A temperature control method and device, electronic equipment and storage medium

Abstract

The application provides a temperature control method and device, an electronic device and a storage medium. The method comprises: performing test calculation on a test temperature control system to obtain test control parameters under different test temperature control data; analyzing the test temperature control data and the test control parameters to determine a first regular relationship between the test temperature control data and the test control parameters; determining target control parameters corresponding to target temperature control data according to the first regular relationship and the target temperature control data required by a target temperature control system; and calculating a target control signal according to the target control parameters to adjust the target temperature control system based on the target control signal. The application is suitable for temperature regulation in a large temperature range, balances the control rate and temperature overshoot, improves the temperature control precision, and achieves the control target faster.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of temperature control, in particular to a temperature control method and device, electronic equipment and storage medium. BACKGROUND

[0002] PID algorithm is widely used in various industrial control systems such as temperature control, speed control, position control, etc. due to its simplicity, effectiveness and wide range of applications. For example, in temperature control, PID algorithm can adjust the power of heating or cooling equipment according to the error between the temperature value fed back by the temperature sensor and the set temperature value through proportional, integral and differential operations, so as to achieve the purpose of accurately controlling temperature.

[0003] In the process of high-precision control, high-precision control is realized by adjusting the control parameters of PID model, and it is often difficult to balance the relationship between overshoot and rate when the temperature setting changes greatly: with the same set of PID parameters and the same flow rate, the system shows temperature oscillation when the set temperature is in the high temperature zone, and the system shows slow adjustment speed when the set temperature is in the low temperature zone; similarly, at the same set temperature, the system shows slow adjustment speed at large flow rate, and the system shows temperature oscillation at low flow rate. Introducing more sensor variables is often limited by the use of field conditions, and also increases more system uncertainty. SUMMARY

[0004] Therefore, the purpose of the present application is to provide a temperature control method, device, electronic equipment and storage medium to overcome the problems in the prior art.

[0005] In a first aspect, the embodiments of the present application provide a temperature control method, which acts on a target temperature control system, and the target temperature control system realizes temperature control based on a PID algorithm. The method comprises the following steps:

[0006] Test calculation is performed on the test temperature control system to obtain test control parameters under different test temperature control data;

[0007] A first regular relationship between the test temperature control data and the test control parameters is determined by analyzing the test temperature control data and the test control parameters;

[0008] According to the first regular relationship and target temperature control data required by the target temperature control system, target control parameters corresponding to the target temperature control data are determined;

[0009] According to the target control parameters, a target control signal is calculated to adjust the target temperature control system based on the target control signal.

[0010] In some embodiments of the present application, the target temperature control system comprises a water pump and a compressor; the test temperature control data comprises test temperature data and test flow rate data;

[0011] The first regular relationship between the test temperature control data and the test control parameter is determined by analyzing the test temperature control data and the test control parameter.

[0012] The first regular relationship between the test control parameter and the test temperature data and the test flow rate data is determined by analyzing the test temperature data, the test flow rate data and the test control parameter.

[0013] In some embodiments of the present application, the first regular relationship between the test control parameter and the test temperature data and the test flow rate data is determined by analyzing the test temperature data, the test flow rate data and the test control parameter, comprising:

[0014] The second regular relationship between the test control parameter and the test temperature data is analyzed under the same test flow rate data.

[0015] The second regular relationship under each test flow rate data is sorted to obtain the first regular relationship.

[0016] In some embodiments of the present application, the target temperature control data comprises target temperature data and target flow rate data.

[0017] The target control parameter corresponding to the target temperature control data is determined according to the first regular relationship and the target temperature control data required by the target temperature control system.

[0018] The third regular relationship corresponding to the target flow rate data is selected from the second regular relationship.

[0019] The target control parameter corresponding to the target temperature data is determined by bringing the target temperature data into the third regular relationship.

[0020] In some embodiments of the present application, the test control parameter under different test temperature control data is obtained by testing and calculating the test temperature control system, comprising:

[0021] In the preset working mode, the sampling temperature curve of the test temperature control system is collected.

[0022] Based on the preset calculation method and the sampling temperature curve, the test control parameter under different test temperature control data is calculated.

[0023] In some embodiments of the present application, the target control parameter comprises a target proportional parameter, a target integral parameter and a target differential parameter.

[0024] The target control signal is calculated according to the target control parameter, and the target temperature control system is adjusted based on the target control signal.

[0025] The target control signal is calculated according to the target proportional parameter, the error, the target integral parameter and the error integral, and the target differential parameter and the change rate of the error, and the target temperature control system is adjusted based on the target control signal.

[0026] In some embodiments of the present application, the error integral is obtained by fine tuning, and the method obtains the error integral by the following method:

[0027] The error integral is adjusted based on the fine tuning term to obtain an adjusted error integral, wherein the fine tuning term is obtained according to the error and an adjustment coefficient.

[0028] In a second aspect, the embodiments of the present application provide a temperature control device for a target temperature control system, wherein the target temperature control system is based on a PID algorithm to realize temperature control, and the device comprises:

[0029] A test module is configured to perform test calculation on a test temperature control system to obtain test control parameters under different test temperature control data.

[0030] An analysis module is configured to determine a first regular relationship between the test temperature control data and the test control parameters by analyzing the test temperature control data and the test control parameters.

[0031] A determination module is configured to determine target control parameters corresponding to target temperature control data according to the first regular relationship and the target temperature control data required by the target temperature control system.

[0032] A calculation module is configured to calculate a target control signal according to the target control parameter, and adjust the target temperature control system based on the target control signal.

[0033] In a third aspect, the embodiments of the present application provide an electronic device, which comprises a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of the temperature control method.

[0034] In a fourth aspect, the embodiments of the present application provide a computer readable storage medium, which stores a computer program. When the computer program is run by a processor, the steps of the temperature control method described above are executed.

[0035] The technical solutions provided by the embodiments of the present application can have the following beneficial effects.

[0036] The method provided by the embodiments of the present application comprises the following steps: performing test calculation on a test temperature control system to obtain test control parameters under different test temperature control data; analyzing the test temperature control data and the test control parameters to determine a first regular relationship between the test temperature control data and the test control parameters; determining target control parameters corresponding to target temperature control data according to the first regular relationship and the target temperature control data required by the target temperature control system; and calculating target control signals according to the target control parameters, so as to adjust the target temperature control system based on the target control signals. The present application is suitable for temperature control in a large temperature range, and can achieve a balance between temperature control rate and temperature overshoot, improve temperature control precision, and achieve the control target more quickly.

[0037] In order to make the above objectives, characteristics and advantages of the present application more apparent and easy to understand, the following preferred embodiments are described in detail below, and the accompanying drawings are described as follows. BRIEF DESCRIPTION OF DRAWINGS

[0038] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings needed in the embodiments. It should be understood that the following drawings only show some embodiments of the present application, and therefore should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can also be obtained without creative labor.

[0039] Figure 1 A flowchart of a temperature control method provided by the embodiments of the present application is shown;

[0040] Figure 2 A temperature curve diagram provided by the embodiments of the present application is shown;

[0041] Figure 3 A device diagram of a temperature control device provided by the embodiments of the present application is shown;

[0042] Figure 4 A structure diagram of an electronic device provided by the embodiments of the present application is shown. DETAILED DESCRIPTION

[0043] In order to make the purposes, technical solutions, and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. It should be understood that the drawings in the present application serve only the purpose of description and illustration, and do not serve to limit the scope of protection of the present application. In addition, it should be understood that the schematic drawings are not drawn according to the actual proportions. The flowcharts used in the present application show the operations implemented according to some embodiments of the present application. It should be understood that the operations of the flowcharts can not be implemented in sequence, and the steps without logical context relationship can be reversed in sequence or implemented simultaneously. In addition, one or more other operations can be added to the flowcharts or one or more operations can be removed from the flowcharts under the guidance of the content of the present application.

[0044] In addition, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings herein can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the claimed present application, but only represents selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0045] It should be noted that the term "comprising" will be used in the embodiments of the present application to indicate the presence of the features declared thereafter, but does not exclude the addition of other features.

[0046] PID algorithm is widely used in various industrial control systems such as temperature control, speed control, and position control due to its simplicity, effectiveness, and wide range of applications. For example, in temperature control, PID algorithm can adjust the power of heating or cooling equipment according to the error between the temperature value fed back by the temperature sensor and the set temperature value through proportional, integral, and differential operations to achieve precise temperature control.

[0047] In processes requiring high-precision control, high-precision control is achieved by adjusting the control parameters of the PID model, and it is often difficult to balance the relationship between overshoot and rate when the temperature setting changes greatly: with the same set of PID parameters, at the same flow rate, the system exhibits temperature oscillation when the set temperature is in the high temperature zone, and the system exhibits slow adjustment speed when the set temperature is in the low temperature zone; similarly, at the same set temperature, the system exhibits slow adjustment speed at large flow rate, and the system exhibits temperature oscillation at low flow rate. Introducing more sensor variables often limits the use of field conditions and increases more system uncertainties.

[0048] Based on this, the embodiment of the application provides a temperature control method, device, electronic equipment and storage medium, which are described below through embodiments.

[0049] Figure 1 A flowchart of a temperature control method provided by the embodiment of the application is shown, which acts on a target temperature control system, and the target temperature control system realizes temperature control based on a PID algorithm. The method comprises steps S101-S104; specifically:

[0050] S101, test calculation is performed on a test temperature control system to obtain test control parameters under different test temperature control data;

[0051] S102, a first regular relationship between the test temperature control data and the test control parameters is determined by analyzing the test temperature control data and the test control parameters;

[0052] S103, a target control parameter corresponding to target temperature control data is determined according to the first regular relationship and the target temperature control data required to be reached by the target temperature control system;

[0053] S104, a target control signal is calculated according to the target control parameter, so as to adjust the target temperature control system based on the target control signal.

[0054] The application is applicable to temperature regulation in a larger temperature range, balances between temperature control rate and temperature overshoot, improves temperature control precision, and faster realizes control targets.

[0055] Some embodiments of the application are described in detail below. In the case of no conflict, the embodiments described below and the features in the embodiments can be combined with each other.

[0056] The embodiment of the application provides a temperature control method, which acts on a target temperature control system. The target temperature control system can be a liquid cooling system or a heating system. In actual target temperature control systems, a water pump and a compressor are generally included for temperature adjustment. The water pump controls the flow of liquid, and the compressor controls the temperature of the liquid, and temperature control is realized based on a PID algorithm. In order to control the temperature of the target temperature control system, the embodiment of the application needs to perform test calculation on a test temperature control system. The test temperature control system is determined according to the target temperature control system. That is, the model of the water pump and the compressor in the target temperature control system is included in the test temperature control system. In other words, the test temperature control system at least includes a water pump and a compressor of the same model as the target temperature control system. By testing the test temperature control system, a first regular relationship between test temperature control data in the test temperature control system and test control parameters is determined, and the target control parameter of the target temperature control system is determined through the first regular relationship.

[0057] For example, the first regular relationship can only include the rule of the test control parameter a1, and the target control parameter a'1 can directly use the first regular relationship. The first regular relationship can also include the rule of the test control parameter a1, the rule of the test control parameter a2, and the rule of the test control parameter a3. When the target control parameter a'1 uses the first regular relationship, the rule of the test control parameter a1 corresponding to the target control parameter a'1 is selected first, and then the rule of the test control parameter a1 is used.

[0058] When the test temperature control system is tested, the test temperature control data is further divided into test temperature data and test flow rate data because the test temperature control system includes a water pump and a compressor.

[0059] Further, the first regular relationship between the test temperature control data and the test control parameter in the above method is a first regular relationship of the test control parameter changing with the test temperature data and the test flow rate data. Specifically, when the first regular relationship is determined, the second regular relationship of the test control parameter changing with the test temperature data under the same test flow rate data is analyzed first, and then the second regular relationship under each test flow rate data is arranged to obtain the first regular relationship.

[0060] In specific implementation, the test temperature data and the test flow rate data obtained by the embodiment of the application are shown in Table 1 and Table 2:

[0061] Table 1

[0062] Temperature zone P I D Temperature zone P I D -20 P -20,5 ]]> I -20,5 ]] [00000D -20,5 ]] 40 P 40,5 ]]> I 40,5 ]] [00000D -20,5 ]] -10 P -10,5 ]]> I -10,5 ]] [00000D -10,5 ]]> 50 P 50,5 ]]> I 50,5 ]] <![CDATA[D 50,5 ]]> 0 P 0,5 ]]> I 0,5 ]] [002D 0,5 ]]> 60 P 60,5 ]]> I 60,5 ]] <![CDATA[D 60,5 ]]> 10 P 10,5 ]]> I 10,5 ]] D 10,5 ]]> 70 P 70,5 ]]> I 70,5 ]] <![CDATA[D 70,5 ]]> 20 P 20,5 ]]> I 20,5 ]] D 20,5 ]]> 80 P 80,5 ]]> I 80,5 ]] D 80,5 ]]> 30 P 30,5 ]]> I 30,5 ]] D 30,5 ]]> 90 P 90,5 ]]> I 90,5 ]] D 90,5 ]]>

[0063] Table 2

[0064] Temperature zone P I D Temperature zone P I D -20 P -20,30 ]]> I -20,30 ]] D -20,30 ]]> 40 P 40,30 ]]> I 40,30 ]] D -20,30 ]]> -10 P -10,30 ]]> I -10,30 ]] D -10,30 ]]> 50 P 50,30 ]]> I 50,30 ]] D 50,30 ]]> 0 P 0,30 ]]> I 0,30 ]] D 0,30 ]]> 60 P 60,30 ]]> I 60,30 ]] D 60,30 ]]> 10 P 10,30 ]]> I 10,30 ]] D 10,30 ]]> 70 P 70,30 ]]> I 70,30 ]] D 70,30 ]]> 20 P 20,30 ]]> I 20,30 ]] D 20,30 ]]> 80 P 80,30 ]]> I 80,30 ]] D 80,30 ]]> 30 P 30,30 ]]> I 30,30 ]] <![CDATA[D 30,30 ]]> 90 P 90,30 ]]> I 90,30 ]]

[00007] D 90,30 ]]

[0065] Table 1 represents the test control parameters at different temperatures when the flow rate is 5 L / min, and Table 2 represents the test control parameters at different temperatures when the flow rate is 30 L / min. The test control parameters include a test proportional parameter (P), a test integral parameter (I), and a test differential parameter (D).

[0066] It should be noted that the test control parameters at different temperatures in the embodiments of the present application are continuous, that is, the data between-20 and-10 in the above table has been determined, but in order to determine a more explicit regular relationship, the continuous data is divided in the embodiments of the present application. The specific division basis is the difference between the test control parameters at different temperatures and the preset difference threshold. By comparison, the embodiments of the present application select 10℃ as the interval to divide the continuous temperature. Then it is determined that the first regular relationship is a linear change relationship.

[0067] After the first regular relationship is determined, the target control parameter corresponding to the target temperature data is determined according to the first regular relationship and the target temperature data required by the target temperature control system.

[0068] Since the target temperature control data in the embodiments of the present application includes target temperature data and target flow rate data, the above process of determining the target control parameter can be converted into screening a third regular relationship corresponding to the target flow rate data from the second regular relationship; bringing the target temperature data into the third regular relationship to determine the target control parameter corresponding to the target temperature data.

[0069] For example, for the data in the above table 1 and table 2, when the target temperature data is-20℃ and the target flow rate data is 20L / min, the target control parameter is calculated as:

[0070] P parameter is calculated as follows:

[0071] P A =(P -20,30 -P -20,5 ) / (30-5);

[0072] P B =P -20，5 -I A *5;

[0073] P=P A *20L+P B ;

[0074] I parameter is calculated as follows:

[0075] I A =(I -20,30 -I -20,5 ) / (30-5);

[0076] I B =I -20，5 -I A *5;

[0077] I=I A*20L+I B ;

[0078] D parameter is calculated as follows:

[0079] D A =(D -20,30 -D -20,5 ) / (30-5);

[0080] D B =D -20，5 -D A *5;

[0081] D=D A *20L+D B .

[0082] After obtaining the target control parameter, a target control signal is calculated. According to the target proportional parameter and the error (Δerr), the target integral parameter and the error integral (err sum ), and the target differential parameter and the rate of change of the error, the target control signal is calculated.

[0083] Specifically, after calculating the PID parameter, PID calculation is performed, and the discretization formula is as follows:

[0084] OUT P =P*Δerr;

[0085]

[0086] When calculating the error integral, in order to realize the anti-integral saturation function, a variable integral method is adopted: based on a fine adjustment term, the error integral is adjusted to obtain an adjusted error integral; wherein the fine adjustment term is obtained according to the error and an adjustment coefficient.

[0087] Specifically, err sum =err sum +K*err;

[0088]

[0089] In an optional embodiment, when determining the test control parameter, in order to improve processing efficiency, the process of testing the test temperature control system is as follows: in a preset working mode, a sampling temperature curve of the test temperature control system is collected; based on a preset calculation method and the sampling temperature curve, the test control parameter under different test temperature control data is calculated.

[0090] The test temperature control system output is set to a switch mode, i.e. only 0% and 100% are outputted, when the sampling value is lower than the set value, the refrigeration system outputs 0%, then the system sampling temperature rises, when the sampling temperature exceeds the set value, the refrigeration system outputs 100%, then the system sampling temperature falls, and the cycle is repeated for several times, and a sampling temperature curve is obtained, as shown in Figure 2 .

[0091] According to the temperature curve, an oscillation period T u , an oscillation wave type amplitude A, and an output amplitude d can be obtained.

[0092] The critical gain K C can be obtained through the following formula.

[0093]

[0094] The PID parameters are determined according to the Ziegle-Nichols algorithm.

[0095] Through the method in the embodiments of the present application, the temperature control accuracy is improved: by setting the temperature and the set value of the set flow, the corresponding PID parameters are calculated through table lookup, which can well adapt to large temperature range changes and large flow changes, and quickly obtain appropriate PID parameters. The system stability is enhanced: through the integral saturation function of the integral, the system output is reduced in the case of large temperature change, and the stable time is shortened. The parameter adjustment convenience is improved: the parameter self-tuning function can provide great convenience for the debugging personnel, without much debugging experience, the system can automatically calculate the corresponding adaptive PID parameters, and the debugging personnel only needs to make fine adjustment.

[0096] Figure 3 A structure diagram of a temperature control device provided by an embodiment of the present application is shown, which acts on a target temperature control system, the target temperature control system realizes temperature control based on a PID algorithm, and the device comprises:

[0097] A test module is configured to perform test calculation on a test temperature control system to obtain test control parameters under different test temperature control data.

[0098] An analysis module is configured to determine a first regular relationship between the test temperature control data and the test control parameters by analyzing the test temperature control data and the test control parameters.

[0099] A determination module is configured to determine target control parameters corresponding to target temperature control data according to the first regular relationship and the target temperature control data required by the target temperature control system.

[0100] The computing module is configured to calculate a target control signal according to the target control parameter, and to adjust the target temperature control system based on the target control signal.

[0101] The target temperature control system comprises a water pump and a compressor; and the test temperature control data comprises test temperature data and test flow rate data.

[0102] The first regular relationship between the test temperature control data and the test control parameter is determined by analyzing the test temperature control data and the test control parameter.

[0103] The first regular relationship between the test control parameter and the test temperature data and the test flow rate data is determined by analyzing the test temperature data, the test flow rate data and the test control parameter.

[0104] The first regular relationship between the test control parameter and the test temperature data and the test flow rate data is determined by analyzing the test temperature data, the test flow rate data and the test control parameter.

[0105] A second regular relationship between the test control parameter and the test temperature data under the same test flow rate data is analyzed.

[0106] The second regular relationship under each test flow rate data is arranged to obtain the first regular relationship.

[0107] The target temperature control data comprises target temperature data and target flow rate data.

[0108] The target control parameter corresponding to the target temperature control data is determined according to the first regular relationship and the target temperature control data required by the target temperature control system.

[0109] A third regular relationship corresponding to the target flow rate data is selected from the second regular relationship.

[0110] The target control parameter corresponding to the target temperature data is determined by inputting the target temperature data into the third regular relationship.

[0111] The test control parameter under different test temperature control data is obtained by testing and calculating the test temperature control system.

[0112] In a preset working mode, a sampling temperature curve of the test temperature control system is collected.

[0113] The test control parameter under different test temperature control data is calculated based on a preset calculation method and the sampling temperature curve.

[0114] The target control parameters include a target proportional parameter, a target integral parameter and a target derivative parameter.

[0115] The target control parameters include a target proportional parameter, a target integral parameter and a target derivative parameter.

[0116] The target control parameters include a target proportional parameter, a target integral parameter and a target derivative parameter.

[0117] The error integral is obtained by fine tuning, and the error integral is obtained by the following method:

[0118] The error integral is adjusted based on a fine tuning term to obtain an adjusted error integral, wherein the fine tuning term is obtained according to the error and an adjustment coefficient.

[0119] As shown in Figure 4 The embodiments of the present application provide an electronic device for executing the temperature control method in the present application, the device comprising a memory, a processor, a bus, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of the temperature control method.

[0120] Specifically, the memory and the processor can be general memory and processor, which are not specifically limited herein, and when the processor runs the computer program stored in the memory, the temperature control method can be executed.

[0121] Corresponding to the temperature control method in the present application, the embodiments of the present application also provide a computer readable storage medium, and the computer readable storage medium stores a computer program, and the computer program is executed by the processor to execute the steps of the temperature control method.

[0122] Specifically, the storage medium can be a general storage medium, such as a mobile disk, a hard disk, etc., and the computer program on the storage medium can be executed to execute the temperature control method.

[0123] In the embodiments of the present application, it should be understood that the disclosed system and method can be implemented in other manners. The embodiments described above are merely exemplary, for example, the division of the units is only a logical function division, and there can be another division manner in actual implementation; for example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the displayed or discussed mutual couplings or direct couplings or communication connections can be indirect couplings or communication connections through some interfaces, and electrical, mechanical or other forms.

[0124] The units described as separate components can or can not be physically separate, and the components displayed as units can or can not be physical units, and can be located in one place, or can be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purposes of the embodiments.

[0125] In addition, each functional unit in the embodiments of the present application can be integrated in one processing unit, or each unit can exist physically, or two or more units can be integrated in one unit.

[0126] If the functions are implemented in the form of software function units and sold or used as independent products, they can be stored in a computer readable storage medium. Based on this understanding, the technical solutions of the present application essentially or the parts that make contributions to the prior art or parts of the technical solutions can be embodied in the form of a software product. The computer software product is stored in a storage medium, and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present application. The foregoing storage medium includes: U disk, mobile hard disk, read-only memory (ROM), random access memory (RAM), magnetic disk or optical disk, and various program codes that can be stored in the medium.

[0127] It should be noted that: similar reference numerals and letters in the following drawings represent similar items, and therefore, once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings. In addition, the terms "first", "second", "third" and the like are used only to distinguish descriptions, and cannot be understood as indicating or implying relative importance.

[0128] Finally, it should be noted that the above-described embodiments are merely specific embodiments of the present application, which are used to illustrate the technical solutions of the present application, but not to limit the same. The protection scope of the present application is not limited thereto. Although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that any skilled person in the art can still modify or easily think of changes to the technical solutions recorded in the foregoing embodiments, or make equivalent replacements to some of the technical features, within the technical scope disclosed by the present application. The modifications, changes or replacements do not make the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application. All should be covered within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A method of temperature control, characterized by, The method is applied to a target temperature control system, the target temperature control system implements temperature control based on a PID algorithm, and the target temperature control system comprises a water pump and a compressor; the method comprises the following steps: test calculation is performed on a test temperature control system to obtain test control parameters under different test temperature control data; a second regular relationship is analyzed, in which the test control parameters change with test temperature data under the same test flow rate data; the second regular relationship under each test flow rate data is sorted to obtain a first regular relationship; a third regular relationship corresponding to target flow rate data is screened from the second regular relationship; target temperature data is brought into the third regular relationship to determine target control parameters corresponding to the target temperature data; the target control parameters comprise target proportional parameters, target integral parameters, and target differential parameters; a target control signal is calculated according to the target control parameters, and the target temperature control system is adjusted based on the target control signal.

2. The method of claim 1, wherein, The test calculation on the test temperature control system to obtain the test control parameters under the different test temperature control data comprises the following steps: a sampling temperature curve of the test temperature control system is collected in a preset working mode; test control parameters under different test temperature control data are calculated based on a preset calculation method and the sampling temperature curve.

3. The method of claim 1, wherein the target control signal is calculated according to the target control parameters, and the target temperature control system is adjusted based on the target control signal, comprising: the target control signal is calculated according to the target proportional parameters and an error, the target integral parameters and an error integral, and the target differential parameters and a change rate of the error, and the target temperature control system is adjusted based on the target control signal. The error integral is obtained through fine adjustment, and the method obtains the error integral in the following manner:

4. The method of claim 3, wherein, the error integral is adjusted based on a fine adjustment term to obtain an adjusted error integral; wherein the fine adjustment term is obtained according to the error and an adjustment coefficient. The method is applied to a target temperature control system, the target temperature control system implements temperature control based on a PID algorithm, and the target temperature control system comprises a water pump and a compressor; the device comprises:

5. A temperature controlled device, characterized by a test module configured to perform test calculation on a test temperature control system to obtain test control parameters under different test temperature control data; an analysis module configured to analyze a second regular relationship in which test control parameters change with test temperature data under the same test flow rate data, and sort the second regular relationship under each test flow rate data to obtain a first regular relationship; a determination module configured to screen a third regular relationship corresponding to target flow rate data from the second regular relationship, and bring target temperature data into the third regular relationship to determine target control parameters corresponding to the target temperature data; the target control parameters comprise target proportional parameters, target integral parameters, and target differential parameters; a calculation module configured to calculate a target control signal according to the target control parameters, and adjust the target temperature control system based on the target control signal. ​ 6. An electronic device, comprising: ​ A processor, a memory storing machine readable instructions executable by the processor, and a bus for communication between the processor and the memory when the electronic device is running, the machine readable instructions, when executed by the processor, performing the steps of the method of temperature control of any one of claims 1 to 4.

7. A computer readable storage medium characterized in that, A computer readable storage medium storing a computer program, the computer program, when executed by a processor, performing the steps of the method of temperature control of any one of claims 1 to 4.

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