Display module production tracing method and system

Abstract

The invention discloses a display module production tracing method and system, and the method comprises the steps: obtaining a first ID of each to-be-tested display module and a corresponding information file, and burning the first ID into a first drive module of the to-be-tested display module; reading back the second ID, comparing the second ID with the first ID, and if the second ID is inconsistent with the first ID, generating a first abnormal sub-ID and storing abnormal information in the first abnormal sub-ID; if the second ID is consistent with the first ID, driving and lightening the display module to be tested, and storing the test process and each test result in a corresponding information file; and according to the first ID, reading an information file corresponding to the first ID, and tracing the display module. According to the method, the display module can be quickly traced according to the ID, systematic and scientific statistical analysis can be carried out on the defective products, and the problems that the defective products are too many, and analysis and processing need to spend too many manpower and material resources are solved.

Description

Technical Field

[0001] The present invention relates to the technical field of display module production tracing, and in particular to a display module production tracing method and system. Background Art

[0002] TFT display module products have a wide range of applications in the display screen market, such as smart bracelets, smart watches, smart homes, electronic cigarette products, etc. With the advancement of technology, more and more household consumer products such as smart watches and bracelets are becoming increasingly popular, and TFT display module products have their own price advantages, which makes them have a large share in the consumer smart watch market.

[0003] As more and more smart watches are shipped, many defective products have also appeared. Defective TFT display module products bring a lot of inconvenience to both the client and the factory. It takes a lot of manpower, materials and time to process and analyze the defective products, thus limiting the further expansion of TFT screen display modules in the consumer electronics market.

[0004] In order to meet market demand and reduce costs, it is necessary to continuously optimize the TFT display module solution, systematically count and analyze the proportion and types of defective TFT display modules, and completely trace the production data of shipped TFT display modules. This will enable the production side to better control and reduce the generation of defective products, and reduce the investment of clients and factories in market processing of defective products, thereby promoting the further development of TFT screen display modules. Summary of the Invention

[0005] The purpose of the embodiments of the present application is to propose a display module production traceability method and system to solve the problem that there are too many defective TFT display modules in existing consumer products and that analysis and processing require too much manpower and material resources.

[0006] In a first aspect, a display module production tracing method includes: Step 100: Obtain a first ID and corresponding information file of each display module to be tested using the production time, production material number, and production line number, and burn the first ID into the first driver module of the display module to be tested to obtain a second ID; Step 200: Read back the second ID and compare the second ID with the first ID. If they are inconsistent, generate a first abnormal sub-ID and save the abnormal information in the first abnormal sub-ID. The test of the current display module to be tested is terminated. Step 300: If the second ID is consistent with the first ID, the display module to be tested is driven to light up, multiple test screens are displayed in sequence for testing, and the test process and each test result are saved in a corresponding information file; Step 400: According to the first ID, read the information file corresponding to the first ID and trace the display module.

[0007] In conjunction with the display module production tracing method described in the first aspect of the present invention, in a first possible implementation, step 100 includes: Step 110: The production line type and time are represented by corresponding hexadecimal numbers in sequence and are sequentially set in a data sequence; Step 120: Sort the production material number after the time number and obtain the first ID.

[0008] In combination with the first possible implementation of the first aspect of the present invention, in a second possible implementation, after step 120, step 100 further includes: Step 130: Burn the first ID into the first driver module of the display module to be tested; Step 140: Distribute the first ID to a second driver module of the tracing system.

[0009] In combination with the second possible implementation manner of the first aspect of the present invention, in a third possible implementation manner, step 200 includes: Step 210: Use the second driver module to read back the second ID; Step 220: The second driver module compares the second ID with the first ID. If they are inconsistent, the comparison result and the corresponding first ID are returned to the central control module of the traceability system. Step 230: The central control module generates the first abnormal sub-ID corresponding to the first ID according to the comparison result, and saves the abnormal content in the first abnormal sub-ID.

[0010] In combination with the third possible implementation manner of the first aspect of the present invention, in a fourth possible implementation manner, step 300 includes: Step 310: The first driving module lights up the display module to be tested according to the instruction of the second driving module and displays a test screen; Step 320: If the current test image is normal, display the next test image.

[0011] In conjunction with the fourth possible implementation manner of the first aspect of the present invention, in a fifth possible implementation manner, after step 320, step 300 further includes: Step 330: Use the second driving module to control the first driving module to drive the display module to be tested to display a specified test screen; Step 340: Using the test module to obtain the CIE data and power consumption information of the specified test screen and transmit them to the central control module of the traceability system; Step 350: The central control module saves the CIE data and power consumption information in an information file corresponding to the first ID.

[0012] In conjunction with the fourth possible implementation manner of the first aspect of the present invention, in a sixth possible implementation manner, after step 320, step 300 further includes: Step 360: If the current test screen is abnormal, the first ID of the display module to be tested and abnormal information are returned to the central control module through the second driving module; Step 370: The central control module generates a second abnormal sub-ID corresponding to the first ID, and saves the abnormal information content in the second abnormal sub-ID.

[0013] In a second aspect, a display module production tracing system adopts the display module production tracing method described in the first aspect, comprising: Central control module, second drive module, display module to be tested and test module; The display module to be tested includes a first driving module; The central control module is respectively connected to the first driving module, the second driving module, and the test module, the first driving module is also connected to the second driving module, and the first driving module is also connected to the test module; The central control module is used to obtain the first ID and corresponding information file of each display module to be tested by using the production time, production material number and production line, and burn the first ID into the first driver module of the display module to be tested, obtain the second ID, save the returned test results to the corresponding information file, determine whether to generate the first abnormal sub-ID and the second abnormal sub-ID according to the test results, and save the abnormal information to the first abnormal sub-ID and the second abnormal sub-ID respectively. The first driving module is used to drive the display module to be tested according to the instruction of the second driving module, and provide its own first ID to the testing module; The second driver module is used to control the first driver module, read back the first ID from the first driver module, compare the first ID with the second ID, and return the corresponding first ID and test result to the central control module if they are inconsistent; The test module is used to test the displayed multiple test screens, test the CIE data and power consumption data of the specified test screens, and return the data to the central control module.

[0014] In conjunction with the display module production traceability system described in the second aspect of the present invention, in a first possible implementation, the central control module includes: The acquisition unit is used to sort the production line type and time in the order of hexadecimal numbers, set them in the ID sequence in sequence, put the production material number after the time sequence, and obtain the first ID.

[0015] In conjunction with the display module production tracing system according to the second aspect of the present invention, in a second possible implementation manner, the second driving module includes: The determination unit is configured to compare the second ID with the first ID, and if they are inconsistent, determine that an abnormality exists in the first driving module of the display module to be tested, and the display module to be tested is a defective product.

[0016] Compared with the prior art, the embodiments of the present application mainly have the following technical effects: by burning a corresponding ID for each display module and saving the test process and test information content to the corresponding ID, when a display module abnormality occurs, an abnormal sub-ID of the corresponding ID is generated to save the abnormal content. The test process and test results of the display module product can be traced according to the ID. Not only can the display module be quickly traced according to the ID and the test process of the display module be understood, but also defective products can be systematically and scientifically counted and analyzed using big data to provide an important data basis for the subsequent generation of display modules, solving the problem of too many defective TFT display modules in existing consumer products and the need for too much manpower and material resources for analysis and processing. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the solutions in this application, a brief introduction will be given below to the drawings required for use in the description of the embodiments of this application. Obviously, the drawings described below are some embodiments of this application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0018] Figure 1 A flowchart of an embodiment of a display module production tracing method according to the present application; Figure 2 yes Figure 1 A flowchart of a specific implementation of S100; Figure 3 yes Figure 2 A flowchart of a specific implementation method after S120; Figure 4 yes Figure 1 A flowchart of a specific implementation of S200; Figure 5 yes Figure 1A flowchart of a specific implementation of S300; Figure 6 yes Figure 5 A flowchart of a specific implementation method after S320; Figure 7 yes Figure 5 A flowchart of another specific implementation after S320; Figure 8 This is a comparison chart of each data bit of the ID sequence in this application and the hexadecimal number; Figure 9 It is a structural diagram of the display module production traceability system in this application. DETAILED DESCRIPTION

[0019] The following will clearly and completely describe the technical solutions of the present invention in conjunction with the accompanying drawings. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, other embodiments obtained by ordinary technicians in this field without creative work are all within the scope of protection of the present invention.

[0020] References herein to "embodiments" mean that a particular feature, structure, or characteristic described in connection with the embodiments may be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0021] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this application belongs; the terms used in the specification of the application herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" and any variations thereof in the specification and claims of this application and the above-mentioned figure descriptions are intended to cover non-exclusive inclusions.

[0022] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. Throughout the description of this application, "plurality" means two or more, unless otherwise specifically defined.

[0023] The purpose of the embodiments of the present application is to propose a display module production traceability method and system to solve the problem that there are too many defective TFT display modules in existing consumer products and that analysis and processing require too much manpower and material resources.

[0024] In the first aspect, a display module production tracing method is provided, such as Figure 1 , Figure 1 A flowchart of an embodiment of a display module production tracing method according to the present application includes: S100 , using the production time, production material number and production line type to obtain the first ID and corresponding information file of each display module 503 to be tested, and burning the first ID into the first driver module 5031 of the display module 503 to be tested to obtain the second ID.

[0025] In a preferred embodiment, Figure 2 , Figure 2 yes Figure 1 A flowchart of a specific implementation of S100; S100 includes: S110, representing the production line type and time in order by corresponding hexadecimal numbers, and setting them in the data sequence in sequence; S120, arranging the production material number after the time number, and obtaining the first ID.

[0026] In this embodiment, the central control module 501 generates a first ID for each display module 503 to be tested. The first ID is a coding sequence consisting of a generation time, a generation material number, and a production line type.

[0027] In this embodiment, the central control module 501 may be a central control center composed of a computer cluster, or may be a single computer.

[0028] like Figure 8 , Figure 8 This is a comparison chart of the various data bits of the ID sequence in this application and the hexadecimal number. The production time includes year, month, and day. The year takes the last digit, and the month and day are represented by the corresponding hexadecimal numbers in sequence. The production line type is also represented by the corresponding hexadecimal data in sequence. The material number can be composed of a four-digit code and set after the ID.

[0029] From the above, we can see that the data sequence format structure of the first ID is as shown in Table 1: Table 1 First ID data sequence format structure First Second place Third place Fourth place Fifth to eighth place Production line Year moon day Material number In practice, the first ID consists of 8 hexadecimal digits. For example, the first digit represents the production line, the second digit represents the last digit of the year of production, the third digit represents the month of production, the fourth digit represents the date of production, and the fifth, sixth, seventh, and eighth digits represent the sample number. For example, if the second sample was produced on June 25, 2024, on line 8, the ID would be 846S0002.

[0030] In a preferred embodiment, Figure 3 , Figure 3 yes Figure 2 Flowchart of a specific implementation after S120 in FIG. 1 ; after S120, S100 further includes: S130 , burning the first ID into the first driver module 5031 of the display module 503 to be tested; S140 , distributing the first ID to the second driver module 502 of the tracing system.

[0031] In this embodiment, the first driving module 5031 can be the driving IC of the display module 503 to be tested, which is used to drive and light up the display screen of the display module 503 to be tested. The second driving module 502 is used to drive and control the first driving module 5031, test the driving IC, and return test data and corresponding ID to the central control module 501.

[0032] During specific implementation, the central control module 501 burns the first ID into the first driver module 5031 through the second driver module 502, and distributes the first ID to the second driver module 502 at the same time. Before the formal test, the second driver module 502 determines whether there is an abnormality in the first driver module 5031 by comparing the first ID, that is, whether the driver IC of the display module 503 to be tested is normal.

[0033] S200 , reading back the second ID and comparing the second ID with the first ID. If they are inconsistent, generating a first abnormal sub-ID and saving abnormal information in the first abnormal sub-ID. The test of the current display module 503 to be tested is terminated.

[0034] In a preferred embodiment, Figure 4 , Figure 4 yes Figure 1 Flowchart of a specific implementation of S200 in FIG. 5 ; S200 includes: S210, using the second driver module 502 to read back the second ID; S220, the second driver module 502 compares the second ID with the first ID, and if they are inconsistent, returns the comparison result and the corresponding first ID to the central control module 501 of the traceability system; S230, the central control module 501 generates a first abnormal sub-ID corresponding to the first ID based on the comparison result, and saves the abnormal content in the first abnormal sub-ID.

[0035] In this embodiment, before driving and lighting up the display module 503 to be tested, the driver IC of the display module 503 to be tested, that is, the first driver module 5031, is tested. In the specific implementation, the second driver module 502 reads the second ID from the first driver module 5031 and compares it with the first ID obtained by distribution. If they are consistent, the driver IC of the display module 503 to be tested is normal. If they are inconsistent, the display module 503 to be tested is judged to be a defective product. The second driver module 502 needs to return the comparison result and its corresponding first ID to the central control module 501. The central control module 501 generates a first abnormal sub-ID based on its first ID, and then saves the abnormal information content of the test to the first abnormal sub-ID for traceability, statistics and analysis.

[0036] S300 , if the second ID is consistent with the first ID, the display module to be tested 503 is driven to light up, multiple test screens are displayed in sequence for testing, and the test process and each test result are saved in a corresponding information file.

[0037] In a preferred embodiment, Figure 5 , Figure 5 yes Figure 1 S300 comprises: S310, the first driver module 5031 lights up the display module 503 to be tested according to the instruction of the second driver module 502, and displays the test screen; S320, if the current test screen is normal, the next test screen is displayed.

[0038] In this embodiment, the second driver module 502 provides an initialization code to the first driver module 5031 and controls the first driver module 5031 to drive the test screen of the display screen. When the test screen is working normally, the test is continued and the test results are returned to the central control module 501 through the second driver module 502.

[0039] In a preferred embodiment, Figure 6 , Figure 6 yes Figure 5 Flowchart of a specific implementation after S320; after S320, S300 further includes: S330. Use the second driver module 502 to control the first driver module 5031 to drive the display module 503 to be tested to display a specified test screen. S340. Use the test module 504 to obtain the CIE data and power consumption information of the specified test screen and transmit them to the central control module 501 of the traceability system. S350. The central control module 501 saves the CIE data and power consumption information in the information file corresponding to the first ID.

[0040] In this embodiment, it is stipulated that the test screen can be white. The test unit CS410 probe of the test module 504 will measure the CIE data of the display screen when the screen is white and simultaneously record the power consumption at this time, and send it back to the host computer (computer) to produce the corresponding ID file for record.

[0041] In a preferred embodiment, Figure 7 , Figure 7 yes Figure 5 A flowchart of another specific implementation method after S320; after S320, S300 also includes: S360, if the current test screen is abnormal, the first ID and abnormal information content of the display module 503 to be tested are returned to the central control module 501 through the second driving module 502; S370, the central control module 501 generates a second abnormal sub-ID corresponding to the first ID, and saves the abnormal information content in the second abnormal sub-ID.

[0042] When a test screen is abnormal, the operator can select the NG key through the operation button of the first drive module 5031. The second drive module 502 will then return the test result to the central control module 501. The central control module 501 generates a second abnormal sub-ID based on the test result. The operator can use the second drive module 502 to enter a simple text description of the abnormality of the test screen and save it to the second abnormal sub-ID.

[0043] S400: Read the information file corresponding to the first ID based on the first ID to trace the display module. By burning a corresponding ID for each display module and saving the test process and test information content to the corresponding ID, when a display module abnormality occurs, an abnormal sub-ID corresponding to the ID is generated to save the abnormal content. The test process and test results of the display module product can be traced based on the ID. Not only can the display module be quickly traced based on the ID to understand the test process of the display module, but also defective products can be systematically and scientifically counted and analyzed using big data, providing an important data foundation for the subsequent generation of display modules. This solves the problem of excessive defective TFT display modules in existing consumer products and the excessive human and material resources required for analysis and processing.

[0044] In the second aspect, a display module production traceability system, such as Figure 9 , Figure 9 : is a schematic diagram of the structure of the display module production tracing system in this application, which adopts the display module production tracing method of the first aspect, including: Central control module 501, second driving module 502, display module to be tested 503 and testing module 504; The display module 503 to be tested includes a first driving module 5031; The central control module 501 is respectively connected to the first driving module 5031, the second driving module 502, and the testing module 504. The first driving module 5031 is also connected to the second driving module 502. The first driving module 5031 is also connected to the testing module 504. The central control module 501 is used to obtain the first ID and corresponding information file of each display module 503 to be tested by using the production time, production material number and production line, and burn the first ID into the first driver module 5031 of the display module 503 to be tested, obtain the second ID, save the returned test results to the corresponding information file, determine whether to generate the first abnormal sub-ID and the second abnormal sub-ID according to the test results, and save the abnormal information to the first abnormal sub-ID and the second abnormal sub-ID respectively. The first driving module 5031 is used to drive the display module 503 to be tested according to the instruction of the second driving module 502, and provide its own first ID to the testing module 504; The second driver module 502 is used to control the first driver module 5031, and read back the first ID from the first driver module 5031, compare the first ID with the second ID, and if they are inconsistent, return the corresponding first ID and test results to the central control module 501; The testing module 504 is used to test the displayed multiple test screens, test the CIE data and power consumption data of the specified test screens, and return the data to the central control module 501.

[0045] In conjunction with the display module production traceability system of the second aspect of the present invention, in a first possible implementation, the central control module 501 includes: The acquisition unit is used to sort the production line type and time in the order of hexadecimal numbers, set them in the ID sequence in sequence, put the production material number after the time sequence, and obtain the first ID.

[0046] In conjunction with the display module production tracing system of the second aspect of the present invention, in a second possible implementation, the second driving module 502 includes: The determination unit is configured to compare the second ID with the first ID. If they are inconsistent, it is determined that the first driving module 5031 of the display module 503 to be tested is abnormal and the display module 503 to be tested is defective.

[0047] Compared with the prior art, the embodiments of the present application mainly have the following technical effects: by burning a corresponding ID for each display module and saving the test process and test information content to the corresponding ID, when a display module abnormality occurs, an abnormal sub-ID of the corresponding ID is generated to save the abnormal content. The test process and test results of the display module product can be traced according to the ID. Not only can the display module be quickly traced according to the ID and the test process of the display module be understood, but also defective products can be systematically and scientifically counted and analyzed using big data to provide an important data basis for the subsequent generation of display modules, solving the problem of too many defective TFT display modules in existing consumer products and the need for too much manpower and material resources for analysis and processing.

[0048] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A display module production tracing method, characterized in that it includes: Using the production time, production material number and production line type, obtain the first ID and the corresponding information file of each display module to be tested, and burn the first ID into the first driver module of the display module to be tested to obtain the second ID; Read back the second ID, and compare the second ID with the first ID. If they are inconsistent, generate a first abnormal sub-ID and save the abnormal information in the first abnormal sub-ID, and terminate the test of the current display module to be tested; If the second ID is consistent with the first ID, the display module to be tested is driven to light up, multiple test screens are displayed in sequence for testing, and the test process and each test result are saved in a corresponding information file; According to the first ID, the information file corresponding to the first ID is read to trace the display module.

2. The display module production tracing method according to claim 1, characterized in that: The method of obtaining a first ID and a corresponding information file of each display module to be tested by using the production time, production material number and production line, and burning the first ID into the first driving module of the display module to be tested to obtain a second ID includes: The production line types and times are represented by corresponding hexadecimal numbers in order and are sequentially set in the data sequence; Sort the production material number after the time number and get the first ID.

3. The display module production tracing method according to claim 2, characterized in that: After the production material number is arranged after the time number and the first ID is obtained, the first ID and the corresponding information file of each display module to be tested are obtained by using the production time, the production material number and the production line, and the first ID is burned into the first driving module of the display module to be tested to obtain the second ID, and further includes: Burning the first ID into the first driving module of the display module to be tested; The first ID is distributed to a second driving module of the tracing system.

4. The display module production tracing method according to claim 1, characterized in that: The method of reading back the second ID and comparing the second ID with the first ID, if they are inconsistent, generating a first abnormal sub-ID and storing abnormal information in the first abnormal sub-ID, and terminating the test of the current display module to be tested, includes: Using a second driver module to read back the second ID; The second driving module compares the second ID with the first ID, and if they are inconsistent, returns the comparison result and the corresponding first ID to the central control module of the traceability system; The central control module generates the first abnormal sub-ID corresponding to the first ID according to the comparison result, and stores the abnormal content in the first abnormal sub-ID.

5. The display module production tracing method according to claim 1, characterized in that: If the second ID is consistent with the first ID, the display module to be tested is driven to light up, multiple test screens are displayed in sequence for testing, and the test process and each test result are saved in a corresponding information file, including: The first driving module lights up the display module to be tested according to the instruction of the second driving module, and displays a test screen; If the current test screen is normal, the next test screen will be displayed.

6. The display module production tracing method according to claim 5, characterized in that: If the current test screen is normal, the next test screen is displayed. After that, if the second ID is consistent with the first ID, the display module to be tested is driven to light up, multiple test screens are displayed in sequence for testing, and the test process and each test result are saved in a corresponding information file, and also includes: Using the second driving module to control the first driving module to drive the display module to be tested to display a specified test screen; The CIE data and power consumption information of the specified test screen are obtained by using the test module and transmitted to the central control module of the traceability system; The central control module saves the CIE data and power consumption information in an information file corresponding to the first ID.

7. The display module production tracing method according to claim 5, characterized in that: If the current test screen is normal, the next test screen is displayed. After that, if the second ID is consistent with the first ID, the display module to be tested is driven to light up, multiple test screens are displayed in sequence for testing, and the test process and each test result are saved in a corresponding information file, and also includes: If the current test screen is abnormal, the first ID and abnormal information content of the display module to be tested are returned to the central control module through the second driving module; The central control module generates a second abnormal sub-ID corresponding to the first ID, and stores the abnormal information content in the second abnormal sub-ID.

8. A display module production tracing system, using the display module production tracing method according to any one of claims 1 to 7, characterized in that: include: Central control module, second drive module, display module to be tested and test module; The display module to be tested includes a first driving module; The central control module is respectively connected to the first driving module, the second driving module and the test module in communication, the first driving module is also connected to the second driving module in communication, and the first driving module is also connected to the test module in communication; The central control module is used to obtain the first ID and the corresponding information file of each display module to be tested by using the production time, production material number and production line, and burn the first ID into the first driving module of the display module to be tested, obtain the second ID, save the returned test result to the corresponding information file, determine whether to generate the first abnormal sub-ID and the second abnormal sub-ID according to the test result, and save the abnormal information to the first abnormal sub-ID and the second abnormal sub-ID respectively. The first driving module is used to drive the display module to be tested according to the instruction of the second driving module, and provide its own first ID to the testing module; The second driving module is used to control the first driving module, and read back the first ID from the first driving module, compare the first ID with the second ID, and if they are inconsistent, return the corresponding first ID and the test result to the central control module; The test module is used to test the displayed multiple test screens, test the CIE data and power consumption data of the specified test screens, and return them to the central control module.

9. The display module production tracing system according to claim 8, characterized in that: The central control module includes: The acquisition unit is used to sort the production line and time in the order of hexadecimal numbers, set them in the ID sequence in sequence, put the production material number after the time sequence, and obtain the first ID.

10. The display module production tracing system according to claim 8, characterized in that: The second driving module comprises: The determination unit is used to compare the second ID with the first ID. If they are inconsistent, it is determined that the first driving module of the display module to be tested is abnormal and the display module to be tested is a defective product.

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