A solid state hard disk integrated test cabinet and its control system

Abstract

The invention provides a solid state hard disk integrated test cabinet and a control system thereof, which relate to the technical field of solid state hard disk detection, and comprise an external detection module, an internal detection module, a preprocessing module, a data analysis module, a comprehensive screening module, and a quality judgment module. The external detection module is used to collect multiple groups of environmental parameters of the environment in which the solid state hard disk to be tested is located and multiple groups of working parameters of the solid state hard disk. Various parameters of the solid state hard disk are collected through the external detection module, the internal detection module, the preprocessing module, the data analysis module, the comprehensive screening module, and the quality judgment module, and transmitted to a computer for storage. Various parameters of the solid state hard disk are analyzed and processed to generate an external quality evaluation index Wz and an operation quality evaluation index Yz, so as to accurately evaluate the performance and quality grade of the solid state hard disk, and then the solid state hard disk is subjected to corresponding comprehensive judgment and processing by comparison with an external quality evaluation threshold and an operation quality evaluation threshold.

Description

Technical Field

[0001] The present invention relates to the technical field of solid state hard disk detection, in particular to a solid state hard disk integrated test cabinet and a control system thereof. Background Art

[0002] A solid-state drive is a data storage device that uses solid-state memory to store data. Compared with a traditional mechanical hard drive, it has no moving parts and uses flash storage technology. Compared with a mechanical hard drive, a solid-state drive has the advantages of fast read and write speed, greater durability, lightness and portability, low power consumption, no noise, and shock and drop resistance. The detection of a solid-state drive can involve many aspects, such as detecting the health status and performance parameters of a solid-state drive through software.

[0003] The Chinese invention patent with publication number CN202110831324.X discloses a method for testing SSD solid-state hard disks, including the following steps: Step S1: Test the compressive strength of the SSD solid-state hard disk and determine whether the compressive strength test is qualified; if yes, proceed to step S2; if no, stop testing and other steps. The present invention tests the performance of the SSD solid-state hard disk by a track-type test method, which well simulates the real application scenario. At the same time, the maximum transmission rate, minimum transmission rate, average transmission rate, random access time, burst data transmission rate, and read-write rate of the solid-state hard disk are tested by the CrystalDiskMark software to ensure the adequacy and accuracy of the performance test of the solid-state hard disk. The present invention well solves the problem that the existing SSD solid-state hard disk test method has a gap with the actual use situation, is susceptible to system limitations, and has poor test result accuracy. It only compares the compressive resistance, internal parameters during use, and high temperature resistance of the solid-state hard disk, thereby eliminating unqualified products, and cannot conduct a targeted comprehensive evaluation of the internal parameter performance and actual service life of the solid-state hard disk, resulting in one-sided and inaccurate detection.

[0004] The above information disclosed in this Background section is only for enhancement of understanding of the background of the present disclosure and therefore it may contain information that does not constitute the prior art that is already known to one of ordinary skill in the art. Summary of the invention

[0005] The object of the present invention is to provide a solid state hard disk integrated test cabinet and a control system thereof to solve the problems raised in the above background technology.

[0006] To achieve the above object, the present invention provides the following technical solutions:

[0007] A solid state hard disk integrated test control system, comprising:

[0008] An external detection module, the external detection module is used to collect multiple sets of environmental parameters of the environment in which the solid-state hard disk to be tested is located and multiple sets of working parameters of the solid-state hard disk, the environmental parameters include the surface temperature of the solid-state hard disk when it is working and the ambient temperature of the environment in which the solid-state hard disk is located, and the working parameters include the working voltage and working current of the solid-state hard disk to be tested;

[0009] An internal detection module, which is used to detect internal parameters of the solid-state hard disk when it is working, and the internal parameters include the maximum transmission rate, the minimum transmission rate, the average transmission rate, the random storage time, the read and write rate, and the CPU occupancy rate of the hard disk;

[0010] A preprocessing module, wherein the preprocessing module receives the environmental parameters and working parameters collected by the external detection module, generates actual life data and average power consumption data of the solid state drive according to the environmental parameters and working parameters, and analyzes and processes the actual life data and average power consumption data of the solid state drive to generate an external quality evaluation index;

[0011] A data analysis module, the data analysis module is used to receive the internal parameter data collected by the internal detection module, establish a data analysis model, and generate an operation quality evaluation index based on the internal parameter data;

[0012] A comprehensive screening module, wherein the comprehensive screening module receives an external quality assessment index and an operation quality assessment index, and compares and analyzes them with a preset external quality assessment threshold and an operation quality assessment threshold, respectively, to generate a quality grade signal;

[0013] The quality judgment module sends out quality grade information according to the quality grade signal, and the quality grade information includes qualified and unqualified.

[0014] Furthermore, the logic of collecting multiple sets of environmental parameter data and multiple sets of working parameter data is to collect the surface temperature of the solid state hard disk when it is working, the ambient temperature of the environment in which the solid state hard disk is located, the working voltage data and the working current data of the solid state hard disk to be tested at equal time intervals n times, and mark them as T i , Tt i 、V i and A i , where i represents the mark of the moment, i = 1, 2, 3...n, n∈N + And n≥10.

[0015] Furthermore, the internal detection module is implemented by HD Tune Pro and Aida64Extreme software set in the computer, which is used to detect the internal parameters of the solid-state hard disk: the highest transmission rate SH, the lowest transmission rate SL, the average transmission rate SJ, the random storage time ST, the read and write rate Sv, the CPU occupancy Cy, and can output a curve graph of the transmission rate changing with time. The curve data is represented by C(t), t∈[t1,t1+t0], thus:

[0016] Maximum transmission rate SH = max[C(t), t∈[t1, t1+t0]]

[0017] Minimum transmission rate SL = min[C(t), t∈[t1,t1+t0]]

[0018] Average transfer rate

[0019] Furthermore, the external detection module includes an ammeter, a temperature sensor A, a temperature sensor B, and a voltmeter, which are respectively used to detect the solid state hard disk current Ai, the solid state hard disk surface temperature Ti, and the ambient temperature Tt i , the solid state hard disk voltage Vi, the ammeter and the voltmeter are both electrically connected to the solid state hard disk, the temperature sensor A is arranged on the surface of the solid state hard disk, and the temperature sensor B is arranged inside the integrated test cabinet.

[0020] Furthermore, the pre-processing module processes the surface temperature Ti and the ambient temperature Tt of the solid state hard disk. i For data processing, the following formula is used:

[0021]

[0022] Where AF is the acceleration factor; SS is the actual life of the SSD; Ct is the time from the test SSD running to damage, which is a positive integer in hours; k is the Boltzmann constant, which is equal to 8.617×10 -5 ; Tu is the temperature of the SSD when the user normally uses it, and its value is 0-50 degrees; Tp is the average temperature of the SSD surface during the test; Ti is the surface temperature of the SSD corresponding to the time i with a value of 1, 2, 3...n, and the unit of time i is seconds.

[0023] Furthermore, the preprocessing module processes the SSD voltage Vi and the SSD current Ai to generate an average power consumption W using the following formula:

[0024]

[0025] Wherein, Vi and Ai are the voltage and current of the solid state drive at time i, i is a positive integer of 1, 2, 3...n, in seconds, and W is the average power consumption of the solid state drive.

[0026] Furthermore, the preprocessing module processes the average power consumption W of the solid state drive and the actual life SS of the solid state drive to generate an external quality evaluation index Wz using the following formula:

[0027]

[0028] Furthermore, the data analysis module performs dimensionless processing on the highest transmission rate SH, the lowest transmission rate SL, the average transmission rate SJ, the random storage time ST, the read / write rate Sv, and the CPU occupancy rate Cy, and associates the parameters to generate the operation quality evaluation index Yz. The association formula is as follows:

[0029]

[0030] Among them, the meanings of the parameters are: α is the maximum transmission rate influencing factor, 0.01≤α≤0.09; β is the storage and write rate influencing factor, 0.05≤β≤0.15, γ is the minimum transmission rate influencing factor, 0.18≤γ≤0.69; δ is the average transmission rate influencing factor, 0.55≤γ≤0.83, and C is the constant correction coefficient.

[0031] Furthermore, the operation logic of the comprehensive screening module is as follows:

[0032] When the external quality assessment index Wz is greater than or equal to the external quality assessment threshold, if the operation quality assessment index Yz is greater than or equal to the operation quality assessment threshold, the solid state drive being tested is marked as quality grade A; if the operation quality assessment index Yz is less than the operation quality assessment threshold, the solid state drive being tested is marked as quality grade AB;

[0033] When the external quality assessment index Wz is less than the external quality assessment threshold, if the operation quality assessment index Yz is less than the operation quality assessment threshold, the solid state drive being tested is marked as quality grade B; if the operation quality assessment index Yz is greater than or equal to the operation quality assessment threshold, the solid state drive being tested is marked as quality grade C;

[0034] The quality grade A, quality grade AB and quality grade B are all unqualified products, and the quality grade C is a qualified product.

[0035] The present invention also proposes an integrated test cabinet for solid-state hard drives, including a temperature control module. The temperature control module includes a refrigerator, an exhaust fan, and a heater, which are respectively used to control and lower the internal ambient temperature of the integrated test cabinet, discharge the internal heat of the integrated test cabinet to assist in heat dissipation, and control and increase the internal ambient temperature of the integrated test cabinet.

[0036] Compared with the prior art, the present invention has the following beneficial effects:

[0037] The present invention collects various parameters of the solid-state hard disk through an external detection module, an internal detection module, a preprocessing module, a data analysis module, a comprehensive screening module, and a quality judgment module, and transmits them to a computer for storage, analyzes and processes various parameters of the solid-state hard disk and generates an external quality evaluation index Wz and an operation quality evaluation index Yz, thereby accurately evaluating the performance and quality level of the solid-state hard disk, and then performs a corresponding comprehensive judgment and processing on the solid-state hard disk by comparing with an external quality evaluation threshold and an operation quality evaluation threshold. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 It is a module diagram of the control system of the present invention;

[0039] Figure 2 is a module diagram of the external detection module of the present invention;

[0040] Figure 3 This is a module diagram of the temperature control module of the present invention. DETAILED DESCRIPTION

[0041] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with specific embodiments.

[0042] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the present invention should be understood by people with ordinary skills in the field to which the present invention belongs. The words "first", "second" and similar words used in the present invention do not indicate any order, quantity or importance, but are only used to distinguish different components. "Include" or "comprise" and similar words mean that the elements or objects appearing before the word include the elements or objects listed after the word and their equivalents, without excluding other elements or objects. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0043] Example:

[0044] See also Figure 1, the present invention provides a technical solution:

[0045] A solid state hard disk integrated test control system, comprising:

[0046] The external detection module, when the solid-state hard disk is working, its internal parameters during operation will be affected by the ambient temperature, its own surface temperature, voltage, and current. Therefore, the external detection module is set to collect multiple sets of environmental parameters of the environment in which the solid-state hard disk to be tested is located and multiple sets of working parameters of the solid-state hard disk. The environmental parameters include the surface temperature of the solid-state hard disk when it is working and the ambient temperature of the environment in which the solid-state hard disk is located. The working parameters include the working voltage and working current of the solid-state hard disk to be tested. The logic of collecting multiple sets of environmental parameter data and multiple sets of working parameter data is to collect the surface temperature of the solid-state hard disk when it is working, the ambient temperature of the environment in which the solid-state hard disk is located, the working voltage data and the working current data of the solid-state hard disk to be tested at equal time intervals at n moments, and calibrate them as T respectively. i , Tt i 、V i and A i , where i represents the mark of the moment, i = 1, 2, 3...n, n∈N + The external detection module includes an ammeter, a temperature sensor A, a temperature sensor B, and a voltmeter, which are used to detect the solid state hard disk current Ai, the solid state hard disk surface temperature Ti, and the ambient temperature Tt respectively. i , the solid state hard disk voltage Vi, the ammeter and the voltmeter are both electrically connected to the solid state hard disk, the temperature sensor A is arranged on the surface of the solid state hard disk, and the temperature sensor B is arranged inside the integrated test cabinet.

[0047] The internal detection module, in order to evaluate the working state of the solid state hard disk, needs to detect the internal parameters of the solid state hard disk when it is working, so the internal detection module is set to detect the internal parameters of the solid state hard disk when it is working, and the internal parameters include the maximum transmission rate, minimum transmission rate, average transmission rate, random storage time, read and write rate, and CPU occupancy rate of the hard disk; the internal detection module is implemented by HD Tune Pro and Aida64 Extreme software set in the computer, and is used to detect the internal parameters of the solid state hard disk: maximum transmission rate SH, minimum transmission rate SL, average transmission rate SJ, random storage time ST, read and write rate Sv, CPU occupancy rate Cy, and can output a curve graph of the transmission rate changing with time, and the curve data is represented by C(t), t∈[t1,t1+t0], so:

[0048] Maximum transmission rate SH = max[C(t), t∈[t1,t1+t0]]

[0049] Minimum transmission rate SL = min[C(t), t∈[t1,t1+t0]]

[0050] Average transfer rate

[0051] A preprocessing module receives environmental parameters and working parameters collected by an external detection module, generates actual life data and average power consumption data of the solid-state hard disk according to the environmental parameters and working parameters, and analyzes and processes the actual life data and average power consumption data of the solid-state hard disk to generate an external quality evaluation index; the actual life data reflects the service life of the solid-state hard disk, the average power consumption data reflects the power consumption of the solid-state hard disk, and the external quality evaluation index obtained through fitting processing reflects the failure rate coefficient of the solid-state hard disk in one year of operation. The preprocessing module analyzes the surface temperature Ti and the ambient temperature Tt of the solid-state hard disk. i For data processing, the following formula is used:

[0052]

[0053] At a specific test temperature Tp, the actual service life SS of the solid state drive is calculated by testing the time from the solid state drive running to damage.

[0054] Where AF is the acceleration factor; SS is the actual life of the SSD; Ct is the time from the test SSD running to damage, which is a positive integer in hours; k is the Boltzmann constant, which is equal to 8.617×10 -5 ; Tu is the temperature of the SSD when the user normally uses it, and its value is 0-50 degrees; Tp is the average temperature of the SSD surface during the test; Ti is the surface temperature of the SSD corresponding to the time i with a value of 1, 2, 3...n, and the unit of time i is seconds.

[0055] The preprocessing module processes the SSD voltage Vi and the SSD current Ai to generate an average power consumption W using the following formula:

[0056]

[0057] Wherein, Vi and Ai are the voltage and current of the solid state drive at time i, i is a positive integer of 1, 2, 3...n, in seconds, and W is the average power consumption of the solid state drive.

[0058] The preprocessing module processes the average power consumption W of the solid state drive and the actual life SS of the solid state drive to generate an external quality evaluation index Wz using the following formula:

[0059]

[0060] The data analysis module is used to receive the internal parameter data collected by the internal detection module, establish a data analysis model, and generate an operation quality evaluation index based on the internal parameter data; the maximum transmission rate SH, the minimum transmission rate SL, the average transmission rate SJ, the random storage time ST, the read and write rate Sv, and the CPU occupancy rate Cy are dimensionlessly processed by the data analysis module, and the parameters are associated to generate an operation quality evaluation index Yz. The quality evaluation index Yz reflects the parameter coefficient of whether the performance of the solid state drive itself is good or not. The association formula is as follows:

[0061]

[0062] Among them, the meanings of the parameters are: α is the maximum transmission rate influencing factor, 0.01≤α≤0.09; β is the storage and write rate influencing factor, 0.05≤β≤0.15, γ is the minimum transmission rate influencing factor, 0.18≤γ≤0.69; δ is the average transmission rate influencing factor, 0.55≤γ≤0.83, and C is the constant correction coefficient.

[0063] The comprehensive screening module receives the external quality assessment index and the operation quality assessment index, and compares and analyzes them with the preset external quality assessment threshold and the operation quality assessment threshold, respectively, to generate a quality grade signal; the operation logic of the comprehensive screening module is as follows:

[0064] When the external quality assessment index Wz is greater than or equal to the external quality assessment threshold, if the operation quality assessment index Yz is greater than or equal to the operation quality assessment threshold, the solid-state drive to be tested is marked as quality grade A; if the operation quality assessment index Yz is less than the operation quality assessment threshold, the solid-state drive to be tested is marked as quality grade AB; wherein the external quality assessment threshold is 0.5% and the operation quality assessment threshold is 1.

[0065] When the external quality assessment index Wz is less than the external quality assessment threshold, if the operation quality assessment index Yz is less than the operation quality assessment threshold, the solid state drive being tested is marked as quality grade B; if the operation quality assessment index Yz is greater than or equal to the operation quality assessment threshold, the solid state drive being tested is marked as quality grade C;

[0066] The quality judgment module sends quality grade information according to the quality grade signal, and the quality grade information includes qualified and unqualified. The quality judgment module judges that the solid state drives of quality grade A, quality grade AB and quality grade B are all unqualified products, and judges that the solid state drives of quality grade C are all qualified products.

[0067] See also Figure 2-Figure 3The present invention also provides a solid state drive integrated test cabinet, including a temperature control module, the temperature control module is used to control the ambient temperature Tt inside the integrated test cabinet i , where the cooler is used to control and reduce the internal ambient temperature Tt of the integrated test cabinet i , the exhaust fan is used to exhaust the internal heat of the integrated test cabinet to assist in heat dissipation, and the heater is used to control and increase the internal ambient temperature Tt of the integrated test cabinet i The computer is electrically connected to the temperature control module through a microprocessor. By controlling the temperature control module through a computer, the interior of the integrated test cabinet can be adjusted to the test temperature. The refrigerator compresses the refrigerant by using a compressor to produce a high-temperature and high-pressure gas, which is then cooled into a liquid state by a condenser. The liquid refrigerant is evaporated into a gaseous state by an evaporator, which is responsible for taking away the heat inside the integrated test cabinet and lowering the internal temperature of the integrated test cabinet. The heater converts electrical energy into thermal energy, thereby raising the internal temperature to the set temperature. The exhaust fan is used to discharge excess heat, thereby achieving the effect of stabilizing the internal temperature of the integrated test cabinet.

[0068] The above formulas are all dimensionless and numerical calculations. The formula is a formula for the most recent real situation obtained by collecting a large amount of data and performing software simulation. The preset parameters in the formula are set by technicians in this field according to actual conditions.

[0069] The above embodiments may be implemented in whole or in part by software, hardware, firmware or any other combination thereof. When implemented using software, the above embodiments may be implemented in whole or in part in the form of a computer program product. Those skilled in the art may appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein may be implemented by computer software, electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed by hardware or software depends on the specific application and design constraints of the technical solution.

[0070] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, and may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0071] The above description is only a specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application.

Claims

1. A solid state hard disk integrated test control system, characterized in that: include: An external detection module, the external detection module is used to collect multiple sets of environmental parameters of the environment in which the solid-state hard disk to be tested is located and multiple sets of working parameters of the solid-state hard disk, the environmental parameters include the surface temperature of the solid-state hard disk when it is working and the ambient temperature of the environment in which the solid-state hard disk is located, and the working parameters include the working voltage and working current of the solid-state hard disk to be tested; An internal detection module, which is used to detect internal parameters of the solid-state hard disk when it is working, and the internal parameters include the maximum transmission rate, the minimum transmission rate, the average transmission rate, the random storage time, the read and write rate, and the CPU occupancy rate of the hard disk; A preprocessing module, wherein the preprocessing module receives the environmental parameters and working parameters collected by the external detection module, generates actual life data and average power consumption data of the solid state drive according to the environmental parameters and working parameters, and analyzes and processes the actual life data and average power consumption data of the solid state drive to generate an external quality evaluation index; A data analysis module, the data analysis module is used to receive the internal parameter data collected by the internal detection module, establish a data analysis model, and generate an operation quality evaluation index based on the internal parameter data; A comprehensive screening module, wherein the comprehensive screening module receives an external quality assessment index and an operation quality assessment index, and compares and analyzes them with a preset external quality assessment threshold and an operation quality assessment threshold, respectively, to generate a quality grade signal; The quality judgment module sends out quality grade information according to the quality grade signal, and the quality grade information includes qualified and unqualified.

2. The solid state drive integrated test system according to claim 1, characterized in that: The logic of collecting multiple sets of environmental parameter data and multiple sets of working parameter data is to collect the surface temperature of the solid state drive when it is working, the ambient temperature of the environment where the solid state drive is located, the working voltage data and the working current data of the solid state drive to be tested at equal time intervals n times, and mark them as T i , Tt i 、V i and A i , where i represents the mark of the moment, i = 1, 2, 3...n, n∈N + And n≥10.

3. A solid state drive integrated test cabinet The solid state drive integrated test system according to claim 1, characterized in that: The internal detection module is implemented by HD Tune Pro and Aida64 Extreme software set in the computer, and is used to detect the internal parameters of the solid state drive: the highest transmission rate SH, the lowest transmission rate SL, the average transmission rate SJ, the random storage time ST, the read and write rate Sv, the CPU occupancy Cy, and can output a curve graph of the transmission rate changing with time. The curve data is represented by C(t), t∈[t1,t1+t0], so: Maximum transmission rate SH = max[C(t), t∈[t1, t1+t0]] Minimum transmission rate SL = min[C(t), t∈[t1,t1+t0]] Average transfer rate 4. The solid state drive integrated test system according to claim 1, characterized in that: The external detection module includes an ammeter, a temperature sensor A, a temperature sensor B, and a voltmeter, which are used to detect the solid state hard disk current Ai, the solid state hard disk surface temperature Ti, and the ambient temperature Tt respectively. i , the solid state hard disk voltage Vi, the ammeter and the voltmeter are both electrically connected to the solid state hard disk, the temperature sensor A is arranged on the surface of the solid state hard disk, and the temperature sensor B is arranged inside the integrated test cabinet.

5. The solid state drive integrated test system according to claim 1, characterized in that: The preprocessing module processes the surface temperature Ti and the ambient temperature Tt of the solid state hard disk. i For data processing, the following formula is used: Where AF is the acceleration factor; SS is the actual life of the SSD; Ct is the time from the test SSD running to damage, which is a positive integer in hours; k is the Boltzmann constant, which is equal to 8.617×10 -5 ; Tu is the temperature of the SSD when the user normally uses it, and its value is 0-50 degrees; Tp is the average temperature of the SSD surface during the test; Ti is the surface temperature of the SSD corresponding to the time i with a value of 1, 2, 3...n, and the unit of time i is seconds.

6. The solid state drive integrated test system according to claim 1, characterized in that: The preprocessing module processes the SSD voltage Vi and the SSD current Ai to generate an average power consumption W using the following formula: Wherein, Vi and Ai are the voltage and current of the solid state drive at time i, i is a positive integer of 1, 2, 3...n, in seconds, and W is the average power consumption of the solid state drive.

7. A solid state drive integrated test system according to any one of claims 5-6, characterized in that: The preprocessing module processes the average power consumption W of the solid state drive and the actual life SS of the solid state drive to generate an external quality evaluation index Wz using the following formula:

8. The solid state drive integrated testing system according to claim 1, characterized in that: The data analysis module performs dimensionless processing on the highest transmission rate SH, the lowest transmission rate SL, the average transmission rate SJ, the random storage time ST, the read / write rate Sv, and the CPU occupancy rate Cy, and associates each parameter to generate the operation quality evaluation index Yz. The association formula is as follows: Among them, the meanings of the parameters are: α is the maximum transmission rate influencing factor, 0.01≤α≤0.09; β is the storage and write rate influencing factor, 0.05≤β≤0.15, γ is the minimum transmission rate influencing factor, 0.18≤γ≤0.69; δ is the average transmission rate influencing factor, 0.55≤γ≤0.83, and C is the constant correction coefficient.

9. A solid state drive integrated test system according to any one of claims 7-8, characterized in that: The operation logic of the comprehensive screening module is as follows: When the external quality assessment index Wz is greater than or equal to the external quality assessment threshold, if the operation quality assessment index Yz is greater than or equal to the operation quality assessment threshold, the solid state drive being tested is marked as quality grade A; if the operation quality assessment index Yz is less than the operation quality assessment threshold, the solid state drive being tested is marked as quality grade AB; When the external quality assessment index Wz is less than the external quality assessment threshold, if the operation quality assessment index Yz is less than the operation quality assessment threshold, the solid state drive being tested is marked as quality grade B; if the operation quality assessment index Yz is greater than or equal to the operation quality assessment threshold, the solid state drive being tested is marked as quality grade C; The quality grade A, quality grade AB and quality grade B are all unqualified products, and the quality grade C is a qualified product.

10. A solid state drive integrated test cabinet, including a temperature control module, characterized in that: The temperature control module includes a refrigerator, an exhaust fan, and a heater, which are respectively used to control and lower the internal ambient temperature of the integrated test cabinet, discharge the internal heat of the integrated test cabinet to assist in heat dissipation, and control and increase the internal ambient temperature of the integrated test cabinet.

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