Detection apparatus and method, device and medium for testing a metal oxide surge arrester

Abstract

The application discloses a detection device, a test method, a device and a medium for a metal oxide lightning arrester, wherein the test method is used for detecting whether the withstand voltage impact performance of the lightning arrester is qualified, and comprises the following steps: obtaining initial direct-current reference voltages of metal oxide lightning arrester samples; performing impact aging tests on the metal oxide lightning arrester samples, and collecting direct-current reference voltages of the samples in the impact aging test process until the metal oxide lightning arresters are damaged; and determining whether the metal oxide lightning arresters are qualified according to the initial direct-current reference voltages of the samples and the direct-current reference voltages of the samples collected for the last time. According to the technical scheme of the application, the test procedure for the metal oxide lightning arrester is optimized, the performance detection standard of the metal oxide lightning arrester is improved, and the rapid decline of the electrical performance of the metal oxide lightning arrester after the metal oxide lightning arrester is put into network operation is avoided, so that the operation stability of the power grid is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of electric power, and in particular to a detection device, a test method, a device and a medium for a metal oxide surge arrester. BACKGROUND

[0002] Metal oxide surge arresters, such as zinc oxide surge arresters, have excellent non-linear voltage-current characteristics, can effectively suppress overvoltage, and are widely used in power grids to protect power equipment. At present, there are zinc oxide surge arresters of different quality from different manufacturers in 10kV distribution networks. In the type test of tin oxide surge arresters, the repeated transfer charge test is regulated to be performed on each zinc oxide resistor sample for 20 times of impulse current resistance, which is divided into 10 groups, 2 times for each group, and the interval time between the 2 times of impulse current in each group is 50s-60s. The interval time between adjacent two groups should be able to cool the test product to the ambient temperature. When the DC reference voltage of the test product changes by more than ±5%, it is determined as not passing the test.

[0003] However, in the repeated transfer charge test, all zinc oxide resistor samples bear a maximum of 10 groups of impulse, and there may be zinc oxide resistors of poor quality that can pass the test when leaving the factory, but they are damaged and returned when they are running and continuously subjected to impact, resulting in a decline in electrical performance that does not meet the aging standard. This makes the distribution network maintenance personnel unable to detect potential safety hazards in advance and make corresponding early warnings, which has a great impact on the safe and stable operation of the power grid. Therefore, the current zinc oxide surge arrester test still has deficiencies, and the test procedure should be optimized and the detection standard should be improved. SUMMARY

[0004] The present application provides a detection device and a test method, device and medium for a metal oxide surge arrester to solve the problems in the prior art, by taking sample damage as the test end criterion, thereby optimizing the test procedure for the metal oxide surge arrester, improving the performance detection standard of the metal oxide surge arrester, and avoiding rapid decline in electrical performance of the metal oxide surge arrester after running in the network, which is conducive to improving the stability of the power grid.

[0005] In a first aspect, the present application provides a test method for a metal oxide surge arrester for detecting whether the voltage withstand performance of the surge arrester is qualified, comprising:

[0006] obtaining the initial DC reference voltage of each metal oxide surge arrester sample;

[0007] performing an impulse aging test on each metal oxide surge arrester sample and collecting the DC reference voltage of each sample during the impulse aging test until each metal oxide surge arrester is damaged;

[0008] According to the initial DC reference voltage of each sample and the DC reference voltage of each sample collected last time, whether the metal oxide surge arrester is qualified is determined.

[0009] Optionally, the initial DC reference voltage of each metal oxide surge arrester sample is acquired, including:

[0010] The DC reference current is applied to the metal oxide surge arrester sample, and the voltage across the metal oxide surge arrester sample is collected;

[0011] The voltage across the metal oxide surge arrester sample is recorded as the initial DC reference voltage.

[0012] Optionally, the impulse aging test is performed on each metal oxide surge arrester sample, including:

[0013] Each metal oxide surge arrester sample is applied with a preset impulse current group according to a preset rule.

[0014] Optionally, the preset rule is that after the preset impulse current group is applied to the sample and the temperature of the sample is less than or equal to a first temperature, the preset impulse current group is applied to the sample again.

[0015] Optionally, the DC reference voltage of each sample during the impulse aging test is collected, including:

[0016] After each preset impulse current group is applied, the temperature of the sample is collected.

[0017] When the temperature of the sample is less than or equal to a second temperature, the DC reference voltage of each sample is collected.

[0018] Optionally, according to the initial DC reference voltage of each sample and the DC reference voltage of each sample collected last time, whether the metal oxide surge arrester is qualified is determined, including:

[0019] According to the initial DC reference voltage of each sample and the DC reference voltage of the corresponding sample collected last time, the DC reference voltage change rate of each sample is determined.

[0020] According to the DC reference voltage change rate of each sample, whether the metal oxide surge arrester is qualified is determined.

[0021] Optionally, according to the DC reference voltage change rate of each sample, whether the metal oxide surge arrester is qualified is determined, including:

[0022] It is judged whether the DC reference voltage change rate of each sample is less than a preset change rate;

[0023] If yes, it is determined that the corresponding sample is not completely aged;

[0024] According to the number of the samples not completely aged and the total number of the samples, a ratio of the number of the samples not completely aged to the total number of the samples is determined;

[0025] When the ratio is less than or equal to a preset ratio, it is determined that the metal oxide surge arrester is qualified.

[0026] In a second aspect, the present application provides a performance test device for a metal oxide surge arrester, which is used to detect whether the pressure impact performance of the surge arrester is qualified, and comprises:

[0027] An acquisition module is configured to acquire initial DC reference voltages of each metal oxide surge arrester sample;

[0028] A test and collection module is configured to perform an impact aging test on each metal oxide surge arrester sample, and collect DC reference voltages of each sample during the impact aging test until each metal oxide surge arrester is damaged;

[0029] A determination module is configured to determine whether the metal oxide surge arrester is qualified according to the initial DC reference voltages of each sample and the last collected DC reference voltages of each sample.

[0030] In a third aspect, the present application provides a detection device, which comprises at least one processor and a memory in communication connection with the at least one processor, wherein the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to execute the test method for a metal oxide surge arrester according to any one of the above aspects.

[0031] In a fourth aspect, the present application provides a computer readable storage medium, which stores a computer instruction, and the computer instruction is used to enable a processor to execute the test method for a metal oxide surge arrester according to any one of the above aspects.

[0032] The technical scheme of the present application obtains the initial DC reference voltage of each metal oxide lightning arrester sample, carries out impulse aging test on each metal oxide lightning arrester sample, and collects the DC reference voltage of each sample during the impulse aging test until each metal oxide lightning arrester is damaged, so as to determine whether the metal oxide lightning arrester is qualified according to the initial DC reference voltage of each sample and the DC reference voltage of each sample collected for the last time. In this way, the sample damage can be used as the test end standard, the test procedure of the metal oxide lightning arrester can be optimized, and the performance detection standard of the metal oxide lightning arrester can be improved, so as to avoid rapid decline of the electrical performance of the metal oxide lightning arrester after being put into network operation, and improve the operation stability of the power grid.

[0033] It should be understood that the content described in this part is not intended to identify key or important features of the embodiments of the present application, nor is it used to limit the scope of the present application. Other features of the present application will become apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS

[0034] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0035] Figure 1 A flow chart of a test method of a metal oxide lightning arrester provided for the first embodiment of the present application;

[0036] Figure 2 A flow chart of a test method of a metal oxide lightning arrester provided for the second embodiment of the present application;

[0037] Figure 3 A change trend graph of the DC reference voltage of a typical sample provided for the embodiments of the present application;

[0038] Figure 4 A flow chart of a test method of a metal oxide lightning arrester provided for the third embodiment of the present application;

[0039] Figure 5 A structural schematic diagram of a test device of a metal oxide lightning arrester provided for the fourth embodiment of the present application. DETAILED DESCRIPTION

[0040] In the following, the technical solutions in the embodiments of the present application will be described clearly and completely with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all the other embodiments obtained by a person of ordinary skill in the art without creative effort should belong to the protection scope of the present application.

[0041] It should be noted that the terms "first", "second" and the like in the description and claims of the present application and the above drawings are used to distinguish similar objects, and do not necessarily indicate a specific order or a sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than that illustrated or described herein.

[0042] Embodiment one

[0043] Figure 1 A flowchart of a test method of a metal oxide surge arrester is provided for the embodiment one of the present application. The embodiment can be applicable to the case of detecting whether the withstand impact performance of the surge arrester is qualified. The method can be executed by a test device of the metal oxide surge arrester. The test device of the metal oxide surge arrester can be realized in the form of hardware and / or software. The test device of the metal oxide surge arrester can be configured in a controller of a detection device. As shown in the figure, the method comprises: Figure 1

[0044] S110, obtaining initial DC reference voltages of the metal oxide surge arrester samples.

[0045] The metal oxide surge arrester can include, but is not limited to, a zinc oxide surge arrester. When the metal oxide surge arrester is selected, a plurality of metal oxide surge arresters are selected from the metal oxide surge arresters of the type to be selected as the metal oxide surge arrester samples. In an exemplary embodiment, the number of the metal oxide surge arrester samples is greater than or equal to 1% of the total number of the metal oxide surge arresters of the type to be selected. In the embodiment, the number of the metal oxide surge arrester samples is greater than or equal to 10, so as to reduce the contingency of the test and improve the stability of the power grid operation.

[0046] The change rate of the DC reference voltage can reflect the aging degree of the metal oxide surge arrester samples. The initial DC reference voltage can be understood as the DC reference voltage of each metal oxide sample before the impact aging test.

[0047] ​Optionally, the initial DC reference voltage of each metal oxide surge arrester sample is obtained, including: applying a DC reference current to the metal oxide surge arrester sample, and collecting the voltage across the metal oxide surge arrester sample; and recording the voltage across the metal oxide surge arrester sample as the initial DC reference voltage.

[0048] The DC reference current is 1 mA. In an exemplary embodiment, the front of the metal oxide surge arrester is defined as the positive side, and the back is defined as the ground side. The metal oxide surge arrester is placed on the workbench of the DC parameter tester with the front up and the back grounded. Then, the DC current is applied to the metal oxide surge arrester. When the DC current is 1 mA, the voltage across the metal oxide surge arrester is collected, and the voltage across the metal oxide surge arrester sample is recorded as the initial DC reference voltage.

[0049] S120, performing an impulse aging test on each metal oxide surge arrester sample, and collecting the DC reference voltage of each sample during the impulse aging test until each metal oxide surge arrester is damaged.

[0050] The impulse aging test can be understood as a test simulating the process of lightning strike on the metal oxide surge arrester. In an optional embodiment, the impulse aging test on each metal oxide surge arrester sample can include, but is not limited to, applying multiple high-voltage pulse currents to the metal oxide surge arrester to simulate the process of lightning strike. The DC reference voltage of each sample during the impulse aging test can be understood as the DC reference voltage of the metal oxide surge arrester collected after each high-voltage impulse current during the impulse aging test.

[0051] The damage of the metal oxide surge arrester can include, but is not limited to, breakdown, flashover, cracking, and the like.

[0052] S130, determining whether the metal oxide surge arrester is qualified according to the initial DC reference voltage of each sample and the last collected DC reference voltage of each sample.

[0053] The last collected DC reference voltage of each sample is the DC reference voltage of each metal oxide surge arrester sample when it is damaged. According to the initial DC reference voltage of each sample and the last collected DC reference voltage of each sample, the change rate of the DC reference voltage of the brand new metal oxide surge arrester and the metal oxide surge arrester facing damage can be determined, and the aging degree of the metal oxide surge arrester when it is damaged can be known.

[0054] Specifically, at least 10 metal oxide arresters of a to-be-selected type are selected as samples, initial DC reference voltages of the metal oxide arrester samples are obtained, then impulse aging tests are performed on the metal oxide arrester samples, and the DC reference voltages of the metal oxide arrester samples are collected during the impulse aging tests until the metal oxide arrester samples are damaged, such as breakdown, flashover or cracking, so that the aging degree of the metal oxide arrester samples when facing damage is determined according to the initial DC reference voltages of the samples and the DC reference voltages of the samples collected for the last time, and then whether the metal oxide arrester is qualified can be determined.

[0055] In the embodiment, the initial DC reference voltages of the metal oxide arrester samples are obtained, the impulse aging tests are performed on the metal oxide arrester samples, and the DC reference voltages of the samples during the impulse aging tests are collected until the metal oxide arrester samples are damaged, so that whether the metal oxide arrester is qualified is determined according to the initial DC reference voltages of the samples and the DC reference voltages of the samples collected for the last time, in this way, the test end standard of sample damage can be realized, the test procedure of the metal oxide arrester is optimized, the performance detection standard of the metal oxide arrester is improved, so that the rapid decline of the electrical performance of the metal oxide arrester after being put into operation of the power grid is avoided, and the operation stability of the power grid is improved.

[0056] Embodiment Two

[0057] Figure 2 A flowchart of a test method of a metal oxide arrester according to Embodiment Two of the present application is provided. Based on the above-mentioned embodiment, the embodiment further increases steps of how to perform impulse aging tests on the metal oxide arrester samples, how to collect the DC reference voltages of the samples during the impulse aging tests, and how to determine whether the metal oxide arrester is qualified, as shown in FIG. 2, the method specifically comprises the following steps. Figure 2

[0058] S210, obtaining initial DC reference voltages of the metal oxide arrester samples.

[0059] Optionally, obtaining the initial DC reference voltages of the metal oxide arrester samples comprises: applying a DC reference current to the metal oxide arrester sample, and collecting the voltage across the metal oxide arrester sample; and recording the voltage across the metal oxide arrester sample as the initial DC reference voltage.

[0060] S220, respectively applying a preset impulse current group to each metal oxide arrester sample according to a preset rule, and collecting the temperature of the sample after each application of the preset impulse current group is completed.

[0061] ​The preset rule can be determined according to the current standard for type test of the metal oxide surge arrester, but is not limited thereto. The preset impulse current group can be understood as applying two or more preset impulse currents to the metal oxide surge arrester at preset time intervals. The preset time can be 50 s to 60 s. The waveform of the preset impulse current can be determined according to the current standard for type test of the metal oxide surge arrester, but is not limited thereto. In an exemplary embodiment, the preset impulse current is an impulse current with a waveform of 8 / 20 μs.

[0062] Optionally, the preset rule is to apply the preset impulse current group to the sample again after the temperature of the sample is less than or equal to the first temperature.

[0063] The first temperature can be determined according to the current standard for type test of the metal oxide surge arrester, but is not limited thereto. In an exemplary embodiment, the first temperature is room temperature.

[0064] Specifically, the preset impulse current group is applied to each metal oxide surge arrester sample respectively, and the preset impulse current group is applied to the sample again after the temperature of the sample is less than or equal to the first temperature.

[0065] S230, when the temperature of the sample is less than or equal to the second temperature, collecting the DC reference voltage of each sample.

[0066] The second temperature can be determined according to the current standard for type test of the metal oxide surge arrester, but is not limited thereto. It should be noted that the second temperature can be equal to or not equal to the first temperature, which is not limited in the embodiment. In an exemplary embodiment, the second temperature is room temperature.

[0067] In an optional embodiment, collecting the DC reference voltage of each sample includes: applying a DC reference current to the metal oxide surge arrester sample, and collecting the voltage across the metal oxide surge arrester sample at the same time; and recording the voltage across the metal oxide surge arrester sample as the DC reference voltage.

[0068] Specifically, after obtaining the initial DC reference voltage of each metal oxide surge arrester sample, the preset impulse current group is applied to each metal oxide surge arrester sample respectively according to the preset rule, and the temperature of each sample is collected after each application of the preset impulse current group. When the temperature of the sample is less than or equal to the second temperature, the DC reference voltage of each sample is collected.

[0069] S240, determining the DC reference voltage change rate of each sample according to the initial DC reference voltage of each sample and the DC reference voltage of the corresponding sample collected last time.

[0070] The DC reference voltage change rate of the sample can be understood as the change degree of the DC reference voltage of the last collected corresponding sample relative to the initial DC reference voltage of the sample.

[0071] Figure 3 A change trend graph of the DC reference voltage of a typical sample provided by the embodiment of the present application is shown. In an exemplary embodiment, the reference Figure 3 It can be seen that the sample endures 14 groups of preset impact current groups when damaged, and the change rate of the DC reference voltage is-6.49% when facing damage.

[0072] S250, determining whether the metal oxide surge arrester is qualified according to the DC reference voltage change rate of each sample.

[0073] It can be understood that the smaller the DC reference voltage change rate of each sample, the higher the stability of the metal oxide surge arrester when subjected to impact current, and the better the quality of the product; on the contrary, the larger the DC reference voltage change rate of each sample, the worse the stability of the metal oxide surge arrester when subjected to impact current, and the worse the quality of the product.

[0074] Specifically, after obtaining the initial DC reference voltage of each metal oxide surge arrester sample and obtaining the DC reference voltage of each sample during the impact aging test, the DC reference voltage change rate of each sample is determined according to the initial DC reference voltage of each sample and the DC reference voltage of the last collected corresponding sample, and finally whether the metal oxide surge arrester is qualified is determined according to the DC reference voltage change rate of each sample.

[0075] In the embodiment, after obtaining the initial DC reference voltage of each metal oxide surge arrester sample, the preset impact current group is applied to each metal oxide surge arrester sample according to the preset rule, and the temperature of the sample is collected after each application of the preset impact current group. When the temperature of the sample is less than or equal to the second temperature, the DC reference voltage of each sample is collected, so that the collected DC reference voltage of each sample is more accurate, thereby further improving the reliability of the aging impact test of the metal oxide surge arrester. In addition, by determining the DC reference voltage change rate of each sample according to the initial DC reference voltage of each sample and the DC reference voltage of the last collected corresponding sample, whether the metal oxide surge arrester is qualified is determined according to the DC reference voltage change rate of each sample, so that the impact aging test procedure of the metal oxide surge arrester is further optimized.

[0076] Embodiment three

[0077] Figure 4A flow chart of a method for testing a metal oxide surge arrester is provided in the third embodiment of the present application. The third embodiment is based on the above-mentioned embodiments, and further includes steps of determining whether the metal oxide surge arrester is qualified according to the DC reference voltage change rate of each sample, as shown in the following. Figure 4 The method specifically includes the following steps:

[0078] S310, obtaining the initial DC reference voltage of each metal oxide surge arrester sample.

[0079] S320, performing an impulse aging test on each metal oxide surge arrester sample, and collecting the DC reference voltage of each sample during the impulse aging test until each metal oxide surge arrester is damaged.

[0080] S330, determining the DC reference voltage change rate of each sample according to the initial DC reference voltage of each sample and the last collected DC reference voltage of the corresponding sample.

[0081] S340, determining whether the DC reference voltage change rate of each sample is less than a preset change rate; if yes, performing S350.

[0082] The preset change rate can be determined according to the current standard for type test of the metal oxide surge arrester, but is not limited thereto. In an exemplary embodiment, the preset change rate is 5%.

[0083] S350, determining that the corresponding sample is not completely aged.

[0084] The not completely aged can be understood as that the corresponding sample does not reach the aging standard when damaged.

[0085] S360, determining the ratio of the number of the not completely aged samples to the total number of the samples according to the number of the not completely aged samples and the total number of the samples.

[0086] S370, determining that the metal oxide surge arrester is qualified when the ratio is less than or equal to a preset ratio.

[0087] The preset ratio can be determined according to the actual demand for the quality of the metal oxide surge arrester. When the requirement for the quality of the metal oxide surge arrester is low, the preset ratio can be set to a large value; on the contrary, when the requirement for the quality of the metal oxide surge arrester is high, the preset ratio can be set to a small value. In an exemplary embodiment, the preset ratio is 5%, that is, when the ratio of the number of the not completely aged samples to the total number of the samples is less than or equal to 5%, it is determined that the metal oxide surge arrester is qualified; and when the ratio of the number of the not completely aged samples to the total number of the samples is greater than 5%, it is determined that the metal oxide surge arrester is unqualified.

[0088] In the embodiment, by obtaining the initial DC reference voltage of each metal oxide surge arrester sample and the DC reference voltage of each sample during the impulse aging test, and determining the DC reference voltage change rate of each sample according to the initial DC reference voltage of each sample and the last collected DC reference voltage of the corresponding sample, it is determined whether the DC reference voltage change rate of each sample is less than the preset change rate. If the DC reference voltage change rate of each sample is less than the preset change rate, it is determined that the corresponding sample is not completely aged. When the DC reference voltage change rate of each sample is greater than or equal to the preset change rate, it is determined that the corresponding sample is completely aged. Therefore, according to the number of samples not completely aged and the total number of samples, the ratio of the number of samples not completely aged to the total number of samples is determined. When the ratio is less than or equal to the preset ratio, the metal oxide surge arrester is determined to be qualified. When the ratio is greater than the preset ratio, the metal oxide surge arrester is determined to be unqualified. Therefore, the impulse aging test procedure of the metal oxide surge arrester can be further optimized to further improve the operation stability of the power grid.

[0089] Embodiment four

[0090] The embodiment provides a performance test device for a metal oxide surge arrester, which can be realized in the form of hardware and / or software. Figure 5 The structural schematic diagram of the test device for a metal oxide surge arrester provided in the embodiment four is shown in Figure 5 The device comprises:

[0091] The obtaining module 410 is configured to obtain the initial DC reference voltage of each metal oxide surge arrester sample.

[0092] The test and collection module 420 is configured to perform an impulse aging test on each metal oxide surge arrester sample, and collect the DC reference voltage of each sample during the impulse aging test until each metal oxide surge arrester is damaged.

[0093] The determining module 430 is configured to determine whether the metal oxide surge arrester is qualified according to the initial DC reference voltage of each sample and the last collected DC reference voltage of each sample.

[0094] The performance test device for a metal oxide surge arrester provided in the embodiment can execute the performance test method for a metal oxide surge arrester provided in any embodiment of the present application, has the function modules and beneficial effects corresponding to the execution method, and the same parts can be referred to the description above.

[0095] Embodiment five

[0096] The detection device provided by the embodiment of the present application comprises at least one processor and a memory connected with the at least one processor, wherein the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to perform the performance test method of the metal oxide surge arrester provided by any of the above embodiments. Since the detection device provided by the embodiment of the present application comprises the above processor and memory, and the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to perform the performance test method of the metal oxide surge arrester provided by any of the above embodiments, it can have the corresponding structure and features of the performance test method of the metal oxide surge arrester provided by the embodiment of the present application, and can achieve the beneficial effects of the performance test method of the metal oxide surge arrester provided by the embodiment of the present application, and the same parts can be referred to the above description.

[0097] Embodiment six

[0098] Based on the same concept, the embodiment of the present application also provides a computer readable storage medium, which stores computer instructions for enabling a processor to perform the test method provided by any of the above embodiments when executed.

[0099] In the context of the present application, the computer readable storage medium can be a tangible medium, which can contain or store a computer program for use by or in connection with an instruction execution system, apparatus or device. The computer readable storage medium can include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus or device, or any suitable combination of the above. Alternatively, the computer readable storage medium can be a machine readable signal medium. More specific examples of the machine readable storage medium will include one or more wires, portable computer disks, hard disks, random access memory (RAM), read only memory (ROM), erasable programmable read only memory (EPROM or flash memory), optical fiber, compact disk read only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination of the above.

[0100] The above detailed description does not constitute a limitation on the protection scope of the present application. Those skilled in the art should understand that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent replacement and improvement within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A test method for a metal oxide surge arrester for detecting whether or not a withstand voltage shock performance of the arrester is qualified, characterized by, The method comprises the following steps: acquiring initial DC reference voltages of each metal oxide surge arrester sample; performing impulse aging tests on each metal oxide surge arrester sample, and collecting the DC reference voltages of each sample during the impulse aging tests until each metal oxide surge arrester sample is damaged; determining whether the metal oxide surge arrester is qualified according to the initial DC reference voltages of each sample and the DC reference voltages of each sample collected for the last time; determining whether the metal oxide surge arrester is qualified according to the initial DC reference voltages of each sample and the DC reference voltages of each sample collected for the last time, comprising: determining the DC reference voltage change rates of each sample according to the initial DC reference voltages of each sample and the DC reference voltages of each sample collected for the last time, respectively; and determining whether the metal oxide surge arrester is qualified according to the DC reference voltage change rates of each sample; determining whether the metal oxide surge arrester is qualified according to the DC reference voltage change rates of each sample, comprising: judging whether the DC reference voltage change rate of each sample is less than a preset change rate; if yes, determining that the corresponding sample is not completely aged; determining a ratio of the number of the samples not completely aged to the total number of the samples according to the number of the samples not completely aged and the total number of the samples; and when the ratio is less than or equal to a preset ratio, determining that the metal oxide surge arrester is qualified.

2. The test method for a metal oxide surge arrester according to claim 1, characterized by, The method for acquiring initial DC reference voltages of each metal oxide surge arrester sample comprises the following steps: applying a DC reference current to the metal oxide surge arrester sample, and collecting the voltage across the metal oxide surge arrester sample at the same time; recording the voltage across the metal oxide surge arrester sample as the initial DC reference voltage.

3. The test method for a metal oxide surge arrester according to claim 1, characterized by, The method for performing impulse aging tests on each metal oxide surge arrester sample comprises the following steps: applying a preset impulse current group to each metal oxide surge arrester sample according to a preset rule, respectively.

4. The test method for a metal oxide surge arrester according to claim 3, characterized by, The preset rule is to apply the preset impulse current group to the sample again after the temperature of the sample is less than or equal to a first temperature after the preset impulse current group is applied to the sample.

5. The test method for a metal oxide surge arrester according to claim 3, characterized by, The method for collecting the DC reference voltages of each sample during the impulse aging tests comprises the following steps: collecting the temperature of the sample after each application of the preset impulse current group is completed; collecting the DC reference voltages of each sample when the temperature of the sample is less than or equal to a second temperature.

6. A performance test device for a metal oxide surge arrester for detecting whether or not the surge resistance performance of the arrester is qualified, characterized by, The method comprises the following steps: an acquisition module, configured to acquire initial DC reference voltages of each metal oxide surge arrester sample; a test and collection module, configured to perform impulse aging tests on each metal oxide surge arrester sample, and collect the DC reference voltages of each sample during the impulse aging tests until each metal oxide surge arrester sample is damaged; a determination module, configured to determine whether the metal oxide surge arrester is qualified according to the initial DC reference voltages of each sample and the DC reference voltages of each sample collected for the last time. The determining module is further specifically configured to determine a DC reference voltage change rate of each of the samples according to an initial DC reference voltage of each of the samples and a last collected DC reference voltage of the corresponding sample, and determine whether the metal oxide surge arrester is qualified according to the DC reference voltage change rate of each of the samples. The determining whether the metal oxide surge arrester is qualified according to the DC reference voltage change rate of each of the samples comprises: judging whether the DC reference voltage change rate of each of the samples is less than a preset change rate; if yes, determining that the corresponding sample is not completely aged; determining a ratio of a number of the samples not completely aged to a total number of the samples according to the number of the samples not completely aged and the total number of the samples; and when the ratio is less than or equal to a preset ratio, determining that the metal oxide surge arrester is qualified.

7. A detection device, characterized in that The method comprises: at least one processor; and a memory connected with the at least one processor in communication; wherein the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to execute the test method for the metal oxide surge arrester according to any one of claims 1-5.

8. A computer-readable storage medium, characterized in that, The computer readable storage medium stores computer instructions for enabling the processor to implement the test method for the metal oxide surge arrester according to any one of claims 1-5 when executed.

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