applied in a non-destructive coating thickness measurement scenario. The non-destructive coating thickness measurement scenario includes: a phosphorescent beam acquisition stage, a data processing stage, and a coating thickness determination stage; an excitation light source emits an excitation beam that illuminates the surface of the coating to be measured. The coating to be measured is a semi-transparent coating containing phosphorescent material. The phosphorescent material emits a phosphorescent beam upon stimulation. The wavelength of the phosphorescent beam is different from the wavelength of the excitation beam. The phosphorescent beam has a relatively wide wavelength range. After being filtered by a filter, it becomes a single-wavelength phosphorescent beam. After the single-wavelength phosphorescent beam is received by a photodetector, the intensity of the single-wavelength phosphorescent beam can be obtained through data processing. Based on the calibrated phosphorescent intensity and its correspondence with the thickness, the thickness of the coating to be measured can be determined.

[0088] In one exemplary embodiment, a computer device is provided, which may be a server or a terminal, and its internal structure diagram may be as follows. Figure 6As shown, the computer device includes a processor, memory, input / output (I / O) interfaces, and a communication interface. The processor, memory, and I / O interfaces are connected via a system bus, and the communication interface is also connected to the system bus via the I / O interfaces. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and a database. The internal memory provides the environment for the operation of the operating system and computer programs in the non-volatile storage media. The database stores the correspondence between the intensity of phosphorescence at a single wavelength and the thickness of the coating to be measured. The I / O interfaces are used for information exchange between the processor and external devices. The communication interface is used for communication with external terminals via a network connection. When the computer program is executed by the processor, it implements a non-destructive measurement method for coating thickness.

[0089] Those skilled in the art will understand that Figure 6 The structure shown is merely a block diagram of a portion of the structure related to the present invention and does not constitute a limitation on the computer device to which the present invention is applied. A specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0090] In one exemplary embodiment, a computer device is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the above-described method embodiments.

[0091] In one exemplary embodiment, a computer-readable storage medium is provided storing a computer program that, when executed by a processor, implements the above-described method embodiments.

[0092] In one exemplary embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the above-described method embodiments.

[0093] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this invention are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of related data must comply with relevant regulations.

[0094] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided by this invention can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM).

[0095] The databases involved in the various embodiments provided by this invention may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, distributed databases based on blockchain. The processors involved in the various embodiments provided by this invention may be, but are not limited to, general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc.

[0096] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0097] This document uses specific examples to illustrate the principles and implementation methods of the present invention. The descriptions of the above embodiments are only for the purpose of helping to understand the method and core ideas of the present invention. Furthermore, those skilled in the art will recognize that, based on the ideas of the present invention, there will be changes in the specific implementation methods and application scope. Therefore, the content of this specification should not be construed as a limitation of the present invention.

Claims

1. A non-destructive measurement method for coating thickness, characterized in that, The non-destructive measurement method for coating thickness includes: Acquire a phosphorescent beam; the phosphorescent beam is a beam obtained by irradiating the surface of the coating under test with an excitation beam emitted by an excitation source; the coating under test contains a phosphorescent substance, and the phosphorescent substance emits a phosphorescent beam upon stimulation. The phosphorescent beam is filtered through a filter to obtain a phosphorescent beam of a single wavelength. Photoelectric data processing is performed on the single-wavelength phosphorescent beam to obtain the phosphorescent intensity of the single wavelength; The thickness of the coating to be tested is determined based on the correspondence between the phosphorescence intensity of the single wavelength and the thickness of the coating to be tested. The expression for the relationship between the intensity of phosphorescence at a single wavelength and the thickness of the coating to be measured is as follows: J=I0·q·f(d,K,K1,S,S1); Where J is the phosphorescence intensity of a single wavelength, I0 is the excitation beam intensity, q is the quantum yield of phosphorescence, d is the thickness of the coating to be tested, K is the absorption coefficient of the coating to be tested for the excitation beam, K1 is the absorption coefficient of the coating to be tested for phosphorescence, S is the scattering coefficient of the coating to be tested for the excitation beam, and S1 is the scattering coefficient of the coating to be tested for phosphorescence. The coating to be tested is a thermal barrier coating; the thermal barrier coating includes: a ceramic layer and an adhesive layer; The ceramic layer is a semi-transparent coating; The adhesive layer is a transition layer between a ceramic layer and a metal substrate; The thickness of the coating to be tested is determined based on the correspondence between the phosphorescence intensity of a single wavelength and the thickness of the coating under test, specifically including: Standard samples of different thicknesses were prepared, and phosphorescence signals of the standard samples of different thicknesses were collected under a single wavelength phosphorescence beam. The phosphorescence intensity of the standard samples of different thicknesses was measured, thereby establishing the correspondence between phosphorescence intensity and thickness. Based on the pre-calibrated relationship between phosphorescence intensity and thickness, the thickness of the coating to be tested is determined according to the phosphorescence intensity.

2. The non-destructive measurement method for coating thickness according to claim 1, characterized in that, The wavelength of the phosphorescent beam is different from the wavelength of the excitation beam.

3. The non-destructive measurement method for coating thickness according to claim 1, characterized in that, The coating to be tested is a semi-transparent coating.

4. The non-destructive measurement method for coating thickness according to claim 1, characterized in that, The phosphorescent material is a rare earth ion.

5. The non-destructive measurement method for coating thickness according to claim 1, characterized in that, The material of the coating to be tested is a mixture of yttrium-stabilized zirconium oxide substrate and phosphorescent material doping.

6. A computer device, comprising: A memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that the processor executes the computer program to implement the non-destructive measurement method for coating thickness according to any one of claims 1-5.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the non-destructive measurement method for coating thickness as described in any one of claims 1-5.

8. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by the processor, it implements the non-destructive measurement method for coating thickness as described in any one of claims 1-5.

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