Method, device, processor and computer-readable storage medium for realizing ground simulation test of charging and discharging effect of aerospace materials

Abstract

The present invention relates to a method for realizing a ground simulation test of aerospace material charge-discharge effect, comprising the following steps: placing aerospace material, connecting a test device on the surface of the aerospace material; setting the corresponding material parameters of the surface material according to different types of materials; using a vacuum system to evacuate the sample table into a vacuum state, turning on an electron gun, and adjusting the electron gun to generate irradiated electrons according to simulation test parameters; turning on an oscilloscope, and using the oscilloscope to collect electrostatic discharge signals of thin film material samples. The method, device, processor and computer-readable storage medium for realizing a ground simulation test of aerospace material charge-discharge effect can adapt to different space environment conditions, can more accurately simulate the space electron energy spectrum environment, thereby improving the accuracy of the ground simulation test, reducing the interference of environmental factors on the test results, improving the test efficiency, and reducing the complexity and cost of manual operation.

Description

Technical Field

[0001] The present invention relates to the field of aerospace materials, and in particular to the field of aerospace material charge-discharge effect simulation experiment, and specifically refers to a method, device, processor and computer-readable storage medium for implementing a ground simulation experiment of aerospace material charge-discharge effect. Background Art

[0002] Aerospace refers to the surface exposed dielectric materials will accumulate and release surface charges under the action of low-energy electron plasma environment, and it is necessary to carry out ground simulation tests on surface charging and discharging effects. Aerospace dielectric materials will deposit and release charges under the action of high-energy electrons, and it is necessary to carry out ground simulation tests on deep-layer charging and discharging effects. If the dielectric material is located inside the spacecraft, this effect is called the internal charging effect in aerospace engineering. Summary of the invention

[0003] The purpose of the present invention is to overcome the shortcomings of the above-mentioned prior art and to provide a method, device, processor and computer-readable storage medium thereof for realizing ground simulation test of charging and discharging effects of aerospace materials, which are simple to operate, high in precision and have a wide range of applications.

[0004] In order to achieve the above-mentioned purpose, the method, device, processor and computer-readable storage medium for implementing a ground simulation test of aerospace material charging and discharging effects of the present invention are as follows:

[0005] The method for realizing a ground simulation test of aerospace material charge and discharge effects is mainly characterized in that the method comprises the following steps:

[0006] (1) Place aerospace materials and connect test equipment on the surface of aerospace materials;

[0007] (2) setting corresponding material parameters of the surface material according to different types of materials;

[0008] (3) using a vacuum system to evacuate the sample stage into a vacuum state, turning on the electron gun, and adjusting the electron gun to generate irradiated electrons according to the simulation test parameters;

[0009] (4) Turn on the oscilloscope and use it to collect the electrostatic discharge signal of the thin film material sample.

[0010] Preferably, the step (1) specifically comprises the following steps:

[0011] Place the aerospace material sample on the sample table, connect the sample conductive layer to the signal cable, place a current probe on the signal cable, and connect the current probe to the oscilloscope.

[0012] Preferably, the step (1) further comprises the following steps:

[0013] The secondary surface mirror film sample is placed on the sample stage, the ITO layer is connected to the signal cable using conductive glue, and a current probe is placed on the signal cable, and the current probe is connected to the oscilloscope.

[0014] Preferably, the step (2) specifically comprises the following steps:

[0015] A structural model of multilayer thin film materials is constructed, and the Monte Carlo method is used to calculate the minimum energy Emin and maximum energy Emax of electron deposition in the dielectric layer. For the space electron energy spectrum environment, Emin and Emax are used as the lower limit and upper limit respectively to analyze the effective electron energy spectrum of the charge and discharge effect of the dielectric layer, and determine the simulation test parameters suitable for the space charge and discharge effect of multilayer thin film materials.

[0016] Preferably, the space electron energy spectrum environment in step (2) is an electron environment that is a combination of a plasma environment and a high-energy electron environment, and the environmental parameters include electron energy and corresponding charging current density.

[0017] Preferably, the Monte Carlo simulation includes constructing a structural model of a multilayer thin film material, assigning material values, setting particle types and irradiation parameters, and outputting calculation results.

[0018] Preferably, the step (3) specifically comprises the following steps:

[0019] The sample stage was evacuated into a vacuum state using a vacuum system. When the vacuum degree was better than 5×10-4Pa, the electron gun was turned on and adjusted so that the energy of the irradiated electrons was 27.5KeV and the beam density was 0.36nA / cm2.

[0020] The device for realizing a ground simulation test of aerospace material charging and discharging effects is mainly characterized in that the device comprises:

[0021] a processor configured to execute computer executable instructions;

[0022] The memory stores one or more computer executable instructions. When the computer executable instructions are executed by the processor, the various steps of the above-mentioned method for realizing the ground simulation test of the charging and discharging effect of aerospace materials are realized.

[0023] The processor for implementing a ground simulation test of aerospace material charge-discharge effect has the main feature that the processor is configured to execute computer executable instructions, and when the computer executable instructions are executed by the processor, the various steps of the above-mentioned method for implementing a ground simulation test of aerospace material charge-discharge effect are implemented.

[0024] The main feature of the computer-readable storage medium is that a computer program is stored thereon, and the computer program can be executed by a processor to implement the various steps of the above-mentioned method for realizing the ground simulation test of the charging and discharging effects of aerospace materials.

[0025] By adopting the method, device, processor and computer-readable storage medium for realizing the ground simulation test of the charge-discharge effect of aerospace materials, the present invention can simulate the electronic environment combined with the plasma environment and the high-energy electronic environment, so that the test results are more universal, can adapt to different space environmental conditions, and can more accurately simulate the space electron energy spectrum environment, thereby improving the accuracy of the ground simulation test. By using a vacuum system and an electron gun, the present invention can conduct tests in a vacuum state, reduce the interference of environmental factors on the test results, improve the test efficiency, reduce the complexity and cost of manual operation, and make the test more economical and efficient. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 The present invention is a flow chart of a method for implementing a ground simulation test of aerospace material charging and discharging effects. DETAILED DESCRIPTION

[0027] In order to more clearly describe the technical content of the present invention, further description is given below in conjunction with specific embodiments.

[0028] The method for realizing the ground simulation test of the charge and discharge effect of aerospace materials of the present invention comprises the following steps:

[0029] (1) Place aerospace materials and connect test equipment on the surface of aerospace materials;

[0030] (2) setting corresponding material parameters of the surface material according to different types of materials;

[0031] (3) using a vacuum system to evacuate the sample stage into a vacuum state, turning on the electron gun, and adjusting the electron gun to generate irradiated electrons according to the simulation test parameters;

[0032] (4) Turn on the oscilloscope and use it to collect the electrostatic discharge signal of the thin film material sample.

[0033] As a preferred embodiment of the present invention, the step (1) specifically comprises the following steps:

[0034] Place the aerospace material sample on the sample table, connect the sample conductive layer to the signal cable, place a current probe on the signal cable, and connect the current probe to the oscilloscope.

[0035] As a preferred embodiment of the present invention, the step (1) further comprises the following steps:

[0036] The secondary surface mirror film sample is placed on the sample stage, the ITO layer is connected to the signal cable using conductive glue, and a current probe is placed on the signal cable, and the current probe is connected to the oscilloscope.

[0037] As a preferred embodiment of the present invention, the step (2) specifically comprises the following steps:

[0038] A structural model of multilayer thin film materials is constructed, and the Monte Carlo method is used to calculate the minimum energy Emin and maximum energy Emax of electron deposition in the dielectric layer. For the space electron energy spectrum environment, Emin and Emax are used as the lower limit and upper limit respectively to analyze the effective electron energy spectrum of the charge and discharge effect of the dielectric layer, and determine the simulation test parameters suitable for the space charge and discharge effect of multilayer thin film materials.

[0039] As a preferred embodiment of the present invention, the space electron energy spectrum environment in step (2) is an electron environment that is a combination of a plasma environment and a high-energy electron environment, and the environmental parameters include electron energy and corresponding charging current density.

[0040] As a preferred embodiment of the present invention, the Monte Carlo simulation includes constructing a structural model of a multilayer thin film material, assigning material values, setting particle types and irradiation parameters, and outputting calculation results.

[0041] As a preferred embodiment of the present invention, the step (3) specifically comprises the following steps:

[0042] The sample stage was evacuated into a vacuum state using a vacuum system. When the vacuum degree was better than 5×10-4Pa, the electron gun was turned on and adjusted so that the energy of the irradiated electrons was 27.5KeV and the beam density was 0.36nA / cm2.

[0043] The device for realizing a ground simulation test of aerospace material charge and discharge effects of the present invention comprises:

[0044] a processor configured to execute computer executable instructions;

[0045] The memory stores one or more computer executable instructions. When the computer executable instructions are executed by the processor, the various steps of the above-mentioned method for realizing the ground simulation test of the charging and discharging effect of aerospace materials are realized.

[0046] The processor of the present invention realizes the ground simulation test of the charging and discharging effect of aerospace materials, wherein the processor is configured to execute computer executable instructions, and when the computer executable instructions are executed by the processor, the various steps of the above-mentioned method for realizing the ground simulation test of the charging and discharging effect of aerospace materials are realized.

[0047] The computer-readable storage medium of the present invention stores a computer program thereon, and the computer program can be executed by a processor to implement the various steps of the above-mentioned method for implementing a ground simulation test of the charging and discharging effects of aerospace materials.

[0048] The degradation mechanism of charge and discharge effect is as follows:

[0049] When the dielectric material is charged, the potential will increase. When the charge is discharged, the dielectric material will be broken down, resulting in ablation damage.

[0050] The exposed surface dielectric materials of spacecraft are easily affected by surface charge and discharge. Dielectric materials with a certain thickness are easily affected by deep charge and discharge effects or internal charging effects under the action of high-energy electrons. For Earth orbit cruise spacecraft, the exposed dielectric materials of GEO orbit spacecraft need to focus on the threat of surface charge and discharge, and the dielectric materials used in MEO orbit spacecraft need to focus on the influence of deep charge and discharge effects or internal charging effects.

[0051] Ground simulation tests are usually ground acceleration simulation tests conducted using low-energy electrons or plasma, and the area of ​​the materials used is also different from the actual on-orbit applications. Therefore, it is necessary to consider the impact of the acceleration rate and material area on the test results.

[0052] Typical ground simulation test equipment for charging electric effect includes low-energy electron gun or electron accelerator; plasma grassland.

[0053] The test standards that can be referenced for the ground simulation test of surface charge and discharge effects are: ESCC 23800, NASA STD-4005, NASA-HDBK-4006, ECSS-E-20-06, and NASA TP-2361.

[0054] The test standard that can be used as a reference for simulation tests of deep charge and discharge effects or internal charging effects is mainly NASA-HDBK-4002A.

[0055] The specific implementation scheme of this embodiment can refer to the relevant description in the above embodiment, which will not be repeated here.

[0056] It can be understood that the same or similar parts of the above embodiments can be referenced to each other, and the contents not described in detail in some embodiments can refer to the same or similar contents in other embodiments.

[0057] It should be noted that, in the description of the present invention, the terms "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance. In addition, in the description of the present invention, unless otherwise specified, the meaning of "plurality" refers to at least two.

[0058] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0059] By adopting the method, device, processor and computer-readable storage medium for realizing the ground simulation test of the charge-discharge effect of aerospace materials, the present invention can simulate the electronic environment combined with the plasma environment and the high-energy electronic environment, so that the test results are more universal, can adapt to different space environmental conditions, and can more accurately simulate the space electron energy spectrum environment, thereby improving the accuracy of the ground simulation test. By using a vacuum system and an electron gun, the present invention can conduct tests in a vacuum state, reduce the interference of environmental factors on the test results, improve the test efficiency, reduce the complexity and cost of manual operation, and make the test more economical and efficient.

[0060] In this specification, the present invention has been described with reference to specific embodiments thereof. However, it is apparent that various modifications and variations may be made without departing from the spirit and scope of the present invention. Therefore, the specification and drawings should be regarded as illustrative rather than restrictive.

Claims

1. A method for realizing a ground simulation test of aerospace material charging and discharging effects, characterized in that: The method comprises the following steps: (1) Place aerospace materials and connect test equipment on the surface of aerospace materials; (2) setting corresponding material parameters of the surface material according to different types of materials; (3) using a vacuum system to evacuate the sample stage into a vacuum state, turning on the electron gun, and adjusting the electron gun to generate irradiated electrons according to the simulation test parameters; (4) Turn on the oscilloscope and use it to collect the electrostatic discharge signal of the thin film material sample.

2. The method for realizing a ground simulation test of aerospace material charge and discharge effects according to claim 1, characterized in that: The step (1) specifically comprises the following steps: Place the aerospace material sample on the sample table, connect the sample conductive layer to the signal cable, place a current probe on the signal cable, and connect the current probe to the oscilloscope.

3. The method for realizing a ground simulation test of aerospace material charge and discharge effects according to claim 1, characterized in that: The step (1) further comprises the following steps: The secondary surface mirror film sample is placed on the sample stage, the ITO layer is connected to the signal cable using conductive glue, and a current probe is placed on the signal cable, and the current probe is connected to the oscilloscope.

4. The method for realizing a ground simulation test of aerospace material charge and discharge effects according to claim 1, characterized in that: The step (2) specifically comprises the following steps: A structural model of multilayer thin film materials is constructed, and the Monte Carlo method is used to calculate the minimum energy Emin and maximum energy Emax of electron deposition in the dielectric layer. For the space electron energy spectrum environment, Emin and Emax are used as the lower limit and upper limit respectively to analyze the effective electron energy spectrum of the charge and discharge effect of the dielectric layer, and determine the simulation test parameters suitable for the space charge and discharge effect of multilayer thin film materials.

5. The method for realizing ground simulation test of charge and discharge effect of aerospace materials according to claim 4, characterized in that: The space electron energy spectrum environment in step (2) is an electron environment that is a combination of a plasma environment and a high-energy electron environment, and the environmental parameters include electron energy and corresponding charging current density.

6. The method for realizing a ground simulation test of aerospace material charge and discharge effects according to claim 4, characterized in that: The Monte Carlo simulation includes building a structural model of a multilayer thin film material, assigning material values, setting particle types and irradiation parameters, and outputting calculation results.

7. The method for realizing a ground simulation test of aerospace material charge and discharge effects according to claim 1, characterized in that: The step (3) specifically comprises the following steps: The sample stage was evacuated into a vacuum state using a vacuum system. When the vacuum degree was better than 5×10-4Pa, the electron gun was turned on and adjusted so that the energy of the irradiated electrons was 27.5KeV and the beam density was 0.36nA / cm2.

8. A device for realizing ground simulation test of charging and discharging effect of aerospace materials, characterized in that: The device comprises: a processor configured to execute computer-executable instructions; A memory storing one or more computer executable instructions, wherein when the computer executable instructions are executed by the processor, each step of the method for realizing a ground simulation test of aerospace material charging and discharging effects as described in any one of claims 1 to 7 is implemented.

9. A processor for realizing ground simulation test of charge and discharge effect of aerospace materials, characterized in that: The processor is configured to execute computer executable instructions. When the computer executable instructions are executed by the processor, the various steps of the method for realizing a ground simulation test of aerospace material charging and discharging effects as described in any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium, characterized in that: A computer program is stored thereon, and the computer program can be executed by a processor to implement the various steps of the method for implementing a ground simulation test of aerospace material charging and discharging effects as described in any one of claims 1 to 7.

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