Test system execution method, device, equipment, system and storage medium

By turning on the in-position detection function of the PCIe switch in the automated test system, turning off the hot-swap interrupt function, and using the microcontroller unit to report the status information of the board and optical module, the system's differentiation in the implementation of PCIe resource pre-allocation and hot-swap of the board is solved, and the violent hot-swap of the board and the hot-restart of the test machine is realized, and the system's fault recovery ability and scalability are improved.

CN119718810APending Publication Date: 2025-03-28BEIJING HUAFENG TEST & CONTROL TECH CO LTD
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Patent Information

Application Number
CN202311255088.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2023-09-26
Publication Date
2025-03-28

AI Technical Summary

Technical Problem

There are differences in existing automated test systems in PCIe resource pre-allocation and board hot-swap implementations between the host and the test head, resulting in insufficient system failure recovery capabilities, scalability and flexibility.

Method used

The computer operating system enables the in-place detection function of the downstream port of the PCIe switch, turns off the hot-swap interrupt function, and polls the status information of the test board and optical module using the microcontroller unit, and reports it to the computer operating system to control the hot-swap service operation of the automated test system.

Benefits of technology

It realizes violent hot plugging of boards and hot restart of test machines in automated test systems, improves the system's timely recovery ability for faults, and enhances the scalability and flexibility of the test system.

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Abstract

The invention discloses a test system execution method, device, equipment and system and a storage medium, and the method comprises the steps: starting an in-place detection function of a downstream port of a PCIe exchanger through a computer operation system, and closing a hot plug interruption function of the downstream port of the PCIe exchanger; polling the state information of each test board card and / or optical module through a micro-control unit, and reporting the state information to a computer operating system after detecting that the state information is changed; and controlling the operation of the hot plug service in the automatic test system according to the state information through a computer operating system. According to the technical scheme, hot plug of the test system board card and hot restart of the test machine can be achieved, the timely fault recovery capability of the automatic test system is guaranteed, and the expansibility and flexibility of the test system are improved.
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