Energy-saving memory bank aging test method, device, equipment and medium

Abstract

The invention provides an energy-saving memory bank aging test method, device and equipment and a medium, and relates to the technical field of memory bank testing. The method comprises the following steps: determining test parameters of a memory bank aging test, wherein the test parameters comprise test duration and test temperature; setting the temperature of the memory bank aging test equipment as the test temperature; when the temperature of the memory bank aging test equipment reaches the test temperature, controlling the temperature of the memory bank aging test equipment to be kept at the test temperature, and starting timing; and when the timing time is equal to the test duration, turning off the memory bank aging test equipment, and ending the memory bank aging test on the memory bank. On one hand, the problem of inaccurate test caused by direct use of default test parameters is avoided; and on the other hand, the memory bank aging test equipment can be directly closed when the test duration is ended, so that the test accuracy is ensured, and the waste of electric energy is avoided.

Description

Technical Field

[0001] The present invention relates to the technical field of memory bar testing, and in particular to an energy-saving memory bar aging test method, device, equipment and medium. Background Art

[0002] Memory is an important component in the computer.

[0003] The performance of the memory module is very important to the computer. In order to ensure that the performance of the memory module meets the standard, the memory module needs to be tested before it leaves the factory. Among them, the aging test of the memory module is an important test.

[0004] Aging tests need to be performed at high temperatures. In the prior art, the test process is not precisely controlled, which not only wastes energy, but also leads to poor accuracy of test results. Summary of the invention

[0005] The embodiments of the present invention provide an energy-saving memory bar aging test method, device, equipment and medium, aiming to solve the problems of poor accuracy and energy waste in existing memory bar tests.

[0006] In a first aspect, an embodiment of the present invention provides an energy-saving memory bar aging test method, which includes:

[0007] Determine test parameters for a memory bar aging test, wherein the test parameters include a test duration and a test temperature;

[0008] Setting the temperature of the memory bar aging test equipment to the test temperature;

[0009] When the temperature of the memory bar aging test device reaches the test temperature, controlling the temperature of the memory bar aging test device to be maintained at the test temperature, and starting timing;

[0010] When the timing time is equal to the test duration, the memory bar aging test device is turned off to end the memory bar aging test on the memory bar.

[0011] A further technical solution is that before determining the test parameters of the memory bar aging test, the method further includes:

[0012] System self-check to determine whether the working status of each functional module of the memory bar aging test device is normal;

[0013] If the working states of the functional modules of the memory stick aging test device are all normal, proceed to the step of determining the test parameters of the memory stick aging test.

[0014] A further technical solution is that the step of determining the test parameters of the memory bar aging test includes:

[0015] Displaying default test parameters to the user and prompting the user to check; the default test parameters include default test duration and default test temperature;

[0016] If a modification instruction of the user for the default test duration is received, the default test duration is modified based on the user modification instruction to obtain the test duration;

[0017] If a modification instruction of the user for the default test temperature is received, the default test temperature is modified based on the user modification instruction to obtain the test temperature.

[0018] A further technical solution is that the determination of the test parameters of the memory bar aging test further includes:

[0019] If a confirmation instruction of the user for the default test duration is received, the default test duration is used as the test duration;

[0020] If a confirmation instruction of the user for the default test temperature is received, the default test temperature is used as the test temperature.

[0021] A further technical solution is that after shutting down the memory bar aging test device and finishing the memory bar aging test on the memory bar, the method further includes:

[0022] A prompt message is sent to the user that the memory bar aging test has been completed.

[0023] A further technical solution is that the sending of a prompt message to the user that the memory bar aging test has been completed includes:

[0024] Control a preset buzzer to start; and / or light a preset indicator light; and / or display a test completion prompt message on a preset display device.

[0025] A further technical solution is that the step of shutting down the memory bar aging test device and ending the memory bar aging test on the memory bar includes:

[0026] Cut off the power supply of the heating plate of the memory stick aging test device, and cut off the power supply of the fan of the memory stick aging test device.

[0027] In a second aspect, an embodiment of the present invention further provides an energy-saving memory bar aging test device, which includes a unit for executing the above method.

[0028] In a third aspect, an embodiment of the present invention further provides a computer device, which includes a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the above method when executing the computer program.

[0029] In a fourth aspect, an embodiment of the present invention further provides a computer-readable storage medium, wherein the storage medium stores a computer program, and the computer program can implement the above method when executed by a processor.

[0030] The embodiment of the present invention provides an energy-saving memory bar aging test method, device, equipment and medium. The method includes: determining the test parameters of the memory bar aging test, the test parameters include the test duration and the test temperature; setting the temperature of the memory bar aging test device to the test temperature; when the temperature of the memory bar aging test device reaches the test temperature, controlling the temperature of the memory bar aging test device to maintain the test temperature, and starting the timing; when the timing time is equal to the test duration, turning off the memory bar aging test device, and ending the memory bar aging test for the memory bar. On the one hand, the present invention first determines the test parameters of the memory bar aging test, rather than directly using the default parameters, so that the test parameters are more accurate, avoiding the problem of inaccurate testing caused by directly using the default test parameters. On the other hand, the present invention can directly turn off the memory bar aging test device when the test duration ends, ensuring the accuracy of the test and avoiding test errors caused by inaccurate test time; by turning off the device in time, it can greatly save energy, reduce test costs, and effectively avoid wasting electric energy. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying any creative work.

[0032] Figure 1 A schematic diagram of a flow chart of an energy-saving memory bar aging test method provided by an embodiment of the present invention;

[0033] Figure 2 A schematic block diagram of an energy-saving memory bar aging test device provided by an embodiment of the present invention;

[0034] Figure 3 A schematic block diagram of a computer device provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0035] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0036] It should be understood that when used in this specification and the appended claims, the terms "include" and "comprises" indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or combinations thereof.

[0037] It should also be understood that the terms used in this specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. As used in the specification of the present invention and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an" and "the" are intended to include plural forms.

[0038] It should be further understood that the term "and / or" used in the present description and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0039] As used in this specification and the appended claims, the term "if" may be interpreted as "when" or "upon" or "in response to determining" or "in response to detecting," depending on the context. Similarly, the phrases "if it is determined" or "if [described condition or event] is detected" may be interpreted as meaning "upon determination" or "in response to determining" or "upon detection of [described condition or event]" or "in response to detecting [described condition or event]," depending on the context.

[0040] See also Figure 1 , Figure 1 FIG. 1 is a flow chart of an energy-saving memory bar aging test method provided by an embodiment of the present invention. Figure 1 As shown, the method comprises the following steps:

[0041] S1, determining test parameters of a memory bar aging test, wherein the test parameters include a test duration and a test temperature.

[0042] In a specific implementation, the present invention first determines the test parameters of the memory bar aging test before starting the memory bar aging test, rather than directly using the default parameters, so that the test parameters are more accurate and avoids the problem of inaccurate testing caused by directly using the default test parameters.

[0043] Specifically, the test parameters include test duration and test temperature.

[0044] In one embodiment, in order to ensure that the test can be carried out normally, before determining the test parameters of the memory stick aging test, the method also includes the following steps: system self-check to determine whether the working status of each functional module of the memory stick aging test device is normal; if the working status of each functional module of the memory stick aging test device is normal, go to the step of determining the test parameters of the memory stick aging test.

[0045] In a specific implementation, the memory stick aging test device is first controlled to perform a system self-check to determine whether the working status of each functional module of the memory stick aging test device is normal. The functional modules may specifically include a heating plate, a fan, etc. That is, it is determined whether the heating plate and the fan can work normally. If the working status of each functional module of the memory stick aging test device is normal, that is, each functional module of the memory stick aging test device can work normally, then go to the step of determining the test parameters of the memory stick aging test.

[0046] Furthermore, after the system self-check passes, the default test time and test temperature are displayed on the display screen of the memory bar aging test device.

[0047] In one embodiment, the above step of “determining test parameters for a memory bar aging test” includes:

[0048] S11, displaying default test parameters to the user and prompting the user to check; the default test parameters include default test duration and default test temperature.

[0049] In a specific implementation, firstly, the default test parameters are displayed on the display screen of the memory bar aging test device, and the user is prompted to check. The default test parameters include the default test duration and the default test temperature.

[0050] After checking, if the default test parameters are inaccurate, the user can modify them.

[0051] S12: If a modification instruction of the user for the default test duration is received, the default test duration is modified based on the user modification instruction to obtain the test duration.

[0052] In a specific implementation, if a modification instruction for the default test duration is received from the user, the default test duration is modified based on the user modification instruction to obtain the test duration; thereby, an accurate test duration can be obtained, avoiding inaccurate test results due to inaccurate test duration.

[0053] S13: If a modification instruction of the user for the default test temperature is received, the default test temperature is modified based on the user modification instruction to obtain the test temperature.

[0054] In a specific implementation, if a modification instruction for the default test temperature is received from the user, the default test temperature is modified based on the user modification instruction to obtain the test temperature; thereby obtaining an accurate test temperature and avoiding inaccurate test results due to inaccurate test temperature.

[0055] During this process, the test program uses serial port communication to transmit the temperature data of the DIMM (dual in-line memory module) to the temperature control board in real time, or reads the temperature sensing data to the temperature control board.

[0056] S14: If a confirmation instruction from the user regarding the default test duration is received, the default test duration is used as the test duration.

[0057] In a specific implementation, if a confirmation instruction of the user for the default test duration is received, the default test duration is used as the test duration.

[0058] S15: If a confirmation instruction of the user for the default test temperature is received, the default test temperature is used as the test temperature.

[0059] In a specific implementation, if a confirmation instruction of the user for the default test temperature is received, the default test temperature is used as the test temperature.

[0060] It can be seen that in the embodiment of the present invention, the program is written into the MCU, and the user operates and calls the peripherals to easily set various temperature and time conditions. There is no need to frequently modify and re-burn the program for different products, thereby quickly adapting to various testing needs and improving testing efficiency.

[0061] S2, setting the temperature of the memory bar aging test equipment to the test temperature.

[0062] In a specific implementation, the temperature of the memory bar aging test device is set to the test temperature, so that the temperature of the memory bar aging test device rises to the test temperature. Specifically, the heating plate is turned on, so that the temperature of the memory bar aging test device rises to the test temperature.

[0063] Specifically, after the temperature control board receives these temperature setting data (the test temperature), it will perform an algorithm to calculate the average temperature of each area and compare it with the preset target temperature (the test temperature). The core of the temperature control system is to adjust the temperature of the equipment by controlling the high and low levels. Specifically, the temperature control program will decide whether to increase or decrease the power of the cooling or heating equipment based on the difference between the average temperature and the target temperature.

[0064] During the adjustment process, the temperature control system will also use PID (proportional-integral-differential) control algorithms or other preset control strategies to ensure the accuracy and stability of temperature adjustment. By continuously adjusting the duty cycle or frequency of high and low level signals, the temperature control system can finely control the power of the heating and cooling equipment, thereby quickly and smoothly adjusting the equipment temperature to the preset value.

[0065] Once the temperature reaches the preset value, the temperature control system will automatically enter a stable state, triggering the temperature control device to turn on and off through continuous threshold comparison to ensure that the device temperature remains within the target range.

[0066] S3, when the temperature of the memory stick aging test device reaches the test temperature, control the temperature of the memory stick aging test device to be maintained at the test temperature, and start timing.

[0067] In a specific implementation, when the temperature of the memory bar aging test device reaches the test temperature, the temperature of the memory bar aging test device is controlled to be maintained at the test temperature, and timing is started. Specifically, the timing can be implemented by software to implement a timer function, thereby achieving precise control of the test time.

[0068] S4, when the timing time is equal to the test duration, turning off the memory bar aging test device, and ending the memory bar aging test on the memory bar.

[0069] In a specific implementation, when the timing time is equal to the test duration, the memory bar aging test device is turned off, and the memory bar aging test for the memory bar is ended. It can be seen that in the present invention, the memory bar aging test device can be directly turned off when the test duration ends, thereby ensuring the accuracy of the test on the one hand and avoiding test errors caused by inaccurate test time; on the other hand, by turning off the device in time, it can greatly save energy, reduce test costs, and effectively avoid wasting electricity.

[0070] It can be seen that in the embodiment of the present invention, a built-in intelligent timing function is used to automatically record and monitor the aging operation time. Once the preset test time is reached, the device will automatically cut off the aging load power supply and issue an audible and visual prompt. No manual intervention is required throughout the process, which effectively avoids energy waste and ensures the accuracy of the test results.

[0071] In one embodiment, the above step of "turning off the memory stick aging test device and ending the memory stick aging test on the memory stick" includes: cutting off the power supply of the heating plate of the memory stick aging test device, and cutting off the power supply of the fan of the memory stick aging test device.

[0072] Specifically, the memory bar aging test device includes a heating plate and a fan. After the test time is over, the power supply of the heating plate and the fan is automatically cut off, thereby greatly saving energy and avoiding the waste of electric energy.

[0073] At the same time, the operating time of the memory stick aging test device is displayed on the display device, so that the user can clearly know the operating status of the memory stick aging test device.

[0074] In one embodiment, in order to better prompt the user, after the above step of "turning off the memory stick aging test device and ending the memory stick aging test on the memory stick", the method also includes: sending a prompt message to the user that the memory stick aging test has been completed.

[0075] Specifically, after the memory stick aging test device is turned off and the memory stick aging test on the memory stick is finished, a prompt message is sent to the user that the memory stick aging test has been completed, so that the user can know the information that the test has ended in time and make subsequent processing in time to avoid the user forgetting.

[0076] Specifically, in one embodiment, the above step of "sending a prompt message to the user that the memory stick aging test has been completed" specifically includes: controlling a preset buzzer to start; and / or lighting a preset indicator light; and / or displaying a test completion prompt message on a preset display device.

[0077] In a specific implementation, the pre-configured prompt device includes a buzzer, a start light, and a display device. After the memory bar aging test for the memory bar is completed, the preset buzzer is controlled to start, so that the user can receive the sound prompt information; the preset indicator light is lit, so that the user can receive the light prompt information; and the test completion prompt information is displayed on the preset display device, so that the user can receive the display prompt information.

[0078] Through the above notification methods, users can promptly know that the memory bar aging test has been completed and take timely action.

[0079] The embodiment of the present invention proposes an energy-saving memory bar aging test method, including: determining the test parameters of the memory bar aging test, the test parameters include the test duration and the test temperature; setting the temperature of the memory bar aging test device to the test temperature; when the temperature of the memory bar aging test device reaches the test temperature, controlling the temperature of the memory bar aging test device to maintain the test temperature, and starting the timing; when the timing time is equal to the test duration, turning off the memory bar aging test device, and ending the memory bar aging test for the memory bar. On the one hand, the present invention first determines the test parameters of the memory bar aging test, rather than directly using the default parameters, so that the test parameters are more accurate, avoiding the problem of inaccurate testing caused by directly using the default test parameters. On the other hand, the memory bar aging test device can be directly turned off at the end of the test duration, ensuring the accuracy of the test and avoiding test errors caused by inaccurate test time; by turning off the device in time, it can greatly save energy, reduce test costs, and effectively avoid wasting electric energy.

[0080] See also Figure 2 , Figure 2 : is a schematic block diagram of an energy-saving memory bar aging test device provided by an embodiment of the present invention. Corresponding to the above energy-saving memory bar aging test method, the present invention also provides an energy-saving memory bar aging test device. The energy-saving memory bar aging test device includes a unit for executing the above energy-saving memory bar aging test method, and the energy-saving memory bar aging test device can be configured in a computer device. Specifically, the energy-saving memory bar aging test device includes:

[0081] A determination unit 21, used to determine test parameters of a memory bar aging test, wherein the test parameters include a test duration and a test temperature;

[0082] A setting unit 22, used to set the temperature of the memory bar aging test device to the test temperature;

[0083] A timing unit 23, used for controlling the temperature of the memory bar aging test device to be maintained at the test temperature when the temperature of the memory bar aging test device reaches the test temperature, and starting timing;

[0084] The closing unit 24 is used to close the memory bar aging test device when the timing time is equal to the test duration, so as to end the memory bar aging test on the memory bar.

[0085] In one embodiment, the energy-saving memory bar aging test device further includes:

[0086] The self-check unit is used for system self-check to determine whether the working status of each functional module of the memory bar aging test device is normal; if the working status of each functional module of the memory bar aging test device is normal, go to the step of determining the test parameters of the memory bar aging test.

[0087] In one embodiment, determining the test parameters of the memory bar aging test includes:

[0088] Displaying default test parameters to the user and prompting the user to check; the default test parameters include default test duration and default test temperature;

[0089] If a modification instruction of the user for the default test duration is received, the default test duration is modified based on the user modification instruction to obtain the test duration;

[0090] If a modification instruction of the user for the default test temperature is received, the default test temperature is modified based on the user modification instruction to obtain the test temperature.

[0091] In one embodiment, determining the test parameters of the memory bar aging test further includes:

[0092] If a confirmation instruction of the user for the default test duration is received, the default test duration is used as the test duration;

[0093] If a confirmation instruction of the user for the default test temperature is received, the default test temperature is used as the test temperature.

[0094] In one embodiment, the energy-saving memory bar aging test device further includes:

[0095] A prompt message is sent to the user that the memory bar aging test has been completed.

[0096] In one embodiment, the sending of a prompt message to the user that the memory bar aging test has been completed includes:

[0097] Control a preset buzzer to start; and / or light a preset indicator light; and / or display a test completion prompt message on a preset display device.

[0098] In one embodiment, shutting down the memory bar aging test device and ending the memory bar aging test on the memory bar includes:

[0099] Cut off the power supply of the heating plate of the memory stick aging test device, and cut off the power supply of the fan of the memory stick aging test device.

[0100] It should be noted that technicians in the relevant field can clearly understand that the specific implementation process of the above-mentioned energy-saving memory bar aging test device and each unit can refer to the corresponding description in the aforementioned method embodiment, and for the convenience and brevity of description, it will not be repeated here.

[0101] The energy-saving memory bar aging test device can be implemented in the form of a computer program. The computer program can be used in Figure 3 Runs on the computer device shown.

[0102] See also Figure 3 , Figure 3 5 is a schematic block diagram of a computer device provided in an embodiment of the present application. The computer device 500 may be a terminal or a server, wherein the terminal may be an electronic device with communication functions such as a smart phone, a tablet computer, a laptop computer, a desktop computer, a personal digital assistant, and a wearable device. The server may be an independent server or a server cluster composed of multiple servers.

[0103] The computer device 500 includes a processor 502 , a memory, and a network interface 505 connected via a system bus 501 , wherein the memory may include a non-volatile storage medium 503 and an internal memory 504 .

[0104] The non-volatile storage medium 503 can store an operating system 5031 and a computer program 5032. When the computer program 5032 is executed, the processor 502 can execute an energy-saving memory bar aging test method.

[0105] The processor 502 is used to provide computing and control capabilities to support the operation of the entire computer device 500 .

[0106] The internal memory 504 provides an environment for the operation of the computer program 5032 in the non-volatile storage medium 503. When the computer program 5032 is executed by the processor 502, the processor 502 can execute an energy-saving memory bar aging test method.

[0107] The network interface 505 is used to communicate with other devices over the network. Those skilled in the art will appreciate that the above structure is only a block diagram of a portion of the structure related to the present application solution, and does not constitute a limitation on the computer device 500 to which the present application solution is applied. The specific computer device 500 may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0108] The processor 502 is used to run the computer program 5032 stored in the memory to implement the following steps:

[0109] Determine test parameters for a memory bar aging test, wherein the test parameters include a test duration and a test temperature;

[0110] Setting the temperature of the memory bar aging test equipment to the test temperature;

[0111] When the temperature of the memory bar aging test device reaches the test temperature, controlling the temperature of the memory bar aging test device to be maintained at the test temperature, and starting timing;

[0112] When the timing time is equal to the test duration, the memory bar aging test device is turned off to end the memory bar aging test on the memory bar.

[0113] In one embodiment, before determining the test parameters of the memory bar aging test, the method further includes:

[0114] System self-check to determine whether the working status of each functional module of the memory bar aging test device is normal;

[0115] If the working states of the functional modules of the memory stick aging test device are all normal, proceed to the step of determining the test parameters of the memory stick aging test.

[0116] In one embodiment, determining the test parameters of the memory bar aging test includes:

[0117] Displaying default test parameters to the user and prompting the user to check; the default test parameters include default test duration and default test temperature;

[0118] If a modification instruction of the user for the default test duration is received, the default test duration is modified based on the user modification instruction to obtain the test duration;

[0119] If a modification instruction of the user for the default test temperature is received, the default test temperature is modified based on the user modification instruction to obtain the test temperature.

[0120] In one embodiment, determining the test parameters of the memory bar aging test further includes:

[0121] If a confirmation instruction of the user for the default test duration is received, the default test duration is used as the test duration;

[0122] If a confirmation instruction of the user for the default test temperature is received, the default test temperature is used as the test temperature.

[0123] In one embodiment, after shutting down the memory bar aging test device and ending the memory bar aging test on the memory bar, the method further includes:

[0124] A prompt message is sent to the user that the memory bar aging test has been completed.

[0125] In one embodiment, the sending of a prompt message to the user that the memory bar aging test has been completed includes:

[0126] Control a preset buzzer to start; and / or light a preset indicator light; and / or display a test completion prompt message on a preset display device.

[0127] In one embodiment, shutting down the memory bar aging test device and ending the memory bar aging test on the memory bar includes:

[0128] Cut off the power supply of the heating plate of the memory stick aging test device, and cut off the power supply of the fan of the memory stick aging test device.

[0129] It should be understood that in the embodiment of the present application, the processor 502 may be a central processing unit (CPU), and the processor 502 may also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Among them, the general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0130] It is understood by those skilled in the art that all or part of the processes in the method for implementing the above embodiment can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a storage medium, which is a computer-readable storage medium. The computer program is executed by at least one processor in the computer system to implement the process steps of the embodiment of the above method.

[0131] Therefore, the present invention also provides a storage medium. The storage medium may be a computer-readable storage medium. The storage medium stores a computer program. When the computer program is executed by a processor, the processor executes the following steps:

[0132] Determine test parameters for a memory bar aging test, wherein the test parameters include a test duration and a test temperature;

[0133] Setting the temperature of the memory bar aging test equipment to the test temperature;

[0134] When the temperature of the memory bar aging test device reaches the test temperature, controlling the temperature of the memory bar aging test device to be maintained at the test temperature, and starting timing;

[0135] When the timing time is equal to the test duration, the memory bar aging test device is turned off to end the memory bar aging test on the memory bar.

[0136] In one embodiment, before determining the test parameters of the memory bar aging test, the method further includes:

[0137] System self-check to determine whether the working status of each functional module of the memory bar aging test device is normal;

[0138] If the working states of the functional modules of the memory stick aging test device are all normal, proceed to the step of determining the test parameters of the memory stick aging test.

[0139] In one embodiment, determining the test parameters of the memory bar aging test includes:

[0140] Displaying default test parameters to the user and prompting the user to check; the default test parameters include default test duration and default test temperature;

[0141] If a modification instruction of the user for the default test duration is received, the default test duration is modified based on the user modification instruction to obtain the test duration;

[0142] If a modification instruction of the user for the default test temperature is received, the default test temperature is modified based on the user modification instruction to obtain the test temperature.

[0143] In one embodiment, determining the test parameters of the memory bar aging test further includes:

[0144] If a confirmation instruction of the user for the default test duration is received, the default test duration is used as the test duration;

[0145] If a confirmation instruction of the user for the default test temperature is received, the default test temperature is used as the test temperature.

[0146] In one embodiment, after shutting down the memory bar aging test device and ending the memory bar aging test on the memory bar, the method further includes:

[0147] A prompt message is sent to the user that the memory bar aging test has been completed.

[0148] In one embodiment, the sending of a prompt message to the user that the memory bar aging test has been completed includes:

[0149] Control a preset buzzer to start; and / or light a preset indicator light; and / or display a test completion prompt message on a preset display device.

[0150] In one embodiment, shutting down the memory bar aging test device and ending the memory bar aging test on the memory bar includes:

[0151] Cut off the power supply of the heating plate of the memory stick aging test device, and cut off the power supply of the fan of the memory stick aging test device.

[0152] The storage medium is a physical, non-transient storage medium, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a magnetic disk, or an optical disk, etc., which can store program codes. The computer-readable storage medium can be non-volatile or volatile.

[0153] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in terms of function in the above description. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

[0154] In the several embodiments provided by the present invention, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of each unit is only a logical function division, and there may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed.

[0155] The steps in the method of the embodiment of the present invention can be adjusted in order, combined and deleted according to actual needs. The units in the device of the embodiment of the present invention can be combined, divided and deleted according to actual needs. In addition, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0156] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a storage medium. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, terminal, or network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention.

[0157] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0158] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

[0159] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of various equivalent modifications or substitutions within the technical scope disclosed by the present invention, and these modifications or substitutions should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention shall be based on the protection scope of the claims.

Claims

1. An energy-saving memory bar aging test method, characterized in that: include: Determine test parameters for a memory bar aging test, wherein the test parameters include a test duration and a test temperature; Setting the temperature of the memory bar aging test equipment to the test temperature; When the temperature of the memory bar aging test device reaches the test temperature, controlling the temperature of the memory bar aging test device to be maintained at the test temperature, and starting timing; When the timing time is equal to the test duration, the memory bar aging test device is turned off to end the memory bar aging test on the memory bar.

2. The energy-saving memory bar aging test method according to claim 1, characterized in that: Before determining the test parameters of the memory bar aging test, the method further includes: System self-check to determine whether the working status of each functional module of the memory bar aging test device is normal; If the working states of the functional modules of the memory stick aging test device are all normal, proceed to the step of determining the test parameters of the memory stick aging test.

3. The energy-saving memory bar aging test method according to claim 1, characterized in that: The step of determining the test parameters of the memory bar aging test includes: Displaying default test parameters to the user and prompting the user to check; the default test parameters include default test duration and default test temperature; If a modification instruction of the user for the default test duration is received, the default test duration is modified based on the user modification instruction to obtain the test duration; If a modification instruction of the user for the default test temperature is received, the default test temperature is modified based on the user modification instruction to obtain the test temperature.

4. The energy-saving memory bar aging test method according to claim 3, characterized in that: The determining of the test parameters of the memory bar aging test also includes: If a confirmation instruction of the user for the default test duration is received, the default test duration is used as the test duration; If a confirmation instruction of the user for the default test temperature is received, the default test temperature is used as the test temperature.

5. The energy-saving memory bar aging test method according to claim 1, characterized in that: After shutting down the memory bar aging test device and finishing the memory bar aging test on the memory bar, the method further includes: A prompt message is sent to the user that the memory bar aging test has been completed.

6. The energy-saving memory bar aging test method according to claim 5, characterized in that: The sending of prompt information to the user that the memory bar aging test has been completed includes: Control a preset buzzer to start; and / or light a preset indicator light; and / or display a test completion prompt message on a preset display device.

7. The energy-saving memory bar aging test method according to claim 1, characterized in that: The step of shutting down the memory bar aging test device and ending the memory bar aging test on the memory bar includes: Cut off the power supply of the heating plate of the memory stick aging test device, and cut off the power supply of the fan of the memory stick aging test device.

8. An energy-saving memory bar aging test device, characterized in that: The method comprises a unit for executing the method according to any one of claims 1 to 7.

9. A computer device, characterized in that: The computer device includes a memory and a processor, the memory stores a computer program, and the processor implements the method according to any one of claims 1 to 7 when executing the computer program.

10. A computer-readable storage medium, characterized in that: The storage medium stores a computer program, and when the computer program is executed by a processor, the method according to any one of claims 1 to 7 can be implemented.

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