Aging test equipment for LCD circuit board

Abstract

The present application relates to the technical field of circuit board testing, and discloses an aging test device for a liquid crystal display circuit board, which includes a test box, a control system disposed in the test box, a test frame, a power device and a drive device, wherein the test frame is rotatably disposed in the test box, the power device is used to drive the test frame to rotate, and the power device is connected to the control system; the test frame includes a central column rotatably disposed in the test box, a first mounting plate disposed on a side wall of the central column, and a second mounting plate slidably disposed on the first mounting plate, an ejection hole is provided on the side wall of the test box, and when the second mounting plate is rotated to face the ejection hole, the present application can inspect and place and retrieve the circuit board during the test process, and reduce the temperature change in the test box during the retrieval process.

Description

Technical Field

[0001] The present application relates to the technical field of circuit board testing, and in particular to an aging test device for a liquid crystal display circuit board. Background Art

[0002] Liquid crystal display is the core component for displaying images and texts. It is widely used in display terminals of mobile phones, computers, tablets, TVs and other devices. Circuit boards play a key role in controlling and driving the displayed content. In order to ensure the quality and service life of liquid crystal display, strict performance tests need to be carried out on the circuit boards of the display. Currently, there are aging test equipment for testing circuit boards on the market.

[0003] The existing aging test equipment is mainly a test box, in which a test rack is set up, and the test rack is equipped with a power supply to provide the required power for the circuit board being tested; the test box is generally equipped with a temperature adjustment system and a control system. The temperature adjustment system can provide different temperature environments, and accelerate the aging process of the circuit board by placing the circuit board at different temperatures for a certain period of time, thereby evaluating the durability of the circuit board; the control system is used to control the operation of the test box. At the same time, when the circuit board fails, the control system will send an alarm signal to notify the staff to check the circuit board and replace it with a new one for testing. The test box is generally equipped with a transparent door to open the test box and facilitate observation of the circuit board under test.

[0004] In the above-mentioned related technologies, when replacing a circuit board, it is necessary to open the box door for operation. This method will cause convection between the air inside the box and the outside, resulting in temperature loss inside the box. It is necessary to re-cool or heat to adjust the temperature inside the box, causing energy loss. At the same time, when high-temperature or low-temperature tests are being performed in the test box, opening the cabinet door for operation will bring certain dangers to the operator. Summary of the invention

[0005] In order to facilitate the inspection and placement of circuit boards during testing and reduce temperature changes in the test box during the retrieval process, the present application provides an aging test device for a liquid crystal display circuit board.

[0006] The present application provides an aging test device for a liquid crystal display circuit board, which adopts the following technical solution:

[0007] An aging test device for a liquid crystal display circuit board comprises a test box, a control system is arranged in the test box, a test frame, a power device and a driving device, the test frame is rotatably arranged in the test box, the power device is used to drive the test frame to rotate, and the power device is connected to the control system;

[0008] The test stand comprises a center column rotatably arranged in the test box, a first mounting plate arranged on a side wall of the center column, and a second mounting plate slidably arranged on the first mounting plate, a plurality of the first mounting plates are arranged along the circumference of the center column, and the first mounting plates are arranged in multiple layers at intervals along the length direction of the center column, the driving device can drive the second mounting plate to slide on the first mounting plate in a direction approaching or away from the center column, the second mounting plate is provided with a mounting groove for accommodating a circuit board, an ejection hole is provided on the side wall of the test box, and a plurality of the ejection holes are arranged at intervals along the height direction of the test box corresponding to the second mounting plate, when the second mounting plate is rotated to face the ejection hole, the driving device can drive the end of the second mounting plate to slide out of the ejection hole, and a first sealing member for closing the ejection hole is also provided on the side wall of the test box;

[0009] The second mounting board is provided with a terminal for supplying power to the circuit board, the first mounting board is provided with a first circuit contact, and the second mounting board is provided with a second circuit contact. When the second mounting board slides, the first circuit contact and the second circuit contact can be separated from each other or abut against each other, the first circuit contact abuts against the second circuit contact, and the second circuit contact is electrically connected to the terminal.

[0010] By adopting the above technical scheme, the test frame is used to place circuit boards, and the circuit boards are tested through the test box; the power device drives the test frame to rotate, and any circuit board can be rotated to a position close to the side wall of the test box, and then the second mounting plate is driven by the driving device to be sent out of the test box from the outlet hole, so that the circuit board can be inspected and replaced outside the test box, and this method is not easy to cause danger to the operator; at the same time, the method of only opening the outlet hole for the second mounting plate to pass through can greatly reduce the temperature exchange between the test box and the external space, and reduce energy loss; at the same time, the rotation setting of the test frame can drive the air flow in the test box, and improve the uniformity of heating of circuit boards at different positions.

[0011] Optionally, a receiving groove for accommodating the second mounting plate is formed on the first mounting plate, a limiting block is arranged on the side wall of the second mounting plate, and a limiting groove is formed on the first mounting plate for the limiting block to slide, and an extension direction of the limiting groove is parallel to a sliding direction of the second mounting plate, and when the second mounting plate slides toward the output hole until the limiting block abuts against the side wall of the limiting groove, the circuit board on the second mounting plate moves to the outside of the test box along with the second mounting plate.

[0012] By adopting the above technical solution, by arranging the accommodating groove and the limiting groove on the first mounting plate, and arranging the limiting block on the second mounting plate, the sliding direction of the second mounting plate is limited so that it can slide smoothly along the predetermined path.

[0013] Optionally, a second magnetic component is provided on the side wall of one end of the second mounting plate facing the center column, and a first magnetic component is provided on the side wall of the accommodating groove of the first mounting plate. When the second mounting plate is located in the accommodating groove, the first magnetic component is magnetically attracted to the second magnetic component.

[0014] By adopting the above technical solution, a second magnetic attraction component and a first magnetic attraction component are respectively arranged on the second mounting plate and the first mounting plate. When the second mounting plate is located in the accommodating groove, the two are magnetically attracted to each other, so that the second mounting plate can be stably fixed on the first mounting plate to prevent it from shifting due to vibration or other external forces during the test, thereby ensuring the stability of the circuit board during the test.

[0015] Optionally, the driving device includes an unlocking rod and a gear, an unlocking hole for the unlocking rod to pass through is opened on the side wall of the test box, and a second sealing member for closing the unlocking hole is provided on the test box. A first tooth is provided on the upper surface of the unlocking rod, and a second tooth is provided on the lower surface of the second mounting plate. The gear is rotatably arranged on the first mounting plate, and the second tooth is meshed with the top of the gear. When the unlocking rod is inserted into the unlocking hole, the first tooth can mesh with the bottom of the gear.

[0016] By adopting the above technical solution, the gear is engaged with the unlocking rod, and the second teeth on the second mounting plate are engaged. By inserting the unlocking rod, the second mounting plate can be controlled to slide out of the test box. This unlocking method is simple and reliable, and will not be affected by the high temperature in the test box.

[0017] Optionally, the second sealing member includes a second sealing plate slidably disposed on the side wall of the test box, and a second handle disposed on the side wall of the second sealing plate. The test box is provided with a second sliding groove on one side of the unlocking hole for accommodating the second sealing plate and allowing the second sealing plate to slide. The test box is provided with a second slot on the other side of the unlocking hole for the second sealing plate to be plugged in. When the second sealing plate slides and the side wall is inserted into the second slot, the unlocking hole can be blocked.

[0018] By adopting the above technical solution, the design of the second seal can close the unlocking hole through the cooperation of the sliding second sealing plate and the second slot; at the same time, the reverse sliding of the second sealing plate can quickly open the unlocking hole, thereby improving the operating convenience and sealing performance of the equipment.

[0019] Optionally, the first sealing member includes a first sealing plate and a first spring, and the side walls of the test box are respectively provided with a first slide groove and a first slot on the upper and lower sides of the outlet hole, the first sealing plate is slid up and down in the first slide groove, and the first spring is arranged between the bottom wall of the first slide groove and the first sealing plate, and in a natural state, when the side wall of the first sealing plate is inserted into the first slot, the first spring is in a compressed state; the first sealing plate is provided with an inclined surface on the side facing the interior of the test box, and when the second mounting plate slides toward the outlet hole, the side wall of the second mounting plate abuts against the inclined surface of the first sealing plate and can drive the first sealing plate to slide into the first slide groove.

[0020] By adopting the above technical solution, when the second mounting plate slides, its side wall can abut against the inclined surface of the first sealing plate, driving the first sealing plate to slide into the slide groove, thereby opening the outlet hole; when the second mounting plate leaves, the first spring can automatically reset the first sealing plate to close the outlet hole. This automated sealing structure not only improves the convenience of operation, but also effectively prevents external dust, impurities, etc. from entering the test box, ensuring the cleanliness of the test environment.

[0021] Optionally, a baffle and an elastic member are provided on the first mounting plate, and the baffle is slidably arranged on a side of the first mounting plate away from the center column, a linkage hole is opened on the baffle, and a slope is provided on the side wall below the linkage hole; in a natural state, the upper end of the baffle extends into the accommodating groove; when the unlocking rod is inserted into the test box, the unlocking rod can abut against the slope of the baffle, and can drive the baffle to move downward so that the upper end of the baffle can be downwardly disengaged from the accommodating groove; when the unlocking rod slides out of the test box, the elastic member can drive the baffle to move upward and be reinserted into the accommodating groove.

[0022] By adopting the above technical solution, by setting the baffle and the elastic member, when the unlocking rod is inserted into the test box, the baffle can be driven to move downward, so that the upper end of the baffle is out of the receiving groove, thereby releasing the restriction on the second mounting plate; when the unlocking rod slides out, the elastic member can drive the baffle to reinsert into the receiving groove to restore the fixation of the second mounting plate. This structure realizes the automatic locking and unlocking of the second mounting plate, further improves the automation degree and convenience of the equipment, and enhances the stability and reliability of the equipment.

[0023] Optionally, the elastic member is a second spring, a clamping plate is provided on the side wall of the baffle, an upper end of the second spring is connected to the first mounting plate, and a lower end of the second spring is connected to the clamping plate.

[0024] Optionally, two test racks are arranged in the test box along the length direction of the test box at intervals, and both side walls of the test box are provided with exit holes for the second mounting plate to slide out.

[0025] By adopting the above technical solution, multiple circuit boards can be subjected to aging tests at the same time, which greatly improves the test efficiency.

[0026] Optionally, the power device is a motor, the motor is disposed on the test box, and the output shaft of the motor is connected to the central column.

[0027] By adopting the above technical solution, using a motor as a power device, the output shaft of the motor is connected to the central column, which can provide stable and reliable power for the rotation of the test stand.

[0028] In summary, the present application includes at least one of the following beneficial effects:

[0029] 1. Through the rotation setting of the test frame, the sliding design of the second mounting plate and the cooperation of the driving device, a single circuit board can be put in and out, and the demand for checking and replacing the faulty circuit board during the aging test is met, while reducing the impact on the temperature in the test box during the operation;

[0030] 2. The arrangement of the first sealing member and the second sealing member can be used to timely close the ejection hole and the unlocking hole to maintain the sealing of the test box. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Figure 1 It is a schematic diagram of the structure of an embodiment of the present application;

[0032] Figure 2 It is a schematic diagram of the structure of the test stand;

[0033] Figure 3 is a schematic diagram of the exploded structure of the second mounting base;

[0034] Figure 4 is a schematic diagram of the structure of the second mounting base when viewed from an upward angle;

[0035] Figure 5 is a schematic diagram of the structure of the driving device;

[0036] Figure 6 yes Figure 5 A schematic diagram of the enlarged structure at A in the middle;

[0037] Figure 7 It is a schematic diagram of the cross-sectional structure of the test box;

[0038] Figure 8 yes Figure 7 A schematic diagram of the enlarged structure at B in the middle;

[0039] Explanation of the reference numerals: 1. test box; 11. ejection hole; 12. unlocking hole; 13. second slide slot; 14. second slot; 15. first slide slot; 16. first slot; 2. test frame; 21. center column; 22. first mounting plate; 221. first circuit contact; 222. accommodating slot; 223. limiting slot; 224. first magnetic member; 225. baffle; 2251. linkage hole; 2252. card plate; 226. elastic member; 23. second mounting plate; 231. mounting slot; 232. terminal; 233. second circuit contact; 234. limiting block; 235. second magnetic member; 3. power device; 31. motor; 4. driving device; 41. unlocking rod; 42. gear; 5. first sealing member; 51. first sealing plate; 52. first spring; 6. second sealing member; 61. second sealing plate; 62. second handle. DETAILED DESCRIPTION

[0040] The following is combined with Figure 1 -Attached Figure 8 This application is described in further detail.

[0041] The present application embodiment discloses an aging test device for a liquid crystal display circuit board. Figure 1 The aging test equipment includes a test box 1, a test stand 2, a power device 3 and a drive device 4 (refer to Figure 5 ). Among them, the test box 1 is a rectangular box structure, and a door for opening the test box 1 is rotatably provided on the side facing the operator, and the side where the door is located is the front side. A temperature regulation system and a control system are provided in the test box 1. The temperature regulation system can provide different temperature environments, and the control system is used to monitor and manage the entire test process; the test stand 2 is used to place the display circuit board, and the test stand 2 is rotatably provided in the test box 1. The power device 3 is used to drive the test stand 2 to rotate, and the control system can monitor the status of the circuit board provided on the test stand 2, and control the power device 3 to work at the same time. It should be noted that, like the prior art, the control system can record the position and test time of each circuit board in order to accurately control the circuit board.

[0042] Reference Figure 1 and Figure 2In the embodiment of the present application, the test stand 2 includes a central column 21, a first mounting plate 22 and a second mounting plate 23. The central column 21 is a circular cylinder, the lower end of which is rotatably connected to the bottom plate of the test box 1 by means of a bearing or the like, and the upper end is also rotatably plugged into the top plate of the test box 1. The power device 3 can be a motor 31, which is fixedly mounted at the lower end of the test box 1, and is preferably located on the outer wall of the test box 1 to reduce the impact of the high temperature inside the test box 1 on the motor 31; the output shaft of the motor 31 is connected to the central column 21 by means of a coupling or the like. The selection of the motor 31 can select models with different powers and speeds according to actual needs to adapt to different test requirements. At the same time, the control of the motor 31 is uniformly managed by the control system to ensure real-time control of the test process.

[0043] Reference Figure 2 and Figure 3 , the first mounting plate 22 is provided with multiple layers along the length direction of the center column 21, and each layer is provided with multiple layers along the circumference of the center column 21; specifically, the first mounting plate 22 can be provided as a rectangular plate structure, and the first mounting plate 22 and the center column 21 can be fixedly connected by providing a connecting rod. The second mounting plate 23 is slidably provided on the first mounting plate 22, and the driving device 4 can drive the second mounting plate 23 to slide in a direction close to or away from the center column 21. The second mounting plate 23 can also be a rectangular plate, and a mounting groove 231 for accommodating a circuit board is provided on its upper surface. An ejection hole 11 is provided on the side wall of the test box 1. When the second mounting plate 23 rotates to the direction toward the ejection hole 11, the driving device 4 can drive the end of the second mounting plate 23 to slide out of the ejection hole 11.

[0044] Reference Figure 3 and Figure 4In the embodiment of the present application, the test stand 2 can supply power to the circuit board. Exemplarily, a terminal head 232 for supplying power to the circuit board is provided on the second mounting plate 23, and the circuit board can be connected to the terminal head 232 through a wire. The setting position of the terminal head 232 is set according to the connection requirements of the circuit board. Preferably, in this embodiment, the terminal head 232 is set at the side wall position where the mounting groove 231 is located; a second circuit contact 233 is provided on the side wall of the second mounting plate 23 facing the central column 21, and a first circuit contact 221 is provided on the corresponding mounting plate of the first mounting plate 22. When the second mounting plate 23 slides toward the outlet hole 11, the first circuit contact 221 is separated from the second circuit contact 233; when the second mounting plate 23 slides toward the central column 21 and slides into the first mounting plate 22, the first circuit contact 221 can abut against the second circuit contact 233. In order to improve the stability of the contact point, a plug-in hole can be coaxially provided at the end of the first circuit contact 221, and the end of the second circuit contact 233 is a columnar structure, and the two can be abutted and connected by mutual plugging. At the same time, the second circuit contact 233 is connected to the terminal 232 through a wire or a metal conductive sheet; a wire is arranged in the center column 21, and the wire arranged on the center column 21 is connected to the first circuit contact 221, and the upper end of the center column 21 can be connected to the circuit by setting a rotating conductive slip ring; the above connection method can realize power supply to the circuit board.

[0045] Reference Figure 1 , a first sealing member 5 is also provided on the side wall of the test box 1, which is used to close the ejection hole 11, so as to ensure the sealing inside the test box 1 under normal operation. The ejection holes 11 correspond to the multi-layer second mounting plates 23, and multiple ejection holes 11 are provided on the side wall of the test box 1 at intervals along the vertical direction. Multiple first sealing members 5 are provided in one-to-one correspondence with the ejection holes 11. At the same time, in order to improve the testing efficiency and production capacity of the circuit board, two test racks 2 are provided in the test box 1 at intervals along the length direction of the test box 1, and ejection holes 11 for the second mounting plates 23 to slide out are provided on the side walls on both sides of the test box 1. The two test racks 2 operate independently without affecting each other.

[0046] Reference Figure 3 and Figure 4In the embodiment of the present application, a receiving groove 222 for receiving the second mounting plate 23 is provided on the upper surface of the first mounting plate 22, a limiting block 234 is fixed on the side wall of the second mounting plate 23, and a limiting groove 223 is provided on the first mounting plate 22, and the extending direction of the limiting groove 223 is parallel to the sliding direction of the second mounting plate 23. Further, the limiting block 234 can be set as a rectangular block and is respectively set on both sides of the second mounting plate 23, and the limiting block 234 is fixed to one end of the second mounting plate 23 close to the central column 21. When the limiting block 234 slides in a direction away from the central column 21 until the limiting block 234 abuts against the outer side wall of the limiting groove 223, the circuit board on the second mounting plate 23 just moves with the second mounting plate 23 to the outside of the test box 1. At this time, the circuit board can be inspected and replaced. At the same time, under the cooperation of the limiting block 234 and the limiting groove 223, the second mounting plate 23 can be restricted from escaping from the first mounting plate 22. It should be noted that, during assembly, the limiting block 234 can be first inserted into the limiting groove 223, and then the end of the limiting groove 223 can be sealed to form a double-ended closed limiting groove 223 structure.

[0047] Reference Figure 3 and Figure 4 Optionally, in the embodiment of the present application, a second magnetic member 235 is embedded on the side wall of one end of the second mounting plate 23 facing the center column 21, and a first magnetic member 224 is embedded on the side wall of the receiving groove 222 of the first mounting plate 22. When the second mounting plate 23 is located in the receiving groove 222, the first magnetic member 224 and the second magnetic member 235 are correspondingly fitted, and the two can be magnetically attracted to each other, thereby positioning the second mounting plate 23. The first magnetic member 224 and the second magnetic member 235 can be a magnetic sheet and an iron sheet respectively, or both can be magnetic sheets.

[0048] Reference Figure 5 and Figure 6 In the embodiment of the present application, the driving device 4 includes an unlocking rod 41 and a gear 42. The unlocking rod 41 is configured as a rectangular long rod structure, one end of which may be provided with a handle or a hanging ring or other structures. A hook for hanging the unlocking rod 41 or a storage box for storing the unlocking rod 41 may be provided on the outer wall of the test box 1. An unlocking hole 12 for the unlocking rod 41 to pass through is provided on the side wall of the test box 1. The upper surface of the unlocking rod 41 is provided with a first tooth, and the first tooth is extended along the length direction of the unlocking rod 41; the lower surface of the second mounting plate 23 is provided with a second tooth (refer to Figure 4 ), the second teeth are extended along the length direction of the second mounting plate 23; the gear 42 is rotatably set on the first mounting plate 22, and the first mounting plate 22 is correspondingly provided with a clearance space for the gear 42 to rotate; at the same time, the upper part of the gear 42 is meshed with the second teeth, and when the unlocking rod 41 is inserted from the unlocking hole 12 and slides toward the center column 21, the first teeth can be meshed with the lower part of the gear 42.

[0049] At this time, by manually pushing the unlocking rod 41, the engagement of the first tooth with the gear 42 can drive the gear 42 to rotate along its own axis. After the gear 42 rotates, the engagement of the gear 42 with the second tooth can drive the second mounting plate 23 to slide away from the center column 21, so that the second mounting plate 23 can drive the electronic board to slide out of the test box 1.

[0050] Reference Figure 7 and Figure 8 Furthermore, the test box 1 is provided with a second sealing member 6 for closing the unlocking hole 12. The second sealing member 6 may include a second sealing plate 61 and a second handle 62. The second sealing plate 61 is slidably arranged on the side wall of the test box 1. The second handle 62 is fixed on the side wall of the second sealing plate 61 away from the central column 21, and is used to control the sliding of the second sealing plate 61. The test box 1 is provided with a second slide groove 13 for accommodating the second sealing plate 61 and allowing the second sealing plate 61 to slide on one side of the unlocking hole 12. The test box 1 is provided with a second slot 14 for inserting the second sealing plate 61 on the other side of the unlocking hole 12. When the second sealing plate 61 slides toward the second slot 14 and the side is inserted into the second slot 14, the second sealing plate 61 can close the unlocking hole 12; when the second sealing plate 61 is slid toward the second slot 13 by the second handle 62 and the second sealing plate 61 is received in the second slot 13, the unlocking hole 12 can be opened for the unlocking rod 41 to be inserted.

[0051] Reference Figure 6 and Figure 8 In the embodiment of the present application, the first sealing member 5 includes a first sealing plate 51 and a first spring 52. The side wall of the test box 1 is provided with a first slide groove 15 and a first slot 16 on the upper and lower sides of the outlet hole 11. The first sealing plate 51 is slidably arranged in the first slide groove 15, and the first spring 52 is arranged between the bottom wall of the first slide groove 15 and the first sealing plate 51. In a natural state, when the side wall of the first sealing plate 51 is inserted into the first slot 16, the first spring 52 is in a compressed state, and at this time, the first sealing plate 51 closes the outlet hole 11. The first sealing plate 51 is provided with an inclined surface on one side facing the inside of the box body, and the inclined surface is provided at one end of the first sealing plate 51 close to the first slot 16, that is, it is opened at the lower end position; when the second mounting plate 23 slides toward the outlet hole 11, the side wall of the second mounting plate 23 away from the center column 21 abuts against the inclined surface of the first sealing plate 51, so that the first sealing plate 51 can be driven to slide upward into the first slide groove 15 to open the outlet hole 11.

[0052] Reference Figure 3 and Figure 4 In an optional embodiment, the first mounting plate 22 may be additionally provided with a baffle 225 and an elastic member 226 to further enhance the stability of the test stand 2. Figure 4and Figure 5 The baffle 225 is slidably disposed on the side of the first mounting plate 22 away from the center column 21, and correspondingly, a through hole for the baffle 225 to slide up and down is provided at the end of the first mounting plate 22. The baffle 225 is a rectangular plate, and a linkage hole 2251 is provided in the middle of the baffle 225, so that the baffle 225 forms a "U"-shaped structure. In a natural state, the upper ends of the left and right sides of the baffle 225 are located in the receiving groove 222, which can limit the second mounting plate 23 from sliding in the direction away from the center column 21, so as to improve the stability of the second mounting plate 23 in the receiving groove 222. The baffle 225 is provided with an inclined surface on the side wall below the linkage hole 2251.

[0053] The baffle 225 is provided with an inclined surface on the lower side wall where the linkage hole 2251 is located, and the inclined surface is facing the side away from the center column 21. When the unlocking rod 41 is inserted into the test box 1, the unlocking rod 41 can abut against the inclined surface of the baffle 225, driving the baffle 225 to move downward, so that the upper end part of the baffle 225 moves downward synchronously to escape from the receiving groove 222. Therefore, when the unlocking rod 41 continues to move toward the center column 21, it can drive the second mounting plate 23 to slide out of the receiving groove 222.

[0054] When the unlocking rod 41 slides out of the test box 1, the elastic member 226 can drive the baffle plate 225 to move upward and re-insert into the outside of the receiving groove 222. Specifically, the elastic member 226 is a second spring, and a clamping plate 2252 is fixed on the side wall of the side plate facing the center. The upper end of the second spring is connected to the lower surface of the first mounting plate 22, and the lower end is connected to the upper surface of the clamping plate 2252. When there is no external force, the second spring drives the upper end of the baffle plate 225 to be inserted into the receiving groove 222.

[0055] The implementation principle of an aging test device for a liquid crystal display circuit board in an embodiment of the present application is as follows: when an aging test of a liquid crystal display circuit board is required, first open the door of the test box 1, connect and place the circuit board in the mounting groove 231 of the second mounting plate 23, and after placement, close the door, and control the temperature adjustment system through the control system to adjust the temperature in the test box 1 to the desired state for aging testing; during the test, the motor 31 can be turned on synchronously to drive the entire test frame 2 to rotate slowly, so that the temperature in the test box 1 is more uniform. When a fault is detected in the circuit board under test, the control system controls the motor 31 to rotate the second mounting plate 23 with the faulty circuit board to a position facing the output hole 11 and sends an alarm to signal the staff.

[0056] Then the staff slides the second sealing plate 61 through the second handle 62 to open the unlocking hole 12, and inserts the unlocking rod 41 into the unlocking hole 12 with the first tooth facing upward, until the unlocking rod 41 engages with the gear 42 through the first tooth, driving the second mounting plate 23 to slide outward and sending the circuit board out of the box body; after checking the circuit board and replacing it with a new one, the staff pulls out the unlocking rod 41 and slides the second mounting plate 23 into the test box 1 again so that it can be re-stored on the first mounting plate 22.

[0057] The above are all preferred embodiments of the present application, and the protection scope of the present application is not limited thereto. Therefore, any equivalent changes made according to the structure, shape, and principle of the present application should be included in the protection scope of the present application.

Claims

1. An aging test device for a liquid crystal display circuit board, comprising a test box (1), wherein a control system is provided in the test box (1), characterized in that: It also comprises a test stand (2), a power device (3) and a drive device (4), wherein the test stand (2) is rotatably arranged in the test box (1), the power device (3) is used to drive the test stand (2) to rotate, and the power device (3) is connected to the control system; The test stand (2) comprises a central column (21) rotatably arranged in the test box (1), a first mounting plate (22) arranged on a side wall of the central column (21), and a second mounting plate (23) slidably arranged on the first mounting plate (22), wherein a plurality of first mounting plates (22) are arranged along the circumference of the central column (21), and a plurality of first mounting plates (22) are arranged at intervals along the length direction of the central column (21), and the driving device (4) is capable of driving the second mounting plate (23) to slide on the first mounting plate (23) in a direction approaching or moving away from the central column (21). 22), the second mounting plate (23) is provided with a mounting groove (231) for accommodating a circuit board, the side wall of the test box (1) is provided with an outlet hole (11), a plurality of the outlet holes (11) are arranged at intervals along the height direction of the test box (1) corresponding to the second mounting plate (23), when the second mounting plate (23) is rotated to face the outlet hole (11), the driving device (4) can drive the end of the second mounting plate (23) to slide out of the outlet hole (11), and the side wall of the test box (1) is also provided with a first sealing member (5) for closing the outlet hole (11); The second mounting plate (23) is provided with a terminal head (232) for supplying power to the circuit board, the first mounting plate (22) is provided with a first circuit contact (221), and the second mounting plate (23) is provided with a second circuit contact (233); when the second mounting plate (23) slides, the first circuit contact (221) and the second circuit contact (233) can be separated from each other or abut against each other, the first circuit contact (221) and the second circuit contact (233) abut against each other, and the second circuit contact (233) is electrically connected to the terminal head (232); The driving device (4) comprises an unlocking rod (41) and a gear (42); an unlocking hole (12) for the unlocking rod (41) to pass through is provided on a side wall of the test box (1); a second sealing member (6) for closing the unlocking hole (12) is provided on the test box (1); a first tooth is provided on the upper surface of the unlocking rod (41); a second tooth is provided on the lower surface of the second mounting plate (23); the gear (42) is rotatably mounted on the first mounting plate (22); the second tooth meshes with the upper portion of the gear (42); and when the unlocking rod (41) is inserted into the unlocking hole (12), the first tooth can mesh with the lower portion of the gear (42).

2. The aging test equipment for a liquid crystal display circuit board according to claim 1, characterized in that: The first mounting plate (22) is provided with a receiving groove (222) for receiving the second mounting plate (23); a limiting block (234) is provided on a side wall of the second mounting plate (23); the first mounting plate (22) is provided with a limiting groove (223) for the limiting block (234) to slide; an extending direction of the limiting groove (223) is parallel to a sliding direction of the second mounting plate (23); when the second mounting plate (23) slides toward the ejection hole (11) until the limiting block (234) abuts against the side wall of the limiting groove (223), the circuit board on the second mounting plate (23) moves along with the second mounting plate (23) to the outside of the test box (1).

3. The aging test equipment for a liquid crystal display circuit board according to claim 2, characterized in that: A second magnetic attraction component (235) is provided on a side wall of one end of the second mounting plate (23) facing the central column (21), and a first magnetic attraction component (224) is provided on a side wall of the accommodating groove (222) of the first mounting plate (22); when the second mounting plate (23) is located in the accommodating groove (222), the first magnetic attraction component (224) and the second magnetic attraction component (235) are magnetically attracted to each other.

4. The aging test equipment for a liquid crystal display circuit board according to claim 3, characterized in that: The second sealing member (6) comprises a second sealing plate (61) slidably arranged on the side wall of the test box (1), and a second handle (62) arranged on the side wall of the second sealing plate (61); the test box (1) is provided with a second slide groove (13) on one side of the unlocking hole (12) for accommodating the second sealing plate (61) and allowing the second sealing plate (61) to slide; the test box (1) is provided with a second slot (14) on the other side of the unlocking hole (12) for the second sealing plate (61) to be inserted; when the second sealing plate (61) slides and the side wall is inserted into the second slot (14), the unlocking hole (12) can be covered.

5. The aging test equipment for a liquid crystal display circuit board according to claim 1, characterized in that: The first sealing member (5) comprises a first sealing plate (51) and a first spring (52); the side wall of the test box (1) is provided with a first slide groove (15) and a first slot (16) at upper and lower sides of the outlet hole (11), respectively; the first sealing plate (51) is slidably arranged in the first slide groove (15); the first spring (52) is arranged between the bottom wall of the first slide groove (15) and the first sealing plate (51); in a natural state, when the side wall of the first sealing plate (51) is inserted into the first slot (16), the first spring (52) is in a compressed state; the first sealing plate (51) is provided with an inclined surface on one side facing the inside of the test box (1); when the second mounting plate (23) slides toward the outlet hole (11), the side wall of the second mounting plate (23) abuts against the inclined surface of the first sealing plate (51) and can drive the first sealing plate (51) to slide into the first slide groove (15).

6. The aging test equipment for a liquid crystal display circuit board according to claim 4, characterized in that: The first mounting plate (22) is provided with a baffle plate (225) and an elastic member (226); the baffle plate (225) is slidably arranged on a side of the first mounting plate (22) away from the central column (21); a linkage hole (2251) is provided on the baffle plate (225); and an inclined surface is provided on a side wall below the linkage hole (2251); in a natural state, the upper end of the baffle plate (225) extends beyond the receiving groove (222). When the unlocking rod (41) is inserted into the test box (1), the unlocking rod (41) can abut against the inclined surface of the baffle (225), and can drive the baffle (225) to move downward so that the upper end of the baffle (225) is downwardly disengaged from the receiving groove (222); when the unlocking rod (41) slides out of the test box (1), the elastic member (226) can drive the baffle (225) to move upward and be reinserted into the receiving groove (222).

7. The aging test equipment for a liquid crystal display circuit board according to claim 6, characterized in that: The elastic member (226) is a second spring, a clamping plate (2252) is provided on the side wall of the baffle plate (225), the upper end of the second spring is connected to the first mounting plate (22), and the lower end of the second spring is connected to the clamping plate (2252).

8. The aging test equipment for a liquid crystal display circuit board according to claim 1, characterized in that: Two test racks (2) are arranged in the test box (1) at intervals along the length direction of the test box (1), and both side walls of the test box (1) are provided with ejection holes (11) for the second mounting plate (23) to slide out.

9. The aging test equipment for a liquid crystal display circuit board according to claim 1, characterized in that: The power device (3) is a motor (31), the motor (31) is arranged on the test box (1), and the output shaft of the motor (31) is connected to the central column (21).

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