Light leakage detection circuit, method and device for high power laser

Abstract

The application discloses a light leakage detection circuit, method and equipment of a high-power laser, and relates to the technical field of laser testing, wherein the light leakage detection circuit comprises a network port communication module connected with an upper computer, is used for detecting instructions issued to the high-power laser by the upper computer, and generates instruction reading signals; a photoelectric detection module connected with the high-power laser, is used for sampling the light emission state of the high-power laser, and generates light emission detection signals; and a main control module connected with the network port communication module and the photoelectric detection module respectively, is used for identifying the type of the instructions according to the instruction reading signals, judging whether the high-power laser is in the light emission state according to the light emission detection signals, obtaining an initial detection result, and when the initial detection result is that there is light leakage, counting the light leakage time and the light leakage frequency, and obtaining a light leakage detection result. The application realizes automatic whole-machine light leakage detection and data quantification of light leakage detection.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of laser testing, in particular to a light leakage detection circuit, method and device for a high-power laser. BACKGROUND

[0002] With the gradual improvement of the power and performance of lasers, the requirements for various indicators of lasers are becoming higher and higher. In the industrial production process of applying lasers, laser light leakage can bring great risks, therefore, the light leakage test of the laser is one of the necessary items of the whole machine test of the laser.

[0003] In the related art, the light leakage test of the laser generally uses a laser debugging light spot photo paper, and whether there is a light spot is directly observed by a human to correspondingly determine whether the laser leaks light. When this method is applied to the light leakage test of a high-power laser (HPFL), it has high danger and uncertainty, and there are many defects in the personal safety of the test personnel, the safety of the test equipment, and the test results. SUMMARY

[0004] The main purpose of the present application is to provide a light leakage detection circuit, method and device for a high-power laser, aiming to solve the technical problems of poor safety and poor test accuracy in the light leakage test of a high-power laser in the related art.

[0005] To achieve the above-mentioned purpose, the present application provides a light leakage detection circuit for a high-power laser, which comprises:

[0006] A network port communication module connected with the host computer, used for detecting an instruction issued by the host computer to the high-power laser, and generating an instruction reading signal;

[0007] A photoelectric detection module connected with the high-power laser, used for sampling the light output state of the high-power laser, and generating a light output detection signal;

[0008] A main control module connected with the network port communication module and the photoelectric detection module, used for identifying the type of the instruction according to the instruction reading signal, judging whether the high-power laser is in a light output state according to the light output detection signal, obtaining an initial detection result, and when the initial detection result is that there is light leakage, counting the light leakage time and the light leakage frequency, and obtaining a light leakage detection result.

[0009] In an embodiment, the main control module is further used for:

[0010] identifying the type of the instruction according to the instruction reading signal;

[0011] if the instruction is a light output instruction, obtaining the initial detection result that there is no light leakage of the high-power laser;

[0012] If the instruction is the light-off instruction, it is judged according to the light-out detection signal whether the high-power laser is in the light-out state or not;

[0013] If the high-power laser is in the light-out state, an initial detection result that the high-power laser does not exist light leakage is obtained;

[0014] If the high-power laser is in the light-out state, it is detected whether the light-out detection signal exists falling edge or not;

[0015] If the falling edge exists, an initial detection result that the high-power laser exists light leakage is obtained, and the light leakage times is added by one;

[0016] Timing starts from the first time corresponding to the falling edge, and it is detected whether the light-out detection signal exists rising edge or not;

[0017] If the rising edge exists, it is judged that the current light leakage of the high-power laser ends, timing ends from the second time corresponding to the rising edge, and the light leakage time is obtained;

[0018] The light leakage detection result is obtained according to the initial detection result, the light leakage times and the light leakage time.

[0019] In an embodiment, the network port communication module comprises a network port connector RJ1 and an RMII interface U1;

[0020] The signal input end of the network port connector RJ1 is connected with the upper computer, the data output end of the network port connector RJ1 is connected with the data input end of the RMII interface U1, and the signal output end of the RMII interface U1 is connected with the main control module through a connector.

[0021] In an embodiment, the photoelectric detection module comprises:

[0022] A silicon photocell is arranged at the light-out port of the high-power laser, and the silicon photocell is used for power light-out detection of the high-power laser and outputs a detection current;

[0023] A signal amplification unit is connected with the silicon photocell, and the signal amplification unit is used for current-voltage conversion and signal amplification processing of the detection current and outputs a power sampling signal;

[0024] A hysteresis comparison unit is connected with the signal amplification unit and the main control module respectively, and the hysteresis comparison unit is used for comparing the power sampling signal with a preset power signal and outputting a light-out detection signal according to the comparison result.

[0025] In an embodiment, the light leakage detection circuit further comprises:

[0026] The power module is connected with the network port communication module, the photoelectric detection module and the main control module respectively, and is used for converting the received input voltage into power supply voltages with different voltage values to provide power supply for different modules.

[0027] In an embodiment, the light leakage detection circuit further comprises:

[0028] The communication module is connected with the main control module.

[0029] The main control module is further used for outputting a communication transmission signal according to the light leakage detection result.

[0030] The communication module is used for converting the communication transmission signal into a serial communication signal to send the light leakage detection result to an external device.

[0031] In an embodiment, the light leakage detection circuit further comprises:

[0032] The display module is connected with the main control module.

[0033] The main control module is further used for outputting a result display signal according to the light leakage detection result.

[0034] The display module is used for indicating light leakage and displaying light leakage time and light leakage frequency according to the result display signal.

[0035] In an embodiment, the light leakage detection circuit further comprises:

[0036] The interaction module is connected with the main control module.

[0037] The interaction module is used for outputting an interaction instruction to the main control module according to user operation to reset the main control module, send the light leakage detection result to an external device through the main control module and / or perform display control on the display module through the main control module.

[0038] In addition, to achieve the above object, the application further provides a light leakage detection method of a high-power laser, applied to the light leakage detection circuit of the high-power laser.

[0039] The network port communication module is used for detecting an instruction sent by an upper computer to the high-power laser to generate an instruction reading signal.

[0040] The photoelectric detection module is used for sampling an emission state of the high-power laser to generate an emission detection signal.

[0041] The main control module is used for identifying a type of the instruction according to the instruction reading signal, judging whether the high-power laser is in the emission state according to the emission detection signal to obtain an initial detection result, and when the initial detection result is that there is light leakage, counting light leakage time and light leakage frequency to obtain a light leakage detection result.

[0042] In addition, to achieve the above object, the application further provides a light leakage detection device of a high-power laser, comprising the light leakage detection circuit of the high-power laser.

[0043] The one or more technical solutions provided by the application have at least the following technical effects:

[0044] The light leakage detection circuit of the high-power laser is provided, and the light leakage detection circuit comprising a network communication module, a photoelectric detection module and a master control module is used for automatically detecting the whole machine light leakage of the high-power laser, so as to reduce the risk of damage to the human body or the test equipment caused by light leakage and has high safety. In the circuit, the network communication module is used for detecting the instruction sent by the upper computer to the high-power laser, generating an instruction reading signal, the photoelectric detection module is used for sampling the light emission state of the high-power laser, generating a light emission detection signal, the master control module is used for identifying the type of the instruction according to the instruction reading signal and judging whether the high-power laser is in the light emission state according to the light emission detection signal, obtaining an initial detection result, and when the initial detection result is that there is light leakage, counting the light leakage time and the light leakage frequency, obtaining a light leakage detection result. Compared with the manual test method, the method is not easy to miss detection or misjudge, so that the light leakage detection is more accurate, and the light leakage duration and the light leakage frequency of the high-power laser can be detected, the data quantification function of the light leakage detection is realized, and a safe and reliable light leakage test scheme is provided. BRIEF DESCRIPTION OF DRAWINGS

[0045] The accompanying drawings, which are incorporated into and form part of the specification, illustrate embodiments consistent with the application and, together with the specification, serve to explain the principles of the application.

[0046] In order to more clearly illustrate the technical solutions in the embodiments of the application or the related art, the accompanying drawings needed to be used in the embodiment or related art description will be briefly introduced. Obviously, the accompanying drawings in the following description are only some embodiments of the application, and other drawings can be obtained by those skilled in the art without creative labor.

[0047] Figure 1 It is a connection diagram of an embodiment of the light leakage detection circuit of the high-power laser of the application.

[0048] Figure 2 It is a circuit principle diagram of the master control module in an embodiment of the light leakage detection circuit of the high-power laser of the application.

[0049] Figure 3 It is a circuit principle diagram of the network communication module in an embodiment of the light leakage detection circuit of the high-power laser of the application.

[0050] Figure 4 Connection diagram of another embodiment of the light leakage detection circuit of the high-power laser of the present application;

[0051] Figure 5 Circuit schematic of the signal amplification unit in another embodiment of the light leakage detection circuit of the high-power laser of the present application;

[0052] Figure 6 Circuit schematic of the hysteresis comparison unit in another embodiment of the light leakage detection circuit of the high-power laser of the present application;

[0053] Figure 7 Connection diagram of another embodiment of the light leakage detection circuit of the high-power laser of the present application;

[0054] Figure 8 Circuit schematic of the power module in another embodiment of the light leakage detection circuit of the high-power laser of the present application;

[0055] Figure 9 Circuit schematic of the communication module in another embodiment of the light leakage detection circuit of the high-power laser of the present application;

[0056] Figure 10 Circuit schematic of the display module in another embodiment of the light leakage detection circuit of the high-power laser of the present application;

[0057] Figure 11 Circuit schematic of the interaction module in another embodiment of the light leakage detection circuit of the high-power laser of the present application;

[0058] Figure 12 Flowchart of an embodiment of the light leakage detection method of the high-power laser of the present application;

[0059] Figure 13 Flowchart of an embodiment of the light leakage detection method of the high-power laser of the present application; Figure 12 Detailed flowchart of step S30 in the embodiment of the light leakage detection method of the high-power laser of the present application;

[0060] Figure 14 Flowchart of an application example of the light leakage detection method of the high-power laser of the present application;

[0061] Figure 15 Flowchart of an application example of the light leakage detection method of the high-power laser of the present application; Figure 14 Detailed flowchart of step A4 in the application example of the light leakage detection method of the high-power laser of the present application.

[0062] The implementation, functional features and advantages of the present application will be further described with reference to the embodiments and the accompanying drawings. DETAILED DESCRIPTION

[0063] With reference to the drawings and the embodiments of the present application, the technical solutions in the embodiments of the present application will be described clearly and completely. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by a person of ordinary skill in the art without creative effort belong to the scope of protection of the present application.

[0064] It should be noted that if the embodiments of the present application involve directional indications (such as up, down, left, right, front, back, etc.), the directional indications are only used to explain the relative position relationship, motion condition, etc. between components in a certain posture, and if the certain posture changes, the directional indications also change accordingly. In addition, if the embodiments of the present application involve descriptions such as “first”, “second”, etc., the descriptions of “first”, “second”, etc. are only for description purposes, and cannot be understood as indicating or implying the relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features limited by “first” and “second” can explicitly or implicitly include at least one of the features. In addition, “and / or” or “and / or” appearing throughout the text means that the three parallel solutions are included, for example, “A and / or B” includes A solution, or B solution, or A and B solutions are satisfied at the same time. In addition, the technical solutions of each embodiment can be combined with each other, but it must be based on the fact that a person of ordinary skill in the art can realize it, and when the combination of technical solutions appears contradictory or unachievable, it should be considered that the combination of technical solutions does not exist, and is not within the scope of protection claimed by the present application.

[0065] In the related art, for the light leakage test of a laser, a laser debugging light spot paper is generally used, and whether there is a light spot is directly observed by a person to correspondingly determine whether the laser leaks light. When this method is applied to the light leakage test of a high-power laser (HPFL), the following problems will exist:

[0066] 1. The light leakage phenomenon has randomness, the light leakage intensity of the HPFL is large, which can punch the paper and the test baffle, causing damage to the test equipment, and can also cause harm to the test personnel;

[0067] 2. Since the laser is invisible light in most cases, when the light power of the HPFL light leakage is weak, it is difficult to determine whether there is light leakage through the naked eye observation, resulting in errors in the test results;

[0068] 3. Only the basic test result of whether the HPFL leaks light can be detected, and more detailed information cannot be obtained;

[0069] 4. There are too many uncertainties in manual testing, and it is easy to miss detection and misjudgment.

[0070] Therefore, the related art has the problems of poor safety and poor test accuracy, especially for the whole machine light leakage test of the high-power laser (HPFL), which has high risk and uncertainty, and many defects in the personal safety of the tester, the equipment safety of the test equipment, and the test result.

[0071] To solve the above problems, the application provides a light leakage detection circuit, method and device of a high-power laser.

[0072] The application provides a light leakage detection circuit of a high-power laser.

[0073] In an embodiment of the application, referring to Figure 1 , Figure 1 FIG. 1 is a connection diagram of an embodiment of a light leakage detection circuit of a high-power laser, which comprises a network port communication module, a photoelectric detection module and a master control module.

[0074] The network port communication module is connected with the upper computer, the photoelectric detection module is connected with the high-power laser, and the master control module is connected with the network port communication module and the photoelectric detection module respectively.

[0075] The network port communication module is configured to detect the instruction issued by the upper computer to the high-power laser, generate an instruction reading signal, the photoelectric detection module is configured to sample the light emission state of the high-power laser, generate a light emission detection signal, and the master control module is configured to identify the type of the instruction according to the instruction reading signal, judge whether the high-power laser is in the light emission state according to the light emission detection signal, obtain an initial detection result, and when the initial detection result is that there is light leakage, count the light leakage time and the light leakage frequency, and obtain a light leakage detection result.

[0076] It should be noted that the network port communication module can detect the light emission instruction and the light-off instruction issued by the upper computer to the high-power laser to directly generate the instruction reading signal, which can be distinguished by the level state of the signal, for example, the instruction reading signal in the high level state corresponds to the light emission instruction, and the instruction reading signal in the low level state corresponds to the light-off instruction, of course, the light emission instruction and the light-off instruction can also be represented by the opposite level state according to actual needs, which is not limited here.

[0077] The photoelectric detection module can sample the light emission state of the high-power laser to directly generate the light emission detection signal, or can amplify, compare and calculate based on the light power of the high-power laser after sampling, and then generate the light emission detection signal in different states according to the calculation result, for example, generate the light emission detection signal in the low level state to indicate that the laser is in the light emission state, and generate the light emission detection signal in the high level state to indicate that the laser is in the non-light emission state.

[0078] The master module can adopt a programmable controller to perform light leakage detection according to the instruction reading signal and the light emission detection signal, specifically, to identify the type of the instruction according to the instruction reading signal, and to determine whether the high-power laser is in the light emission state according to the light emission detection signal, to obtain an initial detection result that the high-power laser does not have light leakage or the high-power laser has light leakage; then, in the case of determining that the high-power laser has light leakage, i.e., in the case of the initial detection result being that there is light leakage, the light leakage time and the light leakage frequency are counted to obtain a final detection result as the light leakage detection result. The light leakage time can be counted and reset according to the level state change of the light emission detection signal, and the light leakage frequency can also be counted according to the level state change of the light emission detection signal.

[0079] The light leakage detection circuit proposed in the embodiment can automatically perform whole-machine light leakage detection on the high-power laser through the light leakage detection circuit including the network port communication module, the photoelectric detection module and the master module, thereby reducing the risk of damage to the human body or damage to the test equipment caused by light leakage, and having high safety. In the circuit, the network port communication module detects the instruction issued by the upper computer to the high-power laser to generate an instruction reading signal, the photoelectric detection module samples the light emission state of the high-power laser to generate a light emission detection signal, and the master module identifies the type of the instruction according to the instruction reading signal, determines whether the high-power laser is in the light emission state according to the light emission detection signal, obtains an initial detection result, and counts the light leakage time and the light leakage frequency when the initial detection result is that there is light leakage to obtain a light leakage detection result. Compared with the manual test method, this method is less likely to miss detection or misjudge, making the light leakage detection more accurate, and can also detect the light leakage duration and the light leakage frequency of the high-power laser, realize the data quantification function of light leakage detection, and provide a safe and reliable light leakage test scheme.

[0080] In a feasible implementation, the master module can also be used to identify the type of the instruction according to the instruction reading signal; if the instruction is a light emission instruction, an initial detection result that the high-power laser does not have light leakage is obtained, if the instruction is a light-off instruction, whether the high-power laser is in the light emission state is determined according to the light emission detection signal; if the high-power laser is in the non-light emission state, an initial detection result that the high-power laser does not have light leakage is obtained, if the high-power laser is in the light emission state, whether the light emission detection signal has a falling edge is detected; if there is a falling edge, an initial detection result that the high-power laser has light leakage is obtained, and the light leakage frequency is incremented by one; timing starts from a first time corresponding to the falling edge, and whether the light emission detection signal has a rising edge is detected; if there is a rising edge, it is determined that the current light leakage of the high-power laser ends, timing ends at a second time corresponding to the rising edge, and the light leakage time is obtained; the light leakage detection result is obtained according to the initial detection result, the light leakage frequency and the light leakage time.

[0081] Wherein, after detecting whether there is a falling edge of the light detection signal, if there is no falling edge, an initial detection result that the high-power laser does not leak light is obtained, and it can also be returned to continue detecting whether there is a falling edge of the subsequent light detection signal to obtain an initial detection result that the high-power laser leaks light when the falling edge is detected, and the number of light leakage is increased by one to obtain the number of light leakage. Similarly, after detecting whether there is a rising edge of the light detection signal, if there is no rising edge, it is determined that the light detection signal is still in a low level state and the high-power laser is still leaking light. It can be returned to continue detecting whether there is a rising edge of the subsequent light detection signal to end the timing when the rising edge is detected to obtain the light leakage time.

[0082] For example, with reference to Figure 2 , Figure 2 is a circuit schematic diagram of the main control module, which includes a main control chip M1 and its peripheral circuit. Wherein, the main control chip M1 adopts GD32F407VGT6 chip, which has the advantages of fast main frequency, multiple available interfaces, low price and the like, and the chip has 1024KB (kilobyte) flash memory, which can store sufficient data, so that the chip also has the advantages of fast running speed and can realize more functions. Wherein, the peripheral circuit of the main control chip M1 includes: a crystal oscillator circuit composed of a crystal oscillator Y2, a capacitor C29 and a capacitor C30; a clock circuit composed of a clock chip Y3, a capacitor C32 and a resistor R27; a reset circuit composed of a resistor R28 and a capacitor C33; a backup power supply circuit composed of an independent battery BAT1, a diode D1, a diode D2 and a capacitor C40; a start-up circuit composed of an interface J2 and a resistor R25; a debugging and programming circuit composed of an interface J3 and a capacitor C41. Of course, the main control chip M1 is also connected with a network port communication module and a photoelectric detection module.

[0083] It can be understood that the main control module can specifically implement the above-mentioned specific light leakage detection steps through the built-in program after reading the instruction reading signal and the light detection signal, so that the light leakage detection circuit can realize automatic whole machine light leakage detection and obtain data-quantized light leakage detection results. The light leakage detection circuit can be well applied to the light leakage detection of the high-power laser HPFL, and the data such as the duration of light leakage and the number of light leakage of the HPFL are quantitatively displayed. When the tester leaves, the light leakage phenomenon can also be automatically found or recorded. Compared with the whole machine test mode of the prior art, the circuit has many advantages in personal safety, equipment safety and test accuracy, etc. On the basis of meeting the whole machine light leakage test demand of the HPFL, a safe and reliable light leakage detection circuit is provided.

[0084] In the embodiment, in the case that the host computer issues a turn-off instruction to the high-power laser, but the high-power laser is actually in the light-emitting state, the falling edge is detected first, and then the rising edge is detected. In the case that the low level represents the light-emitting instruction and the high level represents the turn-off instruction, the closing operation process from the normal light-emitting state to the light interruption state in response to the turn-off instruction is avoided from being misjudged as the light leakage. Also, the case that the laser fails to implement the above-mentioned conversion process to continuously emit light or not to emit light, which leads to the error of the detection result, is avoided.

[0085] In a feasible embodiment, the network communication module in the light leakage detection circuit includes a network connector RJ1 and an RMII interface U1.

[0086] The signal input end of the network connector RJ1 is connected with the host computer, the data output end of the network connector RJ1 is connected with the data input end of the RMII interface U1, and the signal output end of the RMII interface U1 is connected with the main control module through a connector.

[0087] The RMII interface (Reduced Media Independent Interface) U1 can be an SR8201F Ethernet transceiver, which has the characteristics of less signal lines, low frequency, low cost and being suitable for various embedded systems. The network connector RJ1 can be a HY951180A network port, and the signal input end, i.e., the signal receiving end RX and the signal transmitting end TX, can be connected with the host computer to read the instruction issued by the host computer to the high-power laser, and to detect the type of the instruction in time to determine whether the laser emitted by the high-power laser is the light leakage.

[0088] For example, referring to Figure 3 , Figure 3 is a circuit principle diagram of the network communication module. The network connector RJ1 has the functions of line activation indication (LED LINK) and data forwarding indication (LED ACT). The data output end, i.e., the data receiving end RD+ / RD- and the data transmitting end TD+ / TD- of the network connector RJ1 are respectively connected with the data input end, i.e., the pin 3-6 of the RMII interface U1. The signal output end of the RMII interface U1 is connected with the main control chip M1 of the main control module through three connectors. For example, Figure 3As shown, the relevant pins of the data transmission TXD of the RMII interface U1 are connected to the pins ETH RMII REF CLK, the pin ETH RMII TXD0, the pin ETH RMII TXD1 and the pin ETH RMII TX EN of the master chip M1 through the connector RP1, the relevant pins of the data reception RXD of the RMII interface U1 are connected to the pin ETH RMII RXD0, the pin ETH RMII RXD1 and the pin ETH RMII INT of the master chip M1 through the connector RP2, the MDC interface of the RMII interface U1 is connected to the pin ETH RMII MDC of the master chip M1 through the connector RP3, the MDIO interface of the RMII interface U1 is connected to the pin ETH RMII MDIO of the master chip M1 through the connector RP3, the PHYRSTB interface of the RMII interface U1 is connected to the pin ETH RMII RESET of the master chip M1 through the connector RP3, and the CRS_DV interface of the RMII interface U1 is connected to the pin ETH RMII CRS DV of the master chip M1 through the connector RP3.

[0089] It can be understood that the network port communication module composed of the network port connector RJ1 and the RMII interface U1 can automatically detect the instruction sent by the host computer to the high-power laser, detect the type of the instruction in time, generate an instruction reading signal corresponding to the instruction, and thus enable the master control module to execute a specific light leakage detection process. The connection lines between the signal output end of the RMII interface U1 and the master control module are concentrated through the connector, which can reduce wiring and reduce the circuit connection complexity of the light leakage detection circuit.

[0090] In another embodiment of the present application, referring to Figure 4 , Figure 4 Fig. 4 is a connection schematic diagram of another embodiment of a light leakage detection circuit for a high-power laser, and the photoelectric detection module in the light leakage detection circuit can include a silicon photocell, a signal amplification unit and a hysteresis comparison unit.

[0091] The silicon photocell is arranged at the light outlet of the high-power laser, the signal amplification unit is connected to the silicon photocell, and the hysteresis comparison unit is connected to the signal amplification unit and the master control module.

[0092] The silicon photocell is arranged at the light outlet of the high-power laser, the signal amplification unit is connected to the silicon photocell, and the hysteresis comparison unit is connected to the signal amplification unit and the master control module.

[0093] The silicon photocell can adopt a BPW34 photocell, which has the characteristics of fast response speed (20 ns), wide wavelength range (650-1050 (60%)), high sensitivity, and small dark current (2 nA (maximum 30 nA)).

[0094] The positive and negative input terminals of the signal amplification unit can be connected to the positive and negative poles of the silicon photocell, and can be connected to the positive and negative terminals PD+ / PD- of the light outlet of the high-power laser through the power light detection interface XS1 and the positive and negative poles of the silicon photocell. After current-voltage conversion (I-V conversion), the output voltage U o1 The power sampling signal Laser Power Sample is output after being amplified by the in-phase low-pass filter amplifier.

[0095] The positive input terminal of the hysteresis comparison unit is connected to the output terminal of the signal amplification unit, receives the power sampling signal Laser Power Sample, and compares it with the preset power signal REF. Based on the comparison result, the light detection signal Laser Power is output. The output terminal of the hysteresis comparison unit is connected to the pin Laser Power of the main control chip M1, and the light detection signal Laser Power is input to the main control chip M1.

[0096] For example, referring to Figure 5 , Figure 5 The circuit principle diagram of the signal amplification unit can include an I-V converter OP1A, an in-phase low-pass filter amplifier OP1B, resistors R15, R16, R18, and R19, and capacitors C20, C21, and C22.

[0097] The positive input terminal of the I-V converter OP1A is connected to one end of the power light detection interface XS1 and the light outlet PD+ of the high-power laser. The negative input terminal of the I-V converter OP1A is connected to the other end of the power light detection interface XS1 and the light outlet PD- of the high-power laser. The output terminal of the I-V converter OP1A is connected to the output terminal of the I-V converter OP1A through the parallel connection of the resistor R15 and the capacitor C20. The positive input terminal of the I-V converter OP1A is grounded. The output terminal of the I-V converter OP1A is connected to the positive input terminal of the in-phase low-pass filter amplifier OP1B through the resistor R18. The negative input terminal of the OP1B is grounded through the resistor R16. The output terminal of the OP1B is connected to the output terminal of the OP1B through the parallel connection of the resistor R19 and the capacitor C21. The output terminal of the OP1B is connected to the hysteresis comparison unit.

[0098] The I-V converter OP1A and the in-phase low-pass filter amplifier OP1B can adopt SGM80582 operational amplifier. As a high-speed operational amplifier, SGM80582 has high bandwidth of 220MHz, high gain-bandwidth product of 100MHz, high voltage slew rate of 160V / us, and low input bias current of 2pA, etc. These features can ensure that the light leakage detection has high response speed under high amplification, so that the light leakage can be detected quickly and accurately.

[0099] Based on Figure 5 the signal amplification unit shown in the figure, the output voltage of the I-V converter OP1A is U o1 , the output voltage of the in-phase low-pass filter amplifier OP1B is U o2 , and the cutoff frequency of OP1B is f. It can be known that: Figure 5

[0100] The calculation formula of the output voltage U o1 is: U o1 = I O × R 15 , wherein I O represents the dark current of the silicon photocell, and R 15 represents the resistance value of the resistor R15.

[0101] The calculation formula of the output voltage U o2 is: wherein R 16 represents the resistance value of the resistor R16, and R 19 represents the resistance value of the resistor R19.

[0102] The calculation formula of the cutoff frequency f of OP1B is: wherein C 21 represents the capacitance value of the capacitor C21.

[0103] When the high-power laser does not emit light, the calculation process of the output voltage U o2 is that the dark current I O is substituted into the calculation formula with 120% of the maximum dark current, i.e. I O = 36nA, and R 15 = 100K is set, so that U o1 = 3.6mV can be obtained; continuously, R 16 = 1K and R 19 = 270K are set, so that U o2 = 975.6mV can be obtained; and then, the rated voltage of C 21 is set to 50 volts, and the nominal capacity is set to 5.6pF, so that the cutoff frequency f of OP1B is approximately 105.3kHz.

[0104] ​Then, the response speed of the signal amplification unit can be calculated: the gain-bandwidth product of the SGM80582 operational amplifier is 100MHz, and the circuit gain of the signal amplification unit is 271, so the cutoff frequency of the entire signal amplification unit is about 370kHz, and since the cutoff frequency of OP1B is f≈105.3kHz, the response speed of the signal amplification unit is about 5us. As can be seen, the signal amplification unit indeed has the advantage of fast response speed. It should be noted that the gain of the signal amplification unit can also be adjusted by adjusting the resistance values of resistors R15, R16 and R19 in the signal amplification unit.

[0105] For example, with reference to Figure 6 , Figure 6 is a circuit schematic diagram of the hysteresis comparison unit, which can include a comparator N3, resistors R20-R24, a resistor R17, and capacitors C23-C26.

[0106] The positive input terminal of the comparator N3 is connected to the signal amplification unit through resistors R22 and R24 in sequence, specifically connected to the output terminal of the in-phase low-pass filter amplifier OP1B, and is also connected to ground through capacitor C26 and to the output terminal of the comparator N3 through resistor R23. The negative input terminal of the comparator N3 receives a preset power signal REF and is connected to one end of capacitor C23, one end of resistor R20, and one end of resistor R17. The other end of resistor R17 is connected to a +5.0V power supply voltage, and the other end of resistor R20 and the other end of capacitor C23 are both connected to ground. The power supply terminal of the comparator N3 receives a +3.3V power supply voltage and is connected to ground through capacitor C24. The output terminal of the comparator N3 is connected to the main control module and capacitor C25 through resistor R21, specifically connected to the pin Laser Power of the main control chip M1.

[0107] Among them, the comparator N3 can use an SGM80581 rail-to-rail operational amplifier, which has similar characteristics to the aforementioned SGM80582 operational amplifier, and will not be described here.

[0108] Based on the hysteresis comparison unit shown in Figure 6 , let the input voltage of the comparator N3 be U in , the comparison voltage be U ref , the high threshold voltage be U TH , and the low threshold voltage be U TL , then the Figure 6 can be known as:

[0109] The comparison voltage U ref is: Among them, R 20 represents the resistance value of resistor R20, and R 17a resistance value of the resistor R17;

[0110] a high threshold voltage U TH is: wherein R 23 a resistance value of the resistor R23, R 24 +R 22 , R 24 a resistance value of the resistor R24, R 22 a resistance value of the resistor R22, U Z represents a 3.3V power supply voltage;

[0111] a low threshold voltage U TL is:

[0112] When the high-power laser only has a slight light leakage, in the photoelectric detection module, the I-V conversion and signal amplification are first performed by the signal amplification unit, the power sampling and the maximum amplification processing are realized, and the power sampling signal with slightly larger power is obtained; when the light leakage power is slightly large, the operational amplifier in the hysteresis comparison unit outputs saturation, and therefore, the photoelectric detection module can realize the detection of slight light leakage.

[0113] The light leakage detection circuit provided in this embodiment can accurately detect light leakage when the light power of the high-power laser light leakage is relatively weak, compared with the fact that the tester cannot determine whether there is light leakage through naked eye observation in the related art, so that the light leakage detection accuracy is increased.

[0114] In another embodiment of the present application, referring to Figure 7 , Figure 7 is a connection diagram of another embodiment of the light leakage detection circuit of the high-power laser, and the light leakage detection circuit can further include a power module;

[0115] The power module is connected with the network port communication module, the photoelectric detection module and the main control module respectively;

[0116] The power module is configured to convert the received input voltage into power supply voltages with different voltage values, so as to provide the power supply voltages to different modules.

[0117] It should be noted that the power module can convert the input voltage into multiple power supply voltages with different voltage values, so as to provide the voltages required for the work of each module. It should be further noted that when there are other modules in the light leakage detection circuit in addition to the network port communication module, the photoelectric detection module and the main control module, the power module can also provide the voltages required for the work of the other modules.

[0118] For example, referring to Figure 8 , Figure 8A circuit schematic diagram of the power module, the power module can include voltage conversion chip DC1 and voltage regulator N1;

[0119] The positive input end +Vin of the voltage conversion chip DC1 is connected with 24V working voltage VCC24V, one end of the inductor L1 and one end of the capacitor EC2 respectively, the other end of the inductor L1 is connected with one end of the capacitor EC1, one end of the thermistor RT1 and one end of the transient voltage suppression diode TVS respectively, the other end of the thermistor RT1 is connected with the negative electrode of the anti-reverse connection diode V1, the positive electrode of the anti-reverse connection diode V1 receives 24V input voltage +24VIN, the other end of the transient voltage suppression diode TVS, the other end of the capacitor EC1, the other end of the capacitor EC2 and the negative input end of the voltage conversion chip DC1 are grounded, the ground end 0V of the voltage conversion chip DC1 is connected with the ground through the capacitor C4, the output end +Vo of the voltage conversion chip DC1 can output +5.0V power supply voltage, the output end +Vo of the voltage conversion chip DC1 is connected with one end of the capacitor C3, one end of the capacitor EC3, one end of the capacitor C1 and the input end of the voltage regulator N1 respectively, the output end of the voltage regulator N1 can output +3.3V power supply voltage, the output end of the voltage regulator N1 is connected with one end of the capacitor C2 and one end of the resistor R1 respectively, the other end of the resistor R1 is connected with the positive electrode of the light-emitting diode V2, the negative electrode of the light-emitting diode V2, the other end of the capacitor C2, the ground end of the voltage regulator N1, the other end of the capacitor C1, the other end of the capacitor EC3, the other end of the capacitor C3 are grounded.

[0120] Wherein, the voltage conversion chip DC1 can adopt 24V to 5V isolation module; the capacitor EC2 and the capacitor C2 are filter capacitors, the inductor L1 and the capacitor EC2 constitute LC filter circuit; the voltage regulator N1 can adopt 3V3 linear voltage regulator, converts the +5.0V power supply voltage output by the voltage conversion chip DC1 into +3.3V power supply voltage, and supplies power for the light leakage detection circuit. The transient voltage suppression diode TVS can protect the power module from voltage spike damage, the thermistor RT1 first protects the power module by limiting inrush current, then the transient voltage suppression diode TVS absorbs overvoltage, both of which work together to provide double protection, which improves the reliability and safety of the power module.

[0121] In a feasible implementation manner, still referring to Figure 7 , the light leakage detection circuit can further include a communication module;

[0122] The communication module is connected with the master control module;

[0123] The master control module is further configured to output a communication transmission signal according to the light leakage detection result; and the communication module is configured to isolate and convert the communication transmission signal into a serial communication signal, so as to send the light leakage detection result to an external device.

[0124] It should be noted that the communication module is connected with an external device, for example, can be connected with a machine tool, also can be connected with a background monitoring center, so that when the light leakage test is carried out by using the light leakage detection circuit, the accidental injury of the eyes and the body of the tester caused by the light leakage of the high-power laser can be avoided; at the same time, even if the tester is not on site, automatic detection can also be realized, and the tester only needs to confirm the recorded light leakage time and light leakage frequency, which is more accurate and less prone to errors, so that safer, more reliable, more efficient and more accurate light leakage test can be realized; in addition, the communication module can transmit the quantitative data such as the light leakage frequency and the light leakage time in the test process to the background monitoring center, so as to facilitate the tester to view and record the data.

[0125] For example, with reference to Figure 9 , Figure 9 The circuit principle diagram of the communication module can include RS232 transceiver N2 and its peripheral circuit, bidirectional transient suppression diode E1-E3, thermistor R11, thermistor R14, ceramic gas discharge tube GDT1 and connector J1.

[0126] The power supply end VCC of the RS232 transceiver N2 can be connected with the power module to receive +5.0V power supply voltage, the data receiving pin RXD of the RS232 transceiver N2 is connected with the master control module, specifically connected with the pin USARTIRXD of the master control chip M1, and also grounded through the resistor R12, the data sending pin TXD of the RS232 transceiver N2 is connected with the master control module, specifically connected with the pin USARTITXD of the master control chip M1, the output pin TOUT of the RS232 transceiver N2 is connected with the RS232 TX line in the RS232 communication line, also connected with one end of the bidirectional transient suppression diode E1, one end of the bidirectional transient suppression diode E2 and one end of the thermistor R11, the input pin RIN of the RS232 transceiver N2 is connected with the RS232 RX line in the RS232 communication line, also connected with the other end of the bidirectional transient suppression diode E2, one end of the bidirectional transient suppression diode E3 and one end of the thermistor R14, the other end of the thermistor R11 is connected with one end of the ceramic gas discharge tube GDT1 and the connector J1 respectively, the other end of the thermistor R14 is connected with the other end of the ceramic gas discharge tube GDT1 and the connector J1 respectively, the other end of the bidirectional transient suppression diode E3 is grounded, and the connector J1 can be connected with the external device through the interfaces BO1 and BO2.

[0127] The RS232 transceiver N2 can adopt the RS232 transceiver chip TDH541S232H with low power consumption, high static protection and ESD protection, which has signal isolation and a built-in voltage isolation power supply, so that the TTL to RS232 peripheral circuit designed based on the chip has the advantage of simple circuit structure. The bidirectional transient suppression diodes E1-E3 can protect the light leakage detection circuit from voltage spikes introduced by RS232 communication lines. The gas discharge tube GDT1 is a switch type overvoltage lightning protection component. The thermistors R11 and R14 can protect the communication module from overvoltage and overcurrent damage.

[0128] In a possible implementation, continuing to refer to Figure 7 , the light leakage detection circuit can further include a display module.

[0129] The display module is connected with the master control module.

[0130] The master control module is further configured to output a result display signal according to the light leakage detection result; and the display module is configured to indicate light leakage and display light leakage time and light leakage frequency according to the result display signal.

[0131] It should be noted that the display module can specifically display the light leakage time and the light leakage frequency in the light leakage detection result, and can also display an alarm prompt for the presence of light leakage and a normal operation prompt for the absence of light leakage. The display module can adopt an LED indicator lamp and an OLED display screen. The LED indicator lamp can be used to prompt whether the high-power laser has a light leakage phenomenon, and the OLED display screen can be used to roughly display the light leakage frequency and the light leakage time of each time.

[0132] In a possible implementation, continuing to refer to Figure 7 , the light leakage detection circuit can further include an interactive module.

[0133] The interactive module is connected with the master control module.

[0134] The interactive module is configured to output an interactive instruction to the master control module according to a user operation, so as to reset the master control module, send the light leakage detection result to an external device through the master control module, and / or perform display control on the display module through the master control module.

[0135] It should be noted that the interactive module can implement a display page turning operation on the OLED display screen in the display module, and can also implement a data reset operation on the master control module and a sending instruction operation of the master control module on the communication module.

[0136] For example, referring to Figure 10 , Figure 10For the circuit schematic of the display module, the display module can include light emitting diode D4, light emitting diode D3 and OLED screen P1;

[0137] The positive electrode of the light emitting diode D4 is connected with the main control module through the resistor R35, specifically connected with the pin MCU Run LED of the main control chip M1, the negative electrode of the light emitting diode D4 is grounded, used for indicating the absence of light leakage; the positive electrode of the light emitting diode D3 is connected with the main control module through the resistor R34, specifically connected with the pin MCU ERR LED of the main control chip M1, the negative electrode of the light emitting diode D4 is grounded, used for indicating the presence of light leakage; the pin 1 of the OLED screen P1 is connected with the power module, receives +3.3V power supply voltage, the pin 2 of the OLED screen P1 is connected with the main control module, specifically connected with the pin IIC DIO of the main control chip M1, the pin 3 of the OLED screen P1 is connected with the main control module, specifically connected with the pin IIC CLK of the main control chip M1, the pin 4 of the OLED screen P1 is grounded, used for displaying the light leakage time and the light leakage frequency.

[0138] For example, referring to Figure 11 , Figure 11 For the circuit schematic of the interaction module, the interaction module can include keys S1-S4, resistors R36-R39;

[0139] One end of the key S1 is connected with the power module, receives +3.3V power supply voltage, the other end of the key S1 is connected with the pin UP of the master control chip M1 in the master control module and one end of the resistor R36 respectively, the other end of the resistor R36 is grounded, the circuit can be used to generate the up indication signal to the master control module, so that the master control module controls the OLED screen in the display module to up; one end of the key S2 is connected with the power module, receives +3.3V power supply voltage, the other end of the key S2 is connected with the pin Down of the master control chip M1 in the master control module and one end of the resistor R37 respectively, the other end of the resistor R37 is grounded, the circuit can be used to generate the down indication signal to the master control module, so that the master control module controls the OLED screen in the display module to down; one end of the key S3 is connected with the power module, receives +3.3V power supply voltage, the other end of the key S3 is connected with the pin Send of the master control chip M1 in the master control module and one end of the resistor R38 respectively, the other end of the resistor R38 is grounded, the circuit can be used to generate the data sending indication signal to the master control module, so that the master control module controls the communication module to send the light leakage detection result to the external device; one end of the key S4 is connected with the power module, receives +3.3V power supply voltage, the other end of the key S4 is connected with the pin Reset of the master control chip M1 in the master control module and one end of the resistor R39 respectively, the other end of the resistor R39 is grounded, the circuit can be used to generate the reset indication signal to the master control module, so that the master control module performs data reset operation. Therefore, the built-in program of the master control module can also include the steps of reading the key information and executing the display after the light leakage detection.

[0140] For example, the master control module can read the key state, including adding 1 to the display page number of the OLED screen after receiving the up indication signal, then judging whether the display page number after adding 1 is greater than 15, if yes, making the display page number of the OLED screen jump to the first page, if not, directly displaying the corresponding page number; after receiving the down indication signal, reducing 1 to the display page number of the OLED screen, then judging whether the display page number after reducing 1 is less than 1, if yes, making the display page number of the OLED screen jump to the 15th page, if not, directly displaying the corresponding page number; after receiving the data sending indication signal, controlling the communication module to open the serial port and send the related data of the light leakage detection result to the external device; after receiving the reset indication signal, clearing the related data cache of the light leakage detection result, and then eliminating the alarm state of the display module. In actual application, the built-in program of the master control module can also be set according to more actual needs, which is not limited here.

[0141] The light leakage detection circuit provided in the embodiment adds the power module, the communication module, the display module and the interaction module, has more practical functions; the power module has self-protection and multiple power supply outputs, and the communication module also has self-protection, so that the light leakage detection circuit has high stability and reliability.

[0142] The application further provides a light leakage detection method of a high-power laser.

[0143] In an embodiment of the application, referring to Figure 12 , Figure 12 FIG. 1 is a structural schematic diagram of an embodiment of a light leakage detection method of a high-power laser, which is applied to the light leakage detection circuit of the high-power laser in the foregoing embodiment. The light leakage detection method can include steps S10-S30.

[0144] In step S10, the instruction read signal is generated by detecting the instruction issued to the high-power laser by the host computer through the network communication module.

[0145] In step S20, the light emission detection signal is generated by sampling the light emission state of the high-power laser through the photoelectric detection module.

[0146] In step S30, the type of the instruction is identified according to the instruction read signal by the master control module, and whether the high-power laser is in the light emission state is judged according to the light emission detection signal to obtain the initial detection result. When the initial detection result is that there is light leakage, the light leakage time and the light leakage frequency are counted to obtain the light leakage detection result.

[0147] In a feasible implementation, referring to Figure 13 , Figure 13 FIG. 2 is a detailed flowchart of step S30, which can include steps S31-S39.

[0148] In step S31, the type of the instruction is identified according to the instruction read signal by the master control module.

[0149] In step S32, if the instruction is the light emission instruction, the initial detection result that there is no light leakage of the high-power laser is obtained.

[0150] In step S33, if the instruction is the light-off instruction, whether the high-power laser is in the light emission state is judged according to the light emission detection signal.

[0151] In step S34, if the high-power laser is in the non-light emission state, the initial detection result that there is no light leakage of the high-power laser is obtained.

[0152] In step S35, if the high-power laser is in the light emission state, whether the light emission detection signal has a falling edge is detected.

[0153] In step S36, if the falling edge exists, the initial detection result that there is light leakage of the high-power laser is obtained, and the light leakage frequency is added by one. If the falling edge does not exist, the step S36 is returned to continue to detect whether the light emission detection signal has a falling edge.

[0154] Step S37: Start timing from the first moment corresponding to the falling edge, and detect whether there is a rising edge in the light detection signal;

[0155] Step S38: If a rising edge exists, it is determined that the current light leakage of the high-power laser has ended, and the timing ends at the second moment corresponding to the rising edge to obtain the light leakage time; if no rising edge exists, it returns to step S37 to continue detecting whether the light detection signal has a rising edge.

[0156] Step S39: Obtain the light leakage detection result based on the initial detection result, the number of light leakages, and the light leakage time.

[0157] It should be noted that after obtaining the initial detection result that the high-power laser has no light leakage in steps S32 and S34, you can directly jump to step S39 to obtain the light leakage detection result based on the initial detection result. Specifically, corresponding to the initial detection result, the final result that there is no light leakage is obtained, which is the light leakage detection result.

[0158] Understandably, after executing steps S31-S39 once to complete the statistics of light leakage time and number of light leakages, you can continue to return to step S35 to detect whether there is a falling edge in the light detection signal, so as to perform the next light leakage detection. This cycle is repeated, and the light leakage detection results obtained in step S39 are continuously updated. This can realize the complete light leakage test procedure in the whole machine test project of high-power laser in practical applications.

[0159] For example, to better understand the application process of this light leakage detection method, a specific application example is proposed, referring to... Figure 14 , Figure 14 The flowchart for this application example shows that the light leakage detection circuit described above can be implemented through software design of the main control chip M1 in the main control module. For example... Figure 14 As shown, the main control chip M1 specifically performs the following steps:

[0160] Step A1, Initialization;

[0161] Step A2: Read the command and read the signal;

[0162] Step A3: Read the light detection signal;

[0163] Step A4: Perform light leakage detection;

[0164] Step A5: Read the key information;

[0165] Step A6: Display the output.

[0166] Among them, reference Figure 15 , Figure 15As a detailed flowchart of step A4, step A4 is a main step of implementing the light leakage detection method by the master chip M1, and can further include the following steps:

[0167] Step A41, determining whether the light instruction is interrupted.

[0168] According to the type of the instruction sent by the host computer to the high-power laser identified by the read instruction signal, when the instruction is a light-off instruction, the determination result is yes, and when the instruction is a light-on instruction, the determination result is no. If yes, step A42 is entered, otherwise, step A49 is performed to obtain a result that there is no light leakage.

[0169] Step A42, determining whether EMISSION_ON is equal to 1.

[0170] If the light-on instruction is interrupted, it means that the host computer does not send a light-on instruction to the high-power laser at the current time. At this time, the light-on state of the high-power laser can be confirmed according to the light-on detection signal. Specifically, the value of the mark bit EMISSION_ON in the light-on detection signal indicating the light-on state of the high-power laser can be used for judgment. When the laser is in the light-on state, EMISSION_ON = 1, otherwise, EMISSION_ON = 0. Accordingly, it can be determined whether the high-power laser is in the light-off state synchronously after the light-on instruction is interrupted. If yes, i.e. EMISSION_ON = 1, step A43 is entered, if no, i.e. EMISSION_ON = 0, indicating that the high-power laser corresponding to the light-off state after the light-on instruction is interrupted, step A49 can be entered to obtain a result that there is no light leakage.

[0171] Step A43, determining whether a falling edge is detected.

[0172] If the light-on instruction is interrupted and EMISSION_ON = 1, it means that the host computer does not send a light-on instruction to the high-power laser, but the high-power laser is still in the light-on state. At this time, it can be determined whether a falling edge is detected according to the level state of the read light-on detection signal. If yes, step A44 is entered, otherwise, it continues to detect whether a falling edge exists in the light-on detection signal read in the next time.

[0173] Step A44, light leakage times + 1; indicating alarm.

[0174] If a falling edge is detected, it means that there is light leakage at present. At this time, an initial detection result that there is light leakage can be obtained, at the same time, the light leakage times are added by 1, and the display module can be controlled to indicate and alarm the existence of light leakage.

[0175] Step A45, opening the timer and starting timing.

[0176] At the same time of executing the step A44, a timer can also be started to count time from the first time point corresponding to the detected falling edge.

[0177] The step A46 is to determine whether a rising edge is detected.

[0178] Specifically, after the step A45, it is determined whether a rising edge is detected according to the level state of the read light emission detection signal. If yes, the step A47 is entered, otherwise, it is determined whether a rising edge exists in the read light emission detection signal in the next time.

[0179] The step A47 is to close the timer and end the counting.

[0180] If a rising edge is detected, it indicates that the current light leakage ends, and the timer can be closed to end the counting at the second time point corresponding to the detected rising edge.

[0181] The step A48 is to store the light leakage time.

[0182] When the counting ends and the light leakage time is obtained, the light leakage time can be stored.

[0183] The step A49 is to obtain a light leakage detection result.

[0184] The final detection result can be obtained by summarizing the light leakage times, the light leakage times and the initial detection results with light leakage, as the light leakage detection result. The result can be sent to an external device through a communication module, or the result display and warning can be realized through an interaction module and a display module.

[0185] It should be noted that the specific structure of the light leakage detection circuit of the high-power laser can refer to the above embodiments. Since the light leakage detection method of the high-power laser adopts all the technical solutions of the above embodiments, it at least has all the beneficial effects brought by the technical solutions of the above embodiments, which will not be repeated here.

[0186] The present application also proposes a light leakage detection device of a high-power laser.

[0187] In an embodiment of the present application, the light leakage detection device of the high-power laser can include the light leakage detection circuit of the high-power laser of the above embodiments.

[0188] It should be noted that the specific structure of the light leakage detection circuit of the high-power laser can refer to the above embodiments. Since the light leakage detection device of the high-power laser adopts all the technical solutions of the above embodiments, it at least has all the beneficial effects brought by the technical solutions of the above embodiments, which will not be repeated here.

[0189] The above merely illustrates some embodiments of the present application, and does not limit the patent scope of the present application, and any equivalent structural transformation, direct / indirect application in other related technical fields based on the technical concept of the present application, and using the content of the present application specification and drawings are included in the patent protection scope of the present application.

Claims

1. A light leakage detection circuit of a high power laser, characterized by, The light leakage detection circuit comprises: The network port communication module is connected with the upper computer and is used for detecting the instruction issued by the upper computer to the high-power laser to generate an instruction reading signal; The photoelectric detection module is connected with the high-power laser and is used for sampling the light output state of the high-power laser to generate a light output detection signal; The main control module is connected with the network port communication module and the photoelectric detection module respectively, and is used for identifying the type of the instruction according to the instruction reading signal, judging whether the high-power laser is in the light output state according to the light output detection signal to obtain an initial detection result, and when the initial detection result is that there is light leakage, counting the light leakage time and the light leakage frequency to obtain a light leakage detection result; The main control module is further used for: identifying the type of the instruction according to the instruction reading signal; if the instruction is a light output instruction, obtaining the initial detection result that the high-power laser has no light leakage; if the instruction is a light-off instruction, judging whether the high-power laser is in the light output state according to the light output detection signal; if the high-power laser is not in the light output state, obtaining the initial detection result that the high-power laser has no light leakage; if the high-power laser is in the light output state, detecting whether there is a falling edge in the light output detection signal; if there is a falling edge, obtaining the initial detection result that the high-power laser has light leakage and increasing the light leakage frequency by one; starting timing from a first moment corresponding to the falling edge and detecting whether there is a rising edge in the light output detection signal; if there is a rising edge, determining that the current light leakage of the high-power laser is over, ending timing at a second moment corresponding to the rising edge, and obtaining the light leakage time; obtaining the light leakage detection result according to the initial detection result, the light leakage frequency and the light leakage time; The photoelectric detection module comprises: The silicon photocell is arranged at the light output port of the high-power laser, and is used for power light output detection of the high-power laser and output of a detection current; The signal amplification unit is connected with the silicon photocell, is used for current-voltage conversion and signal amplification processing of the detection current, and outputs a power sampling signal; The hysteresis comparison unit is connected with the signal amplification unit and the main control module respectively, is used for comparing the power sampling signal with a preset power signal, and outputs the light output detection signal according to the comparison result.

2. The light leakage detection circuit of a high power laser as claimed in claim 1, wherein, The network port communication module comprises a network port connector RJ1 and an RMII interface U1; The signal input end of the network port connector RJ1 is connected with the upper computer, the data output end of the network port connector RJ1 is connected with the data input end of the RMII interface U1, and the signal output end of the RMII interface U1 is connected with the main control module through a connector.

3. The light leakage detection circuit for high power laser as claimed in claim 1 or 2, wherein, The light leakage detection circuit further comprises: The power module is connected with the network port communication module, the photoelectric detection module and the main control module respectively, is used for converting the received input voltage into power supply voltages with different voltage values to provide power supply to different modules.

4. The light leakage detection circuit for high power laser as claimed in claim 1 or 2, wherein, The light leakage detection circuit further comprises: A communication module connected with the master module; The master module is further configured to output a communication transmission signal according to the light leakage detection result; The communication module is configured to isolate and convert the communication transmission signal into a serial communication signal to send the light leakage detection result to an external device.

5. The light leakage detection circuit for high power laser as claimed in claim 1 or 2, wherein, The light leakage detection circuit further comprises: A display module connected with the master module; The master module is further configured to output a result display signal according to the light leakage detection result; The display module is configured to indicate light leakage and display the light leakage time and the light leakage frequency according to the result display signal.

6. The light leakage detection circuit for high power laser as claimed in claim 5, wherein, The light leakage detection circuit further comprises: An interactive module connected with the master module; The interactive module is configured to output an interactive instruction to the master module according to user operation to reset the master module, send the light leakage detection result to an external device through the master module, and / or control the display of the display module through the master module.

7. A method for detecting light leakage of a high-power laser, characterized in that, The method applied to the light leakage detection circuit of the high-power laser as claimed in any one of claims 1 to 6, the method comprising: Detecting the instruction issued by the upper computer to the high-power laser through the network port communication module to generate an instruction reading signal; Sampling the light output state of the high-power laser through the photoelectric detection module to generate a light output detection signal; Identifying the type of the instruction through the master module according to the instruction reading signal, judging whether the high-power laser is in the light output state according to the light output detection signal to obtain an initial detection result, and when the initial detection result is that there is light leakage, counting the light leakage time and the light leakage frequency to obtain a light leakage detection result; The step of identifying the type of the instruction through the master module according to the instruction reading signal, judging whether the high-power laser is in the light output state according to the light output detection signal to obtain an initial detection result, and when the initial detection result is that there is light leakage, counting the light leakage time and the light leakage frequency to obtain a light leakage detection result, comprises: Identifying the type of the instruction through the master module according to the instruction reading signal; If the instruction is a light output instruction, obtaining the initial detection result that there is no light leakage of the high-power laser; If the instruction is a light-off instruction, judging whether the high-power laser is in the light output state according to the light output detection signal; If the high-power laser is in the non-light output state, obtaining the initial detection result that there is no light leakage of the high-power laser; If the high-power laser is in the light output state, detecting whether there is a falling edge in the light output detection signal; If there is a falling edge, obtaining the initial detection result that there is light leakage of the high-power laser, and increasing the light leakage frequency by one; Starting timing from a first time corresponding to the falling edge, and detecting whether there is a rising edge in the light output detection signal; If there is a rising edge, determining that the current light leakage of the high-power laser ends, ending timing from a second time corresponding to the rising edge, and obtaining the light leakage time; Obtaining the light leakage detection result according to the initial detection result, the light leakage frequency and the light leakage time; The step of sampling the light output state of the high-power laser by the photoelectric detection module to generate a light output detection signal comprises: detecting the power light output of the high-power laser by a silicon photocell arranged at a light output port of the high-power laser to output a detection current; performing current-voltage conversion and signal amplification processing on the detection current by a signal amplification unit to output a power sampling signal; comparing the power sampling signal with a preset power signal by a hysteresis comparison unit and outputting the light output detection signal according to the comparison result.

8. A light leakage detection apparatus for a high power laser, characterized by, A light leakage detection circuit of a high-power laser comprising any one of the high-power lasers according to claims 1 to 6.

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