Fault positioning method for GIS (Gas Insulated Switchgear) equipment
Through GIS optical simulation and true experiments, the optimal layout of optical sensors is determined, combined with the intensity ratio of multiple optical sensors to detect the faulty light signal, the problem of insufficient fault positioning accuracy and anti-interference ability in GIS equipment is solved, and the safety and operation stability of GIS equipment are significantly improved.
Patent Information
- Application Number
- CN202510003296.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-02
- Publication Date
- 2025-04-08
AI Technical Summary
The prior art is difficult to accurately locate the fault source in complex GIS equipment environments, and the unreasonable arrangement of optical sensors leads to insufficient detection accuracy and anti-interference ability.
Through the GIS optical simulation solution, the simulation light source and detection surface are constructed, combined with the optical sensor space layout strategy, GIS true experiments are carried out, the optimal layout scheme of the optical sensor is determined, and the intensity ratio of the fault light signal is detected through multiple optical sensors to determine the fault location.
It significantly improves the detection accuracy and anti-interference ability of optical sensors in GIS equipment, accurately locates internal discharge faults of GIS, and improves the safety and operation stability of GIS equipment.
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Figure CN119780634A_ABST
Abstract
Description
Technical Field
[0001] The invention belongs to the technical field of GIS fault location, and in particular relates to a fault location method for GIS equipment. Background Art
[0002] With the development of power systems, large gas-insulated switchgear has been widely used in high-voltage and ultra-high-voltage power grids. Due to its advantages of small footprint, high operating reliability and low maintenance cost, GIS equipment is particularly used in urban power grids and special environments. However, there are weak partial discharges in GIS equipment during operation, which may develop into violent discharges or breakdowns, causing equipment damage or power outages. Therefore, how to monitor the operating status of GIS equipment in real time and quickly locate and identify the fault location has become one of the key issues to ensure the stable operation of the power system.
[0003] Traditional fault monitoring and location methods mostly rely on acoustic, ultrasonic and UHF detection, but these methods are easily interfered with in complex GIS equipment environments and it is difficult to accurately locate the source of the fault. Optical sensors have gradually become an important means of fault detection in GIS equipment due to their advantages such as anti-electromagnetic interference, high sensitivity and fast response speed. However, how to scientifically and reasonably arrange optical sensors to cover the key positions of the equipment and achieve fast and accurate fault location is an important topic in current research. Therefore, a fault location method suitable for large GIS equipment is proposed, which has important practical application value and research significance. Summary of the invention
[0004] In view of this, the present invention provides a fault locating method for GIS equipment.
[0005] In order to solve the above technical problems, the technical solution adopted by the present invention is: A method for locating a fault of a GIS device comprises the following steps: S1. Use GIS optical simulation solution to construct simulated light source and arrange detection surface to obtain simulation data set P; S2, using the optical sensor spatial layout strategy, carry out GIS real-type experiments, build experimental light sources and arrange sensors to obtain experimental data set P1; S3. In the simulation data set P, the set that meets the first judgment condition is recorded as Q, and in the experimental data set P1, the set that meets the second judgment condition is recorded as Q1. The intersection O of Q and Q1 is taken; S4, taking the positions in set O where the optical sensor receiving range is greater than c% and the receiving sensitivity is greater than d to form set O1, set O1 is the optimal arrangement scheme of the optical sensors in the GIS equipment; S5, using the multiple optical sensors confirmed by the set O1 in step S4, detecting the intensity of the defect light signal at the positions of the multiple optical sensors, and obtaining corresponding ratios based on the intensity of each optical sensor; S6. Obtain ratio data under light sources at different positions through simulation and experiments, thereby constructing a data set K; S7. The optical signal of the actual defect discharge is used to obtain a set of ratios through the optical sensor group, and the ratios are compared with the data set K to determine the most likely location of the defect.
[0006] Furthermore, the process of step S1 includes: S11, constructing a GIS optical simulation model, setting a light source array on the cavity wall of the optical simulation model, and simulating the signal of a typical discharge inside the GIS device; S12. Setting a sensor receiving array for receiving light emitted by the light source array, wherein the size of each sensor receiving surface in the sensor receiving array simulates the size of a photosensitive surface of an actual optical sensor.
[0007] Furthermore, in step S1, the specific operation process includes: S111, setting the length of GIS to L, setting N+1 light sources at intervals of L / N along the axial direction on the cavity wall of the GIS optical simulation model, and setting M+1 monitoring points at intervals of L / M along the axial direction; S112. On the cavity wall of the GIS optical simulation model, a group of light sources and monitoring points identical to those in step S111 are arranged along the axial direction at intervals of 45° around the axis to obtain the optical signal intensity of light sources at different positions detected by monitoring points at different positions inside the GIS, recorded as set P.
[0008] Further, in step S3, the first judgment condition is that the receiving surface receives light sources whose light intensities are greater than a, accounting for more than X% of the total number.
[0009] Further, in step S3, the second judgment condition is that the optical sensor receives light signals from light sources whose number accounts for more than X% of the total number and whose intensity is greater than b.
[0010] The beneficial effects of the present invention are: The present invention proposes a fault location method for GIS equipment, which can obtain the optimal arrangement of optical sensors in GIS equipment, significantly improve the detection accuracy and anti-interference ability, and obtain a method for optical sensors to locate internal discharge faults in GIS. This method solves the dead zone problem of optical sensors detecting fault signals such as partial discharge inside GIS, and at the same time provides a new technical idea and solution for optical sensors in fault location, further improving the safety and operational stability of GIS equipment.
[0011] Based on the analysis of the spatial distribution characteristics of fault signals such as partial discharge in GIS equipment, the present invention comprehensively considers the fault area of GIS equipment, the effective monitoring range of optical sensors, the electrical insulation requirements of the equipment, and the restrictions of the GIS structure on the installation position of the sensor, and proposes the optimal layout of optical sensors in GIS equipment. At the same time, this patent also proposes a fault location method based on multi-optical sensor detection. Combining the data of optical sensors at different positions, the regional judgment of the fault location can be obtained, and the anti-interference ability and fault location accuracy can also be improved. This solution provides important technical support for the application of optical sensors in GIS equipment and improves the reliability and safety of the system.
[0012] This patent proposes for the first time a fault location method for GIS equipment, which solves the layout and anti-interference problems faced by optical sensors in GIS equipment applications. By building a simulation model that is proportional to the actual GIS equipment and setting the fault source based on the typical fault area of the GIS equipment, it is ensured that the fault signal detected by the optical sensor is accurately equivalent to the signal distribution characteristics of the actual equipment. Taking into account the effective monitoring range of the sensor and the restrictions of the equipment structure of the GIS equipment on the sensor installation position, the optimal layout of the optical sensor is obtained to ensure the reliability of the monitoring plan. At the same time, by analyzing the signal amplitude ratio collected by different sensors at different layout positions, the internal area of the GIS where the fault signal is located is judged, thereby improving the ability to judge the internal fault location of the GIS. BRIEF DESCRIPTION OF THE DRAWINGS
[0013] Figure 1 It is a relationship diagram of the various collections of the present invention.
[0014] Figure 2 It is a flow chart of the present invention. DETAILED DESCRIPTION
[0015] In order to better understand the present invention, the content of the present invention is further clearly described below in conjunction with the embodiments and the accompanying drawings, but the protection content of the present invention is not limited to the following embodiments. In the following description, a large number of specific details are provided to provide a more thorough understanding of the present invention. However, it is obvious to those skilled in the art that the present invention can be implemented without one or more of these details.
[0016] Example like Figure 1-2 As shown, the present invention provides a fault location method for GIS equipment, including steps S1-S7.
[0017] S1. Use the GIS optical simulation solution to construct a simulated light source and arrange the detection surface to obtain a simulation data set P.
[0018] The process of step S1 includes: S11, constructing a GIS optical simulation model, setting a light source array on the cavity wall of the optical simulation model, and simulating the signal of a typical discharge inside the GIS device; S12. Setting a sensor receiving array for receiving light emitted by the light source array, wherein the size of each sensor receiving surface in the sensor receiving array simulates the size of a photosensitive surface of an actual optical sensor.
[0019] In step S1, the specific operation process includes: S111, setting the length of GIS to L, setting N+1 light sources at intervals of L / N along the axial direction on the cavity wall of the GIS optical simulation model, and setting M+1 monitoring points at intervals of L / M along the axial direction; S112. On the cavity wall of the GIS optical simulation model, a group of light sources and monitoring points identical to those in step S111 are arranged along the axial direction at intervals of 45° around the axis to obtain the optical signal intensity of light sources at different positions detected by monitoring points at different positions inside the GIS, recorded as set P.
[0020] S2. Use the spatial layout strategy of optical sensors to carry out GIS real-type experiments, build experimental light sources and arrange sensors to obtain the experimental data set P1.
[0021] In this embodiment, the length L of GIS is set to 100 meters; N+1 light sources are set at every L / N interval along the axial direction, where N=10 meters, and a light source is set at every L / N=100 / 10=10 meters. At this time, the positions of the light sources are: 0 meters, 10 meters, 20 meters, 30 meters, 40 meters, 50 meters, 60 meters, 70 meters, 80 meters, 90 meters, 100 meters, and there are 10+1=11 light sources in total; a group of light sources and monitoring points that are the same as those in step S111 are arranged at every 45° interval around the axis, and a group of light sources and monitoring points are arranged at every 45° interval, so there will be a total of 8 groups (360° / 45° = 8). Therefore, in this embodiment, the arrangement of each group of light sources and monitoring points is as follows. Light source position: 0 meters, 10 meters, 20 meters, 30 meters, 40 meters, 50 meters, 60 meters, 70 meters, 80 meters, 90 meters, 100 meters. Monitoring point positions: 0m, 20m, 40m, 60m, 80m, 100m. A total of 8 groups of light sources and monitoring points are arranged on the cavity wall of the GIS optical simulation model.
[0022] The process of step S2 includes: S21. Construct an experimental light source. In an actual GIS device, set up a light source array similar to that in S1. These light sources simulate the signal of a typical discharge inside the GIS device.
[0023] S22. Arrange sensors. Set up sensor receiving arrays inside the GIS equipment according to a certain spatial arrangement strategy. The location and arrangement of these sensors should be as consistent as possible with the simulation model in S1 in order to obtain comparable data.
[0024] S23, data collection, turn on the experimental light source to let the light source emit light. Each sensor in the sensor receiving array receives the light from the light source and records the light signal intensity.
[0025] S24, data processing, sorting and analyzing the light signal intensity data received by the sensor to form an experimental data set P1. These data reflect the intensity of light emitted by light sources at different positions received by sensors at different positions in actual GIS equipment.
[0026] S3. In the simulation data set P, the set that meets the first judgment condition is recorded as Q, and in the experimental data set P1, the set that meets the second judgment condition is recorded as Q1. The intersection O of Q and Q1 is taken.
[0027] In step S3, the first judgment condition is that the receiving surface receives light sources with a light intensity greater than a accounting for more than X% of the total number. The second judgment condition is that the optical sensor receives light signals with a light intensity greater than b accounting for more than X% of the total number of light sources.
[0028] In step S3, in this embodiment, X can be set to 80; a can be set to 0.1 mW / cm 3 , b can be set to -90dBm.
[0029] S4. Take the positions in set O where the optical sensor receiving range is greater than c% and the receiving sensitivity is higher than d to form set O1. Set O1 is the optimal layout plan for optical sensors in GIS equipment.
[0030] In step S4, the receiving range (c%) refers to the proportion of the area where the sensor can effectively receive signals to the total area. The value of c% can be determined based on the coverage capability of the sensor and the actual application requirements. In this embodiment, it is hoped that the sensor can cover most of the internal space of the GIS equipment, so c% is set to a higher value, 80% or 90%. Receiving sensitivity (d) refers to the minimum signal strength that the sensor can receive. The value of d is determined based on the performance indicators of the sensor and the noise level in the actual application environment. In this embodiment, d is set to -80 dBm, which is set to a lower value so that it can still work effectively under low signal strength.
[0031] S5. Using the multiple optical sensors identified by the set O1 in step S4, the intensity of the defect light signal at the positions of the multiple optical sensors is detected, and corresponding ratios are obtained based on the intensity of each optical sensor.
[0032] S6. Obtain ratio data under light sources at different positions through simulation and experiments, thereby constructing a data set K.
[0033] Using multiple optical sensors for detection and calculating the intensity ratio of each optical sensor can improve the accuracy and reliability of detection. The detection results of a single optical sensor may be affected by environmental factors, while the detection results of multiple optical sensors can verify and complement each other, thereby improving the overall detection accuracy and reliability.
[0034] S7. The optical signal of the actual defect discharge is used to obtain a set of ratios through the optical sensor group, and the ratios are compared with the data set K to determine the most likely location of the defect.
[0035] In the present application, the location of the defective optical signal source can be determined by comparing the optical signal intensity ratio at different optical sensor positions. Generally, an optical sensor closer to the defective optical signal source will receive a stronger optical signal, while an optical sensor farther away will receive a weaker optical signal. Therefore, by analyzing the changing trend of the optical signal intensity ratio, the location of the defective optical signal source can be inferred.
[0036] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention rather than to limit it. Other modifications or equivalent substitutions made to the technical solution of the present invention by ordinary technicians in the field should be included in the scope of the claims of the present invention as long as they do not depart from the spirit and scope of the technical solution of the present invention.
Claims
1. A fault location method for GIS equipment, characterized in that: Includes steps: S1. Use GIS optical simulation solution to construct simulated light source and arrange detection surface to obtain simulation data set P; S2, using the optical sensor spatial layout strategy, carry out GIS real-type experiments, build experimental light sources and arrange sensors to obtain experimental data set P1; S3. In the simulation data set P, the set that meets the first judgment condition is recorded as Q, and in the experimental data set P1, the set that meets the second judgment condition is recorded as Q1. The intersection O of Q and Q1 is taken; S4, taking the positions in set O where the optical sensor receiving range is greater than c% and the receiving sensitivity is greater than d to form set O1, set O1 is the optimal arrangement scheme of the optical sensors in the GIS equipment; S5, using the multiple optical sensors confirmed by the set O1 in step S4, detecting the intensity of the defect light signal at the positions of the multiple optical sensors, and obtaining corresponding ratios based on the intensity of each optical sensor; S6. Obtain ratio data under light sources at different positions through simulation and experiments, thereby constructing a data set K; S7. The optical signal of the actual defect discharge is used to obtain a set of ratios through the optical sensor group, and the ratios are compared with the data set K to determine the most likely location of the defect.
2. A fault location method for GIS equipment according to claim 1, characterized in that: The process of step S1 includes: S11, constructing a GIS optical simulation model, setting a light source array on the cavity wall of the optical simulation model, and simulating the signal of a typical discharge inside the GIS device; S12. Setting a sensor receiving array for receiving light emitted by the light source array, wherein the size of each sensor receiving surface in the sensor receiving array simulates the size of a photosensitive surface of an actual optical sensor.
3. A method for locating a fault of a GIS device according to claim 2, characterized in that: In step S1, the specific operation process includes: S111, setting the length of GIS to L, setting N+1 light sources at intervals of L / N along the axial direction on the cavity wall of the GIS optical simulation model, and setting M+1 monitoring points at intervals of L / M along the axial direction; S112. On the cavity wall of the GIS optical simulation model, a group of light sources and monitoring points identical to those in step S111 are arranged along the axial direction at intervals of 45° around the axis to obtain the optical signal intensity of light sources at different positions detected by monitoring points at different positions inside the GIS, recorded as set P.
4. A method for locating a fault of a GIS device according to claim 3, characterized in that: In step S3, the first judgment condition is that the receiving surface receives light sources whose light intensities are greater than a, accounting for more than X% of the total number.
5. A fault location method for GIS equipment according to claim 4, characterized in that: In step S3, the second judgment condition is that the optical sensor receives light signals from light sources whose number is greater than X% of the total number and whose light signal intensities are greater than b.