A three-terminal capacitor voltage aging test device and test method thereof
By designing a three-terminal capacitor voltage aging test device including current limiting resistor and indicator light, the problem of quickly judging the good contact of the three-terminal capacitor during high-temperature old fire is solved, and higher inspection accuracy and efficiency are achieved.
Patent Information
- Application Number
- CN202411937847.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-26
- Publication Date
- 2025-04-01
Smart Images
Figure CN119738636A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to a three-terminal capacitor voltage aging test device and a test method thereof, belonging to the technical field of three-terminal capacitor voltage aging test. Background Art
[0002] After the three-terminal capacitor is placed in the test device, the aging power supply is turned on. Whether the connection is good or not can only be detected by a multimeter. The circuit connection method of the entire board is parallel. As long as one product in the entire board has good contact, the inspection results of the other products will show normal regardless of whether they are in contact during the inspection. In addition, the aging process is carried out in a high temperature environment and inspection cannot be carried out during operation. It cannot be 100% guaranteed that there is no virtual aging phenomenon. Summary of the invention
[0003] The technical problem to be solved by the present invention is to provide a three-terminal capacitor voltage aging test device and a test method thereof, which can quickly determine whether the three-terminal capacitor is in good contact during high-temperature aging.
[0004] The technical solution adopted by the present invention is: a three-terminal capacitor voltage aging test device, including a circuit board and a test socket, a plurality of test sockets are arranged on the circuit board, a plurality of placement slots for placing three-terminal capacitors are arranged on the top surface of the test socket, the plurality of placement slots are connected in parallel to the positive and negative poles of a power supply, each placement slot is connected in series with a current limiting resistor and an indicator light, the current limiting resistor and the indicator light are arranged on the circuit board next to the placement slot, and the circuit board is placed in an oven.
[0005] Furthermore, the positive and negative poles are respectively connected to two conductive pins, which are arranged on the rear side of the base. The circuit board is fixedly connected to the base. The base is placed in a slot on the oven. The slots are arranged in multiple layers. A socket is arranged on the rear wall panel of the oven behind each layer of the slots. The two sockets on the socket are connected to the two conductive pins.
[0006] Furthermore, the base includes a side seat and a bottom plate. Two side seats are used, which are fixedly connected to the front and rear ends of the bottom plate respectively. The circuit board is fixedly connected to the tops of the two side seats. Multiple support columns are arranged between the two side seats, and the two ends of the support columns are fixedly connected to the bottom plate and the circuit board respectively. Furthermore, a handle is provided on the front end surface of the front side seat.
[0007] Furthermore, a welding pad connected to the positive and negative electrodes of the three-terminal capacitor is arranged at the bottom of the placement groove, and an elastic sheet is arranged on the side, and the elastic sheet can clamp the three-terminal capacitor.
[0008] A testing method for a three-terminal capacitor voltage aging testing device, the method comprising the following steps: 1) Place the three-terminal capacitor to be tested into the placement slot; 2) Insert the base into the oven and connect the conductive pins to the socket; 3) Set the oven temperature, start the oven, reach the old fire test temperature range, and start the socket power supply; 4) When the set baking time is reached, observe whether the indicator light is on. If the indicator light is off, it is judged that the three-terminal capacitor corresponding to the indicator light is short-circuited; 5) After removing the three-terminal capacitor whose indicator light shows normal, perform an aging performance test on it.
[0009] The beneficial effects of the present invention are as follows: compared with the prior art, the single placement slot of the present invention adopts a single circuit to ensure the accuracy of the inspection voltage, and an indicator light is added at each placement slot. When the product contact is good, the indicator light lights up, and when the light goes out, it is judged that there is a short circuit, thereby realizing visual inspection and inspection of the baking process, improving inspection accuracy and efficiency, and solving the problems of incomplete product aging, defective products flowing to the client, and the inability to inspect the aging process. In order to extend the service life of the indicator light, a current limiting resistor is added in front of each indicator light to prevent the indicator light from being burned out by excessive current. BRIEF DESCRIPTION OF THE DRAWINGS
[0010] Figure 1 It is a side view structural schematic diagram of a three-terminal capacitor voltage aging test device; Figure 2 It is a front view structural schematic diagram of a three-terminal capacitor voltage aging test device; Figure 3 It is a schematic diagram of the installation structure of the circuit board and the base; Figure 4 It is a schematic diagram of the structure of a three-terminal capacitor viewed from above. DETAILED DESCRIPTION
[0011] The present invention is further described below in conjunction with the accompanying drawings and specific embodiments.
[0012] Example 1: Figure 1-4As shown, a three-terminal capacitor voltage aging test device includes a circuit board 1 and a test socket 2, a plurality of test sockets 2 are arranged on the circuit board 1, a plurality of placement slots 5 for placing three-terminal capacitors 3 are arranged on the top surface of the test socket 2, the plurality of placement slots 5 are connected in parallel to the positive and negative poles of the power supply, each placement slot 5 is connected in series with a current limiting resistor 6 and an indicator light 7, the current limiting resistor 6 and the indicator light 7 are arranged on the circuit board 1 next to the placement slot 5, and the circuit board 1 is placed in an oven 12; a single placement slot of the present invention adopts a single circuit to ensure that the spot inspection voltage is accurate, an indicator light is added at each placement slot, the indicator light lights up when the product contact is good, and a short circuit is judged when the light goes out, thereby realizing visual spot inspection and baking process spot inspection, improving inspection accuracy and efficiency, solving the problems of incomplete product aging, defective products flowing to the client and the inability to inspect the aging process, and in order to extend the service life of the indicator light, a current limiting resistor is added in front of each indicator light to avoid excessive current burning the indicator light.
[0013] In order to facilitate baking in the oven, the positive and negative electrodes are respectively connected to two conductive pins 4, and the two conductive pins 4 are arranged on the rear side of the base 8. The circuit board 1 is fixedly connected to the base 8, and the base 8 is placed in the slot 9 on the oven 12. The slot 9 is arranged in multiple layers, and a socket 10 is arranged on the rear wall plate of the oven 12 on the rear side of each layer of the slot 9. The two sockets on the socket 10 are connected to the two conductive pins 4. After the structure is pushed into the oven slot, the positive and negative poles of the socket are automatically connected, which reduces the cable layout, the base support, better stability, and also avoids the circuit board from being affected.
[0014] In order to improve the supporting stability and facilitate use in the oven, the base 8 includes a side seat 801 and a bottom plate 802. Two side seats 801 are used, which are fixedly connected to the front and rear ends of the bottom plate 802 respectively. The circuit board 1 is fixedly connected to the tops of the two side seats 801. A plurality of supporting columns 803 are arranged between the two side seats 801. The two ends of the supporting columns 803 are fixedly connected to the bottom plate 802 and the circuit board 1 respectively. The support of this structure is stable and reliable. The side seat 801 is a convex strip structure. The two raised sides of the side seats are arranged opposite to each other. The bottom plate and the circuit board are arranged on a step formed by the relative arrangement. The structural stability is better. In order to facilitate pulling out in the oven, a handle 804 is provided on the front end surface of the front side seat 801 .
[0015] In order to ensure the reliability of the conductive connection, a pad for connecting the positive and negative electrodes of the three-terminal capacitor is arranged at the bottom of the placement groove 5, and two symmetrical elastic sheets are arranged on the side, and the elastic sheets can clamp the three-terminal capacitor.
[0016] Embodiment 2: A testing method for a three-terminal capacitor voltage aging testing device, the method comprising the following steps: 1) Place the three-terminal capacitor to be tested into the placement slot; 2) Insert the base into the oven and connect the conductive pins to the socket; 3) Set the oven temperature, start the oven, reach the old fire test temperature range, and start the socket power supply; 4) When the set baking time is reached, observe whether the indicator light is on. If the indicator light is off, it is judged that the three-terminal capacitor corresponding to the indicator light is short-circuited; 5) After removing the three-terminal capacitor whose indicator light shows normal, perform an aging performance test on it.
[0017] The above description is only a specific implementation mode of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.
Claims
1. A three-terminal capacitor voltage aging test device, characterized in that: The invention comprises a circuit board (1) and a test socket (2), wherein a plurality of test sockets (2) are arranged on the circuit board (1), a plurality of placement slots (5) for placing three-terminal capacitors (3) are arranged on the top surface of the test socket (2), the plurality of placement slots (5) are connected in parallel to the positive and negative electrodes of a power source, each placement slot (5) is connected in series with a current limiting resistor (6) and an indicator light (7), the current limiting resistor (6) and the indicator light (7) are arranged on the circuit board (1) beside the placement slot (5), and the circuit board (1) is placed in an oven (12).
2. A three-terminal capacitor voltage aging test device according to claim 1, characterized in that: The positive and negative electrodes are respectively connected to two conductive pins (4), the two conductive pins (4) are arranged on the rear side of the base (8), the circuit board (1) is fixedly connected to the base (8), the base (8) is placed in a slot (9) on the oven (12), the slot (9) is arranged in multiple layers, a socket (10) is arranged on the rear wall plate of the oven (12) behind each layer of the slot (9), and two sockets on the socket (10) are connected to the two conductive pins (4).
3. A three-terminal capacitor voltage aging test device according to claim 1, characterized in that: The base (8) comprises a side seat (801) and a bottom plate (802); two side seats (801) are provided and are respectively fixedly connected to the front and rear ends of the bottom plate (802); the circuit board (1) is fixedly connected to the tops of the two side seats (801); a plurality of support columns (803) are arranged between the two side seats (801); and the two ends of the support columns (803) are respectively fixedly connected to the bottom plate (802) and the circuit board (1).
4. A three-terminal capacitor voltage aging test device according to claim 1, characterized in that: A handle (804) is provided on the front end surface of the front side seat (801).
5. A three-terminal capacitor voltage aging test device according to claim 4, characterized in that: A welding pad connected to the positive and negative electrodes of the three-terminal capacitor is arranged at the bottom of the placement groove (5), and an elastic sheet is arranged on the side, and the elastic sheet can clamp the three-terminal capacitor.
6. The testing method of a three-terminal capacitor voltage aging testing device according to claim 1, characterized in that: The method comprises the following steps: 1) Place the three-terminal capacitor to be tested into the placement slot; 2) Insert the base into the oven and connect the conductive pins to the socket; 3) Set the oven temperature, start the oven, reach the old fire test temperature range, and start the socket power supply; 4) When the set baking time is reached, observe whether the indicator light is on. If the indicator light is off, it is judged that the three-terminal capacitor corresponding to the indicator light is short-circuited; 5) After removing the three-terminal capacitor whose indicator light shows normal, perform an aging performance test on it.