Electrical equipment defect diagnosis method and system

Abstract

The present application relates to a method for diagnosing defects in electrical equipment, which includes: obtaining operating data of the electrical equipment to be detected, determining the possible defect types of the electrical equipment to be detected based on the temperature data in the operating data, determining a target defect detection method based on the possible defect types and the equipment type of the electrical equipment to be detected, analyzing the operating data based on the target defect detection method to determine whether the electrical equipment to be detected has defects, and if so, determining the defect level of the electrical equipment to be detected based on the defect type and the hotspot temperature data corresponding to the defect in the operating data. Through this application, the problem of low accuracy in diagnosing defects in electrical equipment is solved. The defect type of the electrical equipment is analyzed, the defects of the electrical equipment are accurately determined, and the defect level is determined, thereby improving the accuracy of diagnosing defects in the electrical equipment.

Description

Technical Field

[0001] The present application relates to the field of power equipment detection, and in particular to a method and system for diagnosing defects in electrical equipment. Background Art

[0002] With the rapid development of the national economy, people's lives are becoming more and more dependent on electricity. At the same time, electrical equipment is constantly improving, the power industry's high-quality services are constantly deepening, and power grid companies' equipment maintenance strategies are shifting from planned maintenance to equipment condition-based maintenance, which puts higher requirements on power supply stability and reliability.

[0003] In the prior art, infrared temperature measurement and diagnosis technology is commonly used for online detection of electrical equipment. It is widely used by power maintenance departments because of its advantages of being fast, convenient, highly sensitive, non-contact and long-distance measurement, and not requiring the equipment to be shut down or dismantled. However, the use of infrared temperature measurement and diagnosis technology to diagnose defects in electrical equipment has a single diagnostic method and does not analyze and judge from the root cause, resulting in low efficiency and low diagnostic accuracy of electrical equipment defects.

[0004] Currently, no effective solution has been proposed for the problem of low accuracy in electrical equipment defect diagnosis in related technologies. Summary of the invention

[0005] The embodiments of the present application provide a method, system, electronic device and storage medium for diagnosing defects in electrical equipment to at least solve the problem of low accuracy in diagnosing defects in electrical equipment in the related art.

[0006] In a first aspect, an embodiment of the present application provides a method for diagnosing defects in electrical equipment, the method comprising:

[0007] Acquire operating data of the electrical equipment to be detected, and determine the type of defect that may exist in the electrical equipment to be detected based on temperature data in the operating data;

[0008] Determining a target defect detection method according to the possible defect type and the device type of the electrical device to be detected;

[0009] Based on the target defect detection method, the operating data is analyzed to determine whether the electrical equipment to be detected has defects. If so, the defect level of the electrical equipment to be detected is determined based on the defect type and the hot spot temperature data corresponding to the defect in the operating data.

[0010] In some embodiments, the analyzing the operating data based on the target defect detection method to determine whether the electrical equipment to be detected has defects includes:

[0011] In the case where the electrical device to be detected is a current-type heating electrical device or an electromagnetic effect-type heating electrical device, the operation data is analyzed based on a surface temperature judgment method to determine whether the electrical device to be detected has defects; and / or

[0012] In the case that the electrical equipment to be detected is a small load current type heating electrical equipment, the operation data is analyzed based on the relative temperature difference method to determine whether the electrical equipment to be detected has defects.

[0013] In some embodiments, the analyzing the operating data based on the surface temperature judgment method to determine whether the electrical equipment to be inspected has defects includes:

[0014] Obtaining the hotspot position, thermal image characteristics and hotspot maximum temperature of the electrical equipment to be detected from the operation data;

[0015] Based on the hot spot position, the thermal image characteristics and the hot spot maximum temperature, it is determined whether the electrical equipment to be inspected has defects.

[0016] In some embodiments, the analyzing the operating data based on the relative temperature difference method to determine whether the electrical equipment to be inspected has defects includes:

[0017] Acquire the overheat temperature of the current transformer connecting piece of the electrical equipment to be detected from the operating data;

[0018] Based on the overheat temperature of the current transformer connecting piece, it is determined whether the electrical equipment to be inspected has a defect.

[0019] In some embodiments, the electrical equipment to be detected includes a group of equipment; and determining the possible defect type of the electrical equipment to be detected based on the temperature data in the operation data includes:

[0020] According to the operation data, the temperature difference of the same part of the same group of three-phase electrical equipment, the same phase electrical equipment and the same type of electrical equipment is obtained;

[0021] Based on the temperature difference of the same part of the same group of three-phase electrical equipment, the same-phase electrical equipment and the same type of electrical equipment, the possible defect type of the electrical equipment to be detected is determined.

[0022] In some embodiments, the analyzing the operating data based on the target defect detection method to determine whether the electrical equipment to be detected has defects includes:

[0023] Acquire the contact condition of the middle contact of the electrical equipment to be detected, the end temperature of the arc extinguishing chamber of the relay, the top cap temperature of the circuit breaker and the lower flange temperature from the operation data;

[0024] Based on the contact condition of the middle contact, the end temperature of the relay arc extinguishing chamber, the top cap temperature of the circuit breaker and the lower flange temperature, it is determined whether the electrical equipment to be inspected has defects.

[0025] In some embodiments, the analyzing the operating data based on the target defect detection method to determine whether the electrical equipment to be detected has defects includes:

[0026] According to the operation data, the temperature field distribution of the electrical equipment to be tested in different periods is obtained;

[0027] Obtaining the change of the thermal parameters of the electrical equipment to be detected through the temperature field distribution;

[0028] Based on the change of the thermal parameters, it is determined whether the electrical equipment to be inspected has defects.

[0029] In some embodiments, the analyzing the operating data based on the target defect detection method to determine whether the electrical equipment to be detected has defects includes:

[0030] Acquiring temperature data of the electrical equipment to be detected within a preset time from the operating data;

[0031] Based on the temperature data of the electrical equipment to be detected within a preset time, obtaining the temperature change of the electrical equipment to be detected with load and time;

[0032] Whether the electrical equipment to be inspected has defects is determined based on how the temperature changes with load and time.

[0033] In some embodiments, obtaining the operating data of the electrical equipment to be detected includes:

[0034] The infrared rays naturally radiated by the surface temperature of the electrical equipment to be detected are received by an infrared detector to generate a real-time thermal image corresponding to the thermal distribution of the surface of the electrical equipment to be detected.

[0035] In a second aspect, an embodiment of the present application provides an electrical equipment defect diagnosis system, the system comprising: an acquisition module, an analysis module and a judgment module, wherein:

[0036] The acquisition module is used to acquire the operating data of the electrical device to be detected, and determine the type of defect that may exist in the electrical device to be detected based on the temperature data in the operating data;

[0037] The analysis module is used to determine a target defect detection method according to the possible defect type and the device type of the electrical device to be detected;

[0038] The judgment module is used to analyze the operating data based on the target defect detection method to determine whether the electrical equipment to be detected has defects. If so, determine the defect level of the electrical equipment to be detected based on the defect type and the hot spot temperature data corresponding to the defect in the operating data.

[0039] In a third aspect, an embodiment of the present application provides a computer device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the electrical equipment defect diagnosis method as described in the first aspect above is implemented.

[0040] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the electrical equipment defect diagnosis method as described in the first aspect above.

[0041] Compared with the related art, the electrical equipment defect diagnosis method provided in the embodiment of the present application obtains the operation data of the electrical equipment to be detected, determines the possible defect type of the electrical equipment to be detected based on the temperature data in the operation data, determines the target defect detection method according to the possible defect type and the equipment type of the electrical equipment to be detected, analyzes the operation data based on the target defect detection method, and determines whether the electrical equipment to be detected has defects. If so, determines the defect level of the electrical equipment to be detected according to the defect type and the hot spot temperature data corresponding to the defect in the operation data, thereby solving the problem of low accuracy of electrical equipment defect diagnosis. The defect type of the electrical equipment is analyzed, the defects of the electrical equipment are accurately determined, and the defect level is determined, thereby improving the accuracy of electrical equipment defect diagnosis. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0043] Figure 1 is a flow chart of a method for diagnosing defects in electrical equipment according to an embodiment of the present application;

[0044] Figure 2 is a structural block diagram of an electrical equipment defect diagnosis system according to an embodiment of the present application;

[0045] Figure 3 It is a schematic diagram of the internal structure of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0046] In order to make the purpose, technical solutions and advantages of the present application clearer, the present application is described and illustrated below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not intended to limit the present application. Based on the embodiments provided in the present application, all other embodiments obtained by ordinary technicians in the field without making creative work are within the scope of protection of the present application.

[0047] Obviously, the drawings described below are only some examples or embodiments of the present application. For ordinary technicians in this field, the present application can also be applied to other similar scenarios based on these drawings without creative work. In addition, it can also be understood that although the efforts made in this development process may be complicated and lengthy, for ordinary technicians in this field related to the content disclosed in this application, some changes in design, manufacturing or production based on the technical content disclosed in this application are just conventional technical means, and should not be understood as insufficient content disclosed in this application.

[0048] Reference to "embodiments" in this application means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those of ordinary skill in the art that the embodiments described in this application may be combined with other embodiments without conflict.

[0049] Unless otherwise defined, the technical terms or scientific terms involved in this application should be understood by people with ordinary skills in the technical field to which this application belongs. The words "one", "a", "a", "the" and the like involved in this application do not indicate a quantitative limitation, and may represent the singular or plural. The terms "include", "comprise", "have" and any of their variations involved in this application are intended to cover non-exclusive inclusions; for example, a process, method, system, product or device that includes a series of steps or modules (units) is not limited to the listed steps or units, but may also include steps or units that are not listed, or may also include other steps or units inherent to these processes, methods, products or devices. The words "connect", "connected", "coupled" and the like involved in this application are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. The "multiple" involved in this application refers to two or more. "And / or" describes the association relationship of associated objects, indicating that there may be three relationships, for example, "A and / or B" can represent: A exists alone, A and B exist at the same time, and B exists alone. The character " / " generally indicates that the objects before and after are in an "or" relationship. The terms "first", "second", "third", etc. involved in this application are only used to distinguish similar objects and do not represent a specific ordering of the objects.

[0050] This embodiment provides a method for diagnosing defects in electrical equipment. Figure 1 is a flow chart of a method for diagnosing defects in electrical equipment according to an embodiment of the present application. Figure 1 As shown, the process includes the following steps:

[0051] Step S101, obtaining operating data of the electrical equipment to be detected, and determining the possible defect type of the electrical equipment to be detected based on temperature data in the operating data.

[0052] In this embodiment, the operation data of the electrical equipment can be obtained through the infrared imaging unit, the temperature and humidity sensor and the optical camera unit. The operation data includes but is not limited to temperature data and image data.

[0053] In some embodiments, obtaining the operating data of the electrical equipment to be detected in step S101 includes:

[0054] Step S1011, receiving infrared rays naturally radiated from the surface temperature of the electrical device to be detected by an infrared detector to generate a real-time thermal image corresponding to the thermal distribution of the surface of the electrical device to be detected.

[0055] Through infrared thermal imaging technology, a real-time thermal image corresponding to the heat distribution on the surface of the electrical equipment to be tested is obtained, and the surface temperature of the electrical equipment and its temperature surface distribution are intuitively seen. The condition of the electrical equipment is analyzed to determine the health status of the electrical equipment, that is, whether there are defects, defect types, defect properties, defect locations, defect causes and defect levels.

[0056] The infrared diagnostic method uses high-resolution, high-thermal-sensitivity, and low-error temperature measuring equipment for precise detection. Preferably, the color temperature value range of the temperature measuring equipment is 4k-5k higher than the ambient temperature value, and the equipment defects are judged by the temperature rise change.

[0057] Preferably, the infrared imaging unit has an additional resolution of >648*480, can achieve continuous automatic or manual autofocus, visible light image 5 million pixels, operating temperature range: -15℃-50℃, response wavelength range: 7.5m-144m, accuracy: ±1℃ or ±1% of reading, at a nominal temperature of 25℃, the accuracy is ±2℃ or ±2% of reading, equipped with a telephoto lens with FOV of 25° and 7°-15°, thermal sensitivity: <30mk at 30℃, display frame rate 30Hz, and has the function of automatically bringing in GPS data.

[0058] Infrared imaging operations are divided into general detection and precise detection. During general detection, the temperature and humidity meet the requirements. The weather is mainly cloudy. Operations are prohibited during thunderstorms, fog, rain and snow. The wind speed is less than 5m / s, and the lens is prevented from being exposed to sunlight and light. During precise detection, it is carried out on cloudy days or at night, with a wind speed of less than 0.5m / s. The power-on time of the infrared imaging equipment is greater than 24h, avoiding interference from strong magnetic fields and thermal radiation sources, and the tester should be as close as possible to the electrical equipment being tested.

[0059] Through general detection and judgment of infrared imaging operations, the defect type, defect nature, defect location and defect cause of electrical equipment can be analyzed, and accurate detection and judgment can be used to determine whether the electrical equipment is defective and the defect level, thereby improving the efficiency and accuracy of electrical equipment defect diagnosis.

[0060] It should be noted that since the causes of heating of electrical equipment are divided into increased loop resistance loss, increased dielectric loss, increased iron loss, abnormal voltage distribution and increased leakage current, oil shortage and other faults, in this embodiment, the causes of circuit heating are divided into three types: current-induced heating type, voltage-induced heating type and combined heating type.

[0061] The heat caused by current effect is manifested in the connectors, contacts of disconnectors and circuit breakers, external connectors of CT, wires and pressure connectors; the heat caused by voltage effect is manifested in voltage transformers (PT, CVT), lightning arresters, insulators, coupling capacitors (OY) and equalizing capacitors; the heat caused by the comprehensive heating type includes both voltage effect and current effect, or the heat caused by electromagnetic effect, which is manifested in the eddy current of the transformer and the metal plate of the cable wall bushing.

[0062] The possible defect type is preliminarily determined based on the temperature data of the corresponding position. For example, if the temperature of the isolating switch is abnormal, it is considered that the electrical equipment to be tested has a current-induced heating defect.

[0063] In some embodiments, the electrical equipment to be detected includes a group of equipment; in step S101, based on the temperature data in the operation data, determining the possible defect type of the electrical equipment to be detected includes:

[0064] Step S1012, based on the operation data, obtain the temperature difference of the same part of the same group of three-phase electrical equipment, the same phase electrical equipment and the same type of electrical equipment.

[0065] Step S1013, based on the temperature difference of the same part of the same group of three-phase electrical equipment, the same-phase electrical equipment and the same-type electrical equipment, determine the possible defect type of the electrical equipment to be detected.

[0066] The temperature difference between different electrical equipment or different parts of the same electrical equipment measured by the same infrared imaging device is called the temperature difference. By comparing the temperature of the same parts of the same group of three-phase electrical equipment, the same-phase electrical equipment, and the same type of electrical equipment, the possible defect type of the electrical equipment to be tested can be determined.

[0067] Continue to refer to Figure 1 , after determining the possible defect type, execute step S102.

[0068] Step S102, determining a target defect detection method according to possible defect types and the device type of the electrical device to be detected.

[0069] According to the possible defect types and the type of electrical equipment to be detected, the most suitable defect detection method is selected for defect diagnosis. The defect detection methods in this embodiment include but are not limited to surface temperature judgment method, relative temperature difference method, image feature judgment method, archive analysis method and real-time analysis method.

[0070] For example, current-type heating electrical equipment and electromagnetic effect heating electrical equipment can use the surface temperature judgment method to diagnose defects; small-load current-type heating electrical equipment can use the relative temperature difference method to diagnose defects.

[0071] Step S103, based on the target defect detection method, the operation data is analyzed to determine whether the electrical equipment to be detected has defects. If so, the defect level of the electrical equipment to be detected is determined according to the defect type and the hot spot temperature data corresponding to the defect in the operation data.

[0072] The target defect detection method is used to determine whether the electrical equipment to be inspected has defects and determine the defect level. It should be noted that the defect grading rules for different types of defects are different.

[0073] Current-induced heating faults are generally electrical equipment and metal parts or metal parts and metal parts joints and wire clamps. The nature of the defects is divided into general defects, major defects and emergency defects. Optionally, the temperature difference of general defects is greater than 15K, the hot spot temperature of major defects is greater than 80℃ or δ≥80%, and the hot spot temperature of emergency defects is greater than 110℃ or δ≥95%.

[0074] The voltage-induced heating type fault has a small heat generation and a stable temperature rise value, and can be divided into major defects and emergency defects. Optionally, in the case of major defects, the overall temperature rise or relative temperature difference of the electrical equipment is less than 3K, and in the case of emergency defects, the overall temperature rise or relative temperature difference of the electrical equipment is greater than 3K.

[0075] The temperature difference between the surface temperature of the electrical equipment under test and the surface of the ambient temperature reference object is the temperature rise; the percentage of the temperature rise difference between two measuring points to the temperature rise of the hotter point is the relative temperature difference.

[0076] Through the above steps S101 to S103, the operation data of the electrical equipment to be detected is obtained, and based on the temperature data in the operation data, the possible defect type of the electrical equipment to be detected is determined. According to the possible defect type and the equipment type of the electrical equipment to be detected, the target defect detection method is determined. Based on the target defect detection method, the operation data is analyzed to determine whether the electrical equipment to be detected has defects. If so, the defect level of the electrical equipment to be detected is determined according to the defect type and the hot spot temperature data corresponding to the defect in the operation data, thereby solving the problem of low accuracy in electrical equipment defect diagnosis. The defect type of the electrical equipment is analyzed, the defects of the electrical equipment are accurately determined, and the defect level is determined, thereby improving the accuracy of electrical equipment defect diagnosis.

[0077] Through general detection and judgment of infrared imaging operations, the defect type, defect nature, defect location and defect cause of electrical equipment can be analyzed, and accurate detection and judgment can be used to determine whether the electrical equipment is defective and the defect level, thereby improving the efficiency and accuracy of electrical equipment defect diagnosis.

[0078] In some embodiments, in step S103, based on the target defect detection method, analyzing the operation data to determine whether the electrical equipment to be detected has defects includes:

[0079] Step S1031, when the electrical device to be detected is a current-type heating electrical device or an electromagnetic effect heating electrical device, the operation data is analyzed based on the surface temperature judgment method to determine whether the electrical device to be detected has defects.

[0080] In some of the embodiments, step S1031 specifically includes: obtaining the hotspot position, thermal imaging characteristics and hotspot maximum temperature of the electrical equipment to be inspected from the operating data; based on the hotspot position, thermal imaging characteristics and hotspot maximum temperature, determining whether the electrical equipment to be inspected has defects.

[0081] For current-type heating electrical equipment and electromagnetic effect heating electrical equipment, defect diagnosis is performed by surface temperature judgment method.

[0082] Step S1032: When the electrical equipment to be detected is a small-load current type heating electrical equipment, the operation data is analyzed based on the relative temperature difference method to determine whether the electrical equipment to be detected has defects.

[0083] In some of the embodiments, step S1032 specifically includes: obtaining an overheat temperature of a current transformer connecting piece of the electrical equipment to be detected from the operation data; and judging whether the electrical equipment to be detected has a defect based on the overheat temperature of the current transformer connecting piece.

[0084] For small load current type heating electrical equipment, defect diagnosis is carried out by relative temperature difference method.

[0085] In some embodiments, the target defect detection method includes an image feature judgment method. In step S103, based on the target defect detection method, analyzing the operation data to determine whether the electrical equipment to be detected has defects includes:

[0086] Step S1033, obtaining the contact condition of the middle contact of the electrical equipment to be tested, the end temperature of the arc extinguishing chamber of the relay, the top cap temperature of the circuit breaker and the lower flange temperature from the operating data; based on the contact condition of the middle contact, the end temperature of the arc extinguishing chamber of the relay, the top cap temperature of the circuit breaker and the lower flange temperature, determine whether the electrical equipment to be tested has defects.

[0087] The image feature judgment method determines whether the electrical equipment to be tested is abnormal based on the thermal images of the normal and abnormal states of similar electrical equipment, as well as the contact condition of the middle contact of the electrical equipment to be tested, the end temperature of the arc extinguishing chamber of the relay, the top cap temperature of the circuit breaker and the lower flange temperature.

[0088] In some embodiments, the target defect detection method includes a file analysis method. In step S103, based on the target defect detection method, analyzing the operation data to determine whether the electrical equipment to be detected has defects includes:

[0089] Step S1034, obtaining the temperature field distribution of the electrical equipment to be detected at different periods according to the operating data; obtaining the change of the thermal parameters of the electrical equipment to be detected through the temperature field distribution; and judging whether the electrical equipment to be detected has defects based on the change of the thermal parameters.

[0090] The file analysis method analyzes the temperature field distribution of the same electrical equipment at different times to find out the changes in the thermal parameters of the electrical equipment to determine whether the electrical equipment to be tested is abnormal.

[0091] In some embodiments, the target defect detection method includes a real-time analysis method. In step S103, based on the target defect detection method, analyzing the operation data to determine whether the electrical equipment to be detected has defects includes:

[0092] Step S1035, obtaining temperature data of the electrical equipment to be detected within a preset time from the operating data; based on the temperature data of the electrical equipment to be detected within the preset time, obtaining the change of the temperature of the electrical equipment to be detected with load and time; judging whether the electrical equipment to be detected has defects according to the change of the temperature with load and time.

[0093] The real-time analysis method continuously detects electrical equipment over a period of time, observes changes in the temperature of the electrical equipment with load and time, and determines whether the electrical equipment to be detected is abnormal.

[0094] The surface temperature distribution of electrical equipment can reflect the internal operating status of the electrical equipment. Through infrared thermal imaging technology, infrared detectors are used to receive infrared rays naturally radiated from the surface temperature of electrical equipment to obtain a "real-time thermal image" corresponding to the surface heat distribution of the electrical equipment. The surface temperature of the electrical equipment and its temperature surface distribution can be intuitively seen. Based on the surface temperature judgment method, similar comparison method, relative temperature difference method, image feature judgment method, archive analysis method or real-time analysis method, the health status of the electrical equipment can be judged to improve the accuracy of electrical equipment defect diagnosis.

[0095] It should be noted that the steps shown in the above process or the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0096] This embodiment also provides an electrical equipment defect diagnosis system, which is used to implement the above-mentioned embodiments and preferred implementation modes, and will not be repeated hereafter. As used below, the terms "module", "unit", "subunit", etc. can be a combination of software and / or hardware that implements a predetermined function. Although the devices described in the following embodiments are preferably implemented in software, the implementation of hardware, or a combination of software and hardware, is also possible and conceivable.

[0097] Figure 2 is a structural block diagram of an electrical equipment defect diagnosis system according to an embodiment of the present application, such as Figure 2 As shown, the system includes: an acquisition module 21, an analysis module 22 and a judgment module 23.

[0098] The acquisition module 21 is used to acquire the operating data of the electrical device to be detected, and determine the possible defect type of the electrical device to be detected based on the temperature data in the operating data.

[0099] The analysis module 22 is used to determine a target defect detection method according to possible defect types and the device type of the electrical device to be detected.

[0100] The judgment module 23 is used to analyze the operation data based on the target defect detection method to determine whether the electrical equipment to be detected has defects. If so, the defect level of the electrical equipment to be detected is determined based on the defect type and the hot spot temperature data corresponding to the defect in the operation data.

[0101] In some embodiments, the judgment module 23 includes: a surface temperature judgment method module and a relative temperature difference method module.

[0102] A surface temperature judgment method module is used to analyze the operation data based on the surface temperature judgment method to judge whether the electrical equipment to be tested has defects when the electrical equipment to be tested is a current-type heating electrical equipment or an electromagnetic effect heating electrical equipment; and / or

[0103] The relative temperature difference method module is used to analyze the operating data based on the relative temperature difference method when the electrical equipment to be tested is a small load current type heating electrical equipment, so as to determine whether the electrical equipment to be tested has defects.

[0104] In some embodiments, the surface temperature determination module includes: a first data acquisition module and a first determination module.

[0105] The first data acquisition module is used to obtain the hot spot position, thermal image characteristics and hot spot maximum temperature of the electrical equipment to be detected from the operating data.

[0106] The first judgment module is used to judge whether the electrical equipment to be inspected has defects based on the hot spot position, thermal image characteristics and the highest temperature of the hot spot.

[0107] In some embodiments, the relative temperature difference method module includes: a second data acquisition module and a second judgment module.

[0108] A second data acquisition module is used to acquire the overheat temperature of the current transformer connecting piece of the electrical equipment to be detected from the operation data;

[0109] The second judgment module is used to judge whether the electrical equipment to be detected has defects based on the overheat temperature of the current transformer connecting piece.

[0110] In some embodiments, the electrical device to be detected includes a group of devices; the acquisition module 21 includes: a temperature analysis module and a type judgment module.

[0111] The temperature analysis module is used to obtain the temperature difference of the same part of the same group of three-phase electrical equipment, the same-phase electrical equipment and the same type of electrical equipment according to the operating data.

[0112] The type judgment module is used to determine the possible defect type of the electrical equipment to be detected based on the temperature difference of the same part of the same group of three-phase electrical equipment, the same-phase electrical equipment and the same type of electrical equipment.

[0113] In some embodiments, the determination module 23 includes: an image feature determination method module.

[0114] The image feature judgment method module is used to obtain the contact condition of the middle contact of the electrical equipment to be tested, the end temperature of the arc extinguishing chamber of the relay, the top cap temperature of the circuit breaker and the lower flange temperature from the operating data; based on the contact condition of the middle contact, the end temperature of the arc extinguishing chamber of the relay, the top cap temperature of the circuit breaker and the lower flange temperature, it is judged whether the electrical equipment to be tested has defects.

[0115] In some embodiments, the determination module 23 includes: a file analysis module.

[0116] The archive analysis module is used to obtain the temperature field distribution of the electrical equipment to be tested at different times based on the operating data; obtain the changes in the thermal parameters of the electrical equipment to be tested through the temperature field distribution; and determine whether the electrical equipment to be tested has defects based on the changes in the thermal parameters.

[0117] In some embodiments, the determination module 23 includes: a real-time analysis module.

[0118] The real-time analysis module is used to obtain the temperature data of the electrical equipment to be detected within a preset time from the operating data; based on the temperature data of the electrical equipment to be detected within the preset time, obtain the change of the temperature of the electrical equipment to be detected with load and time; according to the change of the temperature with load and time, judge whether the electrical equipment to be detected has defects.

[0119] In some embodiments, the acquisition module 21 includes: an infrared acquisition module.

[0120] The infrared acquisition module is used to receive infrared rays naturally radiated from the surface temperature of the electrical equipment to be detected through an infrared detector to generate a real-time thermal image corresponding to the thermal distribution of the surface of the electrical equipment to be detected.

[0121] Through the above system, the acquisition module 21 is used to obtain the operating data of the electrical equipment to be detected, and based on the temperature data in the operating data, determine the possible defect type of the electrical equipment to be detected, the analysis module 22 is used to determine the target defect detection method according to the possible defect type and the equipment type of the electrical equipment to be detected, and the judgment module 23 is used to analyze the operating data based on the target defect detection method to determine whether the electrical equipment to be detected has defects. If so, the defect level of the electrical equipment to be detected is determined according to the defect type and the hot spot temperature data corresponding to the defect in the operating data, thereby solving the problem of low accuracy in electrical equipment defect diagnosis. The defect type of the electrical equipment is analyzed, the defects of the electrical equipment are accurately judged, and the defect level is determined, thereby improving the accuracy of electrical equipment defect diagnosis.

[0122] It should be noted that the above modules can be functional modules or program modules, and can be implemented by software or hardware. For modules implemented by hardware, the above modules can be located in the same processor; or the above modules can be located in different processors in any combination.

[0123] This embodiment further provides an electronic device, including a memory and a processor, wherein the memory stores a computer program, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

[0124] Optionally, the electronic device may further include a transmission device and an input / output device, wherein the transmission device is connected to the processor, and the input / output device is connected to the processor.

[0125] Optionally, in this embodiment, the processor may be configured to perform the following steps through a computer program:

[0126] S1, obtaining operating data of the electrical equipment to be detected, and determining the type of defects that may exist in the electrical equipment to be detected based on temperature data in the operating data.

[0127] S2, determining a target defect detection method according to the possible defect types and the equipment type of the electrical equipment to be detected.

[0128] S3, based on the target defect detection method, analyze the operating data to determine whether the electrical equipment to be detected has defects. If so, determine the defect level of the electrical equipment to be detected based on the defect type and the hot spot temperature data corresponding to the defect in the operating data.

[0129] It should be noted that the specific examples in this embodiment can refer to the examples described in the above embodiments and optional implementation modes, and this embodiment will not be described in detail here.

[0130] In one embodiment, Figure 3 is a schematic diagram of the internal structure of an electronic device according to an embodiment of the present application, such as Figure 3 As shown, an electronic device is provided, which may be a server, and its internal structure diagram may be as shown in Figure 3 As shown. The electronic device includes a processor, a memory, a network interface and a database connected through a system bus. Among them, the processor of the electronic device is used to provide computing and control capabilities. The memory of the electronic device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the electronic device is used to store data. The network interface of the electronic device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a method for diagnosing defects in electrical equipment is implemented.

[0131] Those skilled in the art will understand that Figure 3 The structure shown in the figure is merely a block diagram of a partial structure related to the scheme of the present application, and does not constitute a limitation on the electronic device to which the scheme of the present application is applied. The specific electronic device may include more or fewer components than shown in the figure, or combine certain components, or have a different arrangement of components.

[0132] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0133] Those skilled in the art should understand that the various technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the various technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0134] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. A method for diagnosing defects in electrical equipment, characterized in that: The method comprises: Acquire operating data of the electrical equipment to be detected, and determine the type of defect that may exist in the electrical equipment to be detected based on temperature data in the operating data; Determining a target defect detection method according to the possible defect type and the device type of the electrical device to be detected; Based on the target defect detection method, the operating data is analyzed to determine whether the electrical equipment to be detected has defects. If so, the defect level of the electrical equipment to be detected is determined based on the defect type and the hot spot temperature data corresponding to the defect in the operating data.

2. The method according to claim 1, characterized in that The analyzing the operation data based on the target defect detection method to determine whether the electrical equipment to be detected has defects includes: In the case where the electrical device to be detected is a current-type heating electrical device or an electromagnetic effect-type heating electrical device, the operation data is analyzed based on a surface temperature judgment method to determine whether the electrical device to be detected has defects; and / or In the case that the electrical equipment to be detected is a small load current type heating electrical equipment, the operation data is analyzed based on the relative temperature difference method to determine whether the electrical equipment to be detected has defects.

3. The method according to claim 2, characterized in that The method of analyzing the operating data based on the surface temperature judgment method to judge whether the electrical equipment to be inspected has defects includes: Obtaining the hotspot position, thermal image characteristics and hotspot maximum temperature of the electrical equipment to be detected from the operation data; Based on the hot spot position, the thermal image characteristics and the hot spot maximum temperature, it is determined whether the electrical equipment to be inspected has defects.

4. The method according to claim 2, characterized in that: The analyzing the operation data based on the relative temperature difference method to determine whether the electrical equipment to be inspected has defects includes: Acquire the overheat temperature of the current transformer connecting piece of the electrical equipment to be detected from the operating data; Based on the overheat temperature of the current transformer connecting piece, it is determined whether the electrical equipment to be inspected has a defect.

5. The method according to claim 1, characterized in that: The electrical equipment to be detected includes a group of equipment; and determining the possible defect type of the electrical equipment to be detected based on the temperature data in the operation data includes: According to the temperature data in the operation data, the temperature difference of the same part of the same group of three-phase electrical equipment, the same phase electrical equipment and the same type of electrical equipment is obtained; Based on the temperature difference of the same part of the same group of three-phase electrical equipment, the same-phase electrical equipment and the same type of electrical equipment, the possible defect type of the electrical equipment to be detected is determined.

6. The method according to claim 1, characterized in that The analyzing the operation data based on the target defect detection method to determine whether the electrical equipment to be detected has defects includes: Acquire the contact condition of the middle contact of the electrical equipment to be detected, the end temperature of the arc extinguishing chamber of the relay, the top cap temperature of the circuit breaker and the lower flange temperature from the operation data; Based on the contact condition of the middle contact, the end temperature of the relay arc extinguishing chamber, the top cap temperature of the circuit breaker and the lower flange temperature, it is determined whether the electrical equipment to be inspected has defects.

7. The method according to claim 1, characterized in that The analyzing the operation data based on the target defect detection method to determine whether the electrical equipment to be detected has defects includes: According to the operation data, the temperature field distribution of the electrical equipment to be tested in different periods is obtained; Obtaining the change of the thermal parameters of the electrical equipment to be detected through the temperature field distribution; Based on the change of the thermal parameters, it is determined whether the electrical equipment to be inspected has defects.

8. The method according to claim 1, characterized in that The analyzing the operation data based on the target defect detection method to determine whether the electrical equipment to be detected has defects includes: Acquiring temperature data of the electrical equipment to be detected within a preset time from the operating data; Based on the temperature data of the electrical equipment to be detected within a preset time, obtaining the temperature change of the electrical equipment to be detected with load and time; Whether the electrical equipment to be inspected has defects is determined based on how the temperature changes with load and time.

9. The method according to claim 1, characterized in that: The obtaining of the operating data of the electrical equipment to be detected comprises: The infrared rays naturally radiated by the surface temperature of the electrical equipment to be detected are received by an infrared detector to generate a real-time thermal image corresponding to the thermal distribution of the surface of the electrical equipment to be detected.

10. An electrical equipment defect diagnosis system, characterized in that: The system includes: an acquisition module, an analysis module and a judgment module, wherein: The acquisition module is used to acquire the operating data of the electrical device to be detected, and determine the type of defect that may exist in the electrical device to be detected based on the temperature data in the operating data; The analysis module is used to determine a target defect detection method according to the possible defect type and the device type of the electrical device to be detected; The judgment module is used to analyze the operating data based on the target defect detection method to determine whether the electrical equipment to be detected has defects. If so, determine the defect level of the electrical equipment to be detected based on the defect type and the hot spot temperature data corresponding to the defect in the operating data.

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