Elemental analysis device for powder material

Abstract

The invention relates to a powder substance elemental analysis device, which comprises a fixing device, the fixing device comprises a substrate, a microneedle film assembly and a vacuum system, a powder substance is placed on the substrate, the microneedle film assembly covers the powder substance, and the vacuum system is connected with the fixing device and is used for keeping the fixing device in a vacuum state; the laser generating device is located on one side of the fixing device and used for emitting laser to the powder substance so that the powder substance can generate plasma; the spectrum acquisition device is positioned on one side of the fixing device and is used for performing spectrum data acquisition on the reflected light of the plasma; and the data processing unit is electrically connected with the spectrum acquisition device and is used for determining the content of each element in the powder substance according to the spectrum data. The problem of low analysis accuracy of the powder substance caused by lack of effective fixation of the powder substance during analysis of the powder substance in the prior art is solved.

Description

Technical Field

[0001] The present application relates to the technical field of powder material analysis, and in particular, to an elemental analysis device for powder materials. Background Art

[0002] With the increasing demand for industrial and environmental monitoring, rapid and accurate analysis of material composition is becoming increasingly important. Traditional chemical analysis methods often require complex sample pretreatment and long analysis time. Laser-induced breakdown spectroscopy (LIBS) technology is a non-contact, rapid, in-situ analysis method that can quickly analyze the elemental composition of solids, liquids, and even gases without sample pretreatment.

[0003] Although LIBS technology has significant advantages in elemental analysis, in the analysis of powdered materials, the stability and accuracy of the analysis results are affected due to the non-uniformity and easy-to-fly characteristics of the powder. In addition, the existing LIBS system often lacks effective powder fixation and excitation methods when processing powdered materials, which limits its application in the field of powder analysis. Summary of the invention

[0004] The present application provides an elemental analysis device for powdered substances, so as to solve the problem in the related art that when analyzing powdered substances, there is a lack of effective fixation of the powdered substances, which leads to low analysis accuracy of the powdered substances.

[0005] According to one aspect of the present application, a powder material elemental analysis device is provided, comprising a fixing device, the fixing device comprising a substrate, a microneedle film assembly and a vacuum system, wherein powder material is placed on the substrate, the microneedle film assembly covers the powder material, and the vacuum system is connected to the fixing device for maintaining the fixing device in a vacuum state; a laser generating device is located on one side of the fixing device, for emitting laser to the powder material so that the powder material generates plasma; a spectral acquisition device is located on one side of the fixing device, for acquiring spectral data of reflected light of the plasma; and a data processing unit is electrically connected to the spectral acquisition device, for determining the content of each element in the powder material based on the spectral data.

[0006] Optionally, the elemental analysis device also includes: a laser protection cover, an emergency stop button and an overheating protection system, wherein the elemental analysis device is located in the laser protection cover, the laser protection cover is used to protect the area outside the elemental analysis device from being affected by the laser, the emergency stop button and the overheating protection system are electrically connected to the laser generating device, the emergency stop button is used to cut off the power supply of the laser generating device, and the overheating protection system is used to monitor and control the temperature of the laser generating device.

[0007] Optionally, the microneedle film assembly comprises a film and a plurality of microneedles, the microneedles are arranged in a matrix on the film, and the microneedle film assembly has one side of the microneedles covered with the powder substance.

[0008] Optionally, the fixing device further includes: a vacuum regulating valve and a high-precision pressure gauge, wherein the vacuum regulating valve is connected to the vacuum system, the vacuum regulating valve is used to adjust the vacuum degree of the laser generating device, and the high-precision pressure gauge is connected to the fixing device, and the high-precision pressure gauge is used to monitor the pressure inside the fixing device.

[0009] Optionally, the vacuum system comprises a filter and a pipeline, wherein the pipeline is communicated with the fixing device, the filter is located in the pipeline, and the filter is used to intercept powdery substances that mistakenly enter the pipeline.

[0010] Optionally, the substrate includes a plurality of holes, and the holes are used to connect the pipes.

[0011] Optionally, the types of the spectrum acquisition device include: a charge coupled device or a CMOS sensor.

[0012] Optionally, the fixing device comprises an observation window, and the observation window is located on a side wall of the fixing device.

[0013] Optionally, the elemental analysis device further includes: an optical system, wherein the optical system is located between the fixing device and the spectrum collection device, or one end of the optical system is located at the observation window and the other end is connected to the spectrum collection device, and the optical system is used to transmit the reflected light of the plasma to the spectrum collection device.

[0014] Optionally, the optical system comprises at least one of the following: an optical fiber and a lens assembly.

[0015] The elemental analysis device of the powder material of the present application includes a fixing device, a laser generating device, a spectrum acquisition device and a data processing unit, wherein the fixing device includes a substrate, a microneedle film assembly and a vacuum system, the powder material is located on the above-mentioned substrate, the microneedle film assembly covers the above-mentioned substrate to fix the above-mentioned powder material, the vacuum system extracts vacuum from the fixing device, the laser generating device irradiates the powder material with a laser to generate plasma from the above-mentioned powder material, the spectrum acquisition device receives the reflected light of the above-mentioned plasma, generates spectrum data of the reflected light, and the data processing unit analyzes the spectrum data to finally determine the content of each element in the powder material. By using the microneedle film assembly to effectively fix the powder material, and the laser generating device irradiates the powder material in the vacuum fixing device with high energy, the device can detect elements with extremely low concentrations, greatly improving the sensitivity and accuracy of the analysis. It solves the problem of lack of effective fixation of the powder material when analyzing the powder material in the related art, which leads to low analysis accuracy of the powder material. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of this application. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0017] Figure 1 is a schematic structural diagram of an elemental analysis device for powdered substances provided according to an embodiment of the present application;

[0018] Figure 2 It is a schematic diagram of the working process of an elemental analysis device for powdered substances provided in an embodiment of the present application;

[0019] Figure 3 is a schematic diagram of adjusting a fixing device of an elemental analysis device for powdered substances provided in an embodiment of the present application;

[0020] Figure 4 It is a schematic diagram of adjusting a laser generating device of an elemental analysis device for powdered materials provided in an embodiment of the present application;

[0021] Figure 5 This is a schematic diagram of adjusting a spectrum collection device of an elemental analysis device for powdered materials provided in an embodiment of the present application;

[0022] Figure 6 It is a schematic diagram of the adjustment of the data processing module of the elemental analysis device for powdered materials provided in an embodiment of the present application.

[0023] The above drawings include the following reference numerals:

[0024] 10. Fixing device; 20. Laser generating device; 30. Spectrum collecting device; 40. Data processing unit. DETAILED DESCRIPTION

[0025] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0026] It should be noted that, unless otherwise specified, all technical and scientific terms used in this application have the same meanings as commonly understood by ordinary technicians in the technical field to which this application belongs.

[0027] In the present invention, unless otherwise specified, the directional words used, such as "up, down, top, bottom", usually refer to the directions shown in the drawings, or to the components themselves in the vertical, perpendicular or gravity directions; similarly, for ease of understanding and description, "inside and outside" refer to the inside and outside relative to the outline of each component itself, but the above-mentioned directional words are not used to limit the present invention.

[0028] According to an embodiment of the present application, a powder material element analysis device is provided, such as Figure 1 As shown, it includes a fixing device 10, and the fixing device 10 includes a substrate, a microneedle film assembly and a vacuum system, wherein a powdered substance is placed on the substrate, and the microneedle film assembly covers the powdered substance. The vacuum system is connected to the fixing device and is used to keep the fixing device in a vacuum state; a laser generating device 20 is located on one side of the fixing device 10 and is used to emit laser to the powdered substance so that the powdered substance generates plasma; a spectrum acquisition device 30 is located on one side of the fixing device 10 and is used to acquire spectrum data of the reflected light of the plasma; a data processing unit 40 is electrically connected to the spectrum acquisition device 30 and is used to determine the content of each element in the powdered substance according to the spectrum data.

[0029] By combining the fixation technology of the microneedle film assembly, the excitation capability of the high-energy pulse laser generator, the high-sensitivity spectrum acquisition device, and the data processing unit with the data processing capability of professional spectrum analysis software, a rapid and accurate analysis of the elements in the powdered material is achieved. Its unique microneedle structure and film material ensure the stable fixation of the sample, while the addition of vacuum adsorption further improves the reliability and flexibility of sample fixation. The precise control of the high-energy pulse laser generator and the optimized design of the high-sensitivity spectrum acquisition device enable the device to detect extremely low concentrations of elements, greatly improving the sensitivity and accuracy of the analysis. The machine learning algorithm used by the data processing unit can automatically identify and analyze complex spectral data, significantly improving the speed and accuracy of data processing.

[0030] The fixing device also includes a magnetic fixing device, which can generate a magnetic field to fix some metal powder materials. The magnetic fixing device can be placed around the substrate. The excitation device is equipped with a high-energy pulse laser, the spectrum acquisition device is equipped with a high-sensitivity spectrometer, and the data processing unit includes a high-performance computer and professional spectrum analysis software, which are used to process and analyze the spectrum data collected by the spectrum acquisition device and output the content information of the elements in the powder material. The device greatly improves the efficiency and accuracy of element analysis of powder materials, and is suitable for rapid detection of various powder materials, such as metal powder, ceramic powder, mineral powder, etc., and provides a powerful analysis tool for materials science, geology, environmental science and other fields.

[0031] The high-energy pulse laser generator has an adjustable pulse width range of 1 to 10 nanoseconds, an energy output range of 1 to 10 joules, and an adjustable frequency range of 1 Hz to 100 Hz. The precise control capability of this laser generator can adapt to different samples and analysis requirements, improve the flexibility and applicability of analysis, and is suitable for various material analyses that require high-energy laser excitation, such as metal alloy composition analysis, geological sample element detection, etc.

[0032] The above-mentioned high-sensitivity spectrum acquisition device has a cooled CCD detector. The use of a cooled CCD detector can reduce the noise of the detector and improve the sensitivity of spectrum acquisition. It is suitable for analytical tasks that require the detection of extremely low concentration elements, such as environmental pollutant powder detection and harmful substance powder analysis in food.

[0033] The professional spectral analysis software in the above data processing unit adopts machine learning algorithms. The introduction of machine learning algorithms can automatically identify and analyze complex spectral data, reduce human errors, improve the efficiency and accuracy of data processing, and is suitable for spectral analysis and pattern recognition of large amounts of data. The data processing unit adopts a layered architecture and designs a simple and intuitive interface, including a menu bar, a toolbar, and a data display area. It supports the import of data in multiple formats, can connect to specific devices to read data, and has management functions such as storage and retrieval. It provides preprocessing methods such as noise removal, baseline correction, and data normalization. Among them, quantitative analysis involves algorithms such as multivariate linear regression, partial least squares, and artificial neural networks, which can establish a model of the relationship between element content and spectral characteristics; qualitative analysis includes spectral line recognition and pattern recognition, which can determine the type of element and classify and identify samples. The results are displayed in tables and charts, and custom reports can be generated and exported in multiple formats.

[0034] In some optional embodiments, the above-mentioned elemental analysis device also includes: a laser protection cover, an emergency stop button and an overheating protection system, wherein the above-mentioned elemental analysis device is located in the above-mentioned laser protection cover, the above-mentioned laser protection cover is used to protect the area outside the above-mentioned elemental analysis device from being affected by the laser, the above-mentioned emergency stop button and the above-mentioned overheating protection system are electrically connected to the above-mentioned laser generating device, the above-mentioned emergency stop button is used to cut off the power supply of the above-mentioned laser generating device, and the above-mentioned overheating protection system is used to monitor and control the temperature of the laser generating device.

[0035] In the above optional embodiment, the laser protective cover is made of high-strength polycarbonate material, which is openable and integrated with the safety interlock mechanism of the laser system. This protective cover can not only effectively prevent laser leakage and protect the safety of operators, but also facilitate the loading and unloading of samples, improve the convenience and safety of the device, and is suitable for various laboratories and industrial environments that require laser operation, such as laser cutting, laser welding, etc. The emergency stop button is located on the front panel of the elemental analysis device, and the trigger mechanism is mechanical. Once activated, it can immediately cut off the power supply of the laser. This safety design can quickly stop the laser operation in an emergency, protect the safety of operators and equipment, and is suitable for various analysis scenarios that may encounter emergencies, such as laboratory accidents, industrial production failures, etc. The overheating protection system includes a temperature detection sensor and an automatic fan cooling mechanism. The addition of the overheating protection system can effectively monitor and control the temperature of the laser, prevent overheating damage, and extend the service life of the equipment. It is suitable for industrial detection and scientific research experiments that are operated continuously for a long time, such as continuous analysis of material composition, batch detection of environmental samples, etc.

[0036] The transparency of the laser protection cover is greater than 90%. The high transparency laser protection cover design can not only effectively protect the safety of the operator, but also facilitate the observation of the analysis process, improve the intuitiveness and convenience of the operation, and is suitable for scientific research experiments and industrial production that require real-time monitoring of the analysis process, such as laser processing process monitoring, material surface morphology analysis, etc. The temperature detection element of the overheating protection system is a thermocouple. As a temperature detection element, the thermocouple has the characteristics of fast response speed and high precision. It can monitor the temperature changes of the laser in real time to ensure the normal operation of the equipment. It is suitable for high-power laser operations that require real-time temperature monitoring, such as laser cutting, laser welding, etc.

[0037] The temperature detection element of the overheat protection system can be a thermocouple. As a temperature detection element, the thermocouple has the characteristics of fast response speed and high precision. It can monitor the temperature changes of the laser in real time to ensure the normal operation of the equipment. It is suitable for high-power laser operations that require real-time temperature monitoring, such as laser cutting and laser welding. By using thermocouples as temperature detection elements, the overheat protection system can achieve high-precision and real-time monitoring of the laser temperature, effectively preventing equipment failures and safety hazards caused by overheating, which is crucial for industrial applications that require high-power laser operations. In laser cutting and welding, the fast response and high-precision monitoring capabilities of thermocouples can ensure that the laser operates within a safe temperature range, improve the accuracy and efficiency of cutting and welding, and have a positive impact on improving product quality and production safety.

[0038] In some optional embodiments, the microneedle film assembly comprises a film and a plurality of microneedles, the microneedles are arranged in a matrix on the film, and the microneedle film assembly has one side of the microneedles covered with the powder substance.

[0039] In the above optional embodiment, the film material of the microneedle film assembly is polyimide. Polyimide film has good thermal stability and chemical stability, can be used in various harsh analysis environments, ensure the safety and effectiveness of sample fixation, and is suitable for material analysis in high temperature and corrosive environments, such as high temperature alloy composition detection, chemical reaction process monitoring, etc. The microneedle structure of the microneedle film assembly is conical, and the length ranges from 50 to 200 microns. This microneedle structure can accurately fix and position the sample, reduce the movement of the sample, and improve the accuracy of the analysis results. It is suitable for analysis scenarios with high requirements for sample fixation, such as nanomaterial analysis, biological sample detection, etc.

[0040] In some optional embodiments, the above-mentioned fixing device also includes: a vacuum regulating valve and a high-precision pressure gauge, wherein the above-mentioned vacuum regulating valve is connected to the above-mentioned vacuum system, the above-mentioned vacuum regulating valve is used to adjust the vacuum degree of the above-mentioned laser generating device, and the above-mentioned high-precision pressure gauge is connected to the above-mentioned fixing device, and the above-mentioned high-precision pressure gauge is used to monitor the pressure inside the above-mentioned fixing device.

[0041] In the above optional implementation, the vacuum regulating valve adopts electromagnetic control mode, which can make the vacuum degree between 10 -3 Up to 10 -7Torr. This precise vacuum control capability can effectively reduce gas interference on the sample surface, improve the efficiency of laser excitation and the purity of the spectrum, and is particularly suitable for analysis scenarios with strict requirements on the vacuum environment, such as ultra-pure material analysis, aerospace material testing, etc. The high-precision pressure gauge has a digital display function and an accuracy of up to 0.01 Torr. The high-precision pressure gauge with digital display can monitor the pressure changes in the vacuum chamber in real time to ensure the stability and repeatability of the analysis process. It is suitable for experimental research and industrial production that require precise pressure control, such as semiconductor manufacturing and precision instrument calibration. The precise vacuum adjustment capability significantly improves the analysis effect of ultra-pure materials, reduces the interference of surface gas molecules on laser excitation, makes the spectral data purer, and the analysis results more accurate. In aerospace material testing, this analysis under a high vacuum environment can effectively avoid the influence of impurities in the atmosphere on the analysis of precision material components, ensuring the high quality and flight safety of aerospace materials.

[0042] In some optional embodiments, the vacuum system includes a filter and a pipe, the pipe is connected to the fixing device, the filter is located in the pipe, and the filter is used to intercept powdered material that mistakenly enters the pipe.

[0043] In the above optional embodiment, a pipeline connects the vacuum pump and the fixing device, and the filter is located at the air suction port of the above pipeline, which can prevent powdered matter from entering the vacuum pump through the pipeline, thereby avoiding damage to the electrodes of the vacuum pump and extending the service life of the vacuum pump.

[0044] In some optional embodiments, the substrate includes a plurality of holes, and the holes are used to connect the pipes.

[0045] In the above optional embodiment, the holes are also used to fix the microneedles of the microneedle film assembly so that the microneedles can better penetrate the powdered substance and fix the powdered substance.

[0046] In some optional embodiments, the types of the above-mentioned spectrum acquisition device include: a charge coupled device or a CMOS sensor.

[0047] In the above optional implementation, the charge-coupled device (CCD) is a device for photoelectric conversion. CCD captures images by converting light signals into electric charges, and transferring and accumulating the electric charges inside the chip. CCD has the advantages of high sensitivity, low noise and high resolution. Complementary Metal-Oxide-Semiconductor (CMOS) is also a device for photoelectric conversion. Compared with CCD, CMOS sensors integrate more functional units on the same chip, such as analog signal processing, digital signal processing and AD conversion. CMOS sensors have the advantages of low power consumption, high integration and low cost.

[0048] In some optional embodiments, the fixing device comprises an observation window, and the observation window is located on a side wall of the fixing device.

[0049] In the above optional embodiment, the material of the observation window is quartz glass with high light transmittance, and the surface is coated with an anti-reflection film. This design ensures the efficient transmission of the laser beam and the clear collection of spectral data, reduces the energy loss and stray light interference in the optical path, and improves the reliability of the analysis results. It is suitable for scientific research laboratories and industrial production lines that require high-precision spectral data, such as semiconductor material analysis, drug component detection, etc. By using quartz glass with high light transmittance and an anti-reflection film, the observation window can effectively reduce the signal loss during the spectrum acquisition process and improve the clarity and integrity of the spectral data. In drug component detection, clear spectral data can help researchers more accurately identify active ingredients and potential contaminants in drugs, ensuring the safety and effectiveness of drugs.

[0050] In some optional embodiments, the above-mentioned elemental analysis device also includes: an optical system, the above-mentioned optical system is located between the above-mentioned fixing device and the above-mentioned spectrum collection device, or, one end of the above-mentioned optical system is located at the above-mentioned observation window, and the other end is connected to the above-mentioned spectrum collection device, and the above-mentioned optical system is used to transmit the reflected light of the above-mentioned plasma to the above-mentioned spectrum collection device.

[0051] In the above optional implementation, after the plasma is generated, it will reflect the ambient light and laser, and the optical system transmits the reflected light to the spectrum collection device through reflection, refraction, total reflection, etc. to generate spectrum data, thereby reducing light loss and distortion and improving light collection efficiency, making the test results more accurate.

[0052] In some optional embodiments, the optical system includes at least one of the following: an optical fiber and a lens assembly.

[0053] In the above optional embodiments, the optimized optical system may include a lens assembly, a grating spectrometer, and an optical fiber transmission assembly. The optimized optical system design can improve the resolution and acquisition efficiency of the spectrum, reduce the distortion of the spectral data, and is suitable for scientific research experiments and industrial testing that require high-resolution spectral data, such as semiconductor material spectral analysis, biomolecular structure identification, etc. The use of optical fiber can directly transmit the light emitted by the plasma to the spectrometer, reduce the scattering and absorption of light during the transmission process, and reduce the consumption of reflected light.

[0054] like Figure 2 As shown, the working process of the powder material element analysis device includes: initializing the device, placing the sample into the fixing device, the sample is located on the substrate, the powder sample is fixed by the micro-needle film assembly, the laser generating device is controlled to perform laser excitation on the powder sample, the powder sample generates plasma, the spectrum acquisition device collects the reflected light of the plasma and generates spectrum data for analysis by the data processing unit, the data processing unit analyzes the spectrum data, and outputs the results of the powder sample. After use, the element analysis device is systematically calibrated and maintained for the next use.

[0055] like Figure 3 As shown, the adjustment steps of the fixing device include: adjusting the position of the microneedle film assembly, placing the powder sample, the microneedle film assembly penetrates the sample to fix the sample, checking the stability of the fixed sample, and completing the sample fixation.

[0056] like Figure 4 As shown, the adjustment steps of the laser generating device include: starting the laser generating device, setting laser parameters for the laser generating device, emitting laser to excite the sample to generate plasma, using a spectrum acquisition device to collect plasma data generated by the excitation, and shutting down the laser excitation device.

[0057] like Figure 5 As shown, the adjustment steps of the spectrum acquisition device include: starting the spectrum acquisition device, acquiring the spectrum while the laser generating device excites the sample, transmitting the reflected light of the plasma to the spectrum acquisition device (which can be a spectrometer CCD) through the optical fiber, the spectrum acquisition device records the spectrum data, and transmits the spectrum data to the data processing unit, thereby ending the spectrum acquisition process.

[0058] like Figure 6 As shown in the figure, the working process of the data processing unit is: processing spectral data, generating analysis results, and outputting result reports.

[0059] The powder material element analysis device of the present application realizes the rapid and accurate analysis of elements in powder materials by combining the fixing technology of microneedle film components, the excitation ability of high-energy pulse laser generator, the acquisition accuracy of high-sensitivity spectrum acquisition device and data processing unit. Its unique microneedle structure and film material ensure the stable fixation of samples, and the addition of vacuum adsorption and magnetic fixation functions further improves the reliability and flexibility of sample fixation. The precise control of the high-energy pulse laser generator and the optimized design of the high-sensitivity spectrometer enable the device to detect elements at extremely low concentrations, greatly improving the sensitivity and accuracy of the analysis. The machine learning algorithm used in the data processing unit can automatically identify and analyze complex spectral data, significantly improve the speed and accuracy of data processing, improve the analysis efficiency, and ensure the safety of operation, providing a new solution for the elemental analysis of powder materials, which is widely used in scientific research, industrial testing and other fields, and greatly promotes the development of materials science. In addition, the modular design and intelligent operation interface of the device enable users to flexibly adjust the configuration and parameters of the device according to different analysis needs.

[0060] After being implemented in the field of materials science, the device can significantly improve the speed of metal powder composition analysis. For large-scale metal powder products, such as 3D printing materials and alloy powders, its fast and accurate analysis capabilities greatly improve production efficiency and product quality control. In the fields of geology and environmental science, the device can be used to quickly detect trace elements in mineral powders, which is helpful for geological exploration and environmental pollution monitoring. Especially in field operations, its portability and efficiency are particularly important.

[0061] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0062] It should be noted that the terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein.

[0063] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. An elemental analysis device for powdered substances, characterized in that: include: A fixing device, comprising a substrate, a microneedle film assembly and a vacuum system, wherein a powder substance is placed on the substrate, the microneedle film assembly covers the powder substance, and the vacuum system is connected to the fixing device to keep the fixing device in a vacuum state; A laser generating device, located at one side of the fixing device, for emitting laser light to the powder material so as to generate plasma from the powder material; A spectrum collection device, located on one side of the fixing device, for collecting spectrum data of the reflected light of the plasma; The data processing unit is electrically connected to the spectrum acquisition device and is used to determine the content of each element in the powder material according to the spectrum data.

2. The element analysis device according to claim 1, characterized in that The elemental analysis device also includes: a laser protection cover, an emergency stop button and an overheating protection system, wherein the elemental analysis device is located in the laser protection cover, the laser protection cover is used to protect the area outside the elemental analysis device from being affected by the laser, the emergency stop button and the overheating protection system are electrically connected to the laser generating device, the emergency stop button is used to cut off the power supply of the laser generating device, and the overheating protection system is used to monitor and control the temperature of the laser generating device.

3. The element analysis device according to claim 1, characterized in that The microneedle film assembly comprises a film and a plurality of microneedles, wherein the microneedles are arranged in a matrix on the film, and the microneedle film assembly has one side of the microneedles covered with the powder substance.

4. The element analysis device according to claim 1, characterized in that The fixing device also includes: a vacuum regulating valve and a high-precision pressure gauge, wherein the vacuum regulating valve is connected to the vacuum system, and the vacuum regulating valve is used to adjust the vacuum degree of the laser generating device; the high-precision pressure gauge is connected to the fixing device, and the high-precision pressure gauge is used to monitor the pressure inside the fixing device.

5. The element analysis device according to claim 1, characterized in that The vacuum system comprises a filter and a pipeline, wherein the pipeline is communicated with the fixing device, the filter is located in the pipeline, and the filter is used to intercept powder material that mistakenly enters the pipeline.

6. The element analysis device according to claim 5, characterized in that The substrate includes a plurality of holes, and the holes are used to connect the pipes.

7. The element analysis device according to claim 1, characterized in that The types of the spectrum acquisition device include: a charge coupled device or a CMOS sensor.

8. The element analysis device according to claim 1, characterized in that The fixing device comprises an observation window, and the observation window is located on a side wall of the fixing device.

9. The element analysis device according to claim 8, characterized in that: The elemental analysis device also includes: an optical system, which is located between the fixing device and the spectrum collection device, or one end of the optical system is located at the observation window and the other end is connected to the spectrum collection device, and the optical system is used to transmit the reflected light of the plasma to the spectrum collection device.

10. The element analysis device according to claim 9, characterized in that: The optical system includes at least one of the following: an optical fiber and a lens assembly.

Images