Photoelectric system imaging performance rapid evaluation method and system based on pre-calculation

Abstract

The invention provides a method and a system for rapidly evaluating the imaging performance of a photoelectric system based on pre-calculation. The method belongs to the field of photoelectric imaging performance evaluation, and comprises the following steps: pre-establishing a photoelectric system pre-calculation library, pre-calculating a plurality of data, storing a pre-calculation result to wait for calling, and continuously updating the pre-calculation result. During use, the pre-calculation result is substituted into the photoelectric system imaging performance evaluation model, so that the photoelectric system imaging performance data can be quickly obtained and output. The system comprises a photoelectric system pre-calculation library module, a target radiation data inversion pre-calculation module, a system space transfer characteristic data pre-calculation module, a system noise characteristic data pre-calculation module, a system contrast threshold function pre-calculation module and a path curve fitting module. A photoelectric system pre-calculation library module and a photoelectric imaging performance data rapid output module are updated; the performance evaluation time of the photoelectric system is shortened, and the real-time deduction task of the photoelectric system in a complex scene can be powerfully supported.

Description

Technical Field

[0001] The present application relates to the technical field of photoelectric imaging performance evaluation, and in particular to a method for rapid evaluation of the imaging performance of a photoelectric system based on pre-calculation. Background Art

[0002] During the scenario simulation, the environment and targets change rapidly. The speed of evaluating the imaging performance of the optoelectronic system is an important indicator of whether the simulation is real-time. Developing a rapid evaluation method for the imaging performance of the optoelectronic system is of great significance for the integrated simulation of the scenario situation. At present, the evaluation method for the imaging performance of the optoelectronic system is mainly based on the Johnson criterion or the TTP (targeting task performance, referred to as TTP) criterion proposed by the U.S. Army Night Vision Sensor Agency. There are a lot of principle calculations in this method, the evaluation takes a long time and requires a lot of computing resources during the evaluation process. When real-time simulation is required, it is difficult to meet the requirements of rapid response. Summary of the invention

[0003] The purpose of the present application is to provide a method for quickly evaluating the imaging performance of an optoelectronic system based on pre-calculation, which can reduce the evaluation time of the optoelectronic system performance.

[0004] This application is implemented as follows:

[0005] In a first aspect, the present application provides a method for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation, comprising the following steps: pre-establishing an optoelectronic system pre-calculation library, including marking data that takes more than a preset time in a simulation process of an optoelectronic system performance evaluation model, and establishing a corresponding database table, wherein the database table includes a target radiation characteristic data table, a system spatial transfer characteristic data table, a system noise characteristic data table, and a contrast threshold function table;

[0006] Target radiation data inversion pre-calculation, including using existing optoelectronic imaging system data to invert the target radiation distribution, combining radiation correlation factors to obtain target radiation characteristic data, and storing it in the corresponding position of the database table waiting for call;

[0007] Pre-calculation of system spatial transfer characteristic data, including obtaining the comprehensive modulation transfer function M(f x ,f y ), the modulation transfer function of the detector array D(f x ,f y ) and the signal processing circuit modulation transfer function S(f x ,f y ), cascade and multiply the three to obtain the system space transfer characteristic data, and store it in the corresponding position of the database table waiting for calling;

[0008] Pre-calculation of system noise characteristic data, including establishing a three-dimensional noise component characterization model N based on the detector noise equivalent temperature difference measurement data and combining the non-uniformity measurement data s ; Obtain system NETD, noise equivalent bandwidth, noise signal variance, and combine with the three-dimensional noise model N s Obtain system noise characteristic data and store it in the corresponding position of the database table waiting for calling;

[0009] Pre-calculation of the system contrast threshold function, including using the TTP criterion to evaluate the imaging performance of the optoelectronic system to obtain the system contrast threshold function CTF sys The calculated value is stored in the corresponding position of the database table and waits for calling;

[0010] Path curve fitting, including polynomial fitting for different target ranges, obtaining the fitting function of atmospheric transmittance, atmospheric radiation and target distance, and the fitting function of optoelectronic system detection probability and target distance;

[0011] Update the optoelectronic system pre-calculation library, including continuously updating the target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and contrast threshold function CTF in the optoelectronic system pre-calculation library through measured data and test data in different application scenarios sys The calculated value of

[0012] Rapid output of optoelectronic imaging performance data, including rapid retrieval of corresponding target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and contrast threshold function CTF from the optoelectronic system pre-calculation library according to optoelectronic system parameters, operating distance and application scenarios by means of database foreign key index sys The calculated value is brought into the optoelectronic system imaging performance evaluation model to quickly obtain and output the optoelectronic system imaging performance data.

[0013] In a second aspect, the present application provides a system for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation, including: an optoelectronic system pre-calculation library module, which is used to mark data that takes more than a preset time during the simulation of an optoelectronic system performance evaluation model, and establish a corresponding database table, wherein the database table includes a target radiation characteristic data table, a system spatial transfer characteristic data table, a system noise characteristic data table, and a contrast threshold function table;

[0014] The target radiation data inversion pre-calculation module is used to use the existing optoelectronic imaging system data to invert the target radiation distribution, combine the radiation correlation factors to obtain the target radiation characteristic data, and store it in the corresponding position of the database table waiting for call;

[0015] The system spatial transfer characteristic data pre-calculation module is used to obtain the comprehensive modulation transfer function M(f x ,fy ), the modulation transfer function of the detector array D(f x ,f y ) and the signal processing circuit modulation transfer function S(f x ,f y ), cascade and multiply the three to obtain the system space transfer characteristic data, and store it in the corresponding position of the database table waiting for calling;

[0016] The system noise characteristic data pre-calculation module is used to establish a three-dimensional noise component characterization model N based on the detector noise equivalent temperature difference measurement data and combined with the non-uniformity measurement data. s ; Obtain system NETD, noise equivalent bandwidth, noise signal variance, and combine with the three-dimensional noise model N s Obtain system noise characteristic data and store it in the corresponding position of the database table waiting for calling;

[0017] System contrast threshold function pre-calculation module, used to evaluate the imaging performance of the optoelectronic system using the TTP criterion to obtain the system contrast threshold function CTF sys The calculated value is stored in the corresponding position of the database table and waits for calling;

[0018] The path curve fitting module is used to use polynomial fitting for different target distances to obtain the fitting function of atmospheric transmittance, atmospheric radiation and target distance, and the fitting function of optoelectronic system detection probability and target distance;

[0019] Update the optoelectronic system pre-calculation library module, which is used to continuously update the target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and contrast threshold function CTF in the optoelectronic system pre-calculation library through measured data and test data in different application scenarios sys The calculated value of

[0020] The optoelectronic imaging performance data fast output module is used to quickly retrieve the corresponding target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and contrast threshold function CTF from the optoelectronic system pre-calculation library according to the optoelectronic system parameters, working distance and application scenario by means of database foreign key index. sys The calculated value is brought into the optoelectronic system imaging performance evaluation model to quickly obtain and output the optoelectronic system imaging performance data.

[0021] In a third aspect, the present application provides an electronic device, including:

[0022] A memory for storing one or more programs;

[0023] processor;

[0024] When one or more programs are executed by a processor, the method as described above is implemented.

[0025] In a fourth aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, which implements the above-mentioned method when executed by a processor.

[0026] Compared with the prior art, the present invention has at least the following advantages or beneficial effects:

[0027] By pre-establishing an optoelectronic system pre-calculation library, we record the time-consuming data in the optoelectronic system performance evaluation model simulation process and establish the corresponding database table. Through the measured data and test data in different application scenarios, we continuously update the target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and contrast threshold function CTF in the optoelectronic system pre-calculation library. sys When in use, the corresponding target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and calculated value of contrast threshold function CTFsys are quickly retrieved from the optoelectronic system pre-calculation library according to the optoelectronic system parameters, working distance and application scenario by means of database foreign key index, and brought into the optoelectronic system imaging performance evaluation model, so as to quickly obtain and output the optoelectronic system imaging performance data. The rapidity of the optoelectronic system imaging performance evaluation model is greatly improved, achieving millimeter-level response, and can effectively support the real-time deduction tasks of the optoelectronic system in complex scenarios. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0029] Figure 1 This is a flow chart of an embodiment of a method for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation according to the present application;

[0030] Figure 2 This is a structural block diagram of an embodiment of a system for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation in the present application;

[0031] Figure 3 This is a structural block diagram of an embodiment of an electronic device of the present application.

[0032] Icons: 101, optoelectronic system pre-calculation library module; 102, target radiation data inversion pre-calculation module; 103, system space transfer characteristic data pre-calculation module; 104, system noise characteristic data pre-calculation module; 105, system contrast threshold function pre-calculation module; 106, path curve fitting module; 107, update optoelectronic system pre-calculation library module; 108, optoelectronic imaging performance data fast output module; 201, processor; 202, memory; 203, communication interface; DETAILED DESCRIPTION

[0033] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various different configurations.

[0034] In conjunction with the accompanying drawings, some embodiments of the present application are described in detail below. In the absence of conflict, the following embodiments and features in the embodiments can be combined with each other.

[0035] Example

[0036] The embodiment of the present application provides a method for quickly evaluating the imaging performance of an optoelectronic system based on pre-calculation, which can reduce the evaluation time of the optoelectronic system performance.

[0037] Please refer to Figure 1 , a method for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation, comprising the following steps:

[0038] S101: pre-establishing an optoelectronic system pre-calculation library, including marking data that takes more than a preset time in the simulation process of the optoelectronic system performance evaluation model, and establishing a corresponding database table, wherein the database table includes a target radiation characteristic data table, a system spatial transfer characteristic data table, a system noise characteristic data table, and a contrast threshold function table;

[0039] In this step, the optoelectronic system pre-calculation library is designed with SQLite database. The data that takes a long time to calculate include target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and the calculated value of the contrast threshold function. By marking these data that take a long time to calculate, corresponding database tables are established for them. In this way, complex data that originally required real-time calculation can be stored in the database in the pre-calculation stage so that it can be quickly called when needed, thus saving calculation time.

[0040] S102: pre-calculation of target radiation data inversion, including using existing optoelectronic imaging system data to invert target radiation distribution, combining radiation-related factors to obtain target radiation characteristic data, and storing it in a corresponding position in a database table to wait for invocation;

[0041] In this step, the radiation brightness received by the system is measured using the existing photoelectric system and expressed as:

[0042] L opt (λ)=L t (T,λ)τ atm (λ)+L atm (λ);

[0043] Where, L t (T,λ) represents the radiant brightness generated by the target surface in the observation direction, τ atm (λ) represents the transmittance of the atmosphere between the target surface and the imaging system, L atm (λ) represents the radiation brightness of the atmosphere between the target surface and the imaging system. At different wavelengths, the radiation of the target can be expressed as:

[0044]

[0045] Where ε(λ) represents the surface emissivity of scene elements; M bb (λ,T) represents the blackbody radiation emittance; C 1 represents the first radiation constant, C 1 =3.74×10 8 (W·μm 4 / m 2 );C 2 represents the second radiation constant, C 2 =1.44×10 4(μm·K); where ε(λ) is obtained through experimental tests and historical data; through measured data radiation calibration, atmospheric effect calculation, the calculated target radiation inversion is calculated to obtain the target radiation distribution. The specific steps of combining radiation correlation factors to obtain the target radiation characteristic data include: based on the target radiation distribution, comprehensively considering the influence of environmental radiation on the radiation characteristics of the target and its background surface, combining the material properties of the target and its background, and local meteorological conditions, to obtain the target radiation characteristic data; where environmental radiation includes direct solar radiation and atmospheric radiation. Specifically, radiation calibration: First, the existing optoelectronic imaging system is used to perform radiation calibration on the imaging data of the target and its background, that is, to determine the corresponding relationship between the pixel value and the radiation intensity in the imaging data. Detector effect and atmospheric effect inversion: Then, considering the influence of detector effects (such as detector sensitivity, noise, etc.) and atmospheric effects (such as atmospheric absorption, scattering, etc.) on the imaging data, inversion processing is performed to more accurately analyze the radiation distribution of the target and its background. Environmental radiation impact analysis: Then, comprehensively consider the influence of environmental radiation such as direct solar radiation and atmospheric radiation on the radiation characteristics of the target and its background surface. These environmental radiation factors will affect the radiation distribution of the target and its background, thus affecting the imaging performance of the optoelectronic system. Calculation of target surface radiation characteristics: Finally, the target radiation characteristics are obtained by combining the material properties of the target and its background (such as reflectivity, emissivity, etc.) and local meteorological conditions (such as temperature, humidity, wind speed, etc.).

[0046] S103: Pre-calculating the spatial transfer characteristic data of the system, including obtaining the comprehensive modulation transfer function M(fx, fy) of the optical system, the modulation transfer function D(fx, fy) of the detector array and the modulation transfer function S(fx, fy) of the signal processing circuit, cascading and multiplying the three to obtain the spatial transfer characteristic data of the system, and storing it in the corresponding position of the database table to wait for calling;

[0047] This step is the pre-calculation of the spatial transfer characteristic data of the system, which focuses on the overall performance estimation of the optoelectronic system under a specific working environment. With the help of the ray tracing theoretical model, the comprehensive modulation transfer function M(fx,fy) of the optical system can be calculated. This function describes the system's ability to modulate images of different spatial frequencies (fx,fy), that is, how the system transfers the contrast of the image. The M(fx,fy) function replaces the model that considers the aberration, diffraction and defocus characteristics of the optical components separately. It provides a more comprehensive and accurate description of the system performance. Combined with the circuit filter function H(fx,fy) provided by the circuit design software, this function describes the impact of the signal processing circuit on the image signal. By combining H(fx,fy) and other characteristics of the system, the modulation transfer function S(fx,fy) of the signal processing circuit is established. This function describes how the signal processing circuit further affects the contrast transfer of the image. Then obtain the modulation transfer function D(fx,fy) of the detector array. The overall spatial transfer characteristics of the system are obtained by cascading the comprehensive modulation transfer function M(fx,fy) of the optical system, the modulation transfer function D(fx,fy) of the detector array (which describes how the detector array affects the image contrast), and the modulation transfer function S(fx,fy) of the signal processing circuit. The three functions M(fx,fy), D(fx,fy) and S(fx,fy) can be calculated based on the specific parameters of the optoelectronic system (such as the parameters of the optical components, the characteristics of the detector array, the design of the signal processing circuit, etc.) and environmental parameters (such as temperature, humidity, lighting conditions, etc.).

[0048] S104: Pre-calculation of system noise characteristic data, including establishing a three-dimensional noise component characterization model Ns based on the detector noise equivalent temperature difference measurement data and combining the non-uniformity measurement data; obtaining the system NETD, noise equivalent bandwidth, and noise signal variance, and combining the three-dimensional noise model N s Obtain system noise characteristic data and store it in the corresponding position of the database table waiting for calling;

[0049] In this step, for ease of understanding, the system NETD (Noise Equivalent Temperature Difference): NETD is an important parameter for measuring the performance of thermal imaging systems, indicating the minimum temperature difference that the system can detect. It reflects the sensitivity of the system to noise. The lower the NETD value, the better the system performance is generally. Noise equivalent bandwidth: The noise equivalent bandwidth refers to the effective frequency range in which the system is sensitive to noise during signal processing. It determines the frequency range of noise signals that the system can respond to, and is crucial to understanding the noise characteristics of the system. Noise signal variance: The noise signal variance is a statistic that measures the degree of fluctuation of the noise signal. In signal processing, understanding the variance of noise helps to evaluate the impact of noise on signal quality. Three-dimensional noise model Ns: The three-dimensional noise model may be a model that takes into account the distribution characteristics of noise in different dimensions (such as time, space, frequency, etc.). Ns represents the noise characteristics in this model, which may be the intensity, distribution or other related parameters of the noise. Based on the known parameters of the system (such as NETD, noise equivalent bandwidth, noise signal variance) and the noise model (Ns), the overall noise characteristics of the system are predicted or calculated. It is very important for system design, optimization and performance evaluation. When calculating the system noise characteristics, the noise characteristics based on NETD, noise equivalent bandwidth and noise signal variance are combined or superimposed with the prediction results of the three-dimensional noise model Ns. This can comprehensively consider the noise performance of the system in different dimensions, thereby obtaining a more comprehensive description of the system noise characteristics.

[0050] S105: pre-calculating the system contrast threshold function, including using the TTP criterion to evaluate the imaging performance of the optoelectronic system to obtain the calculated value of the system contrast threshold function CTFsys, and storing it in the corresponding position of the database table to wait for calling;

[0051] In this step, the TTP criterion is a standard for evaluating the performance of the target task. The TTP criterion is based on factors such as the focal length of the optical system, the center spacing of the detector pixels, the observation distance and the observation angle. It evaluates the image quality interpretation scale by calculating the ground sampling distance, the target background contrast function and the human eye contrast threshold function. This method efficiently combines subjective evaluation with objective evaluation to build a more reliable and realistic evaluation system. The specific steps of pre-calculating the system contrast threshold function include: Let the contrast threshold function calculation formula of the optoelectronic system be:

[0052]

[0053] Where MTF(ξ) is the total MTF of the optoelectronic system, CTFeye(ξ) is the contrast threshold function of the human eye, which is only related to the system parameter values, and L is the display brightness in cd / m 2, α is the correction factor of noise to brightness, which is 169.6, and σ is the noise power of the imaging system. It should be noted that steps S102-S105 are in no particular order, that is, the target radiation data inversion pre-calculation, system spatial transfer characteristic data pre-calculation, system noise characteristic data pre-calculation, and system contrast threshold function pre-calculation can be performed simultaneously, or the system contrast threshold function pre-calculation can be performed first and then the target radiation data inversion pre-calculation.

[0054] S106: path curve fitting, including using polynomial fitting for different target ranges to obtain fitting functions of atmospheric transmittance, atmospheric radiation and target distance, and fitting functions of optoelectronic system detection probability and target distance;

[0055] In this step, polynomial fitting is used in path curve fitting. Polynomial fitting is a commonly used mathematical tool for approximating the relationship between data points through a polynomial function. In this embodiment, polynomial fitting is used to describe the variation of various parameters at different target distances. The action distance refers to the distance from the target to the photoelectric system and the distance that the light propagates in the atmosphere. Through polynomial fitting, a functional relationship describing the change of atmospheric transmittance and atmospheric radiation with target distance can be obtained. These functional relationships represent the degree of influence of the atmosphere on light propagation at different distances, as well as the change of atmospheric radiation. Similarly, through polynomial fitting, a functional relationship describing the change of the detection probability of the photoelectric system with the target distance can also be obtained. This functional relationship is of great significance for evaluating the detection performance of the photoelectric system at different distances.

[0056] S107: updating the optoelectronic system pre-calculation library, including continuously updating the target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and the calculated value of the contrast threshold function CTFsys in the optoelectronic system pre-calculation library through measured data and test data in different application scenarios;

[0057] In this step, various data of typical optoelectronic systems in typical application scenarios can be traversed. These data include environmental data (such as lighting conditions, atmospheric conditions, etc.), target attribute data (such as target brightness, contrast, etc.) and atmospheric data (such as atmospheric transmittance, atmospheric radiation, etc.). By traversing and analyzing these data, the target radiation data of the optoelectronic system in different environmental application scenarios, the system spatial transfer characteristic data, the system noise characteristic data) and the pre-calculated value of the system contrast threshold function can be obtained.

[0058] S108: Rapid output of optoelectronic imaging performance data, including rapidly retrieving corresponding target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and calculated value of contrast threshold function CTFsys from the optoelectronic system pre-calculation library according to optoelectronic system parameters, effective distance and application scenario by means of database foreign key index, and bringing them into the optoelectronic system imaging performance evaluation model to rapidly obtain and output optoelectronic system imaging performance data.

[0059] In this step, the required data is determined based on the specific parameters of the optoelectronic system (such as lens focal length, aperture size, etc.), application scenarios (such as night reconnaissance, daytime surveillance, etc.) and the target's range (i.e., the distance from the target to the optoelectronic system). In order to efficiently obtain the required data, this implementation adopts the database foreign key index method. The foreign key index is a mechanism in the database for quickly locating other records associated with a specific record. In this scenario, it is used to quickly locate data records that match the given optoelectronic system parameters, application scenarios, and range. Target radiation data, system spatial transfer characteristic data, system noise characteristic data, and system contrast threshold function pre-calculated values ​​are data taken out from the pre-calculation library, which respectively represent the radiation energy emitted by the target, the spatial transfer characteristics of the optoelectronic system, the noise characteristics of the system, and the pre-calculated values ​​of the contrast threshold function of the system. These data are key inputs for the performance evaluation of the optoelectronic system. These data are input into the optoelectronic system imaging performance evaluation model, and the performance results of the optoelectronic system can be quickly obtained by running the evaluation model. These results include key performance indicators such as the system's resolution, signal-to-noise ratio, and contrast sensitivity.

[0060] Please refer to Figure 2 , the present application also provides a system for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation, including: an optoelectronic system pre-calculation library module 101, used to mark data that takes more than a preset time in the simulation process of an optoelectronic system performance evaluation model, and to establish a corresponding database table, wherein the database table includes a target radiation characteristic data table, a system spatial transfer characteristic data table, a system noise characteristic data table, and a contrast threshold function table;

[0061] The target radiation data inversion pre-calculation module 102 is used to use the existing optoelectronic imaging system data to invert the target radiation distribution, combine the radiation correlation factors to obtain the target radiation characteristic data, and store it in the corresponding position of the database table to wait for calling;

[0062] The system spatial transfer characteristic data pre-calculation module 103 is used to obtain the comprehensive modulation transfer function M (f x ,f y ), the modulation transfer function of the detector array D(f x ,f y) and the signal processing circuit modulation transfer function S(f x ,f y ), cascade and multiply the three to obtain the system space transfer characteristic data, and store it in the corresponding position of the database table waiting for calling;

[0063] The system noise characteristic data pre-calculation module 104 is used to establish a three-dimensional noise component characterization model N based on the detector noise equivalent temperature difference measurement data and the non-uniformity measurement data. s ; Obtain system NETD, noise equivalent bandwidth, noise signal variance, and combine with the three-dimensional noise model N s Obtain system noise characteristic data and store it in the corresponding position of the database table waiting for calling;

[0064] The system contrast threshold function pre-calculation module 105 is used to evaluate the imaging performance of the optoelectronic system using the TTP criterion to obtain the system contrast threshold function CTF. sys The calculated value is stored in the corresponding position of the database table and waits for calling;

[0065] The path curve fitting module 106 is used to use polynomial fitting for different target ranges to obtain fitting functions of atmospheric transmittance, atmospheric radiation and target distance, and fitting functions of optoelectronic system detection probability and target distance;

[0066] The optoelectronic system pre-calculation library updating module 107 is used to continuously update the target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and contrast threshold function CTF in the optoelectronic system pre-calculation library through the measured data and test data in different application scenarios. sys The calculated value of

[0067] The optoelectronic imaging performance data fast output module 108 is used to quickly retrieve the corresponding target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and contrast threshold function CTF from the optoelectronic system pre-calculation library according to the optoelectronic system parameters, working distance and application scenario in the form of database foreign key index. sys The calculated value is brought into the optoelectronic system imaging performance evaluation model to quickly obtain and output the optoelectronic system imaging performance data.

[0068] In summary, this method overcomes the problems of complex and time-consuming calculations in traditional optoelectronic system imaging performance evaluation, and greatly improves the real-time application of the model.

[0069] For the specific implementation of the system for rapid evaluation of the imaging performance of an optoelectronic system based on pre-calculation, please refer to the embodiment of the method for rapid evaluation of the imaging performance of an optoelectronic system based on pre-calculation, which will not be elaborated herein.

[0070] Please refer to Figure 3 The present application also provides an electronic device, including: a memory 202 for storing one or more programs; a processor 201; the processor 201 and the memory 202 transmit data to each other through a communication interface, and when one or more programs are executed by the processor 201, the above-mentioned method for quickly evaluating the imaging performance of an optoelectronic system based on pre-calculation is implemented.

[0071] The present application also provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the method for quickly evaluating the imaging performance of an optoelectronic system based on pre-calculation is implemented.

[0072] It will be apparent to those skilled in the art that the present application is not limited to the details of the exemplary embodiments described above, and that the present application can be implemented in other specific forms without departing from the spirit or essential features of the present application. Therefore, the embodiments should be considered exemplary and non-limiting in all respects, and the scope of the present application is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present application. Any reference numeral in a claim should not be considered as limiting the claim to which it relates.

Claims

1. A method for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation, characterized in that: The following steps are involved: Pre-establishing an optoelectronic system pre-calculation library, including marking data that takes more than a preset time during the simulation of the optoelectronic system performance evaluation model, and establishing a corresponding database table, wherein the database table includes a target radiation characteristic data table, a system spatial transfer characteristic data table, a system noise characteristic data table, and a contrast threshold function table; Target radiation data inversion pre-calculation, including using existing optoelectronic imaging system data to invert the target radiation distribution, combining radiation correlation factors to obtain target radiation characteristic data, and storing it in the corresponding position of the database table waiting for call; Pre-calculation of system spatial transfer characteristic data, including obtaining the comprehensive modulation transfer function M(f x ,f y ), the modulation transfer function of the detector array D(f x ,f y ) and the signal processing circuit modulation transfer function S(f x ,f y ), cascade and multiply the three to obtain the system space transfer characteristic data, and store it in the corresponding position of the database table waiting for calling; Pre-calculation of system noise characteristic data, including establishing a three-dimensional noise component characterization model N based on the detector noise equivalent temperature difference measurement data and combining the non-uniformity measurement data s ; Obtain system NETD, noise equivalent bandwidth, noise signal variance, and combine with the three-dimensional noise model N s Obtain system noise characteristic data and store it in the corresponding position of the database table waiting for calling; Pre-calculation of the system contrast threshold function, including using the TTP criterion to evaluate the imaging performance of the optoelectronic system to obtain the system contrast threshold function CTF sys The calculated value is stored in the corresponding position of the database table and waits for calling; Path curve fitting, including polynomial fitting for different target ranges, obtaining the fitting function of atmospheric transmittance, atmospheric radiation and target distance, and the fitting function of optoelectronic system detection probability and target distance; Update the optoelectronic system pre-calculation library, including continuously updating the target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and contrast threshold function CTF in the optoelectronic system pre-calculation library through measured data and test data in different application scenarios sys The calculated value of Rapid output of optoelectronic imaging performance data, including rapid retrieval of corresponding target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and contrast threshold function CTF from the optoelectronic system pre-calculation library according to optoelectronic system parameters, operating distance and application scenarios by means of database foreign key index sys The calculated value is brought into the optoelectronic system imaging performance evaluation model to quickly obtain and output the optoelectronic system imaging performance data.

2. The method for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation according to claim 1, characterized in that: The specific steps of pre-establishing the optoelectronic system pre-calculation library include: The optoelectronic system pre-calculation library is designed using the SQLite database.

3. The method for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation according to claim 1, characterized in that: The specific steps of using the existing optoelectronic imaging system data to invert the target radiation distribution include: The radiation brightness received by the system measured using the existing photoelectric system is expressed as: L opt (λ)=L t (T,λ)τ atm (λ)+L atm (l) Where, L t (T,λ) represents the radiant brightness generated by the target surface in the observation direction, τ atm (λ) represents the transmittance of the atmosphere between the target surface and the imaging system, L atm (λ) represents the radiation brightness of the atmosphere between the target surface and the imaging system. At different wavelengths, the radiation of the target can be expressed as: Where ε(λ) represents the surface emissivity of scene elements; M bb (λ,T) represents the blackbody radiation emittance; C1 represents the first radiation constant, C1=3.74×10 8 (W·μm 4 / m 2 ); C2 represents the second radiation constant, C2 = 1.44 × 10 4 (μm·K); where ε(λ) is obtained through experimental tests and historical data; through radiation calibration of measured data and atmospheric effect calculation, the calculated radiation of the target is inverted to obtain the target radiation distribution.

4. The method for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation according to claim 3, characterized in that: The specific steps of obtaining target radiation characteristic data by combining radiation-related factors include: Based on the target radiation distribution, the impact of environmental radiation on the radiation characteristics of the target and its background surface is comprehensively considered, and the target radiation characteristic data is obtained by combining the material properties of the target and its background and local meteorological conditions; wherein the environmental radiation includes direct solar radiation and atmospheric radiation.

5. The method for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation according to claim 1, characterized in that: The specific steps of precalculating the system spatial transfer characteristic data include: According to the changes in optical component parameters under working conditions, the comprehensive modulation transfer function M(f x ,f y ) to replace the aberration, diffraction and defocus characteristic models of the optical components; obtain the modulation transfer function D(f x ,f y ); and according to the circuit filter function H(f x ,f y ) Establish the signal processing circuit modulation transfer function S(f x ,f y ).

6. The method for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation according to claim 3, characterized in that: The specific steps of precalculating the system contrast threshold function include: The contrast threshold function calculation formula of the photoelectric system is: Where MTF(ξ) is the total MTF of the optoelectronic system, CTFeye(ξ) is the contrast threshold function of the human eye, which is only related to the system parameter values, and L is the display brightness in cd / m 2 ,α is the correction factor of noise to brightness, and 169.6 is taken, and σ is the noise power of the imaging system.

7. The method for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation according to claim 6, characterized in that: The specific steps of updating the optoelectronic system pre-calculation library include: Traverse the environmental data, target attribute data, and atmospheric data of typical optoelectronic systems in typical application scenarios, and obtain the target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data, and contrast threshold function CTF of optoelectronic systems in different application scenarios. sys The calculated value is updated in the optoelectronic system pre-calculation library.

8. A system for rapid evaluation of imaging performance of an optoelectronic system based on pre-calculation, characterized in that: include: The optoelectronic system pre-calculation library module is used to mark the data that takes more than the preset time in the simulation process of the optoelectronic system performance evaluation model, and establish a corresponding database table, wherein the database table includes a target radiation characteristic data table, a system spatial transfer characteristic data table, a system noise characteristic data table, and a contrast threshold function table; The target radiation data inversion pre-calculation module is used to use the existing optoelectronic imaging system data to invert the target radiation distribution, combine the radiation correlation factors to obtain the target radiation characteristic data, and store it in the corresponding position of the database table waiting for call; The system spatial transfer characteristic data pre-calculation module is used to obtain the comprehensive modulation transfer function M(f x ,f y ), the modulation transfer function of the detector array D(f x ,f y ) and the signal processing circuit modulation transfer function S(f x ,f y ), cascade and multiply the three to obtain the system space transfer characteristic data, and store it in the corresponding position of the database table waiting for calling; The system noise characteristic data pre-calculation module is used to establish a three-dimensional noise component characterization model N based on the detector noise equivalent temperature difference measurement data and combined with the non-uniformity measurement data. s ; Obtain system NETD, noise equivalent bandwidth, noise signal variance, and combine with the three-dimensional noise model N s Obtain system noise characteristic data and store it in the corresponding position of the database table waiting for calling; System contrast threshold function pre-calculation module, used to evaluate the imaging performance of the optoelectronic system using the TTP criterion to obtain the system contrast threshold function CTF sys The calculated value is stored in the corresponding position of the database table and waits for calling; The path curve fitting module is used to use polynomial fitting for different target distances to obtain the fitting function of atmospheric transmittance, atmospheric radiation and target distance, and the fitting function of optoelectronic system detection probability and target distance; Update the optoelectronic system pre-calculation library module, which is used to continuously update the target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and contrast threshold function CTF in the optoelectronic system pre-calculation library through measured data and test data in different application scenarios sys The calculated value of The optoelectronic imaging performance data fast output module is used to quickly retrieve the corresponding target radiation characteristic data, system spatial transfer characteristic data, system noise characteristic data and contrast threshold function CTF from the optoelectronic system pre-calculation library according to the optoelectronic system parameters, working distance and application scenario by means of database foreign key index. sys The calculated value is brought into the optoelectronic system imaging performance evaluation model to quickly obtain and output the optoelectronic system imaging performance data.

9. An electronic device, characterized in that: include: A memory for storing one or more programs; processor; When the one or more programs are executed by the processor, the method according to any one of claims 1 to 7 is implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 1 to 7 is implemented.

Images