Test parameter adjusting and testing system and method, chip testing equipment and electronic equipment

Abstract

The embodiment of the invention discloses a test parameter adjusting and testing system and method, chip testing equipment and electronic equipment. The system comprises a driving link module, a driving service module and a testing module. The driving link module is used for storing each first interface corresponding to at least one device in the chip test equipment; the drive service module is used for calling a first target interface in the drive link module when test parameter adjustment information for a target test item is received, and controlling the first target interface to send the test parameter adjustment information to a target device; and the test module is used for controlling the target device to execute the target test item according to the test parameter adjustment information and acquiring a test result corresponding to the target test item. Therefore, the test parameter information in the target device is directly adjusted in the chip test equipment, so that the test module can test according to the test parameter adjustment information, the adjusted test parameter information does not need to be uploaded to the chip test equipment again, and the test parameter adjustment efficiency is improved.

Description

Technical Field

[0001] The present application relates to chip testing technology, and in particular to a test parameter adjustment system, method, chip testing equipment and electronic equipment. Background Art

[0002] With the continuous improvement of domestic R&D, design, and manufacturing capabilities of high-end integrated circuits (ICs), as well as the strong growth in demand in consumer fields such as mobile phones and automotive electronics, the demand for RF chips is also increasing year by year. Due to the high design complexity of RF chips, the corresponding testing of RF chips is also relatively complex. Therefore, before testing RF chips, it is necessary to adjust the test parameter information used to test RF chips so that the chip testing equipment can stably test the RF chips and achieve good test results.

[0003] In the process of implementing the present application, it was discovered through research that in the process of debugging the test parameter information, each time the test parameter information is adjusted, the adjusted test parameter information needs to be re-uploaded to the chip testing equipment, and the chip testing equipment re-executes the adjusted test parameter information until the test is stable. However, since the test parameter information is relatively large, each time the test parameter information is uploaded to the chip testing equipment and the test parameter information is executed, it takes a long time, which makes it time-consuming to adjust the test parameter information, resulting in low efficiency in adjusting the test parameter information. Summary of the invention

[0004] In order to solve the above technical problems, the embodiments of the present application provide a test parameter adjustment system, method, chip testing equipment and electronic equipment.

[0005] According to one aspect of an embodiment of the present application, a test parameter adjustment system is provided, which is applied to a chip test device, and the system includes a driver link module, a driver service module and a test module; the driver link module is used to store each first interface corresponding to at least one device in the chip test device; the driver service module is used to call a first target interface in each first interface in the driver link module when receiving test parameter adjustment information for a target test item, and control the first target interface to send the test parameter adjustment information to the target device; the test module is used to control the target device to execute the target test item with the test parameter adjustment information, and obtain the test result corresponding to the target test item.

[0006] Another aspect of an embodiment of the present application provides a chip testing device, which includes an industrial computer and a test head assembly, the industrial computer includes the above-mentioned test parameter adjustment system, and the test head assembly includes at least one RF transmitting board and at least one RF receiving board.

[0007] Another aspect of the embodiments of the present application provides a test parameter adjustment method, which is applied to a chip testing device, and the method includes: when the driver service module receives test parameter adjustment information for a target test item, the driver service module calls the first target interface in each first interface in the driver link module in the driver link module, and controls the first target interface to send the test parameter adjustment information to the target device; the test module controls the target device to execute the target test item with the test parameter adjustment information, and obtains the test result corresponding to the target test item.

[0008] In another aspect of the embodiments of the present application, an electronic device is provided, comprising: a memory for storing a computer program; a processor for executing the computer program stored in the memory, and when the computer program is executed, the above-mentioned test parameter adjustment method is implemented.

[0009] According to another aspect of the embodiments of the present application, a computer-readable storage medium is provided, on which a computer program is stored, characterized in that when the computer program is executed by a processor, the above-mentioned test parameter adjustment method is implemented.

[0010] In another aspect of the embodiments of the present application, a computer program product is provided, including computer program instructions, which implement the above-mentioned test parameter adjustment method when executed by a processor.

[0011] The test parameter adjustment system, method, chip test equipment and electronic device in the embodiment of the present application. The test parameter adjustment system includes a drive link module, a drive service module and a test module. The drive link module is used to store each first interface corresponding to at least one device in the chip test device; the drive service module is used to call the first target interface in each first interface in the drive link module when receiving the test parameter adjustment information for the target test item, and control the first target interface to send the test parameter adjustment information to the target device, and the test module is used to execute the target test item according to the test parameter adjustment information, and obtain the test result corresponding to the target test item. Therefore, in the embodiment of the present application, the first target interface for processing the test parameter adjustment information in the drive link module is called by the drive service module, and the test parameter adjustment information is sent to the target device through the first target interface, so that the test parameter information in the target device is directly adjusted in the chip test device, so that the test module can be tested according to the test parameter adjustment information, and there is no need to re-upload the adjusted test parameter information to the chip test device, thereby improving the adjustment efficiency of the test parameters.

[0012] In addition, in an embodiment of the present application, the test parameter adjustment information of the target test item is transmitted to the target device through the driver service module and the driver link module, so that the test parameter information of each test item can be adjusted, thereby not only further improving the efficiency of adjusting the test parameters, but also improving the accuracy of adjusting the test parameter information, thereby improving the stability of the chip testing by the chip testing equipment through the adjusted test parameter information.

[0013] The technical solution of the present application is further described in detail below through the accompanying drawings and embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] The accompanying drawings, which constitute a part of the specification, illustrate embodiments of the present application and, together with the description, serve to explain the principles of the present application.

[0015] The present application can be more clearly understood from the following detailed description with reference to the accompanying drawings, in which:

[0016] Figure 1 It is a structural diagram of a test parameter tuning system provided by an exemplary embodiment of the present application.

[0017] Figure 2 It is a structural diagram of a test parameter tuning system provided by another exemplary embodiment of the present application.

[0018] Figure 3 It is a schematic diagram of a visual interactive interface provided by an exemplary embodiment of the present application.

[0019] Figure 4 It is a structural diagram of a test parameter tuning system provided by another exemplary embodiment of the present application.

[0020] Figure 5 It is a schematic diagram of a visual interactive interface provided by another exemplary embodiment of the present application.

[0021] Figure 6 It is a schematic diagram of a chip testing device provided by an exemplary embodiment of the present application.

[0022] Figure 7 It is a flowchart of a test parameter adjustment method provided by an exemplary embodiment of the present application.

[0023] Figure 8 This is a schematic diagram of the structure of an application embodiment of the electronic device of the present application. DETAILED DESCRIPTION

[0024] Various exemplary embodiments of the present application will now be described in detail with reference to the accompanying drawings. It should be noted that unless otherwise specifically stated, the relative arrangement of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present application.

[0025] Those skilled in the art can understand that the terms "first" and "second" in the embodiments of the present application are only used to distinguish different steps, devices or modules, etc., and neither represent any specific technical meaning nor indicate the necessary logical order between them.

[0026] It should also be understood that in the embodiments of the present application, "plurality" may refer to two or more than two, and "at least one" may refer to one, two or more than two.

[0027] It should also be understood that any component, data or structure mentioned in the embodiments of the present application can generally be understood as one or more, unless explicitly limited or otherwise indicated in the context.

[0028] In addition, the term "and / or" in this application is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this application generally indicates that the associated objects before and after are in an "or" relationship.

[0029] It should also be understood that the description of the various embodiments in this application focuses on the differences between the various embodiments, and the same or similar aspects thereof can be referenced to each other, and for the sake of brevity, they will not be described one by one.

[0030] At the same time, it should be understood that for the convenience of description, the sizes of the various parts shown in the drawings are not drawn according to the actual proportional relationship.

[0031] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the present application, its application, or uses.

[0032] Technologies, methods, and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be considered as part of the specification.

[0033] It should be noted that like reference numerals and letters refer to similar items in the following figures, and therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0034] The embodiments of the present application can be applied to electronic devices such as terminal devices, computer systems, servers, etc., which can operate with many other general or special computing system environments or configurations. Examples of well-known terminal devices, computing systems, environments and / or configurations suitable for use with electronic devices such as terminal devices, computer systems, servers, etc. include, but are not limited to: personal computer systems, server computer systems, thin clients, thick clients, handheld or laptop devices, microprocessor-based systems, set-top boxes, programmable consumer electronics, network personal computers, small computer systems, large computer systems, and distributed cloud computing technology environments including any of the above systems, etc.

[0035] Electronic devices such as terminal devices, computer systems, servers, etc. can be described in the general context of computer system executable instructions (such as program modules) executed by computer systems. Generally, program modules can include routines, programs, object programs, components, logic, data structures, etc., which perform specific tasks or implement specific abstract data types. Computer systems / servers can be implemented in a distributed cloud computing environment, where tasks are performed by remote processing devices linked through a communication network. In a distributed cloud computing environment, program modules can be located on local or remote computing system storage media including storage devices.

[0036] In the process of implementing the present application, it is found through research that when testing the RF chip, a test task for the RF chip can be run in the chip test device to implement the test of the RF chip. The test task of the RF chip often includes multiple test items, each test item is used to detect at least one function of the RF chip, and each test item corresponds to a test parameter information. Therefore, when adjusting the test parameter information of the RF chip, it is necessary to adjust the test parameter information of each test item. Specifically, the test parameter information including all test items is first uploaded to the chip test device, and then the chip test device tests the RF chip according to the test parameter information to obtain the test results, and then adjusts the test parameter information according to the test results, and re-uploads the adjusted test parameter information to the chip test device, and the chip test device executes the adjusted test parameter information to test the RF chip, and repeats the above parameter adjustment operation until the test is stable. However, since the test parameter information of all test items is often relatively large, for example, the test parameter information can reach several GB, it takes a long time to upload the test parameter information of all test items to the chip testing equipment and execute the test parameter information each time. This makes it time-consuming to adjust the test parameter information, resulting in low efficiency in adjusting the test parameter information.

[0037] Figure 11 is a schematic diagram of the structure of a test parameter adjustment system provided by an exemplary embodiment of the present application. This embodiment can be applied to chip testing equipment, such as Figure 1 As shown, the test parameter tuning system 100 includes: a driver link module 110 , a driver service module 120 and a test module 130 .

[0038] The driver link module 110 is used to store each first interface corresponding to at least one device in the chip testing equipment.

[0039] Among them, the chip test equipment is used to test the function and / or performance of the chip, etc. Exemplarily, the chip test equipment can be an integrated circuit automatic tester (Automatic Test Equipment, ATE). The chip test equipment may include: an industrial computer and a test head (Test Head) component. The industrial computer may include, for example, at least one of the following: a computer, a server, a smart phone, and a tablet computer. The test parameter adjustment system may be deployed in the industrial computer, and the industrial computer is connected to the test head component for communication and control of the test head component. The test head component is used to test the function and / or performance of the chip to be tested. The test head component may include a plurality of devices, which may include, for example, at least one of the following: a plurality of service boards, a communication board (Communication of Tester Interface, CTI) and a whole machine management control board of the test head, etc. Each service board is responsible for testing at least one performance and / or function of the chip. For example, the service board may include, but is not limited to, at least one of the following: a chip power supply test board, a chip I / O (Input / Output, input / output) port test board, and a chip analog signal test board, etc. The communication board is used to collect data from each service board. For example, the communication board can collect self-test data, operation data, chip test data, etc. of each service board. The whole machine management control board of the test head can be used to collect data from the communication board, data from each service board collected by the communication board, etc. In one embodiment, at least one device can be any device in the test head.

[0040] The interface corresponding to the device in the chip testing device may be referred to as the first interface. Each first interface may provide control and data transmission functions for a device in the chip testing device. In one embodiment, each device in the chip testing device may correspond to multiple first interfaces, each first interface may correspond to at least one function, and each first interface may process relevant data of the function to which it corresponds. Exemplarily, the first interface corresponds to sending RF parameters (functions), and the first interface is responsible for transmitting the RF parameters to the storage location where the RF parameters are stored in the device corresponding to the first interface.

[0041] The driver service module 120 is used to call the first target interface at each first interface in the driver link module when receiving the test parameter adjustment information for the target test item, and control the first target interface to send the test parameter adjustment information to the target device.

[0042] The target device is a device in a chip test device, and the target device is used to execute a target test item. Exemplarily, the target device may include a service board in a test head assembly, etc.

[0043] In this embodiment, the first interface corresponding to the target device for processing the test parameter adjustment information can be determined as the first target interface. In one implementation, the first interfaces of the target device can be traversed, and according to the functions corresponding to the first interfaces, the first interface whose function is to process the test parameter adjustment information can be determined, and the first interface can be determined as the first target interface.

[0044] A test instance is used to test at least one function of a test chip. The test instance corresponds to a test parameter information, which includes the test parameters required by the test instance during the test. The test parameter information may include, for example, multiple test parameters and the true value of the test result. For example, assuming that the test instance tests a radio frequency chip, the test parameter information corresponding to the test instance may include: the signal source, amplitude, frequency, etc. (test parameters) of the input signal, and the true value of the output waveform (true value of the test result).

[0045] The test item that needs to be adjusted for test parameters may be referred to as a target test item, and the test parameter information of the adjusted target test item may be referred to as test parameter adjustment information. In one embodiment, the test parameter adjustment information may include all test parameters for the target test item. Exemplarily, at least one test parameter in the test parameter information of the target test item may be adjusted to update the test parameter, and the test parameter adjustment information is formed by each updated test parameter.

[0046] In one embodiment, the driver service module 120 is communicatively connected to the driver link module 110. For example, the driver service module 120 calls the first target interface in the driver link module 110 by means of a dynamic link library (DLL), and the first target interface exchanges data with the target device by means of optical fiber communication, that is, transmits the test parameter adjustment information to the target device.

[0047] The test module 130 is used to control the target device to execute the target test item with the test parameter adjustment information, and obtain the test result corresponding to the target test item.

[0048] The test module 130 may be, for example, a test engine, and may control a chip test device to test the chip. The test module 130 may control a target device to execute a target test item with the test parameter adjustment information received by the target device to test the chip.

[0049] In one embodiment, it can be determined based on the test results whether the test parameter adjustment information meets the preset test requirements. If it is determined that it meets the preset test requirements, the test parameter adjustment information is determined as the test parameter information of the target test item and recorded, and subsequently used to test the target test item in the test task.

[0050] Exemplarily, assuming that the target device is a radio frequency transmitting board, the test parameter adjustment information includes: continuous wave (test parameter), sine wave (test parameter), frequency a (test parameter) and amplitude b (test parameter), etc.; then the test module 130 can control the radio frequency transmitting board to send continuous wave and sine wave of frequency a and amplitude b to the chip for testing.

[0051] In the embodiment of the present application, the first target interface for processing the test parameter adjustment information in the driver link module is called by the driver service module, and the test parameter adjustment information is sent to the target device through the first target interface, so that the test parameter information in the target device is directly adjusted in the chip test device, so that the test module can perform the test according to the test parameter adjustment information, and there is no need to re-upload the adjusted test parameter information to the chip test device, thereby improving the adjustment efficiency of the test parameters. In addition, the test parameter adjustment information of the target test item is transmitted to the target device through the driver service module and the driver link module, so that the test parameter information of each test item can be adjusted, thereby not only further improving the efficiency of adjusting the test parameters, but also improving the accuracy of adjusting the test parameter information, thereby improving the stability of the chip test by the chip test device through the adjusted test parameter information.

[0052] In some optional implementations, in the embodiments of the present application, the test parameter adjustment information includes: at least one test parameter and at least one test bit. Each test bit in the at least one test bit includes: a chip pin, a board slot, a test head slot, and a signal channel.

[0053] Among them, the test parameter adjustment information may include multiple test parameters. For example, a signal output to the chip to be tested or a corresponding signal can be received according to the test parameters. The test bit is used to indicate the position where the target device sends a signal to the chip to be tested or receives a signal from the chip to be tested. The board slot can be used to indicate the station on the load board (Load Board) that loads the chip to be tested, and the test head slot is used to indicate the slot on the test head. For example, the test bit may include: pin0 and site0: 2.1, wherein pin0 indicates the 0th chip pin of the chip to be tested, site0 indicates the 0th board slot, that is, the 0th slot of the load board, 2.1 indicates the 2nd test head slot, and 1 in 2.1 indicates the 1st channel of the load board. The signal formed according to the test parameter adjustment information can be output to the chip to be tested through the test bit.

[0054] In the embodiment of the present application, by setting the test bit and the test parameter information for the target test item in the test parameter adjustment information, the target device can accurately send or receive the corresponding signal according to the test parameter information.

[0055] In some optional implementations, in the embodiment of the present application, the driving service module 120 is further used to store multiple second interfaces. The testing module 130 is further used to call the second target interface among the multiple second interfaces when receiving the test parameter adjustment information, and send the test parameter adjustment information to the driving service module 120 through the second target interface, so that the driving service module 120 executes the operation of calling the first target interface.

[0056] Each second interface may correspond to at least one function, and each second interface may process the relevant data of the function to which it corresponds. For example, if the second interface corresponds to transmitting the output power of the RF board (function), the output power of the RF board may be transmitted to the driving service module 120 through the second interface.

[0057] The second interface for processing the test parameter adjustment information in the driver service module 120 may be determined as the second target interface. In one embodiment, the test module 130 is communicatively connected to the driver service module 120. Exemplarily, when the test module 130 receives the test parameter adjustment information, the test module 130 may interact with the driver service module 120 through shared memory and serialization and deserialization technology to call the second target interface for processing the test parameter adjustment information, and transmit the test parameter adjustment information to the driver service module 120 through the second target interface.

[0058] In the embodiment of the present disclosure, multiple second interfaces are set in the driving service module, and different data are processed through different second interfaces to achieve efficient and accurate processing of different data. In addition, the second target interface used to process test parameter adjustment information in the driving service module is used to process test parameter adjustment information, thereby ensuring efficient interaction of test adjustment information between the test module and the driving service module.

[0059] Figure 2 is a schematic diagram of the structure of a test parameter adjustment system provided by another exemplary embodiment of the present application. In some optional implementations, such as Figure 2 As shown, the test parameter tuning system 100 further includes a parameter tuning module 140 .

[0060] The testing module 130 is further configured to store a plurality of third interfaces.

[0061] Each third interface may correspond to at least one function, and each third interface may process the relevant data of the function to which it corresponds. For example, if the third interface corresponds to transmitting the output power of the RF board (function), the output power of the RF board may be transmitted to the test module 130 through the third interface.

[0062] The parameter adjustment module 140 is used to display the test parameter information of the target test item through a visual interactive interface. In response to receiving the test parameter adjustment information sent by the user according to the test parameter information, it calls the third target interface in multiple third interfaces and transmits the test parameter adjustment information to the test module 130 through the third target interface.

[0063] The test parameter information of the target test item may include each test parameter and each test bit of the target test item. The third interface for processing the test parameter adjustment information in the test module 130 may be determined as the third target interface.

[0064] In one embodiment, the visual interactive interface can be displayed on a display screen of an industrial computer, for example. The parameter adjustment module 140 can also display the test parameter adjustment information through the visual interactive interface.

[0065] For example, Figure 3 is a schematic diagram of a visual interactive interface provided by an exemplary embodiment of the present application. Figure 3 As shown, in Figure 3 The target test items are shown in the figure for testing the RF chip through the target device RF sending board.

[0066] Instrument Setting indicates device settings, pin&type indicates pin and type, Channel Info indicates channel information, Signal indicates signal, and Last Applied Singal indicates the test parameters most recently transmitted to the target device.

[0067] The test position can be displayed and adjusted in Channel Info and pin&type, and the test parameters can be displayed and adjusted in the corresponding option box of Signal. CWSignal10_CW_mvpin0 in the corresponding option box of Signal indicates the identification of the test parameter information. When the user clicks the Edit option, multiple test parameters of the target test item are displayed and can be adjusted. At the same time, the test position of the target test item is displayed in Channel Info and pin&type, and can be adjusted. Among them, mv in pin&type indicates microwave (Microwave, MV), pin0 chip pin is the 0th pin, and CWSource indicates Continuous Wave continuous wave source; site0 in Channel Info: 2.1, site0 indicates the 0th board slot, 2.1 indicates the 2nd test head slot, and 1 in 2.1 indicates the 1st channel of the load board; Site1: 2.1, site1 indicates the 1st board slot, 2.1 indicates the 2nd test head slot, and 1 in 2.1 indicates the 1st channel of the load board.

[0068] In one embodiment, the parameter tuning module 140 is communicatively connected to the test module 130. Exemplarily, the parameter tuning module 140 may call the third target interface in the test module 130 through a GRPC (Google Remote Procedure Calls) communication method, and transmit the test parameter adjustment information to the test module 130 through the third target interface.

[0069] In the disclosed embodiments, by displaying the test parameter information of the target test item on a visual interactive interface, visualization of the test item parameter adjustment is achieved, so that the user can directly view and adjust the test parameter information on the visual interactive interface. The user no longer needs to view the test parameter information by viewing log information, etc., which greatly improves the efficiency of adjusting the test parameter information and also improves the user experience.

[0070] In some optional embodiments, in the embodiment of the present disclosure, the driver service module 120 is also used to call the fourth target interface in each first interface in the driver link module when receiving at least one updated test parameter for the target test item, and control the fourth target interface to send the at least one updated test parameter to the target device.

[0071] The first interface in the driver link module 110 corresponding to the target device and used for processing at least one update test parameter is determined as the fourth target interface.

[0072] In one embodiment, when the parameter tuning module 140 receives updated test parameters sent by the user according to the test parameter information of the target test item, the parameter tuning module 140 calls the third interface for processing the updated test parameters in the test module 130, and transmits the updated test parameters to the test module 130 through the third interface. The test module 130 receives the updated test parameters and calls the second interface for processing the updated test parameters in the drive service module 120, and transmits the updated test parameters to the drive service module 120 through the second interface. The drive service module 120 receives the updated test parameters, calls the fourth target interface in the drive link module 110, and controls the fourth target interface to send the updated test parameters to the target device.

[0073] For example, Figure 3 For example, Trigger Type indicates the trigger type, LevelImmediate indicates that an internal calibration is performed before sending a signal, Tone Source Select indicates selecting a signal source, Frequency indicates frequency, Amplitude indicates amplitude, and None indicates that no selection is made. The user can edit and update the test parameters in the Frequency option and / or the Amplitude option so that the parameter adjustment module 140 sends the test to the test module 130 to update the test parameters.

[0074] In the embodiment of the present disclosure, the fourth target interface in the driver link module is called by the driver service module, and the updated test parameters are sent to the target device through the fourth target interface, so that the corresponding test parameters corresponding to the target test items are adjusted according to requirements, thereby not only improving the efficiency of adjusting the test parameters, but also improving the flexibility of adjusting the test parameters.

[0075] Figure 4 is a schematic diagram of the structure of a test parameter adjustment system provided by another exemplary embodiment of the present application. Figure 4 As shown, the test parameter tuning system 100 further includes a test program editing module 150 .

[0076] The test program editing module 150 is used to edit and store test parameter information of multiple test items.

[0077] The test program editing module 150 may store a plurality of test items and test parameter information corresponding to each test item, and the test parameter information of each test item may also be edited through the test program editing module 150. Exemplarily, when it is determined through the test results that the test parameter adjustment information meets the preset test requirements, the test program editing module 150 may edit the test parameter adjustment information into the parameter information of the target test item.

[0078] The parameter debugging module 140 is further used to obtain the test parameter information of the target test item from the test program editing module 150, and display the identification of the test parameter information of the target test item through a visual interactive interface.

[0079] In one embodiment, the test program editing module 150 can be respectively connected to the parameter tuning module 140 and the test module 130. Exemplarily, the parameter tuning module 140 and the test module 130 can obtain the test parameter information of each test item from the test program editing module 150 through the GRPC communication mode, and the parameter tuning module 140 can also load the test parameter information of each test item so that the test parameter information can be adjusted through the parameter tuning module 140; the test module 130 can also load the test parameter information of each test item so that the test module can execute the corresponding test item to test the chip.

[0080] Accordingly, in an embodiment of the present disclosure, the test parameter information of the target test item can be displayed on the visual interactive interface in the following manner: in response to receiving an instruction to edit the test parameter information sent by the user based on the identification of the test parameter information of the target test item, the test parameter information is displayed on the visual interactive interface.

[0081] For example, Figure 3 Taking an example, when the user clicks the Signal option on the visual interactive interface, the visual interactive interface displays the identifiers of each test parameter information of the target test item. When the user selects CWSignal10_CW_mvpin0 (the identifier of the test parameter information), the test parameter information of the CWSignal10_CW_mvpin0 identifier can be displayed on the visual interactive interface.

[0082] In the embodiment of the present disclosure, the parameter adjustment module can obtain the test parameter information of the target test item from the test program editing module, and display the test parameter information on the visual interactive interface upon receiving the instruction to edit the test parameter information sent by the user based on the identifier of the test parameter information of the target test item, thereby realizing the visualization of the test parameter information and facilitating the user to adjust the parameter test information.

[0083] In some optional implementations, in the disclosed embodiment, the parameter adjustment module 140 is further used to display the circuit diagram corresponding to the target test item through a visual interactive interface. The driving service module 120 is further used to control whether the first target interface sends the test parameter adjustment information to the target device according to the state of the switch component in the circuit diagram, and control whether the second target interface sends at least one updated test parameter to the target device.

[0084] The states of the switch component include: closed and open.

[0085] In one embodiment, the circuit diagram corresponding to the target test item is a circuit diagram for implementing the target test item, and the circuit diagram may include a switch component and other circuit components. The switch component may be, for example, a common switch, a relay switch, or a single-pole four-throw switch, and other circuit components may include, for example, at least one of the following: an amplifier, an attenuator, a voltage source, and a diode. The circuit diagram corresponding to the target test item may be created by a graphical user interface application such as Qt. The user may control the state of the switch component by interacting with the switch component in the circuit diagram.

[0086] When the driving service module 120 receives the test parameter adjustment information, it determines the state of the switch component in the circuit diagram corresponding to the target test item. When the state of the switch component in the circuit diagram is closed, the first target interface is called to send the test parameter adjustment information to the target device. When the state of the switch component in the circuit diagram is open, the driving service module 120 can store the test parameter adjustment information.

[0087] Similarly, when the driving service module 120 receives the updated test parameters, it determines the state of the switch component in the circuit diagram corresponding to the target test item. When the state of the switch component in the circuit diagram is closed, the second target interface is called to send the updated test parameters to the target device. When the state of the switch component in the circuit diagram is open, the driving service module 120 can store the updated test parameters.

[0088] For example, Figure 3 Take this as an example to illustrate: Figure 3 The upper left corner is the circuit diagram corresponding to the target test item. Tone represents a sine wave. Figure 3 The state of the switch component in the circuit diagram is open.

[0089] In the disclosed embodiment, the parameter adjustment module is used to control the visualization interactive interface to display the circuit diagram corresponding to the target test item, and determines whether to send test parameter adjustment information or update the test parameters to the target device according to the state of the switch component in the circuit diagram. This not only realizes the visualization of the test parameter adjustment of the target test item, but also facilitates the user to control whether to send the test parameter adjustment information or update the test parameters to the target device, thereby improving the flexibility and convenience of the test parameter adjustment.

[0090] In some optional implementations, in the embodiments of the present disclosure, the parameter tuning module 140 is also used to display the test results through a visual interactive interface. In one implementation, when the parameter tuning module 140 receives an instruction sent by a user to capture the test results, the parameter tuning module 140 sends the instruction to the test module 130, the test module 130 sends the instruction to the driver service module 120, the driver service module 120 calls the first interface for capturing the test results in the driver link module 110 to capture the test results from the target device, and then the driver service module 120 sends the test results to the test module 130, the test module 130 sends the test results to the parameter tuning module 140, and then the parameter tuning module 140 displays the test results through a visual interactive interface.

[0091] In the disclosed embodiment, the parameter debugging module controls the visual interactive interface to display the test results, so that the user can view the test results conveniently.

[0092] In some optional implementations, in the embodiments of the present disclosure, the target device includes at least one RF transmitting board and at least one RF receiving board, and the test result includes a RF data waveform.

[0093] The test head assembly may further include at least one RF transmission board and at least one RF receiving board. In one embodiment, the RF transmission board integrates electronic components related to RF signal transmission to complete the RF signal transmission function with configurable parameters. The RF receiving board integrates electronic components related to RF signal reception to complete the RF signal reception and sampling functions with configurable parameters.

[0094] The driving service module 120 is also used to call the fifth target interface from each first interface in the driving link module 110 when receiving the capture test result instruction sent by the parameter tuning module 140, and capture the collected RF signal or the transmitted RF signal from the target device through the fifth target interface, and send the collected RF signal or the transmitted RF signal to the parameter tuning module 140.

[0095] The first interface for capturing the test result in the driver link module 110 is determined as the fifth target interface.

[0096] In one embodiment, an instruction for capturing test results can be sent to the parameter tuning module 140 through a visual interactive interface. When the parameter tuning module 140 receives the instruction, the parameter tuning module 140 sends the instruction to the test module 130, and the test module 130 sends the instruction to the drive service module 120. The drive service module 120 calls the fifth target interface in the drive link module 110 to capture the collected RF signal or the transmitted RF signal from the target device. After that, the drive service module 120 sends the collected RF signal or the transmitted RF signal to the test module 130, and the test module 130 sends the collected RF signal or the transmitted RF signal to the parameter tuning module 140.

[0097] The parameter adjustment module 140 is further configured to generate a radio frequency data waveform according to the collected radio frequency signal or the transmitted radio frequency signal in response to receiving a display detection result instruction sent by a user, and display it on a visual interactive interface.

[0098] In the disclosed embodiment, the RF transmitting board and the RF receiving board are integrated into the test head assembly, so that the RF chip can be tested uniformly through the chip testing equipment without the need to use other additional measuring devices to test the RF chip. At the same time, the RF data waveform is displayed on the visual interactive interface, which is convenient for users to adjust the test parameters according to the RF data waveform.

[0099] In some optional implementations, in the embodiments of the present disclosure, the parameter debugging module 140 is further configured to display the test parameter information of multiple test items through a visual interactive interface.

[0100] For example, Figure 5 is a schematic diagram of a visual interactive interface provided by another exemplary embodiment of the present application. Figure 5In the visualization interface, 5 windows are displayed, and each window displays the test parameter information of a test item. Among them, MWSignal10_PRN_mvpin3, MWSignal10_MD_mvpin6, MWSignal10_TT_mvpin0, MWSignal10_CW_mvpin1 and MWSignal10_CW_mvpin7 respectively represent the identification of the test parameter information, Capture means capture, and when Capture is clicked, the test result can be captured, ADC means digital-to-analog converter, LO means local oscillator, I / Q means in-phase and quadrature, LO Source Select selects the local oscillator source, LOSource0 means the name of the local oscillator source, RefClk Source means selecting the reference clock source, External means an option of the reference clock source, Pre Amplifier means signal amplifier, Center Frequency means center frequency, Reference Level means reference level, LO Offset means local oscillator frequency offset, Carrier Frequency means carrier frequency, Tone1 Source Select means selecting the signal source, Tone1 / Frequency means the frequency of signal 1, Tone1 / Amplitude means the amplitude of signal 1, Tone2 / Frequency means the frequency of signal 2, Tone2 / Amplitude means the amplitude of signal 2; pin3 / site0: 2.4, pin3 / site1: 2.8, pin6 / site0: 5.4, pin6 / site1: 5.8, pin0 / site0: 2.1, pin0 / site0: 2.5, pin1 / site0: 2.2, pin1 / site1: 2.6, pin7 / site0: 6.4, and pin7 / site1: 6.8 indicate the test bits respectively.

[0101] In the disclosed embodiment, by displaying the test parameter information of multiple test items on a visual interactive interface, it is convenient to uniformly display and adjust the test parameter information of related test items, thereby further improving the adjustment efficiency of the test parameter information.

[0102] Figure 6 Schematic diagram of a chip testing device provided by an exemplary embodiment of the present application. Figure 6 As shown, the chip testing device 200 includes an industrial computer 210 and a test head assembly 220 . The industrial computer 210 includes any test parameter adjustment system in this embodiment. The test head assembly 220 includes at least one RF transmitting board 221 and at least one RF receiving board 222 .

[0103] The chip testing device of the embodiment of the present application corresponds to the embodiment of the test parameter adjustment system of the present application, and the relevant contents can be referenced to each other and will not be repeated here.

[0104] The beneficial technical effects corresponding to the exemplary embodiment of the chip testing equipment of the embodiment of the present application can be referred to the corresponding beneficial technical effects of the above-mentioned corresponding exemplary system part, which will not be repeated here.

[0105] Figure 7 1 is a flow chart of a test parameter adjustment method provided by an exemplary embodiment of the present application. This embodiment can be applied to chip testing equipment, such as Figure 7 As shown, the test parameter adjustment method may include the following steps:

[0106] Step S300, when the driver service module receives the test parameter adjustment information for the target test item, the driver service module calls the first target interface in each first interface in the driver link module in the driver link module, and controls the first target interface to send the test parameter adjustment information to the target device, wherein each first interface corresponds to at least one device in the chip test device, and the target device is a device in the chip test device;

[0107] Step S310: The test module controls the target device to execute the target test item according to the test parameter adjustment information, and obtains the test result corresponding to the target test item.

[0108] In some possible implementations of the present disclosure, the method in an embodiment of the present disclosure also includes: when the test module receives the test parameter adjustment information, it calls a second target interface among multiple second interfaces in the driver service module, and sends the test parameter adjustment information to the driver service module through the second target interface, so that the driver service module executes the operation of calling the first target interface.

[0109] In some possible implementations of the present disclosure, the method in an embodiment of the present disclosure also includes: displaying test parameter information of the target test item through a visual interactive interface, in response to receiving the test parameter adjustment information sent by the user based on the test parameter information, calling a third target interface among multiple third interfaces in the test module, and transmitting the test parameter adjustment information to the test module through the third target interface.

[0110] In some possible implementations of the present disclosure, the method in an embodiment of the present disclosure also includes: when the driver service module receives at least one updated test parameter for the target test item, calling the fourth target interface in each first interface in the driver link module, and controlling the fourth target interface to send the at least one updated test parameter to the target device.

[0111] In some possible implementations of the present disclosure, the method in the embodiment of the present disclosure further includes: acquiring test parameter information of the target test item, and displaying an identification of the test parameter information of the target test item through a visual interactive interface;

[0112] The displaying of the test parameter information of the target test item through a visual interactive interface includes:

[0113] In response to receiving an instruction sent by a user to edit the test parameter information based on the identifier of the test parameter information of the target test item, the test parameter information is displayed on the visual interaction interface.

[0114] In some possible implementations of the present disclosure, the method in the embodiment of the present disclosure further includes:

[0115] The circuit diagram corresponding to the target test item is displayed through the visual interactive interface, and according to the state of the switch component in the circuit diagram, the first target interface is controlled to send the test parameter adjustment information to the target device, and the second target interface is controlled to send at least one updated test parameter to the target device.

[0116] In some possible implementations of the present disclosure, the target device in the embodiment of the present disclosure includes at least one radio frequency transmitting board and at least one radio frequency receiving board, and the test result includes a radio frequency data waveform;

[0117] The method further comprises:

[0118] When receiving the command to capture the test result sent by the parameter adjustment module, the driver service module calls the fifth target interface in each first interface in the driver link module, and captures the collected radio frequency signal or the transmitted radio frequency signal from the target device through the fifth target interface, and sends the collected radio frequency signal or the transmitted radio frequency signal to the parameter adjustment module;

[0119] In response to receiving the display detection result instruction sent by the user, the radio frequency data waveform is generated according to the collected radio frequency signal or the transmitted radio frequency signal, and is displayed on the visual interactive interface.

[0120] The test parameter tuning method of the embodiment of the present application corresponds to the embodiment of the test parameter tuning system of the present application, and the relevant contents can be referenced to each other and will not be repeated here.

[0121] The beneficial technical effects corresponding to the exemplary embodiment of the test parameter adjustment method of the embodiment of the present application can be referred to the corresponding beneficial technical effects of the above-mentioned corresponding exemplary system part, which will not be repeated here.

[0122] In addition, an embodiment of the present application further provides an electronic device, including:

[0123] Memory for storing computer programs;

[0124] The processor is used to execute the computer program stored in the memory, and when the computer program is executed, the test parameter adjustment method described in any of the above embodiments of the present application is implemented.

[0125] Figure 8 This is a schematic diagram of the structure of an application embodiment of the electronic device of the present application. Figure 8 The electronic device according to the embodiment of the present application is described. The electronic device may be any one or both of the first device and the second device, or a stand-alone device independent of them, and the stand-alone device may communicate with the first device and the second device to receive the collected input signal from them.

[0126] like Figure 8 As shown, the electronic device includes one or more processors and memory.

[0127] The processor may be a central processing unit (CPU) or other forms of processing units having data processing capabilities and / or instruction execution capabilities, and may control other components in the electronic device to perform desired functions.

[0128] The memory may include one or more computer program products, and the computer program product may include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. The volatile memory may include, for example, a random access memory (RAM) and / or a cache memory (cache), etc. The non-volatile memory may include, for example, a read-only memory (ROM), a hard disk, a flash memory, etc. One or more computer program instructions may be stored on the computer-readable storage medium, and the processor may execute the program instructions to implement the test parameter adjustment method of each embodiment of the present application described above and / or other desired functions.

[0129] In one example, the electronic device may further include: an input device and an output device, and these components are interconnected via a bus system and / or other forms of connection mechanisms (not shown).

[0130] In addition, the input device may also include, for example, a keyboard, a mouse, and the like.

[0131] The output device can output various information to the outside, including the determined distance information, direction information, etc. The output device can include, for example, a display, a speaker, a printer, a communication network and a remote output device connected thereto, and the like.

[0132] Of course, to simplify, Figure 8 Only some of the components in the electronic device related to the present application are shown, and components such as a bus, an input / output interface, etc. are omitted. In addition, the electronic device may further include any other appropriate components according to specific application conditions.

[0133] In addition to the above-mentioned methods and devices, an embodiment of the present application may also be a computer program product, which includes computer program instructions, which, when executed by a processor, enable the processor to execute the steps of the test parameter adjustment method according to various embodiments of the present application described in the above part of this specification.

[0134] The computer program product may be written in any combination of one or more programming languages ​​to write program codes for performing the operations of the embodiments of the present application, including object-oriented programming languages, such as Java, C++, etc., and conventional procedural programming languages, such as "C" language or similar programming languages. The program code may be executed entirely on the user computing device, partially on the user device, as an independent software package, partially on the user computing device and partially on a remote computing device, or entirely on a remote computing device or server.

[0135] In addition, an embodiment of the present application may also be a computer-readable storage medium on which computer program instructions are stored. When the computer program instructions are executed by a processor, the processor executes the steps of the test parameter adjustment method according to various embodiments of the present application described in the above part of this specification.

[0136] The computer readable storage medium can adopt any combination of one or more readable media. The readable medium can be a readable signal medium or a readable storage medium. The readable storage medium can include, for example, but is not limited to, a system, device or device of electricity, magnetism, light, electromagnetic, infrared, or semiconductor, or any combination of the above. More specific examples (non-exhaustive list) of readable storage media include: an electrical connection with one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0137] A person of ordinary skill in the art can understand that all or part of the steps of implementing the above method embodiment can be completed by hardware related to program instructions, and the aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it executes the steps of the above method embodiment; and the aforementioned storage medium includes: ROM, RAM, magnetic disk or optical disk, etc., various media that can store program codes.

[0138] The basic principles of the present application are described above in conjunction with specific embodiments. However, it should be noted that the advantages, strengths, effects, etc. mentioned in the present application are only examples and not limitations, and it cannot be considered that these advantages, strengths, effects, etc. are required by each embodiment of the present application. In addition, the specific details disclosed above are only for the purpose of illustration and ease of understanding, not for limitation, and the above details do not limit the present application to being implemented by adopting the above specific details.

[0139] Each embodiment in this specification is described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the embodiments can be referred to each other. For the system embodiment, since it basically corresponds to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment.

[0140] The block diagrams of the devices, apparatuses, equipment, and systems involved in this application are only illustrative examples and are not intended to require or imply that they must be connected, arranged, and configured in the manner shown in the block diagram. As will be appreciated by those skilled in the art, these devices, apparatuses, equipment, and systems can be connected, arranged, and configured in any manner. Words such as "including", "comprising", "having", etc. are open words, referring to "including but not limited to", and can be used interchangeably with them. The words "or" and "and" used here refer to the words "and / or" and can be used interchangeably with them, unless the context clearly indicates otherwise. The words "such as" used here refer to the phrase "such as but not limited to", and can be used interchangeably with them.

[0141] The method and apparatus of the present application may be implemented in many ways. For example, the method and apparatus of the present application may be implemented by software, hardware, firmware, or any combination of software, hardware, and firmware. The above order of steps for the method is for illustration only, and the steps of the method of the present application are not limited to the order specifically described above, unless otherwise specifically stated. In addition, in some embodiments, the present application may also be implemented as a program recorded in a recording medium, which includes machine-readable instructions for implementing the method according to the present application. Therefore, the present application also covers a recording medium storing a program for executing the method according to the present application.

[0142] It should also be noted that in the apparatus, device and method of the present application, each component or each step can be decomposed and / or recombined. Such decomposition and / or recombination should be regarded as equivalent solutions of the present application.

[0143] The above description of the disclosed aspects is provided to enable any person skilled in the art to make or use the present application. Various modifications to these aspects will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to other aspects without departing from the scope of the present application. Therefore, the present application is not intended to be limited to the aspects shown herein, but rather to the widest scope consistent with the principles and novel features disclosed herein.

[0144] The above description has been given for the purpose of illustration and description. In addition, this description is not intended to limit the embodiments of the present application to the forms disclosed herein. Although multiple example aspects and embodiments have been discussed above, those skilled in the art will recognize certain variations, modifications, changes, additions and sub-combinations thereof.

Claims

1. A test parameter adjustment system, characterized in that: Applied to chip testing equipment, the system includes a drive link module, a drive service module and a test module; The driver link module is used to store each first interface corresponding to at least one device in the chip testing device; The driver service module is used to call the first target interface in each first interface in the driver link module when receiving the test parameter adjustment information for the target test item, and control the first target interface to send the test parameter adjustment information to the target device; The test module is used to control the target device to execute the target test item according to the test parameter adjustment information, and obtain the test result corresponding to the target test item.

2. The system according to claim 1, characterized in that The driving service module is further used to store a plurality of second interfaces; The test module is also used to call the second target interface among the multiple second interfaces when receiving the test parameter adjustment information, and send the test parameter adjustment information to the driving service module through the second target interface, so that the driving service module executes the operation of calling the first target interface.

3. The system according to claim 2, characterized in that The test module is further used to store a plurality of third interfaces; The system further comprises: A parameter adjustment module is used to display the test parameter information of the target test item through a visual interactive interface, and in response to receiving the test parameter adjustment information sent by the user according to the test parameter information, call a third target interface among the multiple third interfaces, and transmit the test parameter adjustment information to the test module through the third target interface.

4. The system according to any one of claims 1 to 3, characterized in that: The driver service module is further used to call the fourth target interface in each first interface in the driver link module when receiving at least one updated test parameter for the target test item, and control the fourth target interface to send the at least one updated test parameter to the target device.

5. The system according to claim 4, characterized in that Also includes: A test program editing module is used to edit and store test parameter information of multiple test items; The parameter adjustment module is further used to obtain the test parameter information of the target test item from the test program editing module, and display the identification of the test parameter information of the target test item through a visual interactive interface; The displaying of the test parameter information of the target test item through the visual interactive interface is further used for: In response to receiving an instruction sent by a user to edit the test parameter information based on the identifier of the test parameter information of the target test item, the test parameter information is displayed on the visual interaction interface.

6. The system according to any one of claims 3 to 5, characterized in that: The parameter debugging module is also used to display the circuit diagram corresponding to the target test item through a visual interactive interface; The driving service module is also used to control whether the first target interface sends the test parameter adjustment information to the target device according to the state of the switch component in the circuit diagram, and control whether the second target interface sends at least one updated test parameter to the target device.

7. The system according to claim 3, characterized in that The target device includes at least one radio frequency transmitting board and at least one radio frequency receiving board, and the test result includes a radio frequency data waveform; The driver service module is further configured to, upon receiving a capture test result instruction sent by the parameter adjustment module, call the fifth target interface in each first interface in the driver link module, and capture the collected radio frequency signal or the transmitted radio frequency signal from the target device through the fifth target interface, and send the collected radio frequency signal or the transmitted radio frequency signal to the parameter adjustment module; The parameter adjustment module is further used to generate the RF data waveform according to the collected RF signal or the transmitted RF signal in response to receiving a display detection result instruction sent by the user, and display it on the visual interactive interface.

8. A chip testing device, comprising an industrial computer and a test head assembly, wherein the industrial computer comprises the test parameter adjustment system according to any one of claims 1 to 7, and the test head assembly comprises at least one radio frequency transmitting board and at least one radio frequency receiving board.

9. A test parameter adjustment method, characterized in that: Applied to chip testing equipment, the method comprises: When receiving the test parameter adjustment information for the target test item, the driver service module calls the first target interface in each first interface in the driver link module in the driver link module, and controls the first target interface to send the test parameter adjustment information to the target device; The test module controls the target device to execute the target test item according to the test parameter adjustment information, and obtains a test result corresponding to the target test item.

10. An electronic device, characterized in that: include: Memory for storing computer programs; The processor is used to execute the computer program stored in the memory, and when the computer program is executed, the test parameter adjustment method described in claim 9 is implemented.

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