A high stability current probe measurement and correction device

Abstract

The present invention relates to the technical field of current probe product performance detection, and specifically to a high-stability current probe measurement and correction device, including a main frame, the main frame including a mounting frame, a docking port is provided at the front end of the mounting frame, a mounting groove 1 is provided at one end of the docking port located inside the mounting frame, a mounting cavity is provided at a position near the docking port inside the mounting frame, and a downward pressure test mechanism, the downward pressure test mechanism includes a test frame. The present invention automatically adapts to spring probes of different sizes through the design of gears, racks and pressing sheets, the upper and lower electrode sheets are connected to the spring probe circuit, and the electrical connectivity is quickly tested. The cylinder drive assembly measures the change in the spring probe's pressure resistance to ensure that its electrical connection is stable under different pressures. The lifting plate, spring 3 and cylinder work together to detect resilience and prevent performance degradation caused by insufficient resilience.

Description

Technical Field

[0001] The invention relates to the technical field of current probe product performance detection, and in particular to a high-stability current probe measurement and correction device. Background Art

[0002] In the field of electronic manufacturing, spring-loaded current probes are key components of precision measurement and testing equipment, and their performance stability and accuracy are crucial to the operation of the entire circuit system. However, the current measurement and calibration process for spring-loaded probes has many shortcomings, which limits the improvement of production efficiency and product quality.

[0003] First, the traditional testing method usually disperses the spring force and contact resistance tests on different stations and equipment. This decentralized testing not only increases the time for material handling and station conversion, but also may lead to insufficient correlation between test data, making it difficult to fully evaluate the overall performance of the probe. In addition, the long testing process also directly leads to low production efficiency.

[0004] Secondly, existing test devices often lack sufficient adaptability and protection mechanisms for spring-loaded probes of varying sizes. During pressure testing, due to the lack of precise matching and effective protection of probe size and structure, the probe is easily damaged due to improper test force or unreasonable fixture design, increasing production costs and maintenance difficulties.

[0005] Furthermore, the impedance test of spring-type probes currently still relies mainly on manual operation. This test method is not only inefficient and difficult to meet the needs of large-scale production, but also the test results are greatly affected by human factors, making it difficult to ensure the stability and consistency of the test results. With the expansion of production scale and the increase in testing needs, manual testing has become a bottleneck restricting the improvement of production efficiency. Summary of the invention

[0006] The present invention discloses a high-stability current probe measurement and correction device to solve the problems of low efficiency, high cost, increased time for decentralized testing, poor adaptability and easily damaged probes, inefficient manual testing and inflexible equipment in the traditional current probe testing method proposed in the above background technology.

[0007] In order to solve the above technical problems, a technical solution adopted by the present invention is: to provide a high-stability current probe measurement and correction device, including a main frame, the main frame includes a mounting frame, a docking port is arranged at the front end of the mounting frame, a mounting groove is arranged at one end of the docking port located inside the mounting frame, a mounting cavity is arranged near the docking port inside the mounting frame, and a downward pressure test mechanism is arranged, the downward pressure test mechanism includes a test frame, the interior of the test frame is a hollow cavity, a fixing cylinder is fixed at the bottom of the cavity, the bottom end of the fixing cylinder passes through the test frame and extends to the outside thereof, and a sliding groove is arranged on the circumferential outer surface of the fixing cylinder, The sliding groove is slidably connected with a sleeve, the fixed cylinder is slidably connected with a slider, the bottom of the slider is fixedly connected with an upper electrode sheet, a clamping and fixing mechanism, the clamping and fixing mechanism includes a fixed seat, the fixed seat is slidably connected to the inner wall of the docking port, a fixed partition is arranged inside the fixed seat, a movable frame is sleeved outside the fixed partition, the fixed partition is connected with a pressure plate through pressure sheets symmetrically arranged at the top and bottom thereof, the bottom of the fixed seat is fixedly connected with a bottom plate, the top of the bottom plate is fixedly connected with a lower electrode sheet, a lifting mechanism includes a sliding rod fixed inside the mounting cavity, and the outer wall of the sliding rod is slidably connected with a lifting plate.

[0008] The present invention is further configured as follows: the test frame is connected to the mounting frame via a cylinder drive assembly arranged on the top thereof, a push plate is slidably connected to the inside of the cavity, a telescopic rod is fixedly connected to the top of the test frame, an output end of the telescopic rod passes through the test frame and extends to the inside of the cavity and is fixedly connected to the push plate, the top of the sleeve is fixedly connected to the bottom of the push plate, and a docking plate is arranged at the bottom of the test frame.

[0009] The present invention is further configured such that the bottom of the upper electrode sheet is arc-shaped, and the height of the bottom of the docking plate is on the same horizontal line as the highest point of the arc of the bottom of the upper electrode sheet.

[0010] The present invention is further configured such that a second installation groove is provided on the circumferential outer surface of the slider, a clamp rod is hinged inside the second installation groove, a third installation groove is provided on the outer wall of the clamp rod near the slider, a first spring is provided inside the third installation groove, and the other end of the first spring is connected to the inner wall of the second installation groove.

[0011] The present invention is further configured such that the clamping and fixing mechanism also includes a rack 2 slidably connected to the inside of the mounting groove 1, a docking groove is provided on the outer wall of the fixing seat near the mounting groove 1, a gear is rotatably connected inside the docking groove, a rack 1 is fixedly connected to the outer wall of the movable frame near the gear, and the gear is meshed with rack 1 and rack 2 respectively.

[0012] The present invention is further configured such that a spring 2 is arranged inside the installation groove 1, one end of the spring 2 is connected to the inner wall of the installation groove 1, and the other end of the spring 2 is connected to the rack 2 for supporting the rack 2 and providing a reset force.

[0013] The present invention is further configured such that a pressure block 2 is provided on one side of the pressure plate close to the fixed partition, a pressure block 1 is provided on the outer wall of the movable frame close to the pressure block 2, the pressure block 2 is slidably connected to the pressure block 1, and the side where the pressure block 2 and the pressure block 1 are connected is an inclined surface.

[0014] The present invention is further configured as follows: the jacking mechanism also includes a mounting cover fixedly connected to the bottom of the mounting frame, a driving assembly is arranged inside the mounting cover, an output end of the driving assembly is connected to a screw rod, the screw rod vertically penetrates the mounting frame and extends into the mounting cavity, the outer wall of the screw rod located inside the mounting cavity is threadedly connected with a screw sleeve, the lower end of the screw sleeve penetrates the jacking plate and is slidably connected thereto, a spring three is sleeved on the circumferential outer surface of the sliding rod located below the jacking plate, a socket is arranged on the top of the jacking plate, and a positioning plate is movably connected inside the socket.

[0015] Beneficial effects of the high-stability current probe measurement and correction device of the present invention: Through the design of gears, racks and pressing pieces, it can automatically adapt to spring probes of different sizes and achieve precise fixation. This design improves the versatility and flexibility of the equipment. Through the circuit connection between the upper electrode sheet, the spring probe and the lower electrode sheet, the electrical connectivity test can be quickly carried out to verify the working performance of the spring probe when it is powered on. This helps to find and solve potential quality problems early. Driven by the cylinder drive assembly, the electrical contact performance of the spring probe is evaluated by measuring the change in resistance when it is subjected to mechanical pressure. This test method can ensure that the spring probe maintains a stable electrical connection under different pressure conditions and meets the design requirements. The resilience of the spring probe is detected through the coordinated work of the lifting plate, spring three and cylinder drive assembly. This helps to ensure that the spring probe can maintain a good working condition during long-term use and avoid performance degradation due to insufficient resilience. The entire test process is highly automated, reducing manual intervention and improving test efficiency and accuracy. At the same time, through the precise control of the hydraulic mechanism and the cylinder drive assembly, the precise operation and testing of the spring probe are achieved. The compact structure and easy operation reduce the skill requirements for the operator and improve the ease of use and maintainability of the equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with specific embodiments.

[0017] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the present invention should be understood by people with ordinary skills in the field to which the present invention belongs. The words "first", "second" and similar words used in the present invention do not indicate any order, quantity or importance, but are only used to distinguish different components. "Include" or "comprise" and similar words mean that the elements or objects appearing before the word include the elements or objects listed after the word and their equivalents, without excluding other elements or objects. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0018] Figure 1 This is a three-dimensional structural diagram of a high-stability current probe measurement and correction device of the present invention; Figure 2 A morphological switching diagram of a high-stability current probe measurement and correction device of the present invention; Figure 3 This is a separation diagram of a high-stability current probe measurement and correction device of the present invention; Figure 4 This is an enlarged view of a pressure test mechanism of a high-stability current probe measurement and correction device of the present invention; Figure 5 This is a separation diagram of a pressure test mechanism of a high-stability current probe measurement and correction device of the present invention; Figure 6 A high stability current probe measurement and correction device of the present invention Figure 5 Explosion diagram at A in the middle; Figure 7 An exploded view of a clamping and fixing mechanism of a high-stability current probe measurement and calibration device of the present invention; Figure 8 A cross-sectional view of a clamping and fixing mechanism of a high-stability current probe measurement and calibration device of the present invention; Fig. 9 This is an enlarged view of the lifting mechanism of a high-stability current probe measurement and correction device of the present invention.

[0019] The markings in the figure are: 1. Main frame; 11. Mounting frame; 12. Mounting cavity; 13. Docking port; 14. Mounting slot 1; 2. Press-down test mechanism; 21. Test frame; 22. Docking plate; 23. Cylinder drive assembly; 24. Telescopic rod; 25. Push plate; 26. Fixed cylinder; 261. Slide; 262. Sliding block; 263. Mounting slot 2; 264. Upper electrode sheet; 265. Clamping rod; 266. Mounting slot 3; 267. Spring 1; 27. Sleeve; 3. Clamping and fixing mechanism; 31. Fixed seat; 311. Docking groove; 312. Gear; 313. Fixed partition; 32. Bottom plate; 321. Lower electrode sheet; 33. Movable frame; 331. Rack 1; 332. Pressing block 1; 34. Pressing plate; 341. Pressing sheet; 342. Pressing block 2; 35. Rack 2; 36. Spring 2; 4. Lifting mechanism; 41. Mounting cover; 42. Driving assembly; 43. Screw; 44. Screw sleeve; 45. Sliding rod; 46. Lifting plate; 461. Socket; 462. Positioning plate; 47. Spring three. DETAILED DESCRIPTION

[0020] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other; the following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0021] In the description of the present invention, it should be understood that the terms "upper", "lower", "front", "rear", "left" and "right" etc. indicate directions or positional relationships based on directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the positions or elements referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as limitations of the present invention. In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance. In addition, unless otherwise clearly specified and limited, the term "connection" should be understood in a broad sense, for example, "connection" can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or a transmission connection; it can be a direct connection, or an indirect connection through an intermediate medium, or it can be the internal connection of two elements or the interaction relationship between two elements.

[0022] See also Figure 1 , Figure 2 , Figure 3 , Figure 4 and Figure 5 , Figure 6 , Figure 7 , Figure 8, Fig. 9 A high-stability current probe measurement and correction device comprises a main frame 1, the main frame 1 comprises a mounting frame 11, a docking port 13 is arranged at the front end of the mounting frame 11, a mounting groove 14 is arranged at one end of the docking port 13 located inside the mounting frame 11, a mounting cavity 12 is arranged inside the mounting frame 11 near the docking port 13, a downward pressure test mechanism 2, the downward pressure test mechanism 2 comprises a test frame 21, the interior of the test frame 21 is a hollow cavity, a fixed cylinder 26 is fixed at the bottom of the cavity, the bottom end of the fixed cylinder 26 passes through the test frame 21 and extends to the outside thereof, a sliding groove 261 is arranged on the circumferential outer surface of the fixed cylinder 26, a sleeve 27 is slidably connected inside the sliding groove 261, and the fixed cylinder 26 is provided with a sliding groove 261. A slider 262 is slidably connected inside, an upper electrode sheet 264 is fixedly connected to the bottom of the slider 262, a clamping and fixing mechanism 3, the clamping and fixing mechanism 3 includes a fixed seat 31, the fixed seat 31 is slidably connected to the inner wall of the docking port 13, a fixed partition 313 is arranged inside the fixed seat 31, a movable frame 33 is sleeved on the outside of the fixed partition 313, the fixed partition 313 is connected to a pressing plate 34 through pressing sheets 341 symmetrically arranged at the top and bottom thereof, a bottom plate 32 is fixedly connected to the bottom of the fixed seat 31, a lower electrode sheet 321 is fixedly connected to the top of the bottom plate 32, a lifting mechanism 4, including a sliding rod 45 fixed to the inside of the mounting cavity 12, and a lifting plate 46 is slidably connected to the outer wall of the sliding rod 45.

[0023] By adopting the above technical solution, the spring probe is inserted into the circular hole of the clamping and fixing mechanism 3, contacts the lower electrode sheet 321, and then placed in the docking port 13. The hydraulic mechanism pushes the clamping and fixing mechanism 3 to move. When approaching the mounting frame 11, the gear 312 contacts and rotates with the rack 2 35, driving the movable frame 33 and the pressure block 1 332 to move, and the pressure block 2 342 is squeezed by the inclined surface, so that the pressure sheet 341 between the pressure plate 34 and the fixed partition 313 is bent to fix the probe. Probes of different sizes lead to different bending degrees. The rack 1 331 is stuck when it moves to the limit. The hydraulic mechanism continues to push the compression spring 2 36 to make the clamping and fixing mechanism 3 completely enter the mounting frame 11. After positioning, the positioning plate 462 is inserted to adjust the height of the lifting plate 46 to the top of the probe, and the positioning plate 462 is pulled out. The cylinder drives the test frame 21 to move downward, and the upper electrode sheet 264 contacts the probe to form a circuit and perform an electrical connectivity test. During the test, the fixed cylinder 26 falls and squeezes the clamp rod 265 to clamp the probe, and the dynamic contact resistance is measured. Then, the cylinder continues to press down, squeezing the lifting plate 46 through the docking plate 22, and the spring three 47 is compressed. After stopping pushing, the telescopic rod 24 pulls up the sleeve 27, the clamping rod 265 releases the probe, and the spring three 47 pushes the lifting plate 46 to reset, and check the resilience of the probe. After the test is completed, the hydraulic mechanism pulls out the clamping and fixing mechanism 3, the spring two 36 is restored, the gear 312 rotates in the opposite direction, the movable frame 33 and the pressing plate 341 are reset, and the fixation is released. The problematic probe enters the calibration process.

[0024] The test frame 21 is connected to the mounting frame 11 through a cylinder drive assembly 23 arranged on the top thereof, a push plate 25 is slidably connected inside the cavity, a telescopic rod 24 is fixedly connected to the top of the test frame 21, the output end of the telescopic rod 24 passes through the test frame 21 and extends to the inside of the cavity and is fixedly connected to the push plate 25, the top of the sleeve 27 is fixedly connected to the bottom of the push plate 25, a docking plate 22 is arranged at the bottom of the test frame 21, the bottom of the upper electrode sheet 264 is arc-shaped, the height of the bottom of the docking plate 22 is on the same horizontal line as the highest point of the arc of the bottom of the upper electrode sheet 264, a mounting groove 263 is provided on the circumferential outer surface of the slider 262, a clamping rod 265 is hinged inside the mounting groove 263, a mounting groove 3 266 is provided on the outer wall of the clamping rod 265 near the slider 262, a spring 1 267 is arranged inside the mounting groove 3 266, and the other end of the spring 1 267 is connected to the inner wall of the mounting groove 263.

[0025] By adopting the above technical solution, the downward pressure test mechanism 2 includes a test frame 21, which is connected to the mounting frame 11 through a cylinder drive assembly 23. The test frame 21 has a hollow cavity, and a push plate 25 is slidably connected in the cavity. A telescopic rod 24 is provided at the top, and its output end is fixed to the push plate 25. A docking plate 22 is provided at the bottom, corresponding to the jacking mechanism 4. A fixed cylinder 26 with a slide groove 261 is fixed to the bottom of the cavity, and a sleeve 27 is connected to the push plate 25 in the slide groove 261. The slider 262 in the fixed cylinder 26 has a mounting groove 263 and a hinged clamp rod 265, which is supported and unfolded by a spring 1 267. An upper electrode sheet 264 is provided at the bottom of the slider 262, and the bottom arc is at the same height as the docking plate 22, and is maintained at the bottom of the cylinder due to gravity.

[0026] The clamping and fixing mechanism 3 also includes a rack 2 35 slidably connected to the inside of the mounting groove 14, a docking groove 311 is provided on the outer wall of the fixed seat 31 near the mounting groove 14, a gear 312 is rotatably connected inside the docking groove 311, a rack 1 331 is fixedly connected to the outer wall of the movable frame 33 near the gear 312, the gear 312 is meshed with the rack 1 331 and the rack 2 35 respectively, a spring 2 36 is provided inside the mounting groove 14, one end of the spring 2 36 is connected to the inner wall of the mounting groove 14, and the other end of the spring 2 36 is connected to the rack 2 35, for supporting the rack 2 35 and providing a reset force, a pressure block 2 342 is provided on one side of the pressure plate 34 near the fixed partition 313, a pressure block 1 332 is provided on the outer wall of the movable frame 33 near the pressure block 2 342, the pressure block 2 342 is slidably connected to the pressure block 1 332, and the side where the pressure block 2 342 and the pressure block 1 332 are connected is an inclined surface. By adopting the above technical solution, the spring probe is inserted into the circular hole of the clamping and fixing mechanism 3 and contacts the lower electrode sheet 321. When the mechanism is placed in the docking port 13 and hydraulically pushed close to the mounting frame 11, the gear 312 contacts and rotates with the rack 2 35, driving the rack 1 331 and the movable frame 33 to move, and the pressure block 2 342 is squeezed by the pressure block 1 332, so that the pressure plate 34 is pressed against the fixed partition 313, and the pressure sheet 341 is bent to fix the probe. Probes of different diameters cause the pressure surface to bend differently, and the rack 1 331 moves at different distances. When the limit is reached, the gear 312 and the rack are stuck, the hydraulic pressure overcomes the force of the spring 2 36, and the mechanism continues to enter the frame and is fixed by the positioning mechanism. While the spring 2 36 is under pressure, the pressure surface continues to clamp the probe.

[0027] The lifting mechanism 4 also includes a mounting cover 41 fixedly connected to the bottom of the mounting frame 11, a driving assembly 42 is arranged inside the mounting cover 41, and a screw 43 is connected to the output end of the driving assembly 42, the screw 43 vertically penetrates the mounting frame 11 and extends into the mounting cavity 12, the outer wall of the screw 43 located inside the mounting cavity 12 is threadedly connected with a screw sleeve 44, the lower end of the screw sleeve 44 penetrates the lifting plate 46 and is slidably connected thereto, a spring 47 is sleeved on the circumferential outer surface of the slide rod 45 located below the lifting plate 46, a socket 461 is arranged on the top of the lifting plate 46, and a positioning plate 462 is movably connected inside the socket 461.

[0028] By adopting the above technical solution, the cylinder drives the test frame 21 to fall, and the docking plate 22 presses the lifting plate 46 to move downward, squeezing the spring three 47. When it stops at a certain position, the telescopic rod 24 pulls the sleeve 27 upward, and the clamping rod 265 releases the probe. The cylinder stops, and the spring three 47 pushes the lifting plate 46 upward, driving the downward pressure test mechanism 2 to reset. The lifting plate 46 has a limited height, and the upper electrode sheet 264 contacts the probe. Check whether the probe spring can reset and contact the upper electrode, and evaluate its resilience.

[0029] When the present invention is in use, the main frame 1 includes a mounting frame 11, a docking port 13 is provided at the front end of the mounting frame 11, a mounting groove 14 is provided at one end inside the docking port 13, a mounting cavity 12 is provided inside the mounting frame 11 near the docking port 13, a downward pressure test mechanism 2 is provided at the top position inside the mounting frame 11, a clamping and fixing mechanism 3 is slidably installed inside the docking port 13, and a lifting mechanism 4 is provided inside the mounting cavity 12, after the spring probe is placed inside the clamping and fixing mechanism 3, the clamping and fixing mechanism 3 is placed inside the docking port 13, and then pushed into the mounting frame 11, a positioning mechanism is provided inside the mounting frame 11, and the clamping and fixing mechanism 3 is pushed to move inside the docking port 13 by a hydraulic mechanism, and when the clamping and fixing mechanism 3 moves into the positioning mechanism in the mounting frame 11, it will be positioned and fixed, and the position of the downward pressure test mechanism 2 is also fixed, so the clamping and fixing mechanism 3 will automatically align with the downward pressure test mechanism 2.

[0030] The downward pressure test mechanism 2 includes a test frame 21, which is connected to the mounting frame 11 at the top through a cylinder drive assembly 23. A docking plate 22 is provided at the bottom of the test frame 21 near the jacking mechanism 4. The inside of the test frame 21 is a hollow cavity, and a push plate 25 is slidably connected inside the cavity. A plurality of telescopic rods 24 are provided on the top of the test frame 21. The output ends of the telescopic rods 24 penetrate into the cavity and are fixedly connected to the push plate 25. A plurality of fixed cylinders 26 are fixedly connected at the bottom position of the inner side of the cavity. The lower end of the fixed cylinder 26 penetrates the test frame 21 and extends to the outside thereof. A slide groove 261 is provided on the circumferential outer surface of the fixed cylinder 26. A sleeve 27 is slidably connected inside the slide groove 261. The top of the sleeve 27 is fixedly connected to the bottom of the push plate 25. The fixed cylinder 26 slides inside. A slider 262 is connected, and a mounting groove 263 is provided on the outer circumferential surface of the slider 262. A clamping rod 265 is hinged inside the mounting groove 263. A mounting groove 3 266 is provided on the outer wall of the clamping rod 265 near the slider 262. A spring 1 267 is provided inside the mounting groove 3 266, and the other end of the spring 1 267 is connected to the inside of the mounting groove 263. An upper electrode sheet 264 is fixedly connected to the bottom of the slider 262. The slider 262 is maintained at the bottom of the fixed tube 26 due to gravity. At the same time, the mounting groove 263 is also located outside the fixed tube 26. The clamping rod 265 is in an expanded state due to the support of the spring 1 267. The bottom of the upper electrode sheet 264 is arc-shaped, and the height of the bottom of the docking plate 22 is on the same horizontal line as the highest point of the arc at the bottom of the upper electrode sheet 264.

[0031] The clamping and fixing mechanism 3 includes a fixing seat 31, and also includes a rack 2 35 slidably installed in the installation groove 14. A spring 2 36 is provided at one end of the rack 2 35, and one end of the spring 2 36 is connected to the inner wall of the installation groove 14. A docking groove 311 is provided on the outer wall of the fixing seat 31 near the installation groove 14. A gear 312 is rotatably connected inside the docking groove 311. A fixed partition 313 is provided near the center position inside the fixing seat 31. A movable frame 33 is provided on the outer surface of the fixed partition 313. A rack 1 331 is fixedly connected to the outer wall of the movable frame 33 near the gear 312. The gear 312 is meshed with the rack 1 331 and the rack 2 35 respectively. The fixed partition 313 is symmetrically connected to the fixing seat 31. The pressing pieces 341 arranged at the top and bottom thereof are fixedly connected with the pressing plate 34, the pressing piece 341 is arc-shaped, and its arc-shaped surface is inward, a pressing block 2 342 is arranged on the side of the pressing plate 34 close to the fixed partition 313, a pressing block 1 332 is arranged on the outer wall of the movable frame 33 close to the pressing block 2 342, the pressing block 2 342 is slidably connected with the pressing block 1 332, and the side where the pressing block 2 342 and the pressing block 1 332 are connected is an inclined surface, a circular hole 1 is opened on the top of the fixed seat 31, and a circular hole 2 is opened at the position of the pressing plate 34 and the fixed partition 313 corresponding to the circular hole 1, the bottom plate 32 is fixedly connected to the inner bottom position of the fixed seat 31, and the lower electrode sheet 321 is fixedly connected to the position of the top of the bottom plate 32 corresponding to the circular hole 1.

[0032] The lifting mechanism 4 includes a mounting cover 41 fixedly mounted on the bottom of the mounting frame 11, and also includes a sliding rod 45 fixedly mounted inside the mounting cavity 12. The sliding rod 45 has a circumferential outer surface slidably connected with a lifting plate 46. A socket 461 is provided at the top of the lifting plate 46 near the downward pressure test mechanism 2. A positioning plate 462 is movably connected inside the socket 461. A spring three 47 is sleeved on the circumferential outer surface of the sliding rod 45 located below the lifting plate 46. A driving component 42 is provided inside the mounting cover 41. A screw 43 is provided at the top of the driving component 42. The screw 43 penetrates the mounting frame 11 and extends to the inside of the mounting cavity 12. The outer wall of the screw 43 located inside the mounting cavity 12 is threadedly connected with a screw sleeve 44. The lower end of the screw sleeve 44 penetrates the lifting plate 46 and is slidably connected. The top of the screw sleeve 44 is stuck on the top of the lifting plate 46 to limit its height. The height of the screw sleeve 44 is adjusted by rotating the screw 43. When the screw sleeve 44 is raised or lowered, it will be synchronously adjusted with the spring three 47 to control the lifting plate 46.

[0033] Insert the spring probe into the circular hole 1 and the circular hole 2 in the clamping and fixing mechanism 3, so that its bottom contacts the lower electrode sheet 321, and then place the clamping and fixing mechanism 3 into the docking port 13, and then the hydraulic mechanism pushes it to move inside the docking port 13. When the clamping and fixing mechanism 3 moves to the point where it is almost inside the mounting frame 11, the gear 312 inside the docking slot 311 contacts the rack 2 35 inside the mounting slot 14. Because the spring 2 36 supports the rack 2 35, the rack 2 35 will not move. Therefore, when the gear 312 contacts the rack 2 35, the gear 312 will rotate, and the gear 312 rotates to move the rack 1 331 meshing with it, and the movement of the rack 1 331 will drive the movable frame 33 to move, and the movement of the movable frame 33 will drive the pressing block 1 332 to move, and the movement of the pressing block 1 332 will squeeze the inclined surface of the pressing block 2 342 through the inclined surface, and when the pressing block 2 342 is squeezed, it will drive the pressing plate 34 to move to the position of the fixed partition 313, and the space between the pressing plate 34 and the fixed partition 313 The pressing piece 341 will be squeezed due to the movement of the pressing plate 34. When the pressing piece 341 is squeezed, its arc surface will bend toward the position of the spring probe to squeeze the spring probe, thereby fixing the spring probe. The diameters of spring probes of different sizes are different, so the degree of bending of the pressing piece 341 after being squeezed is different. Therefore, the distances moved by the rack 1 331 to move the movable frame 33 are different. When the rack 1 331 moves to a certain distance and cannot move, the gear 312 and the rack 1 331 and the rack 2 35 will be stuck to each other, making the clamping and fixing mechanism 3 unable to move. At the same time, the hydraulic mechanism will continue to push the clamping and fixing mechanism 3 to move, and the pushing force of the hydraulic mechanism is greater than the supporting force of the supporting spring 2 36, so the rack 2 35 will squeeze the spring 2 36 to shrink, so that the clamping and fixing mechanism 3 continues to move into the mounting frame 11, and then it will be positioned and fixed after passing through the positioning mechanism. While squeezing the spring 2 36, the pressing force of the pressing piece 341 remains unchanged, so that the spring probe can be clamped continuously. After the clamping and fixing mechanism 3 is fixed, the positioning plate 462 is inserted into the socket 461, and then the screw 43 is driven to rotate by the driving component 42, and the height of the lifting plate 46 is adjusted by rotating the screw 43. The lifting plate 46 is adjusted to drive the positioning plate 462 to fall on the top of the spring probe, and then the positioning plate 462 is pulled out, and then the cylinder driving component 23 pushes the test frame 21 to move down so that the bottom docking plate 22 falls on the lifting plate 46. At this time, the upper electrode sheet 264 will fall on the top of the spring probe. At this time, a circuit connection will be formed between the upper electrode sheet 264, the spring probe, and the lower electrode sheet 321, which is used to test the electrical connectivity of the spring probe to verify its working performance when powered on. This test involves measuring the probe in contact state. The resistance, current or voltage parameters under the spring probe are measured to ensure that they meet the design requirements. Because the upper electrode sheet 264 has been in contact with the spring probe, the spring probe will be pressed against the slider 262 and cannot fall. At the same time, as the fixed tube 26 falls, it will squeeze the clamp rod 265. After being squeezed, the clamp rod 265 will shrink, thereby clamping the top of the spring probe. This will stabilize and protect the spring probe when it is squeezed later. After the clamp rod 265 clamps the top of the spring probe, the position of the slider 262 is also fixed. The cylinder drive assembly 23 continues to push down and press the probe of the spring probe to squeeze the spring inside it. While squeezing the spring, the resistance of the spring after squeezing is measured. This test can be called a dynamic contact resistance test or a pressure-resistance relationship test. This test method is mainly used to evaluate the changes in the electrical contact performance of the spring probe when it is subjected to mechanical pressure, to ensure that the electrical connection of the spring probe remains stable under different pressure conditions, and the resistance value fluctuates within an acceptable range. By measuring the change in the resistance value, the contact quality between the spring probe and the contact surface can be indirectly evaluated, including factors such as the contact area and contact pressure. While the cylinder drive assembly 23 continues to push the test frame 21 down, it will squeeze the lifting plate 46 downward through the docking plate 22, and the lifting plate 46 will squeeze the spring 3 47 when it moves down to a certain extent. Then the telescopic rod 24 pulls the sleeve 27 upward through the push plate 25. After the sleeve 27 moves up, it will lose the force to squeeze the clamp rod 265 to contract. Then the clamp rod 265 opens and no longer clamps the spring probe. At the same time, the cylinder drive assembly 23 stops working and cuts off the force to push the test frame 21 down. , after the spring 3 47 loses pressure, it will quickly push the lifting plate 46 up, and the lifting plate 46 will move up as a whole through the downward pressure test mechanism 2. Because the height limit of the lifting plate 46 is set, the lifting plate 46 will stop when it moves to the set height, and the upper electrode sheet 264 will also move to the height just in contact with the spring probe. Then it depends on whether the spring in the spring probe can push the probe to return to its original position and contact the upper electrode sheet 264 to energize. If it cannot be reset, it means that there is a problem with the spring reset performance. This is used to measure the resilience of the spring probe; When the spring probe is finished measuring, the clamping and fixing mechanism 3 is pulled out of the mounting bracket 11 by the hydraulic mechanism. While pulling, the spring 2 36 will slowly recover. When the fixing seat 31 is pulled to the position where the gear 312 and the rack 1 331 and the rack 2 35 are stuck, the jam will be released. At the same time, the reverse movement will drive the gear 312 to rotate in the reverse direction, thereby driving the movable frame 33 to move in the reverse direction so that the pressing piece 341 will slowly reset, thereby releasing the fixation of the spring probe, and the problematic spring probe will enter the next step for correction.

[0034] This device integrates the test functions of spring force and contact resistance in the same device through an integrated design, avoiding the scattered tests between different stations and equipment in the traditional method, significantly reducing the time of material handling and station conversion, and improving the test efficiency. At the same time, automated testing reduces the interference of human factors and improves the stability and consistency of test results; The gear 312, rack and spring in the clamping and fixing mechanism 3 are designed to accurately match and effectively protect spring-type probes of different sizes and structures. This adaptive design avoids probe damage caused by improper test force or unreasonable fixture design, reducing production costs and maintenance difficulties. Through automated testing processes, such as automatic alignment, clamping, testing and resetting, the testing process is simplified, the testing time is reduced, and the overall production cycle is shortened. This is especially important for improving efficiency in large-scale production environments; By integrating multiple test functions (such as electrical connectivity test, dynamic contact resistance test, pressure-resistance relationship test and resilience test), the device can comprehensively evaluate the overall performance of the spring probe, including electrical and mechanical properties, ensuring the comprehensiveness and reliability of the test results; The flexibility of the device design makes it easy to cope with the test requirements of probes of different lengths or diameters. There is no need to frequently change fixed molds, which reduces the test preparation time, improves the versatility and flexibility of the equipment, and further improves the overall test efficiency.

[0035] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements will not cause the essence of the corresponding technical solutions to deviate from the protection scope of the technical solutions of the embodiments of the present invention.

Claims

1. A high stability current probe measurement and calibration device, characterized in that: include: A main frame (1), the main frame (1) comprising a mounting frame (11), a docking port (13) being arranged at the front end of the mounting frame (11), a mounting groove (14) being arranged at one end of the docking port (13) located inside the mounting frame (11), and a mounting cavity (12) being arranged inside the mounting frame (11) near the docking port (13); A downward pressure testing mechanism (2), the downward pressure testing mechanism (2) comprising a testing frame (21), the interior of the testing frame (21) being a hollow cavity, a fixed cylinder (26) being fixed at the bottom of the cavity, the bottom end of the fixed cylinder (26) passing through the testing frame (21) and extending to the outside thereof, a sliding groove (261) being provided on the circumferential outer surface of the fixed cylinder (26), a sleeve (27) being slidably connected to the interior of the sliding groove (261), a sliding block (262) being slidably connected to the interior of the fixed cylinder (26), and an upper electrode sheet (264) being fixedly connected to the bottom of the sliding block (262); A clamping and fixing mechanism (3), the clamping and fixing mechanism (3) comprising a fixing seat (31), the fixing seat (31) being slidably connected to the inner wall of the docking port (13), a fixing partition (313) being arranged inside the fixing seat (31), a movable frame (33) being sleeved outside the fixing partition (313), the fixing partition (313) being connected to a pressing plate (34) via pressing plates (341) symmetrically arranged at the top and bottom thereof, a bottom plate (32) being fixedly connected to the bottom of the fixing seat (31), and a lower electrode plate (321) being fixedly connected to the top of the bottom plate (32); The lifting mechanism (4) comprises a sliding rod (45) fixed inside the mounting cavity (12), and a lifting plate (46) is slidably connected to the outer wall of the sliding rod (45).

2. A high stability current probe measurement and correction device according to claim 1, characterized in that: The test frame (21) is connected to the mounting frame (11) via a cylinder drive assembly (23) arranged on the top thereof; a push plate (25) is slidably connected to the interior of the cavity; a telescopic rod (24) is fixedly connected to the top of the test frame (21); an output end of the telescopic rod (24) passes through the test frame (21) and extends to the interior of the cavity and is fixedly connected to the push plate (25); the top of the sleeve (27) is fixedly connected to the bottom of the push plate (25); and a docking plate (22) is arranged at the bottom of the test frame (21).

3. A high stability current probe measurement and correction device according to claim 2, characterized in that: The bottom of the upper electrode sheet (264) is arc-shaped, and the height of the bottom of the docking plate (22) is on the same horizontal line as the highest point of the arc at the bottom of the upper electrode sheet (264).

4. The high stability current probe measurement and correction device according to claim 1, characterized in that: The outer circumferential surface of the slider (262) is provided with a second mounting groove (263), a clamping rod (265) is hinged inside the second mounting groove (263), a third mounting groove (266) is provided on the outer wall of the clamping rod (265) near the slider (262), a first spring (267) is arranged inside the third mounting groove (266), and the other end of the first spring (267) is connected to the inner wall of the second mounting groove (263).

5. The high stability current probe measurement and calibration device according to claim 1, characterized in that: The clamping and fixing mechanism (3) further comprises a rack gear 2 (35) slidably connected to the interior of the mounting groove 1 (14); a docking groove (311) is provided on the outer wall of the fixing seat (31) near the mounting groove 1 (14); a gear (312) is rotatably connected to the interior of the docking groove (311); a rack gear 1 (331) is fixedly connected to the outer wall of the movable frame (33) near the gear gear (312); and the gear gear (312) is meshedly connected to the rack gear 1 (331) and the rack gear 2 (35) respectively.

6. A high stability current probe measurement and calibration device according to claim 5, characterized in that: A spring 2 (36) is arranged inside the mounting groove 1 (14), one end of the spring 2 (36) is connected to the inner wall of the mounting groove 1 (14), and the other end of the spring 2 (36) is connected to the rack 2 (35), so as to support the rack 2 (35) and provide a reset force.

7. The high stability current probe measurement and calibration device according to claim 1, characterized in that: A second pressing block (342) is arranged on one side of the pressing plate (34) close to the fixed partition (313), and a first pressing block (332) is arranged on the outer wall of the movable frame (33) close to the second pressing block (342). The second pressing block (342) is slidably connected to the first pressing block (332), and the side where the second pressing block (342) and the first pressing block (332) are connected is an inclined surface.

8. The high stability current probe measurement and calibration device according to claim 1, characterized in that: The lifting mechanism (4) further comprises a mounting cover (41) fixedly connected to the bottom of the mounting frame (11), a driving assembly (42) being arranged inside the mounting cover (41), an output end of the driving assembly (42) being connected to a screw rod (43), the screw rod (43) vertically penetrating the mounting frame (11) and extending into the mounting cavity (12), an outer wall of the screw rod (43) located inside the mounting cavity (12) being threadedly connected to a screw sleeve (44), a lower end of the screw sleeve (44) penetrating the lifting plate (46) and being slidably connected thereto, a spring three (47) being sleeved on the circumferential outer surface of the sliding rod (45) located below the lifting plate (46), a socket (461) being arranged at the top of the lifting plate (46), a positioning plate (462) being movably connected inside the socket (461).

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