A CIS chip test image acquisition and light source synchronization control method and system

Abstract

The present invention provides a CIS chip test image acquisition and light source synchronization control method and system, which is applied to a system including a test machine, a CIS control end, a chip and a light source, wherein the CIS control end is connected to the test machine in communication; including: sending a preset synchronization protocol to the test machine through the CIS control end; parsing the synchronization protocol through the test machine, and generating a synchronization control Pattern instruction according to the parsed synchronization protocol; sending the synchronization control Pattern instruction to the chip and the light source respectively through the test machine, so that the chip and the light source that receive the synchronization control Pattern instruction are synchronously triggered based on the synchronization control Pattern instruction respectively, so as to realize the same frequency and same source of the chip and the light source. The present invention generates a synchronization control Pattern instruction according to the acquired synchronization protocol, so that the light source and the chip are synchronously triggered according to the synchronization control Pattern instruction, so as to realize the same frequency and same source of the chip and the light source; it provides a solid and reliable experimental basis for the performance evaluation of the chip and the testing of the image processing capability, and improves the accuracy and reliability of the test.

Description

Technical Field

[0001] The present invention relates to the technical field of integrated circuit testing, and in particular to a CIS chip testing image acquisition and light source synchronization control method and system. Background Art

[0002] CMOS image sensor is an image sensor manufactured using CMOS complementary metal oxide semiconductor technology. Its working principle is to use photodiodes for photoelectric conversion at each pixel and use amplifiers and A / D conversion circuits to convert images into stable electrical signals. Compared with CCD image sensors, CMOS image sensors have the following key advantages: low production cost, fast imaging speed, easier system integration, low power consumption, wide dynamic range, strong radiation resistance, etc., which makes CIS (CMOS Image Sensor) chips grow rapidly. In addition, with the rapid development of smart phones, the Internet of Things, biometrics, and life sciences, CIS chips have also rapidly grown into one of the most dazzling products in the semiconductor industry.

[0003] After the preparation of CIS chip, it needs to be tested and evaluated before it can enter the normal use stage. The conventional test is to set the light source first, and then perform image acquisition. However, in the actual testing process, there are some CIS chips or scenes that require dynamic image acquisition, which requires dynamic setting of the light source, which cannot be met by conventional testing. Summary of the invention

[0004] In view of this, the present invention proposes a CIS chip test image acquisition and light source synchronization control method and system, the specific scheme is as follows:

[0005] In the first part, the present invention proposes a CIS chip test image acquisition and light source synchronization control method, which is applied to a system including a test machine, a CIS control end, a chip and a light source, wherein the CIS control end is communicatively connected to the test machine; the method comprises:

[0006] Sending a preset synchronization protocol to the test machine through the CIS control terminal;

[0007] Parsing the synchronization protocol by the test machine, and generating a synchronization control Pattern instruction according to the parsed synchronization protocol;

[0008] The test machine sends the synchronous control Pattern instruction to the chip and the light source respectively, so that the chip and the light source receiving the synchronous control Pattern instruction are synchronously triggered based on the synchronous control Pattern instruction respectively, so as to realize the same frequency and the same source of the chip and the light source.

[0009] In a specific embodiment, the system further includes a light source controller and a collection device, and the light source controller is in communication with the CIS control terminal; before the step of "sending the synchronization control pattern instruction to the chip and the light source respectively through the test machine", it also includes:

[0010] Sending the synchronization protocol to the light source controller and the acquisition device respectively through the CIS control end;

[0011] The synchronization protocol is parsed by the light source controller and the acquisition device respectively, and the lighting parameters of the light source are configured by the light source controller according to the parsed synchronization protocol;

[0012] The image acquisition parameters of the chip are configured by the test machine or the acquisition device according to the parsed synchronization protocol.

[0013] In a specific embodiment, the configuring of lighting parameters of the light source includes: configuring the brightness and / or lighting duration of the light source;

[0014] The configuration of the image acquisition parameters of the chip includes: configuring the interface rate, and / or resolution, and / or frame rate of the chip output image.

[0015] In a specific embodiment, the number of the chips includes one or more; the number of the light sources includes one or more.

[0016] In a specific embodiment, it also includes:

[0017] Modifying the synchronization control Pattern instruction to change the accuracy and timing of Pattern generation timing;

[0018] The modified synchronization control Pattern instruction is sent to the chip and the light source, so that the chip and the light source that receive the modified synchronization control Pattern instruction are synchronously triggered based on the modified synchronization control Pattern instruction respectively, so as to achieve the same frequency and the same source of the chip and the light source.

[0019] In the second part, the present invention proposes a CIS chip test image acquisition and light source synchronization control system, which is applied to a system including a test machine, a CIS control terminal, a chip and a light source, wherein the CIS control terminal is communicatively connected to the test machine; the system includes:

[0020] A sending module, used for sending a preset synchronization protocol to the test machine through the CIS control terminal;

[0021] A generating module, used for parsing the synchronization protocol through the testing machine, and generating a synchronization control Pattern instruction according to the parsed synchronization protocol;

[0022] A trigger module is used to send the synchronization control Pattern instruction to the chip and the light source respectively through the test machine, so that the chip and the light source that receive the synchronization control Pattern instruction are synchronously triggered based on the synchronization control Pattern instruction respectively, so as to achieve the same frequency and source of the chip and the light source.

[0023] In a specific embodiment, the system further includes a light source controller and a collection device, and the light source controller and the collection device are respectively connected to the CIS control end in communication; before the "sending the synchronization control Pattern instruction to the chip and the light source respectively through the test machine", it also includes:

[0024] Sending the synchronization protocol to the light source controller and the acquisition device respectively through the CIS control end;

[0025] The synchronization protocol is parsed by the light source controller and the acquisition device respectively, and the lighting parameters of the light source are configured by the light source controller according to the parsed synchronization protocol;

[0026] The image acquisition parameters of the chip are configured by the test machine or the acquisition device according to the parsed synchronization protocol.

[0027] In a specific embodiment, the configuring of lighting parameters of the light source includes: configuring the brightness and / or lighting duration of the light source;

[0028] The configuration of the image acquisition parameters of the chip includes: configuring the interface rate, and / or resolution, and / or frame rate of the chip output image.

[0029] In a specific embodiment, the number of the chips includes one or more; the number of the light sources includes one or more.

[0030] In a specific embodiment, it also includes:

[0031] Modifying the synchronization control Pattern instruction to change the accuracy and timing of Pattern generation timing;

[0032] The modified synchronization control Pattern instruction is sent to the chip and the light source, so that the chip and the light source that receive the modified synchronization control Pattern instruction are synchronously triggered based on the modified synchronization control Pattern instruction respectively, so as to achieve the same frequency and the same source of the chip and the light source.

[0033] Beneficial effects:

[0034] The present invention provides a CIS chip test image acquisition and light source synchronization control method and system, by generating a synchronization control Pattern instruction according to an acquired synchronization protocol, so that the light source and the chip are synchronously triggered according to the synchronization control Pattern instruction, so as to achieve the same frequency and source of the chip and the light source; it provides a more solid and reliable experimental basis for the performance evaluation of the chip and the test of the image processing capability, and improves the accuracy and reliability of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 It is a flow chart of a CIS chip test image acquisition and light source synchronous control and sending method according to an embodiment of the present invention;

[0036] Figure 2 It is a schematic diagram of the CIS chip test image acquisition and light source synchronous control and sending system module of an embodiment of the present invention;

[0037] Figure 3 It is a module schematic diagram of a CIS chip test image acquisition and light source synchronous control and sending method according to an embodiment of the present invention;

[0038] Figure 4 It is a schematic diagram of the connection relationship between the CIS control terminal, the test machine, the acquisition device and the light source controller of an embodiment of the present invention.

[0039] Figure identification: 1-sending module; 2-generating module; 3-triggering module. DETAILED DESCRIPTION

[0040] In the following, various embodiments of the present disclosure will be described more fully. The present disclosure may have various embodiments, and adjustments and changes may be made therein. However, it should be understood that there is no intention to limit the various embodiments of the present disclosure to the specific embodiments disclosed herein, but the present disclosure should be understood to cover all adjustments, equivalents and / or alternatives that fall within the spirit and scope of the various embodiments of the present disclosure.

[0041] The terms used in the various embodiments disclosed in the present invention are only used for the purpose of describing specific embodiments and are not intended to limit the various embodiments disclosed in the present invention. As used herein, the singular form is intended to also include the plural form, unless the context clearly indicates otherwise. Unless otherwise specified, all terms used herein (including technical terms and scientific terms) have the same meaning as the meanings commonly understood by ordinary technicians in the field of the various embodiments disclosed in the present invention. The terms (such as the terms defined in the generally used dictionary) will be interpreted as having the same meaning as the contextual meaning in the relevant technical field and will not be interpreted as having an idealized meaning or an overly formal meaning, unless clearly defined in the various embodiments disclosed in the present invention.

[0042] Example 1

[0043] Embodiment 1 of the present invention discloses a CIS chip test image acquisition and light source synchronization control method, which generates a synchronization control pattern instruction according to the acquired synchronization protocol, so that the light source and the chip are synchronously triggered according to the synchronization control pattern instruction, so as to achieve the same frequency and source of the chip and the light source; it provides a more solid and reliable experimental basis for the performance evaluation of the chip and the test of the image processing capability, and improves the accuracy and reliability of the test. The specific process is as shown in the attached manual. Figure 1 The specific plan is as follows:

[0044] A CIS chip test image acquisition and light source synchronization control method is applied to a system including a test machine, a CIS control terminal, a chip and a light source, wherein the CIS control terminal is communicatively connected to the test machine; the method comprises:

[0045] 101. Send the preset synchronization protocol to the tester through the CIS control terminal. The preset synchronization protocol is the key to ensure that the image acquisition and light source control can be accurately synchronized during the entire test process. It contains the timing information, instruction format and other necessary parameter settings used to coordinate the operations of the two to ensure that during chip testing, the image data acquisition and the light source switching, brightness adjustment and other actions can be accurately matched, so as to obtain high-quality and reliable test image data.

[0046] 102. The test machine parses the synchronization protocol and generates synchronization control pattern instructions based on the parsed synchronization protocol. After receiving the synchronization protocol from the CIS control end, the test machine will immediately parse the synchronization protocol in detail. The parsing process includes but is not limited to identifying each field in the synchronization protocol, understanding its meaning, and extracting key control parameters and timing requirements.

[0047] After successfully parsing the synchronization protocol, the test machine will generate a series of precise synchronization control pattern instructions based on the extracted parameters and timing requirements. These instructions are the basis for the test machine to accurately control the CIS control terminal and light source, and contain key information such as the trigger signal of image acquisition, the on / off status of the light source, the brightness adjustment level, and the time relationship between them.

[0048] The generated synchronous control pattern instructions will ensure that during the chip test process, image acquisition and light source control can be performed according to the predetermined timing and parameters, thereby effectively improving the accuracy and reliability of the test. At the same time, in practical applications, these instructions are also flexible and scalable, and can be adjusted and optimized according to different test requirements and chip characteristics to meet a wider range of test applications.

[0049] 103. The test machine sends synchronization control Pattern instructions to the chip and the light source respectively, so that the chip and the light source that receive the synchronization control Pattern instructions are synchronously triggered based on the synchronization control Pattern instructions respectively, so as to realize the same frequency and the same source of the chip and the light source.

[0050] When the chip receives the synchronous control pattern instruction from the tester, the decoding and response mechanism inside the chip is quickly activated to parse the instruction. According to the time nodes and control parameters specified in the instruction, the chip can accurately plan the start time of its image acquisition, thereby maximizing the quality and integrity of the image data.

[0051] At the same time, the light source system also received the synchronous control pattern instructions sent by the test machine. The control unit in the light source system also thoroughly analyzed these instructions and accurately adjusted the switch status, brightness level and other possible light source characteristics of the light source according to the instructions. This ensures that the adjustment of the light source is highly synchronized with the start of the chip's image acquisition.

[0052] Through this synchronous control mechanism, the chip and the light source achieve close coordination and synchronous triggering based on the synchronous control pattern instruction. It not only ensures the consistency of the operating frequency and signal source of the two during the test (i.e. the same frequency and source), but also greatly improves the accuracy and reliability of the test. It enables the test system to more accurately simulate the lighting conditions and image acquisition requirements in actual application scenarios, thus providing a more solid and reliable experimental foundation for chip performance evaluation and image processing capability testing.

[0053] In a specific embodiment, the system further includes a light source controller and a collection device, which are respectively connected to the CIS control terminal in communication; and before "sending a synchronous control pattern instruction to the chip and the light source respectively through the test machine", it also includes:

[0054] Send synchronization protocols to the light source controller and acquisition device respectively through the CIS control terminal;

[0055] The synchronization protocol is parsed by the light source controller and the acquisition device respectively, and the lighting parameters of the light source are configured by the light source controller according to the parsed synchronization protocol;

[0056] The image acquisition parameters of the chip are configured through a test machine or acquisition equipment according to the parsed synchronization protocol.

[0057] In this embodiment, a light source controller and a collection device are also included. The light source controller and the collection device respectively establish a stable and efficient communication connection with the CIS control terminal to achieve precise control of the light source and the chip.

[0058] In actual applications, before the tester sends synchronization control Pattern instructions to the chip and light source respectively (that is, before the test process officially starts), the CIS control end will send a synchronization protocol to the light source controller. The synchronization protocol contains information about light source control, including but not limited to the setting range of lighting parameters, change timing, and brightness adjustment requirements.

[0059] After receiving the synchronization protocol, the light source controller will immediately start its built-in parsing mechanism and configure the lighting parameters of the light source based on the parsed synchronization protocol. These configurations may include the on and off time of the light source, the adjustment of the brightness level, the selection of color temperature, and possible flickering frequency, etc., providing stable and high-quality lighting conditions for the chip's image acquisition.

[0060] At the same time, the CIS control end will also send a synchronization protocol to the acquisition device. After receiving the synchronization protocol, the acquisition device will start its built-in parsing mechanism to parse the synchronization protocol to configure the image acquisition parameters of the chip. The test machine can also configure the image acquisition parameters of the chip according to the previously parsed synchronization protocol. The image acquisition parameters may cover the resolution, frame rate, exposure time, white balance adjustment, and possible image processing algorithms of the image acquisition. Ensure that the chip can accurately capture and process image data during the test, laying a solid foundation for subsequent performance evaluation and image processing capability testing.

[0061] After completing the configuration of the light source illumination parameters and the chip image acquisition parameters, the tester sends synchronization control Pattern instructions to the chip and light source respectively. At this point, the chip and light source have been accurately configured with parameters according to the synchronization protocol, and the collaborative work between the chip and the light source has become more efficient and reliable, so as to achieve precise control and synchronous triggering of the chip and light source, providing a strong guarantee for subsequent testing work.

[0062] In a specific embodiment, configuring the lighting parameters of the light source includes: configuring the brightness and / or lighting duration of the light source;

[0063] Configuring the image acquisition parameters of the chip includes: configuring the interface rate, and / or resolution, and / or frame rate of the chip output image.

[0064] In this embodiment, the configuration of the lighting parameters of the light source includes configuring the brightness and lighting duration of the light source. Brightness adjustment is one of the key factors to ensure the quality of image acquisition, which directly affects the clarity and contrast of the information in the image. By finely adjusting the brightness of the light source, the system can ensure that during the test, the image data can accurately reflect the performance of the chip under different lighting conditions. At the same time, the configuration of the lighting duration determines the time when the light source is turned on and off during the test, thereby affecting the timing and frequency of image acquisition. By reasonably setting the lighting duration, the system can ensure that the light source can provide stable and continuous lighting conditions when the chip is performing image acquisition.

[0065] The configuration of chip image acquisition parameters includes the interface rate, resolution and frame rate of the chip output; the interface rate determines the speed at which image data is transmitted from the chip to the test machine, which directly affects the overall performance and efficiency of the test system. By optimizing the interface rate, the system can ensure that image data can be transmitted to the test machine for analysis and processing in real time and accurately during the test. The configuration of resolution and frame rate is a key factor affecting the quality of image acquisition. The resolution determines the number of pixels in the image, which directly affects the clarity and detail of the image. The frame rate determines the frequency of image acquisition, which affects the real-time and accuracy of the test system's evaluation of chip performance. By reasonably setting the resolution and frame rate, the system can ensure that the chip can capture high-quality, high-definition image data during the test.

[0066] In a specific embodiment, the number of chips includes one or more; the number of light sources includes one or more.

[0067] In this embodiment, the system supports the testing of a single chip or multiple chips, making the test system highly scalable and adaptable, and able to meet the testing requirements of different scales and complexities. When a single chip needs to be tested, the system can focus on the performance evaluation of the chip to ensure the accuracy and reliability of the test results. When multiple chips need to be tested, the system can handle the image acquisition and data analysis tasks of multiple chips at the same time, greatly improving the test efficiency.

[0068] Similarly, the system supports the configuration of a single light source or multiple light sources. The configuration of a single light source is suitable for simple test scenarios, where the lighting conditions and parameters of the light source can be relatively fixed. However, in more complex test scenarios, multiple light sources may be needed to simulate different lighting conditions or provide multi-angle lighting. Multiple light sources can be controlled independently or work together to provide richer and more diverse lighting conditions.

[0069] In the configuration of multiple chips and multiple light sources, the test system needs to manage the sending and receiving of synchronization control pattern instructions more carefully. In order to ensure accurate synchronization between chips and light sources, the system needs to accurately calculate the triggering moment of each chip and light source and ensure that the timing relationship between them remains consistent. In addition, the system also needs to consider the mutual influence and interference between multiple chips and light sources to ensure the accuracy and reliability of the test results.

[0070] In a specific embodiment, it also includes:

[0071] Modify the synchronization control Pattern instruction to change the accuracy and timing of Pattern generation timing;

[0072] The modified synchronization control Pattern instruction is sent to the chip and the light source, so that the chip and the light source that receive the modified synchronization control Pattern instruction are synchronously triggered based on the modified synchronization control Pattern instruction, so as to achieve the same frequency and the same source of the chip and the light source.

[0073] In this embodiment, the system is also given the ability to flexibly adjust the timing. Specifically, the system introduces the function of modifying the synchronous control Pattern instruction. In practical applications, the accuracy of the Pattern generation timing in the instruction and the timing itself can be fine-tuned according to actual needs. The accuracy can be accurate to 1 nanosecond (1ns), which means that the system can control the synchronous triggering moment of the chip and the light source with extremely high accuracy. This high-precision synchronous control is crucial for application scenarios that need to capture high-speed dynamic processes or perform ultra-precision measurements.

[0074] After the modification, the system will send the updated synchronization control pattern instructions to the chip and light source. These instructions contain fine-tuned timing information to ensure that the chip and light source can be accurately and synchronously triggered according to the new timing requirements. When the chip receives the modified synchronization control pattern instruction, it adjusts the triggering moment of its image acquisition module according to the new timing requirements in the instruction. Similarly, the light source will also adjust the switching moment of its lighting state according to the new timing requirements in the instruction.

[0075] Through this sophisticated synchronization control mechanism, the system not only achieves the same frequency and source of the chip and light source during the test, but also greatly improves the accuracy and reliability of the test. This high-precision synchronization control is crucial for evaluating the performance of the chip in high-speed and high-precision application scenarios. At the same time, it also provides more accurate and reliable experimental data for subsequent image processing and analysis.

[0076] Example 2

[0077] Embodiment 2 of the present invention discloses a CIS chip test image acquisition and light source synchronization control system, which systematizes a CIS chip test image acquisition and light source synchronization control method of embodiment 1 to make it more practical. The overall structure diagram of the CIS chip test image acquisition and light source synchronization control transmission system is shown in the attached manual. Figure 2 The specific plan is as follows:

[0078] A CIS chip test image acquisition and light source synchronization control system is applied to a system including a test machine, a CIS control terminal, a chip and a light source, wherein the CIS control terminal is communicatively connected to the test machine; the system includes:

[0079] The sending module 1 is used to send a preset synchronization protocol to the test machine through the CIS control terminal;

[0080] Generating module 2, used for parsing the synchronization protocol through the test machine, and generating a synchronization control Pattern instruction according to the parsed synchronization protocol;

[0081] The trigger module 3 is used to send synchronization control pattern instructions to the chip and the light source respectively through the test machine, so that the chip and the light source that receive the synchronization control pattern instructions are synchronously triggered based on the synchronization control pattern instructions to achieve the same frequency and source of the chip and the light source.

[0082] In a specific embodiment, the system further includes a light source controller and a collection device, which are respectively connected to the CIS control terminal in communication; and before "sending a synchronous control pattern instruction to the chip and the light source respectively through the test machine", it also includes:

[0083] Send synchronization protocols to the light source controller and acquisition device respectively through the CIS control terminal;

[0084] The synchronization protocol is parsed by the light source controller and the acquisition device respectively, and the lighting parameters of the light source are configured by the light source controller according to the parsed synchronization protocol;

[0085] The image acquisition parameters of the chip are configured through a test machine or acquisition equipment according to the parsed synchronization protocol.

[0086] In a specific embodiment, configuring the lighting parameters of the light source includes: configuring the brightness and / or lighting duration of the light source;

[0087] Configuring the image acquisition parameters of the chip includes: configuring the interface rate, and / or resolution, and / or frame rate of the chip output image.

[0088] In a specific embodiment, the number of chips includes one or more; the number of light sources includes one or more.

[0089] In a specific embodiment, it also includes:

[0090] Modify the synchronization control Pattern instruction to change the accuracy and timing of Pattern generation timing;

[0091] The modified synchronization control Pattern instruction is sent to the chip and the light source, so that the chip and the light source that receive the modified synchronization control Pattern instruction are synchronously triggered based on the modified synchronization control Pattern instruction, so as to achieve the same frequency and the same source of the chip and the light source.

[0092] This embodiment proposes a CIS chip test image acquisition and light source synchronous control and sending system, which systematizes the CIS chip test image acquisition and light source synchronous control and sending method of Embodiment 1 to make it more practical.

[0093] The present invention provides a CIS chip test image acquisition and light source synchronization control method and system, by generating a synchronization control Pattern instruction according to an acquired synchronization protocol, so that the light source and the chip are synchronously triggered according to the synchronization control Pattern instruction, so as to achieve the same frequency and source of the chip and the light source; it provides a more solid and reliable experimental basis for the performance evaluation of the chip and the test of the image processing capability, and improves the accuracy and reliability of the test.

[0094] Those skilled in the art will appreciate that the accompanying drawings are only schematic diagrams of a preferred implementation scenario, and the modules or processes in the accompanying drawings are not necessarily required for implementing the present invention. Those skilled in the art will appreciate that the modules in the devices in the implementation scenario can be distributed in the devices in the implementation scenario according to the description of the implementation scenario, or can be changed accordingly and located in devices different from the present implementation scenario.

Claims

1. A CIS chip test image acquisition and light source synchronization control method, characterized in that: Applicable to a system including a test machine, a CIS control terminal, a chip and a light source, wherein the CIS control terminal is communicatively connected to the test machine; the method comprises: Sending a preset synchronization protocol to the test machine through the CIS control terminal; Parsing the synchronization protocol by the test machine, and generating a synchronization control Pattern instruction according to the parsed synchronization protocol; The test machine sends the synchronous control Pattern instruction to the chip and the light source respectively, so that the chip and the light source receiving the synchronous control Pattern instruction are synchronously triggered based on the synchronous control Pattern instruction respectively, so as to realize the same frequency and the same source of the chip and the light source.

2. The method according to claim 1, characterized in that The system further comprises a light source controller and a collection device, wherein the light source controller and the collection device are respectively connected to the CIS control terminal for communication; Before the "sending the synchronization control Pattern instruction to the chip and the light source respectively by the test machine", the method further includes: Sending the synchronization protocol to the light source controller and the acquisition device respectively through the CIS control end; The synchronization protocol is parsed by the light source controller and the acquisition device respectively, and the lighting parameters of the light source are configured by the light source controller according to the parsed synchronization protocol; The image acquisition parameters of the chip are configured by the test machine or the acquisition device according to the parsed synchronization protocol.

3. The method according to claim 2, characterized in that The configuring of the lighting parameters of the light source includes: configuring the brightness and / or lighting duration of the light source; The configuration of the image acquisition parameters of the chip includes: configuring the interface rate, and / or resolution, and / or frame rate of the chip output image.

4. The method according to claim 1, characterized in that The number of the chips includes one or more; the number of the light sources includes one or more.

5. The method according to claim 1, characterized in that Also includes: Modifying the synchronization control Pattern instruction to change the accuracy and timing of Pattern generation timing; The modified synchronization control Pattern instruction is sent to the chip and the light source, so that the chip and the light source that receive the modified synchronization control Pattern instruction are synchronously triggered based on the modified synchronization control Pattern instruction respectively, so as to achieve the same frequency and the same source of the chip and the light source.

6. A CIS chip test image acquisition and light source synchronization control system, characterized in that: The method for implementing claims 1-5 is applied to a system including a test machine, a CIS control terminal, a chip and a light source, wherein the CIS control terminal is communicatively connected to the test machine; the system includes: A sending module, used for sending a preset synchronization protocol to the test machine through the CIS control terminal; A generating module, used for parsing the synchronization protocol through the testing machine, and generating a synchronization control Pattern instruction according to the parsed synchronization protocol; A trigger module is used to send the synchronization control Pattern instruction to the chip and the light source respectively through the test machine, so that the chip and the light source that receive the synchronization control Pattern instruction are synchronously triggered based on the synchronization control Pattern instruction respectively, so as to achieve the same frequency and source of the chip and the light source.

7. The system according to claim 6, characterized in that The system further comprises a light source controller and a collection device, wherein the light source controller and the collection device are respectively connected to the CIS control terminal for communication; Before the "sending the synchronization control Pattern instruction to the chip and the light source respectively by the test machine", the method further includes: Sending the synchronization protocol to the light source controller and the acquisition device respectively through the CIS control end; The synchronization protocol is parsed by the light source controller and the acquisition device respectively, and the lighting parameters of the light source are configured by the light source controller according to the parsed synchronization protocol; The image acquisition parameters of the chip are configured by the test machine or the acquisition device according to the parsed synchronization protocol.

8. The system according to claim 7, characterized in that The configuring of the lighting parameters of the light source includes: configuring the brightness and / or lighting duration of the light source; The configuration of the image acquisition parameters of the chip includes: configuring the interface rate, and / or resolution, and / or frame rate of the chip output image.

9. The system according to claim 6, characterized in that The number of the chips includes one or more; the number of the light sources includes one or more.

10. The system according to claim 6, characterized in that Also includes: Modifying the synchronization control Pattern instruction to change the accuracy and timing of Pattern generation timing; The modified synchronization control Pattern instruction is sent to the chip and the light source, so that the chip and the light source that receive the modified synchronization control Pattern instruction are synchronously triggered based on the modified synchronization control Pattern instruction respectively, so as to achieve the same frequency and the same source of the chip and the light source.

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