Verification method and device for quantum state control signal distortion

Abstract

The invention discloses a verification method and device for quantum state control signal distortion, and the method comprises the steps: carrying out the segmentation processing of a processed first gray-scale image or a first black-and-white image, and obtaining a mirror image of a second sub-image; whether the quantum state control signal of the to-be-measured sub-bit is distorted or not can be directly judged according to a similarity comparison result of the first sub-image and the mirror image. Moreover, the working frequency of the quantum bit is continuously traversed, and the distortion condition of the quantum state control signal of the to-be-measured sub-bit under the corresponding working frequency is obtained, so that the proper working point range of the to-be-measured sub-bit is determined.

Description

Technical Field

[0001] The present invention relates to the field of quantum computing technology, and in particular to a method and device for verifying quantum state control signal distortion. Background Art

[0002] Quantum computers are physical devices that follow the laws of quantum mechanics to perform high-speed mathematical and logical operations, store and process quantum information. The main characteristics of quantum computers are fast operation speed, strong information processing capabilities, and a wide range of applications. Compared with ordinary computers, the more information is processed, the more advantageous it is for quantum computers to perform operations, and the more accurate the operations can be.

[0003] Quantum chips are to quantum computers what CPUs are to traditional computers. Quantum chips are the core components of quantum computers. With the continuous advancement of research on quantum computing-related technologies, the number of quantum bits on quantum chips is also increasing year by year. It is foreseeable that larger-scale quantum chips will appear in the future, and the number of quantum bits in quantum chips will be greater, and quantum computers will also be equipped with larger-scale quantum chips.

[0004] The signal on the quantum state control line is used to control the quantum state of the qubit. Generally speaking, most of the signals of single-qubit gates are transmitted to the qubit through the quantum state control line. The quantum state control line is usually equipped with components such as attenuators. The existence of these components makes the quantum state control line not an ideal line. Therefore, when the voltage waveform output from the AWG (Arbitrary Waveform Generator) reaches the qubit, waveform distortion occurs. Waveform distortion refers to the distortion of the voltage waveform at t 0 At time t, a waveform with an amplitude of A and a duration of T is applied to the quantum state control line. 0 The waveform ends at +T, but there is still voltage on the quantum state control line for a period of time afterwards. This voltage is the distorted waveform. When the quantum circuit is in execution, if a waveform needs to be applied to the quantum state control line first and then, the waveform distortion of the previous waveform will affect the next waveform, causing errors in the final execution result of the quantum circuit.

[0005] Therefore, it is necessary to propose a solution that can verify whether the quantum state control signal of the quantum bit is distorted.

[0006] It should be noted that the information disclosed in the background technology section of this application is only intended to deepen the understanding of the general background technology of this application, and should not be regarded as an admission or suggestion in any form that the information constitutes prior art already known to those skilled in the art. Summary of the invention

[0007] The purpose of the present invention is to provide a method and device for verifying the distortion of a quantum state control signal, so as to solve the problem in the prior art that there is a lack of a method for verifying whether a quantum state control signal of a quantum bit is distorted.

[0008] In order to solve the above technical problems, the present invention proposes a verification method for quantum state control signal distortion, comprising:

[0009] Obtaining an experimental result view of a first experiment, wherein the first experiment is used to obtain a change in the probability of a subbit to be measured being in a first selected eigenstate as a function of a detuning magnitude and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal;

[0010] Performing image processing on the experimental result view to output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white;

[0011] Divide the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along a center line, and obtain a mirror image of the second sub-image;

[0012] The first sub-image is compared with the mirror image for similarity, and when the result of the similarity comparison reaches a preset value, it is determined that the quantum state control signal of the sub-bit to be measured is not distorted.

[0013] Optionally, before performing image processing on the experimental result view, the method further includes:

[0014] The experimental result view is cropped to remove useless information.

[0015] Optionally, before performing the step of dividing the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along a center line, the method further includes:

[0016] Determining whether adhesion occurs between connected domains of the first grayscale image or the first black-and-white image;

[0017] If yes, it is determined that the quantum state control signal of the subbit to be measured has been distorted;

[0018] If not, the step of dividing the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along the center line is performed.

[0019] Optionally, whether adhesion occurs between the connected domains of the first grayscale image or the first black-and-white image is determined based on the ratio between the span of the first connected domain and the span of the second connected domain, wherein the span is the maximum length of the connected domain of the first grayscale image or the first black-and-white image on the Y-axis, the first connected domain is the connected domain with the largest span in the first grayscale image or the first black-and-white image, and the second connected domain is the connected domain with the smallest span in the first grayscale image or the first black-and-white image.

[0020] Optionally, when the ratio of the spans of the first connected domain to the second connected domain exceeds a first preset threshold, it is determined that adhesion occurs between the connected domains of the first grayscale image or the first black-and-white image.

[0021] Optionally, comparing the first sub-image with the mirror image for similarity includes:

[0022] A structural similarity algorithm is used to compare the similarity between the first sub-graph and the mirror image.

[0023] Based on the same inventive concept, the present invention also proposes a verification device for quantum state control signal distortion, comprising:

[0024] an experiment result view acquisition unit, configured to acquire an experiment result view of a first experiment, wherein the first experiment is configured to acquire a probability that a subbit to be measured is in a first selected eigenstate as a function of a detuning magnitude and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal;

[0025] An image processing unit, configured to perform image processing on the experimental result view and output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white;

[0026] An image segmentation unit, used for segmenting the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along a center line position, and obtaining a mirror image of the second sub-image;

[0027] The similarity comparison unit is used to compare the first sub-image with the mirror image for similarity, and when the result of the similarity comparison reaches a preset value, determine that the quantum state control signal of the sub-bit to be measured is not distorted.

[0028] Based on the same inventive concept, the present invention also proposes a method for obtaining a quantum bit working point, comprising:

[0029] Traversing the operating frequency of the subbit to be measured within a first range, obtaining an experimental result view of a first experiment, wherein the first experiment is used to obtain a change in the probability of the subbit to be measured being in a first selected eigenstate as a function of a detuning size and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal;

[0030] Performing image processing on the experimental result view to output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white;

[0031] Divide the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along a center line, and obtain a mirror image of the second sub-image;

[0032] The first sub-image is compared with the mirror image for similarity, and all operating frequencies of the sub-bits to be measured corresponding to when the result of the similarity comparison reaches a preset value are obtained as optional operating points.

[0033] Based on the same inventive concept, the present invention also proposes a quantum computing measurement and control system, which utilizes the verification method of quantum state control signal distortion described in any one of the above-mentioned characteristic descriptions or the method for obtaining the quantum bit working point described in the above-mentioned characteristic descriptions.

[0034] Based on the same inventive concept, the present invention also proposes a quantum computer, including the quantum computing measurement and control system described in the above feature description.

[0035] Based on the same inventive concept, the present invention also proposes a readable storage medium on which a computer program is stored. When the computer program is executed by a processor, it can implement the method for verifying the distortion of the quantum state control signal described in any one of the above-mentioned characteristic descriptions or the method for obtaining the quantum bit working point described in the above-mentioned characteristic descriptions.

[0036] Compared with the prior art, the present invention has the following beneficial effects:

[0037] The verification method of quantum state control signal distortion proposed by the present invention obtains the experimental result view of the first experiment, performs image processing on the experimental result view, and outputs a first grayscale image or a first black-and-white image. The first grayscale image or the first black-and-white image is divided into a first sub-image and a second sub-image along the center line position, and a mirror image of the second sub-image is obtained. The first sub-image and the mirror image are compared for similarity, and when the result of the similarity comparison reaches a preset value, it is determined that the quantum state control signal of the sub-bit to be measured is not distorted. The scheme of the present invention divides the processed first grayscale image or the first black-and-white image, obtains the mirror image of the second sub-image, and uses the similarity comparison result between the first sub-image and the mirror image to directly determine whether the quantum state control signal of the sub-bit to be measured is distorted. In addition, the working frequency of the quantum bit can be continuously traversed, and the distortion of the quantum state control signal of the sub-bit to be measured under the corresponding working frequency can be obtained, so as to determine the appropriate working point range of the sub-bit to be measured.

[0038] The device for verifying the distortion of the quantum state control signal, the method for acquiring the working point of the quantum bit, the quantum computing measurement and control system, the quantum computer and the readable storage medium proposed in the present invention belong to the same inventive concept as the method for verifying the distortion of the quantum state control signal, and therefore have the same beneficial effects, and will not be elaborated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 A schematic flow chart of a method for verifying quantum state control signal distortion proposed in an embodiment of the present invention;

[0040] Figure 2 is an experimental result view of the first experiment in an example;

[0041] Figure 3 A first grayscale image of the experimental result view of the first experiment in an example after grayscale processing;

[0042] Figure 4 For Figure 3 The first sub-image after segmentation processing;

[0043] Figure 5 For Figure 3 The second sub-image after segmentation processing;

[0044] Figure 6 for Figure 5 The mirror image of the second sub-image after mirroring;

[0045] Figure 7 A first grayscale image output after image processing is performed on the experimental result view of the first experiment in another example;

[0046] Figure 8A schematic structural diagram of a verification device for quantum state control signal distortion proposed in another embodiment of the present invention;

[0047] Fig. 9 A schematic flow chart of a method for acquiring a quantum bit working point according to another embodiment of the present invention. DETAILED DESCRIPTION

[0048] The specific implementation of the present invention will be described in more detail below in conjunction with the schematic diagram. The advantages and features of the present invention will become clearer from the following description and claims. It should be noted that the drawings are all in a very simplified form and are not in exact proportions, and are only used to facilitate and clearly assist in explaining the purpose of the embodiments of the present invention.

[0049] In the description of the present invention, it is necessary to understand that the terms "center", "up", "down", "left", "right", etc. indicate directions or positional relationships based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as a limitation on the present invention.

[0050] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0051] Please refer to Figure 1 , an embodiment of the present invention provides a verification method for quantum state control signal distortion, comprising:

[0052] S100: Acquire an experimental result view of a first experiment, wherein the first experiment is used to obtain a probability that a subbit to be measured is in a first selected eigenstate as a function of a detuning magnitude and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal;

[0053] S200: performing image processing on the experimental result view to output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white;

[0054] S300: dividing the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along a center line, and obtaining a mirror image of the second sub-image;

[0055] S400: performing a similarity comparison between the first sub-graph and the mirror image, and when a result of the similarity comparison reaches a preset value, determining that the quantum state control signal of the sub-bit to be measured is not distorted.

[0056] The difference from the prior art is that the verification method of quantum state control signal distortion proposed in the embodiment of the present invention obtains the experimental result view of the first experiment, performs image processing on the experimental result view, and outputs a first grayscale image or a first black-and-white image. The first grayscale image or the first black-and-white image is divided into a first sub-image and a second sub-image along the center line position, and a mirror image of the second sub-image is obtained. The first sub-image and the mirror image are compared for similarity, and when the result of the similarity comparison reaches a preset value, it is determined that the quantum state control signal of the sub-bit to be measured is not distorted. The solution of the present invention divides the processed first grayscale image or the first black-and-white image, obtains the mirror image of the second sub-image, and uses the similarity comparison result between the second sub-image and the mirror image to directly determine whether the quantum state control signal of the sub-bit to be measured is distorted. In addition, the appropriate working point range of the sub-bit to be measured can be determined by continuously traversing the working frequency of the quantum bit and obtaining the distortion of the quantum state control signal of the sub-bit to be measured at the corresponding working frequency. In addition, in this embodiment, the first selected eigenstate can be a |0> state or a |1> state. The X-gate signal is a single quantum bit gate, which is used to excite the quantum bit from the ground state to the excited state.

[0057] It should be noted that the first experiment mentioned in this embodiment refers to traversing the detuning size of the quantum state control signal within a set range, and a Rabi experiment is performed on the sub-bit to be measured at each detuning. It can be understood by those skilled in the art that the Rabi experiment refers to applying a quantum state control signal of duration t to the quantum state control line of the sub-bit to be measured, applying a frequency control signal to the frequency control line of the sub-bit to be measured, obtaining the probability of the sub-bit to be measured being in an excited state or a ground state as a function of time t, and finally summarizing the experimental results of all Rabi experiments to obtain the experimental result view of the first experiment, please refer to Figure 2 , Figure 2 is an experimental result view of the first experiment in an example, the experimental result view is a three-dimensional graph, Figure 2 The depth information in represents the probability of the measured subbit being in the first selected eigenstate, the horizontal axis is the size of the detuning, and the vertical axis is time. In an ideal case, that is, if the quantum state control signal of the subbit to be measured is not distorted, the experimental result view is a left-right symmetrical image along the center line. If the quantum state control signal of the subbit to be measured is distorted, the experimental result view will be deformed to a level that is not left-right symmetrical along the center line.

[0058] The solution of the present application utilizes this feature of the experimental result view. In order to realize the automatic identification of the distortion of the quantum state control signal of the sub-bit to be measured, the present application proposes to process the experimental result view and output a first black-and-white image or a first grayscale image, and then divide the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along the center line, and obtain a mirror image of the second sub-image. The first sub-image is compared with the mirror image for similarity, and it is determined whether the quantum state control signal of the sub-bit to be measured is distorted based on the result of the similarity comparison. Please refer to Figures 3 to 5 , Figure 3 is a first grayscale image after grayscale processing of the experimental result view of the first experiment in an example, Figure 4 is the first sub-image after segmentation, Figure 5 is the second sub-image after segmentation, Figure 6 is the mirror image of the second sub-image after mirroring. Figure 4 The first subgraph and Figure 6 By comparing the similarity of the mirror image, it can be directly determined whether the quantum state control signal of the quantum bit to be measured is distorted.

[0059] It should be noted that, in this embodiment, the first sub-image and the second sub-image do not specifically refer to the image located at the left part and the image located at the right part before the segmentation process, but are only used to distinguish that the first sub-image and the second sub-image are two different parts. Figure 3 For example, in this embodiment, the first sub-graph is Figure 4 , the second subgraph is Figure 5 In other embodiments, the first subgraph may be Figure 5 , correspondingly, the second subgraph can be Figure 4 , no restriction is made here.

[0060] In addition to the scheme proposed in this application, the first grayscale image can be compared with the first image for similarity, and it can also be directly judged whether the quantum state control signal of the sub-bit to be measured is distorted. The first image here refers to the result view of the experimental result of the first experiment that meets the preset requirements, that is, the experimental result view under ideal conditions. It can be understood by those skilled in the art that since the experimental result views finally obtained by different quantum bits and quantum state control signals of different frequencies are definitely different, it is necessary to prepare in advance a plurality of result views reflecting that the experimental results of the first experiment meet the preset requirements, that is, the number of the first images to be prepared is multiple, as long as the similarity between the experimental result view of the first experiment and any one of the multiple first images meets the requirements, it can be considered that the quantum state control signal has no distortion. Since it is necessary to compare the similarity with multiple standard images, the efficiency of this scheme is generally low, while the scheme of this application only needs to compare the similarity with its own mirror image to directly judge whether the quantum state control signal of the sub-bit to be measured is distorted, which effectively improves the overall efficiency of the scheme.

[0061] It should be noted that, in this embodiment, the experimental result view can be gray-scale processed to output a first gray-scale image composed of multiple pixels with different gray-scale values, and the experimental result view can be binarized to output a first black-and-white image composed of black pixels and white pixels. When gray-scale processing is performed, we select pixels whose gray-scale values ​​after gray-scale processing are less than the set gray-scale value and set them to 0 (that is, set them to black), which means that the excitation probability corresponding to the pixel point is low. Pixels with gray-scale values ​​greater than the set gray-scale value retain the original gray-scale, which means that the excitation probability of the pixel point is high.

[0062] In practical application, the experimental results are considered Figure 2 When the value is converted to black and white, the connected domain may be stuck. Figure 6 , this situation can be identified manually, and we can also add an identification method to the solution, so that if the adhesion situation can be directly eliminated at the beginning of the solution, the efficiency of the entire solution can also be improved, by judging whether the connected domains of the first grayscale image or the first black-and-white image are adhered; that is, before executing the method of dividing the first grayscale image or the first black-and-white image into the first sub-image and the second sub-image along the center line position, the method also includes:

[0063] Determining whether adhesion occurs between connected domains of the first grayscale image or the first black-and-white image;

[0064] If adhesion occurs, it is determined that the quantum state control signal of the subbit to be measured has been distorted. It can be understood that when it is determined that the connected domain has adhesion, it is not necessary to continue the similarity comparison operation;

[0065] If no adhesion occurs, continue to execute the step of dividing the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along the center line position.

[0066] It should be noted that a connected domain is a set of pixels consisting of adjacent pixels with the same pixel value. We can use this condition to find the connected domain of an image in an image. For each connected domain found, we give it a unique identifier to distinguish it from other connected domains. For details, please refer to Figure 7 The connected domain 1, the connected domain 2 and the connected domain 3 in the image. Those skilled in the art can understand that the connected domain in the image can generally be obtained by two-pass scanning or seed filling method, which will not be elaborated here.

[0067] Specifically, in this embodiment, whether the connected domains of the first grayscale image are connected can be determined based on the ratio of the spans of the first connected domain to the second connected domain, wherein the span is the maximum length of the connected domain of the first grayscale image on the Y axis (vertical direction of the image), the first connected domain is the connected domain with the largest span in the first grayscale image, and the second connected domain is the connected domain with the smallest span in the first grayscale image. The first connected domain is Figure 7 The connected domain 1 in the second connected domain is Figure 7 On the other hand, in practical applications, considering that some interference with a smaller span may be identified as a connected domain, the second connected domain may be defined as the connected domain with the second smallest span in the first grayscale image, that is, Figure 7 The connected domain 2 in .

[0068] Specifically, in this embodiment, when the ratio of the span between the first connected domain and the second connected domain exceeds a first preset threshold, it is determined that adhesion occurs between the connected domains of the first grayscale image or the first black-and-white image.

[0069] Specifically, in this embodiment, comparing the first sub-image with the mirror image for similarity includes:

[0070] A structural similarity algorithm is used to compare the similarity between the first sub-graph and the mirror image.

[0071] It can be understood by those skilled in the art that the structural similarity (SSIM, Structure Similarity IndexMeasure) is an index for measuring the similarity between two images. The structural similarity algorithm inputs two pictures, i.e., two pictures requiring structural similarity, one of which is an uncompressed distortion-free image, and the other is a picture that needs to be compared with the distortion-free picture. The SSIM index mainly extracts three key features from the image: brightness, contrast, and structure. The comparison between the two images is based on these three features. We process the original experimental result view to output the first black and white image, which can reduce the operating cost of the algorithm to a certain extent and improve the computational efficiency. The range of the SSIM value is [0,1]. In this embodiment, the result of the similarity comparison can be considered as the SSIM value. In this embodiment, the preset value can be set to 0.6. It should be noted that in other embodiments, the preset threshold can be adjusted according to actual needs. For example, for scenes with higher accuracy requirements, the preset value can be set to 0.8 or 0.9. For scenes with lower accuracy requirements, the preset value can be set to 0.5. They are not described one by one here.

[0072] In this embodiment, in order to further improve the execution efficiency of the structural similarity algorithm when performing similarity judgment, before performing image processing on the experimental result view, the experimental result view can be cropped to remove useless information. The useless information mentioned here can be several interfering pixels on the periphery of the image. Generally, this situation is caused by interference from external factors. After cropping, these interfering pixels can be avoided from interfering with the structural similarity algorithm, thereby avoiding misjudgment.

[0073] Based on the same invention concept, please refer to Figure 8 The embodiment of the present invention further provides a verification device for quantum state control signal distortion, comprising:

[0074] An experiment result view acquisition unit 100 is used to acquire an experiment result view of a first experiment, wherein the first experiment is used to acquire a probability that a subbit to be measured is in a first selected eigenstate as a function of a detuning magnitude and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal;

[0075] An image processing unit 200 is used to perform image processing on the experimental result view and output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white;

[0076] An image segmentation unit 300 is used to segment the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along a center line position, and obtain a mirror image of the second sub-image;

[0077] The similarity comparison unit 400 is used to compare the first sub-image with the mirror image for similarity, and when the result of the similarity comparison reaches a preset value, determine that the quantum state control signal of the sub-bit to be measured is not distorted.

[0078] It can be understood that the experimental result view acquisition unit 100, the image processing unit 200, the image segmentation unit 300 and the similarity comparison unit 400 can be combined in one device, or any one of the modules can be split into multiple sub-modules, or at least part of the functions of one or more modules of the experimental result view acquisition unit 100, the image processing unit 200, the image segmentation unit 300 and the similarity comparison unit 400 can be combined with at least part of the functions of other modules and implemented in one functional module. According to an embodiment of the present invention, at least one of the experimental result view acquisition unit 100, the image processing unit 200, the image segmentation unit 300 and the similarity comparison unit 400 can be at least partially implemented as a hardware circuit, such as a field programmable gate array (FPGA), a programmable logic array (PLA), a system on a chip, a system on a substrate, a system on a package, an application specific integrated circuit (ASIC), or can be implemented in hardware or firmware in any other reasonable way of integrating or packaging the circuit, or in a suitable combination of software, hardware and firmware. Alternatively, at least one of the experiment result view acquisition unit 100, the image processing unit 200, the image segmentation unit 300 and the similarity comparison unit 400 may be at least partially implemented as a computer program module, and when the program is executed by a computer, the function of the corresponding module may be executed.

[0079] Based on the same invention concept, please refer to Fig. 9 The embodiment of the present invention further provides a method for obtaining a quantum bit working point, comprising:

[0080] S10: traversing the working frequency of the subbit to be measured within a first range, and obtaining an experimental result view of a first experiment, wherein the first experiment is used to obtain the variation of the probability of the subbit to be measured being in a first selected eigenstate with the detuning size and time, wherein the detuning is the frequency difference between the quantum state control signal applied to the subbit to be measured and the X-gate signal;

[0081] S20: performing image processing on the experimental result view to output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white;

[0082] S30: dividing the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along a center line, and obtaining a mirror image of the second sub-image;

[0083] S40: performing a similarity comparison between the first sub-image and the mirror image, and obtaining all operating frequencies of the sub-bits to be measured corresponding to when the result of the similarity comparison reaches a preset value as optional operating points.

[0084] Based on the same inventive concept, an embodiment of the present invention also proposes a quantum computing measurement and control system, which uses the verification method of quantum state control signal distortion described in any one of the above-mentioned characteristic descriptions or the method for obtaining the quantum bit working point described in the above-mentioned characteristic descriptions.

[0085] Based on the same inventive concept, an embodiment of the present invention also proposes a quantum computer, including the quantum computing measurement and control system described in the above feature description.

[0086] Based on the same inventive concept, an embodiment of the present invention also proposes a readable storage medium on which a computer program is stored. When the computer program is executed by a processor, it can implement the method for verifying the distortion of the quantum state control signal described in any one of the above-mentioned characteristic descriptions or the method for obtaining the quantum bit working point described in the above-mentioned characteristic descriptions.

[0087] The readable storage medium can be a tangible device that can keep and store the instructions used by the instruction execution device, such as but not limited to an electrical storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device or any suitable combination of the above. The more specific example (non-exhaustive list) of the readable storage medium includes: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a static random access memory (SRAM), a portable compact disk read-only memory (CD-ROM), a digital versatile disk (DVD), a memory stick, a floppy disk, a mechanical encoding device, such as a punch card or a convex structure in a groove on which instructions are stored, and any suitable combination of the above. The computer program described here can be downloaded from the readable storage medium to each computing / processing device, or downloaded to an external computer or external storage device through a network, such as the Internet, a local area network, a wide area network and / or a wireless network. The network can include copper transmission cables, optical fiber transmission, wireless transmission, routers, firewalls, switches, gateway computers and / or edge servers. The network adapter card or network interface in each computing / processing device receives the computer program from the network and forwards the computer program for storage in a readable storage medium in each computing / processing device. The computer program for performing the operation of the present invention may be an assembly instruction, an instruction set architecture (ISA) instruction, a machine instruction, a machine-dependent instruction, a microcode, a firmware instruction, a state setting data, or a source code or object code written in any combination of one or more programming languages, including object-oriented programming languages ​​such as Smalltalk, C++, etc., and conventional procedural programming languages ​​such as "C" language or similar programming languages. The computer program may be executed entirely on the user's computer, partially on the user's computer, as an independent software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (e.g., using an Internet service provider to connect through the Internet). In some embodiments, by utilizing the state information of a computer program to personalize an electronic circuit, such as a programmable logic circuit, a field programmable gate array (FPGA), or a programmable logic array (PLA), the electronic circuit can execute computer-readable program instructions to implement various aspects of the present invention.

[0088] Here, various aspects of the present invention are described with reference to the flowchart and / or block diagram of the method, system and computer program product according to the embodiment of the present invention. It should be understood that each square frame of the flowchart and / or block diagram and the combination of the square frames in the flowchart and / or block diagram can be realized by a computer program. These computer programs can be provided to the processor of a general-purpose computer, a special-purpose computer or other programmable data processing device, so as to produce a machine, so that these programs, when executed by the processor of a computer or other programmable data processing device, produce a device for realizing the function / action specified in one or more square frames in the flowchart and / or block diagram. These computer programs can also be stored in a readable storage medium, and these computer programs make the computer, programmable data processing device and / or other equipment work in a specific way, so that the readable storage medium storing the computer program includes a manufactured product, which includes instructions for realizing various aspects of the function / action specified in one or more square frames in the flowchart and / or block diagram.

[0089] The computer program may also be loaded onto a computer, other programmable data processing apparatus, or other device so that a series of operational steps are executed on the computer, other programmable data processing apparatus, or other device to produce a computer-implemented process, thereby causing the computer program executed on the computer, other programmable data processing apparatus, or other device to implement the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0090] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example" or "specific example" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments in a suitable manner. In addition, those skilled in the art may combine and combine different embodiments or examples described in this specification.

[0091] The above is only a preferred embodiment of the present invention and does not limit the present invention in any way. Any technician in the relevant technical field, without departing from the scope of the technical solution of the present invention, makes any form of equivalent replacement or modification to the technical solution and technical content disclosed in the present invention, which does not depart from the content of the technical solution of the present invention and still falls within the protection scope of the present invention.

Claims

1. A method for verifying quantum state control signal distortion, characterized in that: include: Obtaining an experimental result view of a first experiment, wherein the first experiment is used to obtain a change in the probability of a subbit to be measured being in a first selected eigenstate as a function of a detuning magnitude and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal; Performing image processing on the experimental result view to output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white; Divide the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along a center line, and obtain a mirror image of the second sub-image; The first sub-image is compared with the mirror image for similarity, and when the result of the similarity comparison reaches a preset value, it is determined that the quantum state control signal of the sub-bit to be measured is not distorted.

2. The method according to claim 1, characterized in that Before performing image processing on the experimental result view, the method further includes: The experimental result view is cropped to remove useless information.

3. The method according to claim 1, characterized in that Before performing the step of dividing the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along a center line, the method further includes: Determining whether adhesion occurs between connected domains of the first grayscale image or the first black-and-white image; If yes, it is determined that the quantum state control signal of the subbit to be measured has been distorted; If not, the step of dividing the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along the center line is performed.

4. The method according to claim 3, characterized in that Whether adhesion occurs between the connected domains of the first grayscale image or the first black-and-white image is determined based on the ratio between the span of the first connected domain and the span of the second connected domain, wherein the span is the maximum length of the connected domain of the first grayscale image or the first black-and-white image on the Y-axis, the first connected domain is the connected domain with the largest span in the first grayscale image or the first black-and-white image, and the second connected domain is the connected domain with the smallest span in the first grayscale image or the first black-and-white image.

5. The method according to claim 4, characterized in that When the ratio of the spans of the first connected domain to the second connected domain exceeds a first preset threshold, it is determined that adhesion occurs between the connected domains of the first grayscale image or the first black-and-white image.

6. The method according to claim 1, characterized in that The comparing the first sub-image with the mirror image for similarity includes: A structural similarity algorithm is used to compare the similarity between the first sub-graph and the mirror image.

7. A verification device for quantum state control signal distortion, characterized in that: include: an experiment result view acquisition unit, configured to acquire an experiment result view of a first experiment, wherein the first experiment is configured to acquire a probability that a subbit to be measured is in a first selected eigenstate as a function of a detuning magnitude and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal; An image processing unit, configured to perform image processing on the experimental result view and output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white; An image segmentation unit, used for segmenting the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along a center line position, and obtaining a mirror image of the second sub-image; The similarity comparison unit is used to compare the first sub-image with the mirror image for similarity, and when the result of the similarity comparison reaches a preset value, determine that the quantum state control signal of the sub-bit to be measured is not distorted.

8. A method for obtaining a quantum bit working point, characterized in that: include: Traversing the operating frequency of the subbit to be measured within a first range, obtaining an experimental result view of a first experiment, wherein the first experiment is used to obtain a change in the probability of the subbit to be measured being in a first selected eigenstate as a function of a detuning size and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal; Performing image processing on the experimental result view to output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white; Divide the first grayscale image or the first black-and-white image into a first sub-image and a second sub-image along a center line, and obtain a mirror image of the second sub-image; The first sub-image is compared with the mirror image for similarity, and all operating frequencies of the sub-bits to be measured corresponding to when the result of the similarity comparison reaches a preset value are obtained as optional operating points.

9. A quantum computing measurement and control system, characterized in that: A method for verifying the distortion of a quantum state control signal according to any one of claims 1 to 6 or a method for obtaining a quantum bit working point according to claim 8.

10. A quantum computer, characterized in that: Including the quantum computing measurement and control system as described in claim 9.

11. A readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, it can implement the method for verifying the quantum state control signal distortion described in any one of claims 1 to 6 or the method for obtaining the quantum bit working point described in claim 8.

Images