Optical fiber needle card

Abstract

The present application discloses an optical fiber needle card, and relates to the technical field of optical fiber needle cards. An optical fiber needle card includes a substrate one, on which a horizontal and vertical displacement mechanism is installed, which is connected to a substrate two, on which a connecting seat is installed, on which a positioning mechanism is installed, which is connected to a probe assembly; the positioning mechanism includes a mounting seat, a plurality of rocker assemblies, and a plurality of driving assemblies, the mounting seat is connected to the probe assembly and can move synchronously with the probe assembly; the rocker assembly is connected to the mounting seat and can swing; the driving assembly is installed on the connecting seat and connected to the rocker assembly, and the plurality of driving assemblies and the plurality of rocker assemblies correspond one to one; any driving assembly working alone can drive the mounting seat to tilt through the rocker assembly, thereby driving the probe assembly to tilt, and the synchronous working of the plurality of driving assemblies can drive the mounting seat to move vertically, thereby driving the probe assembly to move vertically. The present application enables the probe to contact the chip vertically and also to contact the chip at an angle.

Description

Technical Field

[0001] The present application relates to the technical field of optical fiber pin cards, and in particular to an optical fiber pin card. Background Art

[0002] Fiber optic probe card refers to a special type of probe card used for fiber optic detection, which can provide transmission of electrical and optical signals during fiber optic detection. This probe card plays a vital role in fiber optic communication and optoelectronics industries. In the optoelectronics industry, chips not only need to process electrical signals, but also often need to process optical signals. Usually, fiber optic detection probe cards are used together with coupling optical fibers to transmit electrical and optical signals to the chip for processing.

[0003] The structure of the fiber optic probe card is similar to that of a traditional probe card, which is mainly composed of probes and other functional components. Generally speaking, the probe is responsible for contacting the chip surface and transmitting the test signal, while other functional components are responsible for installing components such as PCB and reinforcement plates, as well as adjusting the probe position to meet the test requirements.

[0004] Usually, when a probe card is used to detect a chip, in order to ensure high-precision testing requirements, the probe tip will be set to vertically contact the chip. This design can ensure stable contact between the probe and the chip, thereby improving test reliability.

[0005] However, sometimes the tester hopes that the probe tip can not only contact the chip vertically but also contact the chip at an angle. In chip testing, if the probe tip contacts the chip completely vertically, the probe may be worn out due to stress problems after long-term use, or the chip's detection point structure may be damaged, which will cause abnormal contact during testing; in addition, in the detection of certain chips, if the needle tip can be switched to contact the chip at an angle and vertically to perform multiple tests, the relevant parameters can be changed to obtain multiple sets of values ​​for comparison, thereby avoiding the erroneous rejection of qualified chips. For example, if the detection point on the chip being tested is in the form of a bump, then the probe will obtain different contact uniformity and contact tightness when contacting different positions on the bump, which will change the resistance value. Summary of the invention

[0006] In order to enable the probe to contact the chip not only vertically but also tiltedly, the present application provides a fiber optic needle card.

[0007] The optical fiber needle card provided in this application adopts the following technical solution:

[0008] An optical fiber needle card comprises a substrate 1, the substrate 1 is equipped with a horizontal and vertical displacement mechanism, the horizontal and vertical displacement mechanism is connected to a substrate 2, a connecting seat is installed on the substrate 2, a positioning mechanism is installed on the connecting seat, and the positioning mechanism is connected to a probe assembly;

[0009] The positioning mechanism comprises:

[0010] A mounting base connected to the probe assembly and capable of moving synchronously with the probe assembly;

[0011] A swing rod assembly, connected to the mounting seat and capable of swinging, wherein a plurality of swing rod assemblies are provided;

[0012] A driving assembly is installed on the connecting seat and connected to the rocker assembly. There are also multiple driving assemblies, and the multiple driving assemblies correspond to the multiple rocker assemblies one by one. Any of the driving assemblies working alone can drive the mounting seat to tilt through the rocker assembly, thereby driving the probe assembly to tilt. The synchronous operation of the multiple driving assemblies can drive the mounting seat to move vertically, thereby driving the probe assembly to move vertically.

[0013] By adopting the above-mentioned technical scheme, the present application can make the probe assembly contact the chip vertically for testing: utilize the horizontal and vertical displacement mechanism to move the probe assembly above the chip to be tested, and synchronously drive multiple driving components to drive the mounting seat to move downward to drive the probe assembly to move downward to vertically contact the chip; in addition, the present application can also make the probe assembly contact the chip at an angle for testing: drive any driving assembly to drive the mounting seat to tilt and thus drive the probe assembly to tilt, utilize the horizontal and vertical displacement mechanism to move the probe assembly above the chip to be tested, and synchronously drive multiple driving components to drive the mounting seat to move downward to drive the probe assembly to move downward to tilt and contact the chip.

[0014] Preferably, three driving assemblies are provided and each driving assembly is installed on the connecting seat, and the three driving assemblies are evenly arranged around the probe assembly; and three rocker arm assemblies are also provided accordingly.

[0015] Preferably, the driving assembly includes a driving rotating member, which is installed on a connecting seat, and the driving rotating member is connected to a vertically arranged screw rod, and the connecting seat is provided with a guide column arranged in the same direction as the screw rod, and the guide column is slidably connected to a guide matching member, and the screw rod is threadedly connected to the guide matching member, and the driving rotating member is used to drive the screw rod to rotate, thereby driving the guide matching member to move vertically; the rocker arm assembly is connected to the guide matching member.

[0016] Preferably, the rocker arm assembly includes a linkage rocker arm, each end of which is equipped with a multi-axis hinge structure, one end of the linkage rocker arm is connected to the mounting seat via a multi-axis hinge structure, and the other end is connected to the guide fitting via another multi-axis hinge structure.

[0017] By adopting the above technical solution, the following actions can be achieved: synchronously drive the three driving parts to drive the three screws to rotate and thus drive the three guide matching parts to move downward synchronously. At this time, driven by the three linkage swing rods, the mounting seat will move downward, and the probe assembly will vertically contact the chip. The following actions can also be achieved: drive one of the driving parts alone, the driving part will drive one of the screws to rotate and thus drive one of the guide matching parts to move downward. At this time, driven by one of the linkage swing rods, the mounting seat will move along an arc trajectory, and the probe assembly will also move along an arc trajectory. The probe assembly will tilt and its direction will change. The inclination of the probe assembly will change based on the different positions reached by the movement of one of the guide matching parts.

[0018] Preferably, the three driving assemblies are located above the mounting seat, and the mounting seat is suspended between the three driving assemblies via three linked rocker arms.

[0019] Preferably, the motion trajectory of the probe assembly includes at least six arc-shaped trajectory lines, and the projections of the six arc-shaped trajectory lines in the vertical direction appear as three diagonal lines of a regular hexagon.

[0020] Preferably, the transverse and longitudinal displacement mechanism includes a seat body arranged on a base plate one, a transverse threaded rod is rotatably connected to the seat body, a feed rotation member one connected to the transverse threaded rod is installed on the seat body, a sliding block is slidably connected to the base plate one, and the transverse threaded rod is threadedly connected to the sliding block; a longitudinal threaded rod is rotatably connected to the sliding block, a feed rotation member two connected to the longitudinal threaded rod is installed on the sliding block, a linkage hole is opened on the base plate two, and the longitudinal threaded rod is threadedly connected to the linkage hole.

[0021] By adopting the above technical solution, driving the first rotating member can drive the transverse threaded rod to rotate, thereby driving the sliding block to move transversely and then driving the second substrate to move transversely, while driving the second rotating member can drive the longitudinal threaded rod to rotate, thereby driving the second substrate to move longitudinally.

[0022] Preferably, the probe assembly comprises a connecting block connected to the mounting seat, the connecting block is provided with a receiving groove, a carrier block is detachably mounted in the receiving groove, and the carrier block is embedded with the probe.

[0023] By adopting the above technical solution, the stability of the probe during detection is ensured by combining the probe with the carrier block in advance.

[0024] Preferably, the carrier block is provided with a docking hole 1, the connection block is provided with a docking hole 2, and the docking hole 1 and the docking hole 2 are jointly connected with a locking piece.

[0025] By adopting the above technical solution, the locking piece can be disassembled to remove the carrier block for replacing the probe.

[0026] Preferably, the probe comprises a connecting needle segment and an epitaxial needle segment connected from inside to outside, the connecting needle segment is buried in the carrier block, and the angle between the connecting needle segment and the epitaxial needle segment is 90°-110°.

[0027] By adopting the above technical solution, the angle between a connecting needle segment and an epitaxial needle segment can avoid hard contact when the probe contacts the chip, thereby preventing the chip from being damaged.

[0028] In summary, the present invention includes at least one of the following beneficial technical effects:

[0029] 1. The present application enables the probe assembly to vertically contact the chip for testing: the probe assembly is moved to the top of the chip to be tested by using the horizontal and vertical displacement mechanism, and the mounting seat is driven downward by synchronously driving multiple driving assemblies to drive the probe assembly to move downward vertically to contact the chip; in addition, the present application also enables the probe assembly to tilt to contact the chip for testing: any driving assembly is driven to tilt the mounting seat and thus drive the probe assembly to tilt, the probe assembly is moved to the top of the chip to be tested by using the horizontal and vertical displacement mechanism, and multiple driving assemblies are driven synchronously to drive the mounting seat to move downward to drive the probe assembly to move downward and tilt to contact the chip;

[0030] 2. The present application can realize the following actions: synchronously drive the three driving parts to drive the three screws to rotate, thereby driving the three guide fittings to move downward synchronously. At this time, driven by the three linkage swing rods, the mounting seat will move downward, and the probe assembly will vertically contact the chip. The present application can also realize the following actions: drive one of the driving parts alone, the driving part will drive one of the screws to rotate, thereby driving one of the guide fittings to move downward. At this time, driven by one of the linkage swing rods, the mounting seat will move along an arc trajectory, and the probe assembly will also move along an arc trajectory. The probe assembly will tilt and its orientation will change. The inclination of the probe assembly will change based on the different positions reached by the movement of one of the guide fittings. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Figure 1 This is a schematic diagram of the overall structure of an optical fiber needle card in an embodiment of the present application;

[0032] Figure 2 It is a structural schematic diagram used to reflect the horizontal and vertical displacement mechanism;

[0033] Figure 3 It is a structural schematic diagram of the connection relationship between the positioning mechanism and the probe assembly;

[0034] Figure 4 It is a structural diagram used to reflect the adjustment mechanism;

[0035] Figure 5 It is a top view used to reflect the multi-axis articulated structure;

[0036] Figure 6 is a schematic diagram of the trajectory of the probe assembly;

[0037] Figure 7 yes Figure 6 Projection in vertical direction;

[0038] Figure 8 is a cross-sectional view used to illustrate the probe assembly.

[0039] Markings in the attached drawings: 1, substrate 1; 2, horizontal and vertical displacement mechanism; 21, seat body; 22, horizontal threaded rod; 23, feed and rotation member 1; 24, sliding block; 25, longitudinal threaded rod; 26, feed and rotation member 2; 3, substrate 2; 31, linkage hole; 4, connecting seat; 5, adjustment mechanism; 51, mounting seat; 511, column part; 512, connecting block part; 52, rocker assembly; 521, linkage rocker; 522, multi-axis Hinge structure; 5221, rotating part; 5222, mounting shaft; 53, driving assembly; 531, driving member; 532, screw; 533, guide column; 534, guide fitting; 6, probe assembly; 61, connecting block; 611, receiving groove; 612, docking hole 2; 62, carrier block; 621, docking hole 1; 63, probe; 631, connecting needle segment; 632, extension needle segment; 64, locking member. DETAILED DESCRIPTION

[0040] The present invention is further described in detail below in conjunction with the accompanying drawings.

[0041] In the description of the present invention, it should be understood that descriptions involving orientations, such as up, down, front, back, left, right, etc., and orientations or positional relationships indicated are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0042] The embodiment of the present application discloses an optical fiber needle card, which is used to enable a probe to contact a chip vertically or tiltedly.

[0043] Reference Figure 1 An optical fiber needle card includes a substrate 1, on which a horizontal and vertical displacement mechanism 2 is installed, which is connected to a substrate 2 3, which is slidably connected to the upper end of the substrate 1, on which a connecting seat 4 is installed, on which a positioning mechanism 5 is installed, and the positioning mechanism 5 is connected to a probe assembly 6 for detection, and the positioning mechanism 5 can drive the probe assembly 6 to tilt.

[0044] Reference Figure 1 and Figure 2The transverse and longitudinal displacement mechanism 2 includes a seat body 21 arranged on the base plate 1, a transverse threaded rod 22 is rotatably connected to the seat body 21, a feed turn piece 23 connected to the transverse threaded rod 22 is installed on the seat body 21, and the feed turn piece 23 is preferably a motor. A sliding block 24 is slidably connected to the base plate 1, and the transverse threaded rod 22 is threadedly connected to the sliding block 24; therefore, driving the feed turn piece 23 can drive the transverse threaded rod 22 to rotate, thereby driving the sliding block 24 to move left and right, and then driving the base plate 23 to move left and right. A longitudinal threaded rod 25 is rotatably connected to the sliding block 24, and a feed turn piece 26 connected to the longitudinal threaded rod 25 is installed on the sliding block 24, and the feed turn piece 26 is preferably a motor. A linkage hole 31 is opened on the base plate 23, and the longitudinal threaded rod 25 is threadedly connected to the linkage hole 31; therefore, driving the feed turn piece 26 can drive the longitudinal threaded rod 25 to rotate, thereby driving the base plate 23 to move forward and backward.

[0045] The probe assembly 6 is driven to reach above the chip by flexibly driving the driving rotating member 531 1 and the driving rotating member 531 2 .

[0046] Reference Figure 3 and Figure 4 The positioning mechanism 5 includes a mounting seat 51, which is connected to the probe assembly 6 and can move synchronously with the probe assembly 6; the mounting seat 51 is connected to three swing rod assemblies 52, and each swing rod assembly 52 can swing relative to the mounting seat 51; three driving assemblies 53 are installed on the connecting seat 4, and the three driving assemblies 53 correspond to the three swing rod assemblies 52 one by one, and each driving assembly 53 is connected to the corresponding swing rod assembly 52. ​​The three driving assemblies 53 are evenly arranged around the probe assembly 6, the three driving assemblies 53 are at the same height and are located above the mounting seat 51, and the mounting seat 51 is suspended between the three driving assemblies 53 through three linkage swing rods 521.

[0047] Any driving assembly 53 working alone can drive the mounting seat 51 to tilt through the rocker assembly 52, thereby driving the probe assembly 6 to tilt. Multiple driving assemblies 53 working synchronously can drive the mounting seat 51 to move up and down, thereby driving the probe assembly 6 to move up and down.

[0048] Reference Figure 3 and Figure 4The three driving components 53 have the same structure. Take the structure of one of the driving components 53 as an example: the driving component 53 includes a driving member 531, which is preferably a motor. The driving member 531 is installed on the connecting seat 4, and the driving member 531 is connected to a vertically arranged screw rod 532. The driving member 531 can drive the screw rod 532 to rotate. The connecting seat 4 is provided with a guide column 533 arranged in the same direction as the screw rod 532. The guide column 533 is slidably connected with a guide fitting 534. The screw rod 532 is threadedly connected to the guide fitting 534. The driving member 531 is used to drive the screw rod 532 to rotate, thereby driving the guide fitting 534 to move vertically; the rocker assembly 52 is connected to the guide fitting 534. The three rocker arm assemblies 52 have the same structure. Take the structure of one of the rocker arm assemblies 52 as an example: the rocker arm assembly 52 includes two linked rocker arms 521, and each end of each linked rocker arm 521 is installed with a multi-axis hinge structure 522. Taking one linked rocker arm 521 as an example, one end of the linked rocker arm 521 is connected to the mounting seat 51 through its multi-axis hinge structure 522, and the other end of the linked rocker arm 521 is connected to the guide fitting 534 through another multi-axis hinge structure 522.

[0049] Reference Figure 4 and Figure 5 Specifically, the mounting seat 51 includes a column portion 511 connected to the probe assembly 6, and a connecting block portion 512 is provided on the side wall of the main body corresponding to each rocker assembly 52. ​​The multi-axis hinge structure 522 includes a rotating portion 5221, and the rotating portion 5221 is rotatably connected to the connecting block portion 512. The rotation axis of the rotating portion 5221 is perpendicular to the axis of the column portion 511. A mounting shaft 5222 is provided on the rotating portion 5221, and the axis of the mounting shaft 5222 is perpendicular to the column portion 511 and the axis of the mounting shaft 5222 is also perpendicular to the rotation axis of the rotating portion 5221; the linkage rocker 521 is rotatably connected to the mounting shaft 5222.

[0050] The present application can achieve the following actions: synchronously drive the three driving parts 531 to drive the three screw rods 532 to rotate, thereby driving the three guide matching parts 534 to move downward synchronously. At this time, driven by the three linkage rocker rods 521, the mounting seat 51 will move downward, and the probe assembly 6 will vertically contact the chip.

[0051] The present application can also realize the following actions: drive one of the driving rotating parts 531 alone, the driving rotating part 531 will drive one of the screw rods 532 to rotate, thereby driving one of the guide matching parts 534 to move downward, at this time, driven by one of the linkage swing rods 521, the mounting seat 51 will move along the arc trajectory, at this time, the probe assembly 6 will also move along the arc trajectory, the probe assembly 6 will tilt and its direction will change. It should be noted that the inclination of the probe assembly 6 will change based on the different positions reached by the movement of one of the guide matching parts 534.

[0052] In the present application, the inclination of the probe assembly 6 is precisely controlled by precisely controlling the driving member 531 so as to obtain multiple sets of values ​​for comparison when the probe assembly 6 contacts the chip.

[0053] Reference Figure 4 , Figure 6 and Figure 7 , Figure 6 is a schematic diagram of the trajectory of the probe assembly 6, Figure 7 yes Figure 6 In the projection diagram, in the present embodiment, the motion trajectory of the probe assembly 6 includes six arc trajectory lines, and the projection of the six arc trajectory lines in the vertical direction is the three diagonal lines of a regular hexagon, and the six arc trajectory lines all converge and connect at one point. In other embodiments, if the number of drive assemblies 53 and the number of swing rod assemblies 52 are different, the motion trajectory of the probe assembly 6 will include more arc trajectory lines, and if the positions of the drive assemblies 53 and the swing rod assemblies 52 are still different at this time, for example, multiple drive assemblies 53 are unevenly arranged around the probe assembly 6, then the projection of the motion trajectory of the probe assembly 6 in the vertical direction is no longer the diagonal lines of a regular hexagon, but the diagonal lines of a polygon of any shape.

[0054] Reference Figure 5 and Figure 8 The probe assembly 6 includes a connecting block 61 connected to the mounting seat 51, and a receiving groove 611 is opened on the connecting block 61. The receiving groove 611 is detachably installed with a carrier block 62. The material of the carrier block 62 is epoxy resin. The carrier block 62 is embedded with a probe 63. The carrier block 62 is formed by combining the probe 63 with epoxy resin in advance and curing it. In this way, the structure of the probe 63 is relatively stable, and the epoxy resin has good smoothness and corrosion resistance after curing.

[0055] Reference Figure 8 The carrier block 62 has a docking hole 1 621, and the connecting block 61 has a docking hole 2 612. The docking hole 1 621 and the docking hole 2 612 are connected to a locking member 64, which is preferably a countersunk screw. The locking member 64 can be removed to remove the carrier block 62 to replace the probe 63.

[0056] Reference Figure 8 The probe 63 includes a connecting needle segment 631 and an epitaxial needle segment 632 connected from the inside to the outside. The connecting needle segment 631 is buried in the carrier block 62. The angle between the connecting needle segment 631 and the epitaxial needle segment 632 is 90°-110°, and in this embodiment, the angle is 108°.

[0057] The implementation principle of an optical fiber needle card in the embodiment of the present application is:

[0058] The driving rotating parts 531 1 and 531 2 are flexibly driven to drive the probe assembly 6 to reach above the chip, and the three driving rotating parts 531 are synchronously driven to drive the three screw rods 532 to rotate, thereby driving the three guide matching parts 534 to move downward synchronously. At this time, driven by the three linked rocker rods 521, the mounting seat 51 will move downward, and the probe 63 will vertically contact the chip.

[0059] Drive one of the driving parts 531 separately, and the driving part 531 will drive one of the screw rods 532 to rotate, thereby driving one of the guide fittings 534 to move downward. At this time, driven by one of the linkage rocker rods 521, the mounting base 51 will move along an arc trajectory, and the probe 63 will also move along an arc trajectory. The probe 63 will tilt and its direction will change. Then, the driving parts 531 one and 531 two are flexibly driven to drive the probe assembly 6 to reach the top of the chip. Finally, the three driving parts 531 are synchronously driven to drive the three screw rods 532 to rotate, thereby driving the three guide fittings 534 to move downward synchronously so that the probe 63 is tilted and contacts the chip.

[0060] The embodiments of this specific implementation method are all preferred embodiments of the present invention, and are not intended to limit the protection scope of the present invention. Therefore, any equivalent changes made based on the structure, shape, and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. An optical fiber needle card, characterized in that: The invention comprises a substrate one (1), the substrate one (1) being provided with a transverse and longitudinal displacement mechanism (2), the transverse and longitudinal displacement mechanism (2) being connected to a substrate two (3), the substrate two (3) being provided with a connecting seat (4), the connecting seat (4) being provided with a positioning mechanism (5), the positioning mechanism (5) being connected to a probe assembly (6); The positioning mechanism (5) comprises: A mounting seat (51) connected to the probe assembly (6) and capable of moving synchronously with the probe assembly (6); A swing rod assembly (52) connected to the mounting seat (51) and capable of swinging, wherein a plurality of the swing rod assemblies (52) are provided; A driving assembly (53) is mounted on the connecting seat (4) and connected to the rocker assembly (52). A plurality of driving assemblies (53) are provided, and the plurality of driving assemblies (53) correspond to the plurality of rocker assemblies (52) one by one. Any of the driving assemblies (53) working alone can drive the mounting seat (51) to tilt through the rocker assembly (52), thereby driving the probe assembly (6) to tilt. The plurality of driving assemblies (53) working synchronously can drive the mounting seat (51) to move vertically, thereby driving the probe assembly (6) to move vertically.

2. The optical fiber needle card according to claim 1, characterized in that: The driving components (53) are provided in three numbers and each driving component (53) is mounted on the connecting seat (4). The three driving components (53) are evenly arranged around the probe component (6); and the rocker components (52) are also provided in three numbers accordingly.

3. The optical fiber needle card according to claim 2, characterized in that: The driving assembly (53) includes a driving member (531), the driving member (531) is installed on the connecting seat (4), the driving member (531) is connected to a vertically arranged screw rod (532), the connecting seat (4) is provided with a guide column (533) arranged in the same direction as the screw rod (532), the guide column (533) is slidably connected to a guide fitting member (534), the screw rod (532) is threadedly connected to the guide fitting member (534), the driving member (531) is used to drive the screw rod (532) to rotate, thereby driving the guide fitting member (534) to move vertically; the rocker assembly (52) is connected to the guide fitting member (534).

4. The optical fiber needle card according to claim 3, characterized in that: The rocker assembly (52) comprises a linkage rocker (521), each end of which is provided with a multi-axis hinge structure (522), one end of the linkage rocker (521) is connected to the mounting seat (51) via one multi-axis hinge structure (522), and the other end is connected to the guide fitting (534) via another multi-axis hinge structure (522).

5. The optical fiber needle card according to claim 2, characterized in that: The three driving assemblies (53) are located above the mounting seat (51), and the mounting seat (51) is suspended between the three driving assemblies (53) via three linkage swing rods (521).

6. The optical fiber needle card according to claim 5, characterized in that: The motion trajectory of the probe assembly (6) comprises at least six arc-shaped trajectory lines, and the projections of the six arc-shaped trajectory lines in the vertical direction present a pattern of three diagonal lines of a regular hexagon.

7. The optical fiber needle card according to claim 1, characterized in that: The transverse and longitudinal displacement mechanism (2) comprises a seat body (21) arranged on a base plate (1); a transverse threaded rod (22) is rotatably connected to the seat body (21); a first feed rotation member (23) connected to the transverse threaded rod (22) is installed on the seat body (21); a sliding block (24) is slidably connected to the base plate (1); the transverse threaded rod (22) is threadedly connected to the sliding block (24); a longitudinal threaded rod (25) is rotatably connected to the sliding block (24); a second feed rotation member (26) connected to the longitudinal threaded rod (25) is installed on the sliding block (24); a linkage hole (31) is opened on the base plate (3); the longitudinal threaded rod (25) is threadedly connected to the linkage hole (31).

8. The optical fiber needle card according to claim 1, characterized in that: The probe assembly (6) comprises a connection block (61) connected to a mounting seat (51), a receiving groove (611) being provided on the connection block (61), a carrier block (62) being detachably mounted in the receiving groove (611), and a probe (63) being embedded in the carrier block (62).

9. The optical fiber needle card according to claim 8, characterized in that: The carrier block (62) is provided with a docking hole 1 (621), the connection block (61) is provided with a docking hole 2 (612), and the docking hole 1 (621) and the docking hole 2 (612) are jointly connected with a locking member (64).

10. The optical fiber needle card according to claim 8, characterized in that: The probe (63) comprises a connecting needle segment (631) and an epitaxial needle segment (632) connected from the inside to the outside, the connecting needle segment (631) is buried in the carrier block (62), and the angle between the connecting needle segment (631) and the epitaxial needle segment (632) is 90°-110°.

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