A Comprehensive Analysis Method and System for Multiple Parameters of a Power Control Board

Abstract

The present invention relates to the technical field of electrical parameter measurement, and particularly relates to a comprehensive analysis method and system for multiple parameters of a power supply control board. The method includes: obtaining the test items of the power supply control board to be tested and the test parameter information of a historical power supply control board identical to the power supply control board to be tested; constructing test circuits corresponding to each test item, and determining the test sequence according to the types and quantities of electronic components in two-by-two test circuits; determining the reference control board of the power supply control board to be tested by using the test parameter information of each test parameter of the historical power supply control board; determining the test parameter scheme of the power supply control board to be tested according to the test parameter information of each test parameter of each reference control board under each working condition environment; testing the power supply control board to be tested by using the test sequence and the test parameter scheme, and analyzing the test results. The present invention improves the accuracy and authenticity of the test results of the power supply control board.

Description

Technical Field

[0001] The present invention relates to the technical field of electrical parameter measurement, and particularly to a comprehensive analysis method and system for multiple parameters of a power control board. Background Art

[0002] A power control board (PCB) is a component used to manage and control the power distribution and conversion in an electronic device. By integrating various circuits and components, it ensures that the system can operate stably and efficiently, and can adjust the output voltage and current according to actual needs. Since the PCB needs to maintain many key parameters of the power output within a safe and stable range, it is necessary to comprehensively test multiple parameters of the PCB.

[0003] In some scenarios, according to the test requirements of the PCB, the corresponding test circuit is connected, and then the test parameters are continuously changed to obtain comprehensive test data of the PCB. Among them, during the testing process of each PCB, most of the existing test systems directly test various PCBs according to the preset test sequence and test parameters. However, the differences in the test sequence and test parameters of different PCBs may lead to differences in the test results of the PCB. Therefore, using a unified test sequence and test parameters for various PCBs will result in poor accuracy and authenticity of the test results of the PCB, and cannot reflect the actual state of the PCB. Summary of the Invention

[0004] In order to solve the technical problem of poor accuracy and authenticity of the test results of the PCB, the purpose of the present invention is to provide a comprehensive analysis method and system for multiple parameters of a power control board, and the specific technical solutions adopted are as follows:

[0005] In a first aspect, an embodiment of the present invention provides a comprehensive analysis method for multiple parameters of a power control board, including: obtaining test items of a power control board to be tested and test parameter information of a historical power control board identical to the power control board to be tested; constructing test circuits corresponding to each test item, and determining the test order of the test circuits corresponding to the test items of the power control board to be tested according to the types and quantities of electronic components in two test circuits, wherein the circuit replacement complexity between adjacent test circuits corresponding to the test items of the power control board to be tested is minimized; determining a reference control board for the power control board to be tested by using the test parameter information of each test parameter of the historical power control board; determining a parameter solution to be tested for the power control board to be tested according to the standard deviation of the test parameter information of each test parameter of each reference control board under each working condition environment, the first average value corresponding to the standard deviation of the parameter values of each test parameter of each reference control board under each working condition environment, and the second average value of the first average values under each working condition environment; testing the power control board to be tested by using the test order and the parameter solution to be tested, and analyzing the test results.

[0006] Optionally, determining the test order of the test circuits corresponding to the test items of the power control board to be tested according to the types and quantities of electronic components in two test circuits includes: determining the circuit replacement complexity of switching from one test circuit to another according to the types and quantities of electronic components in two test circuits, and determining two test circuits with a circuit replacement complexity less than or equal to a first threshold as consecutive circuits; determining the test order of the test circuits corresponding to the test items of the power control board to be tested according to the circuit replacement complexity.

[0007] Optionally, determining the circuit replacement complexity of switching from one test circuit to another according to the types and quantities of electronic components in two test circuits includes: determining a first quantity of electronic components with different types in two test circuits, a second quantity of the total electronic components in one of the two test circuits, and a third quantity of the total electronic components in the other test circuit; determining the maximum value from the second quantity and the third quantity; calculating a first ratio between the first quantity and the maximum value, and a first difference between a predetermined value and the first ratio; performing normalization processing on the first difference to obtain the circuit replacement complexity.

[0008] Optionally, determining the test sequence of the test circuit corresponding to the test item of the power supply control board to be tested according to the circuit replacement complexity includes: randomly selecting a test circuit as the first test circuit; selecting the continuous circuit with the smallest circuit replacement complexity from the first test circuit as the second test circuit, selecting the continuous circuit with the smallest circuit replacement complexity from the second test circuit as the third test circuit, and repeating the above process until all the test circuits corresponding to the test items of the power supply control board to be tested are arranged, so as to obtain the test sequence of the test circuit corresponding to the test item of the power supply control board to be tested.

[0009] Optionally, determining the reference control board of the power supply control board to be tested by using the test parameter information of each test parameter of the historical power supply control board includes: determining the possible normal parameter values of the historical power supply control board by using the test parameter information of the historical power supply control board; calculating the absolute value of the second difference between the possible normal parameter values and the test parameter information, normalizing the absolute value of the second difference to obtain the parameter normal index of the historical power supply control board; calculating the average parameter index of the parameter normal indexes of each test parameter of the historical power supply control board, and taking the average parameter index as the test normal index of the historical power supply control board; taking the historical power supply control board with the test normal index greater than or equal to the second threshold as the reference control board of the power supply control board to be tested.

[0010] Optionally, determining the test parameter scheme of the power supply control board to be tested according to the standard deviation of the test parameter information of each test parameter of each reference control board under each working condition environment, the first average value corresponding to the standard deviation of the parameter values of each test parameter of each reference control board under each working condition environment, and the second average value of the first average values under each working condition environment includes: determining the second average value as the feedback difference factor of the working conditions of each reference control board under the test parameter scheme; using the feedback difference factor to determine the feedback consistency index of each reference control board's feedback on the test parameter scheme; selecting the test parameter scheme with the feedback consistency index greater than or equal to the third threshold as the test parameter scheme of the power supply control board to be tested.

[0011] Optionally, using the feedback difference factor to determine the feedback consistency index of each reference control board's feedback on the test parameter scheme includes: normalizing the feedback difference factor by using the inverse proportional normalization function to obtain the feedback consistency index of each reference control board's feedback on the test parameter scheme.

[0012] Optionally, the power supply control board to be tested is tested using the test sequence and the parameter scheme to be tested, and the test results are analyzed, including: determining a standard fixture according to the application information of the electronic components in the historical test circuit of the historical power supply control board, where the standard fixture is used to place the power supply control board to be tested; sequentially selecting the corresponding test circuit and the parameter scheme to be tested according to the test sequence to test the power supply control board to be tested placed in the standard fixture; inputting the test results into the trained neural network for analysis to obtain the analysis result of the power supply control board to be tested.

[0013] Optionally, determining the standard fixture according to the application information of the electronic components in the historical test circuit of the historical power supply control board includes: determining the number of components of the electronic components used in the historical test circuit and the total number of the historical test circuits; determining the second ratio between the number of components and the total number as the usage rate of the electronic components, and selecting the electronic components with the usage rate exceeding the fourth threshold as the target electronic components; through The layout algorithm combines the connection information of the target electronic components in the historical test circuit to determine the position coordinates of the target electronic components in the standard fixture, and the corresponding position coordinates in the standard fixture are used to place the corresponding target electronic components.

[0014] In a second aspect, an embodiment of the present invention provides a system for comprehensive analysis of multiple parameters of a power supply control board, including: a processor and a memory; wherein, the memory is used to store a computer program that can run on the processor; the processor is used to execute the program stored on the memory to implement the steps of the method for comprehensive analysis of multiple parameters of the power supply control board mentioned in the first aspect.

[0015] The present invention has the following beneficial effects: First, obtain the test items of the power supply control board to be tested and the test parameter information of the historical power supply control board identical to the power supply control board to be tested; then construct the test circuits corresponding to each test item, and determine the test sequence of the test circuit corresponding to the test item of the power supply control board to be tested according to the types and quantities of the electronic components in the two test circuits, where the circuit replacement complexity between adjacent test circuits corresponding to the test item of the power supply control board to be tested is the smallest; secondly, determine the reference control board of the power supply control board to be tested using the test parameter information of each test parameter of the historical power supply control board; then determine the parameter scheme to be tested of the power supply control board to be tested according to the standard deviation of the test parameter information of each test parameter of each reference control board in each working condition environment, the first average value corresponding to the standard deviation of the parameter values of each test parameter of each reference control board in each working condition environment, and the second average value of the first average values in each working condition environment; finally, test the power supply control board to be tested using the test sequence and the parameter scheme to be tested, and analyze the test results.

[0016] Thus, the embodiments of the present invention can analyze the circuit replacement complexity among the test circuits of the test items of the power supply control board to be tested, and select the order with the minimum circuit replacement complexity among the test circuits to formulate the test order for completing the test of the power supply control board to be tested. Then, analyze the test parameter information of the test parameters of numerous historical power supply control boards under various working conditions to obtain the reference control board of the power supply control board to be tested, and then combine the consistency of the changes in the test parameter information of the reference control board under different working conditions to screen the most stable parameter change process of numerous historical power supply control boards as the test parameter scheme of the power supply control board to be tested. Finally, test the power supply control board to be tested according to the above test order and test scheme. Therefore, the embodiments of the present invention determine the test order and test parameters applicable to the power supply control board to be tested based on the test circuits of the power supply control board to be tested and the test parameter information of the same historical power supply control boards, improving the accuracy and authenticity of the test results of the power supply control board, and thus being able to reflect the actual state of the power supply control board. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0018] Figure 1 It is a flowchart of a method for comprehensively analyzing multiple parameters of a power supply control board provided by an embodiment of the present invention.

[0019] Figure 2 It is a schematic structural diagram of a device for comprehensively analyzing multiple parameters of a power supply control board provided by an embodiment of the present invention.

[0020] Figure 3 It is a schematic structural diagram of a system for comprehensively analyzing multiple parameters of a power supply control board provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0021] In order to further elaborate on the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the following, in combination with the accompanying drawings and preferred embodiments, details the specific implementation manners, structures, features, and effects of a method and system for comprehensively analyzing multiple parameters of a power supply control board proposed according to the present invention. In the following description, different "one embodiment" or "another embodiment" do not necessarily refer to the same embodiment. In addition, the specific features, structures, or characteristics in one or more embodiments can be combined in any suitable form.

[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this invention belongs.

[0023] The following specifically describes the specific solution of a comprehensive analysis method for multiple parameters of a power control board provided by the present invention in conjunction with the accompanying drawings.

[0024] Embodiment 1:

[0025] Please refer to Figure 1 , which shows a flowchart of a comprehensive analysis method for multiple parameters of a power control board provided by an embodiment of the present invention, including:

[0026] S101, obtaining the test items of the power control board to be tested and the test parameter information of a historical power control board that is the same as the power control board to be tested.

[0027] Specifically, in the embodiment of the present invention, the test items of the power control board to be tested include but are not limited to function tests, electrical performance tests, and safety tests, etc. Function tests include but are not limited to current input tests, voltage output tests, and load tests, etc. Electrical performance tests include but are not limited to ripple and noise tests, transient response tests, and efficiency tests, etc. Safety tests include but are not limited to insulation resistance tests and withstand voltage tests, etc. The historical power control board that is the same as the power control board to be tested refers to a power control board of the same type as the power control board to be tested. The test parameter information includes but is not limited to the historical test circuit of the historical power control board, various test schemes during the test process, and the parameter values of test parameters such as voltage, current, resistance, and power recorded during the test process.

[0028] Furthermore, when testing the same type of power control board for the same type of test item, the test circuit used is the same, which can effectively avoid test errors caused by changes in the test environment. At the same time, since a comprehensive test of multiple test parameters needs to be carried out on the power control board to be tested, that is, multiple tests need to be completed on the power control board to be tested. In order to more simply and quickly complete the conversion and adjustment of the test circuit for the test item, it is necessary to compare the differences between numerous test circuits, link the test circuits corresponding to the test items with smaller differences, and generate the test sequence in turn. When testing the power control board to be tested, it is necessary to continuously adjust the input parameters of the load in the power control board to be tested and the circuit in the test circuit, so as to evaluate the performance of the power control board to be tested under various working conditions. However, in order to minimize the impact of the test parameter environment of the previous group, such as the load and input parameters, on the test environment of the next group, it is necessary to analyze the differences in the test results of other power control boards under numerous test parameter environments and formulate the corresponding change process of the test parameters. Therefore, the embodiments of the present invention determine the test sequence and test parameters of the power control board to be tested based on the test circuit corresponding to the test item of the power control board to be tested and the test parameter information of the historical power control board.

[0029] S102. Construct the test circuits corresponding to each test item, and determine the test sequence of the test circuit corresponding to the test item of the power control board to be tested according to the types and quantities of electronic components in two test circuits.

[0030] Among them, the circuit replacement complexity between adjacent test circuits corresponding to the test items of the power control board to be tested is the smallest.

[0031] Specifically, since the test items for the power control board are different, the corresponding test circuits are different. In past tests, although the serial order of various electronic components on the test circuit may be different due to the different taking orders, because their test purposes are the same, the number of electronic components used and the types of electronic components between nodes are the same. Based on this, the test circuits corresponding to each test item are constructed. In the embodiments of the present invention, the names of numerous test items are first used as the input of the model, and the corresponding test circuits are used as the output of the model, and the test circuit generation model is trained through a graph neural network. At the same time, the graph neural network can optimize the wiring of the corresponding test circuit and improve the circuit performance. Accordingly, the test circuits corresponding to each test item of the power control board to be tested in the embodiments of the present invention are obtained. That is, the name of the test item of the power control board to be tested is input into the trained graph neural network model, and the trained graph neural network model will generate the corresponding test circuit.

[0032] Furthermore, considering that each test item requires adjustment of the test circuit for the next test item, and the adjustment of these circuits takes some time, the fewer changes to the test circuit and the fewer circuits that need to be reconnected, the less time is required. Therefore, based on the difference in the test circuits, the test order for multiple test items is constructed. Among them, as an optional embodiment of the present invention, first determine the circuit replacement complexity for switching from one test circuit to another according to the types and quantities of electronic components in the two test circuits, and determine two test circuits with a circuit replacement complexity less than or equal to the first threshold as consecutive circuits; then determine the test order of the test circuits corresponding to the test items of the power supply control board to be tested according to the circuit replacement complexity.

[0033] Specifically, the circuit replacement complexity refers to the complexity when switching between two test circuits. The greater the circuit replacement complexity, the more circuits need to be reconnected, the more time is required, and the lower the test efficiency, and vice versa. The types of electronic components in the test circuit include, but are not limited to, resistors, capacitors, and switching devices, etc. When calculating the circuit replacement complexity for switching from one test circuit to another, as an optional embodiment of the present invention, determine the first quantity of electronic components with different types in the two test circuits, the second quantity of the total electronic components in one of the two test circuits, and the third quantity of the total electronic components in the other test circuit; determine the maximum value from the second quantity and the third quantity; calculate the first ratio between the first quantity and the maximum value, and the first difference between the predetermined value and the first ratio; perform normalization processing on the first difference to obtain the circuit replacement complexity.

[0034] Among them, the embodiment of the present invention specifically calculates the circuit replacement complexity using the following formula:

[0035] ;

[0036] In the above formula, represents the circuit replacement complexity for switching from the current test circuit to the test circuit , and is used to evaluate the complexity when switching circuits. represents the first quantity of electronic components that are different in the test circuit compared to the test circuit . represents the second quantity of electronic components in the test circuit . represents the third quantity of electronic components in the test circuit . represents the maximum value function, which is used to determine the maximum value from the second quantity and the third quantity. represents an inverse proportional normalization function, which is used to perform inverse proportional normalization processing.

[0037] Furthermore, the first threshold can be determined according to the actual situation. In the embodiments of the present invention, the first threshold is denoted as , and the first threshold takes a value of 0.1. In the embodiments of the present invention, the circuit replacement complexity of a large number of test circuits is screened. When the circuit replacement complexity of two test circuits is less than or equal to 0.1, the two test circuits are considered similar, and these two test circuits are denoted as consecutive circuits.

[0038] Furthermore, when determining the test order, as an optional embodiment of the present invention, first randomly select a test circuit as the first test circuit; then select the consecutive circuit with the smallest circuit replacement complexity with respect to the first test circuit as the second test circuit, and select the consecutive circuit with the smallest circuit replacement complexity with respect to the second test circuit as the third test circuit, and repeat the above process until all the test circuits corresponding to the test items of the power supply control board to be tested are arranged, obtaining the test order of the test circuits corresponding to the test items of the power supply control board to be tested. It should be noted that each test circuit can only participate once during sorting. When a test circuit has no available consecutive circuit, return to the previous sorting and replace other test circuits in the consecutive circuit. This process is similar to the breadth-first search process. The specific process of the breadth-first search process can refer to the prior art, and the embodiments of the present invention will not elaborate here.

[0039] S103, determine the reference control board of the power supply control board to be tested by using the test parameter information of each test parameter of the historical power supply control board.

[0040] Specifically, since the design parameters used for power supply control boards of the same model are the same, and the processes and parameter models of each raw material used during production are also the same, when they face the same working environment, the various parameters shown during their operation are also the same. However, considering the differences in production batches and equipment, there will be a certain degree of fluctuation in their operating parameters, and these fluctuations have a relatively small impact on power supply control boards with defects. Based on this, power supply control boards that work properly under the same test environment are screened out as the reference control board.

[0041] Further, when determining the reference control board of the power supply control board to be tested, as an optional embodiment of the present invention, first, the possible normal parameter values of the historical power supply control board are determined using the test parameter information of the historical power supply control board; then, the absolute value of the second difference between the possible normal parameter values and the test parameter information is calculated, and the absolute value of the second difference is normalized to obtain the parameter normal index of the historical power supply control board; then, the average parameter index of the parameter normal indexes of each test parameter of the historical power supply control board is calculated, and the average parameter index is used as the test normal index of the historical power supply control board; finally, the historical power supply control board with a test normal index greater than or equal to the second threshold is used as the reference control board of the power supply control board to be tested.

[0042] Specifically, the test parameter information of the historical power supply control board includes but is not limited to the output current value, output voltage value, output power, etc. In the embodiments of the present invention, the central tendency of the test parameter information of numerous historical power supply control boards can be used to infer the possible normal parameter values of this type of power supply control board. In the embodiments of the present invention, the test parameter information of the historical power supply control board is described by taking the output current value as an example. The possible normal parameter value of the current parameter in the embodiments of the present invention is specifically calculated using the following formula:

[0043] ;

[0044] In the above formula, represents the possible normal parameter value of the historical power supply control board when the environmental parameter is , that is, the normal value of this type of power supply control board is inferred through the central tendency of the test parameters of numerous historical power supply control boards. represents the mean value of the output currents of numerous historical power supply control boards under this environmental parameter . represents the mode of the output currents of numerous historical power supply control boards under this environmental parameter . represents the median of the output currents of numerous historical power supply control boards under this environmental parameter . Among them, the environmental parameters include but are not limited to temperature, humidity, etc.

[0045] Further, the parameter normal index of the historical power supply control board can be determined according to the deviation between the historical power supply control board and the possible normal parameter values. In the embodiments of the present invention, the following formula is specifically used to calculate the parameter normal index of the current parameter of the historical power supply control board:

[0046] ;

[0047] In the above formula, represents the parameter normal index of the historical power supply control board in terms of current, which is used to describe this historical power supply control board Similarity in terms of current with other normal power control boards. Represents the historical power control board Under environmental parameters The output current value. Represents when the environmental parameter is The possible normal parameter values of the current parameter of the historical power control board. Represents the exponential function with the base of the natural constant, i.e., the inverse proportional normalization function, which is used to perform inverse proportional normalization on the current difference For inverse proportional normalization.

[0048] It should be noted that the possible normal parameter values of other test parameters of the historical power control board and the parameter normal indicators can refer to the above calculation method of the current parameter. Just replace the value of the current parameter in the calculation formula of the possible normal parameter value of the current parameter and the calculation formula of the parameter normal indicator with the value of the voltage parameter or the power parameter. This embodiment of the present invention will not elaborate here.

[0049] Furthermore, as an optional embodiment of the present invention, the test normal indicator of the historical power control board can be calculated by the following formula:

[0050] ;

[0051] In the above formula, Represents the historical power control board The test normal indicator under this environmental parameter, representing its similarity to other normal power control boards. Represents the historical power control board In terms of test parameter The test normal indicator. Represents the type of test parameter. The types of test parameters include but are not limited to voltage, current, and power, etc.

[0052] Furthermore, in this embodiment of the present invention, the second threshold is denoted as , and the value of the second threshold Can be determined according to the actual situation. In this embodiment of the present invention, the value is 0.6. Screen the test normal indicators of numerous historical power control boards. If the corresponding test normal indicator is greater than or equal to 0.6, it is considered that the power test board has the same reaction as numerous power control boards under this environmental parameter. These power control boards are denoted as reference control boards. Thus, reference control boards under various environmental parameters are obtained.

[0053] S104. Determine the parameter scheme to be measured for the power supply control board to be measured based on the standard deviation of the test parameter information of each test parameter of each reference control board under each working condition environment, the first average value corresponding to the standard deviation of the parameter values of each test parameter of each reference control board under each working condition environment, and the second average value of the first average values under each working condition environment.

[0054] Specifically, during the test, parameters such as the input current and input voltage of the power supply control board need to be continuously changed to test the operating conditions of the power supply control board to be measured under various working condition environments. However, since the responses of the various electronic components in the power supply control board to many working condition environments are inconsistent, the output of the power supply control board varies after the working condition environment changes. To avoid differences in the outputs and working conditions of different power supply control boards caused by changes in the working condition environment, a test parameter scheme in which the parameter changes of many reference control boards tend to be consistent is selected as the parameter scheme to be measured for the power supply control board to be measured.

[0055] Furthermore, when determining the parameter scheme to be measured, as an optional embodiment of the present invention, first determine the second average value as the feedback difference factor of the working conditions of each reference control board under the test parameter scheme; then use the feedback difference factor to determine the feedback consistency index of each reference control board's feedback on the test parameter scheme; finally, select the test parameter scheme with the feedback consistency index greater than or equal to the third threshold as the parameter scheme to be measured for the power supply control board to be measured.

[0056] Specifically, the embodiment of the present invention uses the following formula to calculate the feedback difference factor:

[0057] ;

[0058] In the above formula, represents the feedback difference factor of the working conditions of many reference control boards in the test parameter scheme , characterizing the difference in the working feedback of many reference control boards as the parameters in the test circuit change in the test parameter scheme . represents the test parameter information, that is, the parameter value, of the reference control board when the working condition environment is for the test parameter . represents the standard deviation calculation function, which is used to calculate the discreteness of many reference control boards under a certain test parameter in the corresponding working condition environment. represents the first average value of calculating the standard deviations corresponding to each test parameter of many reference control boards, characterizing the difference in the feedback of many reference control boards to the working condition environment under this working condition environment, that is, is the feedback parameter of the reference control board. It represents calculating the difference in the feedback parameters of the reference control board under numerous working conditions, that is, the second average value of the differences in the feedbacks of numerous reference control boards to the working conditions, which characterizes the working differences of numerous reference control boards facing different working conditions.

[0059] Furthermore, calculate the consistency of the changes in the working parameters of numerous reference control boards under each test parameter scheme. As an optional embodiment of the present invention, use the inverse proportional normalization function to normalize the feedback difference factor to obtain the feedback consistency index of the feedback of each reference control board to the test parameter scheme.

[0060] Specifically, the embodiment of the present invention specifically uses the following formula to calculate the feedback consistency index:

[0061] ;

[0062] In the above formula, represents the feedback consistency index of the feedback of numerous reference control boards to the test parameter scheme . represents the feedback difference factor of the working conditions of numerous reference control boards in the test parameter scheme . represents the exponential function with the natural constant as the base, that is, the inverse proportional normalization function, which is used to perform inverse proportional normalization processing on .

[0063] Furthermore, the third threshold can be valued according to the actual situation. In the embodiment of the present invention, the third threshold is denoted as , and the value of the third threshold is 0.6. The embodiment of the present invention screens the feedback consistency indexes of numerous test parameter schemes. If the feedback consistency index of a certain test parameter scheme is greater than or equal to 0.6, it is considered that the working states of numerous reference control boards under the current test parameter scheme are almost the same, and this test parameter scheme is denoted as the test parameter scheme to be measured. Thus, the test parameter scheme for the power supply control board to be measured during various tests is obtained.

[0064] S105, use the test sequence and the test parameter scheme to test the power supply control board to be measured and analyze the test results.

[0065] Specifically, considering the importance of the power supply control board to be measured, it is necessary to conduct a comprehensive test on it. In order to ensure that the power supply control board to be measured completes a comprehensive test in the same standard fixture, the standard fixture needs to contain the corresponding electronic components for various tests. Therefore, the embodiment of the present invention analyzes the test circuits of numerous historical power supply control boards in the past historical time to set up the standard fixture. And place the power supply control board to be measured in the standard fixture, connect the corresponding lines and conduct the test.

[0066] Further, as an alternative embodiment of the present invention, the power supply control board to be tested is tested using a test sequence and a parameter scheme to be measured, and the test results are analyzed, including: determining a standard fixture according to the application information of the electronic components in the historical test circuit of the historical power supply control board, where the standard fixture is used to place the power supply control board to be tested; sequentially selecting corresponding test circuits and parameter schemes to be measured according to the test sequence to test the power supply control board to be tested placed in the standard fixture; inputting the test results into a trained neural network for analysis to obtain the analysis result of the power supply control board to be tested.

[0067] Among them, the standard fixture includes a combination of electronic components and circuits that are likely to be involved in the power supply control board to be tested. In the embodiment of the present invention, when determining the standard fixture, first determine the number of electronic components used in the historical test circuit and the total number of historical test circuits; then determine that the second ratio between the number of components and the total number is the usage rate of the electronic components, and select the electronic components with a usage rate exceeding the fourth threshold as target electronic components; finally, through The layout algorithm combines the connection information of the target electronic components in the historical test circuit to determine the position coordinates of the target electronic components in the standard fixture, and the corresponding position coordinates in the standard fixture are used to place the corresponding target electronic components.

[0068] Specifically, the fourth threshold can be determined according to the actual situation, and the value in the embodiment of the present invention is 10%. In the embodiment of the present invention, first collect the electronic components used in many test circuits, and any electronic components with a usage rate exceeding 10% need to be set in the standard fixture. Accordingly, the types of electronic components required for the standard fixture are obtained.

[0069] Further, the embodiment of the present invention calculates the usage rate using the following formula:

[0070] ;

[0071] In the above formula, represents the usage rate of the electronic component . represents the number of components using the electronic component , that is, the number of circuits using the electronic component . represents the total number of historical test circuits.

[0072] Further, the embodiment of the present invention then combines the series-parallel situation of the electronic components in many test circuits with the layout algorithm to obtain the position coordinates of each electronic component in the standard fixture. The edges in the layout algorithm correspond to the connection information of two electronic components, such as series relationship and parallel relationship, etc. Among them The specific process of the layout algorithm is as follows: The inputs of the layout algorithm include nodes, lines, graph structures, the initial coordinates of nodes, gravitational coefficients, and repulsive coefficients, etc. Nodes are numerous electronic components, and edges are the wire lines connecting two electronic components in the circuit. The graph structure refers to the graph structures simplified from numerous test circuits. Simplification means simplifying electronic components into nodes and lines into edges. The initial coordinates of nodes are randomly generated positions. The gravitational coefficient is the number of circuits in which two electronic components are directly connected in series or in parallel in numerous test circuits. Direct series connection means that the number of other electronic components between the electronic components is less than or equal to a preset value. In the embodiments of the present invention, the preset value is 2. The repulsive coefficient is the number of test circuits in which two electronic components have no connection in numerous test circuits. No connection means that the number of other electronic components between the two electronic components is greater than or equal to a predetermined value. In the embodiments of the present invention, the predetermined value is 6. The outputs of the layout algorithm are the positions of each node and the edges connecting the nodes.

[0073] The embodiments of the present invention can analyze the circuit replacement complexity between the test circuits of the test items of the power supply control board to be tested, and select the order with the minimum circuit replacement complexity between the test circuits to formulate the test order for completing the power supply control board to be tested. Then, analyze the test parameter information of the test parameters of numerous historical power supply control boards in various working conditions to obtain the reference control board of the power supply control board to be tested, and then combine the consistency of the change of the test parameter information of the reference control board in different working conditions to screen the most stable parameter change process of numerous historical power supply control boards as the test parameter scheme of the power supply control board to be tested. Finally, test the power supply control board to be tested according to the above test order and test scheme. Therefore, the embodiments of the present invention determine the test order and test parameters applicable to the power supply control board to be tested according to the test circuits of the power supply control board to be tested and the test parameter information of the same historical power supply control board, improving the accuracy and authenticity of the test results of the power supply control board, and thus being able to reflect the actual state of the power supply control board.

[0074] Embodiment 2:

[0075] Based on the method for comprehensively analyzing multiple parameters of the power supply control board provided in the above embodiments, and based on the same technical concept, the embodiments of the present invention also provide a device for comprehensively analyzing multiple parameters of the power supply control board. Figure 2 The following is a schematic structural diagram of a device for comprehensively analyzing multiple parameters of the power supply control board provided by an embodiment of the present invention, as Figure 2As shown in the figure. The comprehensive analysis device 200 for multiple parameters of a power supply control board includes: an acquisition module 201, configured to acquire the test items of the power supply control board to be tested and the test parameter information of a historical power supply control board identical to the power supply control board to be tested; a determination module 202, configured to construct a test circuit corresponding to each test item, and determine the test order of the test circuit corresponding to the test item of the power supply control board to be tested according to the types and quantities of electronic components in two test circuits, wherein the circuit replacement complexity between adjacent test circuits corresponding to the test items of the power supply control board to be tested is the smallest; the determination module 202 is further configured to determine a reference control board of the power supply control board to be tested by using the test parameter information of each test parameter of the historical power supply control board; the determination module 202 is further configured to determine a to-be-tested parameter scheme of the power supply control board to be tested according to the standard deviation of the test parameter information of each test parameter of each reference control board in each working condition environment, the first average value corresponding to the standard deviation of the parameter values of each test parameter of each reference control board in each working condition environment, and the second average value of the first average values in each working condition environment; a test module 203, configured to test the power supply control board to be tested by using the test order and the to-be-tested parameter scheme, and analyze the test results.

[0076] The embodiment of the present invention can analyze the circuit replacement complexity between the test circuits of the test items of the power supply control board to be tested, and select the order with the smallest circuit replacement complexity between the test circuits to formulate the test order for completing the power supply control board to be tested. Then, analyze the test parameter information of the test parameters of many historical power supply control boards in each working condition environment to obtain the reference control board of the power supply control board to be tested, and then combine the consistency of the changes in the test parameter information of the reference control board in different working condition environments to screen the most stable parameter change process of many historical power supply control boards as the to-be-tested parameter scheme of the power supply control board to be tested. Finally, test the power supply control board to be tested according to the above test order and test scheme. Therefore, the embodiment of the present invention determines the test order and test parameters applicable to the power supply control board to be tested according to the test circuit of the power supply control board to be tested and the test parameter information of the same historical power supply control board, improves the accuracy and authenticity of the test results of the power supply control board, and thus can reflect the actual state of the power supply control board.

[0077] Embodiment 3:

[0078] Corresponding to the comprehensive analysis method for multiple parameters of a power supply control board provided in the above embodiment, based on the same technical concept, the embodiment of the present invention further provides a comprehensive analysis system for multiple parameters of a power supply control board. The comprehensive analysis system for multiple parameters of a power supply control board is used to execute the comprehensive analysis method for multiple parameters of a power supply control board. Figure 3 The structural schematic diagram of a comprehensive analysis system for multiple parameters of a power supply control board provided in another embodiment of the present invention is as Figure 3As shown. The comprehensive analysis system for various parameters of the power control board can vary significantly due to different configurations or performances, and may include one or more processors 301 and a memory 302. The memory 302 is used to store computer programs that can run on the processor 301. The processor 301 is used to execute the programs stored on the memory 302 to implement the above Figure 1 each step in the method embodiments above. Among them, the memory 302 can be short-term storage or persistent storage. The application programs stored in the memory 302 can include one or more modules (not shown in the figure), and each module can include a series of computer-executable instructions for the comprehensive analysis system of various parameters of the power control board.

[0079] Furthermore, the processor 301 can be set to communicate with the memory 302 and execute a series of computer-executable instructions in the memory 302 on the comprehensive analysis system of various parameters of the power control board. The comprehensive analysis system of various parameters of the power control board can also include one or more power supplies 303, one or more wired or wireless network interfaces 304, one or more input / output interfaces 305, and one or more keyboards 306.

[0080] Specifically, in this embodiment, the comprehensive analysis system of various parameters of the power control board includes a processor, a communication interface, a memory, and a communication bus; among them, the processor, the communication interface, and the memory complete mutual communication through the bus; the memory is used to store computer programs; the processor is used to execute the programs stored on the memory to implement the above Figure 1 each step in the method embodiments above, and has the beneficial effects of the above method embodiments. To avoid repetition, the embodiments of the present invention will not be described in detail here.

[0081] It should be noted that the comprehensive analysis system of various parameters of the power control board provided in the embodiments of the present invention and the comprehensive analysis method of various parameters of the power control board provided in the embodiments of the present invention are based on the same application concept. Therefore, the specific implementation of this embodiment can refer to the implementation of the aforementioned comprehensive analysis method of various parameters of the power control board, and has the same or similar beneficial effects. The repeated parts will not be described again.

[0082] It should be noted that the above sequence of the embodiments of the present invention is only for description and does not represent the superiority or inferiority of the embodiments. The processes depicted in the drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0083] Each embodiment in this specification is described in a progressive manner. The same or similar parts among the embodiments can be referred to each other, and the key points of each embodiment are the differences from other embodiments.

Claims

1. A comprehensive analysis method for multiple parameters of a power control board, characterized in that: The method for comprehensive analysis of multiple parameters of the power control board includes: Acquire test items of the power control board to be tested and test parameter information of the same historical power control board as the power control board to be tested; Constructing test circuits corresponding to the test items, and determining the test order of the test circuits corresponding to the test items of the power control board to be tested according to the types and quantities of the electronic components in the test circuits, wherein the circuit replacement complexity between adjacent test circuits corresponding to the test items of the power control board to be tested is minimal; Determine a reference control board of the power control board to be tested by using the test parameter information of each test parameter of the historical power control board; Determine the parameter scheme for the power control board to be tested according to the standard deviation of the test parameter information of each test parameter of each reference control board under each working condition, the first average value corresponding to the standard deviation of the parameter value of each test parameter of each reference control board under each working condition, and the second average value of the first average value under each working condition; The power control board to be tested is tested using the test sequence and the test parameter scheme, and the test results are analyzed.

2. The method for comprehensive analysis of multiple parameters of a power control board according to claim 1, characterized in that: The method of determining the test sequence of the test circuits corresponding to the test items of the power control board to be tested according to the types and quantities of the electronic components in the two-by-two test circuits includes: Determine the circuit replacement complexity of switching from one test circuit to another test circuit according to the types and quantities of electronic components in the two test circuits, and determine the two test circuits whose circuit replacement complexity is less than or equal to a first threshold as continuous circuits; The test sequence of the test circuits corresponding to the test items of the power control board to be tested is determined according to the circuit replacement complexity.

3. The method for comprehensive analysis of multiple parameters of a power control board according to claim 2, characterized in that: Determining the complexity of circuit replacement from one test circuit to another test circuit according to the types and quantities of electronic components in the two test circuits comprises: Determining a first number of electronic components of different types in the pairwise test circuits, a second number of total electronic components in one of the pairwise test circuits, and a third number of total electronic components in the other test circuit; determining a maximum value from the second number and the third number; calculating a first ratio between the first number and the maximum value, and a first difference between a predetermined value and the first ratio; The first difference is normalized to obtain the circuit replacement complexity.

4. The method for comprehensive analysis of multiple parameters of a power control board according to claim 2, characterized in that: The step of determining the test sequence of the test circuits corresponding to the test items of the power control board to be tested according to the circuit replacement complexity comprises: randomly selecting a test circuit as a first test circuit; Select a continuous circuit with the smallest circuit replacement complexity compared with the first test circuit as the second test circuit, select a continuous circuit with the smallest circuit replacement complexity compared with the second test circuit as the third test circuit, and repeat the above process until the test circuits corresponding to all test items of the power control board to be tested are arranged, and obtain the test order of the test circuits corresponding to the test items of the power control board to be tested.

5. The method for comprehensive analysis of multiple parameters of a power control board according to any one of claims 1 to 4, characterized in that: The method of determining the reference control board of the power control board to be tested by using the test parameter information of each test parameter of the historical power control board comprises: Determining possible normal parameter values ​​of the historical power control board using the test parameter information of the historical power control board; Calculating an absolute value of a second difference between the possible normal parameter value and the test parameter information, and normalizing the absolute value of the second difference to obtain a parameter normality index of the historical power supply control board; Calculating an average parameter index of the parameter normality indexes of each test parameter of the historical power control board, and using the average parameter index as the test normality index of the historical power control board; The historical power control board whose test normal index is greater than or equal to the second threshold is used as a reference control board for the power control board to be tested.

6. The method for comprehensive analysis of multiple parameters of a power control board according to any one of claims 1 to 4, characterized in that: The scheme for determining the tested parameters of the power control board to be tested according to the standard deviation of the test parameter information of each test parameter of each reference control board under each working condition, the first average value corresponding to the standard deviation of the parameter value of each test parameter of each reference control board under each working condition, and the second average value of the first average value under each working condition comprises: Determining the second average value as a feedback difference factor of the working conditions of each of the reference control panels under the test parameter scheme; Determining the feedback consistency index of each of the reference control panels in response to the test parameter scheme using the feedback difference factor; A test parameter scheme in which the feedback consistency index is greater than or equal to a third threshold is selected as the test parameter scheme of the power supply control board to be tested.

7. The method for comprehensive analysis of multiple parameters of a power control board according to claim 6, characterized in that: The method of using the feedback difference factor to determine the feedback consistency index of each reference control board in response to the test parameter scheme includes: The feedback difference factor is normalized using an inverse proportional normalization function to obtain a feedback consistency index of each reference control board for the test parameter scheme.

8. The method for comprehensive analysis of multiple parameters of a power control board according to claim 1, characterized in that: The step of testing the power control board to be tested by using the test sequence and the test parameter scheme, and analyzing the test results includes: Determine a standard fixture according to application information of electronic components in a historical test circuit of a historical power control board, wherein the standard fixture is used to place the power control board to be tested; Selecting the corresponding test circuits and the parameter schemes to be tested in sequence according to the test sequence to test the power control board to be tested placed on the standard fixture; The test results are input into a trained neural network for analysis to obtain analysis results of the power control board to be tested.

9. The method for comprehensive analysis of multiple parameters of a power control board according to claim 8, characterized in that: The method of determining the standard fixture according to the application information of the electronic components in the historical test circuit of the historical power supply control board comprises: determining a component quantity of electronic components used in the historical test circuit and a total quantity of the historical test circuit; Determine a second ratio between the number of components and the total number as a usage rate of the electronic components, and select the electronic components whose usage rates exceed a fourth threshold as target electronic components; pass The layout algorithm determines the position coordinates of the target electronic component in the standard fixture in combination with the connection information of the target electronic component in the historical test circuit, and the corresponding position coordinates in the standard fixture are used to place the corresponding target electronic component.

10. A comprehensive analysis system for multiple parameters of a power control board, characterized in that: include: A processor and a memory; wherein the memory is used to store a computer program that can be run on the processor; The processor is used to execute the program stored in the memory to implement the steps of the method for comprehensive analysis of multiple parameters of a power control board as described in any one of claims 1 to 9.

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