Test circuit board, test device and test method

Abstract

The invention provides a test circuit board, a test device and a test method, and the test circuit board comprises a plurality of first test terminals which are used for being connected with a target position and are arranged at intervals in a first direction after being connected; the first test terminal is configured with a first test signal and is used for testing whether a conductive substance exists in a target area; wherein the target area is at least partially located between the laser cutting position and the bonding area. According to the test circuit board provided by the invention, the target area between the laser cutting position and the bonding area is tested, whether conductive substances exist in the target area or not can be tested, reworking can be performed after the conductive substances are tested, short circuit between terminals caused by the conductive substances during electrical test or module bonding of the display panel is avoided, and the test efficiency is improved. And therefore, the yield of the product is obviously improved.

Description

Technical Field

[0001] The present application relates to the field of display technology, and in particular to a test circuit board, a test device and a test method. Background Art

[0002] With the development of display technology, the application of display panels is becoming more and more extensive, and accordingly, the requirements for display panels are becoming higher and higher. Before the existing display panels leave the factory, they need to be subjected to electrical tests to ensure the performance of the display panels.

[0003] However, existing display panels have a burn-in problem during electrical testing or module bonding. Summary of the invention

[0004] In view of this, the purpose of the present application is to provide a test circuit board that can reduce the risk of burns in display panels during electrical testing and module bonding.

[0005] Based on the above purpose, the present application provides a test circuit board, wherein the display panel includes a display area and a non-display area located at least on one side of the display area, at least one of the non-display areas includes a bonding area and a laser cutting position, the display panel also includes a plurality of panel terminals located in the bonding area, the laser cutting position extends along a first direction, and the plurality of panel terminals are arranged at intervals along the first direction, and the test circuit board includes:

[0006] A plurality of first test terminals, which are used to connect to the target area and are arranged at intervals along the first direction after being connected;

[0007] The first test terminal is configured with a first test signal for testing whether there is a conductive material in the target area;

[0008] Wherein, the target area is at least partially located between the laser cutting position and the bonding area.

[0009] In one embodiment, the test circuit board further includes:

[0010] A plurality of second test terminals, the plurality of second test terminals are used to be connected one by one with the plurality of panel terminals, and the second test terminals are configured with a second test signal for performing an electrical test on the display panel;

[0011] Preferably, the second test terminal is used to be connected to the panel terminal by crimping; or

[0012] The second test terminal is used to connect to the panel terminal through an anisotropic conductive film;

[0013] Preferably, the second test signal includes a voltage and / or a current signal.

[0014] In one embodiment, the test circuit board further includes:

[0015] The first test terminal and the second test terminal are located on one side of the substrate, the first test terminal and the second test terminal both extend along a second direction, and the first test terminal and the second test terminal are spaced apart in the second direction, and the second direction is perpendicular to the first direction.

[0016] In one embodiment, the test circuit board further includes:

[0017] a plurality of metal traces, wherein the plurality of metal traces are located on a side of the substrate away from the first test terminal, the substrate is provided with a plurality of vias, each of the metal traces is electrically connected to a corresponding second test terminal through a corresponding via, and the second test signal enters the second test terminal through the metal traces;

[0018] Preferably, each of the metal traces is electrically connected to the corresponding second test terminal through a plurality of the vias;

[0019] Preferably, the orthographic projection of the via hole on the substrate is located within the orthographic projection of the second test terminal on the substrate;

[0020] Preferably, the orthographic projections of the plurality of first test terminals on the substrate and the orthographic projections of the plurality of metal traces on the substrate are arranged at intervals along the first direction.

[0021] In one embodiment, the first test terminal is connected to the target area by crimping; or

[0022] The first test terminal is used to connect to the target area through an anisotropic conductive film;

[0023] Preferably, the first test signal includes a voltage and / or a current signal.

[0024] In one embodiment, the first test terminals are arranged at equal intervals;

[0025] Preferably, the target area is partially located between adjacent panel terminals.

[0026] Based on the same inventive concept, the present application also discloses a display panel testing device, which includes the above-mentioned testing circuit board.

[0027] Based on the same inventive concept, the present application also discloses a testing method for testing a display panel, wherein the display panel includes a display area and a non-display area, at least one of the non-display areas includes a bonding area and a laser cutting position, the display panel also includes a plurality of panel terminals located in the bonding area, the laser cutting position extends along a first direction, and the plurality of panel terminals are arranged at intervals along the first direction, the display panel testing method includes:

[0028] Connecting a plurality of first test terminals on a test circuit board to a target area on the display panel, wherein the plurality of first test terminals are arranged at intervals along the first direction after the connection; wherein the target area is at least partially located between the laser cutting position and the bonding area;

[0029] configuring a first test signal on the first test terminal to test whether a conductive material exists in the target area;

[0030] In response to the presence of a conductive substance in the target area, the display panel is powered off and no electrical test is performed;

[0031] In response to the absence of conductive material in the target area, an electrical test is performed on the display panel.

[0032] In one embodiment, the electrical test on the display panel includes:

[0033] configuring a second test signal for a plurality of second test terminals on the test circuit board that are connected one by one to a plurality of panel terminals, so as to perform an electrical test on the display panel;

[0034] Preferably, the second test signal includes a voltage and / or a current signal.

[0035] In one embodiment, configuring a first test signal on the first test terminal to test whether a conductive material exists in the target area includes:

[0036] configuring a first test signal on the first test terminal, and detecting a resistance value between two adjacent first test terminals;

[0037] When the resistance value is within a first threshold range, it is determined that a conductive material exists in the target area;

[0038] When the resistance value is not within the first threshold range, it is determined that no conductive material exists in the target area.

[0039] Compared with the prior art, the test circuit board provided in the present application can test whether there is conductive material in the target area by testing the target area between the laser cutting position and the bonding area. After the conductive material is tested, rework can be performed to avoid short circuits between terminals caused by conductive materials during electrical testing of the display panel or module bonding, resulting in burns on the panel terminals or poor electrical properties of the product, thereby significantly improving product yield. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the technical solutions in the present application or related technologies, the drawings required for use in the embodiments or related technical descriptions are briefly introduced below. Obviously, the drawings described below are only embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0041] Figure 1 is a schematic diagram of a related display panel;

[0042] Figure 2 is a schematic diagram of a local structure of a related display panel;

[0043] Figure 3 is a schematic diagram of a related test circuit board;

[0044] Figure 4 A schematic diagram of the connection between a related test circuit board and a display panel;

[0045] Figure 5 A schematic diagram of a test circuit board in an embodiment of the present application;

[0046] Figure 6 This is a schematic diagram of the connection between the test circuit board and the display panel in one embodiment of the present application;

[0047] Figure 7 This is a schematic diagram of the connection between the test circuit board and the display panel in another embodiment of the present application;

[0048] Figure 8 This is a schematic diagram of a test circuit board in another embodiment of the present application;

[0049] Fig. 9 This is a schematic diagram of the layer structure of a test circuit board and a display panel in another embodiment of the present application;

[0050] Fig.10 This is a schematic diagram of the connection between the test circuit board and the display panel in another embodiment of the present application;

[0051] Fig.11 This is a schematic diagram of the layer structure of a test circuit board and a display panel in another embodiment of the present application;

[0052] Fig.12 This is a schematic diagram of the connection between the test circuit board and the display panel in another embodiment of the present application;

[0053] Fig.13 This is a schematic diagram of the layer structure of a test circuit board and a display panel in another embodiment of the present application;

[0054] Fig.14 This is a schematic diagram of the connection between the test circuit board and the display panel in another embodiment of the present application;

[0055] Fig.15 This is a flow chart of a testing method in another embodiment of the present application;

[0056] Fig.16 This is a flow chart of a testing method in another embodiment of the present application.

[0057] Marking Description:

[0058] 1. Display panel; 11. Display area; 12. Non-display area; 13. Bonding area; 14. Panel terminals; 15. Laser cutting position; 16. Target area;

[0059] 2. Test circuit board; 21. Test terminal; 22. First test terminal; 23. Second test terminal; 24. Substrate; 241. Via hole; 25. Metal trace. DETAILED DESCRIPTION

[0060] In order to make the objectives, technical solutions and advantages of the present application more clearly understood, the present application is further described in detail below in combination with specific embodiments and with reference to the accompanying drawings.

[0061] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the embodiments of the present application should be the usual meanings understood by people with ordinary skills in the field to which the present application belongs. The "first", "second" and similar words used in the embodiments of the present application do not represent any order, quantity or importance, but are only used to distinguish different components. "Including" or "comprising" and similar words mean that the elements or objects appearing in front of the word cover the elements or objects listed after the word and their equivalents, without excluding other elements or objects. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0062] Please refer to Figure 1 and 2As shown, a related display panel 1 is shown. The display panel 1 includes a display area 11 and a non-display area 12. The non-display area 12 is arranged around the display area 11, wherein one of the non-display areas 12 includes a bonding area 13, and a panel terminal 14 is arranged in the bonding area 13.

[0063] Please refer to Figure 3 and 4 As shown, when the display panel 1 is electrically tested, a test circuit board 2 is required, and the test circuit board 2 includes a test terminal 21. Please continue to refer to Figure 4 As shown, during the test, the test terminals 21 need to be connected to the panel terminals 14 one by one, and a test signal is configured on the test terminals 21 to drive or detect the display panel 1. The test circuit board 2 at least partially covers the bonding area 13, and Figure 4 In order to show the test terminals 21 and the panel terminals 14, the substrate 24 of the test circuit board 2 is not shown.

[0064] After long-term research, the inventors found that in the display panel manufacturing process, lasers are required to cut products. During the laser cutting process, a large amount of carbonized foreign matter will remain near the laser cutting position 15, that is, around the panel terminal 14. Since the carbonized foreign matter has conductive properties, when the display panel 1 is subjected to electrical testing or module bonding, the carbonized conductive material will cause burns on the panel terminals or poor electrical properties of the product, resulting in loss of production yield.

[0065] Based on this, the present application provides a test circuit board solution to solve the above problems.

[0066] Please refer to Figure 1 , 5 As shown in Figure 6, an embodiment of the present application provides a test circuit board 2 for testing a display panel 1, wherein the display panel 1 includes a display area 11 and a non-display area 12, wherein at least one non-display area 12 includes a bonding area 13 and a laser cutting position 15, and the display panel 1 also includes a plurality of panel terminals 14 located in the bonding area 13, wherein the laser cutting position 15 extends along a first direction (such as the X direction in the figure), and the plurality of panel terminals 14 are arranged at intervals along the first direction.

[0067] The test circuit board 2 includes a plurality of first test terminals 22, which are used to connect to the target area 16 and are arranged in a first direction after connection. The first test terminals 22 are configured with a first test signal for testing whether there is a conductive material in the target area 16; wherein the target area 16 is at least partially located between the laser cutting position 15 and the bonding area 13.

[0068] The test circuit board 2 provided in this embodiment can test whether there is conductive material in the target area 16 by testing the target area 16 between the laser cutting position 15 and the bonding area 13. After the conductive material is tested, rework can be performed to avoid the conductive material causing a short circuit between terminals during electrical testing or module bonding of the display panel 1, resulting in burns to the panel terminals 14 or poor electrical properties of the product, thereby significantly improving the product yield.

[0069] Among them, since a large amount of carbonized foreign matter is generated during the laser cutting process and mainly remains near the laser cutting position 15, the target area 16 is selected between the laser cutting position 15 and the bonding area 13. By measuring the conductive material at this position, it can be determined whether there is carbonized foreign matter around the panel terminal 14.

[0070] In one embodiment, the first test signal includes a voltage or current signal. In another embodiment, the first test signal is a voltage signal and a current signal. The combination of the voltage signal and the current signal is helpful to improve the accuracy of the test.

[0071] In one embodiment, multiple first test terminals 22 are arranged at equal intervals, which is conducive to improving the accuracy of detection. The number of first test terminals 22 can be set as needed. When the number of first test terminals 22 is large, the distance between adjacent first test terminals 22 is small, which is conducive to improving the accuracy of the test.

[0072] Reference Figure 7 In one embodiment, the target area 16 is partially located between adjacent panel terminals 14. Conductive material detection can be performed on the area between adjacent panel terminals 14, ensuring a larger detection range and higher detection accuracy.

[0073] Reference Figure 8-10 As shown, in one embodiment, the test circuit board 2 also includes a plurality of second test terminals 23, which are used to be connected one by one with the plurality of panel terminals 14, and the second test terminals 23 are configured with a second test signal for performing electrical testing on the display panel 1.

[0074] In one embodiment, the first test terminal 22 and the second test terminal 23 are connected to the display panel 1 at the same time, and a first test signal is first configured on the first test terminal 22 to test whether there is a conductive substance in the target area 16. When the conductive substance is detected to be present in the target area 16, in order to avoid the conductive substance causing a short circuit between the terminals, the display panel 1 is powered off and no electrical test is performed. When the conductive substance is detected not to be present in the target area 16, a second test signal is configured on the second test terminal 23 to perform an electrical test on the display panel 1.

[0075] In another embodiment, the first test terminal 22 and the second test terminal 23 can be connected to the display panel 1 successively, that is, the first test terminal 22 is first connected to the target area 16 , and when it is detected that no conductive material exists in the target area 16 , the second test terminal 23 is then connected to the panel terminal 14 .

[0076] Specifically, the second test terminal 23 is used to be connected to the panel terminal 14 by crimping; or, the second test terminal 23 is used to be connected to the panel terminal 14 through an anisotropic conductive film, which is not specifically limited.

[0077] In one embodiment, the second test signal is a voltage signal or a current signal. In another embodiment, the second test signal is a voltage signal and a current signal. The combination of the voltage signal and the current signal is helpful to improve the accuracy of the test.

[0078] Please continue to refer to Fig. 9 As shown, in one embodiment, the test circuit board 2 further includes a substrate 24, the first test terminal 22 and the second test terminal 23 are located on one side of the substrate 24, the first test terminal 22 and the second test terminal 23 both extend along a second direction (such as the Y direction in the figure), and the first test terminal 22 and the second test terminal 23 are spaced apart in the second direction, and the second direction is perpendicular to the first direction. The first test terminal 22 and the second test terminal 23 are spaced apart in the second direction to avoid mutual influence between the first test terminal 22 and the second test terminal 23.

[0079] It should be noted that the substrate 24 is the substrate of the test circuit board 2 , and the display panel 1 also has a substrate, and the substrate of the display panel is different from the substrate of the test circuit board 2 .

[0080] Reference Fig. 9 As shown, during the test, the substrate 24 is located on the side of the panel terminal 14 away from the display panel 1 .

[0081] Reference Fig.11 and 12 As shown, in one embodiment, the test circuit board 2 further includes a plurality of metal traces 25, the plurality of metal traces 25 are located on a side of the substrate 24 away from the first test terminal 22, a plurality of vias 241 are provided on the substrate 24, each metal trace 25 is electrically connected to a corresponding second test terminal 23 through a corresponding via 241, and the second test signal enters the second test terminal 23 through the metal trace 25. The metal trace 25 on the other side of the substrate 24 is connected to the second test terminal 23, so as to avoid mutual influence between the metal trace 25 and the first test terminal 22, and ensure that the first test signal and the second test signal are not affected.

[0082] Reference Fig.13 and 14As shown, in one embodiment, each metal trace 25 is electrically connected to the corresponding second test terminal 23 through a plurality of vias 241, which is conducive to improving the stability of the electrical connection. Exemplarily, each metal trace 25 is electrically connected to the corresponding second test terminal 23 through two, three or four vias 241.

[0083] Preferably, the orthographic projection of the via 241 on the substrate 24 is located within the orthographic projection of the second test terminal 23 on the substrate 24, ensuring that the second test terminal 23 is connected to the metal trace 25 by the shortest path, and ensuring the stability of the connection between the second test terminal 23 and the metal trace 25. Further, each metal trace 25 is connected to the corresponding second test terminal 23 through a plurality of vias 241 to ensure the stability of the electrical connection.

[0084] Preferably, the orthographic projections of the multiple first test terminals 22 on the substrate 24 and the orthographic projections of the multiple metal traces 25 on the substrate 24 are spaced apart along the first direction, so as to facilitate the electrical connection between the metal traces 25 and the second test terminals 23, and at the same time, it is beneficial to reduce the signal interference between the first test terminals 22 and the second test terminals 23.

[0085] In one embodiment, the first test terminal 22 is used to connect to the target area 16 by crimping; or, the first test terminal 22 is used to connect to the target area 16 through an anisotropic conductive film, which is not specifically limited.

[0086] The test circuit board 2 at least partially covers the bonding area 13, and Figure 7 , 10 In order to show the test terminals 21 and the panel terminals 14 in FIGS. 11 and 13 , the substrate 24 of the test circuit board 2 is not shown.

[0087] Based on the same inventive concept, another embodiment of the present application also discloses a display panel test device, which includes the test circuit board 2 in the above embodiment. Further, the test device may include a signal generator, a computer, etc., wherein the signal generator is used to generate a test signal, and the computer is used to calculate a target reference (such as a resistance value), and determine whether a conductive material exists according to the target parameter.

[0088] Based on the same inventive concept, another embodiment of the present application further discloses a testing method for testing the display panel 1. Figure 1 , 5 As shown in FIG. 6 , the display panel 1 includes a display area 11 and a non-display area 12, at least one non-display area 12 includes a bonding area 13 and a laser cutting position 15, and the display panel 1 also includes a plurality of panel terminals 14 located in the bonding area 13, the laser cutting position 15 extends along a first direction, and the plurality of panel terminals 14 are arranged at intervals along the first direction. Fig.15As shown, the display panel testing method in this embodiment includes the following steps:

[0089] Step S10, connecting the plurality of first test terminals 22 on the test circuit board 2 to the target area 16 on the display panel 1, wherein the plurality of first test terminals 22 are arranged in intervals along a first direction after the connection; wherein the target area 16 is at least partially located between the laser cutting position 15 and the bonding area 13.

[0090] In one embodiment, the first test terminal 22 is used to connect to the target area 16 by crimping; or, the first test terminal 22 is used to connect to the target area 16 through an anisotropic conductive film, which is not specifically limited.

[0091] Step S20: configure a first test signal on the first test terminal 22 to test whether there is a conductive material in the target area 16. In one embodiment, the first test signal includes a voltage or current signal. In another embodiment, the first test signal is a voltage signal and a current signal, and the combination of the voltage signal and the current signal is conducive to improving the accuracy of the test.

[0092] Step S30 : in response to the presence of the conductive material in the target area 16 , the display panel 1 is powered off and no electrical test is performed.

[0093] Step S40 : In response to the absence of conductive material in the target area 16 , performing an electrical test on the display panel 1 .

[0094] The testing method provided in this embodiment can test whether there is conductive material in the target area 16 by testing the target area 16 between the laser cutting position 15 and the bonding area 13. After the conductive material is tested, rework can be performed to avoid the conductive material causing a short circuit between terminals during electrical testing or module bonding of the display panel 1, resulting in burns to the panel terminals 14 or poor electrical properties of the product, thereby significantly improving the product yield.

[0095] In one embodiment, step S40, performing electrical testing on the display panel 1, comprises:

[0096] A second test signal is configured for a plurality of second test terminals 23 on the test circuit board 2 which are connected one by one to a plurality of panel terminals 14, so as to perform an electrical test on the display panel 1. Figure 8-10 shown.

[0097] Specifically, the second test terminal 23 is used to be connected to the panel terminal 14 by crimping; or, the second test terminal 23 is used to be connected to the panel terminal 14 through an anisotropic conductive film, which is not specifically limited.

[0098] In one embodiment, the first test terminal 22 and the second test terminal 23 are connected to the display panel 1 at the same time, and a first test signal is first configured on the first test terminal 22 to test whether there is a conductive substance in the target area 16. When the conductive substance is detected to be present in the target area 16, in order to avoid the conductive substance causing a short circuit between the terminals, the display panel 1 is powered off and no electrical test is performed. When the conductive substance is detected not to be present in the target area 16, a second test signal is configured on the second test terminal 23 to perform an electrical test on the display panel 1.

[0099] In another embodiment, the first test terminal 22 and the second test terminal 23 can be connected to the display panel 1 successively, that is, the first test terminal 22 is first connected to the target area 16 , and when it is detected that no conductive material exists in the target area 16 , the second test terminal 23 is then connected to the panel terminal 14 .

[0100] In one embodiment, the second test signal is a voltage signal or a current signal. In another embodiment, the second test signal is a voltage signal and a current signal. The combination of the voltage signal and the current signal is helpful to improve the accuracy of the test.

[0101] Reference Fig.16 As shown, in one embodiment, step S20, configuring a first test signal on the first test terminal 22 to test whether there is a conductive material in the target area 16; includes:

[0102] Step S21, configuring a first test signal on the first test terminal 22, and detecting the resistance value between two adjacent first test terminals 22;

[0103] Step S22, when the resistance value is within the first threshold range, it is determined that there is a conductive material in the target area 16;

[0104] Step S23 : when the resistance value is not within the first threshold range, it is determined that no conductive material exists in the target area 16 .

[0105] Among them, since a large amount of carbonized foreign matter is generated during the laser cutting process and mainly remains near the laser cutting position 15, the resistance value between two adjacent first test terminals 22 is reduced, and the first threshold range can be obtained by measuring and comparing the target area 16 before and after laser cutting. Further, a more accurate first threshold range can be obtained through multiple measurements.

[0106] In other embodiments, the resistance value in step S21 may be replaced with other parameters, such as current, voltage, etc., which are not specifically limited.

[0107] Although the present application has been described in conjunction with specific embodiments thereof, many alternatives, modifications and variations of these embodiments will be apparent to those skilled in the art in light of the foregoing description.

[0108] It should be noted that the above describes some embodiments of the present application. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in an order different from that in the above embodiments and still achieve the desired results. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0109] The embodiments of the present application are intended to cover all such substitutions, modifications and variations that fall within the broad scope of the appended claims. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the embodiments of the present application should be included in the scope of protection of the present application.

Claims

1. A test circuit board for testing a display panel, wherein the display panel comprises a display area and a non-display area located at least on one side of the display area, wherein at least one of the non-display areas comprises a bonding area and a laser cutting position, and the display panel further comprises a plurality of panel terminals located in the bonding area, wherein the laser cutting position extends along a first direction, and the plurality of panel terminals are arranged at intervals along the first direction, wherein: The test circuit board comprises: A plurality of first test terminals, which are used to connect to the target area and are arranged at intervals along the first direction after being connected; The first test terminal is configured with a first test signal for testing whether there is a conductive material in the target area; Wherein, the target area is at least partially located between the laser cutting position and the bonding area.

2. The test circuit board according to claim 1, characterized in that: The test circuit board also includes: A plurality of second test terminals, the plurality of second test terminals are used to be connected one by one with the plurality of panel terminals, and the second test terminals are configured with a second test signal for performing an electrical test on the display panel; Preferably, the second test terminal is used to be connected to the panel terminal by crimping; or The second test terminal is used to connect to the panel terminal through an anisotropic conductive film; Preferably, the second test signal includes a voltage and / or a current signal.

3. The test circuit board according to claim 2, characterized in that: The test circuit board also includes: The first test terminal and the second test terminal are located on one side of the substrate, the first test terminal and the second test terminal both extend along a second direction, and the first test terminal and the second test terminal are spaced apart in the second direction, and the second direction is perpendicular to the first direction.

4. The test circuit board according to claim 3, characterized in that: The test circuit board also includes: a plurality of metal traces, wherein the plurality of metal traces are located on a side of the substrate away from the first test terminal, the substrate is provided with a plurality of vias, each of the metal traces is electrically connected to a corresponding second test terminal through a corresponding via, and the second test signal enters the second test terminal through the metal traces; Preferably, each of the metal traces is electrically connected to the corresponding second test terminal through a plurality of the vias; Preferably, the orthographic projection of the via hole on the substrate is located within the orthographic projection of the second test terminal on the substrate; Preferably, the orthographic projections of the plurality of first test terminals on the substrate and the orthographic projections of the plurality of metal traces on the substrate are arranged at intervals along the first direction.

5. The test circuit board according to claim 1, characterized in that: The first test terminal is connected to the target area by crimping; or The first test terminal is used to connect to the target area through an anisotropic conductive film; Preferably, the first test signal includes a voltage and / or a current signal.

6. The test circuit board according to claim 1, characterized in that: The first test terminals are arranged at equal intervals; Preferably, the target area is partially located between adjacent panel terminals.

7. A display panel testing device, characterized in that: Comprising a test circuit board as described in any one of claims 1-6.

8. A testing method for testing a display panel, wherein the display panel comprises a display area and a non-display area, at least one of the non-display areas comprises a bonding area and a laser cutting position, the display panel further comprises a plurality of panel terminals located in the bonding area, the laser cutting position extends along a first direction, and the plurality of panel terminals are arranged at intervals along the first direction, characterized in that: The display panel testing method comprises: Connecting a plurality of first test terminals on a test circuit board to a target area on the display panel, wherein the plurality of first test terminals are arranged at intervals along the first direction after the connection; wherein the target area is at least partially located between the laser cutting position and the bonding area; configuring a first test signal on the first test terminal to test whether a conductive material exists in the target area; In response to the presence of a conductive substance in the target area, the display panel is powered off and no electrical test is performed; In response to the absence of conductive material in the target area, an electrical test is performed on the display panel.

9. The testing method according to claim 8, characterized in that: The electrical testing of the display panel includes: configuring a second test signal for a plurality of second test terminals on the test circuit board that are connected one by one to a plurality of panel terminals, so as to perform an electrical test on the display panel; Preferably, the second test signal includes a voltage and / or a current signal.

10. The testing method according to claim 8, characterized in that: The configuring a first test signal on the first test terminal to test whether a conductive material exists in the target area includes: configuring a first test signal on the first test terminal, and detecting a resistance value between two adjacent first test terminals; When the resistance value is within a first threshold range, it is determined that a conductive material exists in the target area; When the resistance value is not within the first threshold range, it is determined that no conductive material exists in the target area.

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